TW526498B - High integration memory device, memory module mounting the memory device, and control method of the memory module - Google Patents

High integration memory device, memory module mounting the memory device, and control method of the memory module Download PDF

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TW526498B
TW526498B TW090111615A TW90111615A TW526498B TW 526498 B TW526498 B TW 526498B TW 090111615 A TW090111615 A TW 090111615A TW 90111615 A TW90111615 A TW 90111615A TW 526498 B TW526498 B TW 526498B
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chip
timing
response
signal
supply
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TW090111615A
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Chinese (zh)
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Eun-Youp Kong
Jun-Young Jeon
Hai-Jeong Shon
Chul-Hong Park
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Samsung Electronics Co Ltd
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    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/50Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor for integrated circuit devices, e.g. power bus, number of leads
    • HELECTRICITY
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    • H01L25/10Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers
    • H01L25/105Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being of a type provided for in group H01L27/00
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    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32135Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
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    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/4826Connecting between the body and an opposite side of the item with respect to the body
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    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73215Layer and wire connectors
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    • H01L2225/1005All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00
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    • H01L2225/1005All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00
    • H01L2225/1011All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement
    • H01L2225/1017All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement the lowermost container comprising a device support
    • H01L2225/1029All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement the lowermost container comprising a device support the support being a lead frame
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    • H01L2225/1005All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00
    • H01L2225/1011All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement
    • H01L2225/1047Details of electrical connections between containers
    • H01L2225/107Indirect electrical connections, e.g. via an interposer, a flexible substrate, using TAB
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    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Semiconductor Memories (AREA)

Abstract

The present invention discloses a high integration memory device, including a package packaging at least two chips, each including a predetermined number of control signal pads; and a predetermined number of control signal applying terminals connected with the predetermined number of the control signal pads.

Description

526498 A7 __ _B7 五、發明説明(1 ) 玄互參考 本專利申請根據35 U.S.C· § 119提出於2001年1月8申請 之韓國專利申請案號2001- 1019的優點,該專利申請以提及 方式整個併入本文中。 發明背景 畳明範疇 本發明與一種鬲整合之記憶裝置有關,尤其,本發明係 針對一種至少兩個晶片内建於一包裝中的高整合記憶裝置 、安裝該記憶裝置的記憶模組以及該記憶模組控制方法。 相關技藝説明 - 一種安裝在筆記型電腦主機板上的144接腳針/ 200接腳針 合己憶模組包括:小型雙排直插記憶模組(small 〇utHne duai in-line memory module ; SODIMM),其寬度爲 1.25吋、高度 2.66付及厚度0.15忖;以及,微型雙排直插記憶模組(111丨(^〇-dual in-line memory module ; μ-DIMM),其寬度爲 1 · 1 8 忖、 經濟部中央標準局員工消費合作社印製 (請先閱讀背面之注意事項再填寫本頁) 咼度1 · 5忖及厚度〇· 15叫·。記憶模組大小係按照連接電子裝 置工程協調會(joint electronic devices engineering council ; JEDEC)標準所決定。在此類的記憶體上,可分別在其正面 及背面安裝最多四個54接腳針薄小型包裝(thin small outline package ; TSOP)型同步動態隨機存取記憶體 (SDRAM)。 圖1 A及1 B分別顯示傳統144接腳針/200接腳針記憶模組 之正面及背面組態配置的規劃圖。如圖1 A及1 B所示,記 憶模組正面1 0包括四個記憶裝置1 2 -1至1 2 - 4,而背面2 0 本纸張尺度適用中國國家標準(CNS〉A4規格(210X297公釐) 526498 A7 B7 五、發明説明(2 ) 也包括四個記憶裝置22-1至22-4。雖然圖中未顯示,但是 .1己憶模組的正面1 〇及背面2 〇上已排列信號線,以將記憶裝 置12-1至12-4及22-1至22_4連接至接腳針14-1、14_2、 24-1及24-2。正面1〇的連接接腳針14-1及14_2及背面2〇 的連接接腳針24-1及24-2都是透過主機板(圖中未顯示)上 的插槽(圖中未顯示)連接至信號線(圖中未顯示)。雖然圖 中未顯示,但是記憶模組的接腳針組態配置包括1 2針位址 輸入接腳針、2針記憶組(bank)選擇信號接腳針、64針資料 輸入/輸出接腳針、1針列位址選通(strobe)接腳針、1針行 位址選通(strobe)接腳針、1針寫入啓用信號接腳針、8針資 料輸入/輸出遮罩接腳針以及預定數量的無連接接腳針。 圖2顯示安裝在圖i所示之記憶體上之TS〇p型sdram的 斷面圖。如圖2所示,記憶裝置包括包裝3 〇、晶片3 2、引 線框3 4 -1暨3 4 - 2、焊接區3 6 - 1暨3 6 - 2、隔離材料3 8 _ J暨 3 8 - 2以及键合線4 〇 -1暨4 0 - 2。晶片3 2及引線框3 4 - 1暨 3 4-2分別藉由隔離材料38]暨38-2隔離,以及引線框34_ 1暨3 4 - 2與焊接區3 6 - 1暨3 6 - 2分別經由鍵合線4 〇 - 1暨4 〇 _ 2互相連接。引線框34]暨34-2係作爲信號輸入/輸出接腳 針使用。 經濟部中央標準局員工消費合作社印裂 ---------- (請先閲讀背面之注意事項再填寫本頁)526498 A7 __ _B7 V. Description of the invention (1) Cross reference This patent application has the advantages of Korean Patent Application No. 2001-1019 filed on January 8, 2001, based on 35 USC. § 119. The patent application is mentioned by way of reference. This is incorporated in its entirety. BACKGROUND OF THE INVENTION The present invention relates to an integrated memory device. In particular, the present invention is directed to a highly integrated memory device with at least two chips built into a package, a memory module installed with the memory device, and the memory. Module control method. Related technical description-A 144-pin / 200-pin pin-on-line memory module installed on a notebook computer motherboard includes: small 〇utHne duai in-line memory module; SODIMM ), With a width of 1.25 inches, a height of 2.66, and a thickness of 0.15 忖; and, a micro dual-row in-line memory module (111 丨 (^ 〇-dual in-line memory module; μ-DIMM), whose width is 1 · 1 8 印 Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs (please read the precautions on the back before filling out this page) 咼 1 · 5 忖 and thickness · 15 ··. The size of the memory module is according to the connected electronic device Determined by the Joint Electronic Devices Engineering Council (JEDEC) standard. On this type of memory, up to four 54-pin thin small packages (TSOP) can be installed on its front and back respectively. Type Synchronous Dynamic Random Access Memory (SDRAM). Figures 1 A and 1 B show the front and back configuration plans of a conventional 144-pin / 200-pin memory module, respectively. See Figures 1 A and 1 B, memory module Face 10 includes four memory devices 1 2 -1 to 1 2-4 and back 20. This paper size applies to Chinese national standards (CNS> A4 specification (210X297 mm) 526498 A7 B7 V. Description of the invention (2) It also includes four memory devices 22-1 to 22-4. Although not shown in the figure, signal lines have been arranged on the front 10 and rear 20 of the .1 memory module to connect the memory devices 12-1 to 12 -4 and 22-1 to 22_4 are connected to the pins 14-1, 14_2, 24-1, and 24-2. The connection pins 10-1 on the front 10 and the connection pins 24 on the back 20 -1 and 24-2 are connected to the signal line (not shown) through the slot (not shown) on the motherboard (not shown). Although not shown in the figure, the connection of the memory module Pin configuration includes 12-pin address input pin, 2-pin bank selection signal pin, 64-pin data input / output pin, and 1-pin column address strobe Pin pin, 1-pin row address strobe pin, 1-pin write enable signal pin, 8-pin data input / output mask pin, and a predetermined number of unconnected pin pins. Figure 2 Show A cross-sectional view of a TS0p type sdram installed on the memory shown in Fig. I. As shown in Fig. 2, the memory device includes a package 3 0, a chip 3 2, a lead frame 3 4 -1 and 3 4-2, Welding area 3 6-1 and 3 6-2, insulation material 3 8 _ J and 3 8-2 and bonding wire 4 0-1 and 4 0-2. The wafer 3 2 and the lead frame 3 4-1 and 3 4-2 are separated by the isolation material 38] and 38-2, and the lead frame 34_ 1 and 3 4-2 and the bonding area 3 6-1 and 3 6-2 They are connected to each other via bonding wires 4 0-1 and 4 0 2. Lead frame 34] and 34-2 are used as signal input / output pins. Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs ---------- (Please read the precautions on the back before filling this page)

