TWI669880B - Method of detecting intruding metal for induction type power supply system and related supplying-end module - Google Patents

Method of detecting intruding metal for induction type power supply system and related supplying-end module Download PDF

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TWI669880B
TWI669880B TW107114462A TW107114462A TWI669880B TW I669880 B TWI669880 B TW I669880B TW 107114462 A TW107114462 A TW 107114462A TW 107114462 A TW107114462 A TW 107114462A TW I669880 B TWI669880 B TW I669880B
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power supply
peak
voltage
trigger voltage
peak trigger
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TW107114462A
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TW201828568A (en
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蔡明球
詹其哲
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富達通科技股份有限公司
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Priority to CN201810762662.0A priority patent/CN109143386B/en
Publication of TW201828568A publication Critical patent/TW201828568A/en
Priority to US16/128,526 priority patent/US10630116B2/en
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Priority to US16/547,588 priority patent/US10594168B2/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V3/00Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation
    • G01V3/08Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices
    • G01V3/10Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices using induction coils
    • G01V3/101Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices using induction coils by measuring the impedance of the search coil; by measuring features of a resonant circuit comprising the search coil
    • G01V3/102Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices using induction coils by measuring the impedance of the search coil; by measuring features of a resonant circuit comprising the search coil by measuring amplitude

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Remote Sensing (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electromagnetism (AREA)
  • Environmental & Geological Engineering (AREA)
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  • General Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Geophysics (AREA)
  • Geophysics And Detection Of Objects (AREA)

Abstract

一種金屬異物檢測方法,用於一感應式電源供應器之一供電模組,該供電模組包含有一供電線圈,該金屬異物檢測方法包含有在一測量期間內中斷該感應式電源供應器之至少一驅動訊號以停止對該供電線圈進行驅動,以產生該供電線圈之一線圈訊號;在該線圈訊號之連續複數個振盪週期內測量該線圈訊號之複數個波峰,以分別取得複數個峰值觸發電壓;根據該複數個峰值觸發電壓中的一第一峰值觸發電壓及一第二峰值觸發電壓,計算一第一衰減參數;以及比較該第一衰減參數與一第一臨界值,以判斷該感應式電源供應器之一電力發送範圍內是否存在金屬異物。 A metal foreign object detection method for a power supply module of an inductive power supply. The power supply module includes a power supply coil. The metal foreign object detection method includes at least interrupting the inductive power supply during a measurement period. A driving signal to stop driving the power supply coil to generate a coil signal of the power supply coil; measuring the multiple peaks of the coil signal during successive oscillation cycles of the coil signal to obtain a plurality of peak trigger voltages respectively ; Calculating a first attenuation parameter according to a first peak trigger voltage and a second peak trigger voltage of the plurality of peak trigger voltages; and comparing the first attenuation parameter with a first threshold value to determine the inductive type Whether a metal foreign object exists in the power transmission range of one of the power supplies.

Description

感應式電源供應器之金屬異物檢測方法及其供電模組 Method for detecting metal foreign body in inductive power supply and power supply module thereof

本發明係指一種金屬異物檢測方法,尤指一種可用於感應式電源供應器之金屬異物檢測方法。 The present invention relates to a method for detecting a foreign metal object, and more particularly to a method for detecting a foreign metal object that can be used in an inductive power supply.

在感應式電源供應器中,供電端係透過驅動電路推動供電線圈產生諧振,進而發出射頻電磁波,再透過受電端的線圈接收電磁波能量後進行電性轉換,以產生直流電源提供予受電端裝置。供電線圈所發送的電磁能量若施加在金屬體上,會對其產生加熱效果,累積熱量後可能造成金屬體高溫引起燃燒而發生危害。在先前技術中,感應式電源供應器可在送電過程中週期性地中斷驅動以進行金屬異物檢測,其透過量測斜率的變化來進行判斷。然而,供電端線圈所輸出之功率會隨著供電端與受電端之距離隨時調節,例如當線圈距離較遠時輸出較大功率,當線圈距離較近時輸出較小功率。隨著輸出功率的改變,線圈訊號的振幅也發生變化,使得線圈中斷驅動時諧振訊號衰減之情況也有所不同。因此,當功率發生變化時,供電端需要花費數個偵測週期來調整比較器設定之電壓,以追蹤訊號峰值。若因功率或負載造成線圈電壓不穩定的情況下,難以鎖定訊號峰值以判斷衰減斜率。 In an inductive power supply, the power supply end drives the power supply coil to resonate through a drive circuit, and then emits radio frequency electromagnetic waves. The electromagnetic power is then converted through the power receiving coil to generate a DC power supply to the power receiving end device. If the electromagnetic energy sent by the power supply coil is applied to a metal body, it will have a heating effect. After the heat is accumulated, the metal body may cause high temperature to cause combustion and cause harm. In the prior art, the inductive power supply may periodically interrupt the driving during the power transmission process to detect metal foreign objects, and the judgment is made by measuring the change in the slope of the measurement. However, the power output by the coil at the power supply end will be adjusted at any time according to the distance between the power supply end and the power receiving end. For example, when the coil distance is far away, a higher power is output, and when the coil distance is closer, a lower power is output. With the change of output power, the amplitude of the coil signal also changes, so that the resonance signal attenuation will be different when the coil is interrupted. Therefore, when the power changes, the power supply needs to spend several detection cycles to adjust the voltage set by the comparator to track the signal peak. If the coil voltage is unstable due to power or load, it is difficult to lock the signal peak to determine the attenuation slope.

此外,為了判斷衰減斜率,驅動訊號需中斷一段時間。然而,在無線充電過程中中斷驅動訊號會降低整體功率輸出能力,若中斷時間過長,會影響供電效率,且過長的中斷時間之後重新接合驅動訊號容易產生過大的電磁干擾(Electromagnetic Interference,EMI)。現有技術係透過比較器模組取得多個波峰電壓準位來判斷線圈訊號衰減之多段斜率的變化,因而需要中斷較長的時間。以中華民國專利案TW I577108為例,其需要7~15個不等的線圈振盪週期來完成四個波峰電壓準位的量測以判斷衰減斜率的變化。 In addition, in order to determine the attenuation slope, the driving signal needs to be interrupted for a period of time. However, interrupting the driving signal during the wireless charging process will reduce the overall power output capability. If the interruption time is too long, it will affect the power supply efficiency, and re-engaging the driving signal after an excessively long interruption time is likely to cause excessive electromagnetic interference (Electromagnetic Interference, EMI). ). In the prior art, multiple peak voltage levels are obtained through a comparator module to determine the change in the slope of the coil signal attenuation in multiple stages, which requires a longer interruption time. Taking the patent case TW I577108 of the Republic of China as an example, it requires 7 to 15 different coil oscillation periods to complete the measurement of the four peak voltage levels to determine the change in the attenuation slope.

有鑑於此,實有必要提出另一種金屬異物檢測方法,能夠在極短的中斷驅動時間內完成檢測,同時避免功率或負載變化影響金屬異物檢測的功效。 In view of this, it is necessary to propose another metal foreign object detection method, which can complete the detection in a very short interrupted driving time, while avoiding power or load changes affecting the effectiveness of metal foreign object detection.

因此,本發明之主要目的即在於提供一種可在極短的中斷驅動時間內完成檢測之金屬異物檢測方法,其最低可在2~3個線圈振盪週期內完成金屬異物檢測。此外,本發明之金屬異物檢測方法可透過線圈訊號之衰減比例來進行判斷,可解決先前技術之衰減斜率判斷方式易受到線圈振幅和負載影響的缺點。 Therefore, the main object of the present invention is to provide a metal foreign object detection method that can complete the detection in a very short interrupted driving time, which can complete the metal foreign object detection at least in 2 to 3 coil oscillation cycles. In addition, the method for detecting a metal foreign object of the present invention can be judged by the attenuation ratio of the coil signal, which can solve the disadvantage that the attenuation slope determination method of the prior art is easily affected by the coil amplitude and load.

本發明揭露一種金屬異物檢測方法,用於一感應式電源供應器之一供電模組,該供電模組包含有一供電線圈,該金屬異物檢測方法包含有在一測量期間內中斷該感應式電源供應器之至少一驅動訊號以停止對該供電線圈進行驅動,以產生該供電線圈之一線圈訊號;在該線圈訊號之連續複數個振盪週期內測量該線圈訊號之複數個波峰,以分別取得複數個峰值觸發電壓;根據該複數個峰值觸發電壓中的一第一峰值觸發電壓及一第二峰值觸發電壓,計算一第 一衰減參數;以及比較該第一衰減參數與一第一臨界值,以判斷該感應式電源供應器之一電力發送範圍內是否存在金屬異物。 The invention discloses a metal foreign object detection method for a power supply module of an inductive power supply. The power supply module includes a power supply coil. The metal foreign object detection method includes interrupting the inductive power supply during a measurement period. At least one driving signal of the generator to stop driving the power supply coil to generate a coil signal of the power supply coil; measuring a plurality of peaks of the coil signal during a plurality of consecutive oscillation cycles of the coil signal to obtain a plurality of each Peak trigger voltage; calculates a first trigger voltage based on a first peak trigger voltage and a second peak trigger voltage of the plurality of peak trigger voltages. An attenuation parameter; and comparing the first attenuation parameter with a first threshold value to determine whether a metal foreign object exists within a power transmission range of the inductive power supply.

本發明另揭露一種用於一感應式電源供應器之供電模組,用來執行一金屬異物檢測方法,該供電模組包含有一供電線圈、一諧振電容、至少一供電驅動單元、一訊號接收模組及一處理器。該諧振電容耦接於該供電線圈,用來搭配該供電線圈進行諧振。該至少一供電驅動單元耦接於該供電線圈及該諧振電容,用來發送至少一驅動訊號至該供電線圈,以驅動該供電線圈產生能量,並在一測量期間內中斷該至少一驅動訊號以停止對該供電線圈進行驅動,以產生該供電線圈之一線圈訊號。該訊號接收模組耦接於該供電線圈,用來接收該供電線圈之該線圈訊號。該處理器耦接於該訊號接收模組,用來執行以下步驟:在該線圈訊號之連續複數個振盪週期內測量該線圈訊號之複數個波峰,以分別取得複數個峰值觸發電壓;根據該複數個峰值觸發電壓中的一第一峰值觸發電壓及一第二峰值觸發電壓,計算一第一衰減參數;以及比較該第一衰減參數與一第一臨界值,以判斷該感應式電源供應器之一電力發送範圍內是否存在金屬異物。 The invention also discloses a power supply module for an inductive power supply, which is used to perform a metal foreign object detection method. The power supply module includes a power supply coil, a resonance capacitor, at least a power supply drive unit, and a signal receiving module. Group and a processor. The resonance capacitor is coupled to the power supply coil, and is used for resonance with the power supply coil. The at least one power supply driving unit is coupled to the power supply coil and the resonance capacitor, and is used to send at least one driving signal to the power supply coil to drive the power supply coil to generate energy, and interrupt the at least one driving signal during a measurement period to Stop driving the power supply coil to generate a coil signal of one of the power supply coils. The signal receiving module is coupled to the power supply coil for receiving the coil signal of the power supply coil. The processor is coupled to the signal receiving module, and is used to perform the following steps: measuring multiple peaks of the coil signal during a plurality of consecutive oscillation cycles of the coil signal to obtain a plurality of peak trigger voltages respectively; according to the complex number A first peak trigger voltage and a second peak trigger voltage among the peak trigger voltages are used to calculate a first attenuation parameter; and the first attenuation parameter is compared with a first threshold value to determine the value of the inductive power supply. Whether there is metal foreign matter in a power transmission range.

本發明另揭露一種金屬異物檢測方法,用於一感應式電源供應器之一供電模組,該供電模組包含有一供電線圈,該金屬異物檢測方法包含有取得前一測量期間內測量之相對應之一先前峰值觸發電壓,設定為一參考電壓值;在一測量期間內中斷該感應式電源供應器之至少一驅動訊號以停止對該供電線圈進行驅動,以產生該供電線圈之一線圈訊號;在該線圈訊號之一振盪週期內測量該線圈訊號之一第一波峰,以取得一第一峰值觸發電壓;比較該第一峰值觸發電壓與該參考電壓值;以及當該第一峰值觸發電壓等於或接近於該參考電 壓值時,判斷該感應式電源供應器之一電力發送範圍內不存在金屬異物。 The invention further discloses a metal foreign object detection method for a power supply module of an inductive power supply. The power supply module includes a power supply coil, and the metal foreign object detection method includes a corresponding measurement obtained during a previous measurement period. One of the previous peak trigger voltages is set to a reference voltage value; at least one driving signal of the inductive power supply is interrupted during a measurement period to stop driving the power supply coil to generate a coil signal of the power supply coil; Measuring a first peak of the coil signal during an oscillation period of the coil signal to obtain a first peak trigger voltage; comparing the first peak trigger voltage with the reference voltage value; and when the first peak trigger voltage is equal to Or close to the reference When the voltage value is determined, it is determined that there is no metal foreign object in the power transmission range of one of the inductive power supplies.

100‧‧‧感應式電源供應器 100‧‧‧ Inductive Power Supply

1‧‧‧供電模組 1‧‧‧power supply module

10‧‧‧電源供應器 10‧‧‧ Power Supply

111‧‧‧處理器 111‧‧‧ processor

112‧‧‧時脈產生器 112‧‧‧Clock Generator

113‧‧‧電壓產生裝置 113‧‧‧Voltage generating device

114‧‧‧比較器 114‧‧‧ Comparator

120‧‧‧訊號接收模組 120‧‧‧Signal receiving module

121、122‧‧‧供電驅動單元 121, 122‧‧‧ Power supply drive unit

130‧‧‧分壓電路 130‧‧‧Divided voltage circuit

131、132‧‧‧分壓電阻 131, 132‧‧‧ divided voltage resistor

141、142‧‧‧諧振電容 141, 142‧‧‧Resonant capacitor

16‧‧‧供電線圈 16‧‧‧Power supply coil

161、261‧‧‧磁導體 161, 261‧‧‧ magnetic conductor

D1、D2‧‧‧驅動訊號 D1, D2‧‧‧ drive signal

C1‧‧‧線圈訊號 C1‧‧‧coil signal

2‧‧‧受電模組 2‧‧‧ Power receiving module

21‧‧‧負載單元 21‧‧‧load unit

22‧‧‧電容 22‧‧‧Capacitor

230‧‧‧整流電路 230‧‧‧ rectifier circuit

241、242‧‧‧諧振電容 241, 242‧‧‧Resonant capacitor

26‧‧‧受電線圈 26‧‧‧Power receiving coil

3‧‧‧金屬異物 3‧‧‧ metal foreign body

20、80‧‧‧金屬異物檢測流程 20、80‧‧‧ Metal foreign object detection process

200~222、800~818‧‧‧步驟 200 ~ 222, 800 ~ 818‧‧‧ steps

CP1‧‧‧比較結果 CP1‧‧‧ comparison results

A、B、C、D、E、F‧‧‧波峰 A, B, C, D, E, F‧‧‧ peaks

VB、VC、VD、VE、VF‧‧‧峰值觸發電壓 VB, VC, VD, VE, VF‧‧‧Peak trigger voltage

V0_B、V0_C、V0_D、V0_E、V0_F‧‧‧觸發起始電位 V0_B, V0_C, V0_D, V0_E, V0_F‧‧‧Trigger start potential

PAR1‧‧‧第一衰減參數 PAR1‧‧‧First attenuation parameter

PAR2‧‧‧第二衰減參數 PAR2‧‧‧Second attenuation parameter

PAR3‧‧‧第三衰減參數 PAR3‧‧‧Third attenuation parameter

PAR4‧‧‧第四衰減參數 PAR4‧‧‧Fourth attenuation parameter

TH1‧‧‧第一臨界值 TH1‧‧‧First critical value

TH2‧‧‧第二臨界值 TH2‧‧‧The second critical value

TH3‧‧‧第三臨界值 TH3‧‧‧three critical value

TH0‧‧‧基礎臨界值 TH0‧‧‧Basic critical value

第1圖為本發明實施例一感應式電源供應器之示意圖。 FIG. 1 is a schematic diagram of an inductive power supply according to an embodiment of the present invention.

