US20160190918A1 - Isolator with reduced susceptibility to parasitic coupling - Google Patents
Isolator with reduced susceptibility to parasitic coupling Download PDFInfo
- Publication number
- US20160190918A1 US20160190918A1 US14/588,112 US201414588112A US2016190918A1 US 20160190918 A1 US20160190918 A1 US 20160190918A1 US 201414588112 A US201414588112 A US 201414588112A US 2016190918 A1 US2016190918 A1 US 2016190918A1
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- die
- capacitive element
- isolation
- semiconductor die
- lead frame
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Definitions
- the present disclosure is generally directed toward electronic isolation and devices for accommodating the same.
- Galvanic isolation is a principle of isolating functional sections of electrical systems to prevent current flow, meaning that no direct electrical conduction path is permitted between different functional sections.
- certain types of electronic equipment require that high-voltage components (e.g., 1 kV or greater) interface with low-voltage components (e.g., 10V or lower).
- high-voltage components e.g. 1 kV or greater
- low-voltage components e.g., 10V or lower
- Examples of such equipment include medical devices and industrial machines that utilize high-voltage in some parts of the system, but have low-voltage control electronics elsewhere within the system.
- the interface of the high-voltage and low-voltage sides of the system relies upon the transfer of data via some mechanism other than electrical current.
- isolation products include galvanic isolators, opto-couplers, inductive, and capacitive isolators.
- Previous generations of electronic isolators used two chips in a horizontal configuration with wire bonds between the chips. These wire bonds provide a coupling point for large excursions in the difference between the grounds of the systems being isolated. These excursions can be on the order of 25,000 V/usec.
- electrical isolation can be achieved with capacitive, inductive isolators, and/or RF isolators to transmit data across an isolation boundary.
- the capacitive approach may employ a small capacitor, say 100 fF across the isolation boundary.
- the receiver needs to detect the transmitted signal in the presence of large excursions that have roughly the same bandwidth of interest.
- Prior capacitive isolators use a planar package design in which two chips are separated in the horizontal direction and the coupling device is connected via chip-to-chip wire bond(s).
- the prior solutions may have the coupling device integrated into the receiver or they may employ a third chip that has the coupling device.
- the wire bond acts like an antenna with about 1-2 nH of inductance. This inductor is suspended over the isolation boundary and has a certain coupling to the ground planes of both chips. Since most couplers are differential, there are at least two of these wire bonds. If the coupling to these wire bonds is not balanced, then the large common mode rejection excursions (e.g., 1000V at rate of 25,000V/usec) will turn into differential voltages via this unbalanced coupling.
- FIG. 1 is a schematic block diagram depicting a first capacitive isolation system in accordance with embodiments of the present disclosure
- FIG. 2A is a top view of a first example of two dies used in a capacitive isolation system prior to placement of the dies into an operating position in accordance with embodiments of the present disclosure
- FIG. 2B is a cross-sectional side view of the two dies from FIG. 2A placed in an operating position in accordance with embodiments of the present disclosure
- FIG. 2C is a schematic circuit diagram depicting the two dies from FIGS. 2A and 2B ;
- FIG. 3A is a top view of a second example of two dies used in a capacitive isolation system prior to placement of the dies into an operating position in accordance with embodiments of the present disclosure
- FIG. 3B is a cross-sectional side view of the two dies from FIG. 3A placed in an operating position in accordance with embodiments of the present disclosure
- FIG. 4A is a top view of a third example of two dies used in a capacitive isolation system prior to placement of the dies into an operating position in accordance with embodiments of the present disclosure
- FIG. 4B is a cross-sectional side view of the two dies from FIG. 4A placed in an operating position in accordance with embodiments of the present disclosure
- FIG. 5 is a schematic block diagram depicting a second capacitive isolation system in accordance with embodiments of the present disclosure
- FIG. 6 is a top view of an example of two dies used in the second capacitive isolation system depicted in FIG. 5 ;
- FIG. 7A is a schematic block diagram depicting input and output signals in a capacitive isolation system when the capacitance of each capacitor in the isolation system is approximately matched;
- FIG. 7B is a schematic block diagram depicting input and output signals in a capacitive isolation system when the capacitance of one capacitor does not match the capacitance of another capacitor;
- FIG. 7C is a schematic diagram depicting a first example of an adjustable capacitive circuit in accordance with embodiments of the present disclosure.
- FIG. 7D is a schematic diagram depicting a second example of an adjustable capacitive circuit in accordance with embodiments of the present disclosure.
- FIG. 7E is a top view of portions of a transmitter and receiver die used to implement an adjustable capacitive circuit in accordance with embodiments of the present disclosure
- FIG. 8 is an isometric view of a first manufacturing step for manufacturing a capacitive isolator in accordance with embodiments of the present disclosure
- FIG. 9 is an isometric view of a second manufacturing step for manufacturing a capacitive isolator in accordance with embodiments of the present disclosure.
- FIG. 10 is an isometric view of a third manufacturing step for manufacturing a capacitive isolator in accordance with embodiments of the present disclosure.
- FIG. 11 is an isometric view of a fourth manufacturing step for manufacturing a capacitive isolator in accordance with embodiments of the present disclosure.
- FIG. 12 is an isometric view of a fifth manufacturing step for manufacturing a capacitive isolator in accordance with embodiments of the present disclosure
- FIG. 13 is a side view of a capacitive isolator in accordance with embodiments of the present disclosure.
- FIG. 14 is a side view of the capacitive isolator from FIG. 13 with a first set of dimensions depicted thereon;
- FIG. 15 is a side view of the capacitive isolator from FIG. 13 with additional details of the components depicted thereon;
- FIG. 16 is a side view of the capacitive isolator from FIG. 13 showing potential placement of driver circuitry in the die in accordance with embodiments of the present disclosure.
- transparent should be given the broadest meaning possible within the context of the present disclosure. For example, something that is described as being “transparent” should be understood as having a property allowing no significant obstruction or absorption of electromagnetic radiation in the particular wavelength (or wavelengths) of interest, unless a particular transmittance is provided.
- isolation systems various configurations of isolation systems, isolators, isolation devices, and intermediate isolator configurations are depicted and described.
- the isolation systems depicted in the figures correspond to isolation systems of components thereof at intermediate stages of manufacturing (or in disassembled states), one of ordinary skill in the art will appreciate that any of the intermediate products herein can be considered an isolator or isolation system without departing from the scope of the present disclosure.
- the isolators described herein may be incorporated into any system which requires current and/or voltage monitoring, but is susceptible to transients.
- the isolation system in which an isolator described herein is rated to operate at about 5 kV, 10 kV, or more.
- the system 100 is shown to include a driver chip 104 and a receiver chip 108 separated by an isolation boundary 112 .
- the driver chip 104 may also behave as a receiver chip 108 and the receiver chip 108 may behave as a driver chip 104 during certain times or when information is to be communicated from the chip 108 to chip 104 .
- both chips may operate as drivers and receivers without departing from the scope of the present disclosure.
- the driver chip 104 will be explained as a component that is connected to a circuit (e.g., an input circuit) whose current and/or voltage is being measured and by the receiver chip 108 at an output circuit.
- the isolation boundary 112 is provided to electrically insulate the currents/voltages at the input circuit from the output circuit.
- isolation capacitors 116 Communication of the input signal 102 across the isolation boundary is achieved by one or more isolation capacitors 116 .
- the plates/pads of one or more capacitors 116 on the driver chip side are shown as being approximately the same size as the plates/pads of the one or more capacitors 116 on the receiver chip side, it should be appreciated that the pads of the capacitor may not necessarily be of the same size.
- the plate/pad on the driver chip side may be larger than the plate/pad on the receiver chip side, or vice versa. Said another way, embodiments of the present disclosure are not limited to the illustrative system 100 and the sizes of the components depicted therein.
- both the driver chip 104 and receiver chip 108 are shown to be using the same ground, it should be appreciated that the chips 104 , 108 may not necessarily, and often will not, use the same ground or common potential.
- the parasitic capacitance of the receiver side, Cpr, and parasitic capacitance of the driver side, Cpd is quite large compared to the isolation capacitors 116 a, 116 b.
- the parasitic capacitance inherent to a die e.g., between the plate and the leadframe
- the capacitance between the first die and second die e.g., size of the isolation capacitor 116 a, 116 b Ciso. This means that most of the input signal 102 is lost to parasitic capacitance.
- isolation capacitors form a voltage divider with the input signal 102 and cause the receiver sensitivity to have to be increased to recover the transmitted signal.
- embodiments of the present disclosure aim to create the capacitive elements 116 a, 116 b (isolation capacitors) by using organic tape, spin-on material, or the like and then placing the plates of the capacitive elements in face-to-face contact. Examples of such physical configurations are further depicted and described in connection with FIGS. 2A-4B .
- FIGS. 2A-2C a first example of two dies 204 , 208 used in a capacitive isolation system 100 will be described in accordance with embodiments of the present disclosure.
- FIG. 2A depicts the two dies 204 , 208 from above prior to placement of the dies 204 , 208 into an operating position in accordance with embodiments of the present disclosure.
- FIG. 2B shows the two dies 204 , 208 placed in a face-to-face orientation, thereby creating an example of a capacitive isolator.
- the dies 204 , 208 may correspond to semiconductor dies manufactured using silicon-based manufacturing techniques.
- the dies 204 , 208 may have one or many layers that enable the dies 204 , 208 to carry an electrical signal received from an external contact (e.g., a bonding pad 210 ) to a capacitive element (e.g., capacitive elements or plates 216 , 224 ). Although the details of the dies 204 , 208 are not depicted herein, it should be appreciated that any type of semiconductor die may be used in accordance with embodiments of the present disclosure.
- the bonding pad 210 and/or capacitive elements 216 , 224 may be embodied as a number of different structures.
- the term “capacitive element”, “capacitive element”, and “capacitive plate” may be used interchangeably to refer to one or multiple structures in a die 204 , 208 that provide the capacitive functionality described herein.
- These capacitive elements may correspond to a metal plate or layer of metallic material having a defined area.
- a capacitive element may correspond to a metal plate with some opening (e.g., without passivation) and a protective circuit positioned below for a bond or probe.
- a capacitive element may alternatively or additionally correspond to a simple metal plate (e.g., gold, silver, copper, tin, etc.) or a non-metal plate, such as a polysilicon layer.
- a simple metal plate e.g., gold, silver, copper, tin, etc.
- a non-metal plate such as a polysilicon layer.
- any of the capacitive elements described and claimed herein may correspond to a traditional metal area of material or a polysilicon layer of material.
- the metal layer may or may not be covered by a passivation layer.
- each die 204 , 208 may comprise internal driver circuitry (e.g., digital circuit components formed in silicon).