、1T 圖3顯示54接腳針以〇1>型SDRAM接腳針組態配置的規劃 圖。接腳針號碼1、14及27標示電源供應(VDD)接腳針。 接腳針號碼2 8、4 1及5 4標示電源供應接地接腳針。接腳針 號碼3、9、4 3及4 9標示資料輸出功率接腳針。接腳針號碼 6、1 2、4 6及5 2標示資料輸出功率接地接腳針。接腳針號 -5 526498 A7 B7 經濟部中央標準局員工消費合作社印製 五、發明説明(3 ) 碼16標示窝入開啓信號(WEB)供應接 η 一" a 接腳針號碼1 7 抓不订位址選通信號(CASB)供應接腳針。接腳針號碼η俨 示列位址選通信號(CASB)供應接腳針。接腳針號碼 晶片選擇信號(CSB)供應接腳針。接腳針號碼2〇及21栌于 記憶組選擇信號(BA0、BA1)供應接腳針。接腳針號碼W 至26及29至36標示位址(八0至八12)供應接腳針。接腳針號 碼37標示時序開啓信號(CKE)供應接腳針。接腳針號碼η 標示系統時序信號(CLK)供應接腳針。接腳針號碼15及39 標示資料輸入/輸出it罩信號(LDQM、UDQM)供應接腳針 。接腳針號碼2、4、5、7、8、10、h、13、42、以、 45、47、、48、50、51及53標示資料晶片/輸出信號(DQ0 至DQ15)接腳針。接腳針號碼4〇標示無連接接腳針。 供應至晶片選擇信號(CSB)供應接腳針的晶片選擇信號 (CSB)促使能夠將輸入信號輸入至前面所提及之除了系統 時序=號(CLK)供應接腳針、時序開啓信號(CKE)供應接腳 針及貝料輸入/輸出遮罩信號(LDQM、UDQM)供應接腳針 I外的所有接腳針,以啓用記憶裝置操作。系統時序信號 (CLK)供應接腳針是用來輸入自主機板控制器所供應之時 序仏唬的接腳針。具體而言,時序開啓信號(cke)供應接 腳針可作爲適用於需要低功率模組運作之筆記型電腦停電 (power-down)模式的控制信號供應接腳針。 圖4顯示安裝在圖示之記憶模組之記憶裝置及控制信 號線的規劃圖。圖4所示的記憶模組是可安裝八個16Μχ 16 位己憶裝置至12·4及22-1至22_4的256μ位元組 (請先閱讀背面之注意事項再填寫本頁) 衣· 、1Τ 526498 A7 B7 五、發明説明(4 ) 記憶模組。於圖1及4中,相似的參考數字標示相似的零件。 虛線部份1 0·中所排列的記憶裝置12」至12-4是安裝在 記憶模組正面1 0上的記憶裝置。啓用記憶裝置丨2 - 1至1 2 -4的運作以響應晶片選擇信號(CSBO),以及啓用系統時序 k號(CLKO)以響應時序開啓信號(CKEO),以便輸入或輸出 資料,以響應系統時序信號(CLKO)。此時,將16位元資料 輸入至記憶裝置12-1至12-4或自記憶裝置12-1至12-4輸 出16位元資料,因此,輸入至記憶裝置或自 圮憶裝置1 2 -1至1 2 - 4輸出的總資料是6 4位元。 虛線部份20f中所排列的記憶裝置224至22_4是安裝在 圮憶模組背面2 0上的記憶裝置。啓用記憶裝置2 2 - 1至2 2 -4的運作以響應晶片選擇信號(CSB1),以及啓用系統時序 信號(CLK1)以響應時序開啓信號(CICE1),以便輸入或輸出 資料’以響應系統時序信號(CLK1)。此時,將1 6位元資料 輸入至記憶裝置22-1至22-4或自記憶裝置 出16位元資料,因此,輸入至記憶裝置22_1至22_4或自 記憶裝置2 2 - 1至2 2 - 4輸出的總資料是6 4位元。 其他k號線(圖4中未顯示)都是經由通用信號線互相連接。 經濟部中央標準局員工消费合作社印製 (請先閱讀背面之注意事項再填寫本頁) 亦即,如圖4所示,在將四個16Mx 16位元之記憶裝置分 別安裝在正面1 0及背面20的256M位元組記憶模組中,位 於正面10的四個記憶裝置及位於背面2〇的四個記憶裝置應 以互相獨立的方式運作,以輸入/輸出64位元資料至/自 256M位兀組記憶模組。如圖4所示,假使安裝於正面^ 〇的 四個記憶裝置及安裝於背面20的四個記憶裝置應以互相獨 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) 5264981T Fig. 3 shows a plan view of the configuration of the 54 pin with the 〇1 > type SDRAM pin configuration. Pin numbers 1, 14 and 27 indicate the power supply (VDD) pin. Pin numbers 2 8, 4 1 and 5 4 indicate the power supply ground pin. Pins Numbers 3, 9, 4, 3, and 4 9 indicate the data output power pins. Pin numbers 6, 1, 2, 4, 6 and 5 2 indicate the data output power ground pin. Pin No.-5 526498 A7 B7 Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs. 5. Description of the invention (3) Code 16 indicates the socket opening signal (WEB) supply connection. &Quot; a Pin No. 1 7 Grab An unreserved address strobe signal (CASB) is supplied to the pins. The pin number η 俨 indicates that the column address strobe signal (CASB) is supplied to the pin. Pin Number The chip select signal (CSB) supplies the pin pins. Pin numbers 20 and 21 are supplied to the pin in the memory bank selection signal (BA0, BA1). Pin numbers W to 26 and 29 to 36 indicate the addresses (80 to 8 12) to supply pin pins. Pin No. 37 indicates that the timing enable signal (CKE) is supplied to the pin. The pin number η indicates that the system timing signal (CLK) is supplied to the pin. Pin numbers 15 and 39 indicate that the data input / output it cover signals (LDQM, UDQM) are supplied to the pin pins. Pin numbers 2, 4, 5, 7, 8, 10, h, 13, 42, and 45, 47, 48, 50, 51, and 53 indicate the data chip / output signal (DQ0 to DQ15) pins . The pin number 40 indicates that no pin is connected. The chip select signal (CSB) supplied to the chip select signal (CSB) enables the input signal to be input to the previously mentioned except the system timing = signal (CLK) supply pin, the timing enable signal (CKE) Supply pin pins and shell material input / output mask signals (LDQM, UDQM) supply all pin pins except pin I to enable the operation of the memory device. The system timing signal (CLK) supply pin is a pin used to input the clock signal from the motherboard controller. Specifically, the timing on signal (cke) supply pin can be used as a control signal for the power-down mode of a notebook computer that requires low-power module operation. Fig. 4 shows a plan view of a memory device and a control signal line installed in the illustrated memory module. The memory module shown in Figure 4 is a 256μ byte that can install eight 16M × 16-bit memory devices to 12 · 4 and 22-1 to 22_4 (please read the precautions on the back before filling this page). 1T 526498 A7 B7 5. Description of the Invention (4) Memory module. In Figures 1 and 4, similar reference numerals indicate similar parts. The memory devices 12 ″ to 12-4 arranged in a dotted line 10 · are memory devices mounted on the front face 10 of the memory module. Enable the memory device 丨 2-1 to 1 2-4 to respond to the chip select signal (CSBO) and enable the system timing k (CLKO) to respond to the timing on signal (CKEO) to input or output data in response to the system Timing signal (CLKO). At this time, the 16-bit data is input to the memory devices 12-1 to 12-4 or the 16-bit data is output from the memory devices 12-1 to 12-4. Therefore, the 16-bit data is input to the memory device or the self-recall device 1 2- The total data output from 1 to 1 2-4 is 64 bits. The memory devices 224 to 22_4 arranged in the dotted line portion 20f are memory devices mounted on the rear 20 of the memory module. Enable the operation of memory devices 2 2-1 to 2 2-4 in response to the chip select signal (CSB1) and enable the system timing signal (CLK1) in response to the timing on signal (CICE1) to input or output data 'in response to the system timing Signal (CLK1). At this time, 16-bit data is input to the memory devices 22-1 to 22-4 or 16-bit data is output from the memory device. Therefore, input to the memory device 22_1 to 22_4 or self-memory device 2 2-1 to 2 2 -The total output of 4 is 64 bits. The other k-line (not shown in Figure 4) are connected to each other via a universal signal line. Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs (please read the precautions on the back before filling out this page). That is, as shown in Figure 4, four 16Mx 16-bit memory devices are installed on the front 10 and 10 respectively. In the 256M byte memory module on the back 20, the four memory devices on the front 10 and the four memory devices on the back 20 should operate independently of each other to input / output 64-bit data to / from 256M Bit group memory module. As shown in Fig. 4, if the four memory devices installed on the front side ^ 〇 and the four memory devices installed on the back side 20 should be in accordance with the Chinese paper standard (CNS) A4 (210X297 mm) in a paper size that is unique to each other 526498