第2圖為本發明實施例之一金屬異物檢測流程之示意圖。 FIG. 2 is a schematic diagram of a metal foreign object detection process according to an embodiment of the present invention.

第3圖為在一測量期間內停止驅動供電線圈之示意圖。 FIG. 3 is a schematic diagram of stopping driving the power supply coil during a measurement period.

第4~7圖為本發明實施例在一測量期間內取得峰值觸發電壓之示意圖。 4 to 7 are schematic diagrams of obtaining a peak trigger voltage during a measurement period according to an embodiment of the present invention.

第8圖為本發明實施例另一金屬異物檢測流程之示意圖。 FIG. 8 is a schematic diagram of another metal foreign object detection process according to an embodiment of the present invention.

第9圖為本發明實施例在一測量期間內透過一峰值觸發電壓來進行金屬異物判別之示意圖。 FIG. 9 is a schematic diagram of identifying a metal foreign object through a peak trigger voltage during a measurement period according to an embodiment of the present invention.

請參考第1圖,第1圖為本發明實施例一感應式電源供應器100之示意圖。如第1圖所示,感應式電源供應器100包含有一供電模組1及一受電模組2。 供電模組1可接收來自於一電源供應器10之電源,並輸出無線電力至受電模組2。供電模組1包含有一供電線圈16及諧振電容141、142,以C-L-C的結構設置。其中,供電線圈16可用來發送電磁能量至受電模組2以進行供電,諧振電容141及142分別耦接於供電線圈16兩端,於供電時可用來搭配供電線圈16進行諧振。此外,在供電模組1中,可選擇性地採用磁性材料所構成之一磁導體161,用來提升供電線圈16之電磁感應能力,同時避免電磁能量影響線圈非感應面方向之物體。 Please refer to FIG. 1. FIG. 1 is a schematic diagram of an inductive power supply 100 according to an embodiment of the present invention. As shown in FIG. 1, the inductive power supply 100 includes a power supply module 1 and a power receiving module 2. The power supply module 1 can receive power from a power supply 10 and output wireless power to the power receiving module 2. The power supply module 1 includes a power supply coil 16 and resonance capacitors 141 and 142, and is arranged in a C-L-C structure. The power supply coil 16 can be used to send electromagnetic energy to the power receiving module 2 for power supply. The resonance capacitors 141 and 142 are respectively coupled to both ends of the power supply coil 16 and can be used to resonate with the power supply coil 16 when power is supplied. In addition, in the power supply module 1, a magnetic conductor 161 made of a magnetic material may be selectively used to improve the electromagnetic induction capability of the power supply coil 16 while avoiding electromagnetic energy from affecting objects in the direction of the non-inductive surface of the coil.

為控制供電線圈16及諧振電容141、142的運作,供電模組1另包含有 一處理器111、一時脈產生器112、供電驅動單元121及122、一訊號接收模組120及一分壓電路130。供電驅動單元121及122耦接於供電線圈16及諧振電容141及142,可分別發送驅動訊號D1及D2至供電線圈16,其可接收處理器111的控制,用以驅動供電線圈16產生並發送能量。供電驅動單元121及122兩者同時運作時,可進行全橋驅動。在部分實施例中,亦可僅開啟供電驅動單元121及122其中一者,抑或僅配置一個供電驅動單元121或122,以進行半橋驅動。時脈產生器112耦接於供電驅動單元121及122,可用來控制供電驅動單元121及122發送驅動訊號D1及D2。時脈產生器112可以是一脈衝寬度調變產生器(Pulse Width Modulation generator,PWM generator)或其它類型的時脈產生器,用來輸出一時脈訊號至供電驅動單元121及122。處理器111可接收供電線圈16上的線圈訊號C1(即供電線圈16及諧振電容142之間的電壓訊號)之相關資訊,如線圈訊號C1之諧振頻率或衰減幅度等,並據以判別金屬異物是否存在。處理器111可以是一中央處理器(Central Processing Unit,CPU)、一微處理器(microprocessor)、一微控制器(Micro Controller Unit,MCU)、或其它類型的處理裝置或運算裝置。 訊號接收模組120可用來追蹤線圈訊號C1之諧振頻率及峰值大小,並將諧振頻率及峰值之相關資訊提供予處理器111以進行後續判讀。分壓電路130包含有分壓電阻131及132,其可對供電線圈16上的線圈訊號C1進行衰減之後,將其輸出至處理器111及訊號接收模組120。在部分實施例中,若處理器111及訊號接收模組120等電路具有足夠的耐壓,亦可不採用分壓電路130,直接由處理器111接收供電線圈16上的線圈訊號C1。至於其他可能的組成元件或模組,如供電單元、顯示單元等,可視系統需求而增加或減少,故在不影響本實施例之說明下,略而未示。 In order to control the operation of the power supply coil 16 and the resonance capacitors 141 and 142, the power supply module 1 further includes A processor 111, a clock generator 112, power supply driving units 121 and 122, a signal receiving module 120, and a voltage dividing circuit 130. The power supply driving units 121 and 122 are coupled to the power supply coil 16 and the resonance capacitors 141 and 142, and can send driving signals D1 and D2 to the power supply coil 16, respectively. It can receive the control of the processor 111 to drive the power supply coil 16 to generate and send energy. When both the power supply driving units 121 and 122 are operated at the same time, full-bridge driving can be performed. In some embodiments, only one of the power supply driving units 121 and 122 may be turned on, or only one power supply driving unit 121 or 122 may be configured for half-bridge driving. The clock generator 112 is coupled to the power supply driving units 121 and 122 and can be used to control the power supply driving units 121 and 122 to send driving signals D1 and D2. The clock generator 112 may be a pulse width modulation generator (PWM generator) or other types of clock generators, and is used to output a clock signal to the power supply driving units 121 and 122. The processor 111 can receive information about the coil signal C1 on the power supply coil 16 (that is, the voltage signal between the power supply coil 16 and the resonance capacitor 142), such as the resonance frequency or attenuation range of the coil signal C1, and discriminate metal foreign objects based thereon. does it exist. The processor 111 may be a central processing unit (CPU), a microprocessor, a micro controller unit (MCU), or other types of processing devices or computing devices. The signal receiving module 120 can be used to track the resonance frequency and the peak value of the coil signal C1, and provide the information about the resonance frequency and the peak value to the processor 111 for subsequent interpretation. The voltage dividing circuit 130 includes voltage dividing resistors 131 and 132, which can attenuate the coil signal C1 on the power supply coil 16 and output it to the processor 111 and the signal receiving module 120. In some embodiments, if the circuits such as the processor 111 and the signal receiving module 120 have sufficient withstand voltage, the processor 111 may directly receive the coil signal C1 on the power supply coil 16 without using the voltage dividing circuit 130. As for other possible constituent elements or modules, such as a power supply unit, a display unit, etc., they may be increased or decreased according to the system requirements, so they are not shown without affecting the description of this embodiment.

在一實施例中,訊號接收模組120包含有一電壓產生裝置113及一比 較器114,如第1圖所示。電壓產生裝置113可以是一數位類比轉換器(Digital to Analog Converter,DAC),其可接收來自於處理器111之一參考電壓資訊,將其轉換為類比電壓並加以輸出。比較器114之一輸入端可接收參考電壓,另一輸入端則接收來自於供電線圈16之線圈訊號C1,其可比較線圈訊號C1與參考電壓,處理器111再根據上述比較之結果進行後續判斷及訊號處理。需注意的是,訊號接收模組120亦可整合於處理器111內部,而不限於此。 In an embodiment, the signal receiving module 120 includes a voltage generating device 113 and a ratio Comparator 114 is shown in FIG. 1. The voltage generating device 113 can be a digital to analog converter (DAC), which can receive a reference voltage information from the processor 111, convert it to an analog voltage and output it. One input of the comparator 114 can receive the reference voltage, and the other input can receive the coil signal C1 from the power supply coil 16. It can compare the coil signal C1 with the reference voltage, and the processor 111 performs subsequent judgments based on the results of the above comparison. And signal processing. It should be noted that the signal receiving module 120 may also be integrated in the processor 111, but is not limited thereto.

請繼續參考第1圖。受電模組2包含有一負載單元21、一電容22、一整流電路230、一受電線圈26及諧振電容241、242。在受電模組2中,亦可選擇性地採用磁性材料所構成之一磁導體261,以提升受電線圈26之電磁感應能力,同時避免電磁能量影響線圈非感應面方向之物體。受電線圈26可用來接收供電線圈16之供電,並將接收到的電力傳送至整流電路230以進行整流,完成整流之後再傳送至後端的電容22及負載單元21。電容22可以是用來進行濾波的濾波電容或用於穩定輸出電壓的穩壓電容,且不應以此為限。在受電模組2中,其他可能的組成元件或模組,如訊號反饋電路、受電微處理器等,可視系統需求而增加或減少,故在不影響本實施例之說明下,略而未示。 Please continue to refer to Figure 1. The power receiving module 2 includes a load unit 21, a capacitor 22, a rectifier circuit 230, a power receiving coil 26, and resonance capacitors 241, 242. In the power receiving module 2, a magnetic conductor 261 made of a magnetic material can also be selectively used to improve the electromagnetic induction capability of the power receiving coil 26, and at the same time to prevent electromagnetic energy from affecting objects in the direction of the non-inductive surface of the coil. The power receiving coil 26 can be used to receive power from the power supply coil 16 and transmit the received power to the rectifier circuit 230 for rectification. After the rectification is completed, the power is transmitted to the back-end capacitor 22 and the load unit 21. The capacitor 22 may be a filtering capacitor for filtering or a voltage stabilizing capacitor for stabilizing the output voltage, and should not be limited thereto. In the power receiving module 2, other possible constituent elements or modules, such as a signal feedback circuit, a power receiving microprocessor, etc. may be increased or decreased according to the needs of the system. Therefore, it is not shown without affecting the description of this embodiment. .

此外,一金屬異物3未包含於感應式電源供應器100,但繪示於第1圖中的供電模組1及受電模組2之間以方便說明。當金屬異物3位於感應式電源供應器100之電力發送範圍內時,可能會接收到供電模組1發送的電磁能量而發熱。 本發明之金屬異物檢測方法即可用來判斷感應式電源供應器100之電力發送範圍內是否存在金屬異物3,並在判斷金屬異物3存在時停止送電。 In addition, a metallic foreign object 3 is not included in the inductive power supply 100, but is shown between the power supply module 1 and the power receiving module 2 in FIG. 1 for convenience of description. When the metal foreign object 3 is within the power transmission range of the inductive power supply 100, it may receive electromagnetic energy sent by the power supply module 1 and generate heat. The metal foreign object detection method of the present invention can be used to determine whether a metal foreign object 3 exists within the power transmission range of the inductive power supply 100, and stop power transmission when it is determined that the metal foreign object 3 exists.

不同於習知技術中供電模組藉由量測線圈衰減斜率的變化來判斷金 屬異物,本發明藉由量測線圈訊號之電壓衰減比例來進行金屬異物的判斷。請參考第2圖,第2圖為本發明實施例之一金屬異物檢測流程20之示意圖。如第2圖所示,金屬異物檢測流程20可用於一感應式電源供應器之供電端(如第1圖之感應式電源供應器100之供電模組1),其包含以下步驟:步驟200:開始。 Different from the conventional technology, the power supply module judges the gold by measuring the change in the attenuation slope of the coil. It is a foreign object. The present invention determines the metal foreign object by measuring the voltage attenuation ratio of the coil signal. Please refer to FIG. 2, which is a schematic diagram of a metal foreign object detection process 20 according to an embodiment of the present invention. As shown in FIG. 2, the metal foreign object detection process 20 can be used for the power supply end of an inductive power supply (such as the power supply module 1 of the inductive power supply 100 in FIG. 1), which includes the following steps: step 200: Start.

步驟202:在一測量期間內中斷感應式電源供應器100之驅動訊號D1及D2以停止對供電線圈16進行驅動,以產生供電線圈16之一線圈訊號C1。 Step 202: Interrupt the driving signals D1 and D2 of the inductive power supply 100 during a measurement period to stop driving the power supply coil 16 to generate a coil signal C1 of the power supply coil 16.

步驟204:在線圈訊號C1之連續二個振盪週期內測量線圈訊號C1之二個波峰,以分別取得二個峰值觸發電壓。 Step 204: Measure two peaks of the coil signal C1 during two consecutive oscillation cycles of the coil signal C1 to obtain two peak trigger voltages respectively.

步驟206:根據二個峰值觸發電壓,計算一衰減參數。 Step 206: Calculate an attenuation parameter based on the two peak trigger voltages.

步驟208:比較衰減參數與其對應之一臨界值,並判斷衰減參數是否大於臨界值。若是,則執行步驟216;若否,則執行步驟210。 Step 208: Compare the attenuation parameter with a corresponding critical value, and determine whether the attenuation parameter is greater than the critical value. If yes, go to step 216; if no, go to step 210.

步驟210:判斷所測量之振盪週期數量是否到達預定數量。若是,則執行步驟216;若否,則執行步驟212。 Step 210: Determine whether the measured number of oscillation cycles reaches a predetermined number. If yes, go to step 216; if no, go to step 212.

步驟212:在線圈訊號C1之下一振盪週期內測量線圈訊號C1波峰,以取得一峰值觸發電壓。 Step 212: Measure the peak of the coil signal C1 within an oscillation period below the coil signal C1 to obtain a peak trigger voltage.

步驟214:根據該峰值觸發電壓與前一振盪週期內取得之峰值觸發電壓,計算一衰減參數。 Step 214: Calculate an attenuation parameter according to the peak trigger voltage and the peak trigger voltage obtained in the previous oscillation period.

步驟216:對所取得之衰減參數進行平均而產生一平均結果,並比較平均結果與一基礎臨界值,以判斷平均結果是否大於基礎臨界值。若是,則執行步驟218;若否,則執行步驟220。 Step 216: The obtained attenuation parameters are averaged to generate an average result, and the average result is compared with a basic threshold value to determine whether the average result is greater than the basic threshold value. If yes, go to step 218; if no, go to step 220.

步驟218:判斷感應式電源供應器100之電力發送範圍內不存在金屬異物3。 Step 218: It is determined that there is no metal foreign object 3 in the power transmission range of the inductive power supply 100.

步驟220:判斷感應式電源供應器100之電力發送範圍內存在金屬 異物3。 Step 220: Determine whether there is metal in the power transmission range of the inductive power supply 100 Foreign body 3.

步驟222:結束。 Step 222: End.

根據金屬異物檢測流程20,在感應式電源供應器100之供電模組1中,驅動訊號D1及D2在驅動過程中會中斷一段時間,此時,供電驅動單元121及122會停止對供電線圈16進行驅動。當供電線圈16停止驅動時,因供電線圈16與諧振電容141及142之間仍存在能量,線圈訊號C1會繼續振盪並逐漸衰減。如第3圖所示,當停止驅動時,驅動訊號D1及D2分別停留在高電位及低電位一段時間,此時線圈訊號C1呈現振盪並逐漸衰減之波形,隨後供電驅動單元121及122重新接合,以輸出方波驅動訊號D1及D2並再次驅動供電線圈16輸出電力。在其它實施例中,亦可控制驅動訊號D1及D2同時停留在高電位或同時停留在低電位以停止驅動,而不限於此。上述驅動訊號D1及D2中斷的期間係用來測量線圈訊號C1諧振以進行金屬異物3檢測,下文稱之為測量期間以方便說明。 According to the metal foreign object detection process 20, in the power supply module 1 of the inductive power supply 100, the driving signals D1 and D2 are interrupted for a period of time during the driving process. At this time, the power supply driving units 121 and 122 will stop the power supply coil 16 Drive. When the power supply coil 16 stops driving, because there is still energy between the power supply coil 16 and the resonance capacitors 141 and 142, the coil signal C1 will continue to oscillate and gradually decay. As shown in Figure 3, when the drive is stopped, the drive signals D1 and D2 stay at the high and low potentials for a period of time, respectively. At this time, the coil signal C1 presents a waveform that oscillates and gradually decays, and then the power supply drive units 121 and 122 re-engage To output square wave driving signals D1 and D2 and drive the power supply coil 16 again to output power. In other embodiments, the driving signals D1 and D2 can also be controlled to stay at a high potential at the same time or stay at a low potential at the same time to stop driving, but not limited to this. The period during which the driving signals D1 and D2 are interrupted is used to measure the resonance of the coil signal C1 to detect the metal foreign object 3, which is hereinafter referred to as a measurement period for convenience of description.

