TW583872B - Micro 3D contour scanner - Google Patents

Abstract

The present invention is a micro 3D contour scanner, which is to integrate the optical projection unit and the optical elements and optical lens set of the image capturing unit into a micro-measurement device, and use a fiber to guide the external light source inward, so that the digital micromirror device chip (DMD) can generate the structured light patterns and project it onto the object to be tested. Then an image sensing device is used to capture the deformed image of structured light patterns. By using this information, the color 2D image and 3D contour dimension can be obtained, thereby the present invention can be applied in the measurement within a narrow space.

Description

583872 V. Description of the invention (1) The present invention relates to a miniature three-dimensional contour scanner for non-contact measurement of three-dimensional objects in a narrow space. Non-contact three-dimensional contour measurement technology refers to the use of a light source and projection onto the surface of the object, and then using various optical sensors to capture the characteristic data of the surface of the object, if the light source is slightly divided into two types of active and passive. In the active non-contact 3D contour measurement technology, the measured objects project special structured light patterns (such as light spot arrays, sines, etc.) or other meaningful patterns. Due to the change of the contour of the object surface, the structured light bar projected onto the surface of the object will be used to capture the image of this deformed atlas in an appropriate way, and then analyze the 3D wheel temple data of the object, and analyze the principle method or phase shift interference method. In addition, the passive type refers to the use of optical imaging technology to capture the required object surface. In recent years, the research and development of optical non-contact high-speed retrieval of object contour dimensions has been widely discussed. (U.S. Patent Nos. 6, 5,953,137; 6, 373, 561; C. Zhang, et al.) The on-site environment for three-dimensional space measurement is not performed in a special manner (such as inside a system structure or inside a human oral cavity). ) Not a lot. The three-dimensional scanners seen on the market today are not suitable for direct contactless scanning in narrow spaces. , Can be applied to different ways of production path principle and light projection method can be used to deform the desired (structured periodic wave, beam curvature or depth of the deformation, so it can be measured under the natural lighting such as triangle measurement Characteristic data. The three-dimensional contour (3 D, there are also a variety of squares 169,634; is only a measurement tool for a specific narrow space and the product is too large, the precision three-dimensional wheel

Page 4 583872 V. Description of the invention (2) A small number of delicious and delicious US patents (patent no. 6,26 3,2 34) are currently used in the world for measuring infrared rays (invisible light). It is based on the measurement of the tooth shape, and the light is projected into the oral cavity by TTO P thumb Figure 7, °, which is projected into the mouth '/ said by four or two tiny grating movements (prepared by # / τ 旦 炎 1 / / 1 called Distance), the cameras in the system are spaced one by one and four miles apart from each other, and the raster image (parallel stripe bite) is treated like a k to measure the object ’s degree (phase sh ifti ng strip d ;, Vf k The shape of the gate ^ The projected stripe of the system is set to 1 \ ^ = _; 2 to obtain the three-dimensional size. Due to the surface of the surface), the surface of the surface ^^ is placed in the step of the steep tool (Steped system). The accuracy and range are easily limited

Display, LCD) The computer LCD (Liquid Crystal) is used to generate raster stripes in any of a group of different colors. It can produce raster stripes at the same time. It has a relatively striped pattern, which is better than the fixed projection but the LCD display projection structure. The effect of light streaks and uniform projection. And the LCD quality is too small. The precision quality of the projection grating streak is not the best. In view of this, it has been integrated into a miniature three-dimensional probe. Many years of experience, finally: Engaged in related research. Miniature three-dimensional contour scanning ^ Ming = generated. Therefore, the present invention provides a method for making dry lumps, μ ^ ^ using micro-light projection elements and surface structure light quantity "once, and then calculate a micro-shaped three-dimensional contour scanning measurement system. The system of the present invention can be applied to a narrow space measurement environment, and can output two-dimensional images and three-dimensional contour dimensions of the measured object, and is a universal tool that integrates 2D and 3D measurement. The object of the present invention is to provide a miniature three-dimensional contour