- the driver circuitry is not located beneath either the bonding pads 210 or the capacitive elements 216 , 224 .
- the driver circuitry can be located beneath the capacitive elements 216 , 224 without departing from the scope of the present disclosure. In particular, if reduction of die size is desired, then the driver circuitry may be placed beneath the transmitting capacitive elements 224 .
- the first die 204 may correspond to one of the driver chip 104 or receiver chip 108 and the second die 208 may correspond to the other of the driver chip 104 or receiver chip 108 .
- the first and second dies 204 , 208 may be formed from a common piece of silicon or separate pieces of silicon.
- the first die 204 and second die 208 each have isolation layers 240 formed thereon.
- the isolation layers 240 formed on each chip may be provided as a thin film of polyimide or the like that is formed on the entirety of the top surface of the first and second die 204 , 208 .
- the polyimide film is spun onto the top surface of the silicon forming the dies 204 , 208 .
- the thickness of the spin-on polyimide formed on each die 204 , 208 may be between 10 um and 40 um, with a preferred thickness of 12.5 um per-die.
- an isolation boundary 112 created by the isolation layers 240 may be on the order of 25.0 um.
- the film 240 further includes a plurality of openings 206 .
- Each of the openings 206 expose bonding or contact pads 210 for each die 204 , 208 .
- the bonding pads 210 are used to connect one or more bond wires 244 between the dies 204 , 208 and lead frames 248 , 252 .
- the openings 206 are established in the isolation layer 240 with an area at least as large as the area of the bonding pads 210 .
- the opposite side of the die 204 , 208 may correspond to a capacitor side 236 .
- the capacitor side 236 of the die 204 , 208 may comprise one or more drive isolation capacitor components and one or more receive isolation capacitor components.
- each die 204 , 208 may comprise a drive portion 228 and a receive portion 220 .
- the drive portion 228 of one die e.g., first die 204
- the drive portion 228 of the other die e.g., the second die 208
- a receive portion 220 of one die may be positioned opposite the drive portion 228 (e.g., at a bottom portion of the die). This means that when one die is turned upside down and placed in a face-to-face configuration with the other die, the drive portion 228 of one die is directly opposite to the receive portion 220 of the other die.
- each die 204 , 208 may comprise one or more transmitting capacitive elements 224 and the receive portion 220 may comprise one or more receiving capacitive elements 216 .
- each die 204 , 208 comprises a first receiving capacitive element 216 a and a second receiving capacitive element 216 b for the receive portion 220 .
- Each die 204 , 208 is also depicted as having a first transmitting capacitive element 224 a and a second transmitting capacitive element 224 b for the drive portion 228 .
- the bonding pads 210 , receiving capacitive elements 216 , and transmitting capacitive elements 224 may all be formed on the top surface of the die 204 , 208 . Some or all of these pads may be formed with one or more of a metal, poly, or diffusion. In some embodiments, the pads (e.g., bonding pads 210 , receiving capacitive elements 216 , and transmitting capacitive elements 224 ) are formed on the top most layer of metal in the IC-formation process. By placing the bottom plate as high as possible in the oxide stack, the parasitic capacitances, Cpd and Cpr, are minimized.
- the driver parasitic capacitance Cpd could be larger and, as such, the transmitting capacitive elements 224 a, 224 b could be lower in the oxide stack due to the low impedance of this node.
- the receiving capacitive elements 216 a, 216 b which is most sensitive to parasitic capacitances, is used to define the capacitor (e.g., capacitor size in Farads and area) when the two dies 204 , 208 are placed face-to-face.
- the transmitting capacitive element 224 a, 224 b is enlarged as compared to the receiving capacitive elements 216 a, 216 b to compensate for alignment mismatch due to the chip placement tolerance relative to each other in the face-to-face configuration.
- the thickness of the isolation layer 240 is a tradeoff between the desire to have a thin isolation layer 240 , thereby increasing the value/size of the isolation capacitors 116 a, 116 b formed by the transmitting and receiving capacitive elements with the need to have a thick isolation layer 240 , thereby increasing the isolation voltage rating of the isolator.
- the isolation layer 240 When the isolation layer 240 is applied/formed on top of the die 204 , 208 , the capacitive elements 216 , 224 may be covered. As mentioned above, the bonding pads 210 are exposed through the isolation layer 240 via openings 206 that coincide with the bonding pads 210 .
- the first receiving capacitive element 216 a of one die 204 , 208 at least partially overlies the first transmitting capacitive element 224 a of the other die 204 , 208 .
- This at least a partial overlap may correspond to a full overlap (e.g., a 100% overlap).
- at least a partial overlap may correspond to at least a 90% overlap, at least a 70% overlap, or some other percentage of overlap, which may be dependant upon manufacturing tolerances and/or design requirements.
- the second receiving capacitive element 216 b of one die 204 , 208 also at least partially overlies the second transmitting capacitive element 224 b of the other die 204 , 208 .
- FIGS. 2A and 2B also exhibit a scheme for ensuring that alignment issues during manufacturing are accommodated.
- the receiving capacitive elements 216 are shown to have an area less than the transmitting capacitive elements 224 .
- the ideal placement of one die relative to the other die would result in the center of the receiving capacitive elements 216 aligning with the center of the transmitting capacitive elements 224 .
- such ideal placement may not always occur during actual manufacturing, especially when isolators are being produced in high-volumes.
- the lead frames 248 , 252 supporting the dies 204 , 208 may correspond to metal lead frames that also connect the dies to external circuitry, such as a Printed Circuit Board (PCB) or the like.
- the lead frames may include a first lead frame portion 248 for connecting with the first die 204 and a second lead frame portion 252 for connecting with the second die 208 .
- the second lead frame portion 252 may receive the input signal 102 and, therefore, may be connected to an input side of the isolation system while the first lead frame portion 248 may provide the output signal 110 and, therefore, may be connected to an output side of the isolation system.
- the lead frame portions 248 , 252 may be conductive elements and have one or more leads.
- Examples of materials that can be used to form the lead frame portions 248 , 252 include, without limitation, metal (e.g., copper, silver, gold, aluminum, steel, lead, etc.), graphite, and/or conductive polymers.
- the lead frame portions 248 , 252 may be manufactured using machining, micro-machining, stamping, or other such manufacturing techniques.
- FIG. 2C shows a circuit diagram of the isolator of FIGS. 2A and 2B .
- the first die 204 and second die 208 may comprise a receive portion 220 and/or a drive portion 228 .
- FIG. 2C shows the optional configuration where each die comprises both a receive portion 220 and a drive portion 228 .
- the first die 204 may comprise either a receive portion 220 only, a driver portion 228 only, or a combination of the two.
- the second die 208 may be configured to accommodate the configuration of the first die 204 .
- multiple capacitive couplings may carry information from the drive portion 228 of one die to the receive portion 220 of the other die. These capacitive couplings may be similar in size/value or one capacitive coupling may be larger than the other. In some embodiments, the capacitive couplings are not a differential pair of capacitors.
- FIGS. 3A and 3B another example of two dies 304 , 308 used in a capacitive isolation system 100 will be described in accordance with embodiments of the present disclosure.
- FIG. 3A depicts the two dies 304 , 308 from above prior to placement of the dies 304 , 308 into an operating position in accordance with embodiments of the present disclosure.
- FIG. 3B shows the two dies 304 , 308 placed in a face-to-face orientation, thereby creating an example of a capacitive isolator.
- the dies 304 , 308 are similar to the dies 204 , 208 and share many similar or identical features therewith.
- a difference between dies 304 , 308 and dies 204 , 208 is that dies 304 , 308 comprise a single isolation layer 312 between them when positioned in a face-to-face orientation.
- a single isolation layer 312 is used to electrically isolate the first die 304 from the second die 308 .
- the single isolation layer 312 may comprise a similar thickness to the combined thicknesses of the isolation layers 240 .
- the isolation layer 312 may comprise a thickness of about 1 mil.
- a thicker isolation layer 312 (e.g., 2 mil) can be used, but such an isolation layer may decrease the size of the isolation capacitors 116 a, 116 b, especially with respect to the parasitic capacitances, Cpd and Cpr, thereby making the isolator less effective.
- the isolation layer 312 may correspond to a polyimide tape having silicone adhesives on both sides thereof.
- the polyimide tape may correspond to poly(4,4′-oxydiphenylene-pyromellitimide).
- the polyimide tape is a self-supporting structure (e.g., capable of physically supporting its own weight) that can be cut to a specific dimension and then applied to a top surface of one of die 304 , 308 . Then the die 304 , 308 may be positioned in a face-to-face configuration and the other side of the isolation layer 312 is pushed into contact with the top surface of the other die 304 , 308 .
- a self-supporting structure e.g., capable of physically supporting its own weight
- the isolation layer 312 may be configured to have a width that covers the overlapping regions of die 304 , 308 without extending all the way to the bonding pads 210 .
- the die 304 , 308 may not completely overlap one another.
- the wire sides 232 of the die 304 , 308 may be positioned furthest away from one another while the capacitor sides 236 are overlapped by the other die 304 , 308 .
- wire bonding corresponds to one type of electrical connection mechanism, it should be appreciated that embodiments of the present disclosure contemplate other functionally-equivalent mechanisms such as probing or the like.
- the bonding pads 210 , receiving capacitive elements 216 , and transmitting capacitive elements 224 may be formed at or near the top of the die 304 , 308 .
- the receiving capacitive elements 216 of one die 304 , 308 and transmitting capacitive elements 224 of the other die 304 , 308 may be physically separated from one another to create the isolation capacitors 116 a, 116 b.
- FIGS. 4A and 4B another example of two dies 404 , 408 used in a capacitive isolation system 100 will be described in accordance with embodiments of the present disclosure.
- FIG. 4A depicts the two dies 404 , 408 from above prior to placement of the dies 404 , 408 into an operating position in accordance with embodiments of the present disclosure.
- FIG. 4B shows the two dies 404 , 408 placed in a face-to-face orientation, thereby creating an example of a capacitive isolator.
- metallization is built on both sides of an isolation layer 412 .
- the isolation layer 412 can again be embodied as a polyimide tape having adhesive on both sides thereof.
- the metallization on each side of the isolation layer 412 may be positioned to connect with the transmitting capacitive elements 224 and receiving capacitive elements 216 via gold stud bonding or solder bumps 416 .
- the metallization may be in the form of a metallic pad expanding an area substantially similar to the transmitting/receiving capacitive elements.
- the receiving capacitive element 216 on the die 404 , 408 may be smaller than the transmitting capacitive element 224 on the die 404 , 408 ; however, the size of the capacitor is defined by the size of the metallization. Standard manufacturing techniques such as thermosonic bonding can then be used to connect the top surface of each die 404 , 408 to the metallization formed on the isolation layer 412 .
