US20180240480A1 - Slider test socket - Google Patents
Slider test socket Download PDFInfo
- Publication number
- US20180240480A1 US20180240480A1 US15/903,937 US201815903937A US2018240480A1 US 20180240480 A1 US20180240480 A1 US 20180240480A1 US 201815903937 A US201815903937 A US 201815903937A US 2018240480 A1 US2018240480 A1 US 2018240480A1
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- United States
- Prior art keywords
- slider
- clamp
- arms
- arm
- handle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/48—Disposition or mounting of heads or head supports relative to record carriers ; arrangements of heads, e.g. for scanning the record carrier to increase the relative speed
- G11B5/4806—Disposition or mounting of heads or head supports relative to record carriers ; arrangements of heads, e.g. for scanning the record carrier to increase the relative speed specially adapted for disk drive assemblies, e.g. assembly prior to operation, hard or flexible disk drives
- G11B5/484—Integrated arm assemblies, e.g. formed by material deposition or by etching from single piece of metal or by lamination of materials forming a single arm/suspension/head unit
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B27/00—Editing; Indexing; Addressing; Timing or synchronising; Monitoring; Measuring tape travel
- G11B27/36—Monitoring, i.e. supervising the progress of recording or reproducing
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/455—Arrangements for functional testing of heads; Measuring arrangements for heads
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/455—Arrangements for functional testing of heads; Measuring arrangements for heads
- G11B5/4555—Arrangements for functional testing of heads; Measuring arrangements for heads by using a spin-stand, i.e. a spinning disc or simulator
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/48—Disposition or mounting of heads or head supports relative to record carriers ; arrangements of heads, e.g. for scanning the record carrier to increase the relative speed
- G11B5/4806—Disposition or mounting of heads or head supports relative to record carriers ; arrangements of heads, e.g. for scanning the record carrier to increase the relative speed specially adapted for disk drive assemblies, e.g. assembly prior to operation, hard or flexible disk drives
- G11B5/4826—Mounting, aligning or attachment of the transducer head relative to the arm assembly, e.g. slider holding members, gimbals, adhesive
Definitions
- Certain embodiments of the present disclosure are directed to devices and methods for use with data storage component testing systems.
- Data storage component testing systems can test performance of one or more individual data storage components such as sliders and data storage media used in hard disk drives.
- Example data storage component testing systems include spin stands and test decks, which enable simultaneous testing of individual data storage components that are to be later installed in hard disk drives. Certain embodiments of the present disclosure are directed to methods and devices that assist with coupling and decoupling data storage components in testing systems.
- an apparatus in certain embodiments, includes a slider test socket.
- the slider test socket includes a clamp, which includes a body, a handle having an opening, and a plurality of arms that extend between the body at a first end of the clamp and the handle at a second end of the clamp.
- an apparatus in certain embodiments, includes a slider test socket.
- the slider test socket includes a body coupled to an electrical connector and extending along a first plane.
- the slider test socket further includes a deflectable arm extending from the body along the first plane. The deflectable arm is configured to deflect to receive a slider and to retract to clamp the slider.
- a method for use with a slider test socket having a body extending along a first plane and an arm extending from the body along the first plane.
- the method includes exerting a first force on the arm to deflect the arm in a first direction, placing a slider between the arm and the body, and releasing the first force on the arm to retract the arm such that the slider is clamped between the arm and the body.
- FIG. 1 shows a schematic of a data storage component testing system, in accordance with certain embodiments of the present disclosure.
- FIG. 2 shows a perspective view of a test deck for use in a data storage component testing system, in accordance with certain embodiments of the present disclosure.
- FIG. 3 shows a perspective view of an arm, in accordance with certain embodiments of the present disclosure.
- FIG. 4 shows a zoomed-in, perspective view of a slider test socket, in accordance with certain embodiments of the present disclosure.
- FIG. 5 shows a zoomed-in, perspective view of the slider test socket of FIG. 4 and a slider.
- FIG. 6 shows a top view of the slider test socket and the slider of FIG. 5 .
- FIG. 7 shows a perspective, bottom view of the slider test socket and the slider of FIG. 6 .
- FIG. 8 shows a slider test socket during deflection, in accordance with certain embodiments of the present disclosure.
- FIGS. 9-13 show top views of clamps that can be incorporated into slider test sockets, in accordance with certain embodiments of the present disclosure.
- Example data storage component testing systems include spin stands and other test systems such as those disclosed in U.S. Pat. No. 9,449,643 (hereinafter the '643 patent), which is hereby incorporated by reference in its entirety.
- FIG. 1 is a schematic representation of a data storage component testing system 100 having at least one controller 102 , test rack 104 , loader assembly 106 , testing assembly 108 , and exchange assembly 110 .
- the testing assembly 108 has a plurality of test slots 112 that can be arranged vertically and horizontally to efficiently occupy physical space.
- the testing slots 112 are sized such that the data storage component testing system 100 can simultaneously provide different testing environments for data storage components corresponding with different hard drive form factors, such as 2.5′′ and 3.5′′ hard drives.
- the loader assembly 106 can have one or more robotic or manual rails, conveyors, end effectors, elevators, etc., that allow individual test decks 114 (shown in more detail in FIG. 2 ) to be installed and subsequently removed from the respective test slots 112 .
- the ability to simultaneously test multiple test decks 114 positioned within the test slots 112 in the testing rack 104 allows for efficient testing of a large number of data storage components.
- the test deck 114 can include an access port 120 , media 122 , slide 124 , controller 126 , and connector 128 , among other features and components.
- the controller 126 is configured to store various testing routines that can be carried out while the test deck 114 is positioned within the test slot 112 to evaluate the quality and accuracy of the medium 122 and slider 124 , for example. While in the test slot 112 , the test deck 114 can be subjected to a variety of testing conditions including different temperature, vibration, data writing, data reading, fly height, internal gas composition, and internal gas pressure conditions.
- the test deck's various connectors 128 are configured to mechanically and/or electrically couple the test deck 114 to features in the test slot 112 .
- test deck 114 is not a consumer data storage device such as a hard drive but instead is a testing platform that enables simultaneous testing of individual data storage components, such as sliders and data storage media, that are to be later installed in hard drives.