乂的方式運作,爲了增加記憶模組容量,則需要增加所安 裝的記憶裝置容量。例如,爲了組態512M位元組記憶模組 口己憶模組的正背面上應分別安裝四個1 6 Μ X 1 6位元却,产 裝菩 思 ^ ’而不是安裝四個16M X 1 6位元記憶裝置。 、然而,爲了增加記憶模組的容量,使用具有較大容量的 "己隐裝置會大幅加重製造商的負擔。再者,假使記憶體以 圖4的万式運作,則使用具有小容量的記憶裝置來組態具有 大谷!的記憶模組時會有限制。 爲了努力克服前面提及的問題,會在正面10及背面2〇上 安裝以疊層兩個32MX 8位元TS〇p包裝方式所組態的四個 記憶裝置,使記憶模組可具有512M位元組容量。然而,由 於以疊層兩個包裝的方式來組態記憶模組,所以會導致記 憶裝置厚度變厚的問題。 爲了克服前面提及的問題,已採用安裝將兩個晶片封裝 至個包裝之高整合記憶裝置的記憶模組。 a圖5顯示將兩個晶片封裝至一個包裝之高整合記憶裝置的 k/f面圖。如圖5所示,高整合記憶裝置包括以互相相對方式 配置的上層晶片5 2 ·丨及下層晶片5 2 _ 2,以及封裝上層晶片 52]及下層晶片52-2的包裝50。上層晶片52-1包括第_ 引線框54-1暨第二引線框54_2、第一隔離材料%」暨第 一隔離材料56-2、第一焊接區58_丨暨第二焊接區以 及第一鍵合線60]暨第二鍵合線6〇·2。下層晶片52_2包 括第:引線框54-3暨第二引線框54_4、第一隔離材料5。 3暨第_隔離材料56_4、第一焊接區58_3暨第二焊接區 本紙張尺度適财國國家標準(CNS) A4規格(210 X 297公爱)运作 mode operation, in order to increase the capacity of the memory module, you need to increase the capacity of the installed memory device. For example, in order to configure a 512M-byte memory module, two 16M X 1 6-bit modules should be installed on the front and back of the module. Instead of installing four 16M X 1 6-bit memory device. However, in order to increase the capacity of the memory module, the use of a larger capacity " hidden device will greatly increase the burden on the manufacturer. Furthermore, if the memory operates in the 10,000-type of Figure 4, a memory device with a small capacity is used to configure the Otani! There will be restrictions on the memory module. In order to overcome the problems mentioned above, four memory devices configured by stacking two 32MX 8-bit TS0p packaging methods will be installed on the front 10 and the back 20, so that the memory module can have 512M bits. Tuple capacity. However, since the memory module is configured by stacking two packages, the memory device becomes thicker. In order to overcome the aforementioned problems, a memory module having a highly integrated memory device in which two chips are packaged into one package has been used. a FIG. 5 shows a k / f plan view of a highly integrated memory device in which two chips are packaged into one package. As shown in FIG. 5, the highly integrated memory device includes an upper-layer wafer 5 2 · 丨 and a lower-layer wafer 5 2 _ 2 arranged opposite to each other, and a package 50 that packages the upper-layer wafer 52] and the lower-layer wafer 52-2. The upper wafer 52-1 includes the _th lead frame 54-1 and the second lead frame 54_2, the first isolation material% "and the first isolation material 56-2, the first land 58_ 丨 the second land, and the first Bonding wire 60] and the second bonding wire 60 · 2. The lower layer wafer 52_2 includes a first lead frame 54-3, a second lead frame 54_4, and a first isolation material 5. 3 and No. _ Isolation Material 56_4, No. 1 Welding Area 58_3 and No. 2 Welding Area This paper is suitable for National Standards (CNS) A4 specifications (210 X 297)

Hold

-8- 526498 A7 _______ B7 五、發明祝明(6 ) 5 8-4以及第一鍵合線60-3暨第二键合線60-4。在圖5所示 的南整合$己憶裝置中’上層晶片5 2 - 1的第一引線框5 4 - 1及 下層晶片5 2 - 2的第一引線框5 4 · 2互相連接,以及上層晶片 5 2-1的第二引線框54-2及下層晶片52-2的第二引線框54_ 4互相連接。引線框54-1至54-4分別連接至上層晶片52· i 及下層晶片5 2 - 2的複數個控制信號供應接腳針。雖然圖中 未顯示,但是連接至上層晶片52-1及下層晶片52_2之複數 個貝料輸入/輸出接腳針的引線框未互相連接,並且係以互 相獨立的方式所組態。換言之,除了連接至32Μ χ 8位元之 上層晶片52 - 1及下層晶片5·2-2之資料輸入/輸出接腳針的 引線框以外,上層晶片52“及下層晶片52 ·2的所有第一及 第一引線框分別互相連接。因此,高整合記憶裝置的組態 與如圖3所示的組態相同。圖5所示的第一引線框544暨第 二引線框5 4 - 2係作爲信號輸入/輸出接腳針使用。 圖6顯示32M X 8位元5 4接腳針TSOP型SDRAM接腳針組態 配置的規劃圖。如圖6所示,接腳針號碼4、7、1〇、1 5、 40、42、45、48及5 1標示無連接(NC)接腳針。就未將兩 個晶片52-1及52-2封裝至一個包裝之高整合記憶裝置而言 ’必須將晶片5 2 · 1的無連接引線框連接至晶片5 2 - 2的資料 輸入/輸出(DQ0至DQ7)引線框。因此,高整合記憶裝置的 組態與如圖3所示的組態相同,並且變成32Μ χ 8位元χ 2的 SDRAM 〇 在圖5所示的高整合記憶裝置中,會同時啓用兩個晶片 5 2-1及5 2-2的運作以響應晶片選擇信號,以及啓用系统時 -9 - 經濟部中央標準局員工消費合作社印製 526498 A7 ~---B7 五、發明説明(7 ) ^仏號以響應時序開啓信號,以便將8位元資料輸入至兩個 曰曰片52-1及52-2或自兩個晶片52-1及52-2輸出8位元資料 以喜應系統時序信號。如上文所述,由於兩個晶片同時 執行貝料輸入/輸出,所以會產生熱,進而降低記憶裝置的 運作性能。 圖7顯示安裝在圖1所示之記憶模組之圖5所示之高整合 兄憶裝置及位於主機板上之控制信號線的規劃圖。圖7所示 的兒憶模組包括兩個32M X 8位元之高整合記憶裝置丨2 _ j至 4及22-1至22-4 ’因此具有512M位元組容量。於圖1及 7中’相似的參考數字標示相似的零件。 虛線邵份1 0 ’中所排列的高整合記憶裝置丨2 _丨至丨2 _ 4係 士裝在兄憶模組的正面1 〇上。啓用高整合記憶裝置丨2 _ 3至 1 2 *4的運作以響應晶片選擇信號(CSBO),以及啓用系統時 序信號(CLKO)以響應時序開啓信號(CKE0),以便輸入或輸 出3 2位兀資料,以響應系統時序信號(CLKO)。再者,啓用 南整合1己憶裝置1 2 -1至1 2 - 2的運作以響應晶片選擇信號 (CSB1) ’以及啓用系統時序信號(CLK1)以響應時序開啓信 號(CKE1),以便輸入或輸出3 2位元資料,以響應系統時序 信號(CLK1)。亦即,啓用記憶裝置丨2 ]至丨2 _ 4以響應晶 片選擇信號(CSBO)及時序啓用信號(CKE〇),以及輸入或輸 出64位元資料,以響應系統時序信號(CLK〇、CLK1)。 虛線部份2 0 ·中所排列的記憶裝置2 2 _丨至2 2 _ 4係安裝在 記憶模組的背面2 0上。啓用高整合記憶裝置2 2 - 1至2 2 _ 2 的運作以響應晶片選擇信號(CSB1 ),以及啓用系統時序信 -10 - 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公楚) f Aw%. 訂 (請先閲讀背面之注意事項再填寫本頁} 526498 A7 B7 經濟部中央標準局員工消費合作社印製 五、發明説明(8 號(CLKO)以響應時序開啓信號(CKE1),以便輸入或輸出 3 2位元資料,以響應系統時序信號(CLK〇)。再者,户欠用高 整合記憶裝置22·3至22_4的運作以響應晶片選擇信號 (CSB1),以及啓用系統時序信號(CLK1)以響應時序開啓信 唬(CKE1),以便輸入或輸出3 2位元資料,以響應 信號(CLIO)。亦即,啓用高整合記憶裝置12_f至12 4以 響應晶片選擇信號(CSB1)及時序啓用信號(CKEi),以及輸 入或輸出64位元資料,以響應系統時序信號(clk〇、 CLK1) 〇 然而,如上文所述,傳統.高整合記憶裝置的問題在於, 由於當兩個晶片同時執行資料輸入/輸出時會產生熱,所以 會導致降低記憶裝置的運作性能。 基於前述的原因,需要有—種高整合記憶裝置,其能夠 降低兩個晶片同時運作時所產生的熱。 爲了克服如上文所述的問占g , 士 β Α η吨本發明較佳具體實施例提 供一種具有高運作性能的高整合記憶裝置。 本發明的㈣疋提供-種記憶模组,該記憶模組上可安 裝具有高運作性能的高整合記憶裝置。 本發明還有—項目的是提供_種記憶模組控制方法,該 尤憶m可安裝具有高運作性能的高整合記憶裝置。 