TW202141673A - Positioning method and positioning device for preventing reduction of processing capability per unit time - Google Patents

Positioning method and positioning device for preventing reduction of processing capability per unit time Download PDF

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TW202141673A
TW202141673A TW110108274A TW110108274A TW202141673A TW 202141673 A TW202141673 A TW 202141673A TW 110108274 A TW110108274 A TW 110108274A TW 110108274 A TW110108274 A TW 110108274A TW 202141673 A TW202141673 A TW 202141673A
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Taiwan
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liquid
sheet
supporting
wafer
hydrophilic
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TW110108274A
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Chinese (zh)
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山田忠知
毛受利彰
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日商琳得科股份有限公司
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Publication of TW202141673A publication Critical patent/TW202141673A/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J11/00Manipulators not otherwise provided for
    • B25J11/0095Manipulators transporting wafers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J15/00Gripping heads and other end effectors
    • B25J15/0023Gripper surfaces directly activated by a fluid
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J9/00Programme-controlled manipulators
    • B25J9/16Programme controls
    • B25J9/20Programme controls fluidic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/6715Apparatus for applying a liquid, a resin, an ink or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Robotics (AREA)
  • Mechanical Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

The present invention relates to a positioning method, which may position a sheet body (CP) at a predetermined position using surface tension of liquid, and includes the following steps: a supporting step for supporting the sheet body (CP) having a hydrophilic portion with hydrophilicity disposed on a supporting surface (12A); a liquid supply step for supplying liquid to the hydrophilic portion (12F); and, a liquid recycling step for recycling liquid from the hydrophilic portion (12F).

Description

定位方法及定位裝置Positioning method and positioning device

本發明係關於定位方法及定位裝置。The invention relates to a positioning method and a positioning device.

利用液體的表面張力將複數個片狀體定位於既定位置之定位方法是已知的(例如,參照文獻1:日本特開2010-245452號公報)。 文獻1所記載的定位方法,係在形成於支承基板31(支承構件)的上表面(支承面)之親水膜31a(親水部)上塗布水(液體),在親水部配置晶片20(片狀體),利用親水部上之液體的表面張力將片狀體定位於既定位置之後,到達片狀體被支承面支承的程度必須等到親水部的液體蒸發,因此有單位時間的處理能力降低的問題。A positioning method for positioning a plurality of sheet-like bodies at predetermined positions using the surface tension of the liquid is known (for example, refer to Document 1: Japanese Patent Application Laid-Open No. 2010-245452). The positioning method described in Document 1 is to coat water (liquid) on the hydrophilic film 31a (hydrophilic part) formed on the upper surface (support surface) of the support substrate 31 (support member), and arrange the wafer 20 (sheet-shaped) on the hydrophilic part. After the sheet is positioned at a predetermined position by the surface tension of the liquid on the hydrophilic part, it must wait until the liquid in the hydrophilic part evaporates to the extent that the sheet is supported by the supporting surface, so the processing capacity per unit time is reduced. .

[發明所欲解決之問題] 本發明之目的,係為了提供可防止單位時間的處理能力降低之定位方法及定位裝置。 [解決問題之技術手段] 本發明係採用了請求項所載的構成。 依據本發明,因為從支承面之親水部將液體回收,到達片狀體被支承面支承的程度不須等到親水部的液體蒸發,可防止單位時間之處理能力降低。 此外,如果利用在具有支承面之支承構件的內部所設置之流路來對親水部供給液體,可對親水部確實地供給液體。 此外,如果將從親水部回收後的液體朝向親水部再度供給,可抑制液體的消耗量。[The problem to be solved by the invention] The purpose of the present invention is to provide a positioning method and a positioning device that can prevent the processing capacity per unit time from being reduced. [Technical means to solve the problem] The present invention adopts the composition contained in the claim. According to the present invention, since the liquid is recovered from the hydrophilic part of the supporting surface, it is not necessary to wait until the liquid in the hydrophilic part evaporates to the extent that the sheet-like body is supported by the supporting surface, and the reduction in processing capacity per unit time can be prevented. In addition, if the flow path provided inside the support member having the support surface is used to supply the liquid to the hydrophilic portion, the liquid can be reliably supplied to the hydrophilic portion. In addition, if the liquid recovered from the hydrophilic part is supplied to the hydrophilic part again, the consumption of the liquid can be suppressed.