在測量期間內,線圈訊號C1上存在連續多個振盪週期,處理器111可在多個振盪週期內測量線圈訊號C1之波峰,以分別取得多個峰值觸發電壓。 請參考第4圖,第4圖為本發明實施例在一測量期間內取得峰值觸發電壓VB及VC之示意圖。如第4圖所示,測量期間內線圈訊號C1包含三個波峰A、B及C。由於第一個波峰A發生在驅動訊號D1及D2剛停止驅動的時間,波峰A之訊號振盪仍可能受到驅動訊號D1及D2的影響而非供電線圈16本身之自然振盪,因此,波峰A的峰值高度可能尚未到達自然振盪的高度。在此情形下,為避免金屬異物3的判斷受驅動訊號D1及D2影響而失真,可捨棄波峰A的峰值觸發電壓量測,僅量測波峰B及C的峰值觸發電壓VB及VC。 During the measurement period, there are multiple consecutive oscillation cycles on the coil signal C1. The processor 111 can measure the peaks of the coil signal C1 in multiple oscillation cycles to obtain multiple peak trigger voltages, respectively. Please refer to FIG. 4, which is a schematic diagram of obtaining peak trigger voltages VB and VC during a measurement period according to an embodiment of the present invention. As shown in Figure 4, the coil signal C1 includes three peaks A, B, and C during the measurement period. Because the first peak A occurs at the time when the driving signals D1 and D2 have just stopped driving, the signal oscillation of the peak A may still be affected by the driving signals D1 and D2 instead of the natural oscillation of the power supply coil 16 itself. Therefore, the peak of the peak A The altitude may not have reached the height of the natural oscillation. In this case, in order to avoid that the judgment of the metal foreign body 3 is distorted by the driving signals D1 and D2, the peak trigger voltage measurement of the peak A can be discarded, and only the peak trigger voltages VB and VC of the peaks B and C can be measured.

在欲測量波峰之振盪週期中,處理器111可設定一參考電壓(以虛線繪示於第4圖中),並透過電壓產生裝置113輸出參考電壓至比較器114,由比較器114比較參考電壓與線圈訊號C1而產生一比較結果CP1。詳細來說,在進入波峰B對應之振盪週期之前,處理器111可先將參考電壓設定於一觸發起始電位V0_B。接著,當線圈訊號C1的準位上升至超過參考電壓,使比較器114之輸出端出現一觸發訊號(即比較結果CP1出現高電位)之後,處理器111可控制參考電壓逐漸上升。當參考電壓上升至超過線圈訊號C1的準位時,可判斷觸發訊號結束(即比較結果CP1回到低電位),此時,處理器111可取得參考電壓之準位作為對應於波峰B之峰值觸發電壓VB。同樣地,在波峰C對應之振盪週期中,處理器111可先將參考電壓設定於一觸發起始電位V0_C,進而依照相同方式取得對應於波峰C之峰值觸發電壓VC。 During the oscillation period of the wave to be measured, the processor 111 may set a reference voltage (shown in dotted line in Figure 4), and output the reference voltage to the comparator 114 through the voltage generating device 113, and the comparator 114 compares the reference voltage A comparison result CP1 is generated with the coil signal C1. In detail, before entering the oscillation period corresponding to the peak B, the processor 111 may first set the reference voltage to a trigger starting potential V0_B. Then, when the level of the coil signal C1 rises above the reference voltage, a trigger signal appears on the output end of the comparator 114 (that is, the comparison result CP1 appears high), and the processor 111 can control the reference voltage to gradually rise. When the reference voltage rises above the level of the coil signal C1, it can be judged that the trigger signal ends (that is, the comparison result CP1 returns to a low level). At this time, the processor 111 can obtain the level of the reference voltage as the peak corresponding to the peak B Trigger voltage VB. Similarly, in the oscillation period corresponding to the peak C, the processor 111 may first set the reference voltage to a trigger starting potential V0_C, and then obtain the peak trigger voltage VC corresponding to the peak C in the same manner.

接著,處理器111可根據峰值觸發電壓VB及峰值觸發電壓VC,計算一第一衰減參數PAR1。詳細來說,第一衰減參數PAR1可以是峰值觸發電壓VB及峰值觸發電壓VC的平均值相對於峰值觸發電壓VB及峰值觸發電壓VC的差值之比例。在一實施例中,可計算峰值觸發電壓VB與峰值觸發電壓VC相加之結果除以峰值觸發電壓VB與峰值觸發電壓VC相減之結果而得到第一衰減參數PAR1,其詳細計算方式如下: Then, the processor 111 may calculate a first attenuation parameter PAR1 according to the peak trigger voltage VB and the peak trigger voltage VC. In detail, the first attenuation parameter PAR1 may be a ratio of an average value of the peak trigger voltage VB and the peak trigger voltage VC to a difference between the peak trigger voltage VB and the peak trigger voltage VC. In one embodiment, the result of adding the peak trigger voltage VB and the peak trigger voltage VC divided by the result of subtracting the peak trigger voltage VB and the peak trigger voltage VC to obtain the first attenuation parameter PAR1, the detailed calculation method is as follows:

值得注意的是,中華民國專利案TW I577108係透過衰減斜率的變化來判斷金屬異物,即衰減量的變化。然而,在無金屬異物存在的情形下,當輸出功率較高(即線圈訊號C1振幅較大)時,線圈中斷驅動後之衰減量較大;當輸出功率較低(即線圈訊號C1振幅較小)時,線圈中斷驅動後之衰減量較小。 亦即,衰減量與輸出功率的比例會大致相同。舉例來說,在無金屬異物存在的情形下,若峰值觸發電壓VB為100單位電壓時,峰值觸發電壓VC約為90單位電壓;若峰值觸發電壓VB為50單位電壓時,峰值觸發電壓VC約為45單位電壓,兩者具有不同的峰值衰減量。因此,本發明採用峰值觸發電壓的平均值或總和相對於峰值觸發電壓的差值(即衰減量)之比例來計算衰減參數,可排除不同輸出功率對線圈訊號衰減的影響,進而達到更有效的金屬異物判斷。在此例中,衰減參數愈大代表訊號衰減速度愈慢,即金屬異物存在的可能性愈低;衰減參數愈小代表訊號衰減速度愈快,即金屬異物存在的可能性愈高。 It is worth noting that the patent case TW I577108 of the Republic of China is based on the change of the attenuation slope to judge the metal foreign body, that is, the change of the attenuation. However, in the absence of metallic foreign matter, when the output power is high (that is, the coil signal C1 has a larger amplitude), the attenuation after the coil is interrupted is greater; when the output power is lower (that is, the coil signal C1 has a smaller amplitude ), The attenuation after the coil is interrupted is small. That is, the ratio of the attenuation to the output power will be approximately the same. For example, in the case of no metal foreign matter, if the peak trigger voltage VB is 100 unit voltage, the peak trigger voltage VC is about 90 unit voltage; if the peak trigger voltage VB is 50 unit voltage, the peak trigger voltage VC is about It is 45 units of voltage, and they have different peak attenuation. Therefore, in the present invention, the average value or the ratio of the peak trigger voltage to the difference (ie, the attenuation amount) of the peak trigger voltage is used to calculate the attenuation parameter, which can eliminate the influence of different output power on the coil signal attenuation, thereby achieving a more effective Judge foreign metal. In this example, the larger the attenuation parameter, the slower the signal attenuation speed, that is, the lower the possibility of the presence of metal foreign bodies; the smaller the attenuation parameter, the faster the signal attenuation speed, that is, the higher the possibility of the existence of metal foreign bodies.

另外需注意的是,上述峰值觸發電壓往往不等於相對應波峰之峰值電壓,實際上,峰值觸發電壓略低於相對應波峰之峰值電壓。由第4圖可知,峰值觸發電壓VB接近並略低於波峰B之峰值電壓,峰值觸發電壓VC接近並略低於波峰C之峰值電壓。由於觸發起始電位V0_B及V0_C可分別設定於略低於波峰B及波峰C之電壓準位,因此,上升後的參考電壓和線圈訊號C1在波峰右側交叉,使得根據參考電壓所取得之峰值觸發電壓VB及VC亦略低於並接近其相對應之峰值電壓。此外,由上述衰減參數之計算方式可知,衰減參數的大小主要受到衰減比例的影響,因此,採用數值略低於峰值電壓之峰值觸發電壓作為計算基準,所取得之金屬異物判斷結果仍大致相同於依據峰值電壓取得之判斷結果。只要衰減參數能夠反映衰減量或衰減比例,即可用來進行金屬異物的判別。 It should also be noted that the above-mentioned peak trigger voltage is often not equal to the peak voltage of the corresponding peak. In fact, the peak trigger voltage is slightly lower than the peak voltage of the corresponding peak. It can be seen from FIG. 4 that the peak trigger voltage VB is close to and slightly lower than the peak voltage of the peak B, and the peak trigger voltage VC is close to and slightly lower than the peak voltage of the peak C. Since the trigger starting potentials V0_B and V0_C can be set to slightly lower than the voltage levels of peak B and peak C, respectively, the rising reference voltage and the coil signal C1 cross on the right side of the peak, so that the trigger based on the peak value obtained by the reference voltage The voltages VB and VC are also slightly lower and close to their corresponding peak voltages. In addition, according to the calculation method of the above attenuation parameter, it can be known that the size of the attenuation parameter is mainly affected by the attenuation ratio. Therefore, using the peak trigger voltage whose value is slightly lower than the peak voltage as the calculation basis, the obtained judgment result of the metal foreign body is still substantially the same as Judgment results obtained based on the peak voltage. As long as the attenuation parameter can reflect the attenuation amount or attenuation ratio, it can be used to discriminate metal foreign objects.

如上所述,第一衰減參數PAR1等於峰值觸發電壓VB與峰值觸發電壓VC相加之結果除以峰值觸發電壓VB與峰值觸發電壓VC相減之結果。在取得第一衰減參數PAR1之後,處理器111可設定一第一臨界值TH1,並比較第一衰減參數PAR1與第一臨界值TH1以判斷感應式電源供應器100之一電力發送範圍內是 否存在金屬異物3。在一實施例中,當第一衰減參數PAR1大於第一臨界值TH1時,可判斷感應式電源供應器100之電力發送範圍內不存在金屬異物3;當第一衰減參數PAR1小於第一臨界值TH1時,則進一步進行後續判別。在感應式電源供應系統中,電源或負載端往往存在大量雜訊,容易干擾線圈訊號之分析和檢測,因此,為準確判別金屬異物,需要連續取得多次判斷為金屬異物之數據或結果,以避免雜訊干擾造成金屬異物誤判,使得電源輸出錯誤地被關閉。 As described above, the first attenuation parameter PAR1 is equal to the result of adding the peak trigger voltage VB and the peak trigger voltage VC divided by the result of subtracting the peak trigger voltage VB and the peak trigger voltage VC. After obtaining the first attenuation parameter PAR1, the processor 111 may set a first threshold value TH1, and compare the first attenuation parameter PAR1 and the first threshold value TH1 to determine whether the power transmission range of one of the inductive power supplies 100 is No metal foreign matter 3 is present. In an embodiment, when the first attenuation parameter PAR1 is larger than the first threshold TH1, it can be determined that there is no metal foreign matter 3 in the power transmission range of the inductive power supply 100; when the first attenuation parameter PAR1 is smaller than the first threshold At TH1, follow-up discrimination is further performed. In an inductive power supply system, there is often a lot of noise on the power supply or load side, which is likely to interfere with the analysis and detection of the coil signal. Therefore, in order to accurately discriminate metal foreign objects, it is necessary to continuously obtain data or results determined as metal foreign objects multiple times. Avoid misinterpretation of metal foreign objects caused by noise interference, so that the power output is turned off by mistake.

在一實施例中,處理器111可設定一基礎臨界值TH0。在感應式電源供應器之產品測試過程中,不同產品和不同環境可能存在衰減參數的變異性,可依據不存在金屬異物之下量測到的最低衰減參數來設定基礎臨界值TH0。較佳地,基礎臨界值TH0可設定為較低的數值,其具有較寬鬆的判別基準,以避免雜訊干擾被誤判為金屬異物存在。接著,處理器111可將基礎臨界值TH0分別加上不同數值而得到複數個臨界值,如第一臨界值TH1、第二臨界值TH2、第三臨界值TH3等。處理器111可將一測量期間內取得之第一衰減參數PAR1、第二衰減參數PAR2、第三衰減參數PAR3及第四衰減參數PAR4分別和第一臨界值TH1、第二臨界值TH2、第三臨界值TH3及基礎臨界值TH0進行比較,以進行金屬異物3的判別。舉例來說,處理器可設定基礎臨界值TH0為150,並將第一臨界值TH1設定為基礎臨界值TH0=150加上30,即180;第二臨界值TH2設定為基礎臨界值TH0=150加上20,即170;第三臨界值TH3設定為基礎臨界值TH0=150加上10,即160。其中,第一臨界值TH1大於第二臨界值TH2,且第二臨界值TH2大於第三臨界值TH3。 In one embodiment, the processor 111 may set a basic threshold value TH0. During the product testing process of the inductive power supply, the variability of attenuation parameters may exist in different products and different environments. The basic threshold value TH0 can be set according to the lowest attenuation parameter measured in the absence of metal foreign objects. Preferably, the basic threshold value TH0 can be set to a lower value, which has a looser discrimination criterion to avoid noise interference from being misjudged as the presence of metallic foreign objects. Then, the processor 111 may add different thresholds to the base threshold TH0, respectively, to obtain a plurality of thresholds, such as a first threshold TH1, a second threshold TH2, a third threshold TH3, and the like. The processor 111 may compare the first attenuation parameter PAR1, the second attenuation parameter PAR2, the third attenuation parameter PAR3, and the fourth attenuation parameter PAR4 obtained during a measurement period with the first threshold TH1, the second threshold TH2, and the third The threshold value TH3 and the basic threshold value TH0 are compared to determine the foreign metal 3. For example, the processor may set the basic threshold value TH0 to 150, and set the first threshold value TH1 to the basic threshold value TH0 = 150 plus 30, which is 180; and the second threshold value TH2 to the basic threshold value TH0 = 150. Add 20, which is 170; the third threshold TH3 is set to the basic threshold TH0 = 150 plus 10, which is 160. The first threshold value TH1 is larger than the second threshold value TH2, and the second threshold value TH2 is larger than the third threshold value TH3.

首先,處理器111比較第一衰減參數PAR1與第一臨界值TH1。在一實施例中(如表一所示),處理器111可取得峰值觸發電壓VB為1000單位電壓以及 峰值觸發電壓VC為990單位電壓,經計算後得到第一衰減參數PAR1為199。由於第一衰減參數PAR1=199大於第一臨界值TH1=180,代表其遠大於基礎臨界值TH0,因此,處理器111直接判定金屬異物3不存在。 First, the processor 111 compares the first attenuation parameter PAR1 with a first threshold TH1. In an embodiment (as shown in Table 1), the processor 111 may obtain a peak trigger voltage VB of 1000 unit voltage and The peak trigger voltage VC is 990 unit voltages. After calculation, the first attenuation parameter PAR1 is 199. Since the first attenuation parameter PAR1 = 199 is larger than the first threshold TH1 = 180, which means that it is much larger than the basic threshold TH0, the processor 111 directly determines that the metal foreign object 3 does not exist.