583872 V. Description of the invention (3) The scanner integrates the optical elements and optical lens groups of the optical projection unit and the image capture unit in a miniature measuring device. After the optical fiber is used to introduce an external light source, the digital micromirror projects the wafer (D igita 1 Micr 〇mirr 〇 D Device chip, DMD chip) can generate a structured light spectrum and project it to the object to be measured, and then use the image sensing element to capture the deformed structured light image. Use this information to obtain the color of the object 2D image and 3D contour size. Furthermore, another object of the present invention is to provide a miniature three-dimensional contour scanning method, by which a non-contact three-dimensional measurement of an object can be performed in a narrow measurement space. To achieve the above object, the present invention is realized as follows: A miniature three-dimensional contour scanner includes the following components: An optical projection unit mainly composed of an optical lens group and a digital micromirror projection chip, and an external light source is introduced through an optical fiber. The light source passes through the optical lens group to a digital micromirror projection chip. The digital micromirror projection chip can generate a structured light spectrum, and the structured light spectrum is projected onto the object to be measured through the optical lens group. An image capture unit is mainly composed of The optical lens group and the image sensing element are used to extract the deformed structure light pattern image and the two-dimensional image of the object to be measured to an image sensing element through the optical lens group. The image sensing element can be Output image information to the main control unit; and a main control unit, connected to the optical projection unit and the image capture unit, for controlling the structured light spectrum output and

Page 6 583872 V. Description of the invention (4) Process the image information obtained by the image capture unit. In addition, a miniature three-dimensional contour scanning method includes the following steps: an optical projection step, an external light source is introduced through an optical fiber, the light source passes through the optical lens group to a digital micromirror projection chip, and the digital micromirror projection chip can generate structured light Spectrum, and the structured light spectrum is projected onto the object to be measured through the optical lens group; an image capturing step, using the optical lens group, to capture a two-dimensional image of the light pattern of the deformed structure and the object to be measured from the object through the optical lens group To an image sensing element, the image sensing element can output image information to the main control unit; and a main control step for controlling the structured light spectrum output of the optical projection unit and processing the image information obtained by the image acquisition unit. In order to make your reviewing committee better understand the structural features and effects of the present invention, the following specific embodiments and the accompanying drawings are used to make a detailed description of the present invention, as described below: Digital micromirror projection chip In the present invention, the optical projection element adopts a digital micromirror device chip (DMD chip) as a structured light fringe projection device. The four characteristics of using DMD are as follows: 1 · Square thin wafer (the diagonal length is 1 3 1 mm) easy to integrate in a miniature scanner.