- the test deck 114 includes an enclosed testing region accessed via the access port 120 (shown in FIGS. 1 and 2 ), which allows for efficient removal of tested data storage components and installation of untested components when compared to testing procedures requiring disassembly and assembly of data storage devices.
- the exchange assembly 110 can be configured with manual or robotic means to engage and open the access port 120 of the test deck 114 before replacing one or more components housed within the test deck 114 and closing the access port 120 .
- the access port 120 may include a door 130 , which is configured to be opened and closed and which can reduce the risk of particulate generation and contamination in the enclosed testing region. It is noted that opening and closing the access port 120 via the door 130 can be accomplished pneumatically, hydraulically, and manually through friction, fasteners, and/or magnets.
- the exchange assembly 110 can include one or more end effectors 132 (which can be coupled to a vacuum source 134 ) that can be moved within the exchange assembly and used to open and close the access port 120 and/or position a data storage component such as a slider in or out of the test deck 114 .
- a data storage component such as a slider in or out of the test deck 114 .
- the end effector 132 can pick up a to-be-tested slider and position itself above the access port 120 .
- the door 130 of the access port 120 can be opened, and a tip 136 of the end effector 132 can be moved through the access port 120 .
- the to-be-tested slider can be coupled and clamped to a slider test socket (described in more detail below) positioned in the test deck 114 , and vacuum pressure can be removed to decouple the end effector 132 from the slider.
- the vacuum pressure is maintained while the slider is being clamped to the slider test socket; in other embodiments, the vacuum pressure is released prior to clamping.
- the door 130 of the access port 120 can be closed.
- the test deck 114 can then be transferred to a test slot 112 , and the slider can undergo one or more testing routines. Once the slider has been tested, the test deck 114 can be transferred to the exchange assembly 110 , where the door 130 of the access port 120 is opened to permit the end effector 132 to remove the slider from the test deck 114 .
- FIG. 3 shows a perspective view of an arm 300 for use with a data storage component testing system, such as the system 100 .
- data storage component testing systems can include test decks that house various data storage components—some of which are temporarily mounted to the test deck during testing.
- the arm 300 can be used in a test deck, such as the test deck 114 of shown in FIG. 2 , and used to temporarily clamp sliders for testing.
- the arm 300 can be actuated to rotate around axis 302 to position a slider over a data storage medium for test data reading/writing operations.
- the arm 300 includes a slider test socket 304 , which is positioned near a distal end of the arm 100 .
- FIG. 4 shows a zoomed-in, perspective view of the slider test socket 304 .
- FIG. 5 shows a zoomed-in, perspective view of the slider test socket 304 and a slider 306 clamped by the slider test socket 304 .
- FIG. 6 shows a top view of the slider test socket 304 and the slider 306 .
- FIG. 7 shows a perspective, bottom view of the slider test socket 304 and the slider 306 .
- the slider test socket 304 is configured to temporarily clamp sliders during testing in a data storage component testing system such as the data storage component testing system 100 .
- a data storage component testing system such as the data storage component testing system 100 .
- the slider test socket 304 includes a clamp (e.g., a body 308 and an arm 310 ), an electrical connector 312 , and a shelf 314 .
- the body 308 and the arm 310 can be a unitary structure and can be made of materials comprising stainless steel, copper, elastomers, etc., which permit the arm 310 to deflect in response to an exerted force.
- a body and arm made of a unitary structure can allow for the slider test socket 304 to be designed with tighter tolerances over multi-piece structures because the unitary structure eliminates the need to address tolerances due to welds, fasteners, etc.
- the arm 310 extends from the body 308 along a plane and can take various shapes.
- the arm 310 is substantially L-shaped such that the arm 310 includes a first portion 316 that extends from the body 308 in a first direction 318 and a second portion 320 that extends from the first portion 316 in a second direction 322 that is perpendicular to the first direction 318 .
- the body 308 and the arm 310 form a C-clamp-like structure for clamping sliders.
- the slider 306 can be mechanically coupled to the slider test socket 304 in a variety of ways.
- FIGS. 5-7 show the slider 306 in a clamped position where the slider 306 is positioned and mechanically coupled between the body 308 and the arm 310 .
- FIG. 6 shows that the arm 310 includes a contact feature 324 that extends towards the body 308 and directly contacts one side of the slider 306 at or near a central longitudinal axis 326 of the slider 306 while the opposite side of the slider 306 contacts the body 308 .
- the contact feature 324 can take a variety of shapes.
- FIGS. 3-7 show the contact feature 324 being a bump-like shape.
- FIG. 8 shows the contact feature 324 being formed by a leg 328 protruding from the arm 310 . More specifically, FIG. 8 shows the arm 310 having a Y-shaped portion 330 where one of the legs 328 of the Y-shape is the contact feature 324 .
- the contact feature 324 includes a single, discrete contact point that is configured to contact the slider 306 .
- the contact feature 324 includes a flat surface, which lies against and contacts the slider 306 .
- the arm 310 includes multiple contact features. In such embodiments, the contact features may be positioned to contact the slider away from the slider's central longitudinal axis 326 and/or at equal distances from the central longitudinal axis 326 .
- the slider test socket 304 is configured to temporarily clamp sliders during testing.
- the test deck 114 can be provisioned with at least one member that is configured to exert a force on the body 308 and/or arm 310 to deflect the arm 310 .
- FIG. 8 shows a first member 330 and a second member 332 positioned in a gap between the body 308 and the arm 310 .
- the first and second member, 330 and 332 can be configured to exert a force against the body 308 and the arm 310 , respectively.
- the first and second members, 330 and 332 comprise shape-memory alloys or are actuated by one or more shape-memory alloys.
- first member 330 and the second member 332 are actuated to exert their respective forces against the body 308 and the arm 310 upon the test deck's door 130 opening. In some embodiments, first and second members are actuated upon the test deck 114 being powered on in the exchange assembly 110 .
- FIG. 8 shows the arm 310 in a deflected state such that the slider 306 can be positioned between in the body 308 and the arm 310 .
- the contact feature 324 contacts the slider 306 and exerts a force such that the slider 306 becomes mechanically coupled between the body 308 and the arm 310 .