以下,根據圖1A~圖1E來說明本發明的一實施形態。 又本實施形態的X軸、Y軸、Z軸,分別存在正交的關係,X軸及Y軸是既定平面內的軸,Z軸是與前述既定平面正交的軸。再者,在本實施形態,以從與Y軸平行之圖1A~圖1E的手邊方向觀察的情況為基準來表示方向時,「上」是Z軸的箭頭方向,「下」則是其相反方向,「左」是X軸的箭頭方向,「右」則是其相反方向,「前」是與Y軸平行之圖1A~圖1E中的手邊方向,「後」則是其相反方向。 本發明的定位裝置EA,係利用水、醇類溶液等的液體LQ之表面張力將作為片狀體之半導體晶片(以下也簡稱為「晶片」)CP定位於既定位置之裝置,其係具備支承手段10、液體供給手段20及液體回收手段30,支承手段10,係在支承面12A之具有親水性的親水部12F支承晶片CP;液體供給手段20係對親水部12F供給液體LQ;液體回收手段30係從親水部12F將液體LQ回收。定位裝置EA配置在分離手段40和剝離手段50的附近,分離手段40係對貼合有複數個晶片CP之接著薄片AS賦予張力而使該等晶片CP彼此的間隔擴大;剝離手段50是從晶片CP將接著薄片AS剝離。 支承手段10係具備:作為驅動機器之直動馬達11、及作為支承構件之載台12,載台12是被直動馬達11的輸出軸11A支承,且具有可藉由減壓泵、真空抽氣器等的減壓手段23進行吸附保持之支承面12A。在本實施形態的情況,減壓手段23構成為,是由支承手段10和液體回收手段30共有。 載台12係具備:設置於上表面之凹部12B、設置於載台12的內部且與凹部12B連通之流路12C、以及配置於凹部12B內且其上表面成為支承面12A之多孔質樹脂等的多孔質構件12D。 在支承面12A,如圖1A中之AA圖所示般,具有疏水性的疏水部12E是形成為格子狀,而藉由該疏水部12E區劃親水部12F。 在本實施形態,疏水部12E構成為,在呈格子狀形成於支承面12A之溝槽的內面塗布接著劑、樹脂等的撥水材料12G;親水部12F構成為,藉由進行粗面加工、噴砂加工等的粗面形成手段,實施成為不光滑的粗糙面之粗面處理。 液體供給手段20係具備:收容液體LQ之儲槽21、加壓泵或渦輪機等的加壓手段22、減壓手段23、將對於儲槽21之加壓手段22及減壓手段23的連通狀態進行切換之切換閥24、以及透過配管25A連接於流路12C且將流路12C對於儲槽21的連通位置在儲槽21的上部及底部進行切換之切換閥25。液體供給手段20構成為,利用在具有支承面12A之載台12的內部所設置之流路12C,來對親水部12F供給液體LQ。儲槽21是透過加壓側配管21A及減壓側配管21B而與切換閥25連通。 液體回收手段30係採用與液體供給手段20共用的構成,其構成為,利用在具有支承面12A之載台12的內部所設置之流路12C,從親水部12F將液體LQ回收。 分離手段40係具備:作為驅動機器之複數個直動馬達41、及作為驅動機器之夾頭筒(Chuck cylinder)42。夾頭筒42,是被各直動馬達41的輸出軸41A支承,且是具有一對的把持爪42A之保持手段。 剝離手段50係具備:作為驅動機器之線性馬達51、及作為驅動機器之夾頭筒52。夾頭筒52是被線性馬達51的滑動件51A支承,且是具有一對的把持爪52A之保持手段。 針對以上的定位裝置EA的動作做說明。又藉由定位裝置EA所實施之以下的工序,係在具備晶片CP的半導體裝置之製造方法所實施的工序。 首先,對於在圖1A所示的初期位置配置了各構件之定位裝置EA,若該定位裝置EA的使用者(以下簡稱為「使用者」)、或多關節機器人、帶式輸送機等之未圖示的搬送手段將貼合於接著薄片AS之複數個晶片CP搬送到載台12上方的既定位置,分離手段40會驅動直動馬達41及夾頭筒42,如圖1A中的二點鏈線所示般,利用一對的把持爪42A將接著薄片AS把持住。接下來,分離手段40驅動直動馬達41,如圖1B所示般,對接著薄片AS賦予張力而將複數個晶片CP彼此的間隔擴大(分離工序)。這時,各晶片CP是以分別與支承面12A之各親水部12F對置的方式使彼此的間隔擴大。 然後,支承手段10驅動直動馬達11,如圖1B所示般,讓載台12上升而使支承面12A抵接於晶片CP之後,驅動減壓手段23,開始進行利用支承面12A之晶片CP的吸附保持(支承工序)。接下來,分離手段40驅動夾頭筒42,將利用把持爪42A之接著薄片AS的把持予以解除之後,支承手段10驅動直動馬達11,直到接著薄片AS到達夾頭筒52左方之既定高度位置為止讓載台12下降。 接下來,剝離手段50驅動線性馬達51及夾頭筒52,利用一對的把持爪52A將接著薄片AS的右端部把持住。接下來,支承手段10驅動直動馬達11,讓載台12下降而往初期位置復位,在此同時,剝離手段50驅動線性馬達51,如圖1C所示般,讓夾頭筒52往左方移動而從晶片CP將接著薄片AS剝離(剝離工序)。 若從所有的晶片CP都將接著薄片AS剝離,剝離手段50將線性馬達51的驅動停止之後,驅動夾頭筒52,將利用把持爪52A之接著薄片AS的把持予以解除,讓剝離後的接著薄片AS朝向位於其下方之回收箱、回收袋等之未圖示的回收手段內落下。然後,若支承手段10將減壓手段23的驅動停止,而將利用支承面12A之晶片CP的吸附保持予以解除,液體供給手段20驅動切換閥24、25,如圖1D所示般,透過加壓側配管21A讓凹部12B與加壓手段22連通之後,驅動該加壓手段22,讓儲槽21內的壓力上升。藉此,通過加壓側配管21A、切換閥25、配管25A、流路12C及多孔質構件12D而對支承面12A之親水部12F供給液體LQ(液體供給工序)。若液體LQ被供給到親水部12F,該液體LQ在親水部12F內隆起,如圖1D所示般將晶片CP往上推。若晶片CP被液體LQ往上推,該晶片CP如圖1D中的二點鏈線所示般,利用液體LQ的表面張力而定位在既定位置。 接下來,若液體供給手段20將加壓手段22的驅動停止,液體回收手段30驅動切換閥24、25,如圖1E所示般,透過減壓側配管21B讓凹部12B和減壓手段23連通之後,驅動該減壓手段23,讓儲槽21內的壓力下降。藉此,通過多孔質構件12D、流路12C、配管25A、切換閥25及減壓側配管21B將位於支承面12A的親水部12F上之液體LQ回收到儲槽21內(液體回收工序)。若位於親水部12F上的液體LQ被回收,晶片CP會與支承面12A抵接,而開始進行利用該支承面12A之晶片CP的吸附保持。這時,各晶片CP是在既定位置以既定角度被定位,而以定位在既定位置的狀態被支承面12A支承。又在液體回收工序從親水部12F回收後的液體LQ,是在下一次的液體供給工序朝向親水部12F再度供給。 然後,支承手段10將減壓手段23的驅動停止,而將利用支承面12A之晶片CP的吸附保持予以解除之後,未圖示的搬送手段從支承面12A將晶片CP進行搬送,而積層在引線框架、基板等(積層工序)。接下來,若所有的晶片CP都從支承面12A進行搬送,各手段驅動各自的驅動機器,讓各構件往初期位置復位,之後反覆進行與上述同樣的工序。 依據以上般的實施形態,因為從在支承面12A的親水部12F將液體LQ回收,到達晶片CP被支承面12A支承的程度不須等到親水部12F的液體LQ蒸發,可防止單位時間的處理能力降低。 如以上般,用於實施本發明之最佳構成、方法等雖揭示於前述記載,但本發明並不限定於此。亦即,本發明,雖主要是針對特定的實施形態做圖示及說明,但在不脫離本發明的技術思想及目的之範圍內,對於以上所述的實施形態,在形狀、材質、數量及其他詳細的構造方面,所屬技術領域具有通常知識者可做各種變形。此外,上述揭示之將形狀、材質等予以限定之記載,僅是為了容易理解本發明之例示記載,並非用來限定本發明,因此將該等形狀、材質等的限定之一部分或全部的限定解除後之構件名稱也包含於本發明。 例如,支承手段10,亦可藉由獨立於液體回收手段30之外的減壓手段而利用支承面12A將晶片CP進行吸附保持,亦可在液體回收工序之後不利用支承面12A將晶片CP進行吸附保持。 疏水部12E亦可構成為,將具有疏水性的薄片、薄膜、膠帶等貼合於支承面12A,或對支承面12A實施可發揮疏水性之表面處理、塗布。 親水部12F亦可構成為,將具有親水性的薄片、薄膜、膠帶等貼合於支承面12A,或對支承面12A實施可發揮親水性之表面處理、塗布。 液體供給手段20亦可構成為,利用噴嘴、軟管等從載台12的外側朝向支承面12A上供給液體LQ,或將在液體回收工序從親水部12F回收後的液體LQ不朝向親水部12F再度供給。 液體回收手段30亦可設置成與液體供給手段20為不同個體,在此情況,可將載台12的流路12C與液體供給手段20共用而從該流路12C將液體LQ回收,亦可在載台12設置有別於流路12C之回收用流路,而從該回收用流路將液體LQ回收。 分離手段40亦可對接著薄片AS,例如賦予上下方向的張力,或賦予右方、左方、前方及後方共4方向、右方及左方共2方向、左前方、左後方及右方共3方向、或是包含前後左右方向的成分共5方向以上的張力,而將晶片CP彼此的間隔擴大;當採用透過接著薄片AS而與晶片CP一體化之環狀框架等的框架構件的情況,可藉由支承框架構件並對接著薄片AS賦予張力,而將晶片CP彼此的間隔擴大;亦可對貼合有藉由脆弱層、凹槽、缺口而成為可單片化成複數個晶片CP的狀態的半導體晶圓(以下也簡稱為「晶圓」)之接著薄片AS賦予張力,藉此將晶圓分割成複數個晶片CP而將晶片CP彼此的間隔擴大,該脆弱層是利用雷射照射裝置、化學藥品賦予裝置等的脆弱化手段而物理性或化學性地形成,該凹槽、缺口是利用切刀等的切斷手段所形成的。 分離手段40,在本發明的定位裝置EA是具備或不具備皆可,當不具備分離手段40的情況,可利用其他裝置將晶片CP彼此的間隔擴大。 剝離手段50,在本發明的定位裝置EA是具備或不具備皆可,當不具備剝離手段50的情況,可利用其他裝置將接著薄片AS剝離,亦可藉由切刀等的切斷手段、基於噴嘴等的氣體噴吹手段之氣體噴吹來將接著薄片AS沿著複數個晶片CP之間隙切斷,而讓切斷後的接著薄片AS就那樣貼合於晶片CP。 定位裝置EA可具備:利用按壓輥等的按壓構件在晶片CP或晶圓上貼合接著薄片AS之貼合手段,亦可具備:將晶圓切斷成複數個晶片CP之雷射照射裝置、切刀等的切斷手段,亦可具備:透過接著薄片AS使晶片CP或晶圓與框架構件成為一體化之一體化手段,亦可構成為,將未貼合於接著薄片AS之複數個晶片CP藉由未圖示的搬送手段進行搬送,而載置在支承面12A之親水部12F上。 定位裝置EA所使用的液體LQ,只要是具有一定的表面張力即可,沒有特別的限定,例如可為包含乙醇、丙醇、甘油等之醇類溶液。 在前述實施形態雖例示出,作為片狀體是將複數個晶片CP進行定位,但作為片狀體亦可為1個晶片CP。 支承工序及液體供給工序哪個先實施皆可,可在實施支承工序之後再實施液體供給工序,亦可在實施液體供給工序之後再實施支承工序。當實施液體供給工序之後再實施支承工序的情況,可一邊利用其他裝置維持晶片CP彼此的間隔一邊將晶片CP從接著薄片AS剝離,在實施了液體供給工序之後將剝離後的晶片CP轉印到支承面12A而被支承。 積層工序及回收工序是實施或不實施皆可。 框架構件,除了環狀框架以外,亦可為非環狀(外周不相連)、圓形、橢圓形、多角形、或其他形狀。 本發明的手段及工序,只要能完成針對該等手段及工序所說明之動作、功能或工序即可,並沒有任何的限定,當然不限定於在前述實施形態所示之單一實施形態的構造物及工序。例如,支承工序只要是利用設置於支承面之具有親水性的複數個親水部來支承片狀體者即可,參照申請時的技術常識,只要是在其技術範圍內者即可,並沒有任何的限定(其他手段及工序也是同樣的)。 接著薄片AS及片狀體的材質、種類、形狀等沒有特別的限定。例如,接著薄片AS及片狀體可為圓形、橢圓形、多角形、或其他形狀,接著薄片AS可為感壓接著性、感熱接著性等的接著形態。又這樣的接著薄片AS,例如可為:只有接著劑層之單層者,在基材和接著劑層之間具有中間層者、在基材之上表面具有被覆層等之3層以上者,亦可為能夠將基材從接著劑層剝離之所謂雙面接著薄片者。雙面接著薄片,可為具有單層或複層之中間層者,亦可為不具中間層之單層或複層者。又作為片狀體,例如可為:食品、樹脂容器、矽半導體晶片或化合物半導體晶片等的半導體晶片、電路基板、光碟等的資訊記錄基板、玻璃板、鋼板、陶器、木板或樹脂等的單體物,亦可為由其等中之2個以上所形成之複合物,也能以任意形態的構件、物品等作為對象。