- the isolation layer 412 may correspond to tape or a similar electrically-insulating material.
- the isolation layer 412 may correspond to 25 um or 50 um thick tape having silicone adhesive on both sides thereof.
- the capacitive isolation system 500 is similar to capacitive isolation system 100 in that both systems comprise an input signal 102 , output signal 110 , driver chip 504 , receiver chip 508 , and one or more isolation capacitors 516 a, 516 b that are used to transmit signals across an isolation boundary 112 .
- the isolation capacitors 516 a, 516 b are different from isolation capacitors 116 a, 116 b in that the isolation capacitors 516 a, 516 b comprise multiple capacitive plates.
- FIG. 5 also shows a feature that may be shared with any other isolation system or isolator described herein. Specifically, the chips do not necessarily have to be connected to ground or a common voltage. Instead, each chip 504 , 508 may use different grounds or common potentials without departing from the scope of the present disclosure.
- FIGS. 5 and 6 also show that the capacitors can be configured in a common centroid configuration.
- a center of mass of the set of transmitting capacitive elements on one die may be substantially aligned (within machining and/or manufacturing tolerances) with a center of mass of the set of receiving capacitive elements on the other die.
- FIG. 6 shows how a cluster of four transmitting capacitive elements have a center of mass that is aligned with a center of mass for the cluster of four receiving capacitive elements of the other die.
- trying to align these centers of mass to achieve a common centroid configuration is difficult and subject to manufacturing processes, which may make it difficult to achieve a perfect common centroid configuration.
- FIG. 3B shows a cluster of two capacitive elements having a center of mass that is substantially aligned with the center of mass of the opposing capacitive elements on the other die.
- a common centroid configuration can help to minimize interference and/or noise in the isolation system.
- FIG. 6 depicts one non-limiting example of the capacitor construction that can be used to achieve the isolation capacitors 516 a, 516 b. While FIG. 6 shows an example of die 604 , 608 not having an isolation layer formed directly thereon (e.g., as a film and as described in connection with FIGS. 2A and 2B ) it should be appreciated that the die 604 , 608 may be constructed in accordance with principles described in connection with any of FIGS. 2A through 4B . For simplicity, FIG. 6 shows die 604 having no isolation layer formed thereon.
- each die 604 , 608 again shows a receive portion and drive portion.
- Each die 604 , 608 also exhibits one or more bonding pads 612 that are capable of being wire bonded to a lead frame supporting the die.
- the illustrative die 604 , 608 comprise a plurality of isolation capacitors 516 a, 516 b, each being formed with two or more individual capacitive plate pairs that are connected in parallel with one another.
- the receive and drive portions are shown to include four capacitive elements each, it should be appreciated that a greater or lesser number of capacitive elements may be included in each portion.
- the number of capacitive elements on a drive portion of one die should match the number of capacitive elements on a receive portion of the other die, and vice versa. It is not a requirement, however, that a single die have the same number of transmitting capacitive elements and receiving capacitive elements.
- Each die 604 , 608 is shown to include a first, second, third, and fourth receiving capacitive element 616 a, 616 b, 616 c, 616 d, respectively, as well as a first, second, third, and fourth transmitting capacitive element 620 a, 620 b, 620 c, 620 d, respectively.
- the first receiving capacitive element 616 a of one die may overlap with the second transmitting capacitive element 620 b of the other die.
- the second receiving capacitive element 616 b of one die may overlap with the first transmitting capacitive element 620 a of the other die.
- FIG. 7A depicts an ideal condition where the injection current flowing from the driver chip 708 to the receiver chip 704 approximately equals the injection current flowing from the receiver chip 704 to the driver chip 708 . This will result in approximately the same Vpositive peak amplitude and Vnegative peak amplitude.
- FIG. 7B depicts the scenario where some capacitor mismatch exists and the value of one isolation capacitor does not equal the value of another isolation capacitor. If the isolation capacitors are not equal, then the current injected from the driver chip 708 to the receiver chip 704 will be different from the current injected from the receiver chip 704 to the driver chip 708 . This will result in Vpositive peak amplitude being different from Vnegative peak amplitude. For example, if the first isolation capacitor (e.g., the capacitor carrying injection current from driver chip 708 to receiver chip 704 ) is greater than the second isolation capacitor (e.g., the capacitor carrying injection current from the receiver chip 704 to the driver chip 708 ), then the Vpositive peak amplitude will be greater than the Vnegative peak amplitude.
- the first isolation capacitor e.g., the capacitor carrying injection current from driver chip 708 to receiver chip 704
- the second isolation capacitor e.g., the capacitor carrying injection current from the receiver chip 704 to the driver chip 708
- Vpositive peak amplitude will be less than the Vnegative peak amplitude.
- the differences in Vpositive peak amplitude and Vnegative peak amplitude can be leveraged to calibrate the isolation capacitors with the use of a differential peak detector 716 and one or more adjustable capacitive circuits 712 a, 712 b.
- one or more additional spare capacitors in either a first adjustable capacitive circuit 712 a or a second adjustable capacitive circuit 712 b can be selective switched on the receive side of the capacitor until the value of the first isolation capacitor approximately equals the value of the second isolation capacitor (or the Vpositive peak amplitude approximately equals the value of the Vnegative peak amplitude).
- a differential peak detector 716 may be used to compare the Vpositive peak amplitude with the Vnegative peak amplitude and, based on such comparisons, provide one or more adjustment signals to the adjustable capacitive circuits 712 a, 712 b thereby switching on or off one or more switchable capacitive portions of the isolation capacitors.
- an isolation capacitor may comprise a transmitting capacitive element 724 and a receiving capacitive element 728 .
- the transmitting capacitive element 724 may be similar or identical to some or all of the transmitting capacitive elements already described herein.
- the receiving capacitive element 728 in the adjustable capacitive circuit 712 may be different from the other receiving capacitive elements described herein.
- a receiving capacitive element 728 may comprise a main receiving portion 732 and a secondary receiving portion 736 .
- the main receiving portion 732 may constitute the majority of the receiving capacitive element area whereas the secondary receiving portion 736 may constitute a minority of the receiving capacitive element area.
- the combined area of the capacitive elements included in the secondary receiving portion 736 may comprise less than 1/10th the area of the main receiving portion 732 .
- some or all of the capacitive elements included in the secondary receiving portion 736 may be dynamically switchable via one or several control switches 720 .
- the control switches 720 may correspond to active switches in the receiver chip 704 and/or driver chip 708 . Examples of such control switches 720 include, without limitation, transistors, MOSFETs (n-type or p-type), or the like.
- the actuation of the control switches 720 may be driven by the differential peak detector 716 that attempts to selectively switch on and/or off one or more receiving capacitive elements in the secondary receiving portion 736 .
- the value of one or both isolation capacitors can be dynamically adjusted to accommodate variations in capacitance due to various operational conditions, manufacturing imperfections, and the like.
- the receiving capacitive elements included in the secondary receiving portion 736 may be approximately the same size. As seen in FIG. 7D , the receiving capacitive elements in the secondary receiving portion 736 may be different sizes.
- the utilization of differently-sized receiving capacitive elements e.g., of size C, 2C, 4C, etc.
- the larger capacitive element e.g., of size 4C
- the smaller capacitive element(s) e.g., of size C
- the smaller capacitive element(s) can be used for fine-grain calibration whereas the larger capacitive elements can be used for larger calibration adjustments.
- FIG. 7E shows a general placement of the transmitting capacitive elements 724 a - d that can be included in the transmitting side of a die 704 , 708 as compared to placement of the receiving capacitive element 728 .
- the secondary receiving portion 736 may be located along a common side of the main receiving portion 732 or around a perimeter of the main receiving portion 732 . As receiving capacitive elements in the secondary receiving portion 736 are switched on, the effective area of the receiving capacitive element 728 may be increased, thereby increasing the size of the isolation capacitor.
- FIG. 7E only depicts a transmitting side of the driver chip 708 and a receiving side of the receiving chip 704 , it should be appreciated that the chips 704 , 708 may each comprise a transmitting and receiving portion, which may or may not be similar to one another.
- FIG. 7E also shows how the smaller receiving capacitive elements 728 are positioned in relation to the larger main receiving portion 732 .
- the smaller receiving pads 736 may have a size that is between about 2% and 10% the size of the main receiving portion 736 . More specifically, the smaller receiving pads 736 may have a size that is between about 3% and 7% the size of the main receiving portion 736 .
- the smaller receiving pads 736 may have a size that is approximately 5% the size of the main receiving portion 736 . Stated another way, the smaller receiving pads 736 may have a size on the order of 100 um to accommodate approximately 100 um manufacturing tolerances.
- the smaller and multiple receiving capacitive elements 736 enable fine-grained calibration/tuning of the receiving capacitive element 728 to the transmitting capacitive element 724 .
- FIG. 7E shows the smaller receiving pads 736 as being approximately the same size as one another, it should be appreciated that the smaller receiving pads 736 may be of different sizes/areas as shown in FIG. 7D . It should also be appreciated that the smaller receiving pads 736 may circumnavigate the entire main receiving portion 732 or they may reside adjacent to three or two sides of the main receiving portion 732 rather than just residing adjacent to a single side of the main receiving portion 732 as shown.
- some of the smaller receiving pads 736 may have the same size, but contribute different capacitances as the capacitors can be formed on a bent lead frame, thereby causing the receiving capacitive elements 736 to be spaced apart from the transmitting capacitive element 724 by different distances.
- the method begins with the separate construction of a transmitting side 804 and receiving side 808 of the isolator ( FIG. 8 ).
- the transmitting side 804 may also be configured to receive signals from receiving side 808 and the receiving side 808 may also be configured to transmit signal to the receiving side 804 .
- Use of the terms “receiving” and “transmitting” side are merely used for illustrative purposes.
- the transmitting side 804 may include a first lead frame portion 820 having a transmitting die 812 mounted thereon as well as a first set of leads 828 .
- the receiving side 808 may include a second lead frame portion 824 having a receiving die 816 mounted thereon as well as a second set of leads 832 .
- the first set of leads 828 may connect to a high-voltage side of an isolation system whereas the second set of leads 832 may connect to a low-voltage side of the isolation system (or vice versa).
- the number of leads 828 , 832 included in a lead frame 804 , 808 , respectively, may vary from one to tens or hundreds.
- the depiction of six leads in both the first set of leads 828 and second set of leads 832 should not be construed as limiting embodiments of the present disclosure.
- the lead frame portions may be bent in such a way that the leads 828 , 832 are not co-planar with the portion of the lead frames supporting the die 812 , 816 .
- the die 812 , 816 may be mounted to the lead frame portions 820 , 824 using adhesives, mechanical fittings, or the like.