- the arm 310 and the contact feature 324 are designed such that the contact feature 324 moves along a straight line as the arm 310 is deflected and retracted. This arrangement mitigates alignment and positioning problems as the slider 306 is clamped because the contact feature 324 contacts the slider and exerts a force directly towards the body 308 with little to no rotational force. In some embodiments, the force exerted by the contact feature 324 is directed along the central longitudinal axis 326 of the slider 306 . In some embodiments, the contact feature 324 provides a uniform force for coupling to the electrical connector 312 .
- the slider 306 can be electrically coupled to the electrical connector 312 .
- one of the first and second members, 330 and 332 can exert a force against the electrical connector 312 to retract the electrical connector 312 away from the slider 306 while the slider 306 is being positioned in and mechanically coupled to the slider test socket 304 .
- the force against the electrical connector 312 from one of the of the first and second members, 330 and 332 can be released such that the electrical connector 312 moves towards the slider 306 and electrically couples to the slider 306 .
- Mechanically coupling the slider 306 to the slider test socket 304 before electrically coupling the slider 306 to the electrical connector 312 helps mitigate positioning errors of the slider 306 with respect to the slider test socket 304 .
- the slider 306 is less likely to become misaligned or lifted by the action of electrically coupling the slider 306 to the electrical connector 312 .
- the slider test socket 304 is configured such that electrical connector 312 becomes electrically uncoupled from the slider 306 before the slider 306 is mechanically uncoupled from the slider test socket 304 .
- the slider 306 includes bond pads 336 that are configured to be electrically coupled to corresponding conductors on the electrical connector 312 .
- the electrical connecter 312 can take the form of a variety of types of connectors that configured to mechanically and electrically couple to the bond pads 336 .
- the electrical connecter 312 can be a flex circuit, featherboard-like connector, etc., and have electrical conductors such as pins that couple to the bond pads 336 .
- Each electrical conductor forms part of or is coupled to conductors 338 (shown in FIG. 7 ) that communicate signals to and from the slider 306 .
- the conductors 338 can be part of a flex circuit 340 that extends from the slider test socket 304 along the arm 300 to the test deck's controller 126 .
- FIGS. 9-13 show top views of various designs of clamps that can be incorporated into slider test sockets. These clamps can be used to mechanically couple and decouple sliders to and from slider test sockets.
- these clamps can be a unitary structure and can be made of metals, metal alloys, or elastomers.
- materials can comprise stainless steel, copper (including copper alloys), nickel (including nickel alloys like nickel-cobalt), palladium, cobalt, titanium, aluminum, bronze, brass, etc., which permit the arm 310 to deflect in response to an exerted force.
- the material is chosen to have a yield strength that is greater than applied stresses caused by opening the clamps when positioning a slider within the clamp.
- the clamps are designed to be opened 120-150 ⁇ m without exceeding the yield strength of the chosen material(s) of the clamps.
- FIG. 9 shows a clamp 900 including a body 902 and a plurality of arms (i.e., a first arm 904 A, a second arm 904 B, a third arm 904 C, and a fourth arm 904 D) that extends between a trailing end 906 A (which corresponds with a trailing edge of a slider) and a leading end 906 B (which corresponds with a leading edge of a slider) of the clamp 900 .
- the first arm 904 A and the second arm 904 B are paired on one side of the clamp 900 with a gap therebetween
- the third arm 904 C and the fourth arm 904 D are paired on the other side of the clamp 900 with a gap therebetween.
- the arms are similarly shaped such that the arms extend from the trailing end 906 A and extend away from the body 902 until respective curved portions 908 of the arms. At the curved portion 908 , the arms extend back towards the body 902 until terminating at the leading end 906 B. As shown in FIG. 9 , the arms extend around at least a portion of the body 902 . Although FIG. 9 shows the arms extending along the clamp in pairs, fewer or more arms can be used. For example, additional arms can be used to increase the clamping force of the clamp 900 .
- the clamp 900 includes—at or near the leading end 906 B—a handle 910 with an opening 912 and a contact feature 914 .
- the clamp 900 also includes opener surfaces 916 A and 916 B on the second arm 904 B and the fourth arm 904 D, respectively.
- the clamp 900 Near the trailing end 906 A, the clamp 900 includes a slider support surface 918 .
- the clamp 900 also includes a shelf 920 .
- a first member of the test deck 114 can extend through the opening 912 in the handle 910 and a second member of the test deck 114 can couple to one or both of the opener surfaces 916 A and 916 B.
- the members can exert a force to create a larger gap between the contact feature 914 and the slider support surface 918 .
- the shape of the arms allows the clamp 900 to lengthen such that a slider can be positioned on the shelf 920 and between the contact feature 914 and the slider support surface 918 .
- the members can remove the force against the opening 912 and the opener surfaces 916 A and 916 B such that the contact feature 914 and the slider support surface 918 couple to the slider.
- a similar process can be used with the clamps shown in FIGS. 10-13 .
- FIG. 10 shows a clamp 1000 including a body 1002 and a plurality of arms (i.e., a first arm 1004 A, a second arm 1004 B, a third arm 1004 C, and a fourth arm 1004 D) that extends between a trailing end 1006 A and a leading end 1006 B of the clamp 1000 .
- the first arm 1004 A and the second arm 1004 B are paired on one side of the clamp 1000 with a gap therebetween
- the third arm 1004 C and the fourth arm 1004 D are paired on the other side of the clamp 1000 with a gap therebetween.
- the arms are similarly shaped and form a curve (e.g., curved portion 1008 ) as they extend from the trailing end 1006 A to the leading end 1006 B.
- the arms terminate at a handle 1010 at the leading end 1006 B.
- the handle 1010 includes an opening 1012 and a contact feature 1014 .
- the clamp 1000 also includes opener surfaces 1016 A and 1016 B on the body 1002 . Near the trailing end 1006 A, the clamp 1000 includes a slider support surface 1018 .
- the clamp 1000 also includes a shelf 1020 .
- the arms extend around at least a portion of the body 1002 .
- FIG. 10 shows the arms extending along the clamp in pairs, fewer or more arms can be used. For example, additional arms can be used to increase the clamping force of the clamp 1000 .
