TWI272371B - Multipoint thickness measurement system - Google Patents

Multipoint thickness measurement system Download PDF

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Publication number
TWI272371B
TWI272371B TW091103292A TW91103292A TWI272371B TW I272371 B TWI272371 B TW I272371B TW 091103292 A TW091103292 A TW 091103292A TW 91103292 A TW91103292 A TW 91103292A TW I272371 B TWI272371 B TW I272371B
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Taiwan
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measured
thickness
ionization chamber
ionization
patent application
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TW091103292A
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Chinese (zh)
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Takeshi Kagawa
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Toshiba Corp
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/06Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring the deformation in a solid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/08Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring roughness or irregularity of surfaces

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

A multipoint thickness measurement system is provided to reduce the difference about the sensitivity for radiation of an ionization chamber in the width direction and to accurately measure the thickness of a board. An ionization chamber (5) is arranged in a detecting section (2) and turned around in the clockwise or counterclockwise direction in relation to the direction in which an object (4) to be measured flows. Thereby, a low sensitive region for the radiation existing in conventional arrangement of the ionization chamber is eliminated, and the measurement of the object to be measured is carried out continuously and accurately in the width direction.

Description

1272371 A7 B?1272371 A7 B?

五、發明説明( [發明之背景及技術領域] 其使用放射線以非 本發明係有關一種多點測量厚度計 接觸方式測量被測量物的厚度。 [先前技術] 近年來,由於在鋼鐵工業上滾鱼丨 古,带η# 展軋的形狀控制的需求提 回,所以被要求要有更適合於控 义 制的板形狀的測量器。先 刖’板九度方向的厚度測量是用 ^ ^ . ^ t 子 里疋用知描型厚度計等測量,然 而因為被測量物大部份時候,即 士 jh ^ 在板厚測量時也是連 ,地在移動,所以單單那樣 ._ . W m /2r衣侍板形狀。因此, ::::場合,除了掃描型厚度計以外,引進測量板中心 ’、曰十藉此以取得的數據為基礎做補正來求得板形 狀0 :於多點測量厚度計,參照圖15說明。在水平配置的板 狀被測量物4的板方向上下猶留一點距離而對置地… 聖才勺上方配置檢出部2, 17型框1的下方配置產生器3。 :出部2,信號被送到厚度演算器7。檢出部2:產生 态3被固定在口型框卜在檢出部2内,®筒的電離箱5好幾 個平行地被配置在被測量物2的寬度方向,這些電離箱雖 然?知^產生器3輸出的扇形狀放射線,但是電離箱5的形 狀是圓筒狀,在其中心部和邊緣部對放射線的靈敏度有極 大的差別。對此,以圖16〜圖18進一步說明。 圖16係表示電離箱5及被測量物4的位置關係的立體圖。 由產生器3輸出的扇形狀放射線以虛線表示。圖17係表示 由電離箱5的正上方看到的情況的AA,視圖。電離箱5,如 X 297公釐) 财關家 1272371V. INSTRUCTION DESCRIPTION OF THE INVENTION [Background of the Invention and Technical Field] The use of radiation to measure the thickness of an object to be measured by a multi-point thickness gauge contact method other than the present invention [Prior Art] In recent years, due to the rolling in the steel industry Yuyugu, with the need to control the shape of the η# roll, is required to have a plate shape measuring device that is more suitable for the control system. The thickness measurement in the nine-degree direction of the board is ^ ^. ^ t 疋 疋 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知 知In the :::: occasion, in addition to the scanning type thickness gauge, the center of the measuring board is introduced, and the tenth is used to make correction based on the obtained data to obtain the shape of the board 0: measuring the thickness at multiple points Referring to Fig. 15, a horizontal distance is left and left in the horizontal direction of the plate-shaped object 4 to be placed horizontally, and the detector 3 is disposed above the sacrificial scoop. : Out of 2, the signal is sent to the thickness Actuator 7. Detection unit 2: The production state 3 is fixed in the mouth frame in the detection portion 2, and the ionization chambers 5 of the cartridge are arranged in parallel in the width direction of the object 2 to be measured. Although the fan-shaped radiation output from the generator 3 is known, the shape of the ionization chamber 5 is cylindrical, and the sensitivity of the radiation at the center portion and the edge portion is greatly different. For this, further to FIGS. 16 to 18 Fig. 16 is a perspective view showing the positional relationship between the ionization chamber 5 and the object to be measured 4. The fan-shaped radiation outputted from the generator 3 is indicated by a broken line. Fig. 17 shows the AA seen from the directly above the ionization chamber 5. , view. Ionization box 5, such as X 297 mm) Treasurer 1272371

圖17所示,面對被測量物4平行地排列著。因為電離箱5的 邊緣部比起中心部靈敏度低,所以很難檢出被測量物4的 顯著之點(缺陷)。 在圖18係表示將電離箱5面對被測量物4平行排列時候的 靈敏度分佈。如圖18所示,因為電離箱5的靈敏度低,所 以麦成周期性地存在有無法高精度地測量板厚的不靈敏 區’且變成無法得到寬度方向的連續性的厚度值。 此外,將邊緣部以高分解能力·高精度能夠測量的裝置 的需求曰益增加,但是在先前的多點測量厚度計,在對於 存在於電離箱和電離箱之間的放射線靈敏度低的領域(以 下稱為不靈敏區)無法進行高精度的測量,且很難得到連 續性的邊緣形狀。 [發明所欲解決之課題] —如上所述,點測量厚度計在測量位置的板厚係取在電離 相子的鬲度方向入射的放射線量的總和的平均再變換為板 厚,但是因為電離箱是圓筒狀,所以中心部對放射線的靈 敏度最高,有所謂隨著越接近邊緣其靈敏度就越低的 性。 為此,測量點數正好是不靈敏區的時候,電離箱的高度 :向全區域變成所謂的不靈敏區。為此,於該位置靈敏: 變成顯著地降低,在測量被測量物的寬度方向的板厚的時 候,出現無法測量的地方。 此外,從被測量物的邊緣部進行在任意距離的位置的厚 度測量的的時候’ *寬度計等的外部裝置將被測量物的寬As shown in Fig. 17, the objects to be measured 4 are arranged in parallel. Since the edge portion of the ionization chamber 5 is less sensitive than the center portion, it is difficult to detect a significant point (defect) of the object 4 to be measured. Fig. 18 shows the sensitivity distribution when the ionization chamber 5 faces the objects 4 to be aligned in parallel. As shown in Fig. 18, since the sensitivity of the ionization chamber 5 is low, there is a thickness value in which the insensitivity region of the thickness cannot be measured with high precision and the continuity in the width direction cannot be obtained. In addition, the edge portion is increased in demand for a device capable of measuring with high resolution and high precision, but in the previous multi-point thickness gauge, in the field of low sensitivity to radiation existing between the ionization chamber and the ionization chamber ( Hereinafter, it is called a dead zone), high-precision measurement cannot be performed, and it is difficult to obtain a continuous edge shape. [Problem to be Solved by the Invention] - As described above, the thickness of the spot-measuring thickness gauge at the measurement position is converted to the plate thickness by the average of the sum of the amounts of radiation incident in the direction of the ionization phase, but because of ionization Since the box is cylindrical, the center portion has the highest sensitivity to radiation, and there is a so-called sensitivity that is lower as it approaches the edge. For this reason, when the number of measurement points is exactly the insensitive area, the height of the ionization box becomes a so-called insensitive area to the entire area. For this reason, it is sensitive at this position: it becomes remarkably lowered, and when measuring the thickness of the width direction of the object to be measured, there is a place where measurement is impossible. In addition, when the thickness of the position at any distance is measured from the edge portion of the object to be measured, the external device such as the width meter will measure the width of the object.