- the manufacturing process continues by wire bonding some or all of the bonding pads included on each die to the leads of the lead frame ( FIG. 9 ). Specifically, one side of a wire bond 904 may be soldered or otherwise attached to the bonding pads whereas the other side of a wire bond 904 may be soldered or otherwise attached to the lead frame or a specific lead on the lead frame portion.
- an isolation layer 1004 may be placed on one of the die to cover or overlie the capacitive elements thereof ( FIG. 10 ).
- the isolation layer 1004 may correspond to double-sided insulative tape that is cut to a desired length and then placed on one of the dies.
- the isolation layer 1004 may correspond to a thin-film deposited on top surfaces of both dies and then openings may be established therein to expose the bonding pads of the dies. In such an embodiment, the formation of the isolation layer 1004 may occur before the wire bonding.
- the method continued by placing one lead frame over and adjacent to the other lead frame (step 1104 shown in FIG. 11 ), thereby placing the capacitive elements of one die in close proximity to the conductive pads of the other die. It should be appreciated that any number of placement methods could be used such as pick-and-place, folding, bending, flipping, etc. Moreover, the capacitive elements are placed close enough to one another to enable the transmission of information across the isolation boundary 112 established by the isolation layer(s) 1004 . This placement process may be performed by an automated pick-and-place machine or the like.
- the manufacturing process continues with a step of molding the lead frame portions 1208 and the die mounted thereon in a substantially fixed relative position with a housing 1204 or mold material. Additional manufacturing steps may include trimming the leads 1216 and forming the leads 1216 into a desired formation.
- the depicted embodiment shows the leads as having a specific configuration (e.g., surface mount configurations), it should be appreciated that the leads 1216 or relevant sections protruding from the housing 1204 may comprise any type of known, standardized, or yet-to-be developed configuration such as straight-cut leads, J leads, SOJ leads, gullwing, reverse gullwing, etc.
- the housing 1204 provides a way to protect the die and the other components attached thereto while the leads 1216 enable the isolator 1200 to be connected to external circuitry (e.g., a PCB).
- FIG. 13 shows the isolation system 1300 as comprising a first lead frame 1304 , a second lead frame 1308 , a first die 1312 , a second die 1316 , a first set of bonding wires 1320 , a second set of bonding wires 1324 , and an isolation layer 1328 .
- the first die 1312 is mounted on the first lead frame 1304 and the second die 1316 is mounted on the second lead frame 1308 .
- the first die 1312 and second die 1316 are positioned in a face-to-face configuration with the isolation layer 1328 sandwiched therebetween.
- the lead frames 1304 , 1308 act as a Faraday shield against electromagnetic interference (EMI) as they enclose the two die 1312 , 1316 and the isolation layer 1328 .
- the first and second lead frames 1304 , 1308 may form a conductive enclosure that substantially surrounds the first and second dies 1312 , 1316 such that the enclosure formed thereby substantially blocks external static and non-static electric and magnetic fields.
- the first and second lead frames 1304 , 1308 may be configured to have substantially constant voltage.
- the isolation layer 1328 may be embodied as any type of isolation layer already described herein.
- the first die 1312 comprises a first thickness t 1 and the second die comprises a second thickness 1316 t 2 .
- the isolation layer 1328 may comprise a third thickness t 3 .
- the third thickness t 3 is designed to have a good balance between voltage isolation and signal coupling between the first die 1312 and second die 1316 .
- the thickness variation of the isolation layer 1328 should be kept relatively small.
- FIG. 13 also shows the first lead frame 1304 as having a first downset distance d 1 and the second lead frame 1308 as having a second downset distance d 2 .
- the downset distances d 1 , d 2 correspond to a dimension created by twice folding the lead frames 1304 , 1308 .
- the shortest distance from the bonding area of the lead frame and the leads of the lead frame may be considered the downset distance d 1 , d 2 .
- the downset distance d 1 , d 2 correspond to a height between a bonding surface of the lead frame and a top surface of the leads.
- the downset distances d 1 , d 2 are designed to be similar or identical to one another. A valuable design consideration may attempt to have the downset distances d 1 , d 2 such that both the first die 1312 and second die 1316 make contact with the isolation layer 1328 when the first die 1312 is positioned over the second die 1316 .
- FIG. 14 shows additional dimensions of the isolation system 1300 .
- the first set of bonding wires 1320 may have a first loop height h 1 and the second set of bonding wires 1324 may have a second loop height h 2 .
- the first loop heights h 1 is approximately equal to the second loop height h 2 .
- the thickness of the isolation layer 1328 is a third thickness t 3 .
- the first and second loop heights h 1 , h 2 are designed to be smaller than the first and second thicknesses t 1 , t 2 , respectively. Such dimensionality helps to prevent the bonding wires 1320 , 1324 from shorting to the top surface of the opposing lead frame 1304 , 1308 . In some embodiments, a margin of approximately 50 um is established between the thickness t 1 or t 2 and the loop height h 1 or h 2 , respectively.
- the third thickness t 3 is approximately 25 um to 50 um itself
- the total distance between the lead frames 1304 , 1308 e.g., the sum of t 1 , t 2 , and t 3
- the thin isolation layer 1328 results in the capacitive plates positioned on a surface or within the die 1312 , 1316 are relatively close to one another, thereby facilitating an efficient transfer of information via the capacitor.
- the percentage of the third thickness t 3 to the total distance between the lead frames 1304 , 1306 may be less than 17%, or more specifically may be less than 14% and, in some embodiments, may be less than 12% and may even be as small as 2% or less.
- capacitive plates may be formed elsewhere on or within the dies 1312 , 1316 .
- one or both capacitive plates may be formed within their respective die 1312 , 1316 rather than on a surface thereof. Additional details of such options for capacitive plate placement will now be discussed in connection with FIGS. 15 and 16 .
- the first lead frame 1304 is shown to include a first surface 1504 and an opposing second surface 1508 .
- the first surface 1504 of the first lead frame 1304 may be faced toward a first face 1520 of the second lead frame 1308 .
- the second lead frame 1308 may also comprise a second surface 1524 that opposes the first surface 1520 thereof.
- the total distance between the lead frames 1304 , 1308 e.g., the sum of t 1 , t 2 , and t 3
- the first surface 1504 of the first lead frame 1304 may have the first die 1312 mounted thereon.
- the first surface 1520 of the second lead frame 1308 may have the second die 1316 mounted thereon.
- the first die 1312 may have a first surface 1512 and an opposing second surface 1516 .
- the second die 1316 may also have a first surface 1528 and a second surface 1532 .
- the first surface 1512 of the first die 1312 is in direct contact with the first surface 1504 of the first lead frame 1312 .
- the first surface 1512 of the first die 1312 may be adjacent to the first surface 1504 of the first lead frame 1312 , but some intermediate material (e.g., a bonding material or tape) may be provided between the components.
- first surface 1528 of the second die 1316 may be mounted in direct contact with the first surface 1520 of the second lead frame 1316 .
- first surface 1528 of the second die 1528 may be adjacent to the first surface 1520 of the second lead frame 1316 , but some intermediate material may be provided between the components.
- the second surface 1516 of the first die 1312 may be facing and proximate to the second surface 1532 of the second die 1316 .
- the isolation layer 1328 may correspond to the only material that resides between the second surface 1516 of the first die 1312 and the second surface 1528 of the second die 1316 .
- the distance between the second surface 1512 of the first die 1312 and the second surface 1532 of the second die 1316 may correspond to the third thickness t 3 , which may be relatively small as compared to the distance between the first surface 1504 of the first lead frame 1304 and the first surface 1520 of the second lead frame 1308 .
- the capacitive plates may be formed on the second surfaces 1516 , 1532 of the first and second dies 1312 , 1316 , respectively.
- one or both of the transmitting and receiving capacitive plates may be formed anywhere within the structure of the die.
- a capacitive plate (transmitting or receiving) may be formed on a first surface 1512 , 1528 of either the first die 1312 or second die 1316 .
- a capacitive plate may be formed somewhere between the first surface and second surface of the die.
- FIG. 16 shows two possible locations 1604 a, 1604 b for placement of a capacitive plate within the structure of the die 1304 or 1308 .
- the placement of the driver circuitry may also reside within the structure of the die or at a surface thereof (e.g., either the first surface of the die or the second surface of the die).
- the driver circuitry may be positioned at one of the possible locations 1604 a, 1604 b within the die 1312 , 1316 .
- the driver circuitry may be positioned within the structure of the die and in an overlapping arrangement relative to a capacitive plate formed on a second or first surface of the die. Such a position may correspond, for example, to the first possible location 1604 a.
- the driver circuitry may be positioned within the structure of the die, but in a non-overlapping arrangement relative to a capacitive plate formed on a second or first surface of the die. Such a position may correspond, for example, to the second possible location 1604 b.
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Abstract
Description
- The present disclosure is generally directed toward electronic isolation and devices for accommodating the same.
- There are many types of electrical systems that benefit from electrical isolation. Galvanic isolation is a principle of isolating functional sections of electrical systems to prevent current flow, meaning that no direct electrical conduction path is permitted between different functional sections. As one example, certain types of electronic equipment require that high-voltage components (e.g., 1 kV or greater) interface with low-voltage components (e.g., 10V or lower). Examples of such equipment include medical devices and industrial machines that utilize high-voltage in some parts of the system, but have low-voltage control electronics elsewhere within the system. The interface of the high-voltage and low-voltage sides of the system relies upon the transfer of data via some mechanism other than electrical current.
- Other types of electrical systems such as signal and power transmission lines can be subjected to voltage surges by lightning, electrostatic discharge, radio frequency transmissions, switching pulses (spikes), and perturbations in power supply. These types of systems can also benefit from electrical isolation.
- Electrical isolation can be achieved with a number of different types of devices. Some examples of isolation products include galvanic isolators, opto-couplers, inductive, and capacitive isolators. Previous generations of electronic isolators used two chips in a horizontal configuration with wire bonds between the chips. These wire bonds provide a coupling point for large excursions in the difference between the grounds of the systems being isolated. These excursions can be on the order of 25,000 V/usec.
- As mentioned above, electrical isolation can be achieved with capacitive, inductive isolators, and/or RF isolators to transmit data across an isolation boundary. The capacitive approach may employ a small capacitor, say 100 fF across the isolation boundary. For the receiver to discern logic level swings differentiated across the isolation boundary, the receiver needs to detect the transmitted signal in the presence of large excursions that have roughly the same bandwidth of interest.