在此例中,第一衰減參數PAR1大於第一臨界值TH1且遠大於基礎臨界值TH0,表示金屬異物3存在的機率極低,屬於非常安全的狀態,因而系統直接判定為金屬異物3不存在。在此情形下,處理器111只需要量測2個振盪週期即可完成金屬異物3的判別。換言之,在驅動訊號D1及D2中斷之測量期間內只需包含3個振盪週期,其中,對應於波峰A之振盪週期不進行測量,在對應於波峰B及C之振盪週期內完成測量並取得第一衰減參數PAR1之後,即可完成金屬異物3的判別。 In this example, the first attenuation parameter PAR1 is larger than the first critical value TH1 and much larger than the basic critical value TH0, which indicates that the probability of the presence of the metal foreign body 3 is extremely low and belongs to a very safe state, so the system directly determines that the metal foreign body 3 does not exist . In this case, the processor 111 only needs to measure two oscillation cycles to complete the determination of the metal foreign object 3. In other words, during the measurement period when the drive signals D1 and D2 are interrupted, only three oscillation periods are required. Among them, the oscillation period corresponding to the peak A is not measured, and the measurement is completed within the oscillation periods corresponding to the peaks B and C. After the attenuation parameter PAR1, the discrimination of the metal foreign body 3 can be completed.

在一實施例中,第一衰減參數PAR1小於第一臨界值TH1,此時處理器111進一步執行後續金屬異物3的判別,如表二所示。 In one embodiment, the first attenuation parameter PAR1 is smaller than the first threshold value TH1. At this time, the processor 111 further performs the subsequent determination of the metallic foreign object 3, as shown in Table 2.

詳細來說,處理器111先比較第一衰減參數PAR1與第一臨界值TH1。當判斷第一衰減參數PAR1=166小於第一臨界值TH1=180之後,處理器111可測量線圈訊號C1之下一振盪週期(對應於波峰D之振盪週期)。如第5圖所示,在波峰D之振盪週期中,處理器111可先將參考電壓設定於一觸發起始電位V0_D,並依照上述方式取得對應於波峰D之峰值觸發電壓VD。接著,處理器111可根據峰值觸發電壓VC及峰值觸發電壓VD,計算一第二衰減參數PAR2。詳細來說,處理器111可計算峰值觸發電壓VC與峰值觸發電壓VD相加之結果除以峰值觸發電壓VC與峰值觸發電壓VD相減之結果而得到第二衰減參數PAR2,其詳細計算方式如下: In detail, the processor 111 first compares the first attenuation parameter PAR1 and the first threshold TH1. After determining that the first attenuation parameter PAR1 = 166 is smaller than the first critical value TH1 = 180, the processor 111 can measure the next oscillation period (corresponding to the oscillation period of the peak D) of the coil signal C1. As shown in FIG. 5, during the oscillation period of the peak D, the processor 111 may first set the reference voltage to a trigger starting potential V0_D, and obtain the peak trigger voltage VD corresponding to the peak D in the above manner. Then, the processor 111 may calculate a second attenuation parameter PAR2 according to the peak trigger voltage VC and the peak trigger voltage VD. In detail, the processor 111 may calculate the result of adding the peak trigger voltage VC and the peak trigger voltage VD and dividing it by the result of subtracting the peak trigger voltage VC and the peak trigger voltage VD to obtain the second attenuation parameter PAR2. The detailed calculation method is as follows: :

在此例中,峰值觸發電壓VC為988單位電壓且峰值觸發電壓VD為977單位電壓,經計算後得到第二衰減參數PAR2為179(小數點後四捨五入)。接著,處理器111將第二衰減參數PAR2和第二臨界值TH2進行比較,並判斷第二衰減參數PAR2=179大於第二臨界值TH2=170。在此情形下,處理器111在此測量期間內停止測量後續振盪週期,同時對所取得之第一衰減參數PAR1及第二衰減參數PAR2進行平均,並將上述平均結果與基礎臨界值TH0進行比較,以進行金屬異物3的判別。在此例中,第一衰減參數PAR1及第二衰減參數PAR2之平均值大於基礎臨界值TH0,因此處理器111判斷感應式電源供應器100之電力發送範圍內不存在金屬異物3。 In this example, the peak trigger voltage VC is 988 unit voltage and the peak trigger voltage VD is 977 unit voltage. After calculation, the second attenuation parameter PAR2 is 179 (rounded to the decimal point). Next, the processor 111 compares the second attenuation parameter PAR2 and the second threshold TH2, and determines that the second attenuation parameter PAR2 = 179 is greater than the second threshold TH2 = 170. In this case, the processor 111 stops measuring the subsequent oscillation period during this measurement period, and averages the obtained first attenuation parameter PAR1 and the second attenuation parameter PAR2, and compares the above average result with the basic threshold TH0. To determine the metal foreign object 3. In this example, the average value of the first attenuation parameter PAR1 and the second attenuation parameter PAR2 is greater than the basic threshold value TH0. Therefore, the processor 111 determines that there is no metal foreign object 3 in the power transmission range of the inductive power supply 100.

在另一實施例中,第二衰減參數PAR2亦可能小於第二臨界值TH2,此時處理器111進一步執行後續金屬異物3的判別,如表三所示。 In another embodiment, the second attenuation parameter PAR2 may also be smaller than the second critical value TH2. At this time, the processor 111 further performs the subsequent determination of the metallic foreign object 3, as shown in Table 3.

詳細來說,處理器111先比較第一衰減參數PAR1與第一臨界值TH1。當判斷第一衰減參數PAR1=142小於第一臨界值TH1=180之後,處理器111可測量線圈訊號C1之下一振盪週期(對應於波峰D之振盪週期)以取得第二衰減參數PAR2,並比較第二衰減參數PAR2與第二臨界值TH2。接著,當判斷第二衰減參數PAR2=163小於第二臨界值TH2=170之後,處理器111可測量線圈訊號C1之下一振盪週期(對應於波峰E之振盪週期)。如第6圖所示,在波峰E之振盪週期中,處理器111可先將參考電壓設定於一觸發起始電位V0_E,並依照上述方式取得對應於波峰E之峰值觸發電壓VE。接著,處理器111可根據峰值觸發電壓VD及峰值觸發電壓VE,計算一第三衰減參數PAR3。詳細來說,處理器111可計算峰值觸發電壓VD與峰值觸發電壓VE相加之結果除以峰值觸發電壓VD與峰值觸發電壓VE相減之結果而得到第三衰減參數PAR3,其詳細計算方式如下: In detail, the processor 111 first compares the first attenuation parameter PAR1 and the first threshold TH1. After determining that the first attenuation parameter PAR1 = 142 is smaller than the first critical value TH1 = 180, the processor 111 may measure the next oscillation period (corresponding to the oscillation period of the peak D) of the coil signal C1 to obtain the second attenuation parameter PAR2, Compare the second attenuation parameter PAR2 with the second threshold TH2. Then, after determining that the second attenuation parameter PAR2 = 163 is smaller than the second critical value TH2 = 170, the processor 111 can measure the next oscillation period (corresponding to the oscillation period of the wave peak E) of the coil signal C1. As shown in FIG. 6, during the oscillation period of the peak E, the processor 111 may first set the reference voltage to a trigger starting potential V0_E, and obtain the peak trigger voltage VE corresponding to the peak E in the above manner. Then, the processor 111 may calculate a third attenuation parameter PAR3 according to the peak trigger voltage VD and the peak trigger voltage VE. In detail, the processor 111 may calculate the result of adding the peak trigger voltage VD and the peak trigger voltage VE and divide it by the result of subtracting the peak trigger voltage VD and the peak trigger voltage VE to obtain a third attenuation parameter PAR3. The detailed calculation method is as follows: :

在此例中,峰值觸發電壓VD為974單位電壓且峰值觸發電壓VE為962單位電壓,經計算後得到第三衰減參數PAR3為161(小數點後四捨五入)。接著,處理器111將第三衰減參數PAR3和第三臨界值TH3進行比較,並判斷第三衰減參數PAR3=161大於第三臨界值TH2=160。在此情形下,處理器111在此測量期間內 停止測量後續振盪週期,同時對所取得之第一衰減參數PAR1、第二衰減參數PAR2及第三衰減參數PAR3進行平均,並將上述平均結果與基礎臨界值TH0進行比較,以進行金屬異物3的判別。在此例中,第一衰減參數PAR1、第二衰減參數PAR2及第三衰減參數PAR3之平均值大於基礎臨界值TH0,因此處理器111判斷感應式電源供應器100之電力發送範圍內不存在金屬異物3。 In this example, the peak trigger voltage VD is 974 unit voltage and the peak trigger voltage VE is 962 unit voltage. After calculation, the third attenuation parameter PAR3 is 161 (rounded up to the decimal point). Next, the processor 111 compares the third attenuation parameter PAR3 and the third threshold TH3, and determines that the third attenuation parameter PAR3 = 161 is greater than the third threshold TH2 = 160. In this case, the processor 111 during this measurement period Stop measuring subsequent oscillation cycles, meanwhile average the obtained first attenuation parameter PAR1, second attenuation parameter PAR2, and third attenuation parameter PAR3, and compare the above average result with the basic threshold TH0 to perform the measurement of the metal foreign body 3. Judge. In this example, the average value of the first attenuation parameter PAR1, the second attenuation parameter PAR2, and the third attenuation parameter PAR3 is greater than the basic threshold TH0. Therefore, the processor 111 determines that no metal exists in the power transmission range of the inductive power supply 100. Foreign body 3.

在另一實施例中,第三衰減參數PAR3亦可能小於第三臨界值TH3,此時處理器111進一步執行後續金屬異物3的判別,如表四所示。 In another embodiment, the third attenuation parameter PAR3 may also be smaller than the third critical value TH3. At this time, the processor 111 further performs the subsequent determination of the metal foreign object 3, as shown in Table 4.

詳細來說,處理器111先比較第一衰減參數PAR1與第一臨界值TH1。當判斷第一衰減參數PAR1=124小於第一臨界值TH1=180之後,處理器111可測量線圈訊號C1之下一振盪週期(對應於波峰D之振盪週期)以取得第二衰減參數PAR2,並比較第二衰減參數PAR2與第二臨界值TH2。接著,當判斷第二衰減參數PAR2=122小於第二臨界值TH2=170之後,處理器111可測量線圈訊號C1之下一振盪週期(對應於波峰E之振盪週期)以取得第三衰減參數PAR3,並比較第三衰減參數PAR3與第三臨界值TH3。接著,當判斷第三衰減參數PAR3=120小於第三臨界值TH3=160之後,處理器111可測量線圈訊號C1之下一振盪週期(對應於波峰F之振盪週期)。如第7圖所示,在波峰F之振盪週期中,處理器111可先將參考電壓設定於一觸發起始電位V0_F,並依照上述方式取得對應於波峰F之峰值觸 發電壓VF。接著,處理器111可根據峰值觸發電壓VE及峰值觸發電壓VF,計算一第四衰減參數PAR4。詳細來說,處理器111可計算峰值觸發電壓VE與峰值觸發電壓VF相加之結果除以峰值觸發電壓VE與峰值觸發電壓VF相減之結果而得到第四衰減參數PAR4,其詳細計算方式如下: In detail, the processor 111 first compares the first attenuation parameter PAR1 and the first threshold TH1. After determining that the first attenuation parameter PAR1 = 124 is smaller than the first critical value TH1 = 180, the processor 111 may measure the next oscillation period (corresponding to the oscillation period of the peak D) of the coil signal C1 to obtain the second attenuation parameter PAR2, and Compare the second attenuation parameter PAR2 with the second threshold TH2. Then, after determining that the second attenuation parameter PAR2 = 122 is smaller than the second critical value TH2 = 170, the processor 111 may measure an oscillation period (corresponding to the oscillation period of the wave peak E) under the coil signal C1 to obtain a third attenuation parameter PAR3. And compare the third attenuation parameter PAR3 with the third critical value TH3. Then, after determining that the third attenuation parameter PAR3 = 120 is smaller than the third critical value TH3 = 160, the processor 111 can measure the next oscillation period (corresponding to the oscillation period of the wave peak F) of the coil signal C1. As shown in FIG. 7, during the oscillation period of the peak F, the processor 111 may first set the reference voltage to a trigger starting potential V0_F, and obtain the peak trigger voltage VF corresponding to the peak F in the above manner. Then, the processor 111 may calculate a fourth attenuation parameter PAR4 according to the peak trigger voltage VE and the peak trigger voltage VF. In detail, the processor 111 can calculate the result of adding the peak trigger voltage VE and the peak trigger voltage VF and dividing it by the result of subtracting the peak trigger voltage VE and the peak trigger voltage VF to obtain a fourth attenuation parameter PAR4. The detailed calculation method is as follows: :

在此例中,峰值觸發電壓VE為952單位電壓且峰值觸發電壓VF為936單位電壓,經計算後得到第四衰減參數PAR4為118。由於處理器111在此測量期間內測量之振盪週期數量已到達預定數量,因此,處理器111可對所取得之第一衰減參數PAR1、第二衰減參數PAR2、第三衰減參數PAR3及第四衰減參數PAR4進行平均,並將上述平均結果與基礎臨界值TH0進行比較,以進行金屬異物3的判別。在此例中,第一衰減參數PAR1、第二衰減參數PAR2、第三衰減參數PAR3及第四衰減參數PAR4之平均值小於基礎臨界值TH0,因此處理器111判斷感應式電源供應器100之電力發送範圍內存在金屬異物3。 In this example, the peak trigger voltage VE is 952 unit voltage and the peak trigger voltage VF is 936 unit voltage. After calculation, the fourth attenuation parameter PAR4 is 118. Since the number of oscillation cycles measured by the processor 111 during this measurement period has reached a predetermined number, the processor 111 may perform the first attenuation parameter PAR1, the second attenuation parameter PAR2, the third attenuation parameter PAR3, and the fourth attenuation. The parameter PAR4 is averaged, and the above averaged result is compared with the basic threshold value TH0 to determine the metal foreign object 3. In this example, the average value of the first attenuation parameter PAR1, the second attenuation parameter PAR2, the third attenuation parameter PAR3, and the fourth attenuation parameter PAR4 is less than the basic threshold value TH0, so the processor 111 determines the power of the inductive power supply 100. There is a metal foreign object 3 in the transmission range.

