TWI753424B - Appearance inspection management system, appearance inspection management device, appearance inspection management method, and program - Google Patents

Abstract

The present invention provides a technique for improving the efficiency of judgment of visual inspection in the visual inspection of an object to be inspected, and preventing fluctuations in inspection standards due to the visual inspection. The appearance inspection management system includes: a photographing part for photographing an object to be inspected; an inspection part for inspecting the inspected object based on an image photographed by the photographing part; and a defect candidate extraction unit for extracting relative A defect candidate image having a value of the feature quantity within a predetermined difference range within a predetermined threshold value; a display member; and a visual inspection auxiliary member that displays an image list display and a defect judgment line on the display member, and the image list display is One or more defect candidate images are arranged according to the value of the feature value of each image, the defect judgment line indicates a threshold value, and the defect candidate image displayed in the image list is judged as a defect according to whether or not the defect judgment line is based on the threshold value. to divide.

Description

Appearance inspection management system, appearance inspection management device, appearance inspection management method, and program

The present invention relates to an appearance inspection, which is based on an image of the inspected object captured by irradiating illumination light on the inspected object, and specifically relates to an appearance inspection management system , Appearance inspection management device, appearance inspection management method and program.

Conventionally, there has been known a visual inspection apparatus that inspects an object to be inspected based on an image of the object to be inspected that is captured by irradiating the object to be inspected with illumination light.

For example, Patent Document 1 discloses an inspection apparatus that analyzes an image obtained by irradiating a sheet with visible light or ultraviolet light and photographing its transmitted light or reflected light with a camera, thereby obtaining Abnormalities (contamination of foreign matter, contamination, wrinkles, etc., hereinafter also referred to as defects) in the sheet are detected.

In such a visual inspection apparatus, the presence or absence or type of a defect is automatically determined by comparing the value of the feature quantity extracted from the captured image with a preset threshold value. However, the above-mentioned defect determination often yields a strict result in the sense of preventing omission, and conventionally, a secondary inspection by visual inspection has been performed on the image of the portion temporarily detected as a defect. Also, the inspection threshold value in the visual inspection apparatus is generally reset based on the secondary inspection by the visual inspection. [Prior Art Literature] [Patent Literature]

Patent Document 1: Japanese Patent Laid-Open No. 2015-172519

[The problem to be solved by the invention]

In addition, when the secondary inspection by visual inspection is performed as described above, an image having a feature amount close to the threshold value, which is relatively difficult to determine a defect, is mixed with an image having a feature amount that deviates significantly from the threshold value that can be clearly identified as a defect The totality of existence becomes the object.

Therefore, there is a problem that the time required for visual inspection of images whose necessity of visual inspection is inherently low is wasted. Furthermore, there is also a problem that, every time such a large number of images are visually inspected, the determination made by the inspector fluctuates (ie, the inspection standard wobbles). In addition, if the inspection threshold value of the inspection apparatus is set (changed) based on such a fluctuating defect determination, the primary inspection criterion cannot always be determined, and the inspection accuracy cannot be improved.

The present invention has been made in view of the above-mentioned circumstances, and an object of the present invention is to provide a technique for efficient determination of visual inspection in visual inspection of an object to be inspected, and to prevent fluctuations in inspection standards due to visual inspection. [Means of Solving Problems]

In order to achieve the object, the present invention adopts the following structure.

The visual inspection management system of the present invention includes: a photographing means for photographing an inspection object; an inspection means for comparing a feature quantity obtained from an image of the inspection object photographed by the photographing means with a predetermined threshold value to perform determination, to detect a defect of the object to be inspected; a defect candidate extraction unit extracts, from the image of the object to be inspected, a candidate defect image having a value of the feature quantity within a predetermined difference with respect to the predetermined threshold value a display part; and a visual inspection auxiliary part on which an image list display and a defect judgment line are displayed, wherein the image list display is to display one or more of all the The defect candidate images are arranged, the defect determination line indicates the threshold value, and the defect candidate images in the image list display are classified according to whether they are determined to be defects based on the threshold value.

In addition, as the feature amount mentioned here, various kinds of feature amounts such as image luminance (shade) distribution, luminance peak level, area, width, length, longest and shortest Feret aspect ratio, and circularity can be applied. In addition, hereinafter, the image of the object to be inspected captured by the visual inspection member is also referred to as the object to be inspected image. In addition, a configuration may be adopted in which the inspection means also serves as the defect candidate extraction means, that is, a location having a feature value value within a predetermined difference range with respect to the predetermined threshold value may be detected as a defect, The image captured at the defect portion is extracted as a defect candidate image.