爲了貫現前述的目的,太路土 一& 、, 尽發明較佳具體實施例提供一種 问正…己ft裝置,㉟南整合記憶裝置包括:—封裝至少雨 個晶-片的包裝’其中每個晶片都包括預定數量的控制信號 ml af^n imi ii --1 l i mi l^K m (請先閲讀背面之注意事項再填寫本買)-8- 526498 A7 _______ B7 V. Invention Zhu Ming (6) 5 8-4 and the first bonding wire 60-3 and the second bonding wire 60-4. In the south integrated device of FIG. 5, the first lead frame 5 4-1 of the upper chip 5 2-1 and the first lead frame 5 4 · 2 of the lower chip 5 2-2 are connected to each other, and the upper layer The second lead frame 54-2 of the wafer 5 2-1 and the second lead frame 54_4 of the lower wafer 52-2 are connected to each other. The lead frames 54-1 to 54-4 are respectively connected to a plurality of control signal supply pins of the upper wafer 52 · i and the lower wafer 5 2-2. Although not shown in the figure, the lead frames connected to the plurality of shell input / output pins of the upper wafer 52-1 and the lower wafer 52_2 are not connected to each other and are configured in a mutually independent manner. In other words, except for the lead frames connected to the data input / output pins of the 32M × 8-bit upper chip 52-1 and the lower chip 5 · 2-2, all of the upper chip 52 "and the lower chip 52 · 2 The first and first lead frames are connected to each other. Therefore, the configuration of the high-integration memory device is the same as that shown in FIG. 3. The first lead frame 544 and the second lead frame 5 4-2 shown in FIG. Used as signal input / output pin. Figure 6 shows the 32M X 8-bit 5 4-pin TSOP type SDRAM pin configuration. Figure 6 shows the pin numbers 4, 7, and 10, 15, 40, 42, 45, 48, and 5 1 indicate non-connected (NC) pins. For highly integrated memory devices that do not package the two chips 52-1 and 52-2 into one package 'The connectionless lead frame of chip 5 2 · 1 must be connected to the data input / output (DQ0 to DQ7) lead frame of chip 5 2-2. Therefore, the configuration of the highly integrated memory device and the group shown in FIG. 3 The state is the same, and it becomes 32M χ 8-bit χ 2 SDRAM. In the highly integrated memory device shown in FIG. 5, two chips 5 2-1 will be enabled at the same time. 5 The operation of 2-2 is in response to the chip selection signal and when the system is enabled. -9-Printed by the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs 526498 A7 ~ --- B7 V. Description of the invention (7) ^ 仏 is opened in response to the timing Signal in order to input 8-bit data to the two chips 52-1 and 52-2 or output 8-bit data from the two chips 52-1 and 52-2 in response to the system timing signal. As described above Because two chips perform I / O at the same time, heat will be generated, which will reduce the performance of the memory device. Figure 7 shows the highly integrated brother memory device shown in Figure 5 installed on the memory module shown in Figure 1. And the plan of the control signal line on the motherboard. The memory module shown in Figure 7 includes two 32M X 8-bit highly integrated memory devices 2_ j to 4 and 22-1 to 22-4 ' Therefore, it has a capacity of 512M bytes. In Figures 1 and 7, 'similar reference numerals indicate similar parts. The highly integrated memory devices arranged in dotted lines Shaofen 1 0' 丨 2 _ 丨 to 丨 2 _ 4 series On the front of the brother memory module 1 0. Enable the highly integrated memory device 丨 2 _ 3 to 1 2 * 4 operation in response Chip select signal (CSBO), and enable system timing signal (CLKO) in response to the timing on signal (CKE0), in order to input or output 32-bit data in response to the system timing signal (CLKO). Furthermore, enable Southern Integration 1 The memory device 1 2 -1 to 1 2-2 operates in response to the chip select signal (CSB1) 'and enables the system timing signal (CLK1) in response to the timing enable signal (CKE1) to input or output 32 bit data, In response to the system timing signal (CLK1). That is, the memory devices 丨 2] to 丨 2 _ 4 are enabled in response to the chip select signal (CSBO) and the timing enable signal (CKE〇), and input or output 64-bit data in response to the system timing signals (CLK0, CLK1 ). The memory devices 2 2 _ 丨 to 2 2 _ 4 arranged in the dotted line 2 0 · are mounted on the back 20 of the memory module. Enabling the operation of the highly integrated memory device 2 2-1 to 2 2 _ 2 in response to the chip selection signal (CSB1), and enabling the system timing letter -10-This paper size applies to the Chinese National Standard (CNS) A4 specification (210X297) f Aw%. Order (Please read the precautions on the back before filling out this page} 526498 A7 B7 Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs V. Invention Description (No. 8 (CLKO) in response to the timing opening signal (CKE1), In order to input or output 32-bit data in response to the system timing signal (CLK0). Furthermore, the user owes the operation of the highly integrated memory devices 22 · 3 to 22_4 in response to the chip selection signal (CSB1) and enables the system timing The signal (CLK1) turns on the signal blunt (CKE1) in response to the timing so that 32-bit data can be input or output in response to the signal (CLIO). That is, the highly integrated memory devices 12_f to 12 4 are enabled in response to the chip selection signal (CSB1 ) And timing enable signal (CKEi), and input or output 64-bit data in response to system timing signals (clk〇, CLK1) 〇 However, as mentioned above, the problem with traditional .highly integrated memory devices is that Because two chips will generate heat when performing data input / output at the same time, it will reduce the operating performance of the memory device. Based on the foregoing reasons, there is a need for a highly integrated memory device, which can reduce the The heat generated. In order to overcome the above-mentioned problem, g β β A η tons, a preferred embodiment of the present invention provides a highly integrated memory device with high operation performance. The present invention provides a memory module The memory module can be equipped with a highly integrated memory device with high operating performance. The present invention also provides a method for controlling the memory module, and the Youyi m can be installed with a highly integrated memory device with high operating performance. In order to achieve the foregoing purpose, Tailu Tuyi &, as far as possible, the preferred embodiment provides a corrective ... Jift device, Taonan integrated memory device includes:-a package encapsulating at least rain crystals-tablets' Each of these chips includes a predetermined number of control signals ml af ^ n imi ii --1 li mi l ^ K m (Please read the precautions on the back before filling in this purchase)