583872

V. Description of the invention (5) 2 • Light streak = shadow accuracy (line analysis, straightness) is better than that of liquid crystal display, which can effectively improve the measurement accuracy of the scanner. • Projection graphics, grayscale, and color can be selected by the program, which means that you can freely project the structured light spectrum of Rensi, so you can increase the flexibility of the 3D contour measurement calculation method. 4-MD can complete a single projected gray-scale structured light spectrum in 3.33x1 〇_3 seconds. The theoretical three-dimensional profile and speed can reach 3 〇 〇Η z, which can perform three-dimensional (Q uasi-dynamic) object three-dimensional Contour measurement. In addition, DMD can project more accurate structured light stripes than liquid crystal displays (Liquid Crystal Dissplay, LCD). If DMD micro-components are used, the volume of the scanning probe can be limited to the range of 30mm (W) X 30mmU) X 150 mm (L) to form a miniature three-dimensional contour scanner. In the embodiment of the present invention, the image capture element ^ ^ image sensor (RGB color CCD) can improve the output of two-dimensional color images for wood and wood. The image information can be applied to multiple images. One-color two-dimensional color combination (_ plus ion), with * three-dimensional ^ stack 5833872 5. Invention description (6) 2 0 0 is composed of an image processing unit 2 1 0 and a digital micromirror projection chip control unit 2 2 0 . In addition, this device can be connected to an external light source device 300, a display device 400, and a power supply 500, which are used to introduce an external light source, output image results, and input power, respectively. In the optical system of the miniature measurement body 100, the projection light source 1 is provided by an external light source device 300. This embodiment is a halogen light source (DC regulated illuminator), which is passed through an appropriate-sized optical fiber 30 and focused. The lens 31 is provided into the miniature measurement body 100. The projection light source 1 is first collimated by an optical collimator 32, and is projected on the DMD through a 45 ° optical reflecting plane mirror 33 and a DM D1 0 orthogonal direction (a fixed projection angle of the DMD). Among them, the DMD can be The digital micromirror projection wafer control unit 2200 of the main control unit 200 modulates the light spectrum of any surface structure required for measurement. The structured light source reflected from the surface of the DMD passes through the optical reflecting plane mirror 34, optical focusing lens 35, optical aperture 36, optical collimator lens 37, and 45 ° optical reflecting plane mirror 38, and then is projected on the contour of the three-dimensional object to be measured. on. The deformed structured light pattern 2 (def ommerged fringe patterns) formed by the structured light of the projection light source 1 and the three-dimensional object outline A (concave-convex change), and then passed through the 45 ° optical reflection plane mirror 3 8, optical collimator lens 3 7, and optical aperture 36. Two 45 ° optical reflecting plane mirrors 39, 40 and an optical focusing lens 41 are imaged on the color imaging sensor 20. The image capture and processing is performed by the image processing unit 2 1 0 of the main control unit 2 0. The color object image results can be output through the display device 4 0 0 (for example, the color image display). Miniature measurement body 1 0 0 is through power and signal connector 4 2 outside

583872 V. Description of the invention (7)---- The private source supply is 500 and a main control unit 2000, and the light = component support structure 4 3. Measure the fixed support plate 4 4 and the housing The architecture combines the optical technology shooting unit and the image mining unit (the detailed structure is not modified in the figure). The power supply and signal connector 4 2 are connected to the DMD and RGB CCD through the power supply and the signal 4 5S and 4 6 respectively. In addition, the thermal design of the scanning system is ideal or not, which directly affects the performance and reliability of the system. The design of the system is extremely important. In :: On the sun dagger, DMD (which must be maintained below 40 ° C) is the key area in the probe that needs to be cooled. Generally, the projector is cooled by a fan, but the scanner designed by the present invention has large size and space constraints. The fan is not suitable, so the design of the heat pipe 50 is adopted. The three steps of vaporization, heat insulation (Adiabatic), and pseudo-junction ((: 〇11 (161 ^ 81: 丨 〇11)) are used to achieve narrowness. For the purpose of heat dissipation in space. In summary, the present invention uses structured light (a prime light source to project structured light spectra for measurement through a digital micromirror projection wafer, such as various sinusoidal periods, concentric circles, or dot-array patterns, etc. ), Projected on the object to be measured from a top angle, DMD can use the high-speed and high-precision jersey characteristics of structured light on the projection surface, and can use phase shift (P haseshifting), several structures Light spectrum) or triangulation measurement method (Trianiangu 1 ati ο n, only a single structured light spectrum) is used to calculate the three-dimensional contour size of the measured object, and it becomes a small and light micro-three-dimensional contour probe and measurement system. In addition, the present invention achieves three-dimensional contour measurement of objects in a narrow space by integrating the optical projection unit and the image capturing unit in a miniature detection subject. Therefore, the present invention can be said to be creative and progressive. Comply with the law of invention patents

Page 10 583872 V. Description of the invention (8) Certain requirements must be met, and an invention patent application must be filed according to law. Although the present invention is disclosed as above with a preferred embodiment, it is not intended to limit the scope of implementation of the present invention. Anyone skilled in the art can make some changes and modifications without departing from the spirit and scope of the present invention. That is, all equal changes and modifications made in accordance with the present invention shall be covered by the scope of the patent of the present invention. The definition shall be based on the scope of patent application.