- FIG. 11 shows a clamp 1100 including a body 1102 and a plurality of arms (i.e., a first arm 1104 A, a second arm 1104 B, a third arm 1104 C, a fourth arm 1104 D, a fifth arm 1104 E, and a sixth arm 1104 F) that extends between a trailing end 1106 A and a leading end 1106 B of the clamp 1100 .
- a plurality of arms i.e., a first arm 1104 A, a second arm 1104 B, a third arm 1104 C, a fourth arm 1104 D, a fifth arm 1104 E, and a sixth arm 1104 F
- the first arm 1104 A, the second arm 1104 B, and the third arm 1104 C form a first trio of arms on one side of the clamp 1100 with gaps therebetween
- the fourth arm 1104 D, the fifth arm 1104 E, and the sixth arm 1104 F form a first trio of arms on the other side of the clamp 1100 with gaps therebetween.
- the arms are similarly shaped and form a curve (e.g., curved portion 1108 ) as they extend from the trailing end 1106 A to the leading end 1106 B.
- the arms terminate at a handle 1110 at the leading end 1106 B.
- the handle 1110 includes an opening 1112 and a contact feature 1114 .
- the clamp 1100 also includes opener surfaces 1116 A and 1116 B on the body 1102 .
- the clamp 1100 Near the trailing end 1106 A, the clamp 1100 includes a slider support surface 1118 .
- the clamp 1100 also includes a shelf 1120 .
- the arms extend around at least a portion of the body 1102 .
- FIG. 11 shows the arms extending along the clamp in pairs, fewer or more arms can be used. For example, additional arms can be used to increase the clamping force of the clamp 1100 .
- FIG. 12 shows a clamp 1200 including a body 1202 and a plurality of arms (i.e., a first arm 1204 A, a second arm 1204 B, a third arm 1204 C, and a fourth arm 1204 D) that extends between a trailing end 1206 A and a leading end 1206 B of the clamp 1200 .
- the first arm 1204 A and the second arm 1204 B are paired on one side of the clamp 1200 with a gap therebetween
- the third arm 1204 C and the fourth arm 1204 D are paired on the other side of the clamp 1200 with a gap therebetween.
- the arms are similarly shaped and form a curve (e.g., curved portion 1008 ) as they extend from the trailing end 1206 A to the leading end 1206 B.
- the arms terminate at a handle 1210 at the leading end 1206 B.
- the handle 1210 includes an opening 1212 and a contact feature 1214 .
- the clamp 1200 also includes opener surfaces 1216 A and 1216 B on the body 1202 . Near the trailing end 1206 A, the clamp 1200 includes a slider support surface 1218 .
- the clamp 1200 also includes a shelf 1220 .
- the arms extend around at least a portion of the body 1202 .
- FIG. 12 shows the arms extending along the clamp in pairs, fewer or more arms can be used. For example, additional arms can be used to increase the clamping force of the clamp 1200 .
- FIG. 13 shows a clamp 1300 including a body 1302 and a plurality of arms (i.e., a first arm 1304 A, a second arm 1304 B, a third arm 1304 C, a fourth arm 1304 D, a fifth arm 1304 E, a sixth arm 1304 F, a seventh arm 1304 G, and an eighth arm 1304 H) that extends between a trailing end 1306 A and a leading end 1306 B of the clamp 1300 .
- a first arm 1304 A a second arm 1304 B
- a third arm 1304 C i.e., a fourth arm 1304 D, a fifth arm 1304 E, a sixth arm 1304 F, a seventh arm 1304 G, and an eighth arm 1304 H
- the first arm 1304 A, the second arm 1304 B, the third arm 1304 C, and the fourth arm form a first quadruplet of arms on one side of the clamp 1300 with gaps therebetween
- the fifth arm 1304 E, the sixth arm 1304 F, the seventh arm 1304 G, and the eighth arm 1304 H form a first quadruplet of arms on the other side of the clamp 1300 with gaps therebetween.
- the arms are similarly shaped and form a curve (e.g., curved portion 1308 ) as they extend from the trailing end 1306 A to the leading end 1306 B.
- the arms terminate at a handle 1310 at the leading end 1306 B.
- the handle 1310 includes an opening 1312 and a contact feature 1314 .
- the clamp 1300 also includes opener surfaces 1316 A and 1316 B on the body 1302 . Near the trailing end 1306 A, the clamp 1300 includes a slider support surface 1318 . The clamp 1300 also includes a shelf 1320 . As shown in FIG. 13 , the arms extend around at least a portion of the body 1302 . Although FIG. 13 shows the arms extending along the clamp in pairs, fewer or more arms can be used. For example, additional arms can be used to increase the clamping force of the clamp 1300 .
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Abstract
An apparatus includes a slider test socket. The slider test socket includes a clamp, which includes a body, a handle having an opening, and a plurality of arms that extend between the body at a first end of the clamp and the handle at a second end of the clamp.
Description
- This application claims the benefit of U.S. Provisional Patent Application No. 62/462,698, filed on Feb. 23, 2017, the entirety of which is hereby incorporated by reference for all purposes.
- Certain embodiments of the present disclosure are directed to devices and methods for use with data storage component testing systems.
- Data storage component testing systems can test performance of one or more individual data storage components such as sliders and data storage media used in hard disk drives. Example data storage component testing systems include spin stands and test decks, which enable simultaneous testing of individual data storage components that are to be later installed in hard disk drives. Certain embodiments of the present disclosure are directed to methods and devices that assist with coupling and decoupling data storage components in testing systems.
- In certain embodiments, an apparatus includes a slider test socket. The slider test socket includes a clamp, which includes a body, a handle having an opening, and a plurality of arms that extend between the body at a first end of the clamp and the handle at a second end of the clamp.
- In certain embodiments, an apparatus includes a slider test socket. The slider test socket includes a body coupled to an electrical connector and extending along a first plane. The slider test socket further includes a deflectable arm extending from the body along the first plane. The deflectable arm is configured to deflect to receive a slider and to retract to clamp the slider.
