TWI561838B - Testing device of address configuration signal of dimm slot and testing method thereof - Google Patents
Testing device of address configuration signal of dimm slot and testing method thereofInfo
- Publication number
- TWI561838B TWI561838B TW104129676A TW104129676A TWI561838B TW I561838 B TWI561838 B TW I561838B TW 104129676 A TW104129676 A TW 104129676A TW 104129676 A TW104129676 A TW 104129676A TW I561838 B TWI561838 B TW I561838B
- Authority
- TW
- Taiwan
- Prior art keywords
- testing
- configuration signal
- address configuration
- dimm slot
- testing device
- Prior art date
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW104129676A TWI561838B (en) | 2015-09-08 | 2015-09-08 | Testing device of address configuration signal of dimm slot and testing method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW104129676A TWI561838B (en) | 2015-09-08 | 2015-09-08 | Testing device of address configuration signal of dimm slot and testing method thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI561838B true TWI561838B (en) | 2016-12-11 |
TW201710694A TW201710694A (en) | 2017-03-16 |
Family
ID=58227295
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW104129676A TWI561838B (en) | 2015-09-08 | 2015-09-08 | Testing device of address configuration signal of dimm slot and testing method thereof |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI561838B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU189608U1 (en) * | 2019-04-09 | 2019-05-29 | Акционерное общество "МЦСТ" | Third generation RAM channel test adapter |
RU194790U1 (en) * | 2019-10-17 | 2019-12-23 | Акционерное общество "МЦСТ" | Fourth Generation RAM Channel Testing Adapter |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW311176B (en) * | 1995-12-08 | 1997-07-21 | Ast Res Inc | |
CN1601480A (en) * | 2003-09-26 | 2005-03-30 | 因芬尼昂技术股份公司 | Device for testing storage modular |
US7477522B2 (en) * | 2006-10-23 | 2009-01-13 | International Business Machines Corporation | High density high reliability memory module with a fault tolerant address and command bus |
CN101794624A (en) * | 2009-02-01 | 2010-08-04 | 金士顿科技(上海)有限公司 | Failure diagnosis of serial addressing memory module of personable computer mainboard |
US20130111230A1 (en) * | 2011-10-31 | 2013-05-02 | Calxeda, Inc. | System board for system and method for modular compute provisioning in large scalable processor installations |
-
2015
- 2015-09-08 TW TW104129676A patent/TWI561838B/en active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW311176B (en) * | 1995-12-08 | 1997-07-21 | Ast Res Inc | |
CN1601480A (en) * | 2003-09-26 | 2005-03-30 | 因芬尼昂技术股份公司 | Device for testing storage modular |
US7477522B2 (en) * | 2006-10-23 | 2009-01-13 | International Business Machines Corporation | High density high reliability memory module with a fault tolerant address and command bus |
CN101794624A (en) * | 2009-02-01 | 2010-08-04 | 金士顿科技(上海)有限公司 | Failure diagnosis of serial addressing memory module of personable computer mainboard |
US20130111230A1 (en) * | 2011-10-31 | 2013-05-02 | Calxeda, Inc. | System board for system and method for modular compute provisioning in large scalable processor installations |
Also Published As
Publication number | Publication date |
---|---|
TW201710694A (en) | 2017-03-16 |
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