在上述實施例中,在驅動訊號D1及D2中斷之測量期間內只需包含3~6個不等的振盪週期,即可完成金屬異物3的判別。相較於中華民國專利案TWI577108需要7~15個不等的線圈振盪週期來完成四個波峰電壓準位的量測以判斷衰減斜率變化,本發明之金屬異物檢測方法可在更少的時間內完成,進而縮短驅動訊號D1及D2中斷的時間。一般來說,在金屬異物3不存在且線圈訊號C1之判斷未受到雜訊干擾的情況下,所取得之第一衰減參數PAR1往往遠大於基礎臨界值TH0,此時只需要測量二個振盪週期即可完成金屬異物3之判別,且判別完成後供電驅動單元121及122可立即接合線路以啟動驅動訊號D1及D2,如第3圖所示。另一方面,當金屬靠近或雜訊干擾使得衰減參數下降時,才需要測量 更多振盪週期。換言之,衰減參數之數值愈小,代表金屬異物存在的可能性愈高,此時測量之振盪週期數量亦同步增加。最終無論測量多少個振盪週期或取得多少個衰減參數,處理器111對所取得之衰減參數進行平均,並將平均結果和基礎臨界值TH0進行比較,以判斷金屬異物3是否存在。一般來說,當線圈停止驅動時其訊號為自然諧振的狀態,若無金屬異物存在,線圈訊號之衰減斜率相對於訊號振幅之數值的變化量極小。由於每一衰減參數都是根據相鄰振盪週期之峰值觸發電壓並依照相同方式計算,因此衰減參數的數值相當穩定。在感應式電源供應系統中,訊號的判斷必然受到電源或電路雜訊的影響,但多數電源/電路雜訊反映在衰減參數上只會出現小幅度的數值跳動,此時衰減參數往往遠大於前述臨界值而不影響判別結果。反之,當金屬異物出現時,峰值觸發電壓會快速衰減,透過上述相加結果除以相減結果之計算方式,衰減參數會快速下降,能夠有效進行金屬異物檢測和判別。 In the above embodiment, the measurement period of the interruption of the driving signals D1 and D2 need only include 3 to 6 oscillating periods, and the determination of the metal foreign object 3 can be completed. Compared with the patent case of the Republic of China TWI577108, it takes 7 to 15 different coil oscillation cycles to complete the measurement of the four peak voltage levels to determine the change in attenuation slope. The method for detecting metal foreign objects in the present invention can be performed in less time. Completed, thereby shortening the interruption time of the driving signals D1 and D2. Generally speaking, when the metal foreign body 3 does not exist and the coil signal C1 is judged not to be disturbed by noise, the first attenuation parameter PAR1 obtained is often much larger than the basic threshold TH0. At this time, only two oscillation periods need to be measured. The determination of the metal foreign object 3 can be completed, and after the determination is completed, the power supply driving units 121 and 122 can immediately join the lines to start the driving signals D1 and D2, as shown in FIG. 3. On the other hand, measurement is only needed when the metal is approaching or noise interferes with the attenuation parameter. More oscillation cycles. In other words, the smaller the value of the attenuation parameter, the higher the possibility of the presence of metallic foreign objects, and the number of oscillation cycles measured at this time also increases simultaneously. In the end, no matter how many oscillation periods are measured or how many attenuation parameters are obtained, the processor 111 averages the obtained attenuation parameters, and compares the average result with the basic threshold value TH0 to determine whether the metal foreign body 3 exists. In general, when the coil stops driving, its signal is in a state of natural resonance. If no metal foreign matter is present, the amount of change in the attenuation slope of the coil signal relative to the value of the signal amplitude is extremely small. Since each attenuation parameter is calculated based on the peak trigger voltage of adjacent oscillation cycles and calculated in the same way, the value of the attenuation parameter is quite stable. In an inductive power supply system, the judgment of the signal is necessarily affected by power or circuit noise, but most of the power / circuit noise is reflected in the attenuation parameter with only small amplitude fluctuations. At this time, the attenuation parameter is often much larger than the foregoing. Critical value without affecting the discrimination result. Conversely, when a metal foreign object occurs, the peak trigger voltage will rapidly decay. By calculating the addition result divided by the subtraction result, the attenuation parameter will decrease rapidly, which can effectively detect and discriminate metal foreign objects.

在每一測量期間內,皆可根據衰減參數與對應臨界值之比較結果來決定測量之振盪週期數量,並取得所有衰減參數之平均值以進行金屬異物的判別。一般來說,當第一、第二及第三衰減參數PAR1~PAR3當中任一者大於相對應臨界值時,即不進行最後第四衰減參數PAR4的計算。由於第一、第二及第三臨界值TH1~TH3皆大於基礎臨界值TH0,因此,在未計算第四衰減參數PAR4的情形下,前三個衰減參數PAR1~PAR3之平均值通常大於基礎臨界值TH0而得出金屬異物3不存在的判別結果。在此情形下,處理器111亦可判斷所取得的衰減參數數量或所測量的振盪週期數量,只有在取得之衰減參數數量到達預設值時(例如四個衰減參數),才計算衰減參數之平均值以進行金屬異物3的判別;若取得之衰減參數數量未達到預設值,則處理器111直接判定金屬異物3不存在。 In each measurement period, the number of oscillation cycles to be measured can be determined according to the comparison result between the attenuation parameter and the corresponding critical value, and the average value of all attenuation parameters can be obtained to discriminate metal foreign objects. Generally, when any one of the first, second, and third attenuation parameters PAR1 to PAR3 is greater than the corresponding critical value, the calculation of the last fourth attenuation parameter PAR4 is not performed. Because the first, second, and third thresholds TH1 ~ TH3 are all larger than the basic threshold TH0, the average of the first three attenuation parameters PAR1 ~ PAR3 is usually larger than the basic threshold without calculating the fourth attenuation parameter PAR4. The value TH0 determines the result of the absence of the metallic foreign object 3. In this case, the processor 111 may also determine the number of attenuation parameters obtained or the number of measured oscillation cycles. Only when the number of obtained attenuation parameters reaches a preset value (for example, four attenuation parameters), the attenuation parameter is calculated. The average value is used to determine the metal foreign body 3; if the number of attenuation parameters obtained does not reach the preset value, the processor 111 directly determines that the metal foreign body 3 does not exist.

此外,為提高判別準確度同時避免錯誤判別造成電源輸出被關閉,處理器111可設定一金屬異物計數器。若一測量期間內取得之衰減參數平均值小於基礎臨界值時,可將金屬異物計數器加一。當金屬異物計數器在一段預定期間內到達特定數值時,即判斷為金屬異物3存在。或者,亦可在連續數個測量期間內得到衰減參數平均值小於基礎臨界值時判斷金屬異物3存在。 In addition, in order to improve the discrimination accuracy and prevent the power output from being turned off due to incorrect discrimination, the processor 111 may set a metal foreign object counter. If the average value of the attenuation parameter obtained during a measurement period is less than the basic threshold value, the metal foreign matter counter can be increased by one. When the metal foreign object counter reaches a specific value within a predetermined period, it is determined that the metal foreign object 3 exists. Alternatively, it can also be determined that the presence of the metal foreign object 3 is obtained when the average value of the attenuation parameter is less than the basic critical value within several consecutive measurement periods.

值得注意的是,在上述實施例中,處理器111先將一參考電壓設定於一觸發起始電位,並於比較器114之輸出端發生觸發時控制參考電壓上升,接著在觸發結束時取得參考電壓之準位作為峰值觸發電壓。為使峰值觸發電壓有效反映相對應波峰之電壓準位,觸發起始電位應設定為接近並略低於峰值電壓的位置,以成功發生觸發同時使峰值觸發電壓接近波峰電壓準位。若觸發起始電位設定得過高,可能發生觸發起始電位高於波峰電壓而無法成功觸發的情況;若觸發起始電位設定得過低,雖可成功觸發但峰值觸發電壓可能過低而無法反映真實的波峰電壓大小。 It is worth noting that in the above embodiment, the processor 111 first sets a reference voltage to a trigger starting potential, and controls the reference voltage to rise when a trigger occurs at the output terminal of the comparator 114, and then obtains a reference at the end of the trigger. The voltage level is used as the peak trigger voltage. In order for the peak trigger voltage to effectively reflect the voltage level of the corresponding peak, the trigger starting potential should be set to a position close to and slightly below the peak voltage, in order to successfully trigger and make the peak trigger voltage close to the peak voltage level. If the trigger start potential is set too high, it may happen that the trigger start potential is higher than the peak voltage and the trigger cannot be successfully triggered; if the trigger start potential is set too low, although the trigger can be successfully triggered, the peak trigger voltage may be too low to be able to trigger Reflects the true peak voltage.

在一實施例中,處理器111可根據前一測量期間內取得之相對應之一先前峰值觸發電壓來計算本次測量期間採用的觸發起始電位,例如將先前峰值觸發電壓減去一預設電壓值而得的數值設定為觸發起始電位。舉例來說,對波峰B之振盪週期而言,若前一測量期間取得之峰值觸發電壓VB為1000單位電壓,本次測量期間之觸發起始電位V0_B可設定為900單位電壓(即1000減去預設電壓值100);對波峰C之振盪週期而言,若前一測量期間取得之峰值觸發電壓VC為980單位電壓,本次測量期間之觸發起始電位V0_C可設定為880單位電壓(即980減去預設電壓值100)。根據前一測量期間之峰值觸發電壓,處理器111可得知波峰電壓可能的準位,以將觸發起始電位設定於略低的準位。設定較低準位 的觸發起始電位可提高發生觸發的機率,除非峰值電壓快速下降,多數情況下皆能夠成功發生觸發並取得金屬異物判斷結果。 In an embodiment, the processor 111 may calculate a trigger starting potential used in the current measurement according to a corresponding previous peak trigger voltage obtained in the previous measurement period, for example, subtracting a preset peak trigger voltage from a preset value. The value obtained from the voltage value is set as the trigger starting potential. For example, for the oscillation period of the peak B, if the peak trigger voltage VB obtained in the previous measurement period is 1000 unit voltage, the trigger starting potential V0_B during the current measurement period can be set to 900 unit voltage (ie 1000 minus For the oscillation period of the peak C, if the peak trigger voltage VC obtained in the previous measurement period is 980 unit voltage, the trigger starting potential V0_C during this measurement period can be set to 880 unit voltage (that is, 980 minus the preset voltage value 100). Based on the peak trigger voltage during the previous measurement period, the processor 111 can know the possible level of the peak voltage to set the trigger starting potential to a slightly lower level. Set lower level The trigger starting potential can increase the probability of triggering. Unless the peak voltage drops rapidly, in most cases, the trigger can be successfully generated and the judgment result of the metal foreign body can be obtained.

中華民國專利案TW I577108之波峰電壓準位的判斷方式為,根據前一測量期間內有無觸發之結果來判斷需提高或降低參考電壓,並在數個測量期間內出現時而觸發時而無觸發的情況下判斷參考電壓已鎖定於波峰電壓準位。 因此,當負載及輸出功率未發生變化的情形下,需要多個測量期間才能夠將參考電壓鎖定至波峰電壓準位。相較之下,根據本發明取得峰值觸發電壓的方式,將觸發起始電位設定於較低電位能夠提高發生觸發的機率,只要發生觸發即可立刻計算衰減參數以進行金屬異物的判別,因此,本發明無須花費多個測量期間鎖定至波峰電壓準位,即可迅速完成判別。此外,判別過程中仍可持續調整觸發起始電位至較佳準位,例如,本次測量期間內觸發起始電位V0_B設定為900單位電壓且在參考電壓上升至910單位電壓時觸發結束,代表波峰下降使得峰值觸發電壓VB降至910單位電壓,在此情形下,可於下一測量期間將觸發起始電位V0_B設定於810單位電壓(即910減去預設電壓值100)以達到較佳的觸發效果同時提高成功觸發的機率。 The method of judging the peak voltage level of the Taiwanese patent case TW I577108 is to determine whether the reference voltage needs to be raised or lowered according to the result of the trigger in the previous measurement period, and it is triggered from time to time without triggering in several measurement periods Under the circumstances, it is judged that the reference voltage is locked at the peak voltage level. Therefore, when the load and output power do not change, multiple reference periods are required to lock the reference voltage to the peak voltage level. In contrast, according to the method for obtaining the peak trigger voltage according to the present invention, setting the trigger starting potential to a lower potential can increase the probability of triggering. As long as the trigger occurs, the attenuation parameter can be calculated immediately to discriminate metal foreign objects. Therefore, The invention can quickly complete the determination without spending multiple measurement periods to lock to the peak voltage level. In addition, the triggering start potential can still be adjusted to a better level during the discrimination process. For example, during the measurement period, the triggering start potential V0_B is set to 900 unit voltage and the trigger ends when the reference voltage rises to 910 unit voltage. The peak drop reduces the peak trigger voltage VB to 910 unit voltage. In this case, the trigger starting potential V0_B can be set to 810 unit voltage (that is, 910 minus the preset voltage value 100) in the next measurement period to achieve a better The triggering effect also increases the chance of successful triggering.

值得注意的是,部分情況下處理器111無法取得前一測量期間內相對應之峰值觸發電壓。舉例來說,在前一測量期間內,處理器111根據峰值觸發電壓VB及峰值觸發電壓VC計算出第一衰減參數PAR1,並判斷第一衰減參數PAR1大於第一臨界值TH1,因而無須測量後續振盪週期以及計算其它衰減參數。然而,在本次測量期間內,處理器111判斷第一衰減參數PAR1小於第一臨界值TH1而需要測量後續振盪週期。換言之,本次測量期間內需取得對應於波峰D之觸發起始電位V0_D,但前一測量期間未測量波峰D之振盪週期,因而不存在峰值觸 發電壓VD作為估算本次觸發起始電位V0_D之依據。在此情形下,處理器111可採用本次測量期間內前一振盪週期之另一先前峰值觸發電壓(即對應於波峰C之峰值觸發電壓VC)作為依據,並預估對應於波峰D之峰值觸發電壓VD可能低於峰值觸發電壓VC的幅度,進而計算觸發起始電位V0_D。舉例來說,若峰值觸發電壓VC為900單位電壓,可據此預估波峰D之峰值觸發電壓VD為870單位電壓,並將觸發起始電位V0_D設定於770單位電壓(即870減去預設電壓值100)。在另一實施例中,亦可根據相同測量期間內之峰值觸發電壓VB及VC來預估波峰D之峰值觸發電壓VD。例如,若峰值觸發電壓VB為100單位電壓且峰值觸發電壓VC為90單位電壓時,可據此預估波峰D之峰值觸發電壓VD約位於80單位電壓,進而將觸發起始電位V0_D設定為70單位電壓以偵測實際之峰值觸發電壓VD。 It is worth noting that, in some cases, the processor 111 cannot obtain the peak trigger voltage corresponding to the previous measurement period. For example, during the previous measurement period, the processor 111 calculates the first attenuation parameter PAR1 according to the peak trigger voltage VB and the peak trigger voltage VC, and judges that the first attenuation parameter PAR1 is greater than the first threshold TH1, so there is no need to measure subsequent Oscillation period and calculation of other attenuation parameters. However, during this measurement period, the processor 111 determines that the first attenuation parameter PAR1 is smaller than the first critical value TH1 and needs to measure a subsequent oscillation period. In other words, the trigger starting potential V0_D corresponding to the peak D needs to be obtained during this measurement period, but the oscillation period of the peak D was not measured in the previous measurement period, so there is no peak contact The voltage VD is used as the basis for estimating the current starting potential V0_D. In this case, the processor 111 may use another previous peak trigger voltage (that is, the peak trigger voltage VC corresponding to the peak C) as the basis for the previous oscillation cycle in this measurement period, and estimate the peak corresponding to the peak D The trigger voltage VD may be lower than the amplitude of the peak trigger voltage VC, and then the trigger starting potential V0_D is calculated. For example, if the peak trigger voltage VC is 900 unit voltage, the peak trigger voltage VD of the peak D can be estimated as 870 unit voltage, and the trigger starting potential V0_D is set to 770 unit voltage (that is, 870 minus the preset Voltage value 100). In another embodiment, the peak trigger voltage VD of the peak D can also be estimated according to the peak trigger voltage VB and VC during the same measurement period. For example, if the peak trigger voltage VB is 100 unit voltage and the peak trigger voltage VC is 90 unit voltage, the peak trigger voltage VD of the peak D can be estimated to be about 80 unit voltage, and the trigger starting potential V0_D can be set to 70. Unit voltage to detect the actual peak trigger voltage VD.

一般來說,若前一測量期間內未測量對應於波峰D之振盪週期,代表對應於波峰D之先前峰值觸發電壓的記錄可能來自於一段較長時間之前的測量結果。然而,感應式電源供應器100之供電過程中可能發生負載及/或功率輸出的變化,使得線圈訊號C1上的峰值電壓發生大幅度變化,此變化可能高達數十或數百倍。在此情形下,較長時間之前的峰值觸發電壓記錄往往不具有參考價值,因此,採用相同測量期間內前一振盪週期之峰值觸發電壓作為依據,可取得較適合之觸發起始電位,進而提高成功發生觸發並取得衰減參數及金屬異物判斷結果的機率。 Generally, if the oscillation period corresponding to the peak D is not measured in the previous measurement period, the record representing the previous peak trigger voltage corresponding to the peak D may come from the measurement result before a long time. However, during the power supply process of the inductive power supply 100, changes in load and / or power output may occur, causing the peak voltage on the coil signal C1 to vary greatly. This change may be as many as tens or hundreds of times. In this case, the record of the peak trigger voltage before a long time often has no reference value. Therefore, using the peak trigger voltage of the previous oscillation period in the same measurement period as the basis can obtain a more suitable trigger starting potential, and then increase The probability of successfully triggering and obtaining the attenuation parameter and the judgment result of the metal foreign body.

