TWI400142B - Mutual invasive macromolecular reticular construct, grinding pad, and the preparing method thereof - Google Patents

Mutual invasive macromolecular reticular construct, grinding pad, and the preparing method thereof Download PDF

Info

Publication number
TWI400142B
TWI400142B TW95127576A TW95127576A TWI400142B TW I400142 B TWI400142 B TW I400142B TW 95127576 A TW95127576 A TW 95127576A TW 95127576 A TW95127576 A TW 95127576A TW I400142 B TWI400142 B TW I400142B
Authority
TW
Taiwan
Prior art keywords
polymer
polishing pad
weight
mesh structure
polishing
Prior art date
Application number
TW95127576A
Other languages
Chinese (zh)
Other versions
TW200806430A (en
Inventor
Norikazu Tabata
Kazuhiko Hashisaka
Masahiro Sugimura
Takuo Sakamoto
Masaki Ue
Hiroyuki Nakayama
Seiji Fukuda
Original Assignee
Toray Industries
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toray Industries filed Critical Toray Industries
Priority to TW95127576A priority Critical patent/TWI400142B/en
Publication of TW200806430A publication Critical patent/TW200806430A/en
Application granted granted Critical
Publication of TWI400142B publication Critical patent/TWI400142B/en

Links

Landscapes

  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Polymerisation Methods In General (AREA)

Description

相互侵入高分子網目構造體及研磨墊與其製法Mutual invasion of polymer mesh structure and polishing pad and its preparation method

本發明係有關於一種相互侵入高分子網目構造體之製造方法。又,本發明係有關於一種研磨墊與其製造方法。特別是有關於一種研磨墊,用以平坦化形成在矽等半導體基板上之絕緣層表面或金屬配線表面。The present invention relates to a method of producing a mutually invading polymer mesh structure. Further, the present invention relates to a polishing pad and a method of manufacturing the same. In particular, there is a polishing pad for planarizing an insulating layer surface or a metal wiring surface formed on a semiconductor substrate such as germanium.

在專利文獻1揭示一種研磨墊,係由聚胺甲酸酯與乙烯化合物聚合而成的聚合物所構成。又,在專利文獻2揭示一種研磨墊之製造方法,係包含將高分子成形體浸漬在含有聚合用單體之溶液後,使該單體產生聚合反應的製程之製造方法。Patent Document 1 discloses a polishing pad comprising a polymer obtained by polymerizing a polyurethane and a vinyl compound. Further, Patent Document 2 discloses a method for producing a polishing pad, which comprises a process for immersing a polymer molded body in a solution containing a polymerization monomer and then subjecting the monomer to a polymerization reaction.

但是,以往的研磨墊,因為墊內及墊間的特性偏差大,研磨時之研磨速度的面內均勻性不充分。又,因為研磨墊的強度低,會有墊的磨耗快、研磨時墊的耐用期限短之問題。However, in the conventional polishing pad, since the variation in characteristics between the pad and the pad is large, the in-plane uniformity of the polishing rate at the time of polishing is insufficient. Moreover, since the strength of the polishing pad is low, there is a problem that the pad is worn quickly and the durability of the pad is short during polishing.

而且,該等研磨墊在製造時,會有將單體浸漬在高分子成形體之浸漬速度變慢、製造所需時間變長之問題。為了避免如此的黏度上升,必須設定較低的浸漬溫度,由於低溫浸漬,必須長時間浸漬。而且,由於在聚合用單體中添加有機溶劑,雖然即使黏度上升浸漬速度亦不會大幅度地下降,但是,聚合結束後必須有除去不需要的有機溶劑之製程。Further, in the production of these polishing pads, there is a problem that the immersion speed of immersing the monomer in the polymer molded body is slow, and the time required for production becomes long. In order to avoid such an increase in viscosity, it is necessary to set a lower impregnation temperature, which must be impregnated for a long time due to low temperature impregnation. Further, since the organic solvent is added to the monomer for polymerization, the immersion rate does not decrease drastically even if the viscosity is increased. However, after the completion of the polymerization, a process for removing an unnecessary organic solvent is required.

專利文獻1:WO00/122621號專利文獻2:特開2000-218551號公報Patent Document 1: WO00/122621 Patent Document 2: JP-A-2000-218551

本發明之目的係提供一種均勻性特性優良、且製造效率高之相互侵入高分子網目構造體及其製造方法。又,本發明之目的係提供一種研磨墊與其製造方法,該研磨墊在研磨時之研磨速度的面內均勻性高、能夠在短時間消除段差而具有良好的平坦化特性,能夠減少研磨墊之間之研磨特性差異,改良研磨時之耐用期限、且製造效率高。An object of the present invention is to provide a mutually invading polymer mesh structure having excellent uniformity characteristics and high production efficiency, and a method for producing the same. Further, an object of the present invention is to provide a polishing pad having a high in-plane uniformity of polishing rate during polishing, capable of eliminating step differences in a short period of time, and having good planarization characteristics, and capable of reducing polishing pad The difference in the polishing characteristics between the two, the durability of the polishing is improved, and the manufacturing efficiency is high.

為了解決上述課題,本發明之構成如下。In order to solve the above problems, the constitution of the present invention is as follows.

(1)一種相互侵入高分子網目構造體之製造方法,係包含浸漬製程及聚合製程之相互侵入高分子網目構造體之製造方法,該浸漬製程係將含有乙烯性不飽和化合物及自由基聚合引發劑之自由基聚合性組成物浸漬高分子成形體;而該聚合製程係在該浸漬有該自由基聚合性組成物之高分子成形體的膨脹狀態下,使該乙烯性不飽和化合物聚合之製程,其中在使自由基聚合性組成物浸漬高分子成形體之製程前,在該自由基聚合性組成物及/或該高分子成形體中添加鏈轉移劑及/或自由基聚合抑制劑。(1) A method for producing a mutually invading polymer mesh structure, comprising a method for producing a mutually invading polymer mesh structure comprising an immersion process and a polymerization process, the dipping process comprising an ethylenically unsaturated compound and a radical polymerization initiation reaction The radically polymerizable composition of the agent is impregnated with the polymer molded body; and the polymerization process is a process of polymerizing the ethylenically unsaturated compound in an expanded state of the polymer molded body impregnated with the radically polymerizable composition. A chain transfer agent and/or a radical polymerization inhibitor are added to the radical polymerizable composition and/or the polymer molded body before the process of impregnating the polymerizable molded body with the radical polymerizable composition.

(2)一種研磨墊之製造方法,係含有使用如(1)之相互侵入高分子網目構造體的方法所得到之相互侵入高分子網目構造體來製造研磨墊之製程。(2) A method for producing a polishing pad comprising a process of producing a polishing pad by mutually invading a polymer mesh structure obtained by a method of invading a polymer mesh structure as in (1).

(3)一種研磨墊,係由含有高分子成形體及乙烯性不飽和化合物的聚合物之相互侵入高分子網目構造體所構成,係厚度1毫米以上、直徑300毫米以上的研磨墊,其中相對於高分子成形體與乙烯性不飽和化合物聚合物的合計重量,使高分子成形體的平均重量比為X(%)時,在研磨墊的任意位置之高分子成形體的重量比係在X±3(%)的範圍內。(3) A polishing pad comprising a polymer in which a polymer molded body and an ethylenically unsaturated compound are mutually invaded into a polymer mesh structure, and is a polishing pad having a thickness of 1 mm or more and a diameter of 300 mm or more. When the average weight ratio of the polymer molded article is X (%) in the total weight of the polymer molded article and the ethylenically unsaturated compound polymer, the weight ratio of the polymer molded article at any position of the polishing pad is X. Within the range of ±3 (%).

依據本發明之相互侵入高分子網目構造體之製造方法,能夠得到一種均勻性特性優良、且製造效率高之相互侵入高分子網目構造體。According to the method for producing a mutually invading polymer mesh structure of the present invention, it is possible to obtain a mutually invading polymer mesh structure having excellent uniformity characteristics and high production efficiency.

又,依據本發明之研磨墊之製造方法,能夠得到一種研磨墊,在研磨時之研磨速度的面內均勻性高、能夠在短時間消除段差而具有平坦化特性優良,能夠減少研磨墊之間之研磨特性差異,改善研磨時之耐用期限、且製造效率高。Moreover, according to the method for producing a polishing pad of the present invention, it is possible to obtain a polishing pad which has high in-plane uniformity of polishing rate during polishing, can eliminate stepping in a short time, and has excellent flattening characteristics, and can reduce between polishing pads. The difference in the polishing characteristics improves the durability of the polishing and the manufacturing efficiency is high.

在本發明,相互侵入高分子網目構造體係指在由複數高分子所構成的高分子混合系,該由複數高分子所構成的高分子網目,高分子具有相互侵入之結構。又,亦可以是異種高分子之相互形成連續相的結構係藉由形成交聯點來加以安定化之結構。In the present invention, the mutual intrusion into the polymer network structure system means a polymer mixture system composed of a plurality of polymers, and the polymer mesh composed of the plurality of polymers has a structure in which the polymers invade each other. Further, the structure in which the heterogeneous polymers form a continuous phase with each other may be stabilized by forming a crosslinking point.

本發明所稱相互侵入高分子網目構造體,可以藉由將形成他種高分子之乙烯性不飽和化合物浸漬一部分由高分子所構成的高分子成形體,藉由使該乙烯性不飽和化合物聚合而得到。本發明之研磨墊係由相互侵入高分子網目構造體所構成。In the present invention, the mutually invading polymer network structure can be obtained by immersing a part of a polymer molded body composed of a polymer with an ethylenically unsaturated compound forming another polymer, and polymerizing the ethylenically unsaturated compound. And get it. The polishing pad of the present invention is composed of mutually invading a polymer mesh structure.

在本發明,鏈轉移劑係指在自由基聚合反應時,與成長自由基反應而停止聚合物鏈長度的增加,產生具有再引發能力之低分子自由基之化合物。In the present invention, a chain transfer agent refers to a compound which reacts with a growth radical to stop an increase in the length of a polymer chain during radical polymerization, and which produces a low molecular radical having reinitiation ability.

鏈轉移劑之例子,可舉出的有正丁基硫醇、異丁基硫醇、正辛基硫醇、正十二基硫醇、第二丁基硫醇、第二-十二基硫醇、第三-丁基硫醇等烷基硫醇、苯基硫醇、甲苯硫酚、4-第三丁基-鄰甲苯硫酚等芳香硫醇、巰乙酸2-乙基己酯、巰乙酸乙酯等巰乙酸乙酯、乙二硫醇等碳數3~18之硫醇、α-甲基苯乙烯二聚物、甲苯、乙苯等芳香族烴系鏈轉移劑、四氯化碳等。在此,烷基硫醇可以是第一級、第二級及第三級中任一種,又,亦可以具有取代烷基。此等可單獨使用或組合2種類以上使用。其中,以使用芳香烴系鏈轉移劑及具有碳數4~12的烷基之硫醇為佳。具體上,可舉出的有α-甲基苯乙烯二聚物或甲苯等芳香烴系鏈轉移劑、第三-丁基硫醇、正丁基硫醇、正辛基硫醇、正十二基硫醇等碳數4~12的烷基硫醇。Examples of the chain transfer agent include n-butyl mercaptan, isobutyl mercaptan, n-octyl mercaptan, n-dodecyl mercaptan, second butyl mercaptan, and second-dodecyl sulfur. Alkenyl mercaptan such as alcohol, tri-butyl mercaptan, phenyl mercaptan, toluene thiol, 4-tert-butyl-o-tolylthiophenol, 2-ethylhexyl acetate, hydrazine Ethyl acetate, such as ethyl acetate, ethanedithiol, carbonic acid such as 3 to 18, α-methylstyrene dimer, aromatic hydrocarbon chain transfer agent such as toluene or ethylbenzene, carbon tetrachloride Wait. Here, the alkyl mercaptan may be any of the first stage, the second stage, and the third stage, and may have a substituted alkyl group. These may be used alone or in combination of two or more types. Among them, an aromatic hydrocarbon chain transfer agent and a thiol having an alkyl group having 4 to 12 carbon atoms are preferred. Specific examples thereof include an α-methylstyrene dimer or an aromatic hydrocarbon chain transfer agent such as toluene, a third-butyl mercaptan, n-butyl mercaptan, n-octyl mercaptan, and a positive twelve. An alkylthiol having 4 to 12 carbon atoms such as a thiol.

在本發明,相對於100重量%乙烯性不飽和化合物,鏈轉移劑之使用量以0.01~20重量%為佳,以0.01~5重量%為更佳,以0.05~3重量%為特佳。使用量比0.01重量%少時,鏈轉移劑的效果變低。又,比5重量%多時,所得到的聚合物之強度、彈性模數等機械特性降低。In the present invention, the chain transfer agent is preferably used in an amount of 0.01 to 20% by weight, more preferably 0.01 to 5% by weight, even more preferably 0.05 to 3% by weight based on 100% by weight of the ethylenically unsaturated compound. When the amount used is less than 0.01% by weight, the effect of the chain transfer agent becomes low. Moreover, when it is more than 5% by weight, mechanical properties such as strength and modulus of elasticity of the obtained polymer are lowered.

在本發明,自由基聚合抑制劑係與自由基聚合反應系統內的自由基具有高反應性之化合物,與自由基反應產生鈍性生成物之物。自由基聚合抑制劑以具有芳香環及至少1個以上羥基之化合物為佳。In the present invention, the radical polymerization inhibitor is a compound having high reactivity with a radical in a radical polymerization system, and reacts with a radical to produce a passive product. The radical polymerization inhibitor is preferably a compound having an aromatic ring and at least one or more hydroxyl groups.

自由基聚合引發劑之例子可舉出的有氫醌、氫醌單甲基醚、托帕酚A(topanol A)、兒茶酚、第三丁基兒茶酚、2,6-二-第三丁基-4-甲基苯酚、啡噻、α-生育酚、新戊四醇-肆[3-(3,5-二-第三丁基-4-羥基苯基)丙酸酯]、N,N’-六亞甲基雙(3,5-二-第三丁基-4-羥基-氫化肉桂醯胺、2-(3,5-二-第三丁基-4-羥基苄基)-2-正丁基丙二酸雙(1,2,2,6,6-五甲基-4-哌啶基)等。可從此等化合物中選擇1種或2種以上化合物使用。Examples of the radical polymerization initiator include hydroquinone, hydroquinone monomethyl ether, topanol A, catechol, tert-butylcatechol, 2,6-di- Tributyl-4-methylphenol, thiophene , α-tocopherol, pentaerythritol-indole [3-(3,5-di-t-butyl-4-hydroxyphenyl)propionate], N,N'-hexamethylene double (3 , 5-di-t-butyl-4-hydroxy-hydrocinnamylamine, 2-(3,5-di-t-butyl-4-hydroxybenzyl)-2-n-butylmalonic acid bis ( 1,2,2,6,6-pentamethyl-4-piperidinyl), etc. One or two or more compounds can be selected from these compounds.

在本發明,相對於100重量%乙烯性不飽和化合物,自由基聚合引發劑的使用量以0.001~0.5重量%為佳,以0.001~0.3重量%為更佳,在本發明,乙烯性不飽和化合物係指具有自由基聚合性碳-碳雙鍵之化合物。具體上,可舉出的有甲基丙烯酸甲酯、甲基丙烯酸乙酯、甲基丙烯酸正丙酯、甲基丙烯酸異丙酯、甲基丙烯酸正丁酯、甲基丙烯酸異丁酯、甲基丙烯酸第三丁酯、甲基丙烯酸2-乙基己酯、甲基丙烯酸異癸酯、甲基丙烯酸正月桂酯、甲基丙烯酸十三酯、甲基丙烯酸正硬脂酯、甲基丙烯酸2-羥基乙酯、甲基丙烯酸2-羥基丙酯、甲基丙烯酸2-羥基丁酯、甲基丙烯酸二甲基胺基甲酯、甲基丙烯酸二甲基胺基乙酯、甲基丙烯酸二乙基胺基乙酯、甲基丙烯酸、甲基丙烯酸環氧丙酯、甲基丙烯酸四氫糠酯、甲基丙烯酸環己酯、甲基丙烯酸苄酯、甲基丙烯酸2-苯氧基乙酯、甲基丙烯酸異莰酯、聚乙二醇單甲基丙烯酸酯、聚丙二醇單甲基丙烯酸酯等甲基丙烯酸酯、丙烯酸甲酯、丙烯酸異戊酯、丙烯酸月桂酯、丙烯酸硬脂酯、丙烯酸苯氧基乙酯、丙烯酸四氫糠酯、丙烯酸異莰酯、丙烯酸2-羥基乙酯、丙烯酸2-羥基丙酯等丙烯酸酯、丙烯腈、甲基丙烯腈、苯乙烯、α-甲基苯乙烯、羥基苯乙烯、α-甲基苯乙烯二聚物等單官能性乙烯性不飽和化合物、乙二醇單甲基丙烯酸酯、三羥甲基丙烷三甲基丙烯酸酯、新戊二醇二丙烯酸酯、3-甲基-1,5-新戊二醇二丙烯酸酯、1,6-丁二醇二丙烯酸酯、2-丁基-2-乙基-1,3-丙二醇二丙烯酸酯、1,9-壬烷二丙烯酸酯、二羥甲基三環癸烷二丙烯酸酯、三羥甲基丙烷三丙烯酸酯、新戊四醇四丙烯酸酯等多官能性乙烯性不飽和化合物等。此等乙烯性不飽和化合物可使用1種或2種以上。In the present invention, the amount of the radical polymerization initiator used is preferably 0.001 to 0.5% by weight, more preferably 0.001 to 0.3% by weight, based on 100% by weight of the ethylenically unsaturated compound, and in the present invention, ethylenic unsaturation The compound means a compound having a radical polymerizable carbon-carbon double bond. Specific examples thereof include methyl methacrylate, ethyl methacrylate, n-propyl methacrylate, isopropyl methacrylate, n-butyl methacrylate, isobutyl methacrylate, and methyl group. Tert-butyl acrylate, 2-ethylhexyl methacrylate, isodecyl methacrylate, n-lauryl methacrylate, tridecyl methacrylate, n-stearyl methacrylate, 2-methacrylic acid 2- Hydroxyethyl ester, 2-hydroxypropyl methacrylate, 2-hydroxybutyl methacrylate, dimethylaminomethyl methacrylate, dimethylaminoethyl methacrylate, diethyl methacrylate Aminoethyl ester, methacrylic acid, glycidyl methacrylate, tetrahydrofurfuryl methacrylate, cyclohexyl methacrylate, benzyl methacrylate, 2-phenoxyethyl methacrylate, A Methacrylates such as isodecyl acrylate, polyethylene glycol monomethacrylate, polypropylene glycol monomethacrylate, methyl acrylate, isoamyl acrylate, lauryl acrylate, stearyl acrylate, phenoxy acrylate Ethyl ethyl ester, tetrahydrofurfuryl acrylate, Isodecyl enoate, 2-hydroxyethyl acrylate, 2-hydroxypropyl acrylate, acrylate, acrylonitrile, methacrylonitrile, styrene, α-methylstyrene, hydroxystyrene, α-methylbenzene Monofunctional ethylenically unsaturated compound such as ethylene dimer, ethylene glycol monomethacrylate, trimethylolpropane trimethacrylate, neopentyl glycol diacrylate, 3-methyl-1,5 - Neopentyl glycol diacrylate, 1,6-butanediol diacrylate, 2-butyl-2-ethyl-1,3-propanediol diacrylate, 1,9-decane diacrylate, two A polyfunctional ethylenically unsaturated compound such as hydroxymethyl tricyclodecane diacrylate, trimethylolpropane triacrylate or pentaerythritol tetraacrylate. These ethylenically unsaturated compounds can be used alone or in combination of two or more.