According to the visual inspection management system having such a configuration, a user who performs visual inspection as a secondary inspection of visual inspection can perform visual inspection by comparing a plurality of defect candidate images with a defect determination line representing an objective index, that is, a threshold value. It is possible to prevent fluctuations in the inspection reference.

Further, a plurality of the thresholds may be provided, and the visual inspection aid may display the defect determination line corresponding to the number of the thresholds. Furthermore, the inspection means may acquire a plurality of feature quantities from the image of the object to be inspected, and detect defects of the object to be inspected based on threshold values corresponding to the respective feature quantities. In this way, defects can be reduced based on a plurality of viewpoints, and the content of defects can be subdivided.

Further, the image list display may be formed by arranging one or more of the defect candidate images according to the value of the feature value of each image corresponding to each type of feature value. With such a configuration, when a plurality of feature amounts are used, the visibility of the list display can be improved.

Further, when a defect is detected from the inspection object, a defect type classification unit may further include a defect type classification unit that classifies the defect type. Furthermore, the visual inspection auxiliary means may display the number of the defects on the display means for each type of defects classified by the defect type classification means. With such a configuration, the image data can be managed by classifying the types of defects, and inspection management can be performed based on more detailed information.

Further, the visual inspection management system may further include: an input unit; and an inspection result correction unit that receives, via the input unit, at least one of the defect judgment line and the defect candidate image displayed in the image list. A relative move operation. By having such a configuration, it is possible to correct the determination result of the specific image by the operation of the dialog.

Furthermore, the inspection result correcting means may cause, by the operation, to display on the display part. With such a configuration, when the inspection result has been corrected, the corrected state and its content can be easily recognized.

Further, the inspection result correcting means may accept an operation of relatively moving the defect determination line and at least one of the defect candidate images in the image list display, thereby setting and/or changing the predetermined threshold value. . By having such a structure, the threshold value can be changed by the operation of the dialogue method.

Further, the visual inspection assistance means may display the feature quantity distribution map on the display means simultaneously with the image list display or switchably in the coordinate system defined by the predetermined characteristic quantity, The feature quantity distribution map is arranged such that the value of the feature quantity obtained from the one or more images of the object to be inspected is used as the coordinates of the coordinate system. Further, the inspection management system may further include: a threshold value setting unit for setting and/or changing the predetermined threshold value, displaying a threshold value display line indicating the predetermined threshold value on the feature quantity distribution map, and when the predetermined threshold value is displayed by the When the threshold value setting means changes the predetermined threshold value, the change of the threshold value is reflected in the display of the threshold value display line.

In addition, the threshold value setting means may also be configured to also serve as the inspection result correction means. With such a configuration, the distribution of the feature amounts in the image of the object to be inspected and the relationship with the inspection threshold value can be confirmed at a glance. In addition, it is possible to examine the difference region in which the defect candidate image is extracted while comparing the distribution of the threshold value display line and the feature amount.

Furthermore, the object to be inspected in the visual inspection management system may be a sheet-like article. Further, the visual inspection management system may include at least an inspection management device including the visual inspection auxiliary member as a component.

Furthermore, the visual inspection management method of the present invention manages the visual inspection of the inspection object, the appearance inspection management method comprising: a photographing step of photographing the inspection object; and a defect candidate extraction step of extracting a defect candidate image, the defect The candidate image is an image in which the feature amount obtained from the image of the object to be inspected captured in the imaging step is within a range of a predetermined difference with respect to a predetermined threshold value; and the visual inspection assisting step makes the image A list display and a defect judgment line are displayed on the same screen, and the image list display is a map of one or more defect candidates extracted in the defect candidate extraction step according to the value of the feature amount of each image. The defect determination line indicates the threshold value, and the defect candidate images in the image list display are divided according to whether they are determined to be defects based on the relationship with the threshold value.

Furthermore, the present invention can also be understood as a storage medium that stores a program for causing the information processing device to execute the method, and is a computer-readable storage medium on which such a program is not temporarily recorded.

Furthermore, each of the above-described structures and processes can be combined with each other to constitute the present invention as long as there is no technical inconsistency. [Effect of invention]

According to the present invention, it is possible to provide a technique for making the judgment of the visual inspection in the visual inspection of the object to be inspected efficient, and preventing the fluctuation of the inspection standard caused by the visual inspection.