值得注意的是,前述方法並非每一測量期間內皆能夠成功觸發並取得衰減參數。若其中一振盪週期內未發生觸發而無法取得相對應之峰值觸發電壓時,則處理器111捨棄該測量期間內之計算及判斷結果,同時降低觸發起始電位以提高下一測量期間內成功觸發的機率。此外,為有效取得峰值觸發電壓, 處理器111可先量測線圈諧振頻率,並取得每一諧振週期當中波峰可能發生的位置區間。若此區間內沒有發生觸發,代表觸發起始電位過高,因此處理器111在下一測量期間降低觸發起始電位,並再次嘗試進行觸發以取得相對應之峰值觸發電壓。 It is worth noting that the aforementioned methods cannot successfully trigger and obtain attenuation parameters during each measurement period. If no trigger occurs in one of the oscillation cycles and the corresponding peak trigger voltage cannot be obtained, the processor 111 discards the calculation and judgment results during the measurement period, and at the same time lowers the trigger starting potential to increase the successful trigger in the next measurement period Chance. In addition, in order to effectively obtain the peak trigger voltage, The processor 111 may first measure the resonance frequency of the coil, and obtain a position interval where a wave peak may occur in each resonance period. If no trigger occurs in this interval, it means that the trigger starting potential is too high, so the processor 111 reduces the trigger starting potential during the next measurement period and tries to trigger again to obtain the corresponding peak trigger voltage.

由上述可知,本發明可在驅動訊號中斷之測量期間內,測量線圈訊號以取得對應於複數個峰值之峰值觸發電壓,並根據二相鄰峰值觸發電壓的平均值相對於其差值之比例來計算衰減參數,進而比較衰減參數與對應臨界值來決定是否需取得更多波峰之峰值觸發電壓以執行後續判斷,同時進行金屬異物的判別。其中,處理器可將參考電壓設定於一觸發起始電位,並於發生觸發時控制參考電壓逐漸上升,進而取得峰值觸發電壓。本領域具通常知識者當可據以進行修飾或變化,而不限於此。舉例來說,在上述實施例中,一測量期間內最多測量5個振盪週期以取得5個峰值觸發電壓以計算4個衰減參數。在其它實施例中,上述測量振盪週期之最大次數以及取得衰減參數之最大數量可根據系統需求而進行調整,而不限於此。此外,在上述實施例中,關於峰值觸發電壓及觸發起始電位的數值僅為範例,本領域具通常知識者可依系統需求設定並取得合適的電壓數值。舉例來說,電壓產生裝置113可由一數位類比轉換器來實現,而上述單位電壓可以是處理器111所設定的數位值,其透過數位類比轉換器轉換為對應的類比電壓之後加以輸出,根據不同規格的數位類比轉換器,峰值觸發電壓及觸發起始電位可能具有不同的數值。例如,若電壓產生裝置113為12位元之數位類比轉換器時,其可接收0~4095之數位值並依據線圈訊號C1(通過分壓電路130之後)的可能電壓範圍來對應產生輸出電壓。另外,峰值觸發電壓係參考電壓由觸發起始電位上升至觸發結束時的準位,而處理器111可調整參考電壓上升的速度,例如,處理器111可控制參考電壓依固定的速度上升,並將上升速 度調整至較佳數值,使其在觸發結束時的準位能夠有效反映波峰電壓的準位。 It can be known from the above that the present invention can measure the coil signal to obtain the peak trigger voltage corresponding to a plurality of peaks during the measurement period when the driving signal is interrupted, and according to the ratio of the average value of the two adjacent peak trigger voltages to the difference thereof Calculate the attenuation parameter, and then compare the attenuation parameter with the corresponding threshold value to determine whether it is necessary to obtain the peak trigger voltage of more crests to perform subsequent judgments, and at the same time to discriminate metal foreign objects. The processor can set the reference voltage at a trigger starting potential, and control the reference voltage to gradually rise when a trigger occurs, thereby obtaining a peak trigger voltage. Those skilled in the art can make modifications or changes based on this, without being limited thereto. For example, in the above embodiment, a maximum of 5 oscillation periods are measured in a measurement period to obtain 5 peak trigger voltages to calculate 4 attenuation parameters. In other embodiments, the maximum number of measurement oscillation periods and the maximum number of attenuation parameters obtained can be adjusted according to system requirements, and are not limited thereto. In addition, in the above embodiments, the values of the peak trigger voltage and the trigger starting potential are just examples. Those skilled in the art can set and obtain appropriate voltage values according to system requirements. For example, the voltage generating device 113 may be implemented by a digital analog converter, and the above unit voltage may be a digital value set by the processor 111, which is converted into a corresponding analog voltage by the digital analog converter and then output. For digital analog converters of different specifications, the peak trigger voltage and trigger start potential may have different values. For example, if the voltage generating device 113 is a 12-bit digital analog converter, it can receive a digital value from 0 to 4095 and generate an output voltage corresponding to the possible voltage range of the coil signal C1 (after passing through the voltage dividing circuit 130). . In addition, the peak trigger voltage refers to the reference voltage rising from the trigger starting potential to the level at the end of the trigger, and the processor 111 can adjust the speed of the reference voltage rising. For example, the processor 111 can control the reference voltage to rise at a fixed speed, and Will rise The degree is adjusted to a better value so that the level at the end of the trigger can effectively reflect the level of the peak voltage.

本發明之金屬異物檢測方法可有效降低驅動訊號中斷的時間,以減低中斷驅動對電力供應的影響。因此,判斷金屬異物的過程須盡可能在最短時間內完成。在上述實施例中,最低只需要量測2個振盪週期即可完成金屬異物的判別,連同捨棄的第一個波峰之振盪週期,驅動訊號最低只需要中斷三個振盪週期的時間。在另一實施例中,仍可進一步降低驅動訊號中斷的時間。 The method for detecting metal foreign objects in the present invention can effectively reduce the interruption time of the driving signal, so as to reduce the influence of interrupted driving on the power supply. Therefore, the process of judging metal foreign objects must be completed in the shortest time possible. In the above-mentioned embodiment, it is only required to measure at least two oscillation cycles to complete the determination of the metal foreign body. Together with the discarded oscillation period of the first wave, the driving signal only needs to be interrupted for a minimum of three oscillation cycles. In another embodiment, the driving signal interruption time can be further reduced.

請參考第8圖,第8圖為本發明實施例另一金屬異物檢測流程80之示意圖。如第8圖所示,金屬異物檢測流程80可用於一感應式電源供應器之供電端(如第1圖之感應式電源供應器100之供電模組1),其包含以下步驟:步驟800:開始。 Please refer to FIG. 8, which is a schematic diagram of another metal foreign object detection process 80 according to an embodiment of the present invention. As shown in FIG. 8, the metal foreign object detection process 80 can be used for the power supply end of an inductive power supply (such as the power supply module 1 of the inductive power supply 100 in FIG. 1), which includes the following steps: Step 800: Start.

步驟802:取得前一測量期間內測量之相對應之一先前峰值觸發電壓,設定為一參考電壓值。 Step 802: Obtain a corresponding one of the previous peak trigger voltages measured in the previous measurement period, and set it as a reference voltage value.

步驟804:在一測量期間內中斷感應式電源供應器100之驅動訊號D1及D2以停止對供電線圈16進行驅動,以產生供電線圈16之一線圈訊號C1。 Step 804: Interrupt the driving signals D1 and D2 of the inductive power supply 100 to stop driving the power supply coil 16 during a measurement period, so as to generate a coil signal C1 of the power supply coil 16.

步驟806:在線圈訊號C1之一振盪週期內測量線圈訊號C1之一第一波峰,以取得一第一峰值觸發電壓。 Step 806: Measure a first peak of the coil signal C1 during an oscillation period of the coil signal C1 to obtain a first peak trigger voltage.

步驟808:比較第一峰值觸發電壓與參考電壓值,並判斷第一峰值觸發電壓是否等於或接近於參考電壓值。若是,則執行步驟810;若否,則執行步驟812。 Step 808: Compare the first peak trigger voltage with the reference voltage value, and determine whether the first peak trigger voltage is equal to or close to the reference voltage value. If yes, go to step 810; if no, go to step 812.

步驟810:判斷感應式電源供應器100之一電力發送範圍內不存在金屬異物3,接著執行步驟818。 Step 810: It is determined that there is no metal foreign object 3 in the power transmission range of one of the inductive power supplies 100, and then step 818 is performed.

步驟812:在線圈訊號C1之下一振盪週期內測量線圈訊號C1之一 第二波峰,以取得一第二峰值觸發電壓。 Step 812: Measure one of the coil signals C1 in an oscillation period below the coil signal C1. A second peak to obtain a second peak trigger voltage.

步驟814:根據第一峰值觸發電壓及第二峰值觸發電壓,計算一衰減參數。 Step 814: Calculate an attenuation parameter according to the first peak trigger voltage and the second peak trigger voltage.

步驟816:比較衰減參數與一臨界值,以判斷感應式電源供應器100之電力發送範圍內是否存在金屬異物3。 Step 816: Compare the attenuation parameter with a critical value to determine whether there is a metal foreign object 3 in the power transmission range of the inductive power supply 100.

步驟818:結束。 Step 818: End.

金屬異物檢測流程80與金屬異物檢測流程20之差異在於,在金屬異物檢測流程80中,處理器111在驅動訊號D1及D2中斷之測量期間內最少只需要測量線圈訊號C1之一波峰並取得一峰值觸發電壓,即可完成金屬異物3的判別。 The difference between the metal foreign object detection process 80 and the metal foreign object detection process 20 is that in the metal foreign object detection process 80, the processor 111 needs to measure at least one peak of the coil signal C1 during the measurement period when the driving signals D1 and D2 are interrupted and obtain a The peak trigger voltage can complete the discrimination of the metal foreign body 3.

舉例來說,請參考第9圖,第9圖為本發明實施例在一測量期間內透過一峰值觸發電壓VB來進行金屬異物判別之示意圖。如第9圖所示,測量期間內線圈訊號C1僅包含二個波峰A及B。同樣地,為避免金屬異物3的判斷受驅動訊號D1及D2影響而失真,可捨棄波峰A的峰值觸發電壓量測。接著,在波峰B對應之振盪週期中,處理器111可將參考電壓設定於一觸發起始電位V0_B,並依照上述方式取得對應於波峰B之峰值觸發電壓VB。 For example, please refer to FIG. 9, which is a schematic diagram of discriminating a metal foreign object through a peak trigger voltage VB during a measurement period according to an embodiment of the present invention. As shown in Figure 9, the coil signal C1 contains only two peaks A and B during the measurement period. Similarly, in order to avoid the judgment of the metal foreign object 3 being distorted by the driving signals D1 and D2, the peak trigger voltage measurement of the peak A can be discarded. Then, in the oscillation period corresponding to the peak B, the processor 111 may set the reference voltage at a trigger starting potential V0_B, and obtain the peak trigger voltage VB corresponding to the peak B in the manner described above.

值得注意的是,在前一測量期間內,處理器111可先測量相對應之一先前峰值觸發電壓,即前一測量期間內之波峰B所對應之峰值觸發電壓VB,並記錄峰值觸發電壓VB作為一參考電壓值,例如處理器111可將參考電壓值儲存於一記憶體。同時,前一測量期間內僅取得峰值觸發電壓VB且判斷結果指示無金屬異物3存在;或者,前一測量期間內僅取得峰值觸發電壓VB及VC,計算而得之第一衰減參數PAR1大於第一臨界值TH1以指示無金屬異物3存在。接著,在本 次測量期間,處理器111只需要取得對應於波峰B之峰值觸發電壓VB,即可完成金屬異物3的判別。詳細來說,處理器111可比較峰值觸發電壓VB與參考電壓值,當峰值觸發電壓VB等於或接近於參考電壓值時,即可判斷感應式電源供應器100之電力發送範圍內不存在金屬異物3。在此情形下,當峰值觸發電壓VB測量完畢之後,供電驅動單元121及122即可重新接合,以透過驅動訊號D1及D2再次驅動供電線圈16輸出電力。 It is worth noting that in the previous measurement period, the processor 111 may first measure a corresponding one of the previous peak trigger voltages, that is, the peak trigger voltage VB corresponding to the peak B in the previous measurement period, and record the peak trigger voltage VB As a reference voltage value, for example, the processor 111 may store the reference voltage value in a memory. At the same time, only the peak trigger voltage VB was obtained during the previous measurement period and the judgment result indicated that no metallic foreign matter 3 was present; or, only the peak trigger voltage VB and VC were obtained during the previous measurement period. The calculated first attenuation parameter PAR1 is greater than the first A threshold value TH1 is used to indicate that no metallic foreign matter 3 is present. Then, in this During the second measurement, the processor 111 only needs to obtain the peak trigger voltage VB corresponding to the peak B, and then the metal foreign object 3 can be determined. In detail, the processor 111 can compare the peak trigger voltage VB with a reference voltage value. When the peak trigger voltage VB is equal to or close to the reference voltage value, it can be determined that there is no metal foreign object in the power transmission range of the inductive power supply 100. 3. In this case, after the measurement of the peak trigger voltage VB is completed, the power supply driving units 121 and 122 can be re-engaged to drive the power supply coil 16 to output power again through the driving signals D1 and D2.

一般來說,當金屬異物不存在且線圈輸出功率與負載狀態皆不變的情形下,對應於波峰B之峰值觸發電壓VB也大致不變。相反地,當一金屬異物3進入感應式電源供應器100之電力發送範圍內時,若其它條件(如線圈輸出功率和負載)不變,峰值觸發電壓VB會受金屬異物3影響而大幅下降。在此情形下,處理器111只需要測量峰值觸發電壓VB即可完成金屬異物3的判別。如此一來,在驅動訊號D1及D2中斷之測量期間內最低只需包含2個振盪週期,其中,對應於波峰A之振盪週期不進行測量,在對應於波峰B之振盪週期內完成測量並取得峰值觸發電壓VB之後,即可藉由比較峰值觸發電壓VB與先前取得之參考電壓值來完成金屬異物3的判別。 In general, when the metal foreign matter does not exist and the coil output power and load state are unchanged, the peak trigger voltage VB corresponding to the peak B is also substantially unchanged. Conversely, when a metal foreign object 3 enters the power transmission range of the inductive power supply 100, if other conditions (such as coil output power and load) remain unchanged, the peak trigger voltage VB will be greatly affected by the metal foreign object 3. In this case, the processor 111 only needs to measure the peak trigger voltage VB to complete the determination of the metal foreign object 3. In this way, during the measurement period when the driving signals D1 and D2 are interrupted, it is only necessary to include at least 2 oscillation periods. Among them, the oscillation period corresponding to the peak A is not measured, and the measurement is completed and obtained within the oscillation period corresponding to the peak B. After the peak trigger voltage VB, the discrimination of the metal foreign object 3 can be completed by comparing the peak trigger voltage VB with a previously obtained reference voltage value.

在一實施例中,當峰值觸發電壓VB被判斷為等於或接近於參考電壓值時,代表感應式電源供應器100之電力發送範圍內不存在金屬異物。此時處理器111可更新儲存之參考電壓值並將其設定為目前的峰值觸發電壓VB,以供下一測量期間之判別。 In one embodiment, when the peak trigger voltage VB is determined to be equal to or close to the reference voltage value, it means that there is no metal foreign matter in the power transmission range of the inductive power supply 100. At this time, the processor 111 can update the stored reference voltage value and set it as the current peak trigger voltage VB for determination in the next measurement period.