此等乙烯性不飽和化合物之中,選自甲基丙烯酸甲酯、甲基丙烯酸乙酯、甲基丙烯酸異丙酯及甲基丙烯酸第三丁酯之化合物,從容易形成獨立氣泡、單體的浸漬性良好、聚合硬化容易、及所得到之相互侵入高分子網目構造體的硬度高、平坦化特性良好而言,乃是較佳。Among these ethylenically unsaturated compounds, a compound selected from the group consisting of methyl methacrylate, ethyl methacrylate, isopropyl methacrylate and butyl methacrylate is easy to form independent bubbles and monomers. It is preferable that the impregnation property is good, the polymerization hardening is easy, and the obtained mutual intrusion into the polymer network structure has high hardness and good flattening properties.

本發明之自由基聚合引發劑係指能夠藉由加熱、光照射、放射線照等分解產生自由基之化合物。如此的自由基聚合引發劑可舉出的有偶氮化合物及過氧化物等。具體上,可舉出的有2,2'-偶氮雙異丁烯腈、2,2’-偶氮雙(2-甲基丁烯腈)、2,2’-偶氮雙(2,4-二甲基戊腈)、4,4’-偶氮雙(4-氰基戊酸)、1,1’-偶氮雙(環己烷-1-腈)、2,2’-偶氮雙(4-甲氧基-2,4-二甲基戊腈)等偶氮系聚合引發劑、氫過氧化枯烯、第三丁基過氧化氫、過氧化二枯烯、過氧化二-第三丁烷、第三丁基過氧-2-乙基丁酸酯、第三丁基過氧異丁酸酯、第三丁基過氧三甲基乙酸酯、第三丁基過氧苯甲酯酯、第三丁基過氧乙酸酯、二異丙基過氧二碳酸酯、二-第二丁基過氧二碳酸酯、過氧化苯甲醯、過氧化乙醯、過氧化月桂醯等過氧化物系聚合引發劑。相對於100重量%乙烯性不飽和化合物,自由基聚合抑制劑的添加量以0.01~5重量%為佳,以0.05~3重量%為更佳。The radical polymerization initiator of the present invention means a compound which can generate a radical by decomposition by heating, light irradiation, radiation or the like. Examples of such a radical polymerization initiator include an azo compound, a peroxide, and the like. Specifically, there are 2,2'-azobisisobutenenitrile, 2,2'-azobis(2-methylbutenenitrile), and 2,2'-azobis (2,4- Dimethylvaleronitrile), 4,4'-azobis(4-cyanovaleric acid), 1,1'-azobis(cyclohexane-1-carbonitrile), 2,2'-azobis An azo polymerization initiator such as (4-methoxy-2,4-dimethylvaleronitrile), cumene hydroperoxide, t-butyl hydroperoxide, dicumyl peroxide, and di-peroxide Tributane, tert-butylperoxy-2-ethylbutyrate, tert-butylperoxyisobutyrate, tert-butylperoxytrimethylacetate, tert-butylperoxybenzene Methyl ester, tert-butyl peroxyacetate, diisopropyl peroxydicarbonate, di-second butyl peroxydicarbonate, benzammonium peroxide, ethoxylated ruthenium, peroxidized laurel A peroxide-based polymerization initiator such as hydrazine. The radical polymerization inhibitor is preferably added in an amount of 0.01 to 5% by weight, more preferably 0.05 to 3% by weight, based on 100% by weight of the ethylenically unsaturated compound.

在本發明,有機溶劑係在乙烯性不飽和化合物聚合時實質上不會反應之化合物,在常溫為液體之有機化合物。具體上可使用己烷、二甲基甲醯胺、二甲基亞碸、乙醇、甲醇等。實質上未含有有機溶劑係指在自由基聚合性組成物,相對於100重量%乙烯性不飽和化合物,有機溶劑小於1重量%。已知四氯化碳、甲苯、乙苯等通常作為有機溶劑,但是因為已知此等化合物具有作為鏈轉移劑的效果,在此並非相當於有機溶劑。In the present invention, the organic solvent is a compound which does not substantially react when the ethylenically unsaturated compound is polymerized, and is an organic compound which is liquid at normal temperature. Specifically, hexane, dimethylformamide, dimethyl hydrazine, ethanol, methanol or the like can be used. The fact that the organic solvent is not substantially contained means that the radical polymerizable composition has an organic solvent content of less than 1% by weight based on 100% by weight of the ethylenically unsaturated compound. Carbon tetrachloride, toluene, ethylbenzene and the like are generally known as organic solvents, but since such compounds are known to have an effect as a chain transfer agent, they are not equivalent to organic solvents.

在本發明,自由基聚合性組成物係指有上述乙烯性不飽和化合物及上述自由基聚合引發劑之組成物。而且,亦可在自由基聚合性組成物中添加抗氧化劑、抗老化劑、填料、著色劑、防黴劑、抗菌劑、難燃劑、紫外線吸收劑等。相對於100重量%乙烯性不飽和化合物,上述化合物的添加量,合計以使用不超過3重量%的範圍為佳。In the present invention, the radically polymerizable composition means a composition comprising the above ethylenically unsaturated compound and the above-mentioned radical polymerization initiator. Further, an antioxidant, an anti-aging agent, a filler, a coloring agent, an antifungal agent, an antibacterial agent, a flame retardant, an ultraviolet absorber, or the like may be added to the radically polymerizable composition. The amount of the above compound to be added is preferably in the range of not more than 3% by weight based on 100% by weight of the ethylenically unsaturated compound.

從不必有除去有機溶劑的製程之經濟上的觀點,自由基聚合性組成物以實質上未含有有機溶劑之組成物為佳。The radical polymerizable composition is preferably a composition substantially free of an organic solvent from the viewpoint of the economical process of eliminating the need to remove the organic solvent.

在本發明,高分子成形體係指在常溫為固體之高分子物質。成形體可以是內部結實、亦可以是中空、亦可以是發泡體。其特性沒有特別限定,必須是能夠藉由浸漬於自由基聚合性組成物,將該組成物浸漬收容在成形體中。因此,必須是由與自由基聚合性組成物具有親和性的材質所構成,又,高分子成形體必須具有能夠膨脹程度之柔軟性。雖然亦取決於自由基聚合性組成物的密度或浸漬量,浸漬後之高分子成形體的體積膨脹成原來體積之約1.03~5倍左右,多半是膨脹至約1.03~3倍左右。In the present invention, the polymer molding system refers to a polymer material which is solid at normal temperature. The shaped body may be solid inside, hollow, or foamed. The characteristics are not particularly limited, and it is necessary to immerse the composition in a molded body by immersing in a radically polymerizable composition. Therefore, it must be composed of a material having affinity with the radical polymerizable composition, and the polymer molded body must have flexibility to be expanded. Although depending on the density or impregnation amount of the radical polymerizable composition, the volume of the polymer molded body after immersion is expanded to about 1.03 to 5 times the original volume, and most of it is expanded to about 1.03 to 3 times.

如此的高分子成形體以由具有聚乙二醇鏈、聚丙二醇鏈或是聚伸丁二醇鏈之高分子所構成之物為佳。具體上可舉出的有聚酯或聚胺甲酸酯。Such a polymer molded body is preferably one composed of a polymer having a polyethylene glycol chain, a polypropylene glycol chain or a polybutadiene glycol chain. Specifically, polyester or polyurethane is mentioned.

高分子成形體的形態以含有平均氣泡直徑10~230微米的獨立氣泡之發泡體為佳,以含有平均氣泡直徑10~120微米的獨立氣泡之發泡體為更佳,以含有平均氣泡直徑20~60微米的獨立氣泡為特佳。藉由使用掃描型電子顯微鏡(SEM)以倍率200倍高分子成形體的表面或切面,使用畫像處理裝置解析該畫像,來計測畫像中全部的氣泡直徑,以其數量平均之平均值作為平均氣泡直徑。The form of the polymer molded body is preferably a foam containing independent cells having an average cell diameter of 10 to 230 μm, and a foam having independent cells having an average cell diameter of 10 to 120 μm is more preferable to contain an average cell diameter. Separate bubbles of 20 to 60 microns are particularly good. By using a scanning electron microscope (SEM) at a magnification of 200 times the surface or the cut surface of the polymer molded body, the image was analyzed by an image processing apparatus, and the bubble diameter of all the images was measured, and the average value of the average number of bubbles was used as an average bubble. diameter.

又,高分子成形體的表觀密度以0.1~1.2克/立方公分為佳,以0.5~1.0克/立方公分為更佳。表觀密度可依據日本工業規格JIS K 7112之方法來測定。而且,被收容在高分子成形體之自由基聚合性組成物,以不進入高分子成形體中的氣泡中、在高分子成形體的膨脹狀態下,於乙烯性不飽和化合物聚合後,高分子成形體的氣泡亦照原樣殘留為佳。結果,所得到的研磨墊之表觀密度以0.2~1.1克/立方公分為佳,以0.6~1.1克/立方公分為更佳。Further, the apparent density of the polymer molded body is preferably 0.1 to 1.2 g/cm 3 and more preferably 0.5 to 1.0 g/cm 3 . The apparent density can be measured in accordance with the method of Japanese Industrial Standard JIS K 7112. In addition, the radical polymerizable composition contained in the polymer molded body is polymerized in the bubbles in the polymer molded body, and in the expanded state of the polymer molded body, after the polymerization of the ethylenically unsaturated compound, the polymer The bubbles of the molded body are preferably left as they are. As a result, the apparent density of the obtained polishing pad is preferably 0.2 to 1.1 g/cm 3 and more preferably 0.6 to 1.1 g/cm 3 .

本發明之高分子成形體以由聚胺甲酸酯構成為更佳,雙液混合多元醇及聚異氰酸酯所得到的聚胺甲酸酯成形體為特佳。在此,多元醇係指具有2個以上羥基之化合物。可舉出的有例如選自聚醚多元醇、聚酯多元醇、聚碳酸酯多元醇、聚己內酯多元醇、乙二醇、丙二醇、甘油等其中1種或2種以上的混合物。The polymer molded article of the present invention is particularly preferably a polyurethane molded article obtained by further comprising a polyurethane, a two-liquid mixed polyol and a polyisocyanate. Here, the polyol means a compound having two or more hydroxyl groups. For example, one or a mixture of two or more selected from the group consisting of polyether polyols, polyester polyols, polycarbonate polyols, polycaprolactone polyols, ethylene glycol, propylene glycol, and glycerin may be mentioned.

又,聚異酸酯可舉出的有甲苯聚異酸酯(TDI)、二苯基甲烷二聚異酸酯(MDI)、聚合MDI、萘二異氰酸酯等芳香族異氰酸酯、伸丁基二異氰酸酯、伸己基二異氰酸酯等脂肪族二異氰酸酯、異佛爾酮二異氰酸酯、氫化TDI、氫化MDI等脂環族二異氰酸酯等。此等可選自此等異氰酸酯中1種或2種以上混合物使用。Further, examples of the polyisophthalate include aromatic isocyanate such as toluene polyisoester (TDI), diphenylmethane dipolyisoester (MDI), polymeric MDI, and naphthalene diisocyanate, and butyl diisocyanate. An aliphatic diisocyanate such as a hexyl diisocyanate, an isophorone diisocyanate, a hydrogenated TDI, an alicyclic diisocyanate such as hydrogenated MDI, or the like. These may be selected from one or a mixture of two or more of these isocyanates.

調製高分子成形體時,除了多元醇及聚異氰酸酯以外,亦可含有交聯劑、鏈延長劑、氣泡穩定劑、發泡劑、樹脂化觸媒、氣泡化觸媒、抗氧化劑、抗老化劑、填料、可塑劑、著色劑、防黴劑、抗菌劑、難燃劑、紫外線吸收劑。In the preparation of the polymer molded body, a crosslinking agent, a chain extender, a bubble stabilizer, a foaming agent, a resinized catalyst, a bubble-forming catalyst, an antioxidant, and an anti-aging agent may be contained in addition to the polyol and the polyisocyanate. , fillers, plasticizers, colorants, mold inhibitors, antibacterial agents, flame retardants, UV absorbers.

調製高分子成形體之方法沒有特別限定,可以使用注射成形、反應成形等方法。特別是調製聚胺甲酸酯成形體時以使用在混合頭內使原料之間相撞而瞬間混合之高壓注入機、或是使用攪拌葉等進行機械式混合供給至混合頭的各原料之低壓注入機等,藉由塑模成形或厚塊成形等進行成形為佳。The method of preparing the polymer molded body is not particularly limited, and methods such as injection molding and reaction molding can be used. In particular, when a polyurethane molded article is prepared, a high-pressure injection machine which instantaneously mixes the raw materials in a mixing head or a low pressure of each raw material which is mechanically mixed and supplied to the mixing head by using a stirring blade or the like is used. It is preferable that the injection machine or the like is formed by molding or thick molding.

接著,說明相互侵入高分子網目構造體之製造方法。相互侵入高分子網目構造體可經由浸漬製程及聚合製程製造,該浸漬製程係將含有前述乙烯性不飽和化合物及自由基聚合引發劑之自由基聚合性組成物浸漬高分子成形體;而該聚合製程係在該浸漬有該自由基聚合性組成物之高分子成形體的膨脹狀態下,使該乙烯性不飽和化合物聚合之製程。在此,本發明之相互侵入高分子網目構造體的製造方法係在使自由基聚合性組成物浸漬高分子成形體之製程前,在該自由基聚合性組成物及/或該高分子成形體中添加該鏈轉移劑及/或該自由基聚合抑制劑。Next, a method of manufacturing the mutually invading polymer mesh structure will be described. The mutually invading polymer mesh structure can be produced by an immersion process and a polymerization process, wherein the immersion process is performed by impregnating a polymer molded body with a radical polymerizable composition containing the ethylenically unsaturated compound and a radical polymerization initiator; The process is a process in which the ethylenically unsaturated compound is polymerized in an expanded state of the polymer molded body impregnated with the radical polymerizable composition. Here, the method for producing the mutually invading polymer mesh structure of the present invention is the radical polymerizable composition and/or the polymer molded body before the process of impregnating the polymer molded body with the radical polymerizable composition. The chain transfer agent and/or the radical polymerization inhibitor are added.

亦即,本發明在將自由基聚合性組成物浸漬高分子成形體中之製程及在聚合乙烯性不飽和化合物之製程,其特徵係使系統內存在有鏈轉移劑及/或自由基聚合抑制劑。藉由該方法,所得到的相互侵入高分子網目構造體具有優良的拉伸強度、拉伸延伸性等械機特性均勻性。而且該相互侵入高分子網目構造體作為研磨墊使用時,因為在研磨時之研磨速度的面內均勻性高、平坦化特性優良、能夠改善研磨墊的耐用期限、研磨墊之間的特性差異小,所以CMP研磨製程穩定。That is, the process of impregnating a radical polymerizable composition into a polymer molded body and the process of polymerizing an ethylenically unsaturated compound of the present invention are characterized in that a chain transfer agent and/or a radical polymerization inhibition are present in the system. Agent. According to this method, the obtained mutually invading polymer mesh structure has excellent uniformity of mechanical properties such as tensile strength and tensile elongation. Further, when the mutually invading polymer mesh structure is used as a polishing pad, the in-plane uniformity of the polishing rate at the time of polishing is high, the planarization property is excellent, the durability of the polishing pad can be improved, and the difference in characteristics between the polishing pads is small. Therefore, the CMP polishing process is stable.