A7 B7 1272371 五、發明説明(3 ) 度值輸入;#、异器’雖然合併計被測量物的蛇行量,藉由移 動驶置6使多點測量厚度計移動而進行測量,然而在台車 移動到目標位置為止,無法進行在目標位置的測量。 另一方面,讓電離箱鄰接而排列的時候,因為由鄰接的 電離箱的散射線射入電離箱,所以恐怕會有邊緣部的精度 降低、分解能力降低等對測量結果帶來不良的影響。 本發明係考慮過上述的情況而作成,其目的在減少對於 由於測量位置的放射線的靈敏度的差別,提供能夠有更好 的見度方向測量的多點測量厚度計。 [課題之解決手段] 為了達成上述目的,關於申請專利範圍第i項的發明, 其特徵為具有放射線源、電離箱;且具備一種檢出手段, 其係用以取得與從放射線源被放射、透過被測量物而被入 射的放射線強度相關的輸出信號;及一種演算手段,其係 由該檢出手段的輸出信號運算上述被測量物的厚度,且使 上述電離箱對著上述被測量物的流動方向,以任意的角度 旋轉而排列。 根據關於申請專利範圍第丨項的發明,能夠消弭在先前 的電離箱配置所存在的不靈敏區部份,且能夠連續性、高 精度地測量被測量物的寬度方向。 關於申請專利範圍第2項的發明,根據關於申請專利範圍 第1項之多點測量厚度計,其中其中上述運算手段係被輸 入由測量上述被測量物的厚度的手段所測量的厚度值,運 算上述被測量物的邊緣位置、或是中心位置;且能夠判定 -6-A7 B7 1272371 V. Description of invention (3) Degree value input; #, 异器' Although the amount of snakes of the measured object is combined, the multi-point thickness gauge is moved by moving the drive 6 to measure, but the trolley moves Measurement to the target position cannot be performed until the target position. On the other hand, when the ionization chambers are arranged adjacent to each other, since the scattering lines of the adjacent ionization chambers are incident on the ionization chamber, there is a fear that the accuracy of the edge portion is lowered and the decomposition ability is lowered, which adversely affects the measurement results. The present invention has been made in view of the above circumstances, and its object is to provide a multi-point thickness gauge capable of having a better visibility direction measurement while reducing the difference in sensitivity to radiation due to a measurement position. [Means for Solving the Problem] In order to achieve the above object, the invention of claim i is characterized in that it has a radiation source and an ionization chamber, and has a detection means for obtaining and emitting radiation from a radiation source, An output signal related to the intensity of the radiation incident through the object to be measured; and an arithmetic means for calculating the thickness of the object to be measured by an output signal of the detecting means, and causing the ionization box to face the object to be measured The flow direction is arranged by rotating at an arbitrary angle. According to the invention of the third aspect of the patent application, it is possible to eliminate the portion of the dead zone existing in the previous ionization chamber configuration, and to measure the width direction of the object to be measured continuously and with high precision. In the invention of claim 2, the multi-point thickness measuring instrument according to the first aspect of the patent application, wherein the arithmetic means is input to a thickness value measured by means for measuring the thickness of the object to be measured, The edge position or the center position of the above-mentioned object to be measured; and can determine -6-

12723711272371

發明説明( 手段的輸出信號所運算的厚度的被測量物 達緣位置、或是由令心位置所距離的位置。 關於申請專利範圍笛2 項之多點測量厚产發明’根據申請專利範圍第! 檢出上述被測量:邊缘==手段,係被輸入來自 量物的邊緣位置,且號’運算上述被測 輸出信號所運算的;;:::關從藉由上述檢出手段的 位置。 予度的上述被測量物邊緣位置所距離的 項:=!,第4項的發明,根據申請專利範圍第! 外度計,其中上述運算手段,係被輸入來自 ^ 中心㈣量,運算上述被測量物的中心位置, =夠判定有關從藉由上述檢出手段的輸出信號所運算的 厚度的上述被測量物邊緣位置所距離的位置。 關^請專利範圍第5項的發明,根據f請專利 量 求 算 ==厚度計’其中上述電離箱,被排列於包含目 “丨1,置的特定範圍位置;上述演算手段係為:測量上 ^測置1寬度的手段、或是檢出上述被測量物的邊緣的 4又、或是從外部裝置的輸出信號被輸人,求上述被測 ^的邮量、,並且以多數的測量位置的厚度值為基礎 用以π出測罝位置間的厚度,藉由上述内插函數而運 I上这目標測量位置蛇行量偏離位置的厚度值者。 從 根據關於申請專利範圍第5項的發明,即使被測量物 目標測量位置偏離的時候,也能夠連續地測量寬度。 關於申請專利範圍第6項的發明,根據巾請專利範圍第 1272371 A7 B7 五、發明説明(5 項之多點測量厚度計,其中上述 电雉相係為從圓筒的側面 :射放射線的構造;且使用上述電離箱的全長、及於上述 電離箱侧壁厚度乘上安全比率而求得的不靈敏區的值,決 :了對者上述被測量物的流動方向,上述不靈敏區會消失 的上述電離箱之旋轉角度。 關於申請專利範圍第7項的發 适夕夕科如旦广 根據申請專利範圍第1 二射二Μ"里旱度计I中上述電離箱係為從圓筒的側面 :射放射線的構造;且使用上述電離箱的全長、及利用對 離箱内徑和上述電離箱中心部的氣體量比率而求 敏區的值,決定了對著上述被測量物的流動方 向上述不靈敏區會消失的上述電離箱之旋轉角度。 ==範圍第8項的發明,根據申請專利範圍第〗 和氣體充滿係數而求得的不靈敏, 二:;二量物的流動方向,上述不靈敏區會消失的上 兒為隹相之旋轉角度。 -9! : #^ ^ ,i I, S ,, 箱之間插入墊板之夕上則里尽度计,其中於鄰接的2個電離 :二= 有關Γ請專利範圍第9項的發明,《沒有由 的散亂線的影響,能夠進行沒有邊緣部 货度降低、分解能力$低等波 要原因之精密測量。 里、、。果的壞影響的主OBJECTS OF THE INVENTION (The thickness of the measured object calculated by the output signal is the position of the edge of the object to be measured, or the position of the distance from the center of the center of the handle. The above measured value is detected: the edge == means is input from the edge position of the object, and the number 'calculates the operation of the measured output signal;;::: off the position by the above detection means. The term of the distance from the edge position of the above-mentioned object to be measured: =!, the invention of the fourth item, according to the scope of the patent application, the external measure, wherein the above-mentioned operation means is input from the center (four) amount, and the above-mentioned The center position of the object to be measured is sufficient to determine the position of the edge position of the object to be measured from the thickness calculated by the output signal of the above-described detection means. The calculation of the patent quantity == thickness meter] wherein the above-mentioned ionization box is arranged in a specific range position including the target "丨1"; the above calculation means is: means for measuring the width of the upper one, Is to detect the edge of the object to be measured 4 or the output signal from the external device is input, to obtain the measurable amount of the above measured, and based on the thickness value of the majority of the measurement position for π out The thickness between the measurement positions is calculated by the above interpolation function, and the thickness value of the target measurement position meander deviation from the position is obtained. From the invention according to the fifth aspect of the patent application, even if the object measurement position of the object to be measured deviates In the case of the invention of claim 6, the invention of claim 6 is based on the scope of the patent application No. 1272371 A7 B7. 5. Description of the invention (5 items of multi-point thickness measurement, wherein the above-mentioned electric system is From the side of the cylinder: the structure of the radiation; and the value of the dead zone obtained by multiplying the total length of the ionization box and the thickness of the side wall of the ionization box by the safety ratio is determined by the opposite object The flow direction, the above-mentioned insensitive area will disappear the rotation angle of the above-mentioned ionization box. About the application of the scope of the seventh item of the eve of the law, according to the patent application range of the first two shots The above-mentioned ionization chamber is a structure from the side of the cylinder: radiation; and the total length of the ionization chamber is used, and the ratio of the gas volume to the inner diameter of the tank and the center of the ionization chamber is used. The value of the sensitization zone determines the rotation angle of the ionization chamber in which the insensitive area disappears in the flow direction of the object to be measured. == The invention of the eighth item, according to the scope of the patent application and the gas fullness coefficient And the insensitivity is obtained, 2:; the flow direction of the two objects, the above-mentioned insensitive area will disappear, the upper part is the rotation angle of the prime phase. -9! : #^ ^ , i I, S ,, between the boxes On the eve of the insertion of the bolster, the end of the meter, in the adjacent two ionization: two = the invention of the ninth patent scope, "without the influence of the scattered line, can carry out the edge without the cargo Reduced, decomposed ability, low-frequency, and so on. in,,. The main influence of the bad influence

