TWI482981B - A thimble board testing system and a method thereof - Google Patents

Description

Thimble plate test system and method

The invention relates to a thimble board testing system and method, in particular to using a gerber data (Gerber File) to find the correct connection of each thimble to be tested (the foot to be tested) on the ejector plate to be tested by any electrical connection. Test system and method for location.

The current industry and production line circuit board test method will connect each test pin to the corresponding fixed contact point for static test according to the actual measurement function of each pin (Pin) to be tested on the circuit board to be tested. Therefore, each time a different model is replaced, it is necessary to reconnect to the corresponding contact according to the definition of the function of the new foot to be tested, so that the work of the fixture is complicated before the setting; in addition, when the personnel changes, the tool must be re-familiar. The system increases the training cost, and the fixed pin of the ejector pin and the connector on the ejector pin loses electrical connection due to poor soldering, or the thimble of the ejector pin and the plurality of connectors on the connector When there are too many fixed contacts and it is easy to debug, there are many disadvantages:

1, the program is very complicated and troublesome, increasing the working hours and human error rate.

2. Increase production costs and storage space for fixtures.

3. It is difficult to find out the cause in a short time when the fixture has an unexpected error, and it needs to be detected gradually.

Therefore, conventional techniques often derive the disadvantages described above due to complicated procedures. Therefore, how to develop a method of inspection to solve the above shortcomings will be an important topic that can be explored by those familiar with the art.

The advantages and spirit of the present invention will be further understood from the following detailed description and the appended claims.

The main object of the present invention is to provide a thimble board testing system and method, which uses a Gerber File to find out the correctness of each ejector pin to be tested on the ejector plate to be tested by any electrical connection. Connection location. In this way, when any electrical connection is used, the test can be performed to find the correct position without knowing the correct position of the ejector pins to be tested (the feet to be tested) on the ejector plate to be tested, thereby solving the conventional knowledge. The shortcomings of the technology's "complex and complicated procedures, increased working hours and human error rates" and "increased production costs and storage space for fixtures". Moreover, the present invention utilizes a test system for testing, so that no human step-by-step detection is required.

A thimble test system comprising: a ejector plate to be tested, having a plurality of thimbles to be tested for electrical testing; and a test machine comprising a transmission device, at least one connector, and an analog-to-digital conversion module. The ejector plate to be tested can be placed in the test machine for electrical testing, and the test machine stores a standard file, the coordinate file has coordinate information of the thimble to be tested, and the test machine can read the coordinate information; The transmission device is mounted on the testing machine and has a probe; the plurality of thimbles to be tested can be arbitrarily electrically connected to any of a plurality of connection points on the connector; and the connector can be electrically connected to the analog digital a conversion module and a digital analog conversion module; wherein, according to the coordinate information of the ejector to be tested recorded in the coordinate file, the transmission moves the probe to each of the ejector pins to be tested, and utilizes The analog digital conversion module performs electrical testing, and then summarizes the pinhole information of the thimble that needs to be debugged after the electrical test, and performs debugging.

A thimble test method includes the following steps: (1) arbitrarily electrically connecting a plurality of thimbles to be tested, which need to be electrically tested, to any of a plurality of connection points on at least one connector; (2) Recording the coordinate information of the thimble to be tested on a standard file, and reading the coordinate information of the coordinate file by using a test machine that can be placed in the ejector plate to be tested; (3) one of the transmissions on the test machine The device moves a probe on the transmission to the thimble to be tested according to the coordinate information of the ejector to be tested for electrical connection, and electrically connects the analog digital converter of the connector (Analog Digital Converter) Conduct electrical testing; and (4) summarize the pinhole information of the thimble that needs to be debugged after the electrical test, and debug.

(1)~(24)‧‧‧ is the step number

1‧‧‧Tedger board test system

11‧‧‧The thimble board to be tested

111‧‧‧The thimble to be tested

12‧‧‧Testing machine

121‧‧‧Standard file

1211‧‧‧Coordinate information

122‧‧‧Transmission

1221‧‧‧Probe

123‧‧‧Connector

1231‧‧‧ Connection point

124‧‧‧ Analog Digital Converter Module

1241‧‧‧ channel

125‧‧‧Digital analog conversion module

1251‧‧‧ channel

126‧‧‧Central Processing Unit

127‧‧‧General-purpose input and output control register

128‧‧‧Integrated circuit

The first figure is a schematic structural view of a preferred embodiment of a thimble test system of the present invention;

2 is a schematic view of a transmission device of a preferred embodiment of the thimble test system of the present invention;

The third figure is a schematic diagram of the relationship between the ejector plate to be tested, the thimble to be tested and the connector according to a preferred embodiment of the thimble test system of the present invention;

Figure 4 is a schematic diagram of a signal output test circuit of a preferred embodiment of the thimble test system of the present invention;

5 is a schematic diagram of a signal input test circuit of a preferred embodiment of the thimble test system of the present invention; and

Figure 6 is a diagram showing the steps of a preferred embodiment of a thimble test method of the present invention.