雖然其理由未必明確,推測係添加鏈轉移劑來製造時,因為聚合反應時未出現激烈的發熱,在反應系統內的溫度,經時性大致一定,聚合反應的進行穩定,所生成的相互侵入高分子網目構造體的化學組成或特性均勻,因此由該相互侵入高分子網目構造體所製成的研磨墊,在研磨墊的面內及在複數研磨墊之間顯現穩定的特性。鏈轉移劑在製造相互侵入高分子網目構造體時使厚度方向的化學組成及特性均勻化特別有效。因此,在將相互侵入高分子網目構造體切片製成研磨墊時,使複數研磨墊之間的化學組成及特性均勻化特別有效。Although the reason is not necessarily clear, it is presumed that when a chain transfer agent is added for production, since there is no intense heat generation during the polymerization reaction, the temperature in the reaction system is substantially constant over time, the polymerization reaction proceeds stably, and the generated mutual intrusion occurs. Since the chemical composition or characteristics of the polymer mesh structure are uniform, the polishing pad produced by invading the polymer mesh structure exhibits stable characteristics in the surface of the polishing pad and between the plurality of polishing pads. The chain transfer agent is particularly effective in homogenizing the chemical composition and characteristics in the thickness direction when invading the polymer mesh structure. Therefore, it is particularly effective to homogenize the chemical composition and characteristics between the plurality of polishing pads when the polyethylene mesh structure is infiltrated into each other to form a polishing pad.

又,添加自由基聚合引發劑來製造時,在聚合反應的開始時刻,反應系統整體統一,從聚合反應的開始至結束的過程,反應系統整體大致相同,結果所到的反應硬化物的特性偏差小,能夠得到均勻性高之相互侵入高分子網目構造體或研磨墊。自由基聚合抑制劑在製造相互侵入高分子網目構造體時使面內方向的化學組成或特性均勻化特別有效。Further, when a radical polymerization initiator is added for production, the entire reaction system is unified at the start of the polymerization reaction, and the entire reaction system is substantially the same from the start to the end of the polymerization reaction, and as a result, the characteristic deviation of the reaction cured product is obtained. Small, it is possible to obtain a high-uniformity mutual intrusion into a polymer mesh structure or a polishing pad. The radical polymerization inhibitor is particularly effective in homogenizing the chemical composition or characteristics in the in-plane direction when invading the polymer mesh structure.

又,如前述,自由基聚合引發劑實質上係未含有有機溶劑之組成物,不必有除去有機溶劑之製程,從經濟上的觀點,乃是較佳。但是,以往的製造方法時,在自由基聚合性組成物未含有有機溶劑時,在將自由基聚合性組成物浸漬高分子成形體之途中,因為聚合反應開始、黏度上升,會有浸漬於高分子成形體之速度變慢、製造所需要的時間變長的問題點。在本發明,在將自由基聚合性組成物浸漬於高分子成形體之製程,因為藉由存在有鏈轉移劑及/或自由基聚合抑制劑,能夠防止組成物的黏度上升。藉此,因為能夠使用實質上未含有有機溶劑之自由基聚合性組成物,所以不必除去有機溶劑之製程,能夠縮短製造時間及製程,提高製造效率。Further, as described above, the radical polymerization initiator is substantially a composition which does not contain an organic solvent, and it is not necessary to have a process for removing the organic solvent, and is preferable from the viewpoint of economy. However, in the conventional production method, when the radical polymerizable composition does not contain an organic solvent, the radical polymerization composition is impregnated with high viscosity due to the start of the polymerization reaction and the viscosity increase during the impregnation of the polymer molded article. The speed at which the molecular molded body is slowed down and the time required for manufacturing becomes long. In the present invention, in the process of immersing the radical polymerizable composition in the polymer molded body, the viscosity of the composition can be prevented from increasing by the presence of the chain transfer agent and/or the radical polymerization inhibitor. Thereby, since a radically polymerizable composition which does not substantially contain an organic solvent can be used, the process of removing an organic solvent is unnecessary, and manufacturing time and process can be shortened, and manufacturing efficiency can be improved.

雖然亦可只添加鏈轉移劑及自由基聚合抑制劑其中一方,但是添加兩方時有相乘效果。Although it is also possible to add only one of a chain transfer agent and a radical polymerization inhibitor, there is a synergistic effect when two parties are added.

上述鏈轉移劑及自由基聚合抑制劑可添加在高分子成形體,亦可混合在自由基聚合性組成物中使用。在自由基聚合性組成物及高分子成形體的兩方使用鏈轉移劑及/或自由基聚合抑制劑時,雙方可使用相同的化合物、亦可使用不同的化合物。The chain transfer agent and the radical polymerization inhibitor may be added to the polymer molded body or may be used in a mixture of the radical polymerizable composition. When a chain transfer agent and/or a radical polymerization inhibitor are used for both the radically polymerizable composition and the polymer molded article, the same compound or a different compound may be used.

又,使用自由基聚合抑制劑,為了提高抑制聚合效果之目的,以在氧氣或含有氧氣的氣體存在下進行浸漬自由基聚合性組成物及/或聚合為佳。此時,較佳之自由基聚合抑制劑可舉出的有啡噻、氫醌、氫醌單甲基醚、第三丁基兒茶酚、托帕酚A(topanol A)等。上述含有氧氣的氣體可使用以惰性氣體稀釋空氣、氧及其等而成的氣體,惰性氣體可舉出的有氮、氦、氫等。稀釋時之氧濃度沒有特別限定,以1體積%以上為佳。因為價廉,以使用乾燥空氣、或以氮氣稀釋乾燥空氣而成的氣體作為含有氧氣的氣體為佳。Further, in order to increase the polymerization inhibitory effect, it is preferred to use a radical polymerization inhibitor to impregnate the radically polymerizable composition and/or polymerize in the presence of oxygen or a gas containing oxygen. In this case, a preferred radical polymerization inhibitor may be exemplified by Hydroquinone, hydroquinone monomethyl ether, tert-butylcatechol, topanol A, and the like. As the gas containing oxygen, a gas obtained by diluting air, oxygen, or the like with an inert gas may be used. Examples of the inert gas include nitrogen, helium, hydrogen, and the like. The oxygen concentration at the time of dilution is not particularly limited, and is preferably 1% by volume or more. Since it is inexpensive, it is preferable to use a gas obtained by using dry air or diluting dry air with nitrogen as a gas containing oxygen.

為了具有抑制自由基聚合反應的進行之作用,在反應系統內鏈轉移劑及/或自由基聚合抑制劑以均勻濃度的方式存在為佳。In order to have an effect of suppressing the progress of the radical polymerization reaction, it is preferred that the chain transfer agent and/or the radical polymerization inhibitor are present in a uniform concentration in the reaction system.

使該等鏈轉移劑及/或自由基聚合抑制劑在反應系統內均勻分佈的方法之一,可舉出的有在調製高分子成形體時添加在其原材料中之方法。例如,在調製高分子成形體時,將鏈轉移劑及/或自由基聚合抑制劑混合在聚胺甲酸酯的原材料之多元醇中,藉由反應注射成形法(RIM),藉由使該多元醇與聚異氰酸酯進行反應注射成形,能夠得到鏈轉移劑及/或自由基聚合抑制劑以均勻濃度的方式分佈之聚胺甲酸酯高分子成形體。接著,藉由將自由基聚合性組成物浸漬高高分子成形體、使其聚合,能夠到由聚胺甲酸酯與乙烯性不飽和化合物所構成之化學上均勻組成的相互侵入高分子網目構造體。One of the methods for uniformly distributing the chain transfer agent and/or the radical polymerization inhibitor in the reaction system may be a method of adding a polymer molded body to a raw material thereof. For example, when preparing a polymer molded body, a chain transfer agent and/or a radical polymerization inhibitor are mixed in a polyol of a raw material of a polyurethane, and by a reaction injection molding method (RIM), The polyol and the polyisocyanate are subjected to reaction injection molding, and a polyurethane polymer molded body in which a chain transfer agent and/or a radical polymerization inhibitor are distributed in a uniform concentration can be obtained. Then, by impregnating the high-molecular-weight molded product with a radical polymerizable composition and polymerizing it, it is possible to infiltrate into the polymer network structure which is chemically uniform in composition composed of the polyurethane and the ethylenically unsaturated compound. body.

在調製高分子成形體時混合鏈轉移劑之情況,相對於100重量%高分子成形體,鏈轉移劑的含量以0.01~20重量%為佳,以0.01~5重量%為較佳,以0.05~3重量%為更佳。含量小於0.01重量%時,會有鏈轉移劑的效果無法顯現的情形。又,含量大於20重量%時,會有強度或彈性模數等機械特性降低的情形。In the case of mixing the chain transfer agent in the preparation of the polymer molded article, the content of the chain transfer agent is preferably 0.01 to 20% by weight, more preferably 0.01 to 5% by weight, based on 100% by weight of the polymer molded article. ~3% by weight is more preferred. When the content is less than 0.01% by weight, the effect of the chain transfer agent may not be exhibited. Moreover, when the content is more than 20% by weight, mechanical properties such as strength and modulus of elasticity may be lowered.

高分子成形體中的鏈轉移劑含量,可藉由粉碎高分子成形體,使用氯仿將藉由索克斯累回流萃取器(Soxhlet’ s extractor)所萃取的溶液,藉由氣體層析儀進行定量分析來測定。The content of the chain transfer agent in the polymer molded body can be obtained by pulverizing the polymer molded body, using a solution extracted by a Soxhlet's extractor using chloroform, by a gas chromatograph. Quantitative analysis to determine.

使該等鏈轉移劑及/或自由基聚合抑制劑在反應系統內均勻分佈的另外方法,可舉出的有在自由基聚合性組成物中,添加較低分子量的鏈轉移劑及/或自由基聚合抑制劑之方法。分子量大的鏈轉移劑及/或自由基聚合抑制劑浸漬高分子成形體時之擴散速度較慢,無法均勻地分佈在高分子成形體中。另一方面,較低分子量的鏈轉移劑及/或自由基聚合抑制劑,浸漬高分子成形體時之擴散速度快,能夠以均勻濃度的方式分佈在高分子成形體中。因此,所得到之相互侵入高分子網目構造體在化學上變為均質。此種鏈轉移劑或自由基聚合抑制劑以使用分子量350以下之化合物為佳。分子量350以下之鏈轉移劑可舉出的有α-甲基苯乙烯二聚物、乙苯、甲苯等分子量350以下的芳香族烴、及第三丁基硫醇、正丁基硫醇、正辛基硫醇、正十二基硫醇等具有碳數4~12的烷基之硫醇。又,分子量350以下之自由基聚合抑制劑可舉出的有氫醌、氫醌單甲基醚、兒苯酚、第三丁基兒苯酚、第三丁基焦兒苯酚、2,6-二-第三丁基-4-甲基苯酚、2-第三丁基-4,6-二甲基苯酚等。Another method for uniformly distributing the chain transfer agent and/or the radical polymerization inhibitor in the reaction system is to add a lower molecular weight chain transfer agent and/or free in the radically polymerizable composition. A method of polymerizing an inhibitor. When the chain transfer agent having a large molecular weight and/or the radical polymerization inhibitor impregnate the polymer molded body, the diffusion rate is slow and it is not uniformly distributed in the polymer molded body. On the other hand, the lower molecular weight chain transfer agent and/or the radical polymerization inhibitor have a high diffusion rate when the polymer molded body is impregnated, and can be distributed in a polymer molded body at a uniform concentration. Therefore, the obtained mutually invading polymer network structure is chemically homogeneous. Such a chain transfer agent or a radical polymerization inhibitor is preferably a compound having a molecular weight of 350 or less. Examples of the chain transfer agent having a molecular weight of 350 or less include an α-methylstyrene dimer, an aromatic hydrocarbon having a molecular weight of 350 or less, such as ethylbenzene or toluene, and a third butyl thiol or n-butyl thiol. a mercaptan having an alkyl group having 4 to 12 carbon atoms such as octyl mercaptan or n-dodecyl mercaptan. Further, examples of the radical polymerization inhibitor having a molecular weight of 350 or less include hydroquinone, hydroquinone monomethyl ether, phenol, tert-butyl phenol, tert-butyl pyrophenol, 2,6-di- Third butyl-4-methylphenol, 2-tert-butyl-4,6-dimethylphenol, and the like.

在相互侵入高分子網目構造體,由高分子成形體與乙烯性不飽和化合物所聚合而成的聚合體之重量比以100/5~100/300為佳,以100/50~100/200為更佳。前述重量比小於100/5時,與只有高分子成形體時的特性變化不多。前述重量比大於100/300時,因為將自由基聚合性組成物浸漬高分子成形體時所需要的時間增長,會有不佳的情形。When the polymer mesh structure is invaded into each other, the weight ratio of the polymer obtained by polymerizing the polymer molded body and the ethylenically unsaturated compound is preferably 100/5 to 100/300, and 100/50 to 100/200. Better. When the weight ratio is less than 100/5, the change in characteristics when there is only a polymer molded body is small. When the weight ratio is more than 100/300, the time required for impregnating the polymerizable body with the radical polymerizable composition increases, which may be undesirable.

將自由基聚合性組成物浸漬高分子成形體之製程,以在15~60℃的溫度3小時~20天為佳,以3小時~10天為更佳。The process of impregnating the polymerizable body with the radical polymerizable composition is preferably carried out at a temperature of from 15 to 60 ° C for from 3 hours to 20 days, more preferably from 3 hours to 10 days.

使用上述方法所得到的相互侵入高分子網目構造體來製造研磨墊。研磨墊可藉由將相互侵入高分子網目構造體形成規定形狀及規定厚度後,按照必要在表面上形成溝等來製造。The polishing pad was produced by invading the polymer mesh structure obtained by the above method. The polishing pad can be produced by forming a predetermined shape and a predetermined thickness by invading the polymer mesh structure, and then forming a groove or the like on the surface as necessary.

研磨墊的厚度以1毫米以上為佳。又,研磨墊的厚度以5毫米以下為佳。研磨墊的直徑以300毫米以上為佳。又,研磨墊的直徑以2公尺以下為佳。研磨墊的厚度小於1毫米、或直徑小於300毫米時,會有研磨墊的耐用期限縮短之可能性。研磨墊的厚度大於5毫米、或直徑大於2公尺時,會有研磨墊的換貼作業困難、無法均勻地貼在研磨平台上之可能性。The thickness of the polishing pad is preferably 1 mm or more. Further, the thickness of the polishing pad is preferably 5 mm or less. The diameter of the polishing pad is preferably 300 mm or more. Further, the diameter of the polishing pad is preferably 2 meters or less. When the thickness of the polishing pad is less than 1 mm or the diameter is less than 300 mm, there is a possibility that the durability of the polishing pad is shortened. When the thickness of the polishing pad is more than 5 mm or the diameter is more than 2 meters, there is a possibility that the polishing pad is difficult to be replaced and the film cannot be uniformly attached to the polishing table.

如前述,使用本發明之製造方法時,化學組成的偏差較小,能夠得均勻的研磨墊。本發明的研磨墊之一種態樣係由含有高分子成形體及乙烯性不飽和化合物的聚合物之相互侵入高分子網目構造體所構成,係厚度1毫米以上、直徑300毫米以上之研磨墊,其中相對於高分子成形體與乙烯性不飽和化合物聚合物的合計重量,使高分子成形體的平均重量比為X(%)時,在研磨墊的任意位置之高分子成形體的重量比係在X±3(%)的範圍內之研磨墊。亦即,如實施例所述,測定在研磨墊的各位置的組成,求取相對於高分子成形體與乙烯性不飽和化合物聚合物的合計重量之高分子成形體的重量比,以其平均值為X(%)。在此,所測得高分子成形體的重量比中之最小值為X-3(%)以上,最大值為X+3(%)以下。又,在研磨墊的任意位置,乙烯性不飽和化合物聚合物的重量比為(100-X)±3%的範圍。As described above, when the production method of the present invention is used, the variation in chemical composition is small, and a uniform polishing pad can be obtained. One aspect of the polishing pad of the present invention comprises a polymer in which a polymer molded body and an ethylenically unsaturated compound are mutually invaded into a polymer mesh structure, and is a polishing pad having a thickness of 1 mm or more and a diameter of 300 mm or more. When the average weight ratio of the polymer molded article is X (%) based on the total weight of the polymer molded article and the ethylenically unsaturated compound polymer, the weight ratio of the polymer molded article at any position of the polishing pad is A polishing pad in the range of X ± 3 (%). That is, as described in the examples, the composition at each position of the polishing pad was measured, and the weight ratio of the polymer molded body to the total weight of the polymer molded body and the ethylenically unsaturated compound polymer was determined as an average. The value is X (%). Here, the minimum value among the weight ratios of the polymer molded articles measured is X-3 (%) or more, and the maximum value is X + 3 (%) or less. Further, the weight ratio of the ethylenically unsaturated compound polymer at any position of the polishing pad is in the range of (100-X) ± 3%.

高分子成形體與乙烯性不飽和化合物的聚合物的重量比係藉由紅外線吸數光譜測定得到。從在高分子成形體之固有吸收的吸光度與在乙烯性不飽和化合物聚合物之固有吸收的吸光度比,能夠算出高分子成形體與乙烯性不飽和化合物的重量比。依照測定方法、孔徑不同,所得到光譜區域的大小不同。例如通常的紅外線分光法時,孔徑係直徑約1毫米,能夠得到在1毫米等級(order)區域之兩聚合物的重量比。使用顯微紅外分光法時,孔徑係直徑約100微米,能夠得到在100微米等級區域之兩聚合物的重量比。又,使用顯微拉曼分光法時,孔徑能夠得到在1微米等級區域之兩聚合物的重量比。在本發明之相互侵入高分子網目構造體,高分子成形體與乙烯性不飽和化合物的聚合物係非常微細地混合,因為在約1微米~約1毫米等級的區域,兩者的重量比均勻,使用任一種方法都能夠得到相同的結果。The weight ratio of the polymer molded body to the polymer of the ethylenically unsaturated compound is determined by infrared absorption spectrometry. The weight ratio of the polymer molded body to the ethylenically unsaturated compound can be calculated from the ratio of the absorbance inherently absorbed in the polymer molded article to the absorbance inherently absorbed in the ethylenically unsaturated compound polymer. The size of the obtained spectral region differs depending on the measurement method and the pore diameter. For example, in the usual infrared spectroscopy, the diameter of the aperture is about 1 mm, and the weight ratio of the two polymers in the 1 mm order region can be obtained. When the microscopic infrared spectroscopy method is used, the pore diameter is about 100 μm in diameter, and the weight ratio of the two polymers in the region of 100 μm can be obtained. Further, when the Raman spectroscopy method is used, the pore diameter can obtain the weight ratio of the two polymers in the region of 1 μm. In the mutually invading polymer network structure of the present invention, the polymer molded body and the polymer of the ethylenically unsaturated compound are very finely mixed because the weight ratio of the two is uniform in a region of about 1 μm to about 1 mm. The same result can be obtained using either method.