1272371 A7 --—---- B7 五、發明説明(6 ) [發明之實施形態] 以下,參照設計圖對有關本發明的實施的形態加以說 月再者在以下的圖,包含先前例子的圖,同一符號係 表示是同一部分或對應部分。 & μ (第1例的實施形態) 苓照圖1〜圖4對有關本發明第丨例的實施形態加以說明。 在圖1,能夠測量板狀的被測量物4的板厚那樣地,進行 藉由多點測量厚度計移動裝置6的口型框丨的寬度方向移動 操作。產生器3被固定於〕型框i的下方,檢出部2被固定 於^型框1的上方。此外電離箱5被排列在檢出部2内。 由產生器3輸出的放射線透過被測量物4入射電離箱$。 入射的放射線將被封入於電離箱5内的氣體藉由光電吸 收、康普頓散射、電子對生成等的作用電離,此時產生的 電荷藉由在電極間增加的電場被電極拉攏,再電極再結合 而還原到中性的原+。此時流出去的電流成為檢出部2的 輸出信號,在A/D轉換後被送至厚度運算器7,轉換成被 測量物4的厚度值。 在先丽的例子,如上所述,因為將電離箱5對著被測量 物4平行地配置,所以不靈敏區周期性地存在,無法得到 寬度方向的連續性厚度值。因此,在該實施形態,變更電 離箱5的配置,要將不靈敏區去除。 圖2係表不在該實施形態的電離箱5與被測量物4位置關 係的立體圖。由產生器3輸出的扇形上的放射線以虛線表 示。圖3係表示由電離箱5的正上方所看到情況的八八,方^ -9 - 1272371 A7 ___________ _____ B7 五、發日—ΓΤ———^ -—〜一~- 視圖。如圖3所示,係將電離箱5的排列對著被測量物4傾 斜排列的構造。如此地,將電離箱5在從被測量物4的正上 方所看到的平面上,以對著被測量物4的流動方向,時鐘 f向或反時鐘方向使在任意的角度旋轉的狀態排列,能夠 消弭因為先前的電離箱的配置所存在的不靈敏區& =將被測量物4的寬度方向做連續性地、且極精密地測 量〇 在圖4係表示將電離箱5對著被測量物4的流動方向,在 使其時鐘方向或反時鐘方向旋轉的該實施形態靈敏度分 布。由圖上非常清楚地,對於被測量物4板寬度的方向, 、交成能夠得到一定程度以上的靈敏度。因此,在被測量物 4局部性地有顯著之點(缺陷)的時候,能夠將此輕易地檢 出。 欢 (第2例的實施形態) 圖5係表示本發明第2例的實施形態的構成圖。在該實施 形態’於厚度運算器7,與第1例的實施形態的情況同樣 地’由檢出部2的輸出信號運算被測量物4的厚度的同時, 將以寬度計8測量的板寬值度輸入厚度運算器7,運算被測 1物4的板邊緣位置、或是板中心位置。 因此’在運算器7,對於由檢出部2的輸出信號所運算的 厚度,能夠判定被測量物4的板邊緣位置、或是由板中心 位置距離的位置。 (第3例的實施形態) 圖6係表示本發明第3例的實施形態的構成圖。在該實施 -10 _ 财關家辟(CNS) A4規格(21〇 X 297公釐) " "~~" " 12723711272371 A7 ------- B7 V. EMBODIMENT (6) [Embodiment of the Invention] Hereinafter, the embodiment of the present invention will be described with reference to the drawings, and the following figures are included, including the previous examples. In the figures, the same symbol indicates that it is the same part or the corresponding part. & μ (Embodiment of First Example) An embodiment of the third embodiment of the present invention will be described with reference to Figs. 1 to 4 . In Fig. 1, the width direction movement operation of the lip frame of the thickness gauge moving device 6 by multi-point measurement can be performed by measuring the thickness of the plate-shaped object 4 to be measured. The generator 3 is fixed below the frame i, and the detecting portion 2 is fixed above the frame 1. Further, the ionization tank 5 is arranged in the detecting portion 2. The radiation output from the generator 3 is incident on the ionization chamber $ through the object 4 to be measured. The incident radiation is ionized by the gas enclosed in the ionization chamber 5 by photoelectric absorption, Compton scattering, electron pair generation, etc., and the electric charge generated at this time is pulled by the electrode by the electric field added between the electrodes, and the electrode is further re-electrode Recombined and restored to a neutral original +. The current that has flowed out at this time becomes an output signal of the detecting unit 2, and is sent to the thickness calculator 7 after the A/D conversion, and converted into the thickness value of the object 4 to be measured. In the case of the predecessor, as described above, since the ionization chamber 5 is disposed in parallel to the object to be measured 4, the dead zone is periodically present, and the continuous thickness value in the width direction cannot be obtained. Therefore, in this embodiment, the arrangement of the ionization tank 5 is changed, and the dead zone is removed. Fig. 2 is a perspective view showing the positional relationship between the ionization chamber 5 and the object to be measured 4 which are not in the embodiment. The radiation on the sector output by the generator 3 is indicated by a broken line. Fig. 3 is a view showing the eight-eighth, square -9 - 1272371 A7 ___________ _____ B7 five, hair day - ΓΤ - - ^ - - ~ one ~ - view seen from directly above the ionization box 5. As shown in Fig. 3, the arrangement of the ionization chambers 5 is arranged obliquely to the objects 4 to be measured. In this way, the ionization chamber 5 is arranged in a state of being viewed from directly above the object to be measured 4 in a state of being rotated at an arbitrary angle with respect to the flow direction of the object to be measured 4, the clock f or the counterclockwise direction. It is possible to eliminate the insensitive area existing in the configuration of the previous ionization box & = continuously and extremely accurately measure the width direction of the object 4 to be measured. FIG. 4 shows that the ionization chamber 5 is facing the The flow direction of the measuring object 4 is a sensitivity distribution of the embodiment which is rotated in the clock direction or the counterclockwise direction. It is very clear from the figure that the sensitivity of the direction of the width of the plate 4 of the object to be measured can be obtained to a certain extent or more. Therefore, when the object 4 to be measured has a significant point (defect) locally, it can be easily detected. (Embodiment of the second example) Fig. 5 is a configuration diagram showing an embodiment of the second example of the present invention. In the thickness calculation unit 7 of the embodiment, the thickness of the object 4 is calculated by the output signal of the detecting unit 2, and the plate width measured by the width meter 8 is calculated as in the case of the embodiment of the first example. The value is input to the thickness operator 7, and the board edge position of the object 4 to be measured or the center position of the board is calculated. Therefore, in the arithmetic unit 7, the thickness calculated by the output signal of the detecting unit 2 can determine the position of the board edge of the object 4 or the position of the board center position. (Embodiment of the third example) Fig. 6 is a configuration diagram showing an embodiment of the third example of the present invention. In the implementation -10 _ Cai Jian Jia (CNS) A4 specifications (21〇 X 297 mm) ""~~"" 1272371

