TWI800586B - Substrate processing apparatus and substrate processing method - Google Patents
Substrate processing apparatus and substrate processing method Download PDFInfo
- Publication number
- TWI800586B TWI800586B TW107147174A TW107147174A TWI800586B TW I800586 B TWI800586 B TW I800586B TW 107147174 A TW107147174 A TW 107147174A TW 107147174 A TW107147174 A TW 107147174A TW I800586 B TWI800586 B TW I800586B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate processing
- processing apparatus
- processing method
- substrate
- processing
- Prior art date
Links
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018-000247 | 2018-01-04 | ||
JP2018000247 | 2018-01-04 | ||
JP2018201615A JP7142535B2 (en) | 2018-01-04 | 2018-10-26 | SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD |
JP2018-201615 | 2018-10-26 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201936278A TW201936278A (en) | 2019-09-16 |
TWI800586B true TWI800586B (en) | 2023-05-01 |
Family
ID=67306512
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW107147174A TWI800586B (en) | 2018-01-04 | 2018-12-26 | Substrate processing apparatus and substrate processing method |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP7142535B2 (en) |
TW (1) | TWI800586B (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6956024B2 (en) * | 2018-02-15 | 2021-10-27 | 東京エレクトロン株式会社 | Liquid treatment device and liquid film condition determination method |
JP7249233B2 (en) * | 2019-07-30 | 2023-03-30 | 倉敷紡績株式会社 | thermo camera |
JP7308688B2 (en) * | 2019-08-05 | 2023-07-14 | 東京エレクトロン株式会社 | SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE DRYING METHOD |
KR102578764B1 (en) * | 2021-03-25 | 2023-09-15 | 세메스 주식회사 | Substrate processing apparatus and processing substrate method |
JP2023125013A (en) * | 2022-02-28 | 2023-09-07 | 株式会社Screenホールディングス | Substrate processing method and substrate processing system |
TW202405935A (en) * | 2022-06-01 | 2024-02-01 | 日商東京威力科創股份有限公司 | Substrate processing method and substrate processing device |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6067154A (en) * | 1998-10-23 | 2000-05-23 | Advanced Micro Devices, Inc. | Method and apparatus for the molecular identification of defects in semiconductor manufacturing using a radiation scattering technique such as raman spectroscopy |
US20060181706A1 (en) * | 2005-02-15 | 2006-08-17 | Sweeney Thomas I | Process for enhancing dye polymer recording yields by pre-scanning coated substrate for defects |
US20150273534A1 (en) * | 2014-03-27 | 2015-10-01 | Shibaura Mechatronics Corporation | Substrate processing apparatus and substrate processing method |
CN107275257A (en) * | 2016-03-30 | 2017-10-20 | 芝浦机械电子株式会社 | Substrate board treatment and substrate processing method using same |
US20170345680A1 (en) * | 2016-05-27 | 2017-11-30 | Semes Co., Ltd. | Transfer unit, and apparatus and method for treating substrate |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4488780B2 (en) * | 2003-05-28 | 2010-06-23 | 大日本スクリーン製造株式会社 | Substrate processing apparatus and substrate processing method |
JP2010239013A (en) * | 2009-03-31 | 2010-10-21 | Shibaura Mechatronics Corp | Substrate treatment apparatus and substrate treatment method |
JP6563762B2 (en) * | 2015-09-29 | 2019-08-21 | 芝浦メカトロニクス株式会社 | Substrate processing apparatus and substrate processing method |
-
2018
- 2018-10-26 JP JP2018201615A patent/JP7142535B2/en active Active
- 2018-12-26 TW TW107147174A patent/TWI800586B/en active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6067154A (en) * | 1998-10-23 | 2000-05-23 | Advanced Micro Devices, Inc. | Method and apparatus for the molecular identification of defects in semiconductor manufacturing using a radiation scattering technique such as raman spectroscopy |
US20060181706A1 (en) * | 2005-02-15 | 2006-08-17 | Sweeney Thomas I | Process for enhancing dye polymer recording yields by pre-scanning coated substrate for defects |
US20150273534A1 (en) * | 2014-03-27 | 2015-10-01 | Shibaura Mechatronics Corporation | Substrate processing apparatus and substrate processing method |
CN107275257A (en) * | 2016-03-30 | 2017-10-20 | 芝浦机械电子株式会社 | Substrate board treatment and substrate processing method using same |
US20170345680A1 (en) * | 2016-05-27 | 2017-11-30 | Semes Co., Ltd. | Transfer unit, and apparatus and method for treating substrate |
Also Published As
Publication number | Publication date |
---|---|
TW201936278A (en) | 2019-09-16 |
JP2019121781A (en) | 2019-07-22 |
JP7142535B2 (en) | 2022-09-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
SG10201604456TA (en) | Substrate processing apparatus and substrate processing method | |
TWI800586B (en) | Substrate processing apparatus and substrate processing method | |
SG10201911998QA (en) | Substrate processing method and substrate processing apparatus | |
TWI800654B (en) | Wafer processing method | |
DK3429735T3 (en) | MIXING AND PROCESSING APPARATUS AND METHOD | |
KR20220035947A (en) | Image processing methods, apparatus, electronic devices and media | |
DK3546118T3 (en) | PROCESSING SYSTEM AND PROCESSING METHOD | |
EP3872840A4 (en) | Substrate processing device and substrate processing method | |
TWI799617B (en) | Semiconductor element inspection method and semiconductor element inspection apparatus | |
EP3733575A4 (en) | Substrate processing device and substrate processing method | |
KR102376957B1 (en) | substrate treating apparatus and substrate treating method | |
SG10201907040TA (en) | Substrate processing system, substrate processing apparatus, and method of manufacturingsemiconductor device | |
KR102377316B1 (en) | Substrate processing apparatus and method for inspecting parts of substrate processing apparatus | |
EP3489620C0 (en) | Apparatus for inspecting substrate and method thereof | |
TWI799480B (en) | Substrate processing device and temperature control method | |
TWI799695B (en) | Substrate processing method and substrate processing device | |
EP3642386A4 (en) | Substrate processing apparatus and method | |
DK3687238T3 (en) | DATA PROCESSING METHOD AND TERMINAL DEVICE | |
KR20180084786A (en) | Data processing apparatus and data processing method | |
DE102020106598A8 (en) | IMAGE PROCESSING DEVICE AND METHOD | |
TWI799626B (en) | Wafer processing method | |
TWI799624B (en) | Wafer processing method | |
TWI800660B (en) | Substrate processing device and substrate processing method | |
TWI799562B (en) | Substrate mounting device and substrate mounting method | |
DK3680797T3 (en) | Manipulation-protected data processing apparatus |