The detailed description and technical content of the present invention are described below with reference to the drawings, but the drawings are only for reference and explanation, and are not intended to limit the creation.

Please refer to the first figure, which is a schematic structural diagram of a preferred embodiment of a thimble test system of the present invention. The thimble test system 1 includes: a thimble board 11 to be tested, having a plurality of thimbles 111 to be tested for electrical testing; and a test machine 12 including a transmission device 122 and a plurality of connectors (Connector) 123, an analog digital converter module (Analog Digital Converter) 124, the ejector plate 11 to be tested can be placed in the test machine 12 for electrical testing, and the test machine 12 stores a standard 121 to In this embodiment, it is a Gerber File, the coordinate file 121 has the coordinate information 1211 of the ejector to be tested, and the test machine 12 can read the coordinate information 1211; the transmission device 122 is installed in the The test machine 12 has a probe 1221, which in the present embodiment is a Z-axis probe; the plurality of thimbles 111 to be tested can be arbitrarily electrically connected to any of a plurality of connection points on the connector 123. The connector 123 is electrically connected to the analog digital conversion module 124 and a digital analog conversion module 125. The transmission device 122 is based on the coordinate information 1211 of the ejector pin 111 to be recorded recorded by the coordinate file 121. Move the probe 1221 Each of the ejector pins 111 to be tested is electrically tested by an analog digital conversion module 124. In this embodiment, the electrical test includes a board out test and a signal input. In the test (Board in Test), the information of the pinhole (not shown) where the thimble 111 needs to be debugged on the ejector plate 11 after electrical testing is summarized and debugged.

Furthermore, the test machine 12 further includes a central processing unit (CPU) 126, a universal input/output control register 127, an integrated circuit (IC) 128, and a digital analog conversion module (Digital Analog Converter). The digital analog conversion module 125 further includes a plurality of channels 1251, and the analog digital conversion module 124 further includes a plurality of channels 1241. Thus, through the operation between the components shown in the first figure, a plurality of thimbles on the ejector pin 11 can be electrically tested, thereby obtaining information on the pinholes at the position where the thimbles to be debugged are located.

Please refer to the sixth embodiment and the second to fifth figures, which are step diagrams of the preferred embodiment of the thimble test method of the present invention, and the transmission device of the preferred embodiment of the thimble test system of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 3 is a schematic diagram showing the relationship between a ejector plate to be tested, a thimble to be tested and a connector according to a preferred embodiment of the ejector plate test system of the present invention, a signal output test circuit diagram of a preferred embodiment of the ejector plate test system of the present invention, and A schematic diagram of a signal input test circuit of a preferred embodiment of the thimble test system of the present invention. As shown in the sixth figure, the ejector board test method of the present invention comprises the following steps:

(1) start;

(2) Classification to define clearly which of the plurality of pinholes on the Thimble Board 11 to be tested, which need to be implanted with a thimble;

(3) Defining which of the plurality of thimbles 111 to be tested needs to perform a board out test or a board in test, as shown in the third figure;

(4) According to the classification, one of the connection pins 1111 of each of the ejector pins 111 is arbitrarily electrically connected to any one of the plurality of connectors 123 of the connector 123, as shown in the third figure. Shown only by a connector, but the connection point is not shown;

(5) Recording the coordinate information 1211 of each of the classified thimbles 111 to be recorded in the coordinate file 121. In this embodiment, the coordinate file 121 is a Gerber File;

(6) placing the ejector plate 11 to be tested into the test machine 12, the test machine 12 reads the coordinate information 1211 in the coordinate file 121;

(7) Whether to perform a signal out test on any of the ejector pins 111 to be tested on the ejector pin 11, if yes, proceed to step (8), and if not, proceed to step (14);

(8) The central processing unit (CPU) 126 in the test machine 12 commands the general-purpose input/output control register 127 to issue a high level signal to the integrated circuit (IC) 128, and the integrated circuit 128 will be 3.3V. The voltage is introduced to a probe 1221 of the transmission device 122. In this embodiment, the probe 1221 is a Z-axis probe, as shown in the second and fourth figures;

(9) The test machine 12 moves the probe 1221 of the transmission device 122 to the ejector pin 111 to be tested on the needle plate 11 to be tested according to the coordinate information 1211 of the coordinate file 121, so that the probe 1221 is electrically connected to the ejector pin 111 to be tested. ;