又接著薄片AS改成功能性、用途性的稱謂時,例如可為資訊記載用標籤、裝飾用標籤、保護薄片、切割膠帶、黏晶薄膜(die attach film)、黏晶膠帶(die bonding tape)、記錄層形成樹脂薄片等之任意的薄片、薄膜、膠帶等。 前述實施形態之驅動機器,可採用:轉動馬達、直動馬達、線性馬達、單軸機器人、具備有2軸或3軸以上的關節之多關節機器人等的電動機器,氣缸、油壓缸、無桿缸及旋轉缸等的致動器等,還能採用將其等直接或間接組合而成者。 在前述實施形態中,當採用按壓輥、按壓頭等的按壓手段或按壓構件作為對被按壓物進行按壓者的情況,可取代上述所例示者或與其併用,而採用輥子、圓棒、板片(blade)材、橡膠、樹脂、海綿等的構件,亦可採用藉由大氣、瓦斯等氣體之噴吹來進行按壓的構成,進行按壓者可由橡膠、樹脂等之可變形的構件所構成,亦可由不變形的構件所構成。當採用支承(保持)手段或支承(保持)構件等之用於將被支承構件(被保持構件)進行支承(保持)者的情況,可採用利用機械夾頭或夾頭筒等的把持手段、庫侖力、接著劑(接著薄片、接著膠帶)、黏著劑(黏著薄片、黏著膠帶)、磁力、柏努利吸附、吸引吸附、驅動機器等來將被支承構件進行支承(保持)的構成。當採用切斷手段或切斷構件等之用於將被切斷構件切斷、或在被切斷構件形成切口、切斷線者的情況,可取代上述所例示者或與其併用,而採用利用切刀、雷射切割機、離子束、火力、熱、水壓、電熱線、氣體或液體等的噴吹等進行切斷者,亦可讓與適宜的驅動機器組合而進行切斷者移動來進行切斷。Hereinafter, an embodiment of the present invention will be described based on FIGS. 1A to 1E. Furthermore, the X-axis, Y-axis, and Z-axis in the present embodiment are in an orthogonal relationship, respectively, the X-axis and Y-axis are axes in a predetermined plane, and the Z-axis is an axis orthogonal to the aforementioned predetermined plane. Furthermore, in this embodiment, when viewing the direction from the hand side of FIGS. 1A to 1E parallel to the Y axis as a reference, "up" is the direction of the arrow on the Z axis, and "down" is the opposite. Direction, "Left" is the arrow direction of the X axis, "Right" is the opposite direction, "Front" is the hand direction in Figures 1A~1E parallel to the Y axis, and "Back" is the opposite direction. The positioning device EA of the present invention is a device that uses the surface tension of liquid LQ such as water, alcohol solution, etc. to position a semiconductor chip (hereinafter also referred to as "chip") CP in a predetermined position as a sheet, and it is equipped with a support Means 10, liquid supply means 20, and liquid recovery means 30. Support means 10 support the wafer CP on the hydrophilic part 12F with hydrophilicity of the support surface 12A; liquid supply means 20 supply liquid LQ to the hydrophilic part 12F; liquid recovery means The system 30 recovers the liquid LQ from the hydrophilic part 12F. The positioning device EA is arranged in the vicinity of the separating means 40 and the peeling means 50. The separating means 40 applies tension to the adhesive sheet AS to which a plurality of wafers CP are attached to expand the distance between the wafers CP; the peeling means 50 is from the wafer The CP peels off the subsequent sheet AS. The supporting means 10 is equipped with: a direct-acting motor 11 as a driving device and a stage 12 as a supporting member. The support surface 12A which is adsorbed and held by the pressure reducing means 23 such as an aerator. In the case of this embodiment, the decompression means 23 is configured to be shared by the support means 10 and the liquid recovery means 30. The stage 12 is provided with a recessed portion 12B provided on the upper surface, a flow path 12C provided in the interior of the stage 12 and communicating with the recessed portion 12B, a porous resin arranged in the recessed portion 12B and the upper surface of which serves as a support surface 12A, etc. The porous member 12D. On the supporting surface 12A, as shown in the AA diagram in FIG. 1A, the hydrophobic portion 12E having hydrophobicity is formed in a lattice shape, and the hydrophilic portion 12F is divided by the hydrophobic portion 12E. In this embodiment, the water-repellent portion 12E is configured by applying a water-repellent material 12G such as an adhesive or resin to the inner surface of a groove formed in a grid on the support surface 12A; the hydrophilic portion 12F is configured by roughing , Sandblasting and other rough surface forming means, implement rough surface treatment to become a non-smooth rough surface. The liquid supply means 20 is provided with: a storage tank 21 containing the liquid LQ, a pressurizing means 22 such as a pressurizing pump or a turbine, a pressure reducing means 23, and a communication state of the pressurizing means 22 and a pressure reducing means 23 to the storage tank 21 The switching valve 24 for switching and the switching valve 25 are connected to the flow path 12C through the pipe 25A and switch the communication position of the flow path 12C with the tank 21 at the upper and bottom of the tank 21. The liquid supply means 20 is configured to supply the liquid LQ to the hydrophilic portion 12F using a flow path 12C provided inside the stage 12 having the support surface 12A. The storage tank 21 communicates with the switching valve 25 through the pressure-side pipe 21A and the pressure-reduction side pipe 21B. The liquid recovery means 30 adopts a structure shared with the liquid supply means 20, and is configured to recover the liquid LQ from the hydrophilic part 12F using a flow path 12C provided inside the stage 12 having the support surface 12A. The separating means 40 is provided with a plurality of direct-acting motors 41 as a driving machine, and a chuck cylinder 42 as a driving machine. The chuck barrel 42 is supported by the output shaft 41A of each linear motion motor 41, and is a holding means having a pair of gripping claws 42A. The peeling means 50 is provided with a linear motor 51 as a driving machine, and a chuck barrel 52 as a driving machine. The chuck cylinder 52 is supported by the slider 