Page 11 583872 Brief description of the drawings Figure 1 is a schematic diagram of the device of the miniature three-dimensional contour scanner of the present invention. Fig. 2 is a schematic view of a miniature measuring body of a miniature three-dimensional contour scanner according to the present invention. Brief description of drawing number: A · · · 3D object outline 1 · · · Projection light source 2 · · · Deformed structure light pattern

•• Miniature measurement subject DMD color imaging sensor optical fiber condenser lens optical collimator lens 45 ° optical reflection plane mirror optical reflection plane mirror optical focusing lens optical aperture optical collimator lens 45 ° optical reflection plane mirror 45 ° optical reflection plane mirror 45 ° Optical reflecting plane mirror optical focusing lens

Page 12 583872 Simple illustrations oooooo 2 3 4 5 6 0 1 2 0 0 0 4 4 4 4 4 2 2 2 3 4 5

• Power supply and signal connector • Support structure • Measurement fixed support board • Power supply and signal • Power supply and signal • Main control unit • Image processing unit • Digital micromirror projection chip control unit • External light source device • Display device • Power supply unit Page 13

Claims (1)

583872 VI. Scope of patent application 1 · A miniature three-dimensional contour scanner, which includes the following components: An optical projection unit, which is mainly composed of an optical lens group and a digital micromirror projection chip, and an external light source is introduced through an optical fiber. The lens group to a digital micromirror projection chip, the digital micromirror projection chip can generate a structured light spectrum, and the structured light spectrum is projected onto the object to be measured through the optical lens group; An image capture unit is mainly composed of an optical lens group and an image sensing element, and the optical lens group is used to capture a two-dimensional image of a deformed structure light pattern image and a test object from a test object to an image sensor. Element, the image sensing element can output image information to the main control unit; and a main control unit, connected to the optical projection unit and the image acquisition unit, for controlling the structured light spectrum output of the optical projection unit and processing image acquisition Image information obtained by the unit. 2. The miniature three-dimensional contour scanner according to item 1 of the scope of patent application, further comprising a display device for outputting the image processing result of the main control unit. 3. The miniature three-dimensional contour scanner according to item 1 of the scope of patent application, further comprising an external light source device for providing a light source for the miniature measurement body. 4. The miniature three-dimensional contour scanner according to item 3 of the scope of patent application, wherein the external light source device is a halogen light source. 5. The miniature three-dimensional contour scanner according to item 1 of the scope of patent application, wherein the main control unit includes: Page 14 583872 VI. Patent application scope-An image processing unit for image capture control, image processing and three-dimensional contour calculation; and a digital micromirror projection chip control unit, which is a projection chip through a computing unit and digital micromirror The controller regulates the digital micromirror projection chip to generate a structured light spectrum. 6. The miniature three-dimensional contour scanner according to item 1 of the scope of patent application, wherein the image sensing element of the image capturing unit is a CCD color image sensing element. 7 · The miniature three-dimensional contour scanner according to item 1 of the scope of patent application, wherein the optical lens group is composed of one or more of an optical collimator lens, an optical reflecting plane mirror, an optical condenser lens, an optical focusing lens, or an optical aperture . 8 · The miniature three-dimensional contour scanner according to item 7 of the scope of patent application, wherein the incident light source of the optical projection unit is sequentially projected through an optical condenser lens, an optical collimator lens, a 45 ° optical reflecting plane mirror, and a digital micromirror. Wafer, 45 ° optical reflecting plane mirror, optical focusing lens, optical aperture, optical collimator and 45 ° optical reflecting plane mirror. 9 · The miniature three-dimensional contour scanner as described in item 7 of the scope of patent application, wherein the image information of the image capturing unit is sequentially passed through a 45 ° optical reflection plane mirror, an optical collimator lens, an optical aperture, and a 45 ° optical reflection Plane mirror, optical collimator and image sensing element. 