本發明的研磨墊之拉伸斷裂強度以13MPa以上為佳。又,本發明的研磨墊之拉伸斷裂延伸度以150%以上為佳。拉伸斷裂強度及拉伸斷裂延伸度係在23℃、50%RH環境下,依據JIS K 7113:1995,將1號形小形試片(試片厚度1~2毫米),以夾頭間距離58毫米、試驗速度50毫米/分鐘的條件進行拉伸試驗所得到的值。拉伸破裂強度小於13MPa時,研磨時之研磨速度的面內均勻性、研磨墊耐用期限等研磨特性下降。拉伸斷裂延伸度小於150%時,研磨時之研磨速度的面內均勻性及耐用期限等研磨特性下降。拉伸破裂強度以50MPa以下為佳。拉伸破裂強度大於50MPa時,研磨墊有變脆的傾向。又,拉伸斷裂延伸度1000%以下為佳,拉伸斷裂延伸度1000%以上時,研磨墊之彈性太強。The polishing pad of the present invention preferably has a tensile breaking strength of 13 MPa or more. Further, the polishing pad of the present invention preferably has a tensile elongation at break of 150% or more. The tensile strength at break and the tensile elongation at break are in the environment of 23 ° C and 50% RH. According to JIS K 7113:1995, the small test piece No. 1 (the thickness of the test piece is 1~2 mm) is used as the distance between the chucks. The value obtained by the tensile test was carried out under conditions of 58 mm and a test speed of 50 mm/min. When the tensile breaking strength is less than 13 MPa, the in-plane uniformity of the polishing rate at the time of polishing and the polishing property such as the durability of the polishing pad are lowered. When the tensile elongation at break is less than 150%, the polishing properties such as in-plane uniformity and durability of the polishing rate during polishing are lowered. The tensile strength at break is preferably 50 MPa or less. When the tensile breaking strength is more than 50 MPa, the polishing pad tends to become brittle. Further, the tensile elongation at break is preferably 1000% or less, and when the tensile elongation at break is 1000% or more, the elasticity of the polishing pad is too strong.

本發明之研磨墊之平均氣泡徑以具有10~230微米的獨立氣泡為佳。平均氣泡徑以10~120微米的獨立氣泡為更佳,以20~60微米為特佳。藉由使用倍率200倍之掃描型電子顯微鏡(SEM)觀察研磨墊表面或切面,使用畫像處理裝置解析該畫像,來計測畫像中全部的氣泡直徑,以其數量平均之平均值作為平均氣泡直徑。在研磨墊的表面,來自平坦面與來自氣泡之開口部係以適當比例存在為佳。在任意切面之氣泡數以10~1000個/平方毫米為佳,以200~600個/平方毫米為更佳。The polishing pad of the present invention preferably has an average cell diameter of from 10 to 230 μm. The average bubble diameter is preferably 10 to 120 μm, and 20 to 60 μm. The surface of the polishing pad or the cut surface was observed by a scanning electron microscope (SEM) with a magnification of 200 times, and the image was analyzed by an image processing apparatus to measure the diameter of all the bubbles in the image, and the average value of the number averaged was used as the average bubble diameter. On the surface of the polishing pad, it is preferred that the flat surface and the opening from the bubble are present in an appropriate ratio. The number of bubbles in any of the cut surfaces is preferably 10 to 1000 pieces/mm 2 , and more preferably 200 to 600 pieces/mm 2 .

本發明之研磨墊的表觀密度以0.2~1.1克/立方公分為佳。表觀密度係使用赫伯特型比重瓶,以精製水作為介質所測得的值,可依據日本工業規格JIS K 7112之方法測定。表觀密度小於0.2時,在研磨特性方面,會局部的平坦性不良、整體段差變大之情形。密度大於1.1時,在研磨特性方面,會有容易產生刮傷之情形。表觀密度以0.4~0.9的範圍為較佳,以0.45~0.85的範圍為更佳。The polishing pad of the present invention preferably has an apparent density of 0.2 to 1.1 g/cm 3 . The apparent density is a value measured using a Herbert-type pycnometer in the form of purified water as a medium, and can be measured in accordance with the method of Japanese Industrial Standard JIS K 7112. When the apparent density is less than 0.2, the local flatness is poor and the overall step difference is large in terms of polishing properties. When the density is more than 1.1, scratching is likely to occur in terms of polishing characteristics. The apparent density is preferably in the range of 0.4 to 0.9, and more preferably in the range of 0.45 to 0.85.

本發明之研磨墊能夠使用於矽晶圓等半導體基板、透鏡等光學零件、磁頭、硬碟等電子材料等之研磨。特別是在以平坦化半導體晶圓為目的、藉由化學機械研磨(CMP;Chemical Mechanical Polishing)技術進行研磨處理被研磨物之半導體晶圓時,使用作為研磨墊。在CMP製程時作為研磨墊,用以使用由研磨劑及藥液所構成的研磨漿體,藉由使半導體晶圓與研磨墊相對運動,來研磨半導體晶圓面達成使半導體晶圓面平坦且光滑之目的。The polishing pad of the present invention can be used for polishing a semiconductor substrate such as a tantalum wafer, an optical component such as a lens, an electronic material such as a magnetic head or a hard disk, or the like. In particular, when a semiconductor wafer for polishing an object to be polished is polished by a chemical mechanical polishing (CMP) technique for the purpose of planarizing a semiconductor wafer, it is used as a polishing pad. In the CMP process, as a polishing pad, using a polishing slurry composed of an abrasive and a chemical liquid, the semiconductor wafer surface is polished by relatively moving the semiconductor wafer and the polishing pad to achieve a flat surface of the semiconductor wafer. Smooth purpose.

本發明之研磨墊亦可使用來研磨光學透鏡、光學稜鏡、濾光器、光波導路等光學零件。研磨對象之材質,可舉出的有玻璃、石英、水晶、藍寶石、透明樹脂、鉭酸鋰、鈮酸鋰等。The polishing pad of the present invention can also be used to polish optical components such as optical lenses, optical iridium, filters, and optical waveguides. The material to be polished includes glass, quartz, crystal, sapphire, transparent resin, lithium niobate, lithium niobate, and the like.

又,其他用途可以使用在以鉀砷、鉀磷、銦磷、純粒鐵、氧化鋁、碳化矽、氮化矽、陶瓷、合金、樹脂等作為研磨對象之用途。Further, other uses can be used for polishing with potassium arsenic, potassium phosphorus, indium phosphorus, pure iron, alumina, tantalum carbide, tantalum nitride, ceramics, alloys, resins, and the like.

實施例Example

以下,藉由實施例更詳細說明本發明,但是本發明未限定於此等實施例。又,評價係如下進行。Hereinafter, the present invention will be described in more detail by way of examples, but the invention is not limited thereto. Further, the evaluation was carried out as follows.

[平均氣泡直徑]使用掃描型電子顯微鏡“SEM2400”(日立製作所),以倍率200倍觀察試樣的表面或切面,使用畫像處理裝置解析該畫像,來計測畫像中全部的氣泡直徑,以其平均值作為平均氣泡直徑。[Average bubble diameter] The surface of the sample or the cut surface was observed at a magnification of 200 times using a scanning electron microscope "SEM2400" (Hitachi, Ltd.), and the image was analyzed by an image processing device to measure the bubble diameter of the image. The value is taken as the average bubble diameter.

[表觀密度]依據JIS K 7112之方法,使用比重瓶(赫伯特型)測定。[Apparent density] Measured using a pycnometer (Herbert type) in accordance with the method of JIS K 7112.

[拉伸試驗]使用拉伸試驗機RTM-100((股)ORIENTEC製),使用以下測定條件測定斷裂強度及斷裂延伸度。以5支試片的平均值作為測定值。[Tensile test] Using a tensile tester RTM-100 (manufactured by ORIENTEC), the breaking strength and the elongation at break were measured using the following measurement conditions. The average value of the five test pieces was used as the measured value.

試驗室溫度:23℃試驗室濕度:50%試片形狀:JIS K 7113:1995記載之1號形小形試片試片厚度:1~2毫米夾頭之間距離:58毫米試驗速度:50毫米/分鐘Laboratory temperature: 23 ° C Laboratory humidity: 50% test piece shape: JIS K 7113: 1995 type 1 small test piece thickness: 1 ~ 2 mm distance between chucks: 58 mm test speed: 50 mm /minute

[測定聚胺甲酸酯與聚甲基丙烯酸甲酯之重量比]從所測定薄片切取600毫米×600毫米大小,進而細分化成為30毫米×30毫米之小片400個。在各自小片之小片的中央部,如下測定紅外線吸收光譜,從由來自聚胺甲酸酯與聚甲基丙烯酸甲酯之紅外線吸收的吸光度比,算出聚胺甲酸酯與聚甲基丙烯酸甲酯之重量比。對400個小片,求出相對於聚胺甲酸酯與聚甲基丙烯酸甲酯的合計重量之聚胺甲酸酯的重量比,求得其平均值X、最小值及最大值。[Measurement of the weight ratio of polyurethane to polymethyl methacrylate] The measured sheet was cut into a size of 600 mm × 600 mm, and further subdivided into 400 pieces of 30 mm × 30 mm pieces. In the central portion of the small piece of each small piece, the infrared absorption spectrum was measured as follows, and the polyurethane and polymethyl methacrylate were calculated from the absorbance ratio of the infrared absorption from the polyurethane and polymethyl methacrylate. Weight ratio. The weight ratio of the polyurethane to the total weight of the polyurethane and the polymethyl methacrylate was determined for 400 small pieces, and the average value X, the minimum value, and the maximum value were determined.

裝置:傅立葉變換紅外線吸收光譜測定裝置“AVATAR360”(Nicolet公司製)配件:水平放置1次反射ATR測定裝置“OMNI-samoler”ATR結晶:Ge、入射角45度測定條件:掃描次數32次、分解能力4cm 1 測定處:3公分×3公分×2毫米厚度之試片的表面中央部、正反面都測定解析方法:使用1105cm 1 作為來自聚胺甲酸酯之吸收。使用1150cm 1 作為來自聚甲基丙烯酸甲酯之吸收。聚胺甲酸酯與聚甲基丙烯酸甲酯(以下稱為PMMA)之重量比PU:PMMA係從2吸收的吸光度比ABS(PU):ABS(PMMA)算出。在算出時係使用裝置所附屬之解析軟體“OMNICE.S.P.5.1”。光譜數據的處理係實行以下步驟。(1)自動基線修正、(2)自動平滑、(3)Y軸正規化、(4)尖鋒檢測Apparatus: Fourier transform infrared absorption spectrometer "AVATAR360" (manufactured by Nicolet) Accessories: horizontally placed once reflection ATR measuring device "OMNI-samoler" ATR crystal: Ge, incident angle 45 degrees Measurement conditions: 32 times of scanning, decomposition ability 4cm - 1 measured at the: surface of the central portion 3 cm × 3 cm × thickness of 2 mm of the test piece, is measured both negative analytical methods: 1105cm - 1-carboxylate as an absorbent from the polyamine. Use 1150cm - 1 as an absorption of from polymethyl methacrylate. The weight ratio of polyurethane to polymethyl methacrylate (hereinafter referred to as PMMA) PU: PMMA is calculated from absorbance of 2 absorption ratio ABS (PU): ABS (PMMA). In the calculation, the analysis software "OMNICE.SP5.1" attached to the device is used. The processing of the spectral data carries out the following steps. (1) Automatic baseline correction, (2) automatic smoothing, (3) Y-axis normalization, (4) sharp detection

[研磨評價]使用“Suba400”(Rodel-Nitta(股)製)作為緩衝層,使用雙面黏著帶貼合預定評價的研磨墊,來製成積層研磨墊。將積層研磨墊貼在研磨裝置的平台上,在積層研磨墊上以壓力0.05MPa壓住鑽石調節器,使研磨平台以旋轉數32rpm、調節器以旋轉數30rpm同方向旋轉。邊將精製水以100毫升/分鐘的比率供給至研磨墊上、邊對研磨墊進行調節。[Polishing Evaluation] Using a "Suba 400" (manufactured by Rodel-Nitta Co., Ltd.) as a buffer layer, a polishing pad of a predetermined evaluation was bonded using a double-sided adhesive tape to prepare a laminated polishing pad. The laminated polishing pad was attached to the platform of the polishing apparatus, and the diamond adjuster was pressed on the laminated polishing pad at a pressure of 0.05 MPa, and the polishing table was rotated in the same direction at a rotation number of 32 rpm and a rotation number of 30 rpm. The polishing pad was adjusted while supplying purified water to the polishing pad at a ratio of 100 ml/min.

接著,將評價用6英吋矽晶圓安裝在研磨裝置的研磨墊上,使其以40rpm旋轉。將積層研磨墊貼在研磨裝置的研磨平台上,使其以40rpm且與研磨墊的旋轉方向之相同方向旋轉。邊以180毫升/分鐘供給矽系漿體、邊以研磨壓力0.06MPa進行1分鐘研磨,測定矽晶圓表面的氧化膜之研磨速度。研磨後,以不使晶圓表面乾燥的方式邊直接供給精製水邊以聚乙烯醇海綿洗滌晶圓表面,吹乾燥壓縮空氣使其乾燥。Next, a 6-inch wafer was mounted on the polishing pad of the polishing apparatus and rotated at 40 rpm. The laminated polishing pad was attached to the polishing table of the polishing apparatus and rotated at 40 rpm in the same direction as the rotation direction of the polishing pad. The enamel slurry was supplied at 180 ml/min, and the polishing was performed at a polishing pressure of 0.06 MPa for 1 minute to measure the polishing rate of the oxide film on the surface of the ruthenium wafer. After the polishing, the surface of the wafer was washed with a polyvinyl alcohol sponge while directly supplying the purified water without drying the surface of the wafer, and the compressed air was blown and dried.

研磨處理20片評價用晶圓,測定第20片的氧化膜研磨速度。接著,繼續研磨,測定第500片的氧化膜研磨速度。20 sheets of evaluation wafers were polished, and the oxide film polishing rate of the 20th sheet was measured. Next, the polishing was continued, and the polishing rate of the oxide film of the 500th sheet was measured.

[研磨速度]藉由使用光干涉式膜壓測定裝“RAMUDAES”VM-8000J(DAINIPPON SCREEN MFG(股)製)測定研磨前後之晶圓厚度,算出平均單位時間之研磨量(研磨速度)。使用在6英吋矽晶圓上形成有約1.2微米的熱氧化膜之評價用測試晶圓。[Polishing speed] The wafer thickness before and after polishing was measured by using "RAMUDAES" VM-8000J (manufactured by DAINIPPON SCREEN MFG Co., Ltd.) using an optical interference type membrane pressure measuring device, and the polishing amount (polishing speed) per unit time was calculated. A test wafer for evaluation of a thermal oxide film of about 1.2 μm formed on a 6-inch wafer was used.

[面內均勻性]測定晶圓的直徑方向49點之研磨速度,其最大值與最小值的差除以49點平均值的2倍後之值,算出該值乘100倍作為面內均勻性(%)面內均勻性(%)=(最大值-最小值)×100/2×平均值[In-Plane Uniformity] The polishing rate of 49 points in the diameter direction of the wafer was measured, and the difference between the maximum value and the minimum value was divided by the value of twice the average value of 49 points, and the value was calculated by multiplied by 100 times as the in-plane uniformity. (%) in-plane uniformity (%) = (maximum - minimum value) × 100 / 2 × average

[平坦化特性]研磨處理評價用晶圓40片後,使用具有圖案高度0.60微米、線與間隙為線300微米、間隙30微米的重複圖案之具有圖案的氧化膜晶圓,如上述進行研磨。在研磨時間30、60、90、120、150及180秒間分別測定,求得段差平坦化至0.10微米以下時之時間。[Flatness Characteristics] After 40 wafers for the polishing treatment evaluation, a patterned oxide film wafer having a pattern having a pattern height of 0.60 μm and a line and a gap of 300 μm and a gap of 30 μm was used, and was polished as described above. The polishing time was measured at 30, 60, 90, 120, 150, and 180 seconds, and the time when the step was flattened to 0.10 μm or less was obtained.

(比較例1)(Comparative Example 1)

在RIM成形機的第1原料槽及第2原料槽各自加入以下的原料組成物,在第1原料槽裝載氮氣後,注入模具中使其硬化,得到850毫米×850毫米、厚度12毫米之聚胺甲酸酯成形體。所得到的聚胺甲酸酯成形體的表觀密度為0.82克/立方公分,觀察到平均氣泡直徑為28微米的獨立氣泡。The following raw material composition was added to each of the first raw material tank and the second raw material tank of the RIM molding machine, and after the nitrogen gas was placed in the first raw material tank, it was poured into a mold and hardened to obtain a mixture of 850 mm × 850 mm and a thickness of 12 mm. A urethane shaped body. The apparent density of the obtained polyurethane shaped article was 0.82 g/cm 3 , and independent bubbles having an average cell diameter of 28 μm were observed.