- In certain embodiments, a method is described for use with a slider test socket having a body extending along a first plane and an arm extending from the body along the first plane. The method includes exerting a first force on the arm to deflect the arm in a first direction, placing a slider between the arm and the body, and releasing the first force on the arm to retract the arm such that the slider is clamped between the arm and the body.
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FIG. 1 shows a schematic of a data storage component testing system, in accordance with certain embodiments of the present disclosure. -
FIG. 2 shows a perspective view of a test deck for use in a data storage component testing system, in accordance with certain embodiments of the present disclosure. -
FIG. 3 shows a perspective view of an arm, in accordance with certain embodiments of the present disclosure. -
FIG. 4 shows a zoomed-in, perspective view of a slider test socket, in accordance with certain embodiments of the present disclosure. -
FIG. 5 shows a zoomed-in, perspective view of the slider test socket ofFIG. 4 and a slider. -
FIG. 6 shows a top view of the slider test socket and the slider ofFIG. 5 . -
FIG. 7 shows a perspective, bottom view of the slider test socket and the slider ofFIG. 6 . -
FIG. 8 shows a slider test socket during deflection, in accordance with certain embodiments of the present disclosure. -
FIGS. 9-13 show top views of clamps that can be incorporated into slider test sockets, in accordance with certain embodiments of the present disclosure. - While the disclosure is amenable to various modifications and alternative forms, specific embodiments have been shown by way of example in the drawings and are described in detail below. The intention, however, is not to limit the disclosure to the particular embodiments described but instead is intended to cover all modifications, equivalents, and alternatives falling within the scope the appended claims.
- Certain embodiments of the present disclosure are directed to devices and methods for use with data storage component testing systems. Example data storage component testing systems include spin stands and other test systems such as those disclosed in U.S. Pat. No. 9,449,643 (hereinafter the '643 patent), which is hereby incorporated by reference in its entirety.
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FIG. 1 is a schematic representation of a data storagecomponent testing system 100 having at least onecontroller 102,test rack 104,loader assembly 106,testing assembly 108, andexchange assembly 110. Thetesting assembly 108 has a plurality oftest slots 112 that can be arranged vertically and horizontally to efficiently occupy physical space. Thetesting slots 112 are sized such that the data storagecomponent testing system 100 can simultaneously provide different testing environments for data storage components corresponding with different hard drive form factors, such as 2.5″ and 3.5″ hard drives. - The
loader assembly 106 can have one or more robotic or manual rails, conveyors, end effectors, elevators, etc., that allow individual test decks 114 (shown in more detail inFIG. 2 ) to be installed and subsequently removed from therespective test slots 112. The ability to simultaneously testmultiple test decks 114 positioned within thetest slots 112 in thetesting rack 104 allows for efficient testing of a large number of data storage components. Thetest deck 114 can include anaccess port 120,media 122,slide 124,controller 126, and connector 128, among other features and components. - The
controller 126 is configured to store various testing routines that can be carried out while thetest deck 114 is positioned within thetest slot 112 to evaluate the quality and accuracy of themedium 122 andslider 124, for example. While in thetest slot 112, thetest deck 114 can be subjected to a variety of testing conditions including different temperature, vibration, data writing, data reading, fly height, internal gas composition, and internal gas pressure conditions. The test deck's various connectors 128 are configured to mechanically and/or electrically couple thetest deck 114 to features in thetest slot 112. - It is noted that the
test deck 114 is not a consumer data storage device such as a hard drive but instead is a testing platform that enables simultaneous testing of individual data storage components, such as sliders and data storage media, that are to be later installed in hard drives. Thetest deck 114 includes an enclosed testing region accessed via the access port 120 (shown inFIGS. 1 and 2 ), which allows for efficient removal of tested data storage components and installation of untested components when compared to testing procedures requiring disassembly and assembly of data storage devices. - The
exchange assembly 110 can be configured with manual or robotic means to engage and open theaccess port 120 of thetest deck 114 before replacing one or more components housed within thetest deck 114 and closing theaccess port 120. Theaccess port 120 may include adoor 130, which is configured to be opened and closed and which can reduce the risk of particulate generation and contamination in the enclosed testing region. It is noted that opening and closing theaccess port 120 via thedoor 130 can be accomplished pneumatically, hydraulically, and manually through friction, fasteners, and/or magnets. - The
exchange assembly 110 can include one or more end effectors 132 (which can be coupled to a vacuum source 134) that can be moved within the exchange assembly and used to open and close theaccess port 120 and/or position a data storage component such as a slider in or out of thetest deck 114. Using sliders as an example, theend effector 132 can pick up a to-be-tested slider and position itself above theaccess port 120. Thedoor 130 of theaccess port 120 can be opened, and atip 136 of theend effector 132 can be moved through theaccess port 120. The to-be-tested slider can be coupled and clamped to a slider test socket (described in more detail below) positioned in thetest deck 114, and vacuum pressure can be removed to decouple theend effector 132 from the slider. In some embodiments, the vacuum pressure is maintained while the slider is being clamped to the slider test socket; in other embodiments, the vacuum pressure is released prior to clamping. Once thetip 136 of theend effector 132 is removed from thetest deck 114, thedoor 130 of theaccess port 120 can be closed. Thetest deck 114 can then be transferred to atest slot 112, and the slider can undergo one or more testing routines. Once the slider has been tested, thetest deck 114 can be transferred to theexchange assembly 110, where thedoor 130 of theaccess port 120 is opened to permit theend effector 132 to remove the slider from thetest deck 114. - Some of the concerns when coupling the to-be-tested slider to a slider test socket are the position of the slider with respect to the slider test socket and the quality of the coupling force. For example, in the process of coupling the slider to the test socket, the slider may become undesirably rotated or tilted with respect to the slider test socket. Positioning errors can cause issues with mechanical and electrical coupling between the slider and slider test socket. Certain embodiments of the present disclosure are accordingly directed to methods and devices that assist with coupling sliders to slider test sockets.