1T -11 -1T -11-

526498 A7 ___ B7 ________ 五、發明説明(9 ) 焊接區;以及,預先數量的控制信號供應端子,其連接至 該等預定數量的控制信號焊接區。 本發明較佳具體實施例提供一種高整合記憶裝置,該高 整合記憶裝置包括:一封裝第一及第二晶片的包裝,其中 每個晶片都包括預定數量的控制信號供應焊接區;以及, 第一及第二晶片選擇信號供應接腳針,其分別連接至該等 預定數量控制信號供應焊接區之中的第一及第二晶片信號 供應焊接區,以供應用以啓用該第一及第二晶片運作的信 號。 本發明較佳具體實施例提·供一種記憶模組,該記憶模組 包括:分別對應於各自晶片的複數個高整合記憶裝置,辛 個高整合記憶裝置都包括:a ) —封裝至少兩個晶片的包裝 ’其中每個晶片都包括預定數量的控制信號焊接區;以及 ,b)預先數量的控制信號供應端子,其連接至該等預定數 量的控制信號焊接區,其中會啓用對應的複數個高整合記 憶裝置晶片,以響應自該等預先數量控制信號供應端子所 供應的控制信號,以便輸入及輸出資料。, 經濟部中央標準局員工消費合作社印製 (請先閱讀背面之注意事項存填寫本頁)526498 A7 ___ B7 ________ 5. Description of the invention (9) Welding area; and a predetermined number of control signal supply terminals connected to the predetermined number of control signal welding areas. A preferred embodiment of the present invention provides a highly integrated memory device. The highly integrated memory device includes: a package for packaging a first chip and a second chip, wherein each chip includes a predetermined number of control signal supply pads; and A first and a second chip selection signal supply pin, which are respectively connected to the first and second chip signal supply pads of the predetermined number of control signal supply pads to supply the first and second chip Signal of chip operation. A preferred embodiment of the present invention provides a memory module. The memory module includes: a plurality of highly integrated memory devices corresponding to respective chips, and each of the highly integrated memory devices includes: a)-packaging at least two Packaging of wafers' where each wafer includes a predetermined number of control signal pads; and, b) a predetermined number of control signal supply terminals connected to the predetermined number of control signal pads, where a corresponding plurality of The highly integrated memory device chip is responsive to control signals supplied from the predetermined number of control signal supply terminals for inputting and outputting data. Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs (please read the precautions on the back and fill in this page)