<第1原料槽>聚丙二醇 85重量份二伸乙甘醇 15重量份辛酸錫 0.5重量份矽系氣泡穩定劑 3重量份精製水 0.3重量份<First raw material tank> polypropylene glycol 85 parts by weight of diethylene glycol 15 parts by weight of tin octylate 0.5 parts by weight of anthraquinone bubble stabilizer 3 parts by weight of purified water 0.3 parts by weight

<第2原料槽>二苯基甲烷二異氰酸酯 120重量份<Second raw material tank> diphenylmethane diisocyanate 120 parts by weight

接著,調配以下的自由基聚合性組成物,在20℃浸漬上述聚胺甲酸酯成形體7天後,自由基聚合性組成物全量浸漬在聚胺甲酸酯成形體中。聚胺甲酸酯成形體與自由基聚合性組成物的重量比為100/150。Next, the following radical polymerizable composition was prepared, and after immersing the above-mentioned polyurethane shaped body at 20 ° C for 7 days, the radically polymerizable composition was immersed in the entire polyurethane shaped body. The weight ratio of the polyurethane shaped article to the radically polymerizable composition was 100/150.

甲基丙烯酸甲酯 300重量份偶氮雙異丁腈 0.9重量份Methyl methacrylate 300 parts by weight of azobisisobutyronitrile 0.9 parts by weight

使氯乙烯製墊片介於中間將因浸漬而膨脹的胺甲酸酯成形體夾在2片玻璃板之間,固定周圍密閉後,在70℃加熱5小時,接著在100℃的烘箱中加熱3小時使其硬化,得到相互侵入高分子網目構造體。將所得到的相互侵入高分子網目構造體從玻璃脫模後,測定重量。進而在50℃乾燥12小時、接著在100℃乾燥12小時,進而在常溫乾燥12小時,緊接著測定重量時,與乾燥前比較重量未減少。The urethane molded body expanded by the immersion was sandwiched between two glass plates, and the periphery was sealed, and then heated at 70 ° C for 5 hours, followed by heating in an oven at 100 ° C. The mixture was hardened in 3 hours to obtain a mutual intrusion into the polymer network structure. The obtained intrusive polymer mesh structure was released from the glass, and the weight was measured. Further, the mixture was dried at 50 ° C for 12 hours, then dried at 100 ° C for 12 hours, and further dried at room temperature for 12 hours. Immediately after the weight was measured, the weight was not reduced as compared with that before drying.

對上述相互侵入高分子網目構造體之厚度方向的中央部分進行切片及表面磨削,得到厚度2毫米的薄片。從該薄片的中央部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為11.6MPa及270%。又,從該薄片的端部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為9.8MPa及240%。The center portion in the thickness direction of the mutually invading polymer mesh structure was subjected to slicing and surface grinding to obtain a sheet having a thickness of 2 mm. When the No. 1 shaped test piece was punched from the center of the sheet and the tensile breaking strength and the tensile elongation at break were measured, they were 11.6 MPa and 270%, respectively. Further, when the No. 1 shaped test piece was punched from the end of the sheet and the tensile breaking strength and the tensile elongation at break were measured, they were each 9.8 MPa and 240%.

對從上述厚度方向的中央部取出厚度2毫米的薄片,算出相對於聚胺甲酸酯與PMMA的和之聚胺甲酸酯的重量比。結果,在400個小片之聚胺甲酸酯重量比係平均值為43.3%、最小值為37.3%、最大值為49.2%。聚胺甲酸酯成形體與乙烯性不飽和化合物聚合物的比為100/130.9。A sheet having a thickness of 2 mm was taken out from the center portion in the thickness direction described above, and the weight ratio of the polyurethane to the PMMA was calculated. As a result, the weight ratio of the polyurethane in the 400 small pieces was 43.3%, the minimum value was 37.3%, and the maximum value was 49.2%. The ratio of the polyurethane shaped body to the ethylenically unsaturated compound polymer was 100/130.9.

對從上述厚度方向的中央部取出厚度2毫米的薄片,沖切直徑600毫米的圓後,在一面形成寬度1.5毫米、深度0.5毫米、間距30毫米之圍棋格子狀的溝,製成研磨墊。研磨墊的表觀密度為0.85克/立方公分、獨立氣泡的平均氣泡直徑為34微米。能夠觀察到在表面有395個/平方毫米之來自氣泡的開口部。A sheet having a thickness of 2 mm was taken out from the center portion in the thickness direction, and a circle having a diameter of 600 mm was punched out, and a groove having a width of 1.5 mm, a depth of 0.5 mm, and a pitch of 30 mm was formed on one surface to form a polishing pad. The polishing pad had an apparent density of 0.85 g/cm 3 and the closed cells had an average cell diameter of 34 μm. It was observed that there were 395/mm 2 openings from the bubbles on the surface.

進行研磨評價時,第1片及第20片的研磨速度係各自為1800埃/分鐘及1850埃/分鐘,面內均勻性各自為15%、16%。研磨500片後的研磨速度為800埃/分鐘,面內均勻性為30%。又,平坦化特性係平坦化需要研磨150秒鐘。When the polishing evaluation was performed, the polishing rates of the first sheet and the 20th sheet were each 1800 Å/min and 1850 Å/min, and the in-plane uniformity was 15% and 16%, respectively. The polishing rate after grinding 500 sheets was 800 angstroms/minute, and the in-plane uniformity was 30%. Further, the flattening property is flattened and it takes 15 seconds to polish.

(比較例2)(Comparative Example 2)

對比較例1之相互侵入高分子網目構造體之厚度方向1/5及4/5的部分進行切片及表面磨削,得到厚度2毫米的薄片。從該等薄膜的中央部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為拉伸斷裂強度9.3MPa及拉伸斷裂延伸度180%、以及拉伸斷裂強度8.9MPa及拉伸斷裂延伸度190%。The portions of the comparative example 1 which invaded the polymer mesh structure in the thickness direction of 1/5 and 4/5 were sliced and surface-ground to obtain a sheet having a thickness of 2 mm. The No. 1 shaped test piece was punched from the center of the film, and the tensile breaking strength and tensile elongation at break were measured, and each was tensile fracture strength of 9.3 MPa and tensile elongation at break of 180%, and tensile fracture. The strength is 8.9 MPa and the tensile elongation at break is 190%.

在比較例1及比較例2,從相互侵入高分子網目構造體所得到厚度約2毫米的拉伸試片之拉伸斷裂強度及拉伸斷裂延伸度的值,在薄片內的中央部與周邊部、及在厚度方向的中央薄片與表層片的薄片間有顯著的差異。In Comparative Example 1 and Comparative Example 2, tensile tensile strength and tensile elongation at break of a tensile test piece having a thickness of about 2 mm obtained from intrusion into a polymer mesh structure, and a central portion and a periphery in the sheet. There is a significant difference between the portion and the central sheet in the thickness direction and the sheet of the top sheet.

接著,對從上述厚度方向1/5部分所得到厚度2毫米的薄片,算出相對於聚胺甲酸酯與PMMA的和之聚胺甲酸酯的重量比。結果,在400個小片之聚胺甲酸酯重量比係平均值為36.4%、最小值為30.6%、最大值為42.4%。聚胺甲酸酯成形體與乙烯性不飽和化合物聚合物的比為100/174.7。Next, the weight ratio of the polyurethane of the sum of the polyurethane and the PMMA was calculated from the sheet having a thickness of 2 mm obtained from the 1/5 portion in the thickness direction. As a result, the weight ratio of the polyurethane in 400 small pieces was 36.4%, the minimum value was 30.6%, and the maximum value was 42.4%. The ratio of the polyurethane shaped body to the ethylenically unsaturated compound polymer was 100/174.7.

從比較例1及比較例2的結果,得知任一者之薄面內的組成分布寬度大、又,厚度方向之中央薄片與表層薄片之薄片間的組成差異大。From the results of Comparative Example 1 and Comparative Example 2, it was found that the composition distribution width in the thin surface of either one was large, and the composition difference between the central sheet in the thickness direction and the sheet of the surface layer sheet was large.

(實施例1)(Example 1)

除了第1原料槽使用以下組成物、相對於100重量%聚胺甲酸酯,使用含有10.2重量%乙苯作為鏈轉移劑之聚胺甲酸酯以外,與比較例1完全同樣地,製造相互侵入高分子網目構造體及研磨墊。In the same manner as in Comparative Example 1, except that the first composition was used in the first raw material tank, and the polyurethane containing 10.2% by weight of ethylbenzene as a chain transfer agent was used with respect to 100% by weight of the polyurethane, Invade the polymer mesh structure and the polishing pad.

<第1原料槽>聚丙二醇 85重量份二伸乙甘醇 15重量份乙苯 25重量份辛酸錫 0.5重量份矽系氣泡穩定劑 3重量份精製水 0.3重量份<First raw material tank> polypropylene glycol 85 parts by weight of ethylene glycol 1.5 parts by weight of ethylbenzene 25 parts by weight of tin octylate 0.5 parts by weight of anthraquinone bubble stabilizer 3 parts by weight of purified water 0.3 parts by weight

所得到的研磨墊之表觀密度為0.87克/立方公分,獨立氣泡的平均氣泡為35微米。可觀察到表面有400個/立方毫米之來自氣泡的開口部。從相互侵入高分子網目構造體之厚度方向的所得到厚度2毫米的薄片之拉伸斷裂強度及拉伸斷裂延伸度,各自為拉伸斷裂強度13.2MPa及拉伸斷裂延伸度270%。The resulting polishing pad had an apparent density of 0.87 g/cm 3 and the average bubble of the closed cells was 35 μm. It was observed that the surface had 400/mm 3 openings from the bubbles. The tensile breaking strength and tensile elongation at break of the obtained sheet having a thickness of 2 mm from the thickness direction of the mutually invading polymer mesh structure were each a tensile breaking strength of 13.2 MPa and a tensile elongation at break of 270%.

進行研磨評價時,第1片及第20片的研磨速度係各自為1820埃/分鐘及1820埃/分鐘,面內均勻性各自為8%及7%。研磨500片後的研磨速度為1810埃/分鐘,面內均勻性為8%。又,平坦化特性係平坦化需要研磨120秒鐘。When the polishing evaluation was performed, the polishing rates of the first sheet and the 20th sheet were each 1820 Å/min and 1820 Å/min, and the in-plane uniformity was 8% and 7%, respectively. The polishing rate after grinding 500 sheets was 1810 Å/min, and the in-plane uniformity was 8%. Moreover, the flattening property is flattened and it takes about 120 seconds of polishing.

(實施例2)(Example 2)

除了第2原料槽使用以下組成物、相對於100重量%聚胺甲酸酯,使用含有2.9重量% α-甲基苯乙烯二聚物作為鏈轉移劑之聚胺甲酸酯以外,與比較例1完全同樣地,製造相互侵入高分子網目構造體及研磨墊。The following composition was used in the second raw material tank, and a polyurethane containing 2.9% by weight of α-methylstyrene dimer as a chain transfer agent was used in comparison with 100% by weight of polyurethane, and a comparative example. 1 In the same manner, a mutually invading polymer mesh structure and a polishing pad were produced.

<第2原料槽>二苯基甲烷二異氰酸酯 120重量份α-甲基苯乙烯二聚物 6.5重量份<Second raw material tank> diphenylmethane diisocyanate 120 parts by weight of α-methylstyrene dimer 6.5 parts by weight

相互侵入高分子網目構造體之表觀密度為0.86克/立方公分、獨立氣泡的平均氣泡直徑為35微米。能夠觀察到在表面有367個/平方毫米之來自氣泡的開口部。從相互侵入高分子網目構造體之厚度方向的所得到厚度2毫米的薄片之拉伸斷裂強度及拉伸斷裂延伸度,各自為拉伸斷裂強度15.8MPa及拉伸斷裂延伸度315%。The apparent density of the mutually invading polymer mesh structure was 0.86 g/cm 3 and the average bubble diameter of the closed cells was 35 μm. It was observed that there were 367/mm 2 openings from the bubbles on the surface. The tensile breaking strength and the tensile elongation at break of the sheet having a thickness of 2 mm obtained from the thickness direction of the mutually invading polymer mesh structure were each a tensile breaking strength of 15.8 MPa and a tensile elongation at break of 315%.

接著,對從上述薄片,算出相對於聚胺甲酸酯與PMMA的和之聚胺甲酸酯的重量比。結果,在400個小片之聚胺甲酸酯重量比係平均值為40.3%、最小值為38.1%、最大值為42.3%。聚胺甲酸酯成形體與乙烯性不飽和化合物聚合物的比為100/148.1。Next, the weight ratio of the polyurethane to the PMMA was calculated from the above-mentioned sheet. As a result, the weight ratio of the polyurethane in the 400 small pieces was 40.3%, the minimum value was 38.1%, and the maximum value was 42.3%. The ratio of the polyurethane shaped body to the ethylenically unsaturated compound polymer was 100/148.1.

進行研磨評價時,第1片及第20片的研磨速度係各自為1860埃/分鐘及1890埃/分鐘,面內均勻性各自為7%及8%。研磨500片後的研磨速度為1850埃/分鐘,面內均勻性為7%。又,平坦化特性係平坦化需要研磨120秒鐘。When the polishing evaluation was performed, the polishing rates of the first sheet and the 20th sheet were each 1860 Å/min and 1890 Å/min, and the in-plane uniformity was 7% and 8%, respectively. The polishing rate after grinding 500 sheets was 1,850 angstroms/minute, and the in-plane uniformity was 7%. Moreover, the flattening property is flattened and it takes about 120 seconds of polishing.

(實施例3)(Example 3)

對實施例2之相互侵入高分子網目構造體之厚度方向1/5及4/5的部分進行切片及表面磨削,得到厚度2毫米的薄片。從該等薄膜的中央部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為拉伸斷裂強度15.7MPa及拉伸斷裂延伸度314%、以及拉伸斷裂強度15.6MPa及拉伸斷裂延伸度310%。The portions in the thickness direction of the polymer mesh structure of Example 2 which were in the thickness direction of 1/5 and 4/5 were sliced and surface-ground to obtain a sheet having a thickness of 2 mm. When the No. 1 shaped test piece was punched from the center of the film and the tensile breaking strength and tensile elongation at break were measured, each was tensile fracture strength of 15.7 MPa and tensile elongation at break of 314%, and tensile fracture. The strength was 15.6 MPa and the tensile elongation at break was 310%.

接著,對從上述薄片,算出相對於聚胺甲酸酯與PMMA的和之聚胺甲酸酯的重量比。結果,在400個小片之聚胺甲酸酯重量比係平均值為39.6%、最小值為37.6%、最大值為41.7%。聚胺甲酸酯成形體與乙烯性不飽和化合物聚合物的比為100/152.5。Next, the weight ratio of the polyurethane to the PMMA was calculated from the above-mentioned sheet. As a result, the weight ratio of the polyurethane in the 400 small pieces was 39.6%, the minimum value was 37.6%, and the maximum value was 41.7%. The ratio of the polyurethane shaped body to the ethylenically unsaturated compound polymer was 100/152.5.

在實施例2及實施例3,從相同的相互侵入高分子網目構造體所得到厚度約2毫米的拉伸試片之拉伸斷裂強度及拉伸斷裂延伸度的值,在薄片內及在薄片間的差異小。又,得知厚度方向中央的薄片與表層的薄片之聚胺甲酸酯的重量比的平均值差異小,藉由添加鏈轉移劑,能夠觀察到特別是在厚度方向之減小組成分布的效果。In Example 2 and Example 3, tensile tensile strength and tensile elongation at break of a tensile test piece having a thickness of about 2 mm obtained from the same mutual intrusion into the polymer mesh structure, in the sheet and in the sheet The difference between the two is small. Further, it was found that the difference in the average value of the weight ratio of the sheet in the center in the thickness direction to the sheet in the surface layer was small, and by adding the chain transfer agent, the effect of reducing the composition distribution particularly in the thickness direction can be observed. .

(實施例4)(Example 4)

除了第1原料槽使用以下組成物以外與比較例1完全同樣地進行,相對於100重量%聚胺甲酸酯,使用含有0.09重量% α-甲基苯乙烯二聚物作為鏈轉移劑,製造具有表觀密度為0.31克/立方公分、平均氣泡直徑80微米的獨立氣泡之聚胺甲酸酯成形體。The first raw material tank was used in the same manner as in Comparative Example 1, except that the following composition was used, and 0.09 wt% of α-methylstyrene dimer was used as a chain transfer agent with respect to 100% by weight of the polyurethane. A polyurethane shaped article having closed cells having an apparent density of 0.31 g/cm 3 and an average cell diameter of 80 μm.

<第1原料槽>聚丙二醇 85重量份二伸乙甘醇 15重量份α-甲基苯乙烯二聚物 0.2重量份辛酸錫 0.5重量份矽系氣泡穩定劑 3重量份精製水 0.3重量份<First raw material tank> polypropylene glycol 85 parts by weight of ethylene glycol diethylene glycol 15 parts by weight of α-methylstyrene dimer 0.2 parts by weight of tin octylate 0.5 parts by weight of anthraquinone bubble stabilizer 3 parts by weight of purified water 0.3 parts by weight

接著,調配以下的自由基聚合性組成物,在20℃浸漬上述聚胺甲酸酯成形體24小時後,自由基聚合性組成物全量浸漬在聚胺甲酸酯成形體中。聚胺甲酸酯成形體與自由基聚合性組成物的重量比為100/30。Then, the following radical polymerizable composition was prepared, and after immersing the above-mentioned polyurethane shaped body at 20 ° C for 24 hours, the radically polymerizable composition was immersed in the entire polyurethane molded article. The weight ratio of the polyurethane shaped article to the radically polymerizable composition was 100/30.