-
FIG. 3 shows a perspective view of anarm 300 for use with a data storage component testing system, such as thesystem 100. As described above, data storage component testing systems can include test decks that house various data storage components—some of which are temporarily mounted to the test deck during testing. Thearm 300 can be used in a test deck, such as thetest deck 114 of shown inFIG. 2 , and used to temporarily clamp sliders for testing. During testing, thearm 300 can be actuated to rotate aroundaxis 302 to position a slider over a data storage medium for test data reading/writing operations. - The
arm 300 includes aslider test socket 304, which is positioned near a distal end of thearm 100.FIG. 4 shows a zoomed-in, perspective view of theslider test socket 304.FIG. 5 shows a zoomed-in, perspective view of theslider test socket 304 and aslider 306 clamped by theslider test socket 304.FIG. 6 shows a top view of theslider test socket 304 and theslider 306.FIG. 7 shows a perspective, bottom view of theslider test socket 304 and theslider 306. - The
slider test socket 304 is configured to temporarily clamp sliders during testing in a data storage component testing system such as the data storagecomponent testing system 100. When theslider 306 is properly clamped in theslider test socket 304, theslider 306 is mechanically and electrically coupled to theslider test socket 304. - As shown in
FIG. 4 , theslider test socket 304 includes a clamp (e.g., abody 308 and an arm 310), anelectrical connector 312, and ashelf 314. Thebody 308 and thearm 310 can be a unitary structure and can be made of materials comprising stainless steel, copper, elastomers, etc., which permit thearm 310 to deflect in response to an exerted force. A body and arm made of a unitary structure can allow for theslider test socket 304 to be designed with tighter tolerances over multi-piece structures because the unitary structure eliminates the need to address tolerances due to welds, fasteners, etc. Thearm 310 extends from thebody 308 along a plane and can take various shapes. In some embodiments, like those shown inFIGS. 4-7 , thearm 310 is substantially L-shaped such that thearm 310 includes afirst portion 316 that extends from thebody 308 in afirst direction 318 and asecond portion 320 that extends from thefirst portion 316 in asecond direction 322 that is perpendicular to thefirst direction 318. Together, thebody 308 and thearm 310 form a C-clamp-like structure for clamping sliders. - The
slider 306 can be mechanically coupled to theslider test socket 304 in a variety of ways.FIGS. 5-7 show theslider 306 in a clamped position where theslider 306 is positioned and mechanically coupled between thebody 308 and thearm 310. More specifically,FIG. 6 shows that thearm 310 includes acontact feature 324 that extends towards thebody 308 and directly contacts one side of theslider 306 at or near a centrallongitudinal axis 326 of theslider 306 while the opposite side of theslider 306 contacts thebody 308. Thecontact feature 324 can take a variety of shapes. For example,FIGS. 3-7 show thecontact feature 324 being a bump-like shape.FIG. 8 shows thecontact feature 324 being formed by aleg 328 protruding from thearm 310. More specifically,FIG. 8 shows thearm 310 having a Y-shapedportion 330 where one of thelegs 328 of the Y-shape is thecontact feature 324. - In some embodiments, the
contact feature 324 includes a single, discrete contact point that is configured to contact theslider 306. In some embodiments, thecontact feature 324 includes a flat surface, which lies against and contacts theslider 306. In some embodiments, thearm 310 includes multiple contact features. In such embodiments, the contact features may be positioned to contact the slider away from the slider's centrallongitudinal axis 326 and/or at equal distances from the centrallongitudinal axis 326. - As mentioned above, the
slider test socket 304 is configured to temporarily clamp sliders during testing. In the process of clamping a slider, thetest deck 114 can be provisioned with at least one member that is configured to exert a force on thebody 308 and/orarm 310 to deflect thearm 310.FIG. 8 shows afirst member 330 and asecond member 332 positioned in a gap between thebody 308 and thearm 310. The first and second member, 330 and 332, can be configured to exert a force against thebody 308 and thearm 310, respectively. In some embodiments, the first and second members, 330 and 332, comprise shape-memory alloys or are actuated by one or more shape-memory alloys. In some embodiments, thefirst member 330 and thesecond member 332 are actuated to exert their respective forces against thebody 308 and thearm 310 upon the test deck'sdoor 130 opening. In some embodiments, first and second members are actuated upon thetest deck 114 being powered on in theexchange assembly 110. -
FIG. 8 shows thearm 310 in a deflected state such that theslider 306 can be positioned between in thebody 308 and thearm 310. Upon placing theslider 306 between thearm 310 and thebody 308 in a clampingspace 334, one or more of the forces exerted by the first and second members, 330 and 332, can be released and thearm 310 retracts to its normal state. When the one or more forces are released, thecontact feature 324 contacts theslider 306 and exerts a force such that theslider 306 becomes mechanically coupled between thebody 308 and thearm 310. In some embodiments, thearm 310 and thecontact feature 324 are designed such that thecontact feature 324 moves along a straight line as thearm 310 is deflected and retracted. This arrangement mitigates alignment and positioning problems as theslider 306 is clamped because thecontact feature 324 contacts the slider and exerts a force directly towards thebody 308 with little to no rotational force. In some embodiments, the force exerted by thecontact feature 324 is directed along the centrallongitudinal axis 326 of theslider 306. In some embodiments, thecontact feature 324 provides a uniform force for coupling to theelectrical connector 312. - Once the
slider 306 is mechanically coupled to theslider test socket 304, the slider can be electrically coupled to theelectrical connector 312. For example, one of the first and second members, 330 and 332, can exert a force against theelectrical connector 312 to retract theelectrical connector 312 away from theslider 306 while theslider 306 is being positioned in and mechanically coupled to theslider test socket 304. Once theslider 306 is mechanically coupled to theslider test socket 304, the force against theelectrical connector 312 from one of the of the first and second members, 330 and 332, can be released such that theelectrical connector 312 moves towards theslider 306 and electrically couples to theslider 306. Mechanically coupling theslider 306 to theslider test socket 304 before electrically coupling theslider 306 to theelectrical connector 312 helps mitigate positioning errors of theslider 306 with respect to theslider test socket 304. For example, using the above-described approach, theslider 306 is less likely to become misaligned or lifted by the action of electrically coupling theslider 306 to theelectrical connector 312. Conversely, in some embodiments, theslider test socket 304 is configured such thatelectrical connector 312 becomes electrically uncoupled from theslider 306 before theslider 306 is mechanically uncoupled from theslider test socket 304. - As shown in