51A of the linear motor 51, and is a holding means having a pair of gripping claws 52A. The operation of the above positioning device EA will be described. In addition, the following steps performed by the positioning device EA are steps performed in the method of manufacturing a semiconductor device including the chip CP. First of all, for the positioning device EA in which the components are arranged in the initial position shown in FIG. The conveying means shown in the figure conveys the plurality of wafers CP attached to the next sheet AS to a predetermined position above the stage 12. The separating means 40 drives the linear motor 41 and the chuck barrel 42, as shown in the two-point chain in Fig. 1A As shown in the line, the adhesive sheet AS is held by a pair of holding claws 42A. Next, the separating means 40 drives the linear motion motor 41, and as shown in FIG. 1B, tension is applied to the adhesive sheet AS to expand the interval between the plurality of wafers CP (separation step). At this time, the gaps between the wafers CP are enlarged so as to face the hydrophilic portions 12F of the support surface 12A. Then, the support means 10 drives the linear motor 11, as shown in FIG. 1B, the stage 12 is raised to bring the support surface 12A into contact with the wafer CP, and then the pressure reducing means 23 is driven to start the wafer CP using the support surface 12A. Adsorption and retention (supporting process). Next, the separating means 40 drives the chuck tube 42 to release the grip of the sheet AS by the gripping claws 42A, and the supporting means 10 drives the linear motor 11 until the sheet AS reaches a predetermined height to the left of the chuck tube 52 The stage 12 is lowered up to the position. Next, the peeling means 50 drives the linear motor 51 and the chuck cylinder 52, and the right end of the adhesive sheet AS is gripped by a pair of gripping claws 52A. Next, the supporting means 10 drives the linear motor 11 to lower the stage 12 to return to the initial position. At the same time, the peeling means 50 drives the linear motor 51, as shown in FIG. 1C, to move the chuck barrel 52 to the left. It moves and peels the adhesive sheet AS from the wafer CP (peeling process). If the adhesive sheet AS is peeled from all the wafers CP, after the peeling means 50 stops the drive of the linear motor 51, the chuck cylinder 52 is driven to release the holding of the adhesive sheet AS by the gripping claws 52A, and the peeled adhesive The sheet AS falls toward a collection box, a collection bag, and other collection means (not shown) located below it. Then, if the supporting means 10 stops the driving of the decompression means 23 and the adsorption and holding of the wafer CP on the supporting surface 12A is released, the liquid supply means 20 drives the switching valves 24, 25, as shown in FIG. 1D, by adding After the pressure-side piping 21A connects the recess 12B with the pressurizing means 22, the pressurizing means 22 is driven to increase the pressure in the storage tank 21. Thereby, the liquid LQ is supplied to the hydrophilic portion 12F of the support surface 12A through the pressure-side pipe 21A, the switching valve 25, the pipe 25A, the flow path 12C, and the porous member 12D (liquid supply step). When the liquid LQ is supplied to the hydrophilic part 12F, the liquid LQ swells in the hydrophilic part 12F, pushing up the wafer CP as shown in FIG. 1D. If the wafer CP is pushed up by the liquid LQ, the wafer CP is positioned at a predetermined position using the surface tension of the liquid LQ as shown by the two-dot chain line in FIG. 1D. Next, when the liquid supply means 20 stops the driving of the pressurizing means 22, the liquid recovery means 30 drives the switching valves 24, 25, as shown in FIG. After that, the pressure reducing means 23 is driven to reduce the pressure in the storage tank 21. Thereby, the liquid LQ on the hydrophilic part 12F of the support surface 12A is recovered into the storage tank 21 through the porous member 12D, the flow path 12C, the pipe 25A, the switching valve 25, and the pressure-reducing pipe 21B (liquid recovery step). If the liquid LQ located on the hydrophilic portion 12F is recovered, the wafer CP abuts on the support surface 12A, and the adsorption and holding of the wafer CP by the support surface 12A starts. At this time, each wafer CP is positioned at a predetermined position at a predetermined angle, and is supported by the support surface 12A in a state of being positioned at the predetermined position. The liquid LQ recovered from the hydrophilic portion 12F in the liquid recovery step is again supplied toward the hydrophilic portion 12F in the next liquid supply step. Then, the supporting means 10 stops the driving of the decompression means 23 and releases the suction and holding of the wafer CP by the supporting surface 12A. Then, a transporting means not shown transports the wafer CP from the supporting surface 12A, and the wafer CP is stacked on the lead Frame, substrate, etc. (layering process). Next, if all the wafers CP are transported from the support surface 12A, each means drives the respective driving equipment to return each member to the initial