甲基丙烯酸甲酯 300重量份偶氮雙(2-甲基丁腈) 1.5重量份Methyl methacrylate 300 parts by weight of azobis(2-methylbutyronitrile) 1.5 parts by weight

使氯乙烯製墊片介於中間將因浸漬而膨脹的胺甲酸酯成形體夾在2片玻璃板之間,固定周圍密閉後,在70℃加熱5小時,接著在100℃的烘箱中加熱3小時使其硬化,得到相互侵入高分子網目構造體。The urethane molded body expanded by the immersion was sandwiched between two glass plates, and the periphery was sealed, and then heated at 70 ° C for 5 hours, followed by heating in an oven at 100 ° C. The mixture was hardened in 3 hours to obtain a mutual intrusion into the polymer network structure.

對上述相互侵入高分子網目構造體之厚度方向的中央部分進行切片及表面磨削,得到厚度2毫米的薄片。The center portion in the thickness direction of the mutually invading polymer mesh structure was subjected to slicing and surface grinding to obtain a sheet having a thickness of 2 mm.

接著,對從上述薄片,沖切直徑600毫米的圓後,在一面形成寬度1.0毫米、深度0.5毫米、間距18毫米之圍棋格子狀的溝,製成研磨墊。研磨墊的表觀密度為0.32克/立方公分、獨立氣泡的平均氣泡直徑為85微米。能夠觀察到在表面有76個/平方毫米之來自氣泡的開口部。Next, a groove having a width of 1.0 mm, a depth of 0.5 mm, and a pitch of 18 mm was formed on the one surface by punching a circle having a diameter of 600 mm from the sheet to form a polishing pad. The polishing pad had an apparent density of 0.32 g/cm 3 and the closed cells had an average cell diameter of 85 μm. It was observed that there were 76/mm 2 openings from the bubbles on the surface.

進行研磨評價時,第1片及第20片的研磨速度係各自為1220埃/分鐘及1240埃/分鐘,面內均勻性各自為9%及10%。研磨500片後的研磨速度為1220埃/分鐘,面內均勻性為9%。When the polishing evaluation was performed, the polishing rates of the first sheet and the 20th sheet were each 1220 Å/min and 1240 Å/min, and the in-plane uniformity was 9% and 10%, respectively. The polishing rate after grinding 500 sheets was 1,220 Å/min, and the in-plane uniformity was 9%.

(實施例5)(Example 5)

除了使用以下的組成物作為自由基聚合性組成物以外與比較例1完全同樣地進行,製造相互侵入高分子網目構造體及研磨墊。The same procedure as in Comparative Example 1 was carried out except that the following composition was used as the radical polymerizable composition, and the intrusion into the polymer mesh structure and the polishing pad was produced.

甲基丙烯酸甲酯 300重量份偶氮雙異丁腈 0.9重量份正辛基硫醇 0.9重量份Methyl methacrylate 300 parts by weight of azobisisobutyronitrile 0.9 parts by weight of n-octyl mercaptan 0.9 parts by weight

研磨墊之表觀密度為0.88克/立方公分、獨立氣泡的平均氣泡直徑為34微米。能夠觀察到在表面有390個/平方毫米之來自氣泡的開口部。從相互侵入高分子網目構造體之厚度方向的所得到厚度2毫米的薄片之拉伸斷裂強度及拉伸斷裂延伸度,各自為拉伸斷裂強度16.0MPa及拉伸斷裂延伸度310%。The apparent density of the polishing pad was 0.88 g/cm 3 and the average bubble diameter of the closed cells was 34 μm. It was observed that there were 390/mm 2 openings from the bubbles on the surface. The tensile breaking strength and the tensile elongation at break of the obtained sheet having a thickness of 2 mm from the thickness direction of the mutually invading polymer mesh structure were each a tensile breaking strength of 16.0 MPa and a tensile elongation at break of 310%.

進行研磨評價時,第1片及第20片的研磨速度係各自為1900埃/分鐘及1900埃/分鐘,面內均勻性各自為7%及8%。研磨500片後的研磨速度為1850埃/分鐘,面內均勻性為8%。又,平坦化特性係平坦化需要研磨120秒鐘。When the polishing evaluation was performed, the polishing rates of the first sheet and the 20th sheet were each 1900 Å/min and 1900 Å/min, and the in-plane uniformity was 7% and 8%, respectively. The polishing rate after grinding 500 sheets was 1,850 angstroms/minute, and the in-plane uniformity was 8%. Moreover, the flattening property is flattened and it takes about 120 seconds of polishing.

(實施例6)(Example 6)

除了使用以下的組成物作為自由基聚合性組成物以外與比較例1完全同樣地進行,製造相互侵入高分子網目構造體及研磨墊。The same procedure as in Comparative Example 1 was carried out except that the following composition was used as the radical polymerizable composition, and the intrusion into the polymer mesh structure and the polishing pad was produced.

甲基丙烯酸甲酯 300重量份偶氮雙異丁腈 0.9重量份α-甲基苯乙烯二聚物 1.2重量份氫醌單甲基醚 0.06重量份Methyl methacrylate 300 parts by weight of azobisisobutyronitrile 0.9 parts by weight of α-methylstyrene dimer 1.2 parts by weight of hydroquinone monomethyl ether 0.06 parts by weight

研磨墊之表觀密度為0.86克/立方公分、獨立氣泡的平均氣泡直徑為34微米。能夠觀察到在表面有391個/平方毫米之來自氣泡的開口部。The apparent density of the polishing pad was 0.86 g/cm 3 and the average bubble diameter of the closed cells was 34 μm. It was observed that there were 391/mm 2 openings from the cells on the surface.

從藉由固體NMR(核磁共振)法測定相互侵入高分子網目構造體之鬆弛時間,確認在聚胺甲酸酯成形體中具有PMMA以數十奈米以下的等級分散之結構,聚胺甲酸酯與PMMA之二種高分子鏈相互侵入、高分子鏈互相纏繞。亦即,從相互侵入高分子網目構造體的鬆弛時間比聚胺甲酸酯成形體單獨、及甲基丙烯酸甲酯聚合物單獨之鬆弛時間更長,能夠確認形成了相互侵入高分子網目構造體。The solid state NMR (nuclear magnetic resonance) method was used to measure the relaxation time of the intrusion into the polymer network structure, and it was confirmed that the PMMA has a structure in which PMMA is dispersed at a level of several tens of nanometers or less, and the polyurethane is urethane. The two polymer chains of the ester and PMMA invade each other, and the polymer chains are entangled with each other. In other words, the relaxation time from the mutual invasion into the polymer mesh structure is longer than the relaxation time of the polyurethane molded article alone and the methyl methacrylate polymer alone, and it is confirmed that the mutually invading polymer mesh structure is formed. .

對上述相互侵入高分子網目構造體之厚度方向的中央部分進行切片及表面磨削,得到厚度2毫米的薄片。從該薄片的中央部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為15.5MPa及320%。The center portion in the thickness direction of the mutually invading polymer mesh structure was subjected to slicing and surface grinding to obtain a sheet having a thickness of 2 mm. When the No. 1 shaped test piece was punched from the center of the sheet and the tensile breaking strength and the tensile elongation at break were measured, they were 15.5 MPa and 320%, respectively.

接著,對從上述薄片,算出相對於聚胺甲酸酯與PMMA的和之聚胺甲酸酯的重量比。結果,在400個小片之聚胺甲酸酯重量比係平均值為40.1%、最小值為38.6%、最大值為41.4%。聚胺甲酸酯成形體與乙烯性不飽和化合物聚合物的比為100/149.4。Next, the weight ratio of the polyurethane to the PMMA was calculated from the above-mentioned sheet. As a result, the weight ratio of the polyurethane in 400 small pieces was 40.1%, the minimum value was 38.6%, and the maximum value was 41.4%. The ratio of the polyurethane shaped body to the ethylenically unsaturated compound polymer was 100/149.4.

進行研磨評價時,第1片及第20片的研磨速度係各自為1850埃/分鐘及1900埃/分鐘,面內均勻性各自為7%及7%。研磨500片後的研磨速度為1850埃/分鐘,面內均勻性為7%。又,平坦化特性係平坦化需要研磨120秒鐘。When the polishing evaluation was performed, the polishing rates of the first sheet and the 20th sheet were each 1850 Å/min and 1900 Å/min, and the in-plane uniformity was 7% and 7%, respectively. The polishing rate after grinding 500 sheets was 1,850 angstroms/minute, and the in-plane uniformity was 7%. Moreover, the flattening property is flattened and it takes about 120 seconds of polishing.

(實施例7)(Example 7)

對實施例6之相互侵入高分子網目構造體之厚度方向1/5及4/5的部分進行切片及表面磨削,得到厚度2毫米的薄片。從該等薄膜的中央部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為拉伸斷裂強度15.6MPa及拉伸斷裂延伸度312%、以及拉伸斷裂強度15.5MPa及拉伸斷裂延伸度316%。The portions in the thickness direction of the polymer mesh structure of Example 6 which were in the thickness direction of 1/5 and 4/5 were sliced and surface-ground to obtain a sheet having a thickness of 2 mm. When the No. 1 shaped test piece was punched from the center of the film and the tensile breaking strength and tensile elongation at break were measured, each was tensile fracture strength of 15.6 MPa and tensile elongation at break of 312%, and tensile fracture. The strength is 15.5 MPa and the tensile elongation at break is 316%.

接著,對從上述厚度方向1/5部分所得到厚度2毫米的薄片,算出相對於聚胺甲酸酯與PMMA的和之聚胺甲酸酯的重量比。結果,在400個小片之聚胺甲酸酯重量比係平均值為39.9%、最小值為38.7%、最大值為41.4%。聚胺甲酸酯成形體與乙烯性不飽和化合物聚合物的比為100/150.6。Next, the weight ratio of the polyurethane of the sum of the polyurethane and the PMMA was calculated from the sheet having a thickness of 2 mm obtained from the 1/5 portion in the thickness direction. As a result, the weight ratio of the polyurethane in the 400 small pieces was 39.9%, the minimum value was 38.7%, and the maximum value was 41.4%. The ratio of the polyurethane shaped body to the ethylenically unsaturated compound polymer was 100/150.6.

從實施例6及實施例7的結果,從相同的相互侵入高分子網目構造體所得到厚度約2毫米的拉伸試片之拉伸斷裂強度及拉伸斷裂延伸度的值,在薄片內及在薄片間的差異小。又,實施例6及實施例7之聚胺甲酸酯重量比的薄片內分布,各自為40.1±1.4(%)及39.9±1.4(%),薄片面內的組成分布寬度小。又,從厚度方向中央的薄片組成與表層的薄片組成大致相同,得知厚度方向之組成亦均勻。亦即,得知藉由並用鏈轉移劑及聚合抑制劑,能夠同時提升薄一面內組成均勻性及薄片間組成的均勻性。From the results of Example 6 and Example 7, the values of the tensile rupture strength and the tensile elongation at break of the tensile test piece having a thickness of about 2 mm obtained from the same mutual intrusion into the polymer mesh structure were obtained in the sheet and The difference between the sheets is small. Further, the distribution in the sheet of the weight ratio of the polyurethane of Example 6 and Example 7 was 40.1 ± 1.4 (%) and 39.9 ± 1.4 (%), respectively, and the composition distribution width in the sheet surface was small. Further, the composition of the sheet from the center in the thickness direction was substantially the same as the sheet composition of the surface layer, and it was found that the composition in the thickness direction was also uniform. That is, it was found that by using a chain transfer agent and a polymerization inhibitor in combination, the uniformity of composition in the thin side and the uniformity of the composition between the sheets can be simultaneously improved.

(實施例8)(Example 8)

使用比較例1之聚胺甲酸酯原料組成物,得到具有表觀密度0.51克/立方公分、平均氣泡77微米之聚胺甲酸酯成形體。Using the polyurethane raw material composition of Comparative Example 1, a polyurethane molded article having an apparent density of 0.51 g/cm 3 and an average bubble of 77 μm was obtained.

接著,調配以下的自由基聚合性組成物,在20℃浸漬上述聚胺甲酸酯成形體24小時後,自由基聚合性組成物全量浸漬在聚胺甲酸酯成形體中。聚胺甲酸酯成形體與自由基聚合性組成物的重量比為100/50。Then, the following radical polymerizable composition was prepared, and after immersing the above-mentioned polyurethane shaped body at 20 ° C for 24 hours, the radically polymerizable composition was immersed in the entire polyurethane molded article. The weight ratio of the polyurethane shaped article to the radically polymerizable composition was 100/50.

甲基丙烯酸甲酯 300重量份偶氮(2-甲基丁腈) 1.5重量份正十二基硫醇 0.7重量份Methyl methacrylate 300 parts by weight of azo (2-methylbutyronitrile) 1.5 parts by weight of n-dodecyl mercaptan 0.7 parts by weight

使氯乙烯製墊片介於中間將因浸漬而膨脹的胺甲酸酯成形體夾在2片玻璃板之間,固定周圍密閉後,在70℃加熱5小時,接著在100℃的烘箱中加熱3小時使其硬化,得到相互侵入高分子網目構造體。The urethane molded body expanded by the immersion was sandwiched between two glass plates, and the periphery was sealed, and then heated at 70 ° C for 5 hours, followed by heating in an oven at 100 ° C. The mixture was hardened in 3 hours to obtain a mutual intrusion into the polymer network structure.

對上述相互侵入高分子網目構造體之厚度方向的中央部分進行切片及表面磨削,得到厚度2毫米的薄片。The center portion in the thickness direction of the mutually invading polymer mesh structure was subjected to slicing and surface grinding to obtain a sheet having a thickness of 2 mm.

對上述薄片,沖切直徑600毫米的圓後,在一面形成寬度1.0毫米、深度0.5毫米、間距18毫米之圍棋格子狀的溝,製成研磨墊。研磨墊的表觀密度為0.55克/立方公分、獨立氣泡的平均氣泡直徑為83微米。能夠觀察到在表面有75個/平方毫米之來自氣泡的開口部。To the above-mentioned sheet, a circle having a diameter of 600 mm was punched, and a groove having a width of 1.0 mm, a depth of 0.5 mm, and a pitch of 18 mm was formed on one side to form a polishing pad. The polishing pad had an apparent density of 0.55 g/cm 3 and the closed cells had an average cell diameter of 83 μm. It was observed that there were 75/mm 2 openings from the bubbles on the surface.

進行研磨評價時,第1片及第20片的研磨速度係各自為1200埃/分鐘及1230埃/分鐘,面內均勻性各自為10%及9%。研磨500片後的研磨速度為1210埃/分鐘,面內均勻性為9%。When the polishing evaluation was performed, the polishing rates of the first sheet and the 20th sheet were each 1200 Å/min and 1230 Å/min, and the in-plane uniformity was 10% and 9%, respectively. The polishing rate after grinding 500 sheets was 1210 Å/min, and the in-plane uniformity was 9%.

(比較例4)(Comparative Example 4)

在RIM成形機的第1原料槽及第2原料槽各自加入以下的原料組成物,在第1原料槽裝載氮氣後,注入模具中使其硬化,得到850毫米×850毫米、厚度12毫米之聚胺甲酸酯成形體。所得到的聚胺甲酸酯成形體的表觀密度為0.77克/立方公分,觀察到平均氣泡直徑為32微米的獨立氣泡。The following raw material composition was added to each of the first raw material tank and the second raw material tank of the RIM molding machine, and after the nitrogen gas was placed in the first raw material tank, it was poured into a mold and hardened to obtain a mixture of 850 mm × 850 mm and a thickness of 12 mm. A urethane shaped body. The apparent density of the obtained polyurethane shaped article was 0.77 g/cm 3 , and closed cells having an average cell diameter of 32 μm were observed.

<第1原料槽>聚丙二醇 85重量份二伸乙甘醇 15重量份辛酸錫 0.5重量份矽系氣泡穩定劑 3重量份精製水 0.3重量份<First raw material tank> polypropylene glycol 85 parts by weight of diethylene glycol 15 parts by weight of tin octylate 0.5 parts by weight of anthraquinone bubble stabilizer 3 parts by weight of purified water 0.3 parts by weight

<第2原料槽>二苯基甲烷二異氰酸酯 120重量份<Second raw material tank> diphenylmethane diisocyanate 120 parts by weight

接著,調配以下的自由基聚合性組成物,在20℃浸漬上述聚胺甲酸酯成形體3天後,進行觀察時,自由基聚合性組成物尚未全量滲進聚胺甲酸酯成形體中,所以繼續浸漬。更在20℃ 4天,合計浸漬7天時,自由基聚合性組成物全量浸漬在聚胺甲酸酯成形體中。聚胺甲酸酯成形體與自由基聚合性組成物的重量比為100/160,但是因為在硬化後除去有機成分,所以聚胺甲酸酯成形體與自由基聚合性組成物的重量比,實質上變為100/120。Then, the following radical polymerizable composition was prepared, and after immersing the above-mentioned polyurethane plastisate at 20 ° C for 3 days, the radical polymerizable composition was not fully infiltrated into the polyurethane molded article. So keep immersing. Further, when the total amount of the radically polymerizable composition was immersed for 7 days at 20 ° C for 4 days, the radical polymerizable composition was immersed in the polyurethane molded article. The weight ratio of the polyurethane shaped article to the radically polymerizable composition is 100/160, but since the organic component is removed after curing, the weight ratio of the polyurethane shaped body to the radically polymerizable composition is It becomes essentially 100/120.