需注意的是,上述等於或接近於之判定可依任意方式進行。舉例來說,若峰值觸發電壓VB位於參考電壓值上下一特定數值範圍內即可判斷為兩者 相等或接近,例如可設定參考電壓值向上和向下各50單位電壓之區間內視為接近參考電壓值,且前一測量期間取得之參考電壓值為1000單位電壓。在此情形下,若峰值觸發電壓VB位於950~1050單位電壓之範圍內時,處理器111即可判斷峰值觸發電壓VB等於或接近於參考電壓值,進而判斷金屬異物3不存在。在另一實施例中,可設定參考電壓值上下一特定比例之內的數值範圍為等於或接近於,例如可設定參考電壓值向上和向下各百分之五之區間內視為接近參考電壓值,且前一測量期間取得之參考電壓值為500單位電壓。在此情形下,若峰值觸發電壓VB位於475~525單位電壓之範圍內時,處理器111即可判斷峰值觸發電壓VB等於或接近於參考電壓值,進而判斷金屬異物3不存在。 It should be noted that the above-mentioned determinations that are equal to or close to can be made in any manner. For example, if the peak trigger voltage VB is within the next specific value range above the reference voltage value, it can be judged as both. Equal or close, for example, the reference voltage value can be set to be close to the reference voltage value within a range of 50 unit voltages up and down, and the reference voltage value obtained in the previous measurement period is 1000 unit voltages. In this case, if the peak trigger voltage VB is within a range of 950 to 1050 unit voltages, the processor 111 can determine that the peak trigger voltage VB is equal to or close to the reference voltage value, and further determine that the metal foreign object 3 does not exist. In another embodiment, the value range within the next specific ratio of the reference voltage value can be set to be equal to or close to, for example, the reference voltage value can be set to be regarded as being close to the reference voltage within a range of five percent each up and down. Value, and the reference voltage value obtained in the previous measurement period is 500 unit voltages. In this case, if the peak trigger voltage VB is within a range of 475 to 525 unit voltages, the processor 111 can determine that the peak trigger voltage VB is equal to or close to the reference voltage value, and further determine that the metal foreign object 3 does not exist.

此外,若本次測量期間內峰值觸發電壓VB被判斷為未等於或接近於參考電壓值時,代表可能存在金屬異物3或者系統之輸出功率及/或負載發生變化。此時處理器111需進一步測量線圈訊號C1之下一振盪週期並取得相對應之峰值觸發電壓。接著,處理器111根據二相鄰振盪週期測得之峰值觸發電壓來計算一衰減參數,並比較該衰減參數與相對應的臨界值,以進行金屬異物3的判別。 換言之,在金屬異物檢測流程80中,若一第一峰值觸發電壓(如VB)被判斷為未等於或接近於參考電壓值時,需繼續測量下一振盪週期以取得一第二峰值觸發電壓(如第4圖之VC),以進一步進行金屬異物3的判別,上述判別可透過前述如第2圖所示之金屬異物檢測方法20來實現。 In addition, if the peak trigger voltage VB is judged to be not equal to or close to the reference voltage value during this measurement period, it means that there may be metal foreign matter 3 or the output power and / or load of the system may change. At this time, the processor 111 needs to further measure the next oscillation period of the coil signal C1 and obtain a corresponding peak trigger voltage. Next, the processor 111 calculates an attenuation parameter according to the peak trigger voltage measured in two adjacent oscillation periods, and compares the attenuation parameter with a corresponding threshold value to determine the metal foreign object 3. In other words, in the metal foreign object detection process 80, if a first peak trigger voltage (such as VB) is determined to be not equal to or close to the reference voltage value, it is necessary to continue to measure the next oscillation cycle to obtain a second peak trigger voltage ( (For example, VC in FIG. 4), to further determine the metal foreign object 3, the above discrimination can be realized by the metal foreign object detection method 20 shown in FIG. 2 described above.

值得注意的是,在特定情形下,可能發生金屬異物3接近的同時因線圈移動或負載變化造成峰值觸發電壓VB仍等於或接近於參考電壓值的情況。為避免上述情況下無法有效判別金屬異物3,處理器111可設定峰值觸發電壓VB被判斷為等於或接近於參考電壓值之一連續次數或一連續時間之上限,並於到達 上限時執行測量下一振盪週期以取得一第二峰值觸發電壓(如第4圖之VC)以及計算衰減參數等步驟,亦即,透過前述如第2圖所示之金屬異物檢測方法20來進行金屬異物3的判別。在一實施例中,處理器111可包含一計數器,用來計算峰值觸發電壓VB被判斷為等於或接近於參考電壓值因而僅測量一峰值觸發電壓VB之連續次數,當計數器到達上限時改為執行如第2圖所示之金屬異物檢測方法20,此時處理器111並重置計數器以重新計算連續次數。或者,處理器111亦可包含一計時器,用來判斷峰值觸發電壓VB被判斷為等於或接近於參考電壓值之連續時間,當計時期滿時改為執行如第2圖所示之金屬異物檢測方法20,此時處理器111並重置計時器以重新計算連續時間。又或者,計時器之運作亦可不考慮峰值觸發電壓VB之判別結果,舉例來說,計時器係週期性地依照固定的計時期間運作,平時可採用如第8圖所示之金屬異物檢測方法80,當計時期滿時強制執行如第2圖所示之金屬異物檢測方法20。 It is worth noting that, under certain circumstances, a situation may occur where the metal foreign object 3 approaches and the peak trigger voltage VB is still equal to or close to the reference voltage value due to coil movement or load change. In order to prevent the metal foreign object 3 from being effectively discriminated in the above-mentioned situation, the processor 111 may set the peak trigger voltage VB to be determined to be equal to or close to a continuous number of reference voltage values or an upper limit of a continuous time, and reach When the upper limit is reached, the steps of measuring the next oscillation period to obtain a second peak trigger voltage (such as VC in FIG. 4) and calculating the attenuation parameters are performed, that is, through the aforementioned metal foreign object detection method 20 shown in FIG. 2 Discrimination of metallic foreign matter 3. In an embodiment, the processor 111 may include a counter for calculating that the peak trigger voltage VB is judged to be equal to or close to the reference voltage value and thus only measures the number of consecutive times of a peak trigger voltage VB. When the counter reaches the upper limit, it changes to The metal foreign object detection method 20 shown in FIG. 2 is executed. At this time, the processor 111 resets the counter to recalculate the continuous number of times. Alternatively, the processor 111 may include a timer for determining that the peak trigger voltage VB is determined to be equal to or close to the continuous time of the reference voltage value. When the counting period expires, a metal foreign object as shown in FIG. 2 is executed instead. The method 20 is detected. At this time, the processor 111 resets the timer to recalculate the continuous time. Or, the operation of the timer may not consider the determination result of the peak trigger voltage VB. For example, the timer operates periodically according to a fixed timing period. Usually, a metal foreign object detection method as shown in FIG. 8 can be used. When the counting period expires, the foreign metal detection method 20 shown in FIG. 2 is enforced.

綜上所述,本發明提供了一種金屬異物檢測方法,其可在驅動訊號中斷之測量期間內,測量線圈訊號以取得一或多個峰值觸發電壓,可比較峰值觸發電壓與先前取得之一參考電壓值來進行金屬異物的判別,或根據二相鄰峰值觸發電壓的平均值相對於其差值之比例來計算衰減參數,進而比較衰減參數與對應臨界值來決定是否需取得更多波峰之峰值觸發電壓以執行後續判斷,以實現金屬異物的判別。處理器可將參考電壓設定於較低準位的一觸發起始電位,並於發生觸發時控制參考電壓逐漸上升,進而取得峰值觸發電壓。將觸發起始電位設定於較低準位可提高成功觸發並取得峰值觸發電壓的機率。此外,當金屬異物不存在時,本發明之金屬異物檢測方法最低只需要測量一或二個線圈振盪週期並對應取得一或二個峰值觸發電壓即可完成金屬異物的判別。即使加上不進行測量之第一個波峰,驅動訊號中斷之測量期間最少只包含2~3個線 圈振盪週期,可大幅降低驅動訊號中斷對電力輸出的影響。此外,本發明之金屬異物檢測方法可透過線圈訊號之衰減比例來進行判斷,以取代過去採用衰減量或衰減斜率進行判斷的方式,可解決依衰減斜率判斷易受到線圈振幅和負載影響的缺點。 In summary, the present invention provides a method for detecting metal foreign objects, which can measure the coil signal to obtain one or more peak trigger voltages during the measurement period when the drive signal is interrupted, and can compare the peak trigger voltage with one of the previously obtained references Voltage value to discriminate metal foreign objects, or calculate the attenuation parameter according to the ratio of the average value of the trigger voltage of two adjacent peaks to its difference, and then compare the attenuation parameter with the corresponding threshold value to determine whether more peaks need to be obtained The voltage is triggered to perform subsequent judgments to achieve the discrimination of metallic foreign objects. The processor may set the reference voltage to a trigger starting potential at a lower level, and control the reference voltage to gradually rise when a trigger occurs, thereby obtaining a peak trigger voltage. Setting the trigger starting potential to a lower level can increase the probability of successful triggering and obtaining a peak trigger voltage. In addition, when the metal foreign body does not exist, the metal foreign body detection method of the present invention only needs to measure one or two coil oscillation periods and obtain one or two peak trigger voltages correspondingly to complete the determination of the metal foreign body. Even if the first peak that is not measured is added, the measurement period of the drive signal interruption contains at least 2 ~ 3 lines The ring oscillation period can greatly reduce the impact of driving signal interruption on power output. In addition, the method for detecting a metal foreign object according to the present invention can be judged by the attenuation ratio of the coil signal, instead of using the attenuation method or the attenuation slope to judge in the past, and can solve the disadvantage of judging by the attenuation slope that is easily affected by the coil amplitude and load.

以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。 The above description is only a preferred embodiment of the present invention, and all equivalent changes and modifications made in accordance with the scope of patent application of the present invention shall fall within the scope of the present invention.

Claims (25)