發明説明( 形恶於厚度運异器7,與第i例的實施形態的情況 地、,由檢出部2的輸出信號演算被測量物4的厚度的同^ 將以邊緣感應裔9檢出的信號輸入厚度運算器7 洌 量物4的板邊緣位置。 連^破测 因此,在運异器7,對於由檢出部2的輸出信號所運算的 厚度,能夠判定從被測量物4的板邊緣位置距離的位置二 (第4例的實施形態) μ圖7係表示本發明第4例的實施形態的構成圖。在實施形 悲’於厚度運异器7,與第i例的實施形態的情況同樣地, ^檢出部2的輸出信號運算被測量物4的厚度的同時,藉由 高階計算機等的外縣置職板巾心偏差量輸人厚度運曾 器7,運算板中心位置。 开 因此,在運算器7,對於由檢出部2的輸出信號所運算的 厚度,能夠判定從被測量物4的板中心位置距離的位置。 (第5例的實施形態) 圖8〜圖10係說明本發明的第5例的實施形態的圖。 女圖8係表示為了測量由被測量物4的邊緣部離開任意的距 離的板厚,使用像如第丨例實施形態的構成的多點測量厚 度计的4候的構成。多點測量厚度計為了測量由被測量物 4的邊緣離開任意的距離的目標位置,在以此位置為中心 的特定範圍的位置’能夠測量板厚那樣地而排列電離箱 在厚度運算器7,由檢出部2的輸出信號求得在目標測量 位置附近的特定範圍的多數的測量位置的板厚值m、 -11 - 本紙張尺度適用中國國家標準(CNS) A4規格(21〇 X 297公釐) 1272371(Description of the Invention) In the case of the embodiment of the first embodiment, the thickness of the object to be measured 4 is calculated by the output signal of the detecting unit 2, and the edge sensor 9 is detected. The signal input thickness operator 7 measures the position of the edge of the plate 4 of the object 4. Therefore, the thickness of the object to be measured 4 can be determined by the weight of the object to be measured 4 Position 2 of the position of the edge position of the board (Embodiment of the fourth example) Fig. 7 is a configuration diagram showing an embodiment of the fourth example of the present invention. The implementation of the shape difference device 7 and the implementation of the i-th example In the same manner, the output signal of the detection unit 2 calculates the thickness of the object 4 to be measured, and the thickness of the object is changed by the value of the deviation of the platen heart rate by the high-order computer or the like. In this case, the operator 7 can determine the position from the plate center position of the object 4 by the thickness calculated by the output signal of the detecting unit 2. (Embodiment 5) FIG. 8 Fig. 10 is a view for explaining an embodiment of a fifth example of the present invention. In order to measure the thickness of the distance from the edge of the object 4 by an arbitrary distance, a multi-point thickness gauge of the configuration of the embodiment of the first embodiment is used. The multi-point thickness gauge is used for measurement. The edge of the object 4 is separated from the target position of an arbitrary distance, and the ionization box is arranged in the thickness operator 7 at a position of a specific range centering on the position, and the output signal of the detecting unit 2 is outputted. Find the plate thickness value m, -11 of the majority of the measurement position in the specific range near the target measurement position - This paper size applies to the Chinese National Standard (CNS) A4 specification (21〇X 297 mm) 1272371

五、發明説明(9 112、113,此外,一曰, 一错由見度計8、或是從邊緣感應器9 的輸出信號求得邊緣位置,4岡 一 直,如圖9在所不,能夠將板厚值V. Description of the invention (9 112, 113, in addition, one 曰, one error is obtained from the indicator 8 or the edge position is obtained from the output signal of the edge sensor 9, 4 gangs are always, as shown in Fig. 9 Plate thickness