1 0. The miniature three-dimensional contour scanner according to item 1 of the scope of patent application, wherein the miniature measuring body further includes a heat dissipation element for cooling the digital micromirror projection chip. Page 15 583872 6. Scope of patent application 1 1 · The miniature three-dimensional contour scanner according to item 10 of the scope of patent application, wherein the heat dissipation element is a heat pipe. 1 2 · The miniature three-dimensional contour scanner according to item 1 of the scope of patent application, wherein the structured light spectrum is any one of a light spot array, a sine periodic wave, a light beam, or a concentric circle. 1 3 · A miniature three-dimensional contour scanning method, including the following steps: An optical projection step, an external light source is introduced through an optical fiber, the light source passes through the optical lens group to a digital micromirror projection chip, and the digital micromirror projection chip can generate Structured light spectrum, and the structured light spectrum is then projected onto the object to be measured through the optical lens group; an image capturing step, the optical lens group is used to capture the deformed structure light pattern image and the object to be measured from the object two Dimension image to an image sensing element, the image sensing element can output image information to the main control unit; and a main control step for controlling the structured light spectrum output of the optical projection unit and processing the image obtained by the image acquisition unit Information. 14 The micro three-dimensional contour scanning method as described in item 13 of the scope of patent application, further comprising a display step for outputting the image processing result of the main control unit. 15 · The micro three-dimensional contour scanning method described in item 13 of the scope of patent application, wherein the main control steps include: an image processing flow, which performs operations of image capture control, image processing, and three-dimensional contour calculation; and a Digital micromirror projection chip control flow Page 16 583872 6. Scope of patent application The micro-mirror projection wafer controller controls the digital micro-mirror projection wafer to generate a structured light spectrum. 16 · The micro three-dimensional contour scanning method according to item 15 of the scope of patent application, wherein the image processing process uses the phase shift method to calculate the three-dimensional contour size of the object to be measured. 17 · The miniature three-dimensional contour scanning method as described in item 15 of the scope of patent application, wherein the image processing process uses a triangulation method to calculate the three-dimensional wheel grinding size of the object to be measured. 18 · The miniature three-dimensional contour scanning method according to item 13 of the scope of the patent application, wherein the image capturing step uses a CCD color image sensing element as the image sensing element. 19 · The miniature three-dimensional contour scanning method as described in item 13 of the scope of patent application, wherein the optical projection step and the image capturing step use an optical collimator lens, an optical reflecting plane mirror, an optical condenser lens, an optical focusing lens or One or more types of optical apertures are used as the optical lens group. 0 2 0 · The micro three-dimensional contour scanning method described in item 19 of the patent application scope, wherein the incident light source in the optical projection step is sequentially passed through an optical condenser lens, optical collimation Mirror, 45 ° optical reflection plane mirror, digital micromirror projection chip, 45 ° optical reflection plane mirror, optical focusing lens, optical aperture, optical collimator lens and 45 ° optical reflection plane mirror. 2 1 · The miniature three-dimensional contour scanning method described in item 19 of the scope of patent application, wherein the image information in the image acquisition step is sequentially passed 583872 VI.Applicable patent scope 45 ° optical reflection plane mirror, optical collimator lens, optical aperture, 45 ° optical reflection plane mirror, optical collimator lens and image sensing element 0 2 2 · As described in item 13 of the scope of patent application A miniature three-dimensional contour scanning method, in which a digital micromirror projection chip is cooled by a heat dissipation element. 2 3 · The miniature three-dimensional contour scanning method as described in item 13 of the scope of patent application, wherein the structured light spectrum is any one of a light spot array, a sine periodic wave, a light beam, or a concentric circle. 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