Hereinafter, embodiments of the present invention will be described with reference to the drawings.

<Application example> (system structure) The present invention can be applied to, for example, the visual inspection management system 9 shown in FIG. 1 . FIG. 1 is a schematic diagram showing a schematic configuration of a visual inspection management system 9 of this application example. The appearance inspection management system 9 includes an appearance inspection apparatus 91 and an inspection management apparatus 92 .

The appearance inspection device 91 is an apparatus that captures an image of an inspection object (not shown) and inspects the inspection object for defects based on the image. As shown in FIG. 1 , as a main structure, it has a The light source 911 of the lighting means, the camera 912 as the photographing means, and the control terminal 913 . In addition, the control terminal 913 corresponds to the inspection means and defect candidate extraction means in the present invention.

The light source 911 is configured to irradiate the inspection object and the calibration standard plate 95 with illumination light. The camera 912 is an imaging unit that captures an image of the inspection object in a state irradiated with illumination light, and outputs a digital image. In addition, hereinafter, the image of the inspection object imaged by the imaging unit is also referred to as an inspection object image. The camera 912 includes, for example, an optical system and an image sensor.

The control terminal 913 has functions such as control of the light source 911 and the camera 912, processing of images imported from the camera 912, and the like, and corresponds to the inspection means in the present invention. The control terminal 913 can include a computer including a central processing unit (CPU), a random access memory (RAM), a non-volatile memory device (such as a hard disk drive) (hard disk drive, flash memory, etc.), input devices (such as keyboard, mouse, touch panel, etc.).

When the appearance inspection of the inspection object is performed in the appearance inspection apparatus 91 having the above-described configuration, the camera 912 captures an image of the inspection object in a state where the illumination light is irradiated from the light source 911, and the control terminal 913 performs the inspection on the inspection object. The captured image is subjected to image processing, and a portion having a feature value deviating from the threshold value is determined as a defect by comparing the obtained feature value value with a preset inspection threshold value.

Next, the functions of the control terminal 913 will be described. The control terminal 913 includes an image acquisition unit 9131, a feature value calculation unit 9132, a defect determination unit 9133, and a defect candidate image acquisition unit 9134 as functional modules related to appearance inspection.

The image acquisition unit 9131 is a function of importing an image from the camera 912, and acquires, for example, an image of the inspection object in a state of being irradiated with illumination light. The feature amount calculation unit 9132 is a function of calculating a feature amount for visual inspection based on the image of the inspection object. In addition, the feature amount is not limited to one, and various feature amounts such as image luminance (shade) distribution, luminance peak level, area, width, length, longest and shortest Feret diameter ratio, and circularity may be calculated.

The defect determination unit 9133 compares the feature amount calculated by the feature amount calculation unit 9132 with a preset threshold value, and determines a portion having a feature amount deviated from the threshold value as a defect. Further, the defect candidate extraction unit 9134 is a function of extracting, from the image of the object to be inspected, a defect candidate image having a feature value within a range of a certain difference with respect to a threshold value for defect determination. .

The inspection management device 92 has a function of displaying an image of a portion determined to be defective by the visual inspection device 91 for secondary determination, a function of setting the type of feature quantity and its threshold value used for inspection by the visual inspection device 91, and the like. The inspection management device 92 can include a computer including a CPU, a RAM, a nonvolatile memory device, an input device, and a display unit (eg, a liquid crystal display, etc.) 93 .

The inspection management device 92 includes a defect candidate image acquisition unit 921 and a visual inspection support unit 922 as functional modules. The defect candidate image acquisition unit 921 is a function of acquiring the defect candidate image extracted by the defect candidate extraction unit 9134 from the visual inspection apparatus 91 . The visual inspection support unit 922 is a function of displaying, on the display unit 93, a list of images displayed in a list, which is a list of images to be displayed based on the values of the feature values possessed by each image, and defect judgment lines. The defect judgment line indicates the threshold, and the defect candidate images displayed in the list are divided according to whether or not the defect is determined to be a defect based on the threshold.