111、112、113,繪至對座伙A * A t應於從各自邊緣位置到測量位置 距離的位置,將這些的★ 旦 一们板;測置結果以内插函數114連 結、圖形化。目標測量位詈 g由 、丄 视置,即使位在廷些實際的測量位 置之間的時候’由内插函翁】U At納七 山數114,此夠求得從邊緣位置離 開任意距離115的目標测量位置的板厚值丨丨6。 一再者,㈣量物4穿過來時,幾乎皆是沿寬度方向邊蛇 行邊來的情況。將由寬度計8、或是邊緣感應器9、或是外 部裝置H)等的板寬度、或是邊緣位置、或是表示中心偏差 厚量(蛇行量)等的輸出信號輸入厚度運算器7,運算被測 量物4的蛇行量。然後,將目標測量位置附近的板厚測量 結果以内插函數20結合,如圖1〇所示圖形化。亦即,將在 目標測量位置附近的板厚值17及在其附近的位置板厚值 18、19用以插函數20結合。藉由從寬度計8等得到的邊緣 位置,板偏差量亦即是蛇行量21被算出的時候,由内插函 數20求得板厚值22。因為將該值作為目標測量位置的板厚 值,從目標測量位置即使被測量物4偏差的時候,也能夠 連續地測量板厚。 (第6例的實施形態) 圖11〜圖13係說明本發明的第6例實施形態的圖。對於電 離箱5的放射線靈敏度係與電離箱5内的氣體量成比例。因 為在電離箱5的邊緣部氣體量少所以靈敏度降低,電離箱5 的側壁部分對於放射線的靈敏度變成消失。 -12- 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 1272371111, 112, 113, drawn to the position of the seat A * A t from the respective edge position to the measurement position distance, these will be the board; the measurement results are connected and graphically interpolated by the interpolation function 114. The target measurement position 詈g is set, and the 丄 is set, even if the position is between the actual measurement positions, the 'interpolation letter' U U Naqishan number 114, which is enough to get away from the edge position by any distance 115 The target measurement position is the plate thickness value 丨丨6. Again and again, (4) when the amount of material 4 passes through, almost all of them are snaked along the width direction. The thickness of the plate, or the edge position of the edge sensor 9, or the external device H), or an output signal indicating the thickness of the center deviation (snake amount) is input to the thickness operator 7, and the operation is performed. The amount of snakes of the object 4 to be measured. Then, the plate thickness measurement results near the target measurement position are combined by the interpolation function 20, as shown in Fig. 1A. That is, the plate thickness value 17 near the target measurement position and the position plate thickness values 18, 19 in the vicinity thereof are used for the interpolation function 20. When the plate deviation amount, i.e., the meandering amount 21, is calculated from the edge position obtained from the width meter 8 or the like, the plate thickness value 22 is obtained from the interpolation function 20. Since this value is used as the plate thickness value of the target measurement position, the plate thickness can be continuously measured even when the object 4 is deviated from the target measurement position. (Embodiment of the sixth embodiment) Figs. 11 to 13 are views for explaining a sixth embodiment of the present invention. The radiation sensitivity to the ionization chamber 5 is proportional to the amount of gas in the ionization chamber 5. Since the amount of gas is small at the edge portion of the ionization chamber 5, the sensitivity is lowered, and the sensitivity of the side wall portion of the ionization chamber 5 to the radiation becomes disappeared. -12- This paper scale applies to Chinese National Standard (CNS) A4 specification (210 X 297 mm) 1272371

在此TJ亥貫施在形態雷雜 唆的槿-… 為從圓筒的側面入射放射 :二r1所示,對著被測量物的流動方向,4 此不Α敏區要消失的電離箱5的旋轉角度α。 疋 * :先’料決定旋轉角度α的第"重方法, 長,及於電離箱側壁的肉厚(厚度)乘上安全比率 求付的f靈敏區的值來求得。料,電離箱5的全長^ 相側壁的肉厚t乘上安全比率丫所求得的不靈敏 : 值為T( = t •”的時候,對著被測量物4的流動方 〖…不靈敏區要消失的電離箱5的旋轉角度α為α =tan-(丁/L)破求得。安全比率γ為任意的常數(例如2)。 其次,作為決定旋轉角度α的第2種方法,能夠使用電 離:的全長,及使用對於電離箱内徑及電離箱中心部的氣 體量比所求得的不靈敏區的值來求得。如圖12所示,將對 於電離II 5中心部〇氣體量比成為e的位置當作成為不靈敏 區11的境界的位置’通過中心部⑽水平線上的該位置當 作B亦即,位置B將電離箱内徑當作2r的時候,從位置B 至其上方的内壁的位置c的距離為“的話,就要變成ii=c· r的位置。料,纟圖上將中心部〇上方的内壁的位置為 A,從中心部〇至位置B的距離為〖,,,從位置B至其水平方 向的内壁的位置D的距離為t,,〇A和〇c形成的角度當作 /3。 在此,雖然i1=c · r,然而從圖上,因為變成li=rc〇s沒, 所以c= cos冷,因此,對於電離箱中心部的氣體量比。一旦 被給與的話,就能夠求得角度万。再者,從圖上,因為 -13- 1272371 A7 B7 五、發明説明(μ t =rsln々,所以不靈敏區11的值丁能夠如下列公式求得。 (公式1) T = t+t’ =t+(r-t”) ==t+r ( 1- sin β ) 然後,從如此求得的不靈敏區丨丨的值τ及電離箱5的全長 2L ’對著被測量物4的流動方向,將不靈敏區要消失的電 離相5旋轉角度α作為α : tan々T/L)就能夠求得。再者, 對於電離箱中心部的氣體量比e能給與任意的f 0.5) 〇 再者,作為第3種方法,能夠使用電離箱的全長,及以 電離相外從和氣體充滿係數(氣體充滿的有效直徑係數)求 得的不靈敏區值來求得。電離箱外部直徑當作2R的時候, 如圖13所不,在通過電離箱5的中心部〇的水平線上,從中 口F Ο的距離,將於電離箱外部直徑的一半的值r乘上氣 體充滿係數c’的值的位置E當作不靈敏區丨丨的境界,如下 列公式求得不靈敏區11的值T。 (公式2) 丁 = R - cfR ^ R (1 - cf) …、後L攸如此求得的不靈敏區11的值T及電離箱5的全長 jL"對著被測量物4的流動方向,將不靈敏區要消失的電 離相5疑轉角度α作為α = 就能夠求得。再者, 氣體充滿係數c,能給與任意的常數(例如左右的 _______ -14 - 本錄尺歧格(21()X297公董)-- 1272371 A7In this case, the TJ is applied to the ridge of the shape of the thunder -... for the incident radiation from the side of the cylinder: as shown by the second r1, facing the flow direction of the object to be measured, 4 the ionization box 5 where the non-sensitized area is to disappear The angle of rotation α.疋 * : First, the material is determined by the "degree" of the rotation angle α, and the length, and the thickness (thickness) of the side wall of the ionization box are multiplied by the value of the f sensitive area of the safety ratio. Material, the thickness t of the full length of the ionization box 5 multiplied by the safety ratio 丫 is not sensitive: when the value is T (= t •), the flow side of the object 4 is not sensitive The rotation angle α of the ionization chamber 5 to be eliminated in the region is obtained by α = tan - (D / L). The safety ratio γ is an arbitrary constant (for example, 2). Next, as the second method of determining the rotation angle α, The total length of the ionization: and the value of the dead zone determined for the inner diameter of the ionization chamber and the gas amount at the center of the ionization chamber can be used. As shown in Fig. 12, for the center portion of the ionization II 5 The position where the gas amount ratio becomes e is regarded as the position which becomes the boundary of the dead zone 11. The position on the horizontal line of the center portion (10) is regarded as B, that is, when the position B treats the inner diameter of the ionization chamber as 2r, from the position B When the distance to the position c of the inner wall above is ", the position of ii=c·r is changed. The position of the inner wall above the center portion is A, and the position from the center portion to the position B is shown in the figure. The distance is 〖,,, the distance from the position B to the position D of the inner wall in the horizontal direction is t, 〇A and 〇 The angle formed by c is taken as /3. Here, although i1=c · r, from the figure, since it becomes li=rc〇s, c=cos is cold, and therefore, the gas amount ratio for the center of the ionization box Once given, you can get the angle of 10,000. Again, from the figure, because -13- 1272371 A7 B7 five, the invention description (μ t = rsln々, so the value of the insensitive zone 11 can be as follows The formula is obtained. (Formula 1) T = t+t' = t + (rt") == t + r ( 1- sin β ) Then, the value τ of the insensitive zone 求 thus obtained and the ionization chamber 5 The full length 2L' can be obtained by looking at the flow direction of the object 4 and the ionization phase 5 rotation angle α at which the insensitive area is to disappear as α: tan々T/L. Further, for the center of the ionization box The gas amount ratio e can be given an arbitrary f 0.5). Further, as the third method, the entire length of the ionization chamber can be used, and the ionization phase is derived from the gas filling factor (the effective diameter coefficient of gas filling). The insensitive zone value is obtained. When the outer diameter of the ionization chamber is regarded as 2R, as shown in Fig. 13, the horizontal line passing through the center of the ionization chamber 5 From the distance of the middle mouth F ,, the value r which is half the value of the outer diameter of the ionization box multiplied by the value of the gas fullness coefficient c' is regarded as the boundary of the insensitive area ,, and the dead zone is obtained as the following formula 11 The value T. (Formula 2) D = R - cfR ^ R (1 - cf) ..., the value L of the dead zone 11 thus obtained and the full length of the ionization chamber 5 jL " against the object to be measured 4 The flow direction, the ionization phase 5 to be disappeared in the insensitive zone, can be obtained as α =. Furthermore, the gas is filled with a coefficient c, which can give an arbitrary constant (for example, _______ -14 - Recording fault (21 () X297 Gongdong) -- 1272371 A7