甲基丙烯酸甲酯 300重量份偶氮雙異丁腈 1.5重量份正癸烷 100重量份Methyl methacrylate 300 parts by weight of azobisisobutyronitrile 1.5 parts by weight of n-decane 100 parts by weight

使氯乙烯製墊片介於中間將因浸漬而膨脹的胺甲酸酯成形體夾在2片玻璃板之間,固定周圍密閉後,在70℃加熱5小時,接著在100℃的烘箱中加熱3小時使其硬化,得到相互侵入高分子網目構造體。將所得到的相互侵入高分子網目構造體從玻璃脫模後,在50℃乾燥12小時、接著在100℃真空乾燥12小時,減壓除去能夠除去的成分。The urethane molded body expanded by the immersion was sandwiched between two glass plates, and the periphery was sealed, and then heated at 70 ° C for 5 hours, followed by heating in an oven at 100 ° C. The mixture was hardened in 3 hours to obtain a mutual intrusion into the polymer network structure. The obtained intrusive polymer mesh structure was released from the glass, dried at 50 ° C for 12 hours, and then vacuum dried at 100 ° C for 12 hours, and the components which can be removed were removed under reduced pressure.

對上述相互侵入高分子網目構造體之厚度方向的中央部分進行切片及表面磨削,得到厚度2毫米的薄片。從該薄片的中央部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為10.3MPa及260%。又,從該薄片的端部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為9.2MPa及190%。隨後,沖切直徑600毫米的圓後,磨削成厚度2毫米,在一面形成寬度2毫米、深度0.6毫米、間距40毫米之圍棋格子狀的溝,製成研磨墊。研磨墊的表觀密度為0.80克/立方公分、獨立氣泡的平均氣泡直徑為39微米。能夠觀察到在表面有350個/平方毫米之來自氣泡的開口部。The center portion in the thickness direction of the mutually invading polymer mesh structure was subjected to slicing and surface grinding to obtain a sheet having a thickness of 2 mm. When the No. 1 shaped test piece was punched from the center of the sheet and the tensile breaking strength and the tensile elongation at break were measured, they were 10.3 MPa and 260%, respectively. Further, when the No. 1 shaped test piece was punched from the end of the sheet and the tensile breaking strength and the tensile elongation at break were measured, they were 9.2 MPa and 190%, respectively. Subsequently, a circle having a diameter of 600 mm was punched, and then ground to a thickness of 2 mm, and a groove having a width of 2 mm, a depth of 0.6 mm, and a pitch of 40 mm was formed on one side to form a polishing pad. The polishing pad had an apparent density of 0.80 g/cm 3 and the closed cells had an average bubble diameter of 39 μm. It was observed that there were 350/mm 2 openings from the bubbles on the surface.

進行研磨評價時,第1片及第10片的研磨速度係各自為1700埃/分鐘及1650埃/分鐘,面內均勻性各自為16%及17%。研磨100片後的研磨速度為1400埃/分鐘,面內均勻性為28%。When the polishing evaluation was performed, the polishing rates of the first sheet and the tenth sheet were each 1700 Å/min and 1650 Å/min, and the in-plane uniformity was 16% and 17%, respectively. The polishing rate after grinding 100 sheets was 1,400 angstroms/minute, and the in-plane uniformity was 28%.

(比較例5)(Comparative Example 5)

除了使浸漬條件為60℃以外,與比較例1完全同樣地進行,將聚胺甲酸酯成形體浸漬於自由基聚合性組成物5小時後,自由基聚合性組成物在全量浸漬之前硬化,聚胺甲酸酯成形體與自由基聚合性組成物的硬化物無法整一體化。Except that the immersion conditions were 60° C., the same procedure as in Comparative Example 1 was carried out, and after the polyurethane structural body was immersed in the radical polymerizable composition for 5 hours, the radical polymerizable composition was hardened before the total amount of the immersion. The cured product of the polyurethane shaped article and the radically polymerizable composition cannot be integrated.

(實施例9)(Example 9)

調配以下自由基聚合性組成物,在40℃浸漬在比較例4所製造的聚胺甲酸酯成形體3天時,自由基聚合性組成物全量浸漬聚胺甲酸酯成形體。聚胺甲酸酯成形體與自由基聚合性組成物的重量比為100/120。The following radical polymerizable composition was prepared, and when the polyurethane molded article produced in Comparative Example 4 was immersed at 40 ° C for 3 days, the radical polymerizable composition was impregnated with the polyurethane shaped article in its entirety. The weight ratio of the polyurethane shaped article to the radically polymerizable composition was 100/120.

甲基丙烯酸甲酯 300重量份偶氮雙異丁腈 1.5重量份2,6-二-第三丁基-4-甲基苯酚 0.2重量份Methyl methacrylate 300 parts by weight of azobisisobutyronitrile 1.5 parts by weight of 2,6-di-tert-butyl-4-methylphenol 0.2 parts by weight

使氯乙烯製墊片介於中間將因浸漬而膨脹的胺甲酸酯成形體夾在2片玻璃板之間,固定周圍密閉後,在70℃加熱5小時,接著在100℃的烘箱中加熱3小時使其硬化,得到相互侵入高分子網目構造體。將所得到的相互侵入高分子網目構造體從玻璃脫模後,對厚度方向的中央部分進行切片及表面磨削,得到厚度2毫米的薄片。The urethane molded body expanded by the immersion was sandwiched between two glass plates, and the periphery was sealed, and then heated at 70 ° C for 5 hours, followed by heating in an oven at 100 ° C. The mixture was hardened in 3 hours to obtain a mutual intrusion into the polymer network structure. After the obtained mutually invading polymer mesh structure was released from the glass, the center portion in the thickness direction was sliced and surface-ground to obtain a sheet having a thickness of 2 mm.

從該薄片的中央部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為10.3MPa及260%。又,從該薄片的端部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為10.2MPa及260%。When the No. 1 shaped test piece was punched from the center of the sheet and the tensile breaking strength and the tensile elongation at break were measured, they were 10.3 MPa and 260%, respectively. Further, when the No. 1 shaped test piece was punched from the end of the sheet and the tensile breaking strength and the tensile elongation at break were measured, they were 10.2 MPa and 260%, respectively.

對上述薄片,沖切直徑600毫米的圓後,磨削成厚度2毫米,在一面形成寬度2毫米、深度0.6毫米、間距40毫米之圍棋格子狀的溝,製成研磨墊。研磨墊的表觀密度為0.80克/立方公分、獨立氣泡的平均氣泡直徑為39微米。能夠觀察到在表面有350個/平方毫米之來自氣泡的開口部。The above-mentioned sheet was punched into a circle having a diameter of 600 mm, and ground to a thickness of 2 mm, and a groove having a width of 2 mm, a depth of 0.6 mm, and a pitch of 40 mm was formed on one side to form a polishing pad. The polishing pad had an apparent density of 0.80 g/cm 3 and the closed cells had an average bubble diameter of 39 μm. It was observed that there were 350/mm 2 openings from the bubbles on the surface.

進行研磨評價時,第1片及第10片的研磨速度係各自為1700埃/分鐘及1650埃/分鐘,面內均勻性各自為8%及8%。研磨100片後的研磨速度為1700埃/分鐘,面內均勻性為8%。When the polishing evaluation was performed, the polishing rates of the first sheet and the tenth sheet were each 1700 Å/min and 1650 Å/min, and the in-plane uniformity was 8% and 8%, respectively. The polishing rate after grinding 100 sheets was 1,700 angstroms/minute, and the in-plane uniformity was 8%.

(實施例10)(Embodiment 10)

在RIM成形機的第1原料槽及第2原料槽各自加入以下的原料組成物,注入模具中使其硬化,得到850毫米×850毫米、厚度12毫米之聚胺甲酸酯成形體。所得到的聚胺甲酸酯成形體的表觀密度為0.77克/立方公分,觀察到平均氣泡直徑為32微米的獨立氣泡。The following raw material composition was added to each of the first raw material tank and the second raw material tank of the RIM molding machine, and was injected into a mold to be cured to obtain a polyurethane molded article of 850 mm × 850 mm and a thickness of 12 mm. The apparent density of the obtained polyurethane shaped article was 0.77 g/cm 3 , and closed cells having an average cell diameter of 32 μm were observed.

<第1原料槽>聚丙二醇 85重量份二伸乙甘醇 15重量份辛酸錫 0.5重量份矽系氣泡穩定劑 3重量份精製水 0.3重量份2,6-二-第三丁基-4-甲基苯酚 0.1重量份<First raw material tank> Polypropylene glycol 85 parts by weight Diethylene glycol 15 parts by weight Tin octoate 0.5 parts by weight Antimony-based bubble stabilizer 3 parts by weight Purified water 0.3 parts by weight 2,6-di-t-butyl-4- Methyl phenol 0.1 parts by weight

<第2原料槽>二苯基甲烷二異氰酸酯 120重量份<Second raw material tank> diphenylmethane diisocyanate 120 parts by weight

接著,調配以下的自由基聚合性組成物,在40℃浸漬上述聚胺甲酸酯成形體3天後,自由基聚合性組成物全量浸漬在聚胺甲酸酯成形體中。聚胺甲酸酯成形體與自由基聚合性組成物的重量比為100/120。Then, the following radical polymerizable composition was prepared, and after immersing the above-mentioned polyurethane shaped body at 40 ° C for 3 days, the radically polymerizable composition was immersed in the entire polyurethane shaped body. The weight ratio of the polyurethane shaped article to the radically polymerizable composition was 100/120.

甲基丙烯酸甲酯 300重量份偶氮雙異丁腈 1.5重量份2,6-二-第三丁基4-甲基苯酚 0.1重量份Methyl methacrylate 300 parts by weight of azobisisobutyronitrile 1.5 parts by weight of 2,6-di-t-butyl 4-methylphenol 0.1 parts by weight

使氯乙烯製墊片介於中間將因浸漬而膨脹的胺甲酸酯成形體夾在2片玻璃板之間,固定周圍密閉後,在70℃加熱5小時,接著在100℃的烘箱中加熱3小時使其硬化,得到相互侵入高分子網目構造體。將所得到的相互侵入高分子網目構造體從玻璃脫模後,對上述相互侵入高分子網目構造體之厚度方向的中央部分進行切片及表面磨削,得到厚度2毫米的薄片。The urethane molded body expanded by the immersion was sandwiched between two glass plates, and the periphery was sealed, and then heated at 70 ° C for 5 hours, followed by heating in an oven at 100 ° C. The mixture was hardened in 3 hours to obtain a mutual intrusion into the polymer network structure. After the obtained mutually invading polymer mesh structure was released from the glass, the center portion in the thickness direction of the mutually invaded polymer mesh structure was subjected to slicing and surface grinding to obtain a sheet having a thickness of 2 mm.

從該薄片的中央部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為10.3MPa及260%。又,從該薄片的端部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為10.3MPa及260%。When the No. 1 shaped test piece was punched from the center of the sheet and the tensile breaking strength and the tensile elongation at break were measured, they were 10.3 MPa and 260%, respectively. Further, when the No. 1 shaped test piece was punched from the end of the sheet and the tensile breaking strength and the tensile elongation at break were measured, they were 10.3 MPa and 260%, respectively.

對上述薄片,沖切直徑600毫米的圓後,在一面形成寬度2毫米、深度0.6毫米、間距40毫米之圍棋格子狀的溝,製成研磨墊。研磨墊的表觀密度為0.80克/立方公分、獨立氣泡的平均氣泡直徑為39微米。能夠觀察到在表面有350個/平方毫米之來自氣泡的開口部。To the above-mentioned sheet, a circle having a diameter of 600 mm was punched, and a groove having a grid shape of 2 mm in width, 0.6 mm in depth, and 40 mm in pitch was formed on one surface to prepare a polishing pad. The polishing pad had an apparent density of 0.80 g/cm 3 and the closed cells had an average bubble diameter of 39 μm. It was observed that there were 350/mm 2 openings from the bubbles on the surface.

進行研磨評價時,第1片及第10片的研磨速度係各自為1700埃/分鐘及1700埃/分鐘,面內均勻性各自為8%及8%。研磨100片後的研磨速度為1700埃/分鐘,面內均勻性為7%。When the polishing evaluation was performed, the polishing rates of the first sheet and the tenth sheet were each 1700 Å/min and 1700 Å/min, and the in-plane uniformity was 8% and 8%, respectively. The polishing rate after grinding 100 sheets was 1,700 angstroms/min, and the in-plane uniformity was 7%.

(實施例11)(Example 11)

在RIM成形機的第1原料槽及第2原料槽各自加入以下的原料組成物,在第1原料槽裝載氮氣後,注入模具中使其硬化,得到850毫米×850毫米、厚度12毫米之聚胺甲酸酯成形體。所得到的聚胺甲酸酯成形體的表觀密度為0.82克/立方公分,觀察到平均氣泡直徑為28微米的獨立氣泡。The following raw material composition was added to each of the first raw material tank and the second raw material tank of the RIM molding machine, and after the nitrogen gas was placed in the first raw material tank, it was poured into a mold and hardened to obtain a mixture of 850 mm × 850 mm and a thickness of 12 mm. A urethane shaped body. The apparent density of the obtained polyurethane shaped article was 0.82 g/cm 3 , and independent bubbles having an average cell diameter of 28 μm were observed.

<第1原料槽>聚丙二醇 85重量份二伸乙甘醇 15重量份α-甲基苯乙烯二聚物 0.4重量份2,6-二-第三丁基-4-甲基苯酚 0.1重量份辛酸錫 0.5重量份矽系氣泡穩定劑 3重量份精製水 0.3重量份<1st raw material tank> polypropylene glycol 85 parts by weight of ethylene glycol 1.5 parts by weight of α-methylstyrene dimer 0.4 parts by weight of 2,6-di-tert-butyl-4-methylphenol 0.1 parts by weight Tin octoate 0.5 parts by weight of hydrazine bubble stabilizer 3 parts by weight of purified water 0.3 parts by weight

<第2原料槽>二苯基甲烷二異氰酸酯 120重量份<Second raw material tank> diphenylmethane diisocyanate 120 parts by weight

接著,調配以下的自由基聚合性組成物,在20℃浸漬上述聚胺甲酸酯成形體7天後,自由基聚合性組成物全量浸漬在聚胺甲酸酯成形體中。聚胺甲酸酯成形體與自由基聚合性組成物的重量比為100/140。Next, the following radical polymerizable composition was prepared, and after immersing the above-mentioned polyurethane shaped body at 20 ° C for 7 days, the radically polymerizable composition was immersed in the entire polyurethane shaped body. The weight ratio of the polyurethane shaped article to the radically polymerizable composition was 100/140.

甲基丙烯酸甲酯 300重量份偶氮雙異丁腈 0.5重量份Methyl methacrylate 300 parts by weight of azobisisobutyronitrile 0.5 parts by weight

使氯乙烯製墊片介於中間將因浸漬而膨脹的胺甲酸酯成形體夾在2片玻璃板之間,固定周圍密閉後,在70℃加熱5小時,接著在100℃的烘箱中加熱3小時使其硬化,得到相互侵入高分子網目構造體。將所得到的相互侵入高分子網目構造體從玻璃脫模後,測定重量。進而在50℃乾燥12小時、接著在100℃乾燥12小時,進而在常溫乾燥12小時,緊接著測定重量時,與乾燥前比較重量未減少。The urethane molded body expanded by the immersion was sandwiched between two glass plates, and the periphery was sealed, and then heated at 70 ° C for 5 hours, followed by heating in an oven at 100 ° C. The mixture was hardened in 3 hours to obtain a mutual intrusion into the polymer network structure. The obtained intrusive polymer mesh structure was released from the glass, and the weight was measured. Further, the mixture was dried at 50 ° C for 12 hours, then dried at 100 ° C for 12 hours, and further dried at room temperature for 12 hours. Immediately after the weight was measured, the weight was not reduced as compared with that before drying.

從藉由固體NMR(核磁共振)法測定相互侵入高分子網目構造體之鬆弛時間,確認在聚胺甲酸酯成形體中具有PMMA以數十奈米以下的等級分散之結構,聚胺甲酸酯與PMMA之二種高分子鏈相互侵入、高分子鏈互相纏繞。亦即,從相互侵入高分子網目構造體的鬆弛時間比聚胺甲酸酯成形體單獨、及甲基丙烯酸甲酯聚合物單獨之鬆弛時間更長,能夠確認形成了相互侵入高分子網目構造體。The solid state NMR (nuclear magnetic resonance) method was used to measure the relaxation time of the intrusion into the polymer network structure, and it was confirmed that the PMMA has a structure in which PMMA is dispersed at a level of several tens of nanometers or less, and the polyurethane is urethane. The two polymer chains of the ester and PMMA invade each other, and the polymer chains are entangled with each other. In other words, the relaxation time from the mutual invasion into the polymer mesh structure is longer than the relaxation time of the polyurethane molded article alone and the methyl methacrylate polymer alone, and it is confirmed that the mutually invading polymer mesh structure is formed. .

對上述相互侵入高分子網目構造體之厚度方向的中央部分進行切片及表面磨削,得到厚度2毫米的薄片。從該薄片的中央部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為16.6MPa及310%。又,從該薄片的端部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為16.5MPa及300%。The center portion in the thickness direction of the mutually invading polymer mesh structure was subjected to slicing and surface grinding to obtain a sheet having a thickness of 2 mm. When the No. 1 shaped test piece was punched from the center of the sheet and the tensile breaking strength and the tensile elongation at break were measured, they were 16.6 MPa and 310%, respectively. Further, when the No. 1 shaped test piece was punched from the end of the sheet and the tensile breaking strength and the tensile elongation at break were measured, they were 16.5 MPa and 300%, respectively.

接著,對上述薄片,算出相對於聚胺甲酸酯與PMMA的和之聚胺甲酸酯的重量比。結果,在400個小片之聚胺甲酸酯重量比係平均值為43.0%、最小值為41.6%、最大值為44.5%。聚胺甲酸酯成形體與乙烯性不飽和化合物聚合物的比為100/132.5。Next, the weight ratio of the polyurethane to the PMMA was calculated for the above-mentioned sheet. As a result, the weight ratio of the polyurethane in 400 small pieces was 43.0%, the minimum value was 41.6%, and the maximum value was 44.5%. The ratio of the polyurethane shaped body to the ethylenically unsaturated compound polymer was 100/132.5.