FIG. 2 shows an example of a screen displayed on the display unit 93 by the visual inspection support unit 922 . 2 shows a state in which defect candidate images whose feature values are close to a threshold value are arranged in order from the left in descending order of feature values, when the area of parts with different depths is used as a feature value. The dotted line in FIG. 2 is a defect determination line which shows a threshold value, and is detected as a defect by the visual inspection apparatus 91 compared with the part shown by the image located on the left side. That is, the defect determination line divides the three images on the left and the two images on the right according to whether or not it is determined to be a defect based on the threshold.

According to the visual inspection management system 9 of the present application as described above, the user who performs the visual inspection as a secondary inspection of the visual inspection can refer to only images having a feature value of a value close to the threshold value at a glance. Therefore, the inspection of a clear defect can be omitted, and a plurality of images can be confirmed on one screen, so that the visual inspection can be made more efficient. Furthermore, since a defect determination line indicating a threshold value is displayed, it is possible to perform image defect determination based on an objective index. Thereby, fluctuation of determination can be prevented.

<Embodiment 1> Next, the visual inspection management system 1 which is another example of the form for implementing this invention is demonstrated. However, the dimensions, materials, shapes, relative arrangements, and the like of the components described in this embodiment are not intended to limit the scope of the present invention to these unless otherwise specified.

(system structure) The overall configuration of the visual inspection management system according to the embodiment of the present invention will be described with reference to FIG. 3 . FIG. 3 is a schematic diagram showing the system configuration of the visual inspection management system 1 . As shown in FIG. 3 , the visual inspection management system 1 of the present embodiment includes an external inspection apparatus 2 and an inspection management apparatus 3 as main structures. (Appearance inspection device) The appearance inspection apparatus 2 is an apparatus for acquiring an appearance image of a sheet-like article, and performing defect detection based on the image, and includes, as main components, an illumination system, a measurement system, a conveying mechanism (not shown), a control Terminal 23.

The inspection object T is conveyed in the horizontal direction (arrow direction) by a conveying mechanism not shown. During the conveying, the external appearance image of the inspection object T is continuously acquired by the measurement system and implemented based on this. Check. The object to be inspected T is formed in a sheet shape, for example, paper, cloth, film, or the like can be exemplified. Furthermore, it is not limited to a single material, and may be a sheet body having a plurality of layers, such as a wrapping paper formed by laminating a film and a nonwoven fabric. Moreover, foods, such as dried seaweed, may be used.

The illumination system includes a light source 211 that irradiates visible light (eg, white light) to the surface of the object T under inspection. For these light sources, for example, light emitting diode (Light Emitting Diode, LED) illumination and the like can also be used.

The measurement system includes a camera 221 that captures light irradiated from the light source 211 and reflected by the surface of the test object T (hereinafter referred to as surface reflected light). The camera corresponds to the photographing means in the present invention. In addition, the camera includes a photodetector capable of detecting captured light, a lens, and a signal output unit, and outputs the light detected by the photodetector via the lens as an electrical signal. As the sensor, for example, a Charge Coupled Device (CCD) sensor or a Complementary Metal Oxide Semiconductor (CMOS) sensor can be used.

The camera 221 captures an image of the inspection object in a state where illumination light is irradiated from the light source 211, and the control terminal 23 performs image processing on the captured image, and the obtained feature value values are used to match the preset inspection. The threshold value is compared, and a portion having a feature value deviating from the threshold value is determined as a defect.

The control terminal 23 includes each functional module of the image acquisition unit 231 , the feature value calculation unit 232 , the defect determination unit 233 , the defect type classification unit 234 , and the defect candidate extraction unit 235 , but the functions other than the defect type classification unit 234 are included. The modules are substantially the same as those described in the application example, so detailed descriptions are omitted.

The defect type classification unit 234 classifies the defect type based on a predetermined threshold value and a feature value of an image representing the defect when a defect is detected from the object to be inspected by the defect determination unit 233 . Further, the defect candidate images extracted by the defect candidate extraction unit 235 can be similarly classified. The classified defect types can be arbitrarily set by the user, for example, foreign matter mixing, contamination, wrinkles, holes, etc. can be set, or they can be further classified into subdivided types (such as insects, wood chips, metal foreign objects, oil stains, water stains, large holes, etc.). holes, etc.).

(check management device) The appearance inspection apparatus 2 is connected to the inspection management apparatus 3 via a network (Local Area Network (LAN)), and the appearance inspection apparatus 2 and the inspection management apparatus 3 perform bidirectional communication of information. The inspection management device 3 processes the information received from the visual inspection device 2 and transmits the information related to the inspection to the visual inspection device 2 . The inspection management device 3 includes a general computer system including a CPU, a main memory device, an auxiliary memory device (all not shown), an input device 34 , a display device 35 and the like.