值)。 (第7例的實施形態) 圖14係說明本發明的第7例的實施形態的圖。如第1〜第6 的實施形態,使電離箱5多數個鄰接排列的時候,在電離 箱5除了從產生器3放射的放射線14之外,由於從鄰接的電 離箱5的散射線13入射,對於邊緣部的精度降低、分解能 力降低等測量結果帶來不良影響。 因此:該實施在形態’為了降低如此的散射線13的影 響’在鄰接的電離箱5之間配置著墊板12。 墊板12的厚度係為能夠有足夠吸收散射線的厚度,關於 墊板12的長度、高度,分別要與電離箱5的長度、高度相 等或超過。 ° 再者,墊板12的材質,雖然能夠使用不銹鋼(例如 SUS304) ’但是如果是能夠吸收散射線的材質的話並不在 此限。例如,也能夠使用鎢、鉛等。 此外,也能夠將像線吸收係數大的材質的東西板厚做 薄。 再者,如此地,使用塾板12的時候,對著被測量物4的 流動方向,不靈敏區要消失的電離箱5旋轉角度^,為,將 墊板12的板厚作為的的時候,不用第6例實施形態之時的 丁,而用(丁+0.5丈2)能夠求得^:,=匕11-1{(1^〇.5^/1^。 [發明之效果] 如以上說明所述,如果根據本發明,藉由將電離箱的排 列對著被測量物的流動方向,使其朝時鐘方向或反時鐘方 -15-value). (Embodiment of the seventh embodiment) Fig. 14 is a view for explaining an embodiment of the seventh example of the present invention. In the first to sixth embodiments, when a plurality of the ionization chambers 5 are arranged adjacent to each other, the ionization chamber 5 is incident on the scattering line 13 from the adjacent ionization chamber 5 in addition to the radiation 14 emitted from the generator 3. The measurement results such as lowering the accuracy of the edge portion and lowering the decomposition ability have an adverse effect. Therefore, in this embodiment, the spacer 12 is disposed between the adjacent ionization boxes 5 in order to reduce the influence of such scattered rays 13. The thickness of the backing plate 12 is such a thickness as to be sufficient to absorb the scattered rays, and the length and height of the backing plate 12 are respectively equal to or exceed the length and height of the ionization chamber 5. ° Further, the material of the backing plate 12 can be made of stainless steel (for example, SUS304), but it is not limited to the material that can absorb the scattered rays. For example, tungsten, lead, or the like can also be used. In addition, it is also possible to make the thickness of the material having a large absorption coefficient of the line thin. Further, when the seesaw 12 is used, the angle of rotation of the ionization chamber 5 in which the insensitive area is to be lost is directed to the flow direction of the object 4, and when the thickness of the backing plate 12 is used, When the case of the sixth embodiment is not used, it is possible to obtain ^:, = 匕 11-1{(1^〇.5^/1^.) [Effect of the invention] According to the present invention, according to the present invention, by arranging the arrangement of the ionization chamber against the flow direction of the object to be measured, it is directed toward the clock direction or the counterclockwise side -15-