一種金屬異物檢測方法,用於一感應式電源供應器之一供電模組,該供電模組包含有一供電線圈,該金屬異物檢測方法包含有:在一測量期間內中斷該感應式電源供應器之至少一驅動訊號以停止對該供電線圈進行驅動,以產生該供電線圈之一線圈訊號;在該線圈訊號之連續複數個振盪週期內測量該線圈訊號之複數個波峰,以分別取得複數個峰值觸發電壓;根據該複數個峰值觸發電壓中對應於二相鄰波峰的一第一峰值觸發電壓及一第二峰值觸發電壓,計算一第一衰減參數;以及比較該第一衰減參數與一第一臨界值,以判斷該感應式電源供應器之一電力發送範圍內是否存在金屬異物。A method for detecting a metal foreign object is used for a power supply module of an inductive power supply. The power supply module includes a power supply coil. The method for detecting a metal foreign object includes: interrupting the inductive power supply during a measurement period. At least one driving signal to stop driving the power supply coil to generate a coil signal of the power supply coil; measuring multiple peaks of the coil signal during successive oscillation cycles of the coil signal to obtain multiple peak triggers respectively Voltage; calculating a first attenuation parameter according to a first peak trigger voltage and a second peak trigger voltage of the plurality of peak trigger voltages corresponding to two adjacent peaks; and comparing the first attenuation parameter with a first threshold Value to determine whether a metal foreign object exists within the power transmission range of one of the inductive power supplies. 如請求項1所述之金屬異物檢測方法,其中根據該複數個峰值觸發電壓中的該第一峰值觸發電壓及該第二峰值觸發電壓,計算該第一衰減參數之步驟包含有:根據該第一峰值觸發電壓及該第二峰值觸發電壓的平均值相對於該第一峰值觸發電壓及該第二峰值觸發電壓的差值之比例,計算該第一衰減參數。The method for detecting a metal foreign object according to claim 1, wherein the step of calculating the first attenuation parameter according to the first peak trigger voltage and the second peak trigger voltage of the plurality of peak trigger voltages includes: according to the first A ratio of a peak trigger voltage and an average value of the second peak trigger voltage to a difference between the first peak trigger voltage and the second peak trigger voltage is used to calculate the first attenuation parameter. 如請求項1所述之金屬異物檢測方法,其中該第一衰減參數等於該第一峰值觸發電壓與該第二峰值觸發電壓相加之結果除以該第一峰值觸發電壓與該第二峰值觸發電壓相減之結果。The method for detecting a metal foreign object according to claim 1, wherein the first attenuation parameter is equal to a result of adding the first peak trigger voltage and the second peak trigger voltage divided by the first peak trigger voltage and the second peak trigger The result of voltage subtraction. 如請求項1所述之金屬異物檢測方法,其中該第一峰值觸發電壓接近並低於該複數個波峰中相對應之一第一波峰之峰值電壓,該第二峰值觸發電壓接近並低於該複數個波峰中相對應之一第二波峰之峰值電壓。The method for detecting a metal foreign body according to claim 1, wherein the first peak trigger voltage is close to and lower than a corresponding one of the plurality of peaks, and the second peak trigger voltage is close to and lower than The peak voltage of the corresponding second peak among the plurality of peaks. 如請求項1所述之金屬異物檢測方法,其中在該線圈訊號之該連續複數個振盪週期內測量該線圈訊號之該複數個波峰,以分別取得該複數個峰值觸發電壓之步驟包含有:在該複數個振盪週期之其中一者內執行以下步驟:將一參考電壓設定於一觸發起始電位;在出現一觸發訊號之後,控制該參考電壓逐漸上升;以及取得該觸發訊號結束時該參考電壓之準位作為該複數個峰值觸發電壓中的一峰值觸發電壓。The method for detecting a metal foreign object according to claim 1, wherein the steps of measuring the plurality of peaks of the coil signal within the continuous plurality of oscillation cycles of the coil signal to obtain the plurality of peak trigger voltages include: In one of the plurality of oscillation cycles, the following steps are performed: setting a reference voltage at a trigger starting potential; after a trigger signal appears, controlling the reference voltage to gradually rise; and obtaining the reference voltage at the end of the trigger signal The standard level is used as a peak trigger voltage of the plurality of peak trigger voltages. 如請求項5所述之金屬異物檢測方法,其中在該線圈訊號之該連續複數個振盪週期內測量該線圈訊號之該複數個波峰,以分別取得該複數個峰值觸發電壓之步驟另包含有:取得前一測量期間內取得之相對應之一第一先前峰值觸發電壓,並將該第一先前峰值觸發電壓減去一預設電壓值而得的數值設定為該觸發起始電位;或當該前一測量期間內未取得相對應之該第一先前峰值觸發電壓時,執行以下步驟:取得該複數個振盪週期中的前一振盪週期內之一第二先前峰值觸發電壓;根據該第二先前峰值觸發電壓來計算一預估峰值觸發電壓;以及將該預估峰值觸發電壓減去該預設電壓值而得的數值設定為該觸發起始電位。The method for detecting a metal foreign object according to claim 5, wherein the steps of measuring the plurality of wave peaks of the coil signal within the continuous plurality of oscillation cycles of the coil signal to obtain the plurality of peak trigger voltages respectively further include: Obtain a corresponding first previous peak trigger voltage obtained during the previous measurement period, and set a value obtained by subtracting a preset voltage value from the first previous peak trigger voltage as the trigger starting potential; or when the When the corresponding first previous peak trigger voltage is not obtained in the previous measurement period, the following steps are performed: obtaining a second previous peak trigger voltage in the previous oscillation period of the plurality of oscillation periods; according to the second previous The peak trigger voltage is used to calculate an estimated peak trigger voltage; and a value obtained by subtracting the preset voltage value from the estimated peak trigger voltage is set as the trigger starting potential. 如請求項1所述之金屬異物檢測方法,其中比較該第一衰減參數與該第一臨界值,以判斷該感應式電源供應器之該電力發送範圍內是否存在金屬異物之步驟包含有:當該第一衰減參數大於該第一臨界值時,判斷該感應式電源供應器之該電力發送範圍內不存在金屬異物;以及當該第一衰減參數小於該第一臨界值時,另執行以下步驟:取得該複數個峰值觸發電壓中的一第三峰值觸發電壓;根據該第二峰值觸發電壓及該第三峰值觸發電壓,計算一第二衰減參數;以及比較該第二衰減參數與一第二臨界值。The method for detecting a metal foreign object according to claim 1, wherein the step of comparing the first attenuation parameter with the first threshold value to determine whether a metal foreign object exists in the power transmission range of the inductive power supply includes: when When the first attenuation parameter is greater than the first critical value, it is determined that there is no metal foreign object in the power transmission range of the inductive power supply; and when the first attenuation parameter is less than the first critical value, the following steps are additionally performed. : Obtaining a third peak trigger voltage of the plurality of peak trigger voltages; calculating a second attenuation parameter based on the second peak trigger voltage and the third peak trigger voltage; and comparing the second attenuation parameter with a second Critical value. 如請求項7所述之金屬異物檢測方法,其中該第一臨界值係由預定之一基礎臨界值加上一第一數值而得,該第二臨界值係由該基礎臨界值加上一第二數值而得,其中,該第二數值小於該第一數值。The method for detecting a foreign metal substance according to claim 7, wherein the first threshold value is obtained by adding a predetermined basic threshold value to a first value, and the second threshold value is obtained by adding the first threshold value to a first threshold value. Derived from two values, wherein the second value is smaller than the first value. 如請求項1所述之金屬異物檢測方法,另包含有:根據該複數個峰值觸發電壓,計算複數個衰減參數;以及對該複數個衰減參數進行平均,以判斷該感應式電源供應器之該電力發送範圍內是否存在金屬異物。The method for detecting a metal foreign object according to claim 1, further comprising: calculating a plurality of attenuation parameters according to the plurality of peak trigger voltages; and averaging the plurality of attenuation parameters to determine the inductive power supply. Is there any foreign metal in the power transmission range? 如請求項9所述之金屬異物檢測方法,其中對該複數個衰減參數進行平均,以判斷該感應式電源供應器之該電力發送範圍內是否存在金屬異物之步驟包含有:取得該複數個衰減參數進行平均而產生之一平均結果;比較該平均結果與一基礎臨界值;當該平均結果大於該基礎臨界值時,判斷該感應式電源供應器之該電力發送範圍內不存在金屬異物;以及當該平均結果小於該基礎臨界值時,判斷該感應式電源供應器之該電力發送範圍內存在金屬異物。The method for detecting a metal foreign object according to claim 9, wherein the step of averaging the plurality of attenuation parameters to determine whether a metal foreign object exists in the power transmission range of the inductive power supply includes: obtaining the plurality of attenuations Averaging the parameters to produce an average result; comparing the average result with a basic threshold value; when the average result is greater than the basic threshold value, judging that there are no metal foreign objects in the power transmission range of the inductive power supply; and When the average result is less than the basic threshold, it is determined that there is a metal foreign object in the power transmission range of the inductive power supply. 一種用於一感應式電源供應器之供電模組,用來執行一金屬異物檢測方法,該供電模組包含有:一供電線圈;一諧振電容,耦接於該供電線圈,用來搭配該供電線圈進行諧振;至少一供電驅動單元,耦接於該供電線圈及該諧振電容,用來發送至少一驅動訊號至該供電線圈,以驅動該供電線圈產生能量,並在一測量期間內中斷該至少一驅動訊號以停止對該供電線圈進行驅動,以產生該供電線圈之一線圈訊號;一訊號接收模組,耦接於該供電線圈,用來接收該供電線圈之該線圈訊號;以及一處理器,耦接於該訊號接收模組,用來執行以下步驟:在該線圈訊號之連續複數個振盪週期內測量該線圈訊號之複數個波峰,以分別取得複數個峰值觸發電壓;根據該複數個峰值觸發電壓中對應於二相鄰波峰的一第一峰值觸發電壓及一第二峰值觸發電壓,計算一第一衰減參數;以及比較該第一衰減參數與一第一臨界值,以判斷該感應式電源供應器之一電力發送範圍內是否存在金屬異物。A power supply module for an inductive power supply is used to perform a metal foreign object detection method. The power supply module includes: a power supply coil; and a resonance capacitor coupled to the power supply coil for matching the power supply. The coil resonates; at least one power supply driving unit is coupled to the power supply coil and the resonance capacitor, and is used to send at least one driving signal to the power supply coil to drive the power supply coil to generate energy, and interrupt the at least one during a measurement period. A driving signal to stop driving the power supply coil to generate a coil signal of the power supply coil; a signal receiving module coupled to the power supply coil to receive the coil signal of the power supply coil; and a processor , Coupled to the signal receiving module, for performing the following steps: measuring multiple peaks of the coil signal in successive multiple oscillation cycles of the coil signal to obtain a plurality of peak trigger voltages respectively; according to the plurality of peaks A first peak trigger voltage and a second peak trigger voltage of the trigger voltages corresponding to two adjacent peaks are calculated as a first Save parameter; and comparing the first attenuation parameter to a first threshold value to determine whether there is a metal foreign substance within the power transmission range of one of the inductive power supply. 如請求項11所述之供電模組,其中該處理器根據該第一峰值觸發電壓及該第二峰值觸發電壓的平均值相對於該第一峰值觸發電壓及該第二峰值觸發電壓的差值之比例,計算該第一衰減參數。The power supply module according to claim 11, wherein the processor is based on a difference between an average value of the first peak trigger voltage and the second peak trigger voltage with respect to the first peak trigger voltage and the second peak trigger voltage. Ratio, calculate the first attenuation parameter. 如請求項11所述之供電模組,其中該第一衰減參數等於該第一峰值觸發電壓與該第二峰值觸發電壓相加之結果除以該第一峰值觸發電壓與該第二峰值觸發電壓相減之結果。The power supply module according to claim 11, wherein the first attenuation parameter is equal to a result of adding the first peak trigger voltage and the second peak trigger voltage divided by the first peak trigger voltage and the second peak trigger voltage Subtraction result. 如請求項11所述之供電模組,其中該第一峰值觸發電壓接近並低於該複數個波峰中相對應之一第一波峰之峰值電壓,該第二峰值觸發電壓接近並低於該複數個波峰中相對應之一第二波峰之峰值電壓。The power supply module according to claim 11, wherein the first peak trigger voltage is close to and lower than a corresponding first peak voltage of the plurality of peaks, and the second peak trigger voltage is close to and lower than the complex number The peak voltage corresponding to one of the two peaks. 如請求項11所述之供電模組,其中該處理器執行以下步驟,以在該線圈訊號之該連續複數個振盪週期內測量該線圈訊號之該複數個波峰以分別取得該複數個峰值觸發電壓:在該複數個振盪週期之其中一者內執行以下步驟:將一參考電壓設定於一觸發起始電位;在出現一觸發訊號之後,控制該參考電壓逐漸上升;以及取得該觸發訊號結束時該參考電壓之準位作為該複數個峰值觸發電壓中的一峰值觸發電壓。The power supply module according to claim 11, wherein the processor executes the following steps to measure the plurality of peaks of the coil signal within the continuous plurality of oscillation cycles of the coil signal to obtain the plurality of peak trigger voltages, respectively : Performing the following steps in one of the plurality of oscillation cycles: setting a reference voltage at a trigger starting potential; after a trigger signal appears, controlling the reference voltage to gradually rise; and when obtaining the trigger signal, the The reference voltage level is used as a peak trigger voltage of the plurality of peak trigger voltages. 如請求項15所述之供電模組,其中該處理器另執行以下步驟,以在該線圈訊號之該連續複數個振盪週期內測量該線圈訊號之該複數個波峰以分別取得該複數個峰值觸發電壓:取得前一測量期間內取得之相對應之一第一先前峰值觸發電壓,並將該第一先前峰值觸發電壓減去一預設電壓值而得的數值設定為該觸發起始電位;或當該前一測量期間內未取得相對應之該第一先前峰值觸發電壓時,該處理器執行以下步驟:取得該複數個振盪週期中的前一振盪週期內之一第二先前峰值觸發電壓;根據該第二先前峰值觸發電壓來計算一預估峰值觸發電壓;以及將該預估峰值觸發電壓減去該預設電壓值而得的數值設定為該觸發起始電位。The power supply module according to claim 15, wherein the processor further performs the following steps to measure the plurality of peaks of the coil signal within the continuous plurality of oscillation periods of the coil signal to obtain the plurality of peak triggers respectively Voltage: Obtain a corresponding first previous peak trigger voltage obtained in the previous measurement period, and set the value obtained by subtracting a preset voltage value from the first previous peak trigger voltage as the trigger starting potential; or When the corresponding first previous peak trigger voltage is not obtained during the previous measurement period, the processor performs the following steps: obtaining a second previous peak trigger voltage within a previous oscillation period of the plurality of oscillation periods; Calculating an estimated peak trigger voltage according to the second previous peak trigger voltage; and setting a value obtained by subtracting the preset voltage value from the estimated peak trigger voltage as the trigger starting potential. 如請求項11所述之供電模組,其中該處理器執行以下步驟,以比較該第一衰減參數與該第一臨界值以判斷該感應式電源供應器之該電力發送範圍內是否存在金屬異物:當該第一衰減參數大於該第一臨界值時,判斷該感應式電源供應器之該電力發送範圍內不存在金屬異物;以及當該第一衰減參數小於該第一臨界值時,該處理器另執行以下步驟:取得該複數個峰值觸發電壓中的一第三峰值觸發電壓;根據該第二峰值觸發電壓及該第三峰值觸發電壓,計算一第二衰減參數;以及比較該第二衰減參數與一第二臨界值。The power supply module according to claim 11, wherein the processor executes the following steps to compare the first attenuation parameter and the first threshold value to determine whether a metal foreign object exists in the power transmission range of the inductive power supply. : When the first attenuation parameter is greater than the first critical value, judging that there is no metal foreign object in the power transmission range of the inductive power supply; and when the first attenuation parameter is less than the first critical value, the process The controller further performs the following steps: obtaining a third peak trigger voltage of the plurality of peak trigger voltages; calculating a second attenuation parameter according to the second peak trigger voltage and the third peak trigger voltage; and comparing the second attenuation Parameters and a second critical value. 如請求項17所述之供電模組,其中該第一臨界值係由預定之一基礎臨界值加上一第一數值而得,該第二臨界值係由該基礎臨界值加上一第二數值而得,其中,該第二數值小於該第一數值。The power supply module according to claim 17, wherein the first threshold value is obtained by adding a predetermined first threshold value to a first threshold value, and the second threshold value is obtained by adding the second threshold value to a second threshold value. Value, wherein the second value is smaller than the first value. 如請求項11所述之供電模組,其中該處理器另執行以下步驟:根據該複數個峰值觸發電壓,計算複數個衰減參數;以及對該複數個衰減參數進行平均,以判斷該感應式電源供應器之該電力發送範圍內是否存在金屬異物。The power supply module according to claim 11, wherein the processor further performs the following steps: calculating a plurality of attenuation parameters according to the plurality of peak trigger voltages; and averaging the plurality of attenuation parameters to determine the inductive power supply Is there any metal foreign object in the power transmission range of the power supply. 如請求項19所述之供電模組,其中該處理器執行以下步驟,以對該複數個衰減參數進行平均以判斷該感應式電源供應器之該電力發送範圍內是否存在金屬異物:取得該複數個衰減參數進行平均而產生之一平均結果;比較該平均結果與一基礎臨界值;當該平均結果大於該基礎臨界值時,判斷該感應式電源供應器之該電力發送範圍內不存在金屬異物;以及當該平均結果小於該基礎臨界值時,判斷該感應式電源供應器之該電力發送範圍內存在金屬異物。The power supply module according to claim 19, wherein the processor executes the following steps to average the plurality of attenuation parameters to determine whether there is a metal foreign object in the power transmission range of the inductive power supply: obtaining the plurality An average result is generated by averaging the attenuation parameters; comparing the average result with a basic threshold value; when the average result is greater than the basic threshold value, it is determined that there is no metal foreign object in the power transmission range of the inductive power supply And when the average result is less than the basic threshold value, it is determined that there is a metal foreign object in the power transmission range of the inductive power supply. 一種金屬異物檢測方法,用於一感應式電源供應器之一供電模組,該供電模組包含有一供電線圈,該金屬異物檢測方法包含有:取得前一測量期間內測量之相對應之一先前峰值觸發電壓,設定為一參考電壓值;在一測量期間內中斷該感應式電源供應器之至少一驅動訊號以停止對該供電線圈進行驅動,以產生該供電線圈之一線圈訊號;在該線圈訊號之一振盪週期內測量該線圈訊號之一第一波峰,以取得一第一峰值觸發電壓;比較該第一峰值觸發電壓與該參考電壓值;以及當該第一峰值觸發電壓等於或接近於該參考電壓值時,判斷該感應式電源供應器之一電力發送範圍內不存在金屬異物。A metal foreign object detection method is used for a power supply module of an inductive power supply. The power supply module includes a power supply coil. The metal foreign object detection method includes: obtaining a corresponding one of the previous measurements during the previous measurement period. The peak trigger voltage is set to a reference voltage value; at least one driving signal of the inductive power supply is interrupted during a measurement period to stop driving the power supply coil to generate a coil signal of the power supply coil; Measuring a first peak of the coil signal during an oscillation period of the signal to obtain a first peak trigger voltage; comparing the first peak trigger voltage with the reference voltage value; and when the first peak trigger voltage is equal to or close to At the reference voltage value, it is determined that there is no metal foreign object in a power transmission range of one of the inductive power supplies. 如請求項21所述之金屬異物檢測方法,其中當該第一峰值觸發電壓未等於或接近於該參考電壓值時,該金屬異物檢測方法另包含以下步驟:在該線圈訊號之下一振盪週期內測量該線圈訊號之一第二波峰,以取得一第二峰值觸發電壓;根據該第一峰值觸發電壓及該第二峰值觸發電壓,計算一衰減參數;以及比較該衰減參數與一臨界值,以判斷該感應式電源供應器之該電力發送範圍內是否存在金屬異物。The method for detecting a metal foreign object according to claim 21, wherein when the first peak trigger voltage is not equal to or close to the reference voltage value, the method for detecting a metal foreign object further includes the following steps: an oscillation period below the coil signal Measure a second peak of the coil signal internally to obtain a second peak trigger voltage; calculate an attenuation parameter based on the first peak trigger voltage and the second peak trigger voltage; and compare the attenuation parameter with a threshold value, To determine whether there is a metal foreign object in the power transmission range of the inductive power supply. 如請求項21所述之金屬異物檢測方法,另包含有:當該第一峰值觸發電壓等於或接近於該參考電壓值時,將該參考電壓值設定為等於該第一峰值觸發電壓。The method for detecting a metal foreign object according to claim 21, further comprising: when the first peak trigger voltage is equal to or close to the reference voltage value, setting the reference voltage value to be equal to the first peak trigger voltage. 如請求項21所述之金屬異物檢測方法,另包含有:計算該第一峰值觸發電壓被判斷為等於或接近於該參考電壓值之一連續次數或一連續時間;以及當該連續次數或該連續時間到達一上限時,執行以下步驟:在該線圈訊號之下一振盪週期內測量該線圈訊號之一第二波峰,以取得一第二峰值觸發電壓;根據該第一峰值觸發電壓及該第二峰值觸發電壓,計算一衰減參數;比較該衰減參數與一臨界值,以判斷該感應式電源供應器之該電力發送範圍內是否存在金屬異物;以及重置一計數器以重新計算該連續次數,或重置一計時器以重新計算該連續時間。The method for detecting a foreign metal object according to claim 21, further comprising: calculating the first peak trigger voltage to be determined to be equal to or close to a continuous number or a continuous time of the reference voltage value; and when the continuous number or the When the continuous time reaches an upper limit, the following steps are performed: measuring a second peak of the coil signal within an oscillation period below the coil signal to obtain a second peak trigger voltage; according to the first peak trigger voltage and the first Calculate an attenuation parameter with two peak trigger voltages; compare the attenuation parameter with a critical value to determine whether there is a metal foreign object in the power transmission range of the inductive power supply; and reset a counter to recalculate the continuous number of times, Or reset a timer to recalculate the continuous time. 如請求項21所述之金屬異物檢測方法,另包含有:設置一計時器,並於該計時器計時期滿時執行以下步驟:在該線圈訊號之下一振盪週期內測量該線圈訊號之一第二波峰,以取得一第二峰值觸發電壓;根據該第一峰值觸發電壓及該第二峰值觸發電壓,計算一衰減參數;以及比較該衰減參數與一臨界值,以判斷該感應式電源供應器之該電力發送範圍內是否存在金屬異物。The method for detecting a metal foreign object according to claim 21, further comprising: setting a timer, and performing the following steps when the timer expires: measuring one of the coil signals within an oscillation period below the coil signal A second peak to obtain a second peak trigger voltage; calculate an attenuation parameter based on the first peak trigger voltage and the second peak trigger voltage; and compare the attenuation parameter with a threshold value to determine the inductive power supply Whether there is a metal foreign object within the power transmission range of the device.
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