In addition, the examination management apparatus 3 may include a single computer or a plurality of computers. Alternatively, all or part of the functions of the inspection management device 3 may be installed in the control terminal 23 of the visual inspection device 2 . Alternatively, a part of the functions of the inspection management device 3 may be realized by a server (cloud server, etc.) on the network.

The inspection management device 3 of the present embodiment includes a defect candidate image acquisition unit 31 , a visual inspection assistance unit 32 , and an inspection reference setting unit 33 as functional modules.

The defect candidate image acquisition unit 31 is a function of acquiring defect candidate images from the visual inspection apparatus 2 . Also, defect candidate images may be acquired from other locations on the Internet. The visual inspection support unit 32 is a function of displaying a screen for assisting the visual inspection on the display device 35 . The screen displayed on the display device 35 by the visual inspection support unit 32 will be described later. The inspection reference setting unit 33 is a function of accepting an input from the user via the input device 34 and setting the type and threshold value of the feature quantity used in the visual inspection by the visual inspection device 2 . In addition, the inspection reference setting unit 33 in the present embodiment corresponds to the threshold value setting means and the inspection result correction means in the present invention. That is, in the visual inspection management system of the present embodiment, a configuration in which the inspection reference setting unit serves as both the threshold value setting means and the inspection result correction means is adopted.

(Check the processing flow in the management system) Next, the flow of processing performed by the visual inspection management system 1 in the present embodiment will be described with reference to FIG. 4 . First, in the visual inspection apparatus 2, the inspection object T is photographed, and the control terminal 23 acquires an image of the inspection object via the image acquisition unit 231 (step S101). Next, the feature value calculation unit 232 calculates the value of the predetermined feature value from the image of the object to be inspected (step S102 ), and the defect determination unit 233 and the defect type classification unit 234 use the calculated value of the feature value and the preset value. The inspection threshold is compared to perform an inspection (step S103). That is, in step 103, a primary determination is made regarding the presence or absence of defects and the type of defects. In addition, the information of the determination may be sent to the inspection management device 3 together with the image data of the inspection object.

Next, the defect candidate extraction unit 235 compares the value of the feature value of the object image calculated by the feature value calculation unit 232 with the inspection threshold value. In the case of a part within the set predetermined margin range, an image including the part is extracted as a defect candidate image (step S104 ). The extracted images are sent to the inspection management device 3 and stored in the storage device by the defect candidate image acquisition unit 31 . In addition, the defect candidate image acquisition unit 31 may acquire the defect candidate image every time the defect candidate image is extracted, or may be acquired in a predetermined unit (for example, a roll, a lot of products, etc.). After the inspection is completed, the defect candidate images of each predetermined unit are collectively acquired.

Then, when the inspection of the inspection object T of a predetermined unit is completed, the visual inspection support unit 32 displays a list of the memorized defect candidate images on the display device 35 according to a predetermined arrangement rule (step S105 ). . Also, a defect determination line indicating an inspection threshold value is also displayed, and the defect candidate images displayed in a list are divided according to whether or not the inspection threshold value is exceeded (step 106 ).

In addition, for the arrangement displayed in the list, for example, for each type of feature amount used for inspection, the image with a large difference from the threshold value of the feature amount can be arranged in descending power. FIG. 5 is a diagram showing an example of a screen in which a list of defective candidate images is displayed. The broken line in FIG. 5 represents the defect judgment line. As shown in FIG. 5 , the defect candidate images are arranged in a grid based on the viewpoints of two feature quantities, namely, the brightness peak level of the brightness value (the degree of deviation from the brightness value of the texture) and the area of the part showing brightness different from the texture. shape. Fig. 5 shows that, regarding the feature value of the peak level, the higher the image is, the greater the deviation from the texture is, and the feature value of the area is the image that is located farther to the left, and the texture has a different brightness value. the larger the area.

In addition, it is also possible to perform a display that can distinguish the type of defects and the number of defects for each type. As shown in FIG. 5 , on the right side of the defect candidate image list, a table showing the number of each defect type is displayed. The defect candidate image of the area indicated by O in the figure corresponds to the defect of defect type 1, the defect candidate image of the area indicated by P in the figure corresponds to the defect of defect type 2, and the area indicated by Q in the figure The defect candidate image corresponding to defect type 3 defects, and the defect candidate image in the area indicated by R in the figure corresponds to defect type 4 defects.

The inspector who performed the secondary inspection of the visual inspection performed the visual inspection of the defect candidate image while observing the screen display shown in FIG. 5 . At this time, the inspector can change the inspection threshold. Specifically, when it is determined that the inspection threshold should be changed based on the relationship between the list of defect candidate images and the defect determination line, an operation of relatively moving at least one of the defect determination line and the defect candidate image is performed via the input device 34, Thereby, the threshold value can be changed.

FIG. 6 shows a screen example of the image list display when such an operation is performed. The dotted lines shown in FIG. 6(A) and FIG. 6(B) respectively represent defect judgment lines. FIG. 6(A) shows an example of a screen when the defect candidate image is moved to the opposite side of the defect determination line indicating the threshold. On the other hand, (B) of FIG. 6 shows a screen example when the defect determination line is moved.

Returning to the flow of processing performed by the visual inspection management system 1, the inspection management device 3 determines whether or not the threshold value change operation has been performed via the input device 34 (step S107). Here, if no operation is performed, a series of processing is directly terminated. Alternatively, the user may be requested to perform input for ratifying the inspection result, and when the user inputs, the process is terminated.

On the other hand, when the threshold value change operation is performed in step S107 , attention display for notifying that there is a change is performed in the image list display (step S108 ). For example, as shown in FIG. 6(A) and FIG. 6(B) , the display color of the defect candidate image whose defect determination result varies due to the change of the threshold value may be changed, or the thick and dark colors may be used. colored frame to surround the image. Next, the inspection threshold value is changed by the inspection reference setting unit 33 , the setting is transmitted to the visual inspection apparatus 2 (step S109 ), and a series of processes are ended.

According to the inspection management system as described above, when performing a secondary inspection of the visual inspection, not only can the visual inspection be performed efficiently, but the inspection can be performed while comparing a plurality of images with lines corresponding to their thresholds. Threshold correction. Thereby, it is possible to suppress fluctuations in the threshold value change.

(Variation) In addition, the visual inspection support unit 32 can also display a screen other than the screen described above. For example, the visual inspection support unit 32 can display a feature value distribution map in which the values of the feature values obtained from one or more images of the object to be inspected are used as the coordinates of the coordinate system to be arranged on the basis of predetermined feature quantity to define the coordinate system. FIG. 7 is an example of a feature amount distribution diagram displayed on the display device 35 by the visual inspection support unit 32 . The screen shown in FIG. 7 is a project in which the value of the peak grayscale is set on the X-axis as the feature quantity, and the area on the Y-axis is set as the project on the feature quantity. mapper.

The dotted line in FIG. 7 is a threshold value display line indicating the inspection threshold value of each feature quantity. When the threshold value is changed by the inspection reference setting unit 33, the threshold value display line is displayed at a position reflecting the change in conjunction with the change.

By such display, it is possible to confirm at a glance the distribution of the feature amount in the image of the object to be inspected and the relationship with the inspection threshold value. In addition, it is possible to examine the difference region in which the defect candidate image is extracted while comparing the distribution of the threshold value display line and the feature amount.

＜Other＞ The above-described embodiments are merely illustrative of the present invention, and the present invention is not limited to the specific embodiments described above. The present invention can be modified in various ways within the scope of its technical idea. For example, as shown in FIG. 8 , the feature amount distribution map may be displayed simultaneously with the list display of defect candidate images.

In addition, in each of the above-described examples, the defect determination unit and the defect candidate extraction unit have been described as independent functional modules, but they may be integrated. That is, when there is a portion where the value of the feature value of the image of the object to be inspected is within a predetermined margin range set with respect to the inspection threshold, the portion may be determined as a defect, and the portion including the portion determined as a defect may be determined. The image of the defective part is extracted as a defect candidate image. At this time, in the processing flow of the first embodiment, step S103 and step S104 will be executed simultaneously.

Furthermore, in the above-described embodiment, the apparatus for inspecting a sheet-like object to be inspected is an article, but the present invention is not limited to this, and it can be widely applied to an appearance inspection apparatus that performs image processing.