1272371 A7 B7 五、發明説明(13 ) 向旋轉’放射線靈敏度低的領域減少,能夠得到在測量領 域全體靈敏度變化少的多點測量厚度計,在被測量物局部 性地有顯著之點(缺陷)的時候,能夠將此輕易地檢出。 此外,從被輸入的信號求蛇行量,由於將此應用於内插 各測量位置之間的函數,能夠對應藉由被測量物的蛇行的 目標測量位置偏差,能夠連續地進行目標測量位置附近的 測量。 [圖面之簡要說明] 圖1係表示關於本發明的第1例實施形態的多點測量厚度 計的構成之正視圖。 圖2係表示在第1例實施形態的電離箱的排列之立體圖。 圖3係表示在圖2從電離箱的正上方所看到狀態之aa,視 圖。 圖4係表示關於在第1例實施形態的電離箱寬度方向的靈 敏度分佈圖。 圖5係表示關於本發明之第2例實施形態的多點測量厚度 5十的構成圖。 圖6係表示關於本發明之第3例實施形態的多點測量厚度 計的構成圖。 圖7係表示關於本發明之第4例實施形態的多點測量厚度 計的構成圖。 圖8係表示關於本發明之第5例實施形態的多點測量厚度 計的構成圖。 圖9係表示在第5例實施形態的目標測量位置於實際的測 -16 1272371 A7 -------------- B7 五、發明説明(14 ) 量位置之間,在某時候内插目標測量位置的板厚值而求得 之圖形。 圖10係表示在第5例實施形態的被測量物在蛇行的時 候’内插目標測量位置的板厚值而求得之圖形。 圖11係表示為了說明決定本發明的第6例實施形態的電 離箱旋轉角度的方法之圖。 圖12係表不為了說明使用對於在本發明的第6例實施形 態的電離箱内徑、電離箱中心部的氣體量比等,而決定電 離箱旋轉角度的方法之圖。 圖13係表示為了說明使用對於在本發明的第6例實施形 態的電離箱外徑,氣體充滿係數等,而決定電離箱旋轉角 度的方法之圖。 圖14係表示關於本發明之第7例實施形態的多點測量厚 度計主要部份的構成圖。 圖15係表示指示先前例子的構成的正視圖。 圖16係表示在先前例子的電離箱的排列的立體圖。 圖17係表示纟圖16從電離箱的正上方所看到^況的aa, 視圖。 圖18係表示關於在先前例子的電離箱的寬度方向的靈敏 度分佈圖。 [符號的說明] 1··· 口型框 2.. .檢出部 3.. .產生器 4.. .被測量物 -17-1272371 A7 B7 V. OBJECTS OF THE INVENTION (13) In the field of low-radiation sensitivity, it is possible to obtain a multi-point thickness gauge with less sensitivity change in the measurement field, and a significant point (defect) locally in the object to be measured. This can be easily detected. Further, by applying the meandering amount from the input signal, since this is applied to the function of interpolating the respective measurement positions, it is possible to continuously perform the vicinity of the target measurement position in accordance with the target measurement position deviation by the meandering of the object to be measured. measuring. [Brief Description of the Drawings] Fig. 1 is a front elevational view showing the configuration of a multi-point measuring thickness gauge according to a first embodiment of the present invention. Fig. 2 is a perspective view showing the arrangement of the ionization chambers of the first embodiment. Fig. 3 is a view showing the state of aa seen from directly above the ionization tank in Fig. 2. Fig. 4 is a graph showing the sensitivity distribution in the width direction of the ionization chamber in the first embodiment. Fig. 5 is a view showing a configuration of a multi-point measurement thickness of 50 in the second embodiment of the present invention. Fig. 6 is a view showing the configuration of a multi-point measuring thickness gauge according to a third embodiment of the present invention. Fig. 7 is a view showing the configuration of a multipoint measuring thickness gauge according to a fourth embodiment of the present invention. Fig. 8 is a view showing the configuration of a multi-point measuring thickness gauge according to a fifth embodiment of the present invention. Figure 9 is a view showing the target measurement position of the fifth embodiment in the actual measurement - 1 1272371 A7 -------------- B7 5, the description of the invention (14) A pattern obtained by interpolating the plate thickness value of the target measurement position at a certain time. Fig. 10 is a view showing a plate thickness value obtained by interpolating the target measurement position at the time of meandering of the object to be measured in the fifth embodiment. Fig. 11 is a view for explaining a method of determining the rotation angle of the ionization box according to the sixth embodiment of the present invention. Fig. 12 is a view for explaining a method of determining the rotation angle of the ionization chamber by using the ratio of the gas amount of the ionization chamber and the gas amount ratio at the center portion of the ionization chamber in the sixth embodiment of the present invention. Fig. 13 is a view for explaining a method of determining the rotation angle of the ionization chamber by using the outer diameter of the ionization chamber, the gas fullness coefficient, and the like in the embodiment of the sixth embodiment of the present invention. Fig. 14 is a view showing the configuration of a main portion of a multi-point measuring thickness meter according to a seventh embodiment of the present invention. Fig. 15 is a front elevational view showing the configuration of the previous example. Fig. 16 is a perspective view showing the arrangement of the ionization tanks of the previous examples. Fig. 17 is a view showing a view of a view of Fig. 16 as seen from directly above the ionization chamber. Fig. 18 is a graph showing the sensitivity distribution with respect to the width direction of the ionization tank of the previous example. [Description of Symbols] 1··· Mouth Frame 2.. Checkout Section 3.. Generators 4..Measured Objects -17-

A7 B7 1272371 五、發明説明(15 ) 5.. .電離箱 6.. .多點測量厚合計移動裝置 7.. .厚度運算器 8.. .寬度計 9.. .邊緣感應器 10.. .外部裝置 11.. .不靈敏區 12.. .墊板 13.. .散射線 14.. .放射線 -18- 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐)A7 B7 1272371 V. Description of invention (15) 5.. Ionization box 6... Multi-point measurement thick total mobile device 7. Thickness operator 8.. Width meter 9.. Edge sensor 10.. External device 11.. Insensitive area 12... Backing plate 13.. Scattering line 14.. . Radiation -18- This paper scale applies to Chinese National Standard (CNS) A4 specification (210 X 297 mm)

Claims (1)