- Prior capacitive isolators use a planar package design in which two chips are separated in the horizontal direction and the coupling device is connected via chip-to-chip wire bond(s). The prior solutions may have the coupling device integrated into the receiver or they may employ a third chip that has the coupling device. In either scenario, the wire bond acts like an antenna with about 1-2 nH of inductance. This inductor is suspended over the isolation boundary and has a certain coupling to the ground planes of both chips. Since most couplers are differential, there are at least two of these wire bonds. If the coupling to these wire bonds is not balanced, then the large common mode rejection excursions (e.g., 1000V at rate of 25,000V/usec) will turn into differential voltages via this unbalanced coupling.
- It would be desirable to employ a capacitive isolator that minimizes the coupling to this node by removing the wire bonds and making this node as short as possible. It would also be desirable to achieve these goals without increasing production costs to the point where high-volume production is not feasible.
- The present disclosure is described in conjunction with the appended figures, which are not necessarily drawn to scale:
-
FIG. 1 is a schematic block diagram depicting a first capacitive isolation system in accordance with embodiments of the present disclosure; -
FIG. 2A is a top view of a first example of two dies used in a capacitive isolation system prior to placement of the dies into an operating position in accordance with embodiments of the present disclosure; -
FIG. 2B is a cross-sectional side view of the two dies fromFIG. 2A placed in an operating position in accordance with embodiments of the present disclosure; -
FIG. 2C is a schematic circuit diagram depicting the two dies fromFIGS. 2A and 2B ; -
FIG. 3A is a top view of a second example of two dies used in a capacitive isolation system prior to placement of the dies into an operating position in accordance with embodiments of the present disclosure; -
FIG. 3B is a cross-sectional side view of the two dies fromFIG. 3A placed in an operating position in accordance with embodiments of the present disclosure; -
FIG. 4A is a top view of a third example of two dies used in a capacitive isolation system prior to placement of the dies into an operating position in accordance with embodiments of the present disclosure; -
FIG. 4B is a cross-sectional side view of the two dies fromFIG. 4A placed in an operating position in accordance with embodiments of the present disclosure; -
FIG. 5 is a schematic block diagram depicting a second capacitive isolation system in accordance with embodiments of the present disclosure; -
FIG. 6 is a top view of an example of two dies used in the second capacitive isolation system depicted inFIG. 5 ; -
FIG. 7A is a schematic block diagram depicting input and output signals in a capacitive isolation system when the capacitance of each capacitor in the isolation system is approximately matched; -
FIG. 7B is a schematic block diagram depicting input and output signals in a capacitive isolation system when the capacitance of one capacitor does not match the capacitance of another capacitor; -
FIG. 7C is a schematic diagram depicting a first example of an adjustable capacitive circuit in accordance with embodiments of the present disclosure; -
FIG. 7D is a schematic diagram depicting a second example of an adjustable capacitive circuit in accordance with embodiments of the present disclosure; -
FIG. 7E is a top view of portions of a transmitter and receiver die used to implement an adjustable capacitive circuit in accordance with embodiments of the present disclosure; -
FIG. 8 is an isometric view of a first manufacturing step for manufacturing a capacitive isolator in accordance with embodiments of the present disclosure; -
FIG. 9 is an isometric view of a second manufacturing step for manufacturing a capacitive isolator in accordance with embodiments of the present disclosure; -
FIG. 10 is an isometric view of a third manufacturing step for manufacturing a capacitive isolator in accordance with embodiments of the present disclosure; -
FIG. 11 is an isometric view of a fourth manufacturing step for manufacturing a capacitive isolator in accordance with embodiments of the present disclosure; -
FIG. 12 is an isometric view of a fifth manufacturing step for manufacturing a capacitive isolator in accordance with embodiments of the present disclosure; -
FIG. 13 is a side view of a capacitive isolator in accordance with embodiments of the present disclosure; -
FIG. 14 is a side view of the capacitive isolator fromFIG. 13 with a first set of dimensions depicted thereon; -
FIG. 15 is a side view of the capacitive isolator fromFIG. 13 with additional details of the components depicted thereon; and -
FIG. 16 is a side view of the capacitive isolator fromFIG. 13 showing potential placement of driver circuitry in the die in accordance with embodiments of the present disclosure. - The ensuing description provides embodiments only, and is not intended to limit the scope, applicability, or configuration of the claims. Rather, the ensuing description will provide those skilled in the art with an enabling description for implementing the described embodiments. It being understood that various changes may be made in the function and arrangement of elements without departing from the spirit and scope of the appended claims.
- Various aspects of the present disclosure will be described herein with reference to drawings that are schematic illustrations of idealized configurations. As such, variations from the shapes of the illustrations as a result, for example, manufacturing techniques and/or tolerances, are to be expected. Thus, the various aspects of the present disclosure presented throughout this document should not be construed as limited to the particular shapes of elements (e.g., regions, layers, sections, substrates, etc.) illustrated and described herein but are to include deviations in shapes that result, for example, from manufacturing. By way of example, an element illustrated or described as a rectangle may have rounded or curved features and/or a gradient concentration at its edges rather than a discrete change from one element to another. Thus, the elements illustrated in the drawings are schematic in nature and their shapes are not intended to illustrate the precise shape of an element and are not intended to limit the scope of the present disclosure.
- It will be understood that when an element such as a region, layer, section, substrate, or the like, is referred to as being “on” another element, it can be directly on the other element or intervening elements may also be present. In contrast, when an element is referred to as being “directly on” another element, there are no intervening elements present. It will be further understood that when an element is referred to as being “formed” or “established” on another element, it can be grown, deposited, etched, attached, connected, coupled, or otherwise prepared or fabricated on the other element or an intervening element.
- Furthermore, relative terms, such as “lower” or “bottom” and “upper” or “top” may be used herein to describe one element's relationship to another element as illustrated in the drawings. It will be understood that relative terms are intended to encompass different orientations of an apparatus in addition to the orientation depicted in the drawings. By way of example, if an apparatus in the drawings is turned over, elements described as being on the “lower” side of other elements would then be oriented on the “upper” side of the other elements. The term “lower” can, therefore, encompass both an orientation of “lower” and “upper” depending of the particular orientation of the apparatus. Similarly, if an apparatus in the drawing is turned over, elements described as “below” or “beneath” other elements would then be oriented “above” the other elements. The terms “below” or “beneath” can therefore encompass both an orientation of above and below.
- Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and this disclosure.
- As used herein, the singular forms “a,” “an,” and “the” are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms “comprise,” “comprises,” and/or “comprising,” when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. The term “and/or” includes any and all combinations of one or more of the associated listed items.
- Furthermore, various descriptive terms used herein, such as “transparent” should be given the broadest meaning possible within the context of the present disclosure. For example, something that is described as being “transparent” should be understood as having a property allowing no significant obstruction or absorption of electromagnetic radiation in the particular wavelength (or wavelengths) of interest, unless a particular transmittance is provided.
- Referring now to
FIGS. 1-15 , various configurations of isolation systems, isolators, isolation devices, and intermediate isolator configurations are depicted and described. Although some of the isolation systems depicted in the figures correspond to isolation systems of components thereof at intermediate stages of manufacturing (or in disassembled states), one of ordinary skill in the art will appreciate that any of the intermediate products herein can be considered an isolator or isolation system without departing from the scope of the present disclosure. In some embodiments, the isolators described herein may be incorporated into any system which requires current and/or voltage monitoring, but is susceptible to transients. In some embodiments, the isolation system in which an isolator described herein is rated to operate at about 5 kV, 10 kV, or more. Stated another way, the input side (e.g., a high-voltage side) of the isolator or isolation system may be directly connected to a 5 kV, 10 kV, 15 kV or greater source without damaging the isolator or any electronic devices attached to the output side (e.g., a low-voltage side) of the isolator. Accordingly, an isolation system which employs one or more of the isolators disclosed herein may be configured to operate in high-voltage or high-current systems but may also be configured to separate the high-voltage or high-current systems from a low-voltage or low-current system. - Referring now to
FIG. 1 , a firstcapacitive isolation system 100 will be described in accordance with at least some embodiments of the present disclosure. Thesystem 100 is shown to include adriver chip 104 and areceiver chip 108 separated by anisolation boundary 112. In some embodiments, thedriver chip 104 may also behave as areceiver chip 108 and thereceiver chip 108 may behave as adriver chip 104 during certain times or when information is to be communicated from thechip 108 tochip 104. In other words, both chips may operate as drivers and receivers without departing from the scope of the present disclosure. - The
driver chip 104 may be operating in a high-voltage environment (e.g., with a ground potential at or exceeding 1 kV) whereas thereceiver chip 108 may be operating in a low-voltage environment. Of course, the opposite condition may also be true without departing from the scope of the present disclosure. Theisolation boundary 112 may provide the mechanism for protecting the low-voltage environment from the high-voltage environment. It should be appreciated, however, that thereceiver chip 108 may be operating in the high-voltage environment and thedriver chip 104 may be operating in the low-voltage environment. - For ease of discussion, the
driver chip 104 will be explained as a component that is connected to a circuit (e.g., an input circuit) whose current and/or voltage is being measured and by thereceiver chip 108 at an output circuit. Theisolation boundary 112 is provided to electrically insulate the currents/voltages at the input circuit from the output circuit. - In some embodiments, the
driver chip 104 receives aninput signal 102 from the input circuit and communicates theinput signal 102 across theisolation boundary 112 to thereceiver chip 108. Thereceiver chip 108 then generates anoutput signal 110 that is transmitted to further circuitry. Theoutput signal 110 may correspond to a logical representation or copy of theinput signal 102. Theoutput signal 110 is essentially a reproduction of theinput signal 102 on different circuitry and at a different potential. - Communication of the
input signal 102 across the isolation boundary is achieved by one or more isolation capacitors 116. Although the plates/pads of one or more capacitors 116 on the driver chip side are shown as being approximately the same size as the plates/pads of the one or more capacitors 116 on the receiver chip side, it should be appreciated that the pads of the capacitor may not necessarily be of the same size. As a non-limiting example, the plate/pad on the driver chip side may be larger than the plate/pad on the receiver chip side, or vice versa. Said another way, embodiments of the present disclosure are not limited to theillustrative system 100 and the sizes of the components depicted therein. Additionally, although both thedriver chip 104 andreceiver chip 108 are shown to be using the same ground, it should be appreciated that thechips - In the embodiment of