A technical solution of the present invention is an appearance inspection management system, comprising: a photographing unit (221) for photographing an object to be inspected; and an inspection unit (233) for judging from a predetermined threshold value of the object to be inspected photographed by the photographing unit The feature quantity obtained from the image is used to detect the defect of the object to be inspected; a defect candidate extraction unit (235) extracts, from the image of the object to be inspected, a predetermined difference with respect to the predetermined threshold value. defect candidate images of feature value values within a range; a display part (35); and a visual inspection auxiliary part (32) on which an image list display and a defect judgment line are displayed, wherein the image list display is One or more of the defect candidate images are arranged according to the value of the feature value of each image, the defect determination line indicates the threshold, and the defect is divided according to whether it is determined to be a defect based on the threshold. Defect candidate images in the image list display.

Moreover, another technical solution of the present invention is a visual inspection management method for managing the visual inspection of an object to be inspected, the appearance inspection management method comprising: a photographing step ( S101 ) of photographing the object to be inspected; a defect candidate extraction step ( S101 ) S104), extracting a defect candidate image in which the feature quantity obtained from the image of the object to be inspected captured in the imaging step is within a range of a predetermined difference with respect to a predetermined threshold value images; and a visual inspection assistance step ( S105 , S106 ), in which a list of images and a defect judgment line are displayed on the same screen, and the list of images is displayed based on the value of the feature amount of each image. One or more of the defect candidate images extracted in the defect candidate extraction step are arranged in a row, the defect determination line indicates the threshold, and the defect is divided according to whether the defect is determined according to the relationship with the threshold. Defect candidate images displayed in the image list.

1, 9: Appearance inspection management system 2. 91: Appearance inspection device 3, 92: Check management device 23, 913: Control terminal 31, 921, 9134: Defect candidate image acquisition unit 32, 922: Visual Inspection Auxiliary Department 33: Check the reference setting section 34: Input device 35: Display device 93: Display parts 211, 912: light source 221, 911: Camera 231, 9131: Image Acquisition Department 232, 9132: Feature calculation section 233, 9133: Defect Judgment Department 234: Defect Type Classification Department 235: Defect candidate extraction section S101~S109: Steps T: object to be inspected

FIG. 1 is a schematic diagram showing the configuration of a visual inspection management system of an application example of the present invention. FIG. 2 is a diagram showing an example of a screen displayed on a display part by a visual inspection support unit of an application example. FIG. 3 is a schematic diagram showing the configuration of the visual inspection management system according to the embodiment. FIG. 4 is a flowchart showing a processing flow of the visual inspection management system according to the embodiment. FIG. 5 is a first diagram showing an example of a screen displayed on the display device by the visual inspection support unit according to the embodiment. FIG. 6(A) is a second diagram showing an example of a screen displayed on the display device by the visual inspection support unit according to the embodiment. FIG. 6(B) is a third diagram showing an example of a screen displayed on the display device by the visual inspection assistance unit of the embodiment. FIG. 7 is a fourth diagram showing an example of a screen displayed on the display device by the visual inspection assistance unit according to the embodiment. FIG. 8 is a fifth diagram showing an example of a screen displayed on the display device by the visual inspection assistance unit according to the embodiment.

1: Appearance inspection management system

2: Appearance inspection device

3: Check the management device

23: Control Terminal

31: Defect candidate image acquisition unit

32: Visual Inspection Auxiliary Department

33: Check the reference setting part

34: Input device

35: Display device

211: Light source

221: Camera

231: Image Acquisition Department

232: Feature calculation section

233: Defect Judgment Department

234: Defect Type Classification Department

235: Defect candidate extraction section

T: object to be inspected

Claims (15)