(10) The test machine 12 determines whether the thimble 111 to be tested has a voltage of 3.3V via an analog digital converter 124. If yes, the process proceeds to step (11). If not, the process proceeds to step (12). ;

(11) One of the coordinate information 1211 coordinates in the coordinate file 121 is matched with one of the plurality of channels 1241 of the analog digital conversion module 124, and proceeds to step (13);

(12) The thimble 111 to be tested has an electrical connection problem and is recorded, and proceeds to step (13);

(13) Whether to perform a signal output test on a thimble 111 to be tested under the ejector pin 11, and if so, proceed to step (8), and if not, proceed to step (14);

(14) Whether to perform any signal input test (Board in Test) on any of the ejector pins 111 to be tested, if yes, proceed to step (15), and if not, proceed to step (22);

(15) The central processing unit 126 in the test machine 12 commands the general-purpose input/output control register 127 to issue a low level signal to the integrated circuit 128 to electrically connect the analog digital conversion module 124 to the transmission 122. Probe 1221 on, as shown in the fifth figure;

(16) The test machine 12 moves the probe 1221 of the transmission device 122 to the other ejector pin 111 to be tested on the ejector plate 11 to be tested according to the coordinate information 1211 of the coordinate file 121, so that the probe 1221 and the other test are to be tested. The thimble 111 is electrically connected;

(17) The test machine 12 sends a voltage of 3.3V to the ejector pin 111 to be tested via a digital analog converter 125;

(18) The test machine 12 interprets whether the 3.3V voltage sent by the digital analog conversion module 125 reaches the analog digital conversion module 124 via the analog digital conversion module 124. If yes, the process proceeds to step (19). Going to step (20);

(19) One coordinate of the coordinate information 1211 in the coordinate file 121 coincides with the channel 1251 of the plurality of channels 1251 of the digital analog conversion module 125, and proceeds to step (21);

(20) The thimble 111 to be tested has an electrical connection problem with one of the plurality of channels 1251 of the digital analog conversion module 125, and records;

(21) Whether to perform a signal input test on a thimble 111 to be tested under the ejector pin 11, and if so, proceed to step (15), and if no, proceed to step (22);

(22) List the information of the pinholes at the position of the thimble 111 on the ejector plate 11 that needs to be debugged after the signal output test or the signal input test;

(23) performing a debugging procedure;

(24) End.

Therefore, in summary, it can be understood that the thimble test system and method of the present invention has the advantages that the data transfer is unclear due to personnel changes, and some fixed contacts on a circuit board and its connector are artificially welded. When the electrical connection is lost and the electrical connection is lost, or when there are too many fixed contacts on a circuit board and its connector, it is not easy to debug. The invention can make the circuit board into a ejector plate to be tested, and use the Gerber File. Find the electrical connection relationship between the ejector pins to be tested and the connector on the ejector plate to be tested by any electrical connection. Therefore, the present invention can reconstruct the original electrical connection relationship between each other without knowing the electrical connection relationship between the original board and the connector; furthermore, when there are too many fixed contacts, it is difficult to find the electrical connection relationship and it is difficult to remove. In the wrong time, the present invention can find errors and perform debugging by any electrical connection.

Thus, the patent application of the present invention utilizes the rich experience of the creator to design a simple but fully problematic solution to the problem of the prior art. Therefore, the function of the patent application of the present invention does meet the patent requirements of novelty and progress.

The above is only the preferred embodiment of the present invention, and the scope of the present invention is not limited thereto. It is to be understood that the scope of the present invention is not limited by the spirit and scope of the present invention, and should be considered as a further embodiment of the present invention.

(1)~(24)‧‧‧ is the step number

Claims (10)

