US20150349281A1 - Organic schottky diodes - Google Patents

Organic schottky diodes Download PDF

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Publication number
US20150349281A1
US20150349281A1 US14/294,929 US201414294929A US2015349281A1 US 20150349281 A1 US20150349281 A1 US 20150349281A1 US 201414294929 A US201414294929 A US 201414294929A US 2015349281 A1 US2015349281 A1 US 2015349281A1
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Prior art keywords
diode
conductor
layer
organic
substrate
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Abandoned
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US14/294,929
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Bing R. Hsieh
Tse Nga Ng
Gregory Whiting
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Palo Alto Research Center Inc
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Palo Alto Research Center Inc
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Priority to US14/294,929 priority Critical patent/US20150349281A1/en
Assigned to PALO ALTO RESEARCH CENTER INCORPORATED reassignment PALO ALTO RESEARCH CENTER INCORPORATED ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: WHITING, GREGORY, HSIEH, BING R., NG, TSE NGA
Publication of US20150349281A1 publication Critical patent/US20150349281A1/en
Priority to US15/837,843 priority patent/US10283725B2/en
Abandoned legal-status Critical Current

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having a potential-jump barrier or a surface barrier
    • H10K10/20Organic diodes
    • H10K10/23Schottky diodes
    • H01L51/0579
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007Multistep manufacturing processes
    • H01L29/66075Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66083Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by variation of the electric current supplied or the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. two-terminal devices
    • H01L29/6609Diodes
    • H01L29/66143Schottky diodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861Diodes
    • H01L29/872Schottky diodes
    • H01L51/0002
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/12Deposition of organic active material using liquid deposition, e.g. spin coating

Abstract

An organic diode has a substrate, a first conductor layer on the substrate, an organic semiconductor layer on the first conductor layer, and a second conductor layer on the organic substrate layer, wherein one of the conductor layers has an injection enhancement.