position, and then repeats the same process as described above. According to the above-mentioned embodiment, because the liquid LQ is recovered from the hydrophilic part 12F on the supporting surface 12A, it is not necessary to wait until the liquid LQ of the hydrophilic part 12F evaporates to the extent that the wafer CP is supported by the supporting surface 12A, and the processing capacity per unit time can be prevented. reduce. As described above, the best configuration, method, etc. for carrying out the present invention are disclosed in the foregoing description, but the present invention is not limited thereto. That is, although the present invention is mainly illustrated and described for specific embodiments, it does not deviate from the technical idea and purpose of the present invention. For the above-mentioned embodiments, the shape, material, quantity, and For other detailed structures, various modifications can be made by those with ordinary knowledge in the relevant technical field. In addition, the above-disclosed descriptions that limit shapes, materials, etc. are merely illustrative descriptions for easy understanding of the present invention, and are not intended to limit the present invention. Therefore, some or all of the limitations on shapes, materials, etc. are released. The following component names are also included in the present invention. For example, the supporting means 10 can also use the supporting surface 12A to adsorb and hold the wafer CP by a pressure reducing means independent of the liquid recovery means 30, or it can also be used to hold the wafer CP without using the supporting surface 12A after the liquid recovery process. Adsorption keeps. The water-repellent portion 12E may be configured by attaching a hydrophobic sheet, film, tape, or the like to the support surface 12A, or subjecting the support surface 12A to surface treatment or coating that can exhibit hydrophobicity. The hydrophilic portion 12F may be configured by attaching a hydrophilic sheet, film, tape, or the like to the support surface 12A, or subjecting the support surface 12A to surface treatment or coating that can exhibit hydrophilicity. The liquid supply means 20 may also be configured to supply the liquid LQ from the outside of the stage 12 toward the support surface 12A using a nozzle, hose, etc., or prevent the liquid LQ recovered from the hydrophilic part 12F in the liquid recovery process from facing the hydrophilic part 12F Supply again. The liquid recovery means 30 may be provided as a separate unit from the liquid supply means 20. In this case, the flow path 12C of the stage 12 and the liquid supply means 20 may be shared and the liquid LQ may be recovered from the flow path 12C. The stage 12 is provided with a recovery channel different from the channel 12C, and the liquid LQ is recovered from the recovery channel. The separating means 40 may also apply tension in the up and down direction to the adhesive sheet AS, or give a total of 4 directions to the right, left, front and rear, 2 directions to the right and left, and a total of left front, left rear and right. Tensions in 3 directions or 5 directions or more including components in the front, rear, left, and right directions expand the gap between the wafers CP; when a frame member such as a ring frame integrated with the wafer CP through the adhesive sheet AS is used, By supporting the frame member and applying tension to the adhesive sheet AS, the gap between the chips CP can be enlarged; it can also be bonded with a fragile layer, grooves, and notches to form a state that can be singulated into a plurality of chips CP Tension is applied to the adhesive sheet AS of the semiconductor wafer (hereinafter also referred to as "wafer") to divide the wafer into a plurality of chips CP to expand the gap between the chips CP. The fragile layer is used by a laser irradiation device , The chemical agent application device and other fragile means are formed physically or chemically, and the grooves and notches are formed by cutting means such as a cutter. The separating means 40 may be provided or not provided in the positioning device EA of the present invention. When the separating means 40 is not provided, another device may be used to increase the distance between the wafers CP. The peeling means 50 may be provided or not provided in the positioning device EA of the present invention. When the peeling means 50 is not provided, other devices can be used to peel off the adhesive sheet AS, or cutting means such as a cutter, etc. The adhesive sheet AS is cut along the gap between the plurality of wafers CP by gas blowing by a gas blowing means such as a nozzle, and the cut adhesive sheet AS is bonded to the wafer CP as it is. The positioning device EA may include: a bonding means for bonding the adhesive sheet AS on the wafer CP or wafer using a pressing member such as a pressing roller, and may also include: a laser irradiation device for cutting the wafer into a plurality of chips CP, Cutting means such as cutters may also be provided with an integrated means for integrating the chip CP or the wafer with the frame member through the adhesive sheet AS, or it may be configured to combine a