FIG. 1 , a first andsecond isolation capacitor input signal 102 across theisolation boundary 112. In some embodiments, thefirst isolation capacitor 116 a may correspond to a capacitor that communicates information from thedriver chip 104 to thereceiver chip 108 across theisolation boundary 112. Thesecond isolation capacitor 116 b may correspond to a capacitor that communicates information from thereceiver chip 108 to thedriver chip 104 across theisolation boundary 112. Accordingly, thefirst isolation capacitor 116 a may also be referred to herein as the transmitting isolation capacitor whereas thesecond isolation capacitor 116 b may also be referred to herein as the receiving isolation capacitor. Thefirst isolation capacitor 116 a may be included in a driver circuit of theisolation system 100 whereas thesecond isolation capacitor 116 b may be included in a receiver circuit of theisolation system 100. -
FIG. 1 further depicts other capacitors that are connected to ground on both the driver and receiver circuits. The capacitors to ground represent the parasitic capacitors that are inherently found on the driver and receiver circuits. Embodiments of the present disclosure aim to eliminate the sources of unequal coupling of a Common Mode-Rejection (CMR) event into theisolation capacitors - Currently-available capacitive isolation systems have the capacitors being wire bonded to circuits on one or both sides of the capacitor. This wire bonding actually helps couple a CMR event into the capacitors and, as such, creates the potential for a CMR event to be transformed into a differential signal that is indistinguishable from the desired informational signal. An ideal capacitive coupler as depicted in
FIG. 1 will preferably exhibit little conductor area between the capacitor and the receiver/driver circuits. In applications in which the capacitor is fabricated on the receiver silicon, the bottom plate of the capacitor is the input of the receiver and is realized in a lower level conductor, which is usually well or island. In such a configuration, the parasitic capacitance of the receiver side, Cpr, and parasitic capacitance of the driver side, Cpd, is quite large compared to theisolation capacitors isolation capacitor 116 a, 116 bCiso). This means that most of theinput signal 102 is lost to parasitic capacitance. - These isolation capacitors form a voltage divider with the
input signal 102 and cause the receiver sensitivity to have to be increased to recover the transmitted signal. As will be discussed in further detail herein, embodiments of the present disclosure aim to create thecapacitive elements FIGS. 2A-4B . - Referring initially to
FIGS. 2A-2C , a first example of two dies 204, 208 used in acapacitive isolation system 100 will be described in accordance with embodiments of the present disclosure.FIG. 2A depicts the two dies 204, 208 from above prior to placement of the dies 204, 208 into an operating position in accordance with embodiments of the present disclosure.FIG. 2B shows the two dies 204, 208 placed in a face-to-face orientation, thereby creating an example of a capacitive isolator. The dies 204, 208 may correspond to semiconductor dies manufactured using silicon-based manufacturing techniques. The dies 204, 208 may have one or many layers that enable the dies 204, 208 to carry an electrical signal received from an external contact (e.g., a bonding pad 210) to a capacitive element (e.g., capacitive elements orplates 216, 224). Although the details of the dies 204, 208 are not depicted herein, it should be appreciated that any type of semiconductor die may be used in accordance with embodiments of the present disclosure. - As used herein, the
bonding pad 210 and/orcapacitive elements die - Furthermore, although not depicted, it should be appreciated that each die 204, 208 may comprise internal driver circuitry (e.g., digital circuit components formed in silicon). In some embodiments, the driver circuitry is not located beneath either the
bonding pads 210 or thecapacitive elements capacitive elements capacitive elements 224. - As can be appreciated, the
first die 204 may correspond to one of thedriver chip 104 orreceiver chip 108 and thesecond die 208 may correspond to the other of thedriver chip 104 orreceiver chip 108. The first and second dies 204, 208 may be formed from a common piece of silicon or separate pieces of silicon. In the depicted embodiment, thefirst die 204 and second die 208 each haveisolation layers 240 formed thereon. The isolation layers 240 formed on each chip may be provided as a thin film of polyimide or the like that is formed on the entirety of the top surface of the first andsecond die thick film 240 formed thereon, anisolation boundary 112 created by the isolation layers 240 may be on the order of 25.0 um. - In the embodiment of
FIGS. 2A-2C , since theisolation layer 240 extends to the outer boundaries of the top surface of the dies 204, 208, thefilm 240 further includes a plurality ofopenings 206. Each of theopenings 206 expose bonding orcontact pads 210 for each die 204, 208. In some embodiments, thebonding pads 210 are used to connect one ormore bond wires 244 between the dies 204, 208 andlead frames bonding pads 210, it is difficult to establish a direct electrical connection between the lead frames of the isolator and the silicon dies 204, 208. Thus, theopenings 206 are established in theisolation layer 240 with an area at least as large as the area of thebonding pads 210. - The
bonding pads 210 may correspond to a direct-connect portion 212 of thedie bond wires 244 can be directly connected to the dies 204, 208 via thebonding pads 210. In some embodiments, the direct-connect portion 212, including thebonding pads 210 can be positioned asymmetrically on the top of thedie wire side 232 of thedie wire side 232 of each die 204, 208 may correspond to a side of thedie lead frame shorter bond wire 244. - The opposite side of the
die capacitor side 236. Thecapacitor side 236 of thedie drive portion 228 and a receiveportion 220. As shown inFIG. 2A , thedrive portion 228 of one die (e.g., first die 204) may be positioned at a top portion of the die whereas thedrive portion 228 of the other die (e.g., the second die 208) may be positioned at a bottom portion of the die. Likewise, a receiveportion 220 of one die (e.g., first die 204) may be positioned opposite the drive portion 228 (e.g., at a bottom portion of the die). This means that when one die is turned upside down and placed in a face-to-face configuration with the other die, thedrive portion 228 of one die is directly opposite to the receiveportion 220 of the other die. - In some embodiments, the
drive portion 228 of each die 204, 208 may comprise one or more transmittingcapacitive elements 224 and the receiveportion 220 may comprise one or more receivingcapacitive elements 216. In the depicted embodiment, each die 204, 208 comprises a firstreceiving capacitive element 216 a and a secondreceiving capacitive element 216 b for the receiveportion 220. Each die 204, 208 is also depicted as having a firsttransmitting capacitive element 224 a and a secondtransmitting capacitive element 224 b for thedrive portion 228. Thebonding pads 210, receivingcapacitive elements 216, and transmittingcapacitive elements 224 may all be formed on the top surface of thedie bonding pads 210, receivingcapacitive elements 216, and transmitting capacitive elements 224) are formed on the top most layer of metal in the IC-formation process. By placing the bottom plate as high as possible in the oxide stack, the parasitic capacitances, Cpd and Cpr, are minimized. The driver parasitic capacitance Cpd could be larger and, as such, the transmittingcapacitive elements capacitive elements - In some embodiments, the transmitting
capacitive element capacitive elements isolation layer 240 is a tradeoff between the desire to have athin isolation layer 240, thereby increasing the value/size of theisolation capacitors thick isolation layer 240, thereby increasing the isolation voltage rating of the isolator. - When the
isolation layer 240 is applied/formed on top of thedie capacitive elements bonding pads 210 are exposed through theisolation layer 240 viaopenings 206 that coincide with thebonding pads 210. - When configured in a face-to-face orientation, the first
receiving capacitive element 216 a of onedie transmitting capacitive element 224 a of theother die receiving capacitive element 216 b of onedie transmitting capacitive element 224 b of theother die isolation capacitors FIGS. 2A and 2B also exhibit a scheme for ensuring that alignment issues during manufacturing are accommodated. Specifically, the receivingcapacitive elements 216 are shown to have an area less than the transmittingcapacitive elements 224. The ideal placement of one die relative to the other die would result in the center of the receivingcapacitive elements 216 aligning with the center of the transmittingcapacitive elements 224. However, such ideal placement may not always occur during actual manufacturing, especially when isolators are being produced in high-volumes. - As can be appreciated, the lead frames 248, 252 supporting the dies 204, 208 may correspond to metal lead frames that also connect the dies to external circuitry, such as a Printed Circuit Board (PCB) or the like. The lead frames may include a first
lead frame portion 248 for connecting with thefirst die 204 and a secondlead frame portion 252 for connecting with thesecond die 208. The secondlead frame portion 252 may receive theinput signal 102 and, therefore, may be connected to an input side of the isolation system while the firstlead frame portion 248 may provide theoutput signal 110 and, therefore, may be connected to an output side of the isolation system. It should be appreciated that thelead frame portions lead frame portions lead frame portions -
FIG. 2C shows a circuit diagram of the isolator ofFIGS. 2A and 2B . In some embodiments, thefirst die 204 andsecond die 208 may comprise a receiveportion 220 and/or adrive portion 228.FIG. 2C shows the optional configuration where each die comprises both a receiveportion 220 and adrive portion 228. It should be appreciated that thefirst die 204 may comprise either a receiveportion 220 only, adriver portion 228 only, or a combination of the two. Thesecond die 208 may be configured to accommodate the configuration of thefirst die 204. As can be seen inFIG. 2C , multiple capacitive couplings may carry information from thedrive portion 228 of one die to the receiveportion 220 of the other die. These capacitive couplings may be similar in size/value or one capacitive coupling may be larger than the other. In some embodiments, the capacitive couplings are not a differential pair of capacitors. - With reference now to
FIGS. 3A and 3B , another example of two dies 304, 308 used in acapacitive isolation system 100 will be described in accordance with embodiments of the present disclosure.FIG. 3A depicts the two dies 304, 308 from above prior to placement of the dies 304, 308 into an operating position in accordance with embodiments of the present disclosure.FIG. 3B shows the two dies 304, 308 placed in a face-to-face orientation, thereby creating an example of a capacitive isolator. - The dies 304, 308 are similar to the dies 204, 208 and share many similar or identical features therewith. A difference between dies 304, 308 and dies 204, 208 is that dies 304, 308 comprise a
single isolation layer 312 between them when positioned in a face-to-face orientation. Specifically, instead of forming a polyimide layer for theisolation layer 240 on each die, asingle isolation layer 312 is used to electrically isolate thefirst die 304 from thesecond die 308. In some embodiments, thesingle isolation layer 312 may comprise a similar thickness to the combined thicknesses of the isolation layers 240. As an example, theisolation layer 312 may comprise a thickness of about 1 mil. In some embodiments, a thicker isolation layer 312 (e.g., 2 mil) can be used, but such an isolation layer may decrease the size of theisolation capacitors isolation layer 312 may correspond to a polyimide tape having silicone adhesives on both sides thereof. The polyimide tape may correspond to poly(4,4′-oxydiphenylene-pyromellitimide). In some embodiments, the polyimide tape is a self-supporting structure (e.g., capable of physically supporting its own weight) that can be cut to a specific dimension and then applied to a top surface of one ofdie die isolation layer 312 is pushed into contact with the top surface of theother die - Since a