Li 本發明較佳具體實施例提供一種包含複數個高整合記憶 裝置的記憶模組,每個高整合記憶裝置都包括:a)—封裝 第一及第二晶片的包裝’其中每個晶片都包括預定數量的 控制信號供應焊接區;以及,b)第一及第二晶片選擇信號 供應接腳針,其分別連接至該等預定數量控制信號供應焊 接區之中的第一及第二晶片信號供應焊接區,以供應用以 啓用該第一及第二晶片運作的信號,其中會分別啓用該等 -12- 本紙張尺度適用中國國家標準(CNS ) A4規格(公i ^~~ 526498 五、發明説明(1〇) 複數個高整合+ > 應至該第—個的第一晶片,以響應-供 便輸入或心資::應ί腳針的第一晶片選擇信號,以 愔I w、— 料,並且會同時啓用該等複數個高整合記 二二::T個的第二晶片,以響應-供應至該第二晶片 ……矣腳針的第二晶片選擇信號,以便輸人或輸出資 料。 本發月k佳具體實施例進_步提供—種記憶模組控制方 二’;:記憶模組包括有安裝至少兩個第一及第二晶片的複 、、固冋正合圮憶裝置,用以接收及輸出資料,以響應位於 Θ记隐ω上層表面及下層表面的第一及第二控制信號。該 方…已括下列步服:輸入及輸出資料,其方式是同時啓用 β等複數個鬲整合記憶裝置之每一個的第一晶片,以響應 該第一控制信號;以及,輸入及輸出資料,其方式是同時 啓用該等複數個高整合記憶裝置之每一個的第二晶片,以 響應該第二控制信號。 圖式簡單揣械 爲了更瞭解本發明及其優點,請參考配合附圖説明的較 佳具體實施例詳細説明,其中相似的參考數字標示相似的 零件,以及其中: 經濟部中央標準局員工消費合作社印製 (請先閱讀背面之注意事項再填寫本頁) 圖1 Α及1Β分別顯示傳統144接腳針/200接腳針記憶模組 之正面及背面組態配置的規劃圖; 圖2顯示TSOP型SDRAM斷面圖; 圖3顯示54接腳針TSOP型SDRAM接腳針組態配置的規割 圖;一 -13 · Ϊ紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) " " -- 經濟部中央標準局員工消費合作社印製 526498 A7 ____ B7 五、發明説明(η) 圖4顯示安裝在圖1 a及1 Β所示之記憶模組之記憶裝置及 控制信號線的規劃圖; 圖5顯示將兩個晶片封裝至一個包裝之高整合記憶裝置的 斷面圖; 圖6顯示32M X 8位元5 4接腳針TSOP型SDRAM接腳針組態 配置的規劃圖; 圖7顯示安裝在圖1所示記憶模組之圖5所示之高整合記 憶裝置及控制信號線的規劃圖; 圖8顯示根據本發明較佳具體實施例之高整合記憶裝置之 接腳針組態配置的規劃圖;· 圖9顯不根據本發明較佳具體實施例之安裝在圖1所示之 A憶模組之高整合記憶裝置及位於主機板上之控制信號線 的規劃圖;以及 圖1 〇顯示根據本發明修改型具體實施例之安裝在圖1所 不 < 記憶模組之高整合記憶裝置及位於主機板上之控制信 號線的規劃圖。 較佳具體實施例詳細説明 現在將藉由本發明的較佳具體實施例並參考示範性附圖 來說明本發明。 圖8顯示根據本發明較佳具體實施例之高整合記憶裝置之 接腳針組怨配置的規劃圖。接腳針號碼丨5標示晶片選擇信 唬(CSB1)供應接腳針。接腳針號碼4 〇標示時序開啓信號 (CKE1)。接腳針號碼19標示晶片選擇信號(csb〇供應接 脚針。接腳針號碼37標示時序開啓信號(CKE〇)供應接腳針 (請先閲讀背面之注意^項再填寫本頁)Li A preferred embodiment of the present invention provides a memory module including a plurality of highly integrated memory devices, each of which includes: a)-a package that packages the first and second chips, wherein each chip includes A predetermined number of control signal supply pads; and, b) first and second chip selection signal supply pins connected to the first and second chip signal supplies of the predetermined number of control signal supply pads, respectively Welding area to supply signals to enable the operation of the first and second chips, which will be used separately. -12- This paper size applies Chinese National Standard (CNS) A4 specifications (public i ^ ~~ 526498 V. Invention Explanation (1〇) A plurality of high-integration + > should be to the first chip of the first, in response to-supply or input :: the first chip selection signal of the foot pin should be 愔 I w, — Materials, and will simultaneously enable these multiple high-integration notes 22 :: T second chips, in response to-the second chip selection signal supplied to the second chip ... Output data. Yuekjia specific embodiment further provides a kind of memory module control method '; the memory module includes a complex, solid-state memory device with at least two first and second chips installed, for Receive and output data in response to the first and second control signals located on the upper surface and lower surface of the Θ hidden ω. The party ... has included the following steps: input and output data by simultaneously enabling a plurality of β and other 鬲A first chip of each of the integrated memory devices in response to the first control signal; and inputting and outputting data by simultaneously enabling a second chip of each of the plurality of highly integrated memory devices in response to the Second control signal. Simple diagram. For a better understanding of the present invention and its advantages, please refer to the detailed description of the preferred embodiment illustrated in the accompanying drawings. Similar reference numerals indicate similar parts, and of which: Printed by the Consumer Bureau of the Standards Bureau (please read the precautions on the back before filling out this page) Figure 1 Α and 1B show the front of the traditional 144-pin / 200-pin memory module respectively And the rear configuration plan; Figure 2 shows the TSOP-type SDRAM cross-sectional view; Figure 3 shows the 54-pin TSOP-type SDRAM pin configuration and configuration diagram; I-13 · ΪThe paper size is applicable to China Standard (CNS) A4 size (210X297 mm) " "-Printed by the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs 526498 A7 ____ B7 V. Description of the invention (η) Figure 4 shows the installation in Figure 1 a and 1 Β Figure 5 shows the plan of the memory device and control signal line of the memory module; Figure 5 shows a cross-section view of a highly integrated memory device in which two chips are packaged into a package; Figure 6 shows a 32M X 8-bit 5 4 pin TSOP type SDRAM pin configuration plan; Figure 7 shows the highly integrated memory device and control signal lines shown in Figure 5 installed in the memory module shown in Figure 1; Figure 8 shows the comparison according to the present invention A plan view of the pin configuration of the highly integrated memory device according to the preferred embodiment; FIG. 9 shows a highly integrated memory device installed in the A memory module shown in FIG. 1 according to a preferred embodiment of the present invention And the plan of the control signal line on the motherboard Figure 1 shows the installation and a square embodiment of FIG. 1 according to a modification not in & lt particular embodiment of the invention; FIG high memory module programming of integrated memory device and a control signal line located on the motherboard. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will now be described by way of preferred embodiments of the invention and with reference to exemplary drawings. FIG. 8 shows a plan view of a pin configuration of a highly integrated memory device according to a preferred embodiment of the present invention. Pin number 丨 5 indicates the chip selection signal (CSB1). Pin number 4 〇 indicates the timing on signal (CKE1). Pin number 19 indicates the chip selection signal (csb〇 supply pin. Pin number 37 indicates the timing on signal (CKE〇) supply pin (please read the note on the back ^ before filling this page)

-14 --14-

526498 A7 B7 經濟部中央標準局員工消費合作社印製 五、發明説明(12) 。其他的接腳針組態配置與圖6所示的接腳針組態配置相同。 在傳統高整合記憶裝置中,兩個晶片的晶片選擇信號供 應引線框及時序啓用信號供應引線框會互相連接。然而, 在圖8所示的高整合記憶裝置中,兩個晶片的晶片選擇信號 供應引線框及時序啓用信號供應引線框不會互相連接,而 是以互相獨立的方式組態。再者,在傳統高整合記憶裝置 中,兩個晶片的八個資料輸入/輸出引線框不會互相連接, 而是以互相獨立的方式組態。然而,在圖8所示的高整合記 憶裝置接腳針組態配置中,兩個晶片的八個資料輸入/輸出 引線框會互相連接。因此,啓用圖8所示之高整合記憶裝置 的運作以響應晶片選擇信號(CSB〇),以及啓用系統時序信 唬(CLK)以響應時序開啓信號(CKE〇),以便將資料輸入至 兩個晶片的其中一個或自兩個晶片的其中一個輸出資料。 再者,啓用南整合記憶裝置的運作以響應晶片選擇信號 (CSB1),以及啓用系統時序信號(CLK)以響應時序開啓信 號(CKE1),以便將資料輸入至兩個晶片的另一個或自兩個 晶片的另一個輸出資料。亦即,在圖8所示的高整合記憶裝 置中可運作包裝中的兩個晶片,以響應來自於互相不同 的控制信號。 在圖8所示的高整合記憶裝置中,兩個晶片的資料輸入/ 輸出引線框會在内部互相連接,並且在外部組態8位元資料 輸入/輸出接腳針(DQO至DQ7)。然而,由於圖8所示的高整 合記憶裝置具有無連接(>1(:)接腳針,所以兩個晶片的資料 輸人/輸出焊接區不會在内邵互相連接,圖8所示的無連接 (請先閲讀背面之注意事項再填寫本頁)526498 A7 B7 Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs 5. Description of Invention (12). The other pin configuration is the same as that shown in FIG. 6. In a conventional highly integrated memory device, the chip selection signal supply lead frame and the timing enable signal supply lead frame of the two chips are connected to each other. However, in the highly integrated memory device shown in FIG. 8, the chip selection signal supply lead frame and the timing enable signal supply lead frame of the two chips are not connected to each other, but are configured in a mutually independent manner. Furthermore, in a conventional highly integrated memory device, the eight data input / output lead frames of the two chips are not connected to each other, but are configured in a mutually independent manner. However, in the pin configuration of the highly integrated memory device shown in FIG. 8, the eight data input / output lead frames of the two chips are connected to each other. Therefore, the operation of the highly integrated memory device shown in FIG. 8 is enabled in response to the chip select signal (CSB〇), and the system timing signal (CLK) is enabled in response to the timing enable signal (CKE〇) to input data into two Data is output from one of the wafers or from one of the two wafers. Furthermore, the operation of the South integrated memory device is enabled in response to the chip select signal (CSB1), and the system timing signal (CLK) is enabled in response to the timing enable signal (CKE1) to input data to the other of the two chips or from two Output data from one chip. That is, in the highly integrated memory device shown in Fig. 8, two chips in the package can be operated in response to control signals from each other. In the highly integrated memory device shown in FIG. 8, the data input / output lead frames of the two chips are interconnected internally, and 8-bit data input / output pin pins (DQO to DQ7) are externally configured. However, since the highly integrated memory device shown in FIG. 8 has a no connection (> 1 (:) pin, the data input / output pads of the two chips will not be connected to each other in Inshao, as shown in FIG. 8 No connection (Please read the notes on the back before filling out this page)