接著,對上述薄片,沖切直徑600毫米的圓後,在一面形成寬度1.5毫米、深度0.5毫米、間距30毫米之圍棋格子狀的溝,製成研磨墊。研磨墊的表觀密度為0.84克/立方公分、獨立氣泡的平均氣泡直徑為34微米。能夠觀察到在表面有392個/平方毫米之來自氣泡的開口部。Next, the above-mentioned sheet was punched into a circle having a diameter of 600 mm, and a groove having a lattice shape of 1.5 mm in width, 0.5 mm in depth, and 30 mm in pitch was formed on one surface to prepare a polishing pad. The apparent density of the polishing pad was 0.84 g/cm 3 and the average bubble diameter of the closed cells was 34 μm. It was observed that there were 392/mm 2 openings from the bubbles on the surface.

進行研磨評價時,第1片及第20片的研磨速度係各自為1900埃/分鐘及1900埃/分鐘,面內均勻性各自為7%及8%。研磨500片後的研磨速度為1850埃/分鐘,面內均勻性為8%。又,平坦化特性係平坦化需要研磨120秒鐘。When the polishing evaluation was performed, the polishing rates of the first sheet and the 20th sheet were each 1900 Å/min and 1900 Å/min, and the in-plane uniformity was 7% and 8%, respectively. The polishing rate after grinding 500 sheets was 1,850 angstroms/minute, and the in-plane uniformity was 8%. Moreover, the flattening property is flattened and it takes about 120 seconds of polishing.

(實施例12)(Embodiment 12)

對實施例11之相互侵入高分子網目構造體之厚度方向1/5及4/5的部分進行切片及表面磨削,得到厚度2毫米的薄片。從該等薄膜的中央部沖切1號形小形試片,測定拉伸斷裂強度及拉伸斷裂延伸度時,各自為拉伸斷裂強度17.5MPa及拉伸斷裂延伸度330%、以及拉伸斷裂強度17.3MPa及拉伸斷裂延伸度330%。The portions in the thickness direction of the polymer mesh structure of Example 11 which were in the thickness direction of 1/5 and 4/5 were sliced and surface-ground to obtain a sheet having a thickness of 2 mm. When the No. 1 shaped test piece was punched from the center of the film and the tensile breaking strength and the tensile elongation at break were measured, each was tensile fracture strength of 17.5 MPa and tensile elongation at break of 330%, and tensile fracture. The strength is 17.3 MPa and the tensile elongation at break is 330%.

接著,對從上述厚度方向1/5部分所得到厚度2毫米的薄片,算出相對於聚胺甲酸酯與PMMA的和之聚胺甲酸酯的重量比。結果,在400個小片之聚胺甲酸酯重量比係平均值為40.4%、最小值為39.0%、最大值為41.8%。聚胺甲酸酯成形體與乙烯性不飽和化合物聚合物的比為100/147.5。Next, the weight ratio of the polyurethane of the sum of the polyurethane and the PMMA was calculated from the sheet having a thickness of 2 mm obtained from the 1/5 portion in the thickness direction. As a result, the weight ratio of the polyurethane in 400 small pieces was 40.4%, the minimum value was 39.0%, and the maximum value was 41.8%. The ratio of the polyurethane shaped body to the ethylenically unsaturated compound polymer was 100/147.5.

在實施例11及實施例12,從相同的相互侵入高分子網目構造體所得到厚度約2毫米的拉伸試片之拉伸斷裂強度及拉伸斷裂延伸度的值,在薄片內及在薄片間的差異小。又,實施例11及實施例12之聚胺甲酸酯重量比的薄片內分布,各自為43.0±1.5(%)及40.4±1.4(%),薄片面內的組成分布寬度小。得知厚度方向之組成亦均勻。得知藉由添加聚合抑制劑,特別是能夠提升薄片面內均勻性。In Example 11 and Example 12, tensile tensile strength and tensile elongation at break of a tensile test piece having a thickness of about 2 mm obtained from the same mutual intrusion into the polymer mesh structure, in the sheet and in the sheet The difference between the two is small. Further, the distribution in the sheet of the weight ratio of the polyurethane of Example 11 and Example 12 was 43.0 ± 1.5 (%) and 40.4 ± 1.4 (%), respectively, and the composition distribution width in the sheet surface was small. It is known that the composition in the thickness direction is also uniform. It has been found that by adding a polymerization inhibitor, in particular, the in-plane uniformity of the sheet can be improved.

從上述,在實施例與比較例之相互侵入高分子網目構造體,表觀密度、獨立氣泡的平均氣泡直徑、氣泡數等雖然同等,但在機械特性有差異。實施例之相互侵入高分子網目構造體與比較例之物比較時,拉伸斷裂強度及拉伸斷裂延伸度較高、且拉伸斷裂強度或拉伸斷裂延伸度依照位置之分布較小、均勻較高。而且由實施例之相互侵入高分子網目構造體所得到的研磨墊,CMP研磨時之面內均勻性高、平坦化特性優良,能夠大幅度地改善耐用期限。As described above, in the examples and the comparative examples, the polymer mesh structure was invaded, and the apparent density, the average cell diameter of the closed cells, the number of cells, and the like were the same, but the mechanical properties were different. When the mutually invading polymer mesh structure of the embodiment is compared with the material of the comparative example, the tensile breaking strength and the tensile elongation at break are high, and the tensile breaking strength or the tensile elongation at break is small and uniform according to the position distribution. Higher. Further, the polishing pad obtained by invading the polymer mesh structure from each other in the examples has high in-plane uniformity during CMP polishing and excellent flatness characteristics, and can greatly improve the durability.

產業上之利用可能性Industrial use possibility

本發明之研磨墊,能夠使用於矽晶圓等半導體基板、透鏡等光學零件、磁頭、硬碟等電子材料等之研磨。特別是在以平坦化半導體晶圓為目的、藉由化學機械研磨(CMP)技術進行研磨處理被研磨物之半導體晶圓時,使用作為研磨墊。The polishing pad of the present invention can be used for polishing a semiconductor substrate such as a tantalum wafer, an optical component such as a lens, an electronic material such as a magnetic head or a hard disk, or the like. In particular, when a semiconductor wafer for polishing a workpiece is polished by a chemical mechanical polishing (CMP) technique for the purpose of planarizing a semiconductor wafer, it is used as a polishing pad.

Claims (17)

一種相互侵入高分子網目構造體之製造方法,係包含浸漬製程及聚合製程之相互侵入高分子網目構造體之製造方法,該浸漬製程係將含有乙烯性不飽和化合物及自由基聚合引發劑之自由基聚合性組成物浸漬高分子成形體;而該聚合製程係在該浸漬有該自由基聚合性組成物之高分子成形體的膨脹狀態下,使該乙烯性不飽和化合物聚合之製程,其中在使自由基聚合性組成物浸漬高分子成形體之製程前,在該自由基聚合性組成物及/或該高分子成形體中添加鏈轉移劑及/或自由基聚合抑制劑。 A method for producing a mutually invading polymer mesh structure, which comprises a method for producing an intrusive polymer network structure comprising an impregnation process and a polymerization process, wherein the dipping process is free of an ethylenically unsaturated compound and a radical polymerization initiator The base polymerizable composition impregnates the polymer molded body; and the polymerization process is a process of polymerizing the ethylenically unsaturated compound in an expanded state of the polymer molded body impregnated with the radical polymerizable composition, wherein A chain transfer agent and/or a radical polymerization inhibitor is added to the radical polymerizable composition and/or the polymer molded body before the process of impregnating the polymer molded body with the radical polymerizable composition. 如申請專利範圍第1項之相互侵入高分子網目構造體之製造方法,其中係在該高分子成形體中添加鏈轉移劑及/或自由基聚合抑制劑。 A method for producing a mutually invading polymer mesh structure according to the first aspect of the invention, wherein a chain transfer agent and/or a radical polymerization inhibitor are added to the polymer molded article. 如申請專利範圍第1項之相互侵入高分子網目構造體之製造方法,其中該鏈轉移劑及/或自由基聚合抑制劑之分子量為350以下。 The method for producing a mutually invading polymer network structure according to the first aspect of the invention, wherein the chain transfer agent and/or the radical polymerization inhibitor has a molecular weight of 350 or less. 如申請專利範圍第1項之相互侵入高分子網目構造體之製造方法,其中該鏈轉移劑係選自具有碳數3~12的烷基之硫醇及芳香族烴系鏈轉移劑中一種以上之化合物。 The method for producing a mutually invading polymer network structure according to the first aspect of the invention, wherein the chain transfer agent is one or more selected from the group consisting of a thiol having an alkyl group having 3 to 12 carbon atoms and an aromatic hydrocarbon chain transfer agent. Compound. 如申請專利範圍第2項之相互侵入高分子網目構造體之製造方法,其中相對於100重量%該高分子成形體,在該 高分子成形體中添加0.01~20重量%鏈轉移劑。 A method for producing a mutually invading polymer mesh structure according to the second aspect of the patent application, wherein the polymer molded body is 100% by weight or more 0.01 to 20% by weight of a chain transfer agent is added to the polymer molded body. 如申請專利範圍第1項之相互侵入網目構造體之製造方法,其中該自由基聚合抑制劑係具有芳香環及至少一個以上羥基之一種以上化合物。 The method for producing a mutually invasive mesh structure according to the first aspect of the invention, wherein the radical polymerization inhibitor has one or more compounds having an aromatic ring and at least one or more hydroxyl groups. 如申請專利範圍第1項之相互侵入網目構造體之製造方法,其中該自由基聚合抑制劑係實質上未含有有機溶劑。 The method for producing a mutually invasive mesh structure according to the first aspect of the invention, wherein the radical polymerization inhibitor does not substantially contain an organic solvent. 如申請專利範圍第1項之相互侵入網目構造體之製造方法,其中該乙烯性不飽和化合物係選自甲基丙烯酸甲酯、甲基丙烯酸乙酯、甲基丙烯酸異丙酯、及甲基丙烯酸第三丁酯之化合物。 The method for producing a mutually invasive mesh structure according to the first aspect of the invention, wherein the ethylenically unsaturated compound is selected from the group consisting of methyl methacrylate, ethyl methacrylate, isopropyl methacrylate, and methacrylic acid. a compound of a third butyl ester. 如申請專利範圍第1項之相互侵入網目構造體之製造方法,其中在氧氣或含有氧氣之氣體存在下,使乙烯性不飽和化合物聚合。 The method for producing a mutually invasive mesh structure according to the first aspect of the invention, wherein the ethylenically unsaturated compound is polymerized in the presence of oxygen or a gas containing oxygen. 一種研磨墊之製造方法,含有使用藉由如申請專利範圍第1至9項中任一項之相互侵入高分子網目構造體的方法所得到之相互侵入高分子網目構造體來製造研磨墊之製程。 A method for producing a polishing pad comprising the process of producing a polishing pad by mutually invading a polymer mesh structure obtained by a method of mutually invading a polymer mesh structure according to any one of claims 1 to 9 . 一種研磨墊,係由含有高分子成形體及乙烯性不飽和化合物的聚合物之相互侵入高分子網目構造體所構成,係厚度1毫米以上、直徑300毫米以上的研磨墊,其中相對於高分子成形體與乙烯性不飽和化合物聚合物的合計重量,使高分子成形體的平均重量比為X(%)時,在研磨墊的任意位置之高分子成形體的重量比係在X±3(%)的範圍內。 A polishing pad comprising a polymer in which a polymer molded body and an ethylenically unsaturated compound are mutually invaded into a polymer mesh structure, and is a polishing pad having a thickness of 1 mm or more and a diameter of 300 mm or more, wherein the polishing pad is relative to the polymer. When the average weight ratio of the molded article and the ethylenically unsaturated compound polymer is X (%), the weight ratio of the polymer molded body at any position of the polishing pad is X ± 3 ( %)In the range. 如申請專利範圍第11項之研磨墊,其中拉伸斷裂強度為13MPa以上。 The polishing pad of claim 11, wherein the tensile breaking strength is 13 MPa or more. 如申請專利範圍第11項之研磨墊,其中拉伸斷裂延伸度為150%以上。 The polishing pad of claim 11, wherein the tensile elongation at break is 150% or more. 如申請專利範圍第11項之研磨墊,其中具有平均氣泡直徑為10~230微米之獨立氣泡。 For example, the polishing pad of claim 11 has independent bubbles having an average bubble diameter of 10 to 230 μm. 如申請專利範圍第11項之研磨墊,其中表觀密度為0.2~1.1克/立方公分。 For example, the polishing pad of claim 11 has an apparent density of 0.2 to 1.1 g/cm 3 . 如申請專利範圍第11項之研磨墊,其中高分子成形體與乙烯性不飽和化合物聚合物的重量比為100/5~100/300。 For example, in the polishing pad of claim 11, wherein the weight ratio of the polymer molded body to the ethylenically unsaturated compound polymer is 100/5 to 100/300. 一種半導體元件之製造方法,係含有使用如申請專利範圍第11項之研磨墊研磨半導體基板的表面之製程。 A method of manufacturing a semiconductor device, comprising the process of polishing a surface of a semiconductor substrate using the polishing pad of claim 11 of the patent application.
TW95127576A 2006-07-28 2006-07-28 Mutual invasive macromolecular reticular construct, grinding pad, and the preparing method thereof TWI400142B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW95127576A TWI400142B (en) 2006-07-28 2006-07-28 Mutual invasive macromolecular reticular construct, grinding pad, and the preparing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW95127576A TWI400142B (en) 2006-07-28 2006-07-28 Mutual invasive macromolecular reticular construct, grinding pad, and the preparing method thereof

Publications (2)

Publication Number Publication Date
TW200806430A TW200806430A (en) 2008-02-01
TWI400142B true TWI400142B (en) 2013-07-01

Family

ID=44766349

Family Applications (1)

Application Number Title Priority Date Filing Date
TW95127576A TWI400142B (en) 2006-07-28 2006-07-28 Mutual invasive macromolecular reticular construct, grinding pad, and the preparing method thereof

Country Status (1)

Country Link
TW (1) TWI400142B (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4841680A (en) * 1987-08-25 1989-06-27 Rodel, Inc. Inverted cell pad material for grinding, lapping, shaping and polishing
US5538465A (en) * 1992-07-07 1996-07-23 Shin-Etsu Handotai Co., Ltd. Elastic foamed sheet and wafer-polishing jig using the sheet
TW401347B (en) * 1996-11-08 2000-08-11 Procter & Gamble Three-dimensional sheet material and method of making same, and forming structure and method of making same
TW425331B (en) * 1998-07-10 2001-03-11 Cabot Microelectronics Corp Polishing pads for a semiconductor substrate
US7208267B2 (en) * 2000-11-22 2007-04-24 Diadexus, Inc. Compositions and methods relating to breast specific genes and proteins
TWI281493B (en) * 2000-10-06 2007-05-21 Mitsui Mining & Smelting Co Polishing material

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4841680A (en) * 1987-08-25 1989-06-27 Rodel, Inc. Inverted cell pad material for grinding, lapping, shaping and polishing
US5538465A (en) * 1992-07-07 1996-07-23 Shin-Etsu Handotai Co., Ltd. Elastic foamed sheet and wafer-polishing jig using the sheet
TW401347B (en) * 1996-11-08 2000-08-11 Procter & Gamble Three-dimensional sheet material and method of making same, and forming structure and method of making same
TW425331B (en) * 1998-07-10 2001-03-11 Cabot Microelectronics Corp Polishing pads for a semiconductor substrate
TWI281493B (en) * 2000-10-06 2007-05-21 Mitsui Mining & Smelting Co Polishing material
US7208267B2 (en) * 2000-11-22 2007-04-24 Diadexus, Inc. Compositions and methods relating to breast specific genes and proteins

Also Published As

Publication number Publication date
TW200806430A (en) 2008-02-01

Similar Documents

Publication Publication Date Title
KR101276962B1 (en) Process for producing interpenetrating polymer network structure and process for producing polishing pad using the same
US6705934B1 (en) Polishing pad
KR100709392B1 (en) Polishing Pad Containing Interpenetrating Liquified Vinyl Monomer Network With Polyurethane Matrix Therein
TW201629128A (en) UV curable CMP polishing pad and method of manufacture
JP2010077288A (en) Interpenetrating polymer network structure, polishing pad, and method for producing interpenetrating polymer network structure
JP5250934B2 (en) Improved polishing pad manufacturing method
WO2002006859A1 (en) Light diffusing films
KR101894071B1 (en) Uv-curable resin composition, polishing pad and preparation method thereof
EP3798244B1 (en) Resin composition, polishing pad, and method for producing polishing pad
JP5091230B2 (en) Retardation film, retardation film laminate and production method thereof
JP4892992B2 (en) Interpenetrating polymer network structure and polishing pad, and interpenetrating polymer network structure and method for producing polishing pad
TWI400142B (en) Mutual invasive macromolecular reticular construct, grinding pad, and the preparing method thereof
JP2007245308A (en) Polishing pad having low foaming region and its manufacturing method
JP5109409B2 (en) Polishing pad and method of manufacturing polishing pad
JP2009167315A (en) Method for producing porous material
JP4893023B2 (en) Method for producing interpenetrating polymer network structure, polishing pad using interpenetrating polymer network structure, and foamed polyurethane
JP2007181913A (en) Polishing pad
JP4845347B2 (en) Polishing pad and manufacturing method thereof
JP5176639B2 (en) Polishing pad
JP2013103329A (en) Polishing pad
JP2010242064A (en) Method for producing interpenetrating polymer network structure and polishing pad
JP2010234489A (en) Polishing pad
JP2006114666A (en) Polishing pad, its manufacturing method, and polishing method using the same
KR100699522B1 (en) Method for manufacturing polishing pad for wafer and the polishing pad
JP2013203782A (en) Composition, polishing pad and method for producing composition

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees