TW427552U - Chip examination device - Google Patents

Chip examination device

Info

Publication number
TW427552U
TW427552U TW88217159U TW88217159U TW427552U TW 427552 U TW427552 U TW 427552U TW 88217159 U TW88217159 U TW 88217159U TW 88217159 U TW88217159 U TW 88217159U TW 427552 U TW427552 U TW 427552U
Authority
TW
Taiwan
Prior art keywords
examination device
chip examination
chip
examination
Prior art date
Application number
TW88217159U
Other languages
Chinese (zh)
Inventor
Jung-Ju Wei
Original Assignee
Wei Jung Ju
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wei Jung Ju filed Critical Wei Jung Ju
Priority to TW88217159U priority Critical patent/TW427552U/en
Publication of TW427552U publication Critical patent/TW427552U/en

Links

TW88217159U 1999-10-06 1999-10-06 Chip examination device TW427552U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW88217159U TW427552U (en) 1999-10-06 1999-10-06 Chip examination device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW88217159U TW427552U (en) 1999-10-06 1999-10-06 Chip examination device

Publications (1)

Publication Number Publication Date
TW427552U true TW427552U (en) 2001-03-21

Family

ID=21654597

Family Applications (1)

Application Number Title Priority Date Filing Date
TW88217159U TW427552U (en) 1999-10-06 1999-10-06 Chip examination device

Country Status (1)

Country Link
TW (1) TW427552U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109029335A (en) * 2018-09-12 2018-12-18 江苏英锐半导体有限公司 A kind of wafer flow surface smoothness detection device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109029335A (en) * 2018-09-12 2018-12-18 江苏英锐半导体有限公司 A kind of wafer flow surface smoothness detection device

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Legal Events

Date Code Title Description
GD4K Issue of patent certificate for granted utility model filed before june 30, 2004
MM4K Annulment or lapse of a utility model due to non-payment of fees