*1T 如 -15 經濟部中央標準局員工消費合作社印製 526498 A7 -----— ____B7______ 五、發明説日月(13) 接腳針可連接其他晶片的資料輸入/輸出焊接區,以在外部 組態16位元資料輸入/輸出接腳針(DQO至DQ15)。再者, 假使不需要以低電力來運作高整合記憶裝置,則可互相連 接時序啓用信號(CKE0,CKE1)供應接腳針。 圖9顯示根據本發明較佳具體實施例之安裝在圖1所示之 記憶模組之高整合記憶裝置及位於主機板上之控制信號線 的規劃圖。此記憶模組具有八個32M X8位元x2高整合記 憶裝置,因此其容量爲512M位元組。於圖1及9中,相似的 參考數字標示相似的零件。 虛線部份1 0'中所排列的記憶裝置i 2- 1至丨2-4是安裝在 記憶模組正面1 〇上的記憶裝置。啓用每個高整合記憶裝置 1 2 - 1至1 2 - 4之其中一個晶片的運作以響應晶片選擇信號 (CSB0),以及啓用系統時序信號(CLK〇)以響應時序開啓信 號(CKE0),以便輸入或輸出8位元資料,以響應系統時序 信號(C LK 0 )。再者,啓用每個高整合記憶裝置丨2 - 1至丨2 _ 4的運作以響應晶片選擇信號(CSB1),以及啓用系統時序 信號(CLK1)以響應時序開啓信號(CKE1),以便輸入或輸出 8位元資料,以響應系統時序信號(clki)。 虛線部份2 0 1中所排列的記憶裝置2 2 - 1至2 2 - 4是安裝在 記憶模組背面2 0上的記憶裝置。啓用每個高整合記憶裝置 2 2 - 1至2 2 - 4之其中一個晶片的運作以響應晶片選擇信號 (CSB0),以及啓用系統時序信號(CLK0)以響應時序開啓信 號(CKE0),以便輸入或輸出8位元資料,以響應系統時序 信號(CLK0)。再者,啓用每個高整合記憶裝置22-1至22- -16 - 本紙張只Jl適用中國國家標準(CNS ) A4規格(210 X297公釐^ 衣 訂 (請先閱讀背面之注意事項再填寫本頁} 526498 A7 B7 經濟部中央標準局員工消費合作社印製 五、發明説明(14) 4的運作以響應晶片選擇信號(CSB1),以及啓用系統時序 信號(CLK1)以響應時序開啓信號(CKE1),以便輸入或輸出 8位元資料,以響應系統時序信號(CLK1)。 換各之’晶片選擇信號(CSBO)及時序啓用信號(CKEO)會 使6己憶裝置12-1至12-4及22-1至22-4的上層(或下層)晶 片同時運作,晶片選擇信號(CSB1)&時序啓用信號(ckeo 會使記憶裝置12-1至12-4及22-1至22-4的下層(或上層) 晶片同時運作。因此,會將8位元資料輸入至記憶裝置12_ 1至12-4及22-1至22-4或自記憶裝置12-1至12-4及22-1 至2 2-4輸出8位元資料,因-此,輸入至記憶模組或自記憶 模組輸出的總資料是64位元。 此時,不僅因爲記憶裝置12-1至12-4及22-1至22-4的 上層晶片及下層晶片會同時運作,而且還因爲正背面的上 層晶片及下層晶片會各自運作,所以能夠改善因上層晶片 及下層晶片同時運作時所產生的熱而導致降低記憶模組運 作性能的問題。 圖1 0顯示根據本發明修改型具體實施例之安裝在圖1所 示之兒憶模組之高整合記憶裝置及位於主機板上之控制信 號線的規劃圖。在圖1 〇的記憶模組中,會將系統時序信號 (CLKO)供應至虛線部份1 〇,上所排列的記憶裝置1 2 -1暨 12-2以及虛線部份20,上所排列的記憶裝置22_ι暨22-2, 並且,會將系統時序信號(CLK1)供應至虛線部份10,上所 排列的記憶裝置1 2 - 3暨1 2 - 4以及虛線部份2 〇,上所排列的 記憶裝置2 2 - 3暨2 2 - 4。因此,會將系統時序信號(CLK0, 17- 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) I I I I n 訂 (請先閱讀背面之注意事項再填寫本頁) 526498 經濟部中央標準局員工消費合作社印製 A7 B7 五、發明説明(15) ^ ^~ CLK1)以分離方式供應至位於正面的記憶裝置及位於背面 的記憶裝置,如此可降低系統時序信號線的負載,進而加 速信號傳輸。再者,由於記憶裝置的上層晶片及下層不是 同時運作,而是分別運作,所以可改善運作性能。 在前面的具體實施例中,高整合記憶裝置的包裝中具有 至少兩個晶片。當高整合記憶裝置的包裝中具有三個晶片 時,可用下列方式來組態記憶裝置:互相連接兩個晶片的 晶片選擇信號供應接腳針及兩個時序啓用信號供應接腳針 ,以及互相連接三個晶片的資料輸入/輸出接腳針。以某種 方法,可用下列方式來組態·記憶裝置:在外部組態三個晶 片的三個晶片選擇信號供應接腳針及三個時序啓用信號供 應接腳針,以及互相連接三個晶片的資料輸入/輸出接腳針 在相同的方式中,如果所安裝的記憶模組上的複數個高 整合記憶裝置的每一個都包括三個晶片,可用下列方式2 組態記憶模組:將資料輸入至複數個高整合記憶裝置之每 -個之三個晶片的其中一個或一個以上,或自複數個高整 合記憶裝置之每一個之三個晶片的其中一個或一個以上輸 出資料,以響應兩個晶片選擇信號及兩個時序啓用信號7 或響應三個晶片選擇信號及三個時序啓用信號。 如上文所述,在根據本發明較佳具體實施例的高整合吃 憶裝置中,由於會分別運作高整合記憶裝置中的晶片 以不會發生因熱所導致的問題,因此可改善記憶裝置的運 作性能。再者,在安裝根據本發明較佳具體實施例之高敕 合1己憶裝置的記憶模組中,由於會分別運作高整合記憶^ IT (請先閲讀背面之注意事項再填寫本頁} -18 - 526498 A7 B7 五、發明説明(16) 置中的晶片,所以不會發生因熱所導致的問題,因此可改 善記憶裝置的運作性能。此外,因爲會分開運作高整合記 憶裝置中的晶片,所以在根據本發明較佳具體實施例的記 憶模組及控制方法可改善記憶模組的可靠度,由於會分別 運作高整合記憶裝置中的晶片,因此再也不會發生因過熱 所導致的問題。 雖然本發明參考其較佳具體實施例進行説明,熟知技藝 人士應知道前述及其他變更的形式及細節,而不會脱離本 發明的精神與範疇。 (請先閱讀背面之注意事項再填寫本頁) 經濟部中央標準局員工消費合作社印製 -19- 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐)* 1T such as -15 printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs 526498 A7 --------- ____B7______ V. Invented Sun and Moon (13) The pin can be connected to the data input / output soldering area of other chips, External configuration 16-bit data input / output pin (DQO to DQ15). Furthermore, if it is not necessary to operate the highly integrated memory device with low power, the timing enable signals (CKE0, CKE1) can be connected to each other to supply the pin pins. FIG. 9 shows a plan view of a highly integrated memory device installed on the memory module shown in FIG. 1 and a control signal line on a motherboard according to a preferred embodiment of the present invention. This memory module has eight 32M X8-bit x2 highly integrated memory devices, so its capacity is 512M bytes. In Figures 1 and 9, similar reference numerals indicate similar parts. The memory devices i 2-1 to 丨 2-4 arranged in a dotted portion 10 0 ′ are memory devices mounted on the front surface 10 of the memory module. Enable the operation of one of each of the highly integrated memory devices 1 2-1 to 1 2-4 in response to the chip select signal (CSB0), and enable the system timing signal (CLK〇) in response to the timing enable signal (CKE0) to Input or output 8-bit data in response to the system timing signal (C LK 0). Furthermore, the operation of each highly integrated memory device 丨 2-1 to 丨 2 _ 4 is enabled in response to the chip select signal (CSB1), and the system timing signal (CLK1) is enabled in response to the timing enable signal (CKE1) for inputting or Output 8-bit data in response to system timing signals (clki). The memory devices 2 2-1 to 2 2-4 arranged in a dotted portion 2 0 1 are memory devices mounted on the back 20 of the memory module. Enable each of the highly integrated memory devices 2 2-1 to 2 2-4 to operate in response to the chip select signal (CSB0), and enable the system timing signal (CLK0) in response to the timing enable signal (CKE0) for input Or output 8-bit data in response to the system timing signal (CLK0). In addition, enable each highly integrated memory device 22-1 to 22- -16-This paper is only Jl applicable to China National Standard (CNS) A4 specifications (210 X297 mm ^ clothing order (please read the precautions on the back before filling This page} 526498 A7 B7 Printed by the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs 5. Invention Description (14) 4 operates in response to the chip select signal (CSB1) and enables the system timing signal (CLK1) in response to the timing on signal (CKE1 ) In order to input or output 8-bit data in response to the system timing signal (CLK1). Replacing the 'chip selection signal (CSBO) and timing enable signal (CKEO) will cause the 6th memory device 12-1 to 12-4 And the upper (or lower) chips of 22-1 to 22-4 operate at the same time, the chip select signal (CSB1) & timing enable signal (ckeo will make the memory devices 12-1 to 12-4 and 22-1 to 22-4 The lower (or upper) chip operates simultaneously. Therefore, 8-bit data is input to the memory devices 12_ 1 to 12-4 and 22-1 to 22-4 or the self-memory devices 12-1 to 12-4 and 22- 1 to 2 2-4 output 8-bit data, therefore-the total data input to or output from the memory module 64-bit. At this time, not only the upper and lower wafers of the memory devices 12-1 to 12-4 and 22-1 to 22-4 will operate simultaneously, but also the upper and lower wafers on the front and back sides will operate separately. Therefore, the problem of reducing the operating performance of the memory module caused by the heat generated when the upper chip and the lower chip are operated at the same time can be improved. FIG. 10 shows the installation of the modified embodiment according to the modified embodiment of the present invention. The high-integrated memory device of the module and the planning diagram of the control signal line located on the motherboard. In the memory module of Figure 10, the system timing signal (CLKO) is supplied to the dotted line 10, which is arranged on the The memory devices 1 2 -1 and 12-2 and the memory devices 22_ι and 22-2 arranged on the dotted portion 20, and the system timing signal (CLK1) is supplied to the memory arranged on the dotted portion 10, Devices 1 2-3 and 1 2-4 and the dotted line 2 〇, the memory devices 2 2-3 and 2 2-4 arranged above. Therefore, the system timing signals (CLK0, 17- National Standard (CNS) A4 Specification (210X 297mm) I Order III n (Please read the notes on the back before filling this page) 526498 Printed by the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs A7 B7 V. Description of the invention (15) ^ ^ ~ CLK1) Separately supplied to the memory located on the front Device and a memory device located on the back, which can reduce the load of the system timing signal line, thereby speeding up signal transmission. Furthermore, since the upper chip and the lower layer of the memory device do not operate simultaneously, but operate separately, the operation performance can be improved. In the foregoing specific embodiment, the package of the highly integrated memory device has at least two chips. When a highly integrated memory device has three chips in the package, the memory device can be configured in the following ways: a chip selection signal supply pin and two timing enable signal supply pins connected to two chips, and connected to each other Data input / output pin for three chips. In one way, the memory device can be configured in the following ways: three chip selection signal supply pins and three timing enable signal supply pins for three chips are externally configured, and three chips are connected to each other externally. Data input / output pins In the same way, if each of the plurality of highly integrated memory devices on the installed memory module includes three chips, the following methods can be used to configure the memory module: 2 Input data Output data to one or more of each of the three chips of the plurality of highly integrated memory devices, or output data from one or more of the three chips of each of the plurality of highly integrated memory devices in response to two Chip select signal and two timing enable signals 7 or respond to three chip select signals and three timing enable signals. As described above, in the highly integrated memory device according to the preferred embodiment of the present invention, since the chips in the highly integrated memory device are separately operated so that problems caused by heat do not occur, the memory device can be improved. Operational performance. Furthermore, in the memory module installed with the high-coupling 1 memory device according to the preferred embodiment of the present invention, since the highly integrated memory will be operated separately ^ IT (Please read the precautions on the back before filling this page}- 18-526498 A7 B7 V. Description of the invention (16) The chip in the center will not cause problems caused by heat, so the performance of the memory device can be improved. In addition, the chip in the highly integrated memory device will be operated separately. Therefore, in the memory module and the control method according to the preferred embodiments of the present invention, the reliability of the memory module can be improved. Since the chips in the highly integrated memory device are operated separately, the overheating caused by overheating will never occur Question. Although the present invention is described with reference to its preferred embodiments, those skilled in the art should know the forms and details of the foregoing and other changes without departing from the spirit and scope of the present invention. (Please read the precautions on the back before (Fill in this page) Printed by the Consumer Cooperatives of the Central Bureau of Standards of the Ministry of Economic Affairs -19- This paper size applies to China National Standard (CNS) A4 (210X 297 mm)