FIG. 5 , theslider 306 includesbond pads 336 that are configured to be electrically coupled to corresponding conductors on theelectrical connector 312. Theelectrical connecter 312 can take the form of a variety of types of connectors that configured to mechanically and electrically couple to thebond pads 336. For example, theelectrical connecter 312 can be a flex circuit, featherboard-like connector, etc., and have electrical conductors such as pins that couple to thebond pads 336. Each electrical conductor forms part of or is coupled to conductors 338 (shown inFIG. 7 ) that communicate signals to and from theslider 306. Theconductors 338 can be part of aflex circuit 340 that extends from theslider test socket 304 along thearm 300 to the test deck'scontroller 126. -
FIGS. 9-13 show top views of various designs of clamps that can be incorporated into slider test sockets. These clamps can be used to mechanically couple and decouple sliders to and from slider test sockets. In certain embodiments, these clamps can be a unitary structure and can be made of metals, metal alloys, or elastomers. For example, materials can comprise stainless steel, copper (including copper alloys), nickel (including nickel alloys like nickel-cobalt), palladium, cobalt, titanium, aluminum, bronze, brass, etc., which permit thearm 310 to deflect in response to an exerted force. In certain embodiments, the material is chosen to have a yield strength that is greater than applied stresses caused by opening the clamps when positioning a slider within the clamp. In certain embodiments, the clamps are designed to be opened 120-150 μm without exceeding the yield strength of the chosen material(s) of the clamps. -
FIG. 9 shows aclamp 900 including abody 902 and a plurality of arms (i.e., afirst arm 904A, asecond arm 904B, athird arm 904C, and afourth arm 904D) that extends between a trailingend 906A (which corresponds with a trailing edge of a slider) and aleading end 906B (which corresponds with a leading edge of a slider) of theclamp 900. As shown inFIG. 9 , thefirst arm 904A and thesecond arm 904B are paired on one side of theclamp 900 with a gap therebetween, and thethird arm 904C and thefourth arm 904D are paired on the other side of theclamp 900 with a gap therebetween. The arms are similarly shaped such that the arms extend from the trailingend 906A and extend away from thebody 902 until respectivecurved portions 908 of the arms. At thecurved portion 908, the arms extend back towards thebody 902 until terminating at theleading end 906B. As shown inFIG. 9 , the arms extend around at least a portion of thebody 902. AlthoughFIG. 9 shows the arms extending along the clamp in pairs, fewer or more arms can be used. For example, additional arms can be used to increase the clamping force of theclamp 900. - The
clamp 900 includes—at or near theleading end 906B—ahandle 910 with anopening 912 and acontact feature 914. Theclamp 900 also includesopener surfaces second arm 904B and thefourth arm 904D, respectively. Near the trailingend 906A, theclamp 900 includes aslider support surface 918. Theclamp 900 also includes ashelf 920. - To couple a slider to the
clamp 900, a first member of thetest deck 114 can extend through theopening 912 in thehandle 910 and a second member of thetest deck 114 can couple to one or both of the opener surfaces 916A and 916B. Once positioned, the members can exert a force to create a larger gap between thecontact feature 914 and theslider support surface 918. The shape of the arms allows theclamp 900 to lengthen such that a slider can be positioned on theshelf 920 and between thecontact feature 914 and theslider support surface 918. Once the slider is positioned, the members can remove the force against theopening 912 and the opener surfaces 916A and 916B such that thecontact feature 914 and theslider support surface 918 couple to the slider. A similar process can be used with the clamps shown inFIGS. 10-13 . -
FIG. 10 shows aclamp 1000 including abody 1002 and a plurality of arms (i.e., afirst arm 1004A, asecond arm 1004B, athird arm 1004C, and afourth arm 1004D) that extends between a trailingend 1006A and aleading end 1006B of theclamp 1000. As shown inFIG. 10 , thefirst arm 1004A and thesecond arm 1004B are paired on one side of theclamp 1000 with a gap therebetween, and thethird arm 1004C and thefourth arm 1004D are paired on the other side of theclamp 1000 with a gap therebetween. The arms are similarly shaped and form a curve (e.g., curved portion 1008) as they extend from the trailingend 1006A to theleading end 1006B. The arms terminate at ahandle 1010 at theleading end 1006B. Thehandle 1010 includes anopening 1012 and acontact feature 1014. Theclamp 1000 also includes opener surfaces 1016A and 1016B on thebody 1002. Near the trailingend 1006A, theclamp 1000 includes aslider support surface 1018. Theclamp 1000 also includes ashelf 1020. As shown inFIG. 10 , the arms extend around at least a portion of thebody 1002. AlthoughFIG. 10 shows the arms extending along the clamp in pairs, fewer or more arms can be used. For example, additional arms can be used to increase the clamping force of theclamp 1000. -
FIG. 11 shows aclamp 1100 including abody 1102 and a plurality of arms (i.e., afirst arm 1104A, asecond arm 1104B, athird arm 1104C, afourth arm 1104D, afifth arm 1104E, and asixth arm 1104F) that extends between a trailingend 1106A and aleading end 1106B of theclamp 1100. As shown inFIG. 11 , thefirst arm 1104A, thesecond arm 1104B, and thethird arm 1104C form a first trio of arms on one side of theclamp 1100 with gaps therebetween, and thefourth arm 1104D, thefifth arm 1104E, and thesixth arm 1104F form a first trio of arms on the other side of theclamp 1100 with gaps therebetween. The arms are similarly shaped and form a curve (e.g., curved portion 1108) as they extend from the trailingend 1106A to theleading end 1106B. The arms terminate at ahandle 1110 at theleading end 1106B. Thehandle 1110 includes anopening 1112 and acontact feature 1114. Theclamp 1100 also includes opener surfaces 1116A and 1116B on thebody 1102. Near the trailingend 1106A, theclamp 1100 includes aslider support surface 1118. Theclamp 1100 also includes ashelf 1120. As shown inFIG. 11 , the arms extend around at least a portion of thebody 1102. AlthoughFIG. 11 shows the arms extending along the clamp in pairs, fewer or more arms can be used. For example, additional arms can be used to increase the clamping force of theclamp 1100. -