Description

    BACKGROUND
  • Schottky diodes typically have a metal-semiconductor junction rather than a semiconductor-semiconductor junction. They typically have a low forward voltage drop. These diodes may consist of organic materials. Organic Schottky diodes may have an organic semiconductor layer sandwiched between a single or multi-layered stack of injecting contact (IC) and a blocking contact (BC), designated IC/OSL/BC. An example of such a diode is shown in FIG. 1. FIG. 1 shows a prior art embodiment of an organic Schottky diode 10. The diode has an injecting contact 14 on a substrate 12. The organic semiconductor layer 16 resides on the injecting contact layer. The blocking contact 18 resides on the organic semiconductor layer. Materials for the organic semiconductor layer include both p-type and n-type organic semiconducting polymeric or molecular materials and the IC and BC can each consist of at least a conductive layer such as indium-tin-oxide (ITO), gold, silver, copper, aluminum, nickel, and palladium.
  • Solution processing techniques, such a printing, spin coating, etc., work well with organic polymer Schottky diode processes. Because of this, these have become prevalent, including those based on pi conjugated polymers such as poly(phenylene vinylenes) (PPVs) and poly(thiophenes) such as ITO/PPV/A1, ITO/PEDOT-PSS/MEH-PPV/Au, ITO/MEH-PPV:C60/Ca, ITO/P3HT/Au and the like. Recently poly(triarylamine) (PTAA) and its derivatives have become one of the most popular semiconducting polymer classes, because of their ease of processing, stability and outstanding charge transport properties.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1 shows a prior art embodiment of an organic Schottky diode.
  • FIG. 2 shows an embodiment of an organic Schottky diode having an injection enhancement.
  • FIG. 3 shows another embodiment of an organic Schottky diode having an injection enhancement.
  • FIG. 4 shows another embodiment of an organic Schottky diode having an injection enhancement.
  • FIG. 5 shows another embodiment of an organic Schottky diode having an injection enhancement.
  • FIGS. 6 and 7 show linear plot and a log plot of voltage versus current density for a first embodiment of an organic Schottky diode.
  • FIGS. 8 and 9 show linear plot and a log plot of voltage versus current density for a second embodiment of an organic Schottky diode.
  • DETAILED DESCRIPTION OF THE EMBODIMENTS
  • FIG. 2 shows an embodiment of an organic Schottky diode 20. The diode has a substrate 22, a first conductor 24, a semiconductor 26 and a second conductor 28, similar to the prior structure. In this embodiment, the conductor layer 24, sometimes referred to as the injecting contact layer, has an injection enhancement layer between the conductor and the semiconductor layer. The injection enhancement layer modifies the work function of the conductive layer to achieve, ideally, an Ohmic contact.
  • The conductor layer may consist of silver, gold, copper, nickel, aluminum, indium-tin-oxide, conductive carbon materials, silver nanowires, etc. The organic semiconductor layer may consist of pi conjugated polymers such as poly(triarylamines) (PTAA), poly(phenylene vinylenes), poly(thiophenes), triarylamine containing polymers, ferrocene containing polymers, polysilanes, and triarylamine molecularly doped polymers. The injection enhancement layer and injection enhancement additive include TCNQ (tetracyanoquinodimethane) and its derivatives, LiF (lithium fluorine), Li2CO3 (lithium carbonate), CsF (cesium fluoride), Cs2CO3 (cesium carbonate). Substrate materials may include high temperature thermal plastics, such as PET (polyethylene terephthalate) and PEN (polyethylene napthalate), glass and silicone.
  • In some particular embodiments, the conductor 24 consists of silver, and the injection enhancement layer consists of 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimehane (F4-TCNQ). The other layers may consist of N,N′-Bis(3-methylphenyl)-N,N′-diphenylbenzidine (TPD), bisphenol A polycarbonate (PC), and (PTAA) polytriphenylamine. The diode would be Ag/F4-TCNQ/TPD:PC(1:1)/Ag. Another possibility would be Ag/F4-TCNQ/PTAA/Ag. The area of the TPD:PC diode is 1 mm2 and the polymer thickness is about 400 nm. The area of the PTAA diode is 2.5 mm2 and the PTAA layer thickness is about 1000 nm.
  • FIGS. 3-5 show alternative embodiments of the diode structure. In the diode 30, the injection enhancement layer 29 resides between the semiconductor layer 26 and the second conductor layer 28. In FIGS. 4 and 5, rather than an injection enhancement layer, it consists of an injection enhancement additive. The conductor is bulk modified by addition of the injection enhancement additive, which may consist of the same materials used in the injection enhancement layer. FIG. 4 shows a diode 40 has a lower conductor layer that has been bulk modified layer 44 by an injection enhancement additive on the substrate. FIG. 5 shows a diode 50 in which the bulk modified layer resides above the semiconductor layer. In either case, the additive is referred to as an injection enhancement, either in layer or additive form.
  • The manufacture of these diodes may take many forms. The metal conductor is deposited on the substrate. Typically, this may be accomplished using several different processes, but the materials used here are particularly useful for printing or other solution processing. In the case of the injection enhancement layer, the process will deposit it on either the conductor layer or the substrate depending upon the structure of the diode. With the injection enhancement additive, the solution used to form the conductor layer has the additive mixed into it prior to deposition.
  • FIGS. 6 and 7 show the linear and log I-V plots for a diode consisting of Ag/F4-TCNQ/PTD:PC(1:1:)/Ag upon applying a forward bias showing at current density of 1.0×10−5 A/mm2 at 5 V. FIGS. 8 and 9 show linear and log I-V plots for a diode consisting of Ag/F4-TCNQ/PTAA/Ag. The plots show a rectifying effect upon applying a forward bias showing at a current density of 2.0×104 A/mm2. The resulting performance of this diode is approximately better than that for the TPD:PC. Without the injecting material, the device does not rectify.
  • The resulting diodes having an injection enhancement layer or additive has several advantages over other organic semiconductor layer diodes. For example, most organic diodes use different electrode materials with different work functions. With the use of injection enhancement layer or additive, the diode has near Ohmic contact, enabling the use of identical electrode materials. In one embodiment, for example, both electrodes consist of silver in the bulk metal, but the additives are tuned to enhance or block the charge injection.
  • It will be appreciated that several of the above-disclosed and other features and functions, or alternatives thereof, may be desirably combined into many other different systems or applications. Also that various presently unforeseen or unanticipated alternatives, modifications, variations, or improvements therein may be subsequently made by those skilled in the art which are also intended to be encompassed by the following claims.