single isolation layer 312 is used and it not entirely covering the top surface of either die 304, 308, there is no need to establishopenings 206 through theisolation layer 312. Instead, theisolation layer 312 may be configured to have a width that covers the overlapping regions ofdie bonding pads 210. As with the first configuration ofdie die die other die bonding pads 210 for wire bonding to thelead frame portions - Again, the
bonding pads 210, receivingcapacitive elements 216, and transmittingcapacitive elements 224 may be formed at or near the top of thedie capacitive elements 216 of onedie capacitive elements 224 of theother die isolation capacitors - With reference now to
FIGS. 4A and 4B , another example of two dies 404, 408 used in acapacitive isolation system 100 will be described in accordance with embodiments of the present disclosure.FIG. 4A depicts the two dies 404, 408 from above prior to placement of the dies 404, 408 into an operating position in accordance with embodiments of the present disclosure.FIG. 4B shows the two dies 404, 408 placed in a face-to-face orientation, thereby creating an example of a capacitive isolator. - In this particular construction, metallization is built on both sides of an
isolation layer 412. Here theisolation layer 412 can again be embodied as a polyimide tape having adhesive on both sides thereof. The metallization on each side of theisolation layer 412 may be positioned to connect with the transmittingcapacitive elements 224 and receivingcapacitive elements 216 via gold stud bonding or solder bumps 416. In some embodiments, the metallization may be in the form of a metallic pad expanding an area substantially similar to the transmitting/receiving capacitive elements. An advantage to using this particular configuration is that the size of theisolation capacitors isolation layer 412. This eliminates the turn over and placement tolerances of the assembly equipment. Again, the receivingcapacitive element 216 on thedie capacitive element 224 on thedie isolation layer 412. - As with other embodiments described herein, the
isolation layer 412 may correspond to tape or a similar electrically-insulating material. Theisolation layer 412 may correspond to 25 um or 50 um thick tape having silicone adhesive on both sides thereof. - With reference now to
FIG. 5 , a second example of acapacitive isolation system 500 will be described in accordance with at least some embodiments of the present disclosure. Thecapacitive isolation system 500 is similar tocapacitive isolation system 100 in that both systems comprise aninput signal 102,output signal 110,driver chip 504,receiver chip 508, and one ormore isolation capacitors isolation boundary 112. Theisolation capacitors isolation capacitors isolation capacitors FIG. 5 also shows a feature that may be shared with any other isolation system or isolator described herein. Specifically, the chips do not necessarily have to be connected to ground or a common voltage. Instead, eachchip -
FIGS. 5 and 6 also show that the capacitors can be configured in a common centroid configuration. In particular, a center of mass of the set of transmitting capacitive elements on one die may be substantially aligned (within machining and/or manufacturing tolerances) with a center of mass of the set of receiving capacitive elements on the other die. For instance,FIG. 6 shows how a cluster of four transmitting capacitive elements have a center of mass that is aligned with a center of mass for the cluster of four receiving capacitive elements of the other die. As can be appreciated, trying to align these centers of mass to achieve a common centroid configuration is difficult and subject to manufacturing processes, which may make it difficult to achieve a perfect common centroid configuration. It should be appreciated that other embodiments depicted herein also show variants of a common centroid configuration. For instance,FIG. 3B shows a cluster of two capacitive elements having a center of mass that is substantially aligned with the center of mass of the opposing capacitive elements on the other die. A common centroid configuration can help to minimize interference and/or noise in the isolation system. -
FIG. 6 depicts one non-limiting example of the capacitor construction that can be used to achieve theisolation capacitors FIG. 6 shows an example ofdie FIGS. 2A and 2B ) it should be appreciated that thedie FIGS. 2A through 4B . For simplicity,FIG. 6 shows die 604 having no isolation layer formed thereon. - The illustrative construction of each die 604, 608 again shows a receive portion and drive portion. Each die 604, 608 also exhibits one or
more bonding pads 612 that are capable of being wire bonded to a lead frame supporting the die. Theillustrative die isolation capacitors - Although the receive and drive portions are shown to include four capacitive elements each, it should be appreciated that a greater or lesser number of capacitive elements may be included in each portion. In some embodiments, the number of capacitive elements on a drive portion of one die should match the number of capacitive elements on a receive portion of the other die, and vice versa. It is not a requirement, however, that a single die have the same number of transmitting capacitive elements and receiving capacitive elements.
- Each die 604, 608 is shown to include a first, second, third, and fourth receiving
capacitive element capacitive element receiving capacitive element 616 a of one die may overlap with the secondtransmitting capacitive element 620 b of the other die. Similarly, the secondreceiving capacitive element 616 b of one die may overlap with the firsttransmitting capacitive element 620 a of the other die. Further still, the thirdreceiving capacitive element 616 c of one die may overlap with the fourth transmittingcapacitive element 620 d of the other die. For completeness, the fourth receivingcapacitive element 616 d of one die may overlap with the thirdtransmitting capacitive element 620 c of the other die. In this configuration, two or more parallel capacitors are established for theisolator capacitors FIGS. 5 and 6 and the utilization of multiple parallel capacitors may help to avoid capacitor mismatch. - Referring now to
FIGS. 7A through 7E , additional details of adaptive calibration for an isolation system will be described in accordance with at least some embodiments of the present disclosure.FIG. 7A depicts an ideal condition where the injection current flowing from thedriver chip 708 to thereceiver chip 704 approximately equals the injection current flowing from thereceiver chip 704 to thedriver chip 708. This will result in approximately the same Vpositive peak amplitude and Vnegative peak amplitude. - It should be appreciated, however, that manufacturing processes may be imperfect. Vertical and/or horizontal alignment mismatches due to misplacement of either
chip -
FIG. 7B depicts the scenario where some capacitor mismatch exists and the value of one isolation capacitor does not equal the value of another isolation capacitor. If the isolation capacitors are not equal, then the current injected from thedriver chip 708 to thereceiver chip 704 will be different from the current injected from thereceiver chip 704 to thedriver chip 708. This will result in Vpositive peak amplitude being different from Vnegative peak amplitude. For example, if the first isolation capacitor (e.g., the capacitor carrying injection current fromdriver chip 708 to receiver chip 704) is greater than the second isolation capacitor (e.g., the capacitor carrying injection current from thereceiver chip 704 to the driver chip 708), then the Vpositive peak amplitude will be greater than the Vnegative peak amplitude. Conversely, if the value of the first isolation capacitor is less than the value of the second isolation capacitor, then the Vpositive peak amplitude will be less than the Vnegative peak amplitude. The differences in Vpositive peak amplitude and Vnegative peak amplitude can be leveraged to calibrate the isolation capacitors with the use of adifferential peak detector 716 and one or more adjustablecapacitive circuits adjustable capacitive circuit 712 a or a secondadjustable capacitive circuit 712 b can be selective switched on the receive side of the capacitor until the value of the first isolation capacitor approximately equals the value of the second isolation capacitor (or the Vpositive peak amplitude approximately equals the value of the Vnegative peak amplitude). -
FIGS. 7C and 7D depict two examples of adjustablecapacitive circuits 712 in accordance with at least some embodiments of the present disclosure. Although the adjustablecapacitive circuits 712 shown possess a certain number of switchable capacitive portions, it should be appreciated that anadjustable capacitive circuit 712 may have one, two, three, . . . , twenty or more switchable capacitive portions, which may or may not be of the same size. - As discussed above, a
differential peak detector 716 may be used to compare the Vpositive peak amplitude with the Vnegative peak amplitude and, based on such comparisons, provide one or more adjustment signals to the adjustablecapacitive circuits capacitive element 724 and a receivingcapacitive element 728. The transmittingcapacitive element 724 may be similar or identical to some or all of the transmitting capacitive elements already described herein. The receivingcapacitive element 728 in theadjustable capacitive circuit 712 may be different from the other receiving capacitive elements described herein. Specifically, a receivingcapacitive element 728 may comprise amain receiving portion 732 and asecondary receiving portion 736. Themain receiving portion 732 may constitute the majority of the receiving capacitive element area whereas thesecondary receiving portion 736 may constitute a minority of the receiving capacitive element area. In some embodiments, the combined area of the capacitive elements included in thesecondary receiving portion 736 may comprise less than 1/10th the area of the main receivingportion 732. - In some embodiments, some or all of the capacitive elements included in the
secondary receiving portion 736 may be dynamically switchable via one or several control switches 720. The control switches 720 may correspond to active switches in thereceiver chip 704 and/ordriver chip 708. Examples ofsuch control switches 720 include, without limitation, transistors, MOSFETs (n-type or p-type), or the like. The actuation of the control switches 720 may be driven by thedifferential peak detector 716 that attempts to selectively switch on and/or off one or more receiving capacitive elements in thesecondary receiving portion 736. By switching on and/or off the pads in thesecondary receiving portion 736, the value of one or both isolation capacitors can be dynamically adjusted to accommodate variations in capacitance due to various operational conditions, manufacturing imperfections, and the like. - As seen in
FIG. 7C , the receiving capacitive elements included in thesecondary receiving portion 736 may be approximately the same size. As seen inFIG. 7D , the receiving capacitive elements in thesecondary receiving portion 736 may be different sizes. The utilization of differently-sized receiving capacitive elements (e.g., of size C, 2C, 4C, etc.) can help in the capacitor-calibration process. In particular, if differently-sized capacitive elements are used, then calibration of the capacitance can be done in different scales where the larger capacitive element (e.g., ofsize 4C) is used for large adjustments and the smaller capacitive element(s) (e.g., of size C) are used for smaller adjustments. In other words, the smaller capacitive element(s) can be used for fine-grain calibration whereas the larger capacitive elements can be used for larger calibration adjustments. -
FIG. 7E shows a general placement of the transmittingcapacitive elements 724 a-d that can be included in the transmitting side of adie capacitive element 728. Specifically, thesecondary receiving portion 736 may be located along a common side of the main receivingportion 732 or around a perimeter of the main receivingportion 732. As receiving capacitive elements in thesecondary receiving portion 736 are switched on, the effective area of the receivingcapacitive element 728 may be increased, thereby increasing the size of the isolation capacitor. - Although
FIG. 7E only depicts a transmitting side of thedriver chip 708 and a receiving side of thereceiving chip 704, it should be appreciated that thechips FIG. 7E also shows how the smaller receivingcapacitive elements 728 are positioned in relation to the larger main receivingportion 732. In some embodiments, thesmaller receiving pads 736 may have a size that is between about 2% and 10% the size of the main receivingportion 736. More specifically, thesmaller receiving pads 736 may have a size that is between about 3% and 7% the size of the main receivingportion 736. In an even more specific embodiment, thesmaller receiving pads 736 may have a size that is approximately 5% the size of the main receivingportion 736. Stated another way, thesmaller receiving pads 736 may have a size on the order of 100 um to accommodate approximately 100 um manufacturing tolerances. - The smaller and multiple receiving