plurality of chips that are not bonded to the adhesive sheet AS The CP is conveyed by a conveying means not shown, and is placed on the hydrophilic part 12F of the support surface 12A. The liquid LQ used in the positioning device EA is not particularly limited as long as it has a certain surface tension. For example, it may be an alcohol solution containing ethanol, propanol, glycerin, and the like. In the foregoing embodiment, although it was shown as an example that a plurality of wafers CP are positioned as the sheet-like body, one wafer CP may be used as the sheet-like body. Either the support step or the liquid supply step may be performed first, and the liquid supply step may be performed after the support step is performed, or the support step may be performed after the liquid supply step is performed. When the support step is performed after the liquid supply step is performed, the wafer CP can be peeled from the adhesive sheet AS while maintaining the gap between the wafers CP with another device. After the liquid supply step is performed, the peeled wafer CP can be transferred to The supporting surface 12A is supported. The lamination process and the recycling process may be implemented or not. The frame member, in addition to the ring-shaped frame, may also be non-circular (not connected to the outer periphery), circular, elliptical, polygonal, or other shapes. The means and steps of the present invention are not limited as long as they can complete the actions, functions, or steps described for the means and steps, and are of course not limited to the structure of the single embodiment shown in the foregoing embodiment. And process. For example, the supporting step is only required to support the sheet-like body by using a plurality of hydrophilic portions provided on the supporting surface with hydrophilicity. Refer to the technical common sense at the time of application. (The other means and procedures are the same). Next, the material, type, shape, etc. of the sheet AS and the sheet-like body are not particularly limited. For example, the adhesive sheet AS and the sheet-shaped body may be circular, elliptical, polygonal, or other shapes, and the adhesive sheet AS may be of pressure-sensitive adhesive, heat-sensitive adhesive, or the like. Such an adhesive sheet AS may be, for example, a single layer having only an adhesive layer, an intermediate layer between the substrate and the adhesive layer, and three or more layers including a coating layer on the upper surface of the substrate. It may also be a so-called double-sided adhesive sheet capable of peeling the base material from the adhesive layer. The double-sided adhesive sheet may have a single-layer or multiple-layer intermediate layer, or a single-layer or multiple-layer without intermediate layer. Also as a sheet-like body, for example, food, resin containers, semiconductor wafers such as silicon semiconductor wafers or compound semiconductor wafers, circuit boards, information recording substrates such as optical discs, glass plates, steel plates, ceramics, wood boards, resins, etc. The body object may also be a composite formed by two or more of them, and it may also be an object of any form of member, article, etc. When the sheet AS is changed to a functional and useful name, for example, it can be a label for information recording, a label for decoration, a protective sheet, a dicing tape, a die attach film, and a die bonding tape. , The recording layer forms any sheet, film, tape, etc. such as a resin sheet. The drive machine of the foregoing embodiment can be used: electric machines such as rotary motors, linear motors, linear motors, single-axis robots, multi-joint robots with two or more joints, air cylinders, hydraulic cylinders, and Actuators such as rod cylinders and rotary cylinders can also be directly or indirectly combined. In the foregoing embodiment, when a pressing means such as a pressing roller, a pressing head, or a pressing member is used as the person to press the object to be pressed, instead of or in combination with the above-exemplified ones, a roller, a round bar, or a plate may be used. (blade) materials, rubber, resin, sponge, etc., can also be compressed by blowing air, gas and other gases, and the press can be composed of deformable members such as rubber, resin, etc. Can be composed of non-deformable components. When supporting (holding) means or supporting (holding) members are used for supporting (holding) the supported member (holding member), a holding means such as a mechanical chuck or a chuck barrel can be used, Coulomb force, adhesive (adhesive sheet, adhesive tape), adhesive (adhesive sheet, adhesive tape), magnetic force, Bernoulli suction, suction suction, driving machine, etc. to support (hold) the supported member. When a cutting means or a cutting member is used to cut the member to be cut, or to form a cut or cut line in the member to be cut, it can be used instead of the above-exemplified or used in combination with it. Cutting knife, laser cutting machine, ion beam, firepower, heat, water pressure, electric heating wire, gas or liquid spray, etc., can also be combined with a suitable driving machine to perform cutting. Cut off.