Claims (11)

1. An organic diode, comprising:
a substrate;
a first conductor layer on the substrate;
an organic semiconductor layer on the first conductor layer;
a second conductor layer on the organic semiconductor layer, wherein one of the conductor layers is comprised of a conductor mixed with an injection enhancement additive.
2. The diode of claim 1, wherein the substrate comprises one of a high temperature thermal plastic, glass or silicone.
3. The diode of claim 2, wherein the substrate comprises high temperature thermal plastic and is one of polyethylene terephthalate or polyethylene napthalate.
4. The diode of claim 1, wherein the first conductor comprises one of silver, gold, copper, nickel, aluminum, indium-tin-oxide, conductive carbon materials, and silver nanowires.
5. The diode of claim 1, wherein the second conductor comprises one of silver, gold, copper, nickel, aluminum, indium-tin-oxide, conductive carbon materials, and silver nanowires.
6. The diode of claim 1, the organic semiconductor layer comprises pi conjugated polymers.
7. The diode of claim 1, the pi conjugated polymer comprises one of poly(triarylamines), poly(phenylene vinylenes), poly(thiophenes), triarylamine containing polymers, ferrocene containing polymers, polysilanes, and triarylamine molecularly doped polymers.
8. (canceled)
9. (canceled)
10. The diode of claim 1, wherein the injection enhancement comprises one of tetracyanoquinodimethane, a derivative of tetracyanoquinodimethane, lithium fluoride, lithium carbonate, cesium fluoride, and cesium carbonate.
11.-16. (canceled)
US14/294,929 2014-06-03 2014-06-03 Organic schottky diodes Abandoned US20150349281A1 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10283725B2 (en) 2014-06-03 2019-05-07 Palo Alto Research Center Incorporated Organic Schottky diodes

Citations (1)

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US7193291B2 (en) 2004-03-25 2007-03-20 3M Innovative Properties Company Organic Schottky diode
CN101506989B (en) * 2006-07-31 2014-02-19 威世-硅尼克斯 Molybdenum barrier metal for sic schottky diode and process of manufacture
KR20100105678A (en) 2007-12-14 2010-09-29 바스프 에스이 Process for the preparation of semiconducting layers
KR20110061099A (en) * 2009-12-01 2011-06-09 삼성전기주식회사 Substitutional electroless gold plating solution and method for forming the gold plating layer using the same
KR101021280B1 (en) * 2010-11-11 2011-03-11 한국기계연구원 The preparing method for aluminum cathode using wetting process and the aluminum cathode thereby
US8900985B2 (en) 2012-10-15 2014-12-02 Infineon Technologies Austria Ag Self-doped ohmic contacts for compound semiconductor devices
US20150349281A1 (en) 2014-06-03 2015-12-03 Palo Alto Research Center Incorporated Organic schottky diodes
GB201415708D0 (en) * 2014-09-05 2014-10-22 Cambridge Display Tech Ltd Semiconductor doping

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Publication number Priority date Publication date Assignee Title
US20080179742A1 (en) * 2006-07-24 2008-07-31 Interuniversitair Microelektronica Centrum (Imec) Method and solution to grow charge-transfer complex salts

Non-Patent Citations (1)

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Title
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10283725B2 (en) 2014-06-03 2019-05-07 Palo Alto Research Center Incorporated Organic Schottky diodes

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