A visual inspection management system, comprising: a photographing part for photographing an object to be inspected; an inspection part for comparing a feature quantity obtained from an image of the inspected object photographed by the photographing part with a predetermined threshold value, thereby making a determination to detecting a defect of the object to be inspected; and a defect candidate extraction unit extracting, from the image of the object to be inspected, a candidate defect image having a value of the feature quantity within a predetermined difference range with respect to the predetermined threshold value; A display part; and a visual inspection auxiliary part for displaying an image list display and a defect judgment line on the display part, wherein the image list display is to display one or more of the said The defect candidate images are arranged, the defect determination line indicates the threshold value, and the defect candidate images in the image list display are classified according to whether they are determined to be defects according to the threshold value, so that the defect candidate images are determined as defects. Defect candidate images of defects are arranged and displayed on one side of the defect judgment line according to the value of the feature quantity, and defect candidate images that are not judged as defects are arranged and displayed on the defect judgment line according to the value of the feature quantity. the other side of the line. The visual inspection management system according to claim 1, wherein a plurality of the threshold values are provided, and the visual inspection auxiliary means displays the defect determination line corresponding to the number of the threshold values. The visual inspection management system according to claim 1 or claim 2, wherein the inspection means acquires a plurality of feature quantities from the image of the inspection object, and detects the inspection object based on a threshold value corresponding to each feature amount. defect. The visual inspection management system according to claim 3, wherein the image list display corresponds to each type of feature quantity, and one or more of the defect candidate maps are sorted according to the value of the feature quantity possessed by each image. arranged like. The visual inspection management system according to claim 1 or claim 2, further comprising: a defect type classification unit that, when a defect is detected from the inspection object, classifies the defect type. The visual inspection management system according to claim 5, wherein the visual inspection auxiliary means causes the display means to display the number of the defects corresponding to each type of defects classified by the defect type classification means. The visual inspection management system according to claim 1, further comprising: input means; and inspection result correction means for accepting, via the input means, the defect judgment line and the defect candidate image displayed in the image list operation of at least one relative movement. The visual inspection management system according to claim 7, wherein the inspection result correction means is used for display and operation before the operation by the operation. The attention display of the defect candidate image that has moved to the opposite side of the defect determination line by comparison is displayed on the display means. The visual inspection management system according to claim 7 or claim 8, wherein the inspection result correction means accepts an operation to relatively move the defect determination line and at least one of the defect candidate images in the image list display , thereby setting and/or changing the predetermined threshold. The visual inspection management system according to claim 1 or claim 2, wherein the visual inspection assistance means simultaneously displays a feature quantity distribution map and the image list in a coordinate system defined by a predetermined feature quantity Alternatively, it may be switchably displayed on the display means, and the feature value distribution map may be arranged such that the value of the feature value obtained from one or more images of the object to be inspected is used as the coordinates of the coordinate system. The visual inspection management system according to claim 10, further comprising: threshold value setting means for setting and/or changing the predetermined threshold value, displaying a threshold value display line indicating the predetermined threshold value on the feature quantity distribution map, and when When the predetermined threshold value is changed by the threshold value setting means, the change of the threshold value is reflected in the display of the threshold value display line. A visual inspection management device, which at least includes the visual inspection auxiliary component, and the visual inspection management device constitutes any one of claim 1 to claim 11. at least a part of the visual inspection management system described above. A visual inspection management system, comprising: a conveying part for continuously conveying a sheet-like inspected object; a photographing part for continuously photographing the inspected object being conveyed; The feature quantity obtained from the object image and a predetermined threshold value are used to determine and detect the defective part of the inspection object; the defect candidate extraction unit extracts, from the inspection object image, relative to the predetermined value. A defect candidate image is an image having a feature value within a range of a predetermined difference from a threshold value; a display part; The image list display is formed by arranging one or more of the defect candidate images according to the value of the feature value of each image, the defect judgment line indicates the threshold value, and the images are sorted according to the threshold value. The defect candidate images displayed in the list are divided according to whether they are determined to be defects, and the defect candidate images determined to be defects are arranged and displayed on the side of the defect determination line according to the value of the feature value, and the defect candidate images determined to be defects are arranged and displayed on the side of the defect determination line. The defect candidate images judged to be defects are displayed on the other side of the defect judgment line according to the value of the feature quantity. A visual inspection management method for managing the visual inspection of an object to be inspected, the appearance inspection management method comprising: a photographing step of photographing the object to be inspected; A defect candidate extraction step for extracting a defect candidate image in which the feature quantity obtained from the image of the inspection object captured in the imaging step is within a range of a predetermined difference with respect to a predetermined threshold value and a visual inspection assisting step of displaying a list of images and a defect judgment line on the same screen, and the list display of images is based on the value of the feature amount possessed by each image to classify the defects in the defects. One or more of the defect candidate images extracted in the candidate extraction step are arranged, the defect determination line indicates the threshold value, and the defect candidate images in the image list display are displayed according to the relationship with the threshold value. It is divided according to whether it is determined to be a defect, and the defect candidate images determined to be defects are arranged and displayed on the side of the defect determination line according to the value of the feature amount, and the defect candidate images that are not determined to be defects are displayed. Arranged and displayed on the other side of the defect judgment line according to the value of the feature quantity. A program for causing an information processing device to perform the steps described in claim 14.

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