capacitive elements 736 enable fine-grained calibration/tuning of the receivingcapacitive element 728 to the transmittingcapacitive element 724. AlthoughFIG. 7E shows thesmaller receiving pads 736 as being approximately the same size as one another, it should be appreciated that thesmaller receiving pads 736 may be of different sizes/areas as shown inFIG. 7D . It should also be appreciated that thesmaller receiving pads 736 may circumnavigate the entire main receivingportion 732 or they may reside adjacent to three or two sides of the main receivingportion 732 rather than just residing adjacent to a single side of the main receivingportion 732 as shown. It should also be appreciated that some of thesmaller receiving pads 736 may have the same size, but contribute different capacitances as the capacitors can be formed on a bent lead frame, thereby causing the receivingcapacitive elements 736 to be spaced apart from the transmittingcapacitive element 724 by different distances. - With reference now to
FIGS. 8-12 , details of a method of manufacturing an isolator will be described in accordance with at least some embodiments of the present disclosure. The method begins with the separate construction of a transmittingside 804 and receivingside 808 of the isolator (FIG. 8 ). The transmittingside 804 may also be configured to receive signals from receivingside 808 and the receivingside 808 may also be configured to transmit signal to the receivingside 804. Use of the terms “receiving” and “transmitting” side are merely used for illustrative purposes. - The transmitting
side 804 may include a firstlead frame portion 820 having a transmittingdie 812 mounted thereon as well as a first set of leads 828. Similarly, the receivingside 808 may include a secondlead frame portion 824 having a receivingdie 816 mounted thereon as well as a second set of leads 832. The first set ofleads 828 may connect to a high-voltage side of an isolation system whereas the second set ofleads 832 may connect to a low-voltage side of the isolation system (or vice versa). - The number of
leads lead frame leads 828 and second set ofleads 832 should not be construed as limiting embodiments of the present disclosure. - As shown in
FIG. 8 , the lead frame portions may be bent in such a way that theleads die die lead frame portions - The manufacturing process continues by wire bonding some or all of the bonding pads included on each die to the leads of the lead frame (
FIG. 9 ). Specifically, one side of awire bond 904 may be soldered or otherwise attached to the bonding pads whereas the other side of awire bond 904 may be soldered or otherwise attached to the lead frame or a specific lead on the lead frame portion. - Thereafter, an
isolation layer 1004 may be placed on one of the die to cover or overlie the capacitive elements thereof (FIG. 10 ). In some embodiments, theisolation layer 1004 may correspond to double-sided insulative tape that is cut to a desired length and then placed on one of the dies. In other embodiments, theisolation layer 1004 may correspond to a thin-film deposited on top surfaces of both dies and then openings may be established therein to expose the bonding pads of the dies. In such an embodiment, the formation of theisolation layer 1004 may occur before the wire bonding. - Once the isolation layer(s) 1004 is in position, the method continued by placing one lead frame over and adjacent to the other lead frame (step 1104 shown in
FIG. 11 ), thereby placing the capacitive elements of one die in close proximity to the conductive pads of the other die. It should be appreciated that any number of placement methods could be used such as pick-and-place, folding, bending, flipping, etc. Moreover, the capacitive elements are placed close enough to one another to enable the transmission of information across theisolation boundary 112 established by the isolation layer(s) 1004. This placement process may be performed by an automated pick-and-place machine or the like. - The manufacturing process continues with a step of molding the
lead frame portions 1208 and the die mounted thereon in a substantially fixed relative position with ahousing 1204 or mold material. Additional manufacturing steps may include trimming theleads 1216 and forming theleads 1216 into a desired formation. Although the depicted embodiment shows the leads as having a specific configuration (e.g., surface mount configurations), it should be appreciated that theleads 1216 or relevant sections protruding from thehousing 1204 may comprise any type of known, standardized, or yet-to-be developed configuration such as straight-cut leads, J leads, SOJ leads, gullwing, reverse gullwing, etc. Thehousing 1204 provides a way to protect the die and the other components attached thereto while theleads 1216 enable theisolator 1200 to be connected to external circuitry (e.g., a PCB). - With reference now to
FIGS. 13 and 14 additional details regarding the dimensionality of the components in theisolation system 1300 will be described in accordance with at least some embodiments of the present disclosure. Theisolation system 1300 may correspond to some or all of theisolator 1200 or any similar isolation system previously described herein.FIG. 13 shows theisolation system 1300 as comprising afirst lead frame 1304, asecond lead frame 1308, afirst die 1312, asecond die 1316, a first set ofbonding wires 1320, a second set ofbonding wires 1324, and anisolation layer 1328. - The
first die 1312 is mounted on thefirst lead frame 1304 and thesecond die 1316 is mounted on thesecond lead frame 1308. As with other isolators described herein, thefirst die 1312 and second die 1316 are positioned in a face-to-face configuration with theisolation layer 1328 sandwiched therebetween. In some embodiments, the lead frames 1304, 1308 act as a Faraday shield against electromagnetic interference (EMI) as they enclose the two die 1312, 1316 and theisolation layer 1328. More specifically, the first and second lead frames 1304, 1308 may form a conductive enclosure that substantially surrounds the first and second dies 1312, 1316 such that the enclosure formed thereby substantially blocks external static and non-static electric and magnetic fields. In some embodiments, the first and second lead frames 1304, 1308 may be configured to have substantially constant voltage. Theisolation layer 1328 may be embodied as any type of isolation layer already described herein. - As shown in
FIG. 13 , thefirst die 1312 comprises a first thickness t1 and the second die comprises asecond thickness 1316 t2. Theisolation layer 1328 may comprise a third thickness t3. The third thickness t3 is designed to have a good balance between voltage isolation and signal coupling between thefirst die 1312 andsecond die 1316. Preferably, the thickness variation of theisolation layer 1328 should be kept relatively small. -
FIG. 13 also shows thefirst lead frame 1304 as having a first downset distance d1 and thesecond lead frame 1308 as having a second downset distance d2. The downset distances d1, d2 correspond to a dimension created by twice folding the lead frames 1304, 1308. In other words, the shortest distance from the bonding area of the lead frame and the leads of the lead frame may be considered the downset distance d1, d2. Said another way, the downset distance d1, d2 correspond to a height between a bonding surface of the lead frame and a top surface of the leads. - In some embodiments, the downset distances d1, d2 are designed to be similar or identical to one another. A valuable design consideration may attempt to have the downset distances d1, d2 such that both the
first die 1312 and second die 1316 make contact with theisolation layer 1328 when thefirst die 1312 is positioned over thesecond die 1316. -
FIG. 14 shows additional dimensions of theisolation system 1300. Specifically, the first set ofbonding wires 1320 may have a first loop height h1 and the second set ofbonding wires 1324 may have a second loop height h2. In some embodiments, the first loop heights h1 is approximately equal to the second loop height h2. Again, the thickness of theisolation layer 1328 is a third thickness t3. - In some embodiments, the first and second loop heights h1, h2 are designed to be smaller than the first and second thicknesses t1, t2, respectively. Such dimensionality helps to prevent the
bonding wires lead frame first die 1312 andsecond die 1316. In other words, thethin isolation layer 1328 results in the capacitive plates positioned on a surface or within thedie - Although embodiments of the present disclosure have been primarily concerned with describing the capacitive plates as being formed on surfaces of the
first die 1312 andsecond die 1316, it should be appreciated that the capacitive plates (receiving and/or transmitting) may be formed elsewhere on or within the dies 1312, 1316. As a non-limiting example, one or both capacitive plates may be formed within theirrespective die FIGS. 15 and 16 . - Referring initially to
FIG. 15 , thefirst lead frame 1304 is shown to include afirst surface 1504 and an opposingsecond surface 1508. Thefirst surface 1504 of thefirst lead frame 1304 may be faced toward afirst face 1520 of thesecond lead frame 1308. Like thefirst lead frame 1304, thesecond lead frame 1308 may also comprise asecond surface 1524 that opposes thefirst surface 1520 thereof. In some embodiments, the total distance between the lead frames 1304, 1308 (e.g., the sum of t1, t2, and t3) may correspond to the shortest linear distance between thefirst surface 1504 of thefirst lead frame 1304 and thefirst surface 1520 of thesecond lead frame 1308. - The
first surface 1504 of thefirst lead frame 1304 may have thefirst die 1312 mounted thereon. Likewise, thefirst surface 1520 of thesecond lead frame 1308 may have thesecond die 1316 mounted thereon. Thefirst die 1312 may have afirst surface 1512 and an opposingsecond surface 1516. Thesecond die 1316 may also have afirst surface 1528 and asecond surface 1532. In the depicted embodiment, thefirst surface 1512 of thefirst die 1312 is in direct contact with thefirst surface 1504 of thefirst lead frame 1312. In other embodiments, thefirst surface 1512 of thefirst die 1312 may be adjacent to thefirst surface 1504 of thefirst lead frame 1312, but some intermediate material (e.g., a bonding material or tape) may be provided between the components. Similarly, thefirst surface 1528 of thesecond die 1316 may be mounted in direct contact with thefirst surface 1520 of thesecond lead frame 1316. In other embodiments, thefirst surface 1528 of thesecond die 1528 may be adjacent to thefirst surface 1520 of thesecond lead frame 1316, but some intermediate material may be provided between the components. - The
second surface 1516 of thefirst die 1312 may be facing and proximate to thesecond surface 1532 of thesecond die 1316. Theisolation layer 1328 may correspond to the only material that resides between thesecond surface 1516 of thefirst die 1312 and thesecond surface 1528 of thesecond die 1316. Using the dimensions shown inFIGS. 13 and 14 , the distance between thesecond surface 1512 of thefirst die 1312 and thesecond surface 1532 of thesecond die 1316 may correspond to the third thickness t3, which may be relatively small as compared to the distance between thefirst surface 1504 of thefirst lead frame 1304 and thefirst surface 1520 of thesecond lead frame 1308. - As previously described herein, the capacitive plates may be formed on the
second surfaces first surface first die 1312 orsecond die 1316. As another example, a capacitive plate (transmitting or receiving) may be formed somewhere between the first surface and second surface of the die.FIG. 16 shows twopossible locations die possible locations die possible location 1604 a. In another embodiment, the driver circuitry may be positioned within the structure of the die, but in a non-overlapping arrangement relative to a capacitive plate formed on a second or first surface of the die. Such a position may correspond, for example, to the secondpossible location 1604 b. - Specific details were given in the description to provide a thorough understanding of the embodiments. However, it will be understood by one of ordinary skill in the art that the embodiments may be practiced without these specific details. In other instances, well-known circuits, processes, algorithms, structures, and techniques may be shown without unnecessary detail in order to avoid obscuring the embodiments.
- While illustrative embodiments of the disclosure have been described in detail herein, it is to be understood that the inventive concepts may be otherwise variously embodied and employed, and that the appended claims are intended to be construed to include such variations, except as limited by the prior art.
Claims (36)
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