TWI472750B - - Google Patents
Info
- Publication number
- TWI472750B TWI472750B TW100149488A TW100149488A TWI472750B TW I472750 B TWI472750 B TW I472750B TW 100149488 A TW100149488 A TW 100149488A TW 100149488 A TW100149488 A TW 100149488A TW I472750 B TWI472750 B TW I472750B
- Authority
- TW
- Taiwan
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW100149488A TW201326797A (en) | 2011-12-29 | 2011-12-29 | Chip defect inspection apparatus based on linear CCD array imaging and inspection method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW100149488A TW201326797A (en) | 2011-12-29 | 2011-12-29 | Chip defect inspection apparatus based on linear CCD array imaging and inspection method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201326797A TW201326797A (en) | 2013-07-01 |
| TWI472750B true TWI472750B (en) | 2015-02-11 |
Family
ID=49224953
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW100149488A TW201326797A (en) | 2011-12-29 | 2011-12-29 | Chip defect inspection apparatus based on linear CCD array imaging and inspection method thereof |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW201326797A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111551555A (en) * | 2019-02-12 | 2020-08-18 | 微精科技股份有限公司 | Automatic identification system on cloth flaw line |
| CN111146109B (en) * | 2020-02-16 | 2020-10-30 | 徐州康禄新材料科技有限公司 | Detection system |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6198529B1 (en) * | 1999-04-30 | 2001-03-06 | International Business Machines Corporation | Automated inspection system for metallic surfaces |
| JP2003007746A (en) * | 2001-06-18 | 2003-01-10 | Sharp Corp | Method and equipment for inspecting semiconductor element |
| US20040207863A1 (en) * | 2003-04-16 | 2004-10-21 | Christiansen Robert Douglas | Automatic discovery of networked raster image processing engines |
| US20050240376A1 (en) * | 2004-04-21 | 2005-10-27 | Fuji Xerox Co., Ltd. | Failure diagnosis method, failure diagnosis apparatus, image forming apparatus, program, and storage medium |
| US20090030544A1 (en) * | 2007-07-26 | 2009-01-29 | 3M Innovative Properties Company | Multi-unit process spatial synchronization of image inspection systems |
| TW201140042A (en) * | 2010-03-16 | 2011-11-16 | Panasonic Corp | Pattern inspecting method, pattern inspecting device and imaging head for pattern inspecting device |
-
2011
- 2011-12-29 TW TW100149488A patent/TW201326797A/en unknown
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6198529B1 (en) * | 1999-04-30 | 2001-03-06 | International Business Machines Corporation | Automated inspection system for metallic surfaces |
| JP2003007746A (en) * | 2001-06-18 | 2003-01-10 | Sharp Corp | Method and equipment for inspecting semiconductor element |
| US20040207863A1 (en) * | 2003-04-16 | 2004-10-21 | Christiansen Robert Douglas | Automatic discovery of networked raster image processing engines |
| US20050240376A1 (en) * | 2004-04-21 | 2005-10-27 | Fuji Xerox Co., Ltd. | Failure diagnosis method, failure diagnosis apparatus, image forming apparatus, program, and storage medium |
| US20090030544A1 (en) * | 2007-07-26 | 2009-01-29 | 3M Innovative Properties Company | Multi-unit process spatial synchronization of image inspection systems |
| TW201140042A (en) * | 2010-03-16 | 2011-11-16 | Panasonic Corp | Pattern inspecting method, pattern inspecting device and imaging head for pattern inspecting device |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201326797A (en) | 2013-07-01 |