10:支承手段 11,41:直動馬達 11A,41A:輸出軸 12:載台 12A:支承面 12B:凹部 12C:流路 12D:多孔質構件 12E:疏水部 12F:親水部 12G:撥水材料 20:液體供給手段 21:儲槽 21A:加壓側配管 21B:減壓側配管 22:加壓手段 23:減壓手段 24,25:切換閥 25A:配管 30:液體回收手段 40:分離手段 42,52:夾頭筒 42A,52A:把持爪 50:剝離手段 51:線性馬達 51A:滑動件 AS:接著薄片 CP:半導體晶片(片狀體) EA:定位裝置 LQ:液體10: Supporting means 11, 41: Direct drive motor 11A, 41A: output shaft 12: Stage 12A: Bearing surface 12B: recess 12C: Flow path 12D: Porous member 12E: hydrophobic part 12F: Hydrophilic part 12G: Water repellent material 20: Liquid supply means 21: storage tank 21A: Pressure side piping 21B: Decompression side piping 22: Pressure means 23: Decompression means 24, 25: switching valve 25A: Piping 30: Liquid recovery means 40: Separation means 42,52: chuck barrel 42A, 52A: gripping claw 50: Stripping means 51: Linear motor 51A: Sliding parts AS: then slice CP: Semiconductor wafer (sheet body) EA: Positioning device LQ: Liquid

[圖1A]係實施本發明的一實施形態之定位方法的定位裝置之說明圖。 [圖1B]係實施本發明的一實施形態之定位方法的定位裝置之說明圖。 [圖1C]係實施本發明的一實施形態之定位方法的定位裝置之說明圖。 [圖1D]係實施本發明的一實施形態之定位方法的定位裝置之說明圖。 [圖1E]係實施本發明的一實施形態之定位方法的定位裝置之說明圖。[Fig. 1A] is an explanatory diagram of a positioning device that implements a positioning method according to an embodiment of the present invention. [Fig. 1B] is an explanatory diagram of a positioning device that implements a positioning method according to an embodiment of the present invention. [Fig. 1C] is an explanatory diagram of a positioning device that implements a positioning method according to an embodiment of the present invention. [Fig. 1D] is an explanatory diagram of a positioning device that implements a positioning method according to an embodiment of the present invention. [Fig. 1E] is an explanatory diagram of a positioning device that implements a positioning method according to an embodiment of the present invention.

10:支承手段 10: Supporting means

11,41:直動馬達 11, 41: Direct drive motor

11A,41A:輸出軸 11A, 41A: output shaft

12:載台 12: Stage

12A:支承面 12A: Bearing surface

12B:凹部 12B: recess

12C:流路 12C: Flow path

12D:多孔質構件 12D: Porous member

12E:疏水部 12E: hydrophobic part

12F:親水部 12F: Hydrophilic part

12G:撥水材料 12G: Water repellent material

20:液體供給手段 20: Liquid supply means

21:儲槽 21: storage tank

21A:加壓側配管 21A: Pressure side piping

21B:減壓側配管 21B: Decompression side piping

22:加壓手段 22: Pressure means

23:減壓手段 23: Decompression means

24,25:切換閥 24, 25: switching valve

25A:配管 25A: Piping

30:液體回收手段 30: Liquid recovery means

40:分離手段 40: Separation means

42,52:夾頭筒 42,52: chuck barrel

42A,52A:把持爪 42A, 52A: gripping claw

50:剝離手段 50: Stripping means

51:線性馬達 51: Linear motor

51A:滑動件 51A: Sliding parts

AS:接著薄片 AS: then slice

CP:半導體晶片(片狀體) CP: Semiconductor wafer (sheet body)

EA:定位裝置 EA: Positioning device

LQ:液體 LQ: Liquid

Claims (4)

一種定位方法,係利用液體的表面張力將片狀體定位於既定位置之定位方法,其係實施以下工序: 利用設置於支承面之具有親水性的親水部來支承前述片狀體之支承工序, 對前述親水部供給液體之液體供給工序, 從前述親水部將前述液體回收之液體回收工序。A positioning method is a positioning method that uses the surface tension of a liquid to position a sheet in a predetermined position, which implements the following steps: The supporting step of supporting the aforementioned sheet-like body by using the hydrophilic part with hydrophilicity provided on the supporting surface, The liquid supply step of supplying liquid to the aforementioned hydrophilic part, A liquid recovery step of recovering the liquid from the hydrophilic part. 如請求項1所述之定位方法,其中, 在前述液體供給工序,係利用在具有前述支承面之支承構件的內部所設置之流路來對前述親水部供給前述液體。The positioning method according to claim 1, wherein: In the liquid supply step, the liquid is supplied to the hydrophilic portion using a flow path provided inside the support member having the support surface. 如請求項1或2所述之定位方法,其中, 在前述液體供給工序,係將在前述液體回收工序從前述親水部回收後的液體朝向前述親水部再度供給。The positioning method according to claim 1 or 2, wherein: In the liquid supply step, the liquid recovered from the hydrophilic portion in the liquid recovery step is supplied again to the hydrophilic portion. 一種定位裝置,係利用液體的表面張力將片狀體定位於既定位置之定位裝置,其係具備: 利用設置於支承面之具有親水性的親水部來支承前述片狀體之支承手段、 對前述親水部供給液體之液體供給手段、以及 從前述親水部將前述液體回收之液體回收手段。A positioning device is a positioning device that uses the surface tension of a liquid to position a sheet-shaped body at a predetermined position, and is equipped with: The support means for supporting the aforementioned sheet-shaped body by using the hydrophilic part with hydrophilicity provided on the support surface, Liquid supply means for supplying liquid to the aforementioned hydrophilic part, and Liquid recovery means for recovering the liquid from the hydrophilic part.
TW110108274A 2020-03-17 2021-03-09 Positioning method and positioning device for preventing reduction of processing capability per unit time TW202141673A (en)

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