1272多7〇ί i〖03292號專利申請案 中文申請專利範圍替換本(95年6月) 申請專利範園 1. 一種多點測量厚度計’其特徵為具有: 放射線源; 多數的電離箱,其係蚣+你a 、、1 /、被入射的放射線的量亦即 強度相關的輸出信號,且為圓筒形狀; 框’其係固疋上述放射線源與上述電離箱,以使得被 測量物之板在其間移動,從玫射線源被放射的放射線 透過上述被測量物而被入射至上述電離箱;及 演算手段,其係由上述電離箱的輸出信號運算上述被 測量物的厚度;且 上述電離箱係具備從圓筒的側面入射放射線之入射 窗;且使上述電離箱對著上述被測量物的移動方向, 以除了平行及直角以外之任意的角度旋轉而排列。 2·根據申請專利範圍第i項之多點測量厚度計,其中上述 運算手段係被輸入由測量上述被測量物的厚度的手段 所測畺的厚度值,運异上述被測量物的邊緣位置、或 疋中心位置;且能夠判定有關由上述電離箱的輸出信 號所運算的厚度的被測量物之自邊緣位置、或是自中 心位置所距離的位置。 3·根據申請專利範圍第1項之多點測量厚度計,其中上述 運手& ’係被輸入來自檢出上述被測量物邊緣的手 段的輸出信號,運算上述被測量物的邊緣位置,且能 夠判定從藉由上述運算手段運算厚度的上述被測量物 之自邊緣位置起之距離。 4·根據申請專利範圍第1項之多點測量厚度計,其中上述 76852-950627.doc 本紙張尺度適用中國國家標準(CNS)八4規格(21QX297公釐) 1272371 i Π", I 申請專利範園 ^算手段’:、被輸入來自外部裝置的中心偏差量,運 、f $ 2測里物的中心位置,且能夠判定有關從藉由 上,電離箱的輸出信號所運算的厚度的上述被測量物 之自中心位置所距離的位置。 5·根據申請專利節圖笛1 s ♦ 〇 項之多點測量厚度計,其中上述 :離相,被排列於包含目標測量位置的 ^上㈣算手段係為··測量上述被測量物寬度的手 段、或疋檢出上述被測量物的邊緣的手段、或是從外 部裝置的輸出信號姑於Λ ,, 旦 。広彳〇唬被輸入,求上述被測量物的蛇行 罝丄亚且以多數的測量位置的厚度值為基礎,求出用 以出測里位置間的厚度,藉由上述内插函數而運算 從上述目標測量位置蛇行量偏離位置的厚度值者。^ 6·根據申請專利範圍第丨項之多點測量厚度計,其中上述 電離箱係為從圓筒的側面入射放射線的構造;且使用 上述電離箱的全長、及於上述電離箱側壁厚度乘上安 全比率而求得的不靈敏區的值,決定了對著上述 量物的流動方向,上述不靈敏區會消失的上述電離箱 之旋轉角度。 目 7·根據申請專利範圍第丨項之多點測量厚度計,其中上述 電離箱係為從圓筒的側面入射放射線的構造;且使^ 上述電離箱的全長、及利用對於上述電離箱内徑和上 述電離箱中心部的氣體量比率而求得的不靈敏區的 值’決定了對著上述被測量物的流動方向,上述不靈 敏區會消失的上述電離箱之旋轉角度。 -2. 76852-950627.doc 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) A8 B8 C8 D8 1272371 六、申請專利範i 8·根據申請專利範圍第1項之多點測量厚度計,其中上述 電離箱係為從圓筒的側面入射放射線的構造;且使用 上述電離箱的全長、及利用上述電離箱外徑和氣體充 滿係數而求得的不靈敏區的值,決定了對著被測量物 的流動方向,上述不靈敏區會消失的上述電離箱之旋 轉角度。 9·根據申請專利冑圍第u 8項中任一項之多點測量厚度 計,其中於鄰接的2個上述電離箱之間插入墊板。 76852-950627.doc 本紙張尺度適用中國國家標準(CNS) A4規格(210X 297公釐)1272 more 7〇ί i 〖03292 patent application Chinese application patent scope replacement (June 95) Patent application garden 1. A multi-point measurement thickness meter 'characterized to have: radiation source; most ionization boxes, The system 蚣+你 a , , 1 /, the amount of incident radiation, that is, the intensity-related output signal, and has a cylindrical shape; the frame 'fixes the radiation source and the ionization chamber to make the object to be measured The plate moves therebetween, and the radiation emitted from the ray source passes through the object to be measured and is incident on the ionization chamber; and the calculation means calculates the thickness of the object to be measured by the output signal of the ionization chamber; The ionization chamber includes an entrance window for incident radiation from a side surface of the cylinder, and the ionization chamber is arranged to rotate in an angular direction other than the parallel and right angles with respect to the moving direction of the object to be measured. 2. The multi-point thickness gauge according to item i of the patent application scope, wherein the calculation means is input with a thickness value measured by means for measuring the thickness of the object to be measured, and the edge position of the object to be measured is different. Or the center position; and it is possible to determine the position of the object to be measured from the thickness calculated by the output signal of the ionization box, or the distance from the center position. 3. The multi-point thickness measuring instrument according to the first aspect of the patent application, wherein the above-mentioned operator & ' is input with an output signal from a means for detecting the edge of the object to be measured, and an edge position of the object to be measured is calculated, and It is possible to determine the distance from the edge position of the object to be measured whose thickness is calculated by the above-described arithmetic means. 4. According to the multi-point measurement thickness meter of the scope of the patent application, the above 76,582-950627.doc paper scale applies to the Chinese National Standard (CNS) eight 4 specifications (21QX297 mm) 1272371 i Π", I apply for a patent The calculation method of the garden is: the center deviation of the object from the external device is input, and the center position of the object is measured, and the thickness of the object calculated by the output signal of the ionization box can be determined. The position of the object from the center position. 5. According to the patent application section of the patent flute 1 s ♦ 〇 multi-point measurement thickness meter, wherein the above: phase separation, is arranged in the target measurement position (4) calculation means is ... measuring the width of the above measured object The means, or the means for detecting the edge of the object to be measured, or the output signal from the external device, is used.広彳〇唬 is input, and the meandering value of the above-mentioned object to be measured is determined, and the thickness between the positions to be measured is determined based on the thickness values of the plurality of measurement positions, and the interpolation function is used to calculate The above target measures the thickness value of the position where the meandering amount deviates from the position. [6] The multi-point measuring thickness meter according to the scope of the patent application, wherein the ionization chamber is a structure in which radiation is incident from a side surface of the cylinder; and the total length of the ionization chamber is used, and the thickness of the side wall of the ionization chamber is multiplied. The value of the dead zone obtained by the safety ratio determines the angle of rotation of the ionization chamber that is opposite to the flow direction of the above-mentioned quantity, and the dead zone disappears. The multi-point measuring thickness meter according to the scope of the patent application, wherein the ionization chamber is a structure in which radiation is incident from a side surface of the cylinder; and the entire length of the ionization chamber is utilized, and the inner diameter of the ionization chamber is utilized. The value of the dead zone obtained by the ratio of the gas amount in the center portion of the ionization chamber determines the rotation angle of the ionization chamber in which the flow direction of the object to be measured is lost. -2. 76852-950627.doc This paper scale applies to China National Standard (CNS) A4 specification (210 X 297 mm) A8 B8 C8 D8 1272371 VI. Patent application i 8 · According to the first paragraph of the patent application scope The thickness gauge is a structure in which the ionization chamber is configured to receive radiation from a side surface of the cylinder; and the total length of the ionization chamber and the value of the dead zone obtained by using the outer diameter of the ionization chamber and the gas fullness coefficient are determined. The rotation angle of the ionization chamber in which the above-mentioned insensitive area disappears against the flow direction of the object to be measured. 9. A multi-point thickness gauge according to any one of the applications of the patent application, wherein a spacer is interposed between two adjacent ionization chambers. 76852-950627.doc This paper size applies to the Chinese National Standard (CNS) A4 specification (210X 297 mm)
TW091103292A 2001-03-01 2002-02-25 Multipoint thickness measurement system TWI272371B (en)

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JP2006170883A (en) * 2004-12-17 2006-06-29 Toshiba Corp Thickness profile measuring device
JP2009098095A (en) * 2007-10-19 2009-05-07 Yasuto Ioka Ionization chamber type x-ray foreign matter detector and cylindrical ionization chamber
KR100921417B1 (en) * 2007-12-17 2009-10-14 한국원자력연구원 A device for measuring the thickness of a large area subject using one point radioactive isotope source and the measurement method
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JPS5890112A (en) * 1981-11-26 1983-05-28 Toshiba Corp Radiation ray thickness meter
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FR2704643B1 (en) * 1993-04-26 1995-06-23 Lorraine Laminage CALIBRATION METHOD AND DEVICE FOR A CROSS-SECTION THICKNESS PROFILE MEASUREMENT ASSEMBLY.

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