TWI268339B - Displacement measuring device and method, an internal diameter measuring device by use of the variance of the wavelength to measure the displacement and the internal diameter - Google Patents

Displacement measuring device and method, an internal diameter measuring device by use of the variance of the wavelength to measure the displacement and the internal diameter

Info

Publication number
TWI268339B
TWI268339B TW094117011A TW94117011A TWI268339B TW I268339 B TWI268339 B TW I268339B TW 094117011 A TW094117011 A TW 094117011A TW 94117011 A TW94117011 A TW 94117011A TW I268339 B TWI268339 B TW I268339B
Authority
TW
Taiwan
Prior art keywords
displacement
internal diameter
measuring device
wavelength
aforementioned
Prior art date
Application number
TW094117011A
Other languages
Chinese (zh)
Other versions
TW200641325A (en
Inventor
Hong-Xi Cao
Jen-Chuen Liao
Ricky Hsu
Sheng-Jang Cheng
Ji-Bin Horng
Original Assignee
Ind Tech Res Inst
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ind Tech Res Inst filed Critical Ind Tech Res Inst
Priority to TW094117011A priority Critical patent/TWI268339B/en
Priority to US11/439,228 priority patent/US7567350B2/en
Publication of TW200641325A publication Critical patent/TW200641325A/en
Application granted granted Critical
Publication of TWI268339B publication Critical patent/TWI268339B/en
Priority to US12/184,283 priority patent/US7663767B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509—Color coding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Abstract

A displacement measuring device and method, an internal diameter measuring device is presented to measure the displacement, surface profile, surface roughness or an internal diameter of a hollow cylinder for a moving body. The measuring device at least includes a lighting component used to provide the light source, a light dispersion component used to receive the output lights of the aforementioned lighting component and focus the lights with different wavelengths respectively onto the focal points with focuses of different distance, and wavelength measuring module, where when the aforementioned focal points are moving in the region of the aforementioned focus dispersion, the lights with different wavelength distribution will be reflected or scattered. And after the wavelength is measured by the wavelength measuring module, the displacement of the measured body can be obtained by use of the variance of the wavelength. Besides, if a reflection component is installed in the internal center of the aforementioned hollow cylinder, and the principle of the aforementioned displacement measuring device is used, the internal diameter of the hollow cylinder can be measured. Therefore, this invention uses the light dispersion component, the light reaction of a measured body and the wavelength measuring module to obtain the different wavelengths to reach the purpose of measuring the displacement and the internal diameter.
TW094117011A 2005-05-25 2005-05-25 Displacement measuring device and method, an internal diameter measuring device by use of the variance of the wavelength to measure the displacement and the internal diameter TWI268339B (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
TW094117011A TWI268339B (en) 2005-05-25 2005-05-25 Displacement measuring device and method, an internal diameter measuring device by use of the variance of the wavelength to measure the displacement and the internal diameter
US11/439,228 US7567350B2 (en) 2005-05-25 2006-05-24 Apparatus and method for measuring displacement, surface profile and inner radius
US12/184,283 US7663767B2 (en) 2005-05-25 2008-08-01 Apparatus and method for measuring displacement, surface profile and inner radius

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094117011A TWI268339B (en) 2005-05-25 2005-05-25 Displacement measuring device and method, an internal diameter measuring device by use of the variance of the wavelength to measure the displacement and the internal diameter

Publications (2)

Publication Number Publication Date
TW200641325A TW200641325A (en) 2006-12-01
TWI268339B true TWI268339B (en) 2006-12-11

Family

ID=37462949

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094117011A TWI268339B (en) 2005-05-25 2005-05-25 Displacement measuring device and method, an internal diameter measuring device by use of the variance of the wavelength to measure the displacement and the internal diameter

Country Status (2)

Country Link
US (2) US7567350B2 (en)
TW (1) TWI268339B (en)

Cited By (1)

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TWI476427B (en) * 2013-01-14 2015-03-11 Sintai Optical Shenzhen Co Ltd Range finder

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TWI490444B (en) * 2009-01-23 2015-07-01 Univ Nat Taipei Technology Slit-scan microscopic system and method using the same
US8384890B2 (en) 2009-12-14 2013-02-26 CBC Engineers & Associates Ltd. Apparatus for measuring the inner surface of a culvert or other tunnel defining structure imbedded in the ground
TWI414817B (en) * 2010-07-23 2013-11-11 Univ Nat Taipei Technology Linear chromatic confocal microscope system
DE102015111905B4 (en) * 2015-07-22 2018-06-28 Pepperl + Fuchs Gmbh Optoelectronic triangulation sensor and method of operating such
JP6839928B2 (en) * 2016-04-26 2021-03-10 株式会社三井ハイテック Measurement method for deformed laminated iron core
TWI666422B (en) * 2017-08-09 2019-07-21 億光電子工業股份有限公司 A displacement sensor device and object displacement measurement method
KR102655064B1 (en) * 2020-11-05 2024-04-09 세메스 주식회사 Distance measuring system and distance measuring method
CN116336953B (en) * 2023-05-30 2023-08-11 武汉工程大学 System and method for measuring radius and depth of perforation model

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI476427B (en) * 2013-01-14 2015-03-11 Sintai Optical Shenzhen Co Ltd Range finder

Also Published As

Publication number Publication date
US20080316502A1 (en) 2008-12-25
US20060268286A1 (en) 2006-11-30
US7567350B2 (en) 2009-07-28
TW200641325A (en) 2006-12-01
US7663767B2 (en) 2010-02-16

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