FIG. 12 shows aclamp 1200 including abody 1202 and a plurality of arms (i.e., afirst arm 1204A, asecond arm 1204B, athird arm 1204C, and afourth arm 1204D) that extends between a trailingend 1206A and a leading end 1206B of theclamp 1200. As shown inFIG. 12 , thefirst arm 1204A and thesecond arm 1204B are paired on one side of theclamp 1200 with a gap therebetween, and thethird arm 1204C and thefourth arm 1204D are paired on the other side of theclamp 1200 with a gap therebetween. The arms are similarly shaped and form a curve (e.g., curved portion 1008) as they extend from the trailingend 1206A to the leading end 1206B. The arms terminate at ahandle 1210 at the leading end 1206B. Thehandle 1210 includes anopening 1212 and acontact feature 1214. Theclamp 1200 also includes opener surfaces 1216A and 1216B on thebody 1202. Near the trailingend 1206A, theclamp 1200 includes aslider support surface 1218. Theclamp 1200 also includes ashelf 1220. As shown inFIG. 12 , the arms extend around at least a portion of thebody 1202. AlthoughFIG. 12 shows the arms extending along the clamp in pairs, fewer or more arms can be used. For example, additional arms can be used to increase the clamping force of theclamp 1200. -
FIG. 13 shows aclamp 1300 including abody 1302 and a plurality of arms (i.e., afirst arm 1304A, asecond arm 1304B, athird arm 1304C, afourth arm 1304D, afifth arm 1304E, asixth arm 1304F, aseventh arm 1304G, and aneighth arm 1304H) that extends between a trailingend 1306A and aleading end 1306B of theclamp 1300. As shown inFIG. 13 , thefirst arm 1304A, thesecond arm 1304B, thethird arm 1304C, and the fourth arm form a first quadruplet of arms on one side of theclamp 1300 with gaps therebetween, and the thefifth arm 1304E, thesixth arm 1304F, theseventh arm 1304G, and theeighth arm 1304H form a first quadruplet of arms on the other side of theclamp 1300 with gaps therebetween. The arms are similarly shaped and form a curve (e.g., curved portion 1308) as they extend from the trailingend 1306A to theleading end 1306B. The arms terminate at ahandle 1310 at theleading end 1306B. Thehandle 1310 includes anopening 1312 and acontact feature 1314. Theclamp 1300 also includes opener surfaces 1316A and 1316B on thebody 1302. Near the trailingend 1306A, theclamp 1300 includes aslider support surface 1318. Theclamp 1300 also includes ashelf 1320. As shown inFIG. 13 , the arms extend around at least a portion of thebody 1302. AlthoughFIG. 13 shows the arms extending along the clamp in pairs, fewer or more arms can be used. For example, additional arms can be used to increase the clamping force of theclamp 1300. - Various modifications and additions can be made to the embodiments disclosed without departing from the scope of this disclosure. For example, while the embodiments described above refer to particular features, the scope of this disclosure also includes embodiments having different combinations of features and embodiments that do not include all of the described features. Accordingly, the scope of the present disclosure is intended to include all such alternatives, modifications, and variations as falling within the scope of the claims, together with all equivalents thereof.
Claims (20)
1. An apparatus comprising:
a slider test socket including a clamp that includes:
a body,
a handle having an opening, and
a plurality of arms extending between the body at a first end of the clamp and the handle at a second end of the clamp.
2. The apparatus of claim 1 , wherein the plurality of arms extend around the body.
3. The apparatus of claim 1 , wherein the clamp further includes a shelf, and wherein the plurality of arms extends around the shelf.
4. The apparatus of claim 1 , wherein the plurality of arms includes a first pair of arms and a second pair of arms that extends around opposite sides of the body.
5. The apparatus of claim 1 , wherein the plurality of arms includes a first trio of arms and a second trio of arms that extends around opposite sides of the body.
6. The apparatus of claim 1 , wherein the plurality of arms includes a curved section between the first end and the second end of the clamp.
7. The apparatus of claim 1 , wherein the handle is coupled to a contact feature that extends towards the body.
8. The apparatus of claim 1 , wherein the plurality of arms are configured to deform when the handle is pulled.
9. The apparatus of claim 1 , wherein the clamp forms a unitary structure.
10. The apparatus of claim 1 , wherein the slider test socket further includes an electrical connector.
11. The apparatus of claim 1 , further comprising:
a test deck including the slider test socket.
12. The apparatus of claim 11 , wherein the test deck includes an access window.
13. The apparatus of claim 12 , wherein the access window includes a door configured to be opened to permit a slider to be inserted into or removed from the test deck.
14. The apparatus of claim 13 , further comprising:
a test rack, a loader assembly, a testing assembly, and an exchange assembly.
15. An apparatus comprising:
a slider test socket including:
a body coupled to an electrical connector, the body extending along a first plane, and
a deflectable arm extending from the body along the first plane, wherein the arm is configured to deflect to receive a slider and to retract to clamp the slider.
16. The apparatus of claim 15 , wherein the deflectable arm includes a contact feature that extends towards the body.
17. The apparatus of claim 16 , wherein the deflectable arm is shaped such that the contact feature moves along a straight line when the deflectable arm is deflected.
18. A method for use with a slider test socket having a clamp with a body, handle with an opening and coupled to a contact feature, and a plurality of arms extending between the body at a first end of the clamp and the handle at a second end of the clamp, the method comprising:
exerting a first force in a first direction on the handle to deflect the plurality of arms in the first direction;
placing a slider between the contact feature and the body; and
releasing the first force on the handle such that the slider is clamped between the contact feature and the body.
19. The method of claim 18 , wherein the contact feature moves along a straight line as the handle is pulled.
20. The method of claim 18 , further comprising:
after releasing the first force, releasing a second force applied against an electrical connector coupled to the clamp such that the electrical connector is electrically coupled to the slider after the slider is clamped between the body and the contact feature.
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US16/701,470 US10839836B2 (en) | 2017-02-23 | 2019-12-03 | Slider test socket |
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US10839836B2 (en) | 2017-02-23 | 2020-11-17 | Seagate Technology Llc | Slider test socket |
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