Claims (1)

526498 A8 B8 C8 D8 申請、專利範圍526498 A8 B8 C8 D8 application, patent scope 2 經濟部智慧財產局員工消費合作社印製 一種高整合記憶體_,其包括: 一封裝至少兩個、灞#的包裝,其中每個晶片都包括預 定數量的控制信號*旱“區;以及 ' 預先數虽的控制仏號供應端子,其連接至該等預定數 量的控制信號焊接區。 如申請專利範圍第1項之裝置,其中該等預先數量控制 k號供應端子包括晶片選擇信號供應‘端子及時序啓用信 號供應端子。 如申请專利範圍第2項之裝置,其中會啓用每個晶片以 響應一供應至該晶片選擇信號供應端子的晶片選擇信號 ,啓用一系統時序信號以響應一供應至該時序啓用信號 供應端子的時序開參號,以便輸入或輸出資料以響應 該系統時序信號。,:;二' 一種高整合記憶體,其包括: ΐ J”,---:' 一封裝第一及第受彳晶片的包裝,其中每個晶片都包括 預定數量的控制信號供應焊接區;以及 第一及第二晶片選擇信號供應接腳針,其分別連接至 該等預定數量控制信號供應焊接區之中的第一及第二晶 片信號供應焊接區,以供應用以啓用該第一及第二晶片 運作的信號。 如申請專利範園第4項之裝置,該裝置進一步包括:第 一及第二時序啓用信號供應接腳針,其連接至該等預定 數量控制信號供應焊接區之中的第一及第二時序啓用信 一號供應焊接區,以供應用以控制供應至該第一及第二晶 閱 讀 背 面 之 注 意 事 項 再J 本 頁 1 I訂 -20- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 526498 A8 B8 C8 D8 六、申請、專利範圍 經濟部智慧財產局員工消費合作社印製 片的系統時序信號。 一種記憶體模組,其包括·· 一分別位於該記憶模組上層表面及下層表面上的複數個 高整合記憶裝置,每個高整合記憶裝置都包括: a) —封裝至少兩個晶片的包裝,其中每個晶片都包 括預定數量的控制信號焊接區;以及 b) 預先數量的控制信號供應端子‘,其連接至該等預 定數量的控制信號焊接區, 其中會同時啓用對應的該等複數個高整合記憶裝置之 每-個的晶片,以響應自該等預先數量控制信號供應端 子所供應的控制信號,以便輸入及輸出資料。 如申請專利範圍第6項之模組,其中該記憶模組是寬度 1.25对、南度2.66忖及厚度〇 15忖的SODIMM。 如申請專利範圍第6項之模組,其中該等預先數量控制 信號供應端子包括晶片選擇信號供應端子及時序啓用信 號供應端子。 如申凊專利範圍第7項之模組,其中會啓用每個晶片以 響應分別對應於各自晶片之一供應至該晶片選擇信號供 應端子的晶片選擇信號,啓用一系統時序信號以響應一 供應至該時序啓用信號供應端子的時序開啓信號Y ^便 輸入或輸出資料以響應該系統時序信號。 10·如申請專利範圍第9項之模組,其中會將系統時序信號 分劃成預定數量時序信號,並且將該等預定數量時序信 號以分離方式供應至位於正面的記憶裝置及位於背面的 6. 7. 8· 9. -21 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) _ A8 B8 C8 D8 526498 六、 申請、專利範圍 記憶裝置。 1 1 . 一種記憶體模組,其包括: 分別位於該記憶模組上層表面及下層表面上的複數個 南整合1己憶裝置,每個高整合記憶裝置都包括: a) —封裝第一及第二晶片的包裝,其中每個晶片都 包括預定數量的控制信號供應焊接區;以及 b) 第一及第二晶片選擇信號供應接腳針,其分別連 接至该等預定數量控制信號供應焊接區之中的第一及 弟一晶片k $虎供應焊接區’以供應用以啓用該第一及 第二晶片運作的信號, 其中會分別啓用該等複數個高整合記憶裝置之每一個 的第一晶片,以響應一供應至該第一晶片信號供應接腳 針的第一晶片選擇信號,以便輸入或輸出資料,並且會 同時啓用該等複數個高整合記憶裝置之每一個的第二晶 片,以響應一供應至該第二晶片信號供應接腳針的第二 晶片選擇信號,以便輸入或輸出資料/ 1 2 ·如申請專利範圍第1 1項之模組,其中該高整合記憶裝置 進一步包括··第一及第二時序啓用信號供應接腳針,其 連接至該等預定數量控制信號供應焊接區之中的第一及 第二時序啓用彳㊁號供應焊接區’以供應用以控制供與至 該第一及第二晶片的系統時序信號。 13.如申請專利範圍第1 1項之模組,其中該記憶模組是寬度 1.25吋、高度2.66吋及厚度0.15吋的SODIMM。 1 4 ·—如申請專利範圍第1 1項之模組,其中該記憶模組是寬度 -22- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁). I · n ·ϋ n n n n n 一一OJa n I in ϋ 經濟部智慧財產局員工消費合作社印製 526498 經濟部智慧財產局員工消費合作社印製 A8 i ___ D8 六、申請專利範圍 1·18吋、高度1·5吋及厚度0.15吋的μ-Ι)ΙΜΜ。 15·如申請專利範圍第1丨項之模組,其中會將8位元資料輸 入至記憶裝置的每一個或自記憶裝置的每一個輸出8位 元資料,因此,輸入至記憶模組或自記憶模組輸出的總 資料是64位元。 16·如申請專利範圍第12項之模組,其中會啓用該等複數個 咼整合記憶裝置之每一個的第一晶片·,以響應該第一晶 片選擇信號’啓用該系統時序信號以響應該第一時序啓 用信號,以便輸入或輸出資料以響應該時序啓用信號, 並且會啓用該等複數個高整合記憶裝置之每一個的第二 晶片,以響應該第二晶片選擇信號,啓用該系統時序信 號以響應該第一時序啓用信號,以便輸入或輸出資料以 響應該時序啓用信號。 17· —種記憶模組控制方法,該記憶模組包括有安裝至少兩 個第一及第二晶片的複數個高整合記憶裝置,用以接收 及輸出資料,以響應位於該記憶體上層表面及下層表面 的弟一及弟一控制信號’該方法包括下列步驟: 輸入及輸出資料’其方式是同時啓用該等複數個高整 合記憶裝置之每一個的第一晶片,以響應該第一控制作 號;以及 輸入及輸出資料,其方式是同時啓用該等複數個高整 合記憶裝置之每一個的第二晶片,以響應該第二控制信 號。 1 8 ·—如申請專利範圍第1 7項之方法,其中該記憶模組是寬度 -23 - 本紙張尺度適用中國國家&準(CNS)A4規格(21G χ 297公餐) (請先閱讀背面之注意事項寫本頁) i:農 寫太 訂---------線k 526498 A8 B8 C8 D8 、申請專利範圍 1.25吋、高度2.66付及厚度〇15忖的3〇1)1]^]^。 1 9 ·如申請專利範圍第i 2項之方法,其中該記憶模組是寬度 1.18付南度U忖及厚度〇15忖的μ_ DIMM。 20·如申請專利範園第17項之方法,其中在該等複數個高整 合記憶裝置的每一個接收或輸出8位元資料及總共6 4位 元資料。 (請先閱讀背面之注意事 —--- 項寫本頁X 線 經濟部智慧財產局員工消費合作社印製 24 - 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱)2 The Ministry of Economic Affairs ’Intellectual Property Bureau employee consumer cooperative prints a highly-integrated memory_, which includes: a package containing at least two, ##, where each chip includes a predetermined number of control signals * drought“ zone; The pre-numbered control number supply terminals are connected to the predetermined number of control signal welding areas. For the device in the scope of the patent application, the pre-number control k-number supply terminals include the chip selection signal supply 'terminal. The signal supply terminal is enabled in a timely manner. For the device in the scope of patent application No. 2, each chip is enabled in response to a chip selection signal supplied to the chip selection signal supply terminal, and a system timing signal is enabled in response to a supply to the device. The timing enable parameter of the timing enable signal supply terminal is used to input or output data in response to the timing signal of the system., ;; 'A highly integrated memory, which includes: ΐ J ”, ---:' One package first And first and second wafers, each of which includes a predetermined number of control signal supply pads; and first and second wafers The selection signal supply pins are respectively connected to the first and second chip signal supply pads of the predetermined number of control signal supply pads to supply signals for enabling the operation of the first and second chips. If the device of the patent application No. 4 is applied, the device further includes: first and second timing enable signal supply pins, which are connected to the first and second timings among the predetermined number of control signal supply pads. The letter No. 1 is supplied to the welding zone to supply the precautions for controlling the supply to the back of the first and second crystals. J Page 1 I-20-This paper size applies to China National Standard (CNS) A4 specifications ( 210 X 297 mm) 526498 A8 B8 C8 D8 6. Application, Patent Scope System timing signals printed by employees' cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. A memory module includes: a plurality of highly integrated memory devices located on an upper surface and a lower surface of the memory module, each of which includes: a) a package encapsulating at least two chips , Each of which includes a predetermined number of control signal pads; and b) a predetermined number of control signal supply terminals, which are connected to the predetermined number of control signal pads, where a corresponding plurality of these are simultaneously enabled Each of the highly integrated memory devices responds to the control signals supplied from the predetermined number of control signal supply terminals in order to input and output data. For example, the module in the sixth scope of the patent application, wherein the memory module is a SODIMM with a width of 1.25 pairs, a southness of 2.66 忖, and a thickness of 15 忖. For example, the module in the sixth scope of the patent application, wherein the pre-quantity control signal supply terminals include a chip selection signal supply terminal and a timing enable signal supply terminal. For example, the module of claim 7 of the patent scope will enable each chip to respond to a chip selection signal corresponding to one of the respective chips supplied to the chip selection signal supply terminal, and enable a system timing signal in response to a supply to The timing enable signal Y ^ of the timing enable signal supply terminal inputs or outputs data in response to the system timing signal. 10 · If the module of the scope of patent application No. 9, the system timing signals are divided into a predetermined number of timing signals, and the predetermined number of timing signals are separately supplied to the memory device on the front and the 6 on the back. 7. 8. · 9. -21 This paper size applies to China National Standard (CNS) A4 specification (210 X 297 mm) _ A8 B8 C8 D8 526498 6. Application, patent scope memory device. 1 1. A memory module comprising: a plurality of south integrated 1 memory devices located on an upper surface and a lower surface of the memory module, each of the highly integrated memory devices includes: a) —package first and A package of second wafers, wherein each wafer includes a predetermined number of control signal supply pads; and b) the first and second wafer selection signal supply pins are connected to the predetermined number of control signal supply pads, respectively Among them, the first and the second chip k $ tiger supply welding area 'are used to supply signals for enabling the operation of the first and second chips, wherein the first of each of the plurality of highly integrated memory devices is enabled respectively. Chip, in response to a first chip selection signal supplied to the first chip signal supply pin, so as to input or output data, and simultaneously enable the second chip of each of the plurality of highly integrated memory devices to Responds to a second chip selection signal supplied to the second chip signal supply pin, so as to input or output data / 1 2 · As the module of the scope of patent application No. 11 Group, wherein the highly integrated memory device further includes first and second timing enable signal supply pins connected to the first and second timing enable signals of the predetermined number of control signal supply pads. The supply pads are used to supply system timing signals for controlling supply to the first and second chips. 13. The module according to item 11 of the patent application scope, wherein the memory module is a SODIMM with a width of 1.25 inches, a height of 2.66 inches, and a thickness of 0.15 inches. 1 4 · —If the module in the scope of patent application No. 11 is used, the memory module has a width of -22- This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) (Please read the back first Please note this page before filling in this page). I · n · nn nnnnn-OJa n I in 印 Printed by the Employees 'Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 526498 Printed by the Employees' Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs A8 i ___ D8 VI. Application The patent range is 1.18 inches, height 1.5 inches, and μ-1) IMM with a thickness of 0.15 inches. 15 · If the module in the scope of patent application No. 1 丨, 8-bit data will be input to each of the memory devices or 8-bit data will be output from each of the self-memory devices. The total data output by the memory module is 64 bits. 16. If the module of the scope of patent application No. 12 is used, the first chip of each of the plurality of integrated memory devices will be enabled in response to the first chip selection signal 'enable the system timing signal in response to the The first timing enable signal, so as to input or output data in response to the timing enable signal, and enable the second chip of each of the plurality of highly integrated memory devices in response to the second chip selection signal to enable the system The timing signal is in response to the first timing enabling signal, so that data is input or output in response to the timing enabling signal. 17. · A method for controlling a memory module, the memory module comprising a plurality of highly integrated memory devices mounted with at least two first and second chips for receiving and outputting data in response to the upper surface of the memory and The lower surface of the first and second control signals 'the method includes the following steps: inputting and outputting data' by means of simultaneously enabling the first chip of each of the plurality of highly integrated memory devices in response to the first control operation And inputting and outputting data in a manner of simultaneously enabling the second chip of each of the plurality of highly integrated memory devices in response to the second control signal. 1 8 · —If you apply for the method of item 17 in the scope of patent application, where the memory module has a width of -23-This paper size is applicable to China & quasi (CNS) A4 specifications (21G χ 297 meals) (Please read first (Notes on the reverse side of this page) i: The farmer's book is too customized --------- line k 526498 A8 B8 C8 D8, patent application scope 1.25 inches, height 2.66 pairs and thickness 〇15 忖 3〇1) 1] ^] ^. 19 · The method according to item i 2 of the patent application scope, wherein the memory module is a μ_DIMM with a width of 1.18 nanometers U 忖 and a thickness of 15〇. 20. The method according to item 17 of the patent application park, wherein 8-bit data and a total of 64-bit data are received or output at each of the plurality of high-integration memory devices. (Please read the note on the back first ----- Item X-line on this page Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 24-This paper size applies to China National Standard (CNS) A4 (210 X 297 public love)
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