TWI475492B - Method of manufacturing memory card and apparatus thereof - Google Patents
Method of manufacturing memory card and apparatus thereofInfo
- Publication number
- TWI475492B TWI475492B TW096133135A TW96133135A TWI475492B TW I475492 B TWI475492 B TW I475492B TW 096133135 A TW096133135 A TW 096133135A TW 96133135 A TW96133135 A TW 96133135A TW I475492 B TWI475492 B TW I475492B
- Authority
- TW
- Taiwan
- Prior art keywords
- memory card
- manufacturing memory
- manufacturing
- card
- memory
- Prior art date
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW096133135A TWI475492B (en) | 2007-09-05 | 2007-09-05 | Method of manufacturing memory card and apparatus thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW096133135A TWI475492B (en) | 2007-09-05 | 2007-09-05 | Method of manufacturing memory card and apparatus thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200912758A TW200912758A (en) | 2009-03-16 |
TWI475492B true TWI475492B (en) | 2015-03-01 |
Family
ID=44724998
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096133135A TWI475492B (en) | 2007-09-05 | 2007-09-05 | Method of manufacturing memory card and apparatus thereof |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI475492B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI798536B (en) * | 2020-03-03 | 2023-04-11 | 慧榮科技股份有限公司 | Method and computer program product for analyzing failures on flash data |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020199142A1 (en) * | 2001-06-26 | 2002-12-26 | Moshe Gefen | Semiconductor programming and testing method and apparatus |
US6768324B1 (en) * | 1999-11-05 | 2004-07-27 | Fab Solutions, Inc. | Semiconductor device tester which measures information related to a structure of a sample in a depth direction |
US20070188183A1 (en) * | 2005-02-07 | 2007-08-16 | Micky Holtzman | Secure memory card with life cycle phases |
-
2007
- 2007-09-05 TW TW096133135A patent/TWI475492B/en not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6768324B1 (en) * | 1999-11-05 | 2004-07-27 | Fab Solutions, Inc. | Semiconductor device tester which measures information related to a structure of a sample in a depth direction |
US20040207415A1 (en) * | 1999-11-05 | 2004-10-21 | Keizo Yamada | Semiconductor device tester |
US20020199142A1 (en) * | 2001-06-26 | 2002-12-26 | Moshe Gefen | Semiconductor programming and testing method and apparatus |
US20070188183A1 (en) * | 2005-02-07 | 2007-08-16 | Micky Holtzman | Secure memory card with life cycle phases |
Also Published As
Publication number | Publication date |
---|---|
TW200912758A (en) | 2009-03-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |