TW359749B - Circuit and method for determining propagation delay times of testing signals - Google Patents

Circuit and method for determining propagation delay times of testing signals

Info

Publication number
TW359749B
TW359749B TW085107099A TW85107099A TW359749B TW 359749 B TW359749 B TW 359749B TW 085107099 A TW085107099 A TW 085107099A TW 85107099 A TW85107099 A TW 85107099A TW 359749 B TW359749 B TW 359749B
Authority
TW
Taiwan
Prior art keywords
circuit
socket board
device interface
propagation delay
testing signals
Prior art date
Application number
TW085107099A
Other languages
Chinese (zh)
Inventor
Yuhachi Morikawa
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Application granted granted Critical
Publication of TW359749B publication Critical patent/TW359749B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay

Abstract

The invention provides a circuit and a determining method which can easily and accurately determine each time of propagation delay in a propagating line of a plurality of testing signals of an IC device interface of an IC tester. In the propagation line of the test signal from an IC device interface part (33) of an IC tester, a connector is used so that the IC device interface part (33) of the IC socket board (A1) has a releasable construction. An IC socket board (B31), which is in the same group as the IC circuit board (A1), has its conductor removed from the through hole thereof and is connected to the IC device interface part (33). The IC socket board (B31) is detached after only the intended TPDA11 is determined directly, and, in place of the IC socket board (B31), the IC socket board (A1) is attached. An easily interchangeable construction is provided as such for testing.
TW085107099A 1995-06-22 1996-06-13 Circuit and method for determining propagation delay times of testing signals TW359749B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7179459A JPH095461A (en) 1995-06-22 1995-06-22 Propagation delay time measuring circuit for measurement signal

Publications (1)

Publication Number Publication Date
TW359749B true TW359749B (en) 1999-06-01

Family

ID=16066229

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085107099A TW359749B (en) 1995-06-22 1996-06-13 Circuit and method for determining propagation delay times of testing signals

Country Status (4)

Country Link
JP (1) JPH095461A (en)
KR (1) KR100193323B1 (en)
CN (1) CN1124491C (en)
TW (1) TW359749B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102213601A (en) * 2011-03-03 2011-10-12 中国电子科技集团公司第十研究所 Air line having replaceable joints and used for time delay parameter quantity transmission
KR102626858B1 (en) * 2016-11-02 2024-01-19 삼성전자주식회사 Test system for measuring propagation time of transmission line
CN110488595B (en) * 2019-08-29 2020-10-13 北京理工大学 Time-to-digital converter for time difference ranging of frequency modulation continuous wave radar

Also Published As

Publication number Publication date
JPH095461A (en) 1997-01-10
KR100193323B1 (en) 1999-06-15
CN1139231A (en) 1997-01-01
CN1124491C (en) 2003-10-15
KR970002368A (en) 1997-01-24

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