A thimble test system comprising:
a ejector plate to be tested, having a plurality of thimbles to be tested for electrical testing; and a testing machine comprising a transmission device, at least one connector, and an analog-digital conversion module, wherein the ejector plate to be tested can be placed The test machine is used for electrical testing, and the test machine stores a standard file, the coordinate file has coordinate information of the thimble to be tested, the test machine can read the coordinate information; the transmission device is installed in the testing machine And having a probe; the plurality of thimbles to be tested can be arbitrarily electrically connected to any of a plurality of connection points on the connector; and the connector can be electrically connected to the analog-to-digital conversion module and a digital analog conversion Module
Wherein, according to the coordinate information of the thimble to be tested recorded in the coordinate file, the transmission device moves the probe to each thimble to be tested of the ejector plate to be tested, and performs electrical test using an analog digital conversion module, and then generalizes After the electrical test, the pinhole information of the thimble that needs to be debugged on the ejector plate is debugged. The ejector board test system of claim 1, wherein the electrical test comprises a board out test and a board in test. The ejector board test system of claim 2, wherein the digital analog conversion module further comprises a plurality of channels. A thimble test method includes the following steps:
(1) arbitrarily electrically connecting a plurality of thimbles to be tested, which need to be electrically tested, to any of a plurality of connection points on at least one connector;
(2) recording the coordinate information of the ejector to be tested on a standard file, and reading the coordinate information of the coordinate file by using a test machine that can be placed in the ejector plate to be tested;
(3) one of the transmission devices of the test machine moves a probe on the transmission device to each of the ejector pins to be tested according to the coordinate information of the ejector pin to be electrically connected, and electrically connects the connector One of the analog digital converters for electrical testing; and
(4) Summarize the pinhole information of the thimble that needs to be debugged after the electrical test, and debug. The thimble test method of claim 4, wherein the step (1) further comprises the following steps:
(11) Perform classification to define clearly which of the plurality of pinholes on the Thimble Board to be tested need to be implanted into the thimble;
(12) defining which of the plurality of thimbles to be tested needs to perform a board out test or a board in test; and
(13) According to the classification, one of the connection pins of each of the ejector pins to be tested is arbitrarily electrically connected to any of the connection points on the at least one connector. The thimble test method of claim 4, wherein the step (2) further comprises the following steps:
(21) recording the coordinate information of each of the classified thimbles to be in a standard file; and
(22) The ejector plate to be tested is placed in the test machine, and the test machine reads the coordinate information in the coordinate file. The thimble test method of claim 4, wherein the step (3) further comprises the following steps:
(31) whether a signal output test is performed on any of the ejector pins to be tested on the ejector plate to be tested, and if so, proceeds to step (32), and if not, proceeds to step (34);
(32) performing the signal output test on any of the ejector pins to be tested on the ejector pin;
(33) Whether to perform the signal output test on the lower thimble under test on the ejector pin board, if yes, go to step (32), if no, go to step (34);
(34) Whether to perform a signal input test on any of the ejector pins to be tested on the ejector pin board, if yes, proceed to step (35), and if not, proceed to step (4);
(35) performing a signal input test on any of the thimbles to be tested on the ejector pin; and
(36) Whether to perform the signal input test on the lower thimble to be tested on the ejector plate, if yes, go to step (35), if no, go to step (4). The thimble test method of claim 4, wherein the step (4) further comprises the following steps:
(41) summarizing the pinhole information of the thimble on which the ejector pin needs to be debugged after a signal output test or a signal input test; and
(42) Perform a debug procedure. The thimble test method of claim 7, wherein the step (32) further comprises the following steps:
(321) A central processing unit (CPU) in the test machine commands a general-purpose input/output control register to issue a high level signal to an integrated circuit (IC), which introduces a voltage of 3.3V. To the probe of the transmission;
(322) the test machine moves the probe of the transmission device to the ejector pin to be tested on the needle plate according to the coordinate information of the coordinate file, so that the probe is electrically connected with the ejector pin to be tested;
(323) The test machine determines whether the thimble to be tested has a voltage to be introduced via the analog digital conversion module, and if so, proceeds to step (324), and if not, proceeds to step (325);
(324) one of the coordinates of the coordinate information in the coordinate file is consistent with one of the channels of the analog digital conversion module, and proceeds to step (33);
(325) The thimble to be tested has an electrical connection problem and is recorded, and proceeds to step (33). The thimble test method of claim 7, wherein the step (35) further comprises the following steps:
(351) a central processing unit in the test machine commands a general-purpose input/output control register to send a low level signal to an integrated circuit (IC) to electrically connect the analog digital conversion module to the transmission On the probe;
(352) the test machine moves the probe of the transmission device to another ejector pin to be tested on the pie plate to be tested according to the coordinate information of the coordinate file, so that the probe is electrically connected to the other ejector pin to be tested ;
(353) The test machine sends a voltage of 3.3V to the ejector to be tested via a digital analog converter (Digital Analog Converter);
(354) The test machine interprets whether the voltage of the 3.3V sent by the digital analog conversion module reaches the analog digital conversion module via the analog digital conversion module, and if yes, proceeds to step (355), and if not, enters Step (356);
(355) one of the coordinates of the coordinate information in the coordinate file is consistent with one of the channels of the digital analog conversion module, and proceeds to step (36);
(356) The thimble to be tested has an electrical connection problem with one of the plurality of channels of the digital analog conversion module, and is recorded, and proceeds to step (36).