TW202141673A - Positioning method and positioning device for preventing reduction of processing capability per unit time - Google Patents
Positioning method and positioning device for preventing reduction of processing capability per unit time Download PDFInfo
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J11/00—Manipulators not otherwise provided for
- B25J11/0095—Manipulators transporting wafers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J15/00—Gripping heads and other end effectors
- B25J15/0023—Gripper surfaces directly activated by a fluid
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J9/00—Programme-controlled manipulators
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- H—ELECTRICITY
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
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- H—ELECTRICITY
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
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Abstract
Description
本發明係關於定位方法及定位裝置。The invention relates to a positioning method and a positioning device.
利用液體的表面張力將複數個片狀體定位於既定位置之定位方法是已知的(例如,參照文獻1:日本特開2010-245452號公報)。 文獻1所記載的定位方法,係在形成於支承基板31(支承構件)的上表面(支承面)之親水膜31a(親水部)上塗布水(液體),在親水部配置晶片20(片狀體),利用親水部上之液體的表面張力將片狀體定位於既定位置之後,到達片狀體被支承面支承的程度必須等到親水部的液體蒸發,因此有單位時間的處理能力降低的問題。A positioning method for positioning a plurality of sheet-like bodies at predetermined positions using the surface tension of the liquid is known (for example, refer to Document 1: Japanese Patent Application Laid-Open No. 2010-245452). The positioning method described in Document 1 is to coat water (liquid) on the hydrophilic film 31a (hydrophilic part) formed on the upper surface (support surface) of the support substrate 31 (support member), and arrange the wafer 20 (sheet-shaped) on the hydrophilic part. After the sheet is positioned at a predetermined position by the surface tension of the liquid on the hydrophilic part, it must wait until the liquid in the hydrophilic part evaporates to the extent that the sheet is supported by the supporting surface, so the processing capacity per unit time is reduced. .
[發明所欲解決之問題] 本發明之目的,係為了提供可防止單位時間的處理能力降低之定位方法及定位裝置。 [解決問題之技術手段] 本發明係採用了請求項所載的構成。 依據本發明,因為從支承面之親水部將液體回收,到達片狀體被支承面支承的程度不須等到親水部的液體蒸發,可防止單位時間之處理能力降低。 此外,如果利用在具有支承面之支承構件的內部所設置之流路來對親水部供給液體,可對親水部確實地供給液體。 此外,如果將從親水部回收後的液體朝向親水部再度供給,可抑制液體的消耗量。[The problem to be solved by the invention] The purpose of the present invention is to provide a positioning method and a positioning device that can prevent the processing capacity per unit time from being reduced. [Technical means to solve the problem] The present invention adopts the composition contained in the claim. According to the present invention, since the liquid is recovered from the hydrophilic part of the supporting surface, it is not necessary to wait until the liquid in the hydrophilic part evaporates to the extent that the sheet-like body is supported by the supporting surface, and the reduction in processing capacity per unit time can be prevented. In addition, if the flow path provided inside the support member having the support surface is used to supply the liquid to the hydrophilic portion, the liquid can be reliably supplied to the hydrophilic portion. In addition, if the liquid recovered from the hydrophilic part is supplied to the hydrophilic part again, the consumption of the liquid can be suppressed.
以下,根據圖1A~圖1E來說明本發明的一實施形態。
又本實施形態的X軸、Y軸、Z軸,分別存在正交的關係,X軸及Y軸是既定平面內的軸,Z軸是與前述既定平面正交的軸。再者,在本實施形態,以從與Y軸平行之圖1A~圖1E的手邊方向觀察的情況為基準來表示方向時,「上」是Z軸的箭頭方向,「下」則是其相反方向,「左」是X軸的箭頭方向,「右」則是其相反方向,「前」是與Y軸平行之圖1A~圖1E中的手邊方向,「後」則是其相反方向。
本發明的定位裝置EA,係利用水、醇類溶液等的液體LQ之表面張力將作為片狀體之半導體晶片(以下也簡稱為「晶片」)CP定位於既定位置之裝置,其係具備支承手段10、液體供給手段20及液體回收手段30,支承手段10,係在支承面12A之具有親水性的親水部12F支承晶片CP;液體供給手段20係對親水部12F供給液體LQ;液體回收手段30係從親水部12F將液體LQ回收。定位裝置EA配置在分離手段40和剝離手段50的附近,分離手段40係對貼合有複數個晶片CP之接著薄片AS賦予張力而使該等晶片CP彼此的間隔擴大;剝離手段50是從晶片CP將接著薄片AS剝離。
支承手段10係具備:作為驅動機器之直動馬達11、及作為支承構件之載台12,載台12是被直動馬達11的輸出軸11A支承,且具有可藉由減壓泵、真空抽氣器等的減壓手段23進行吸附保持之支承面12A。在本實施形態的情況,減壓手段23構成為,是由支承手段10和液體回收手段30共有。
載台12係具備:設置於上表面之凹部12B、設置於載台12的內部且與凹部12B連通之流路12C、以及配置於凹部12B內且其上表面成為支承面12A之多孔質樹脂等的多孔質構件12D。
在支承面12A,如圖1A中之AA圖所示般,具有疏水性的疏水部12E是形成為格子狀,而藉由該疏水部12E區劃親水部12F。
在本實施形態,疏水部12E構成為,在呈格子狀形成於支承面12A之溝槽的內面塗布接著劑、樹脂等的撥水材料12G;親水部12F構成為,藉由進行粗面加工、噴砂加工等的粗面形成手段,實施成為不光滑的粗糙面之粗面處理。
液體供給手段20係具備:收容液體LQ之儲槽21、加壓泵或渦輪機等的加壓手段22、減壓手段23、將對於儲槽21之加壓手段22及減壓手段23的連通狀態進行切換之切換閥24、以及透過配管25A連接於流路12C且將流路12C對於儲槽21的連通位置在儲槽21的上部及底部進行切換之切換閥25。液體供給手段20構成為,利用在具有支承面12A之載台12的內部所設置之流路12C,來對親水部12F供給液體LQ。儲槽21是透過加壓側配管21A及減壓側配管21B而與切換閥25連通。
液體回收手段30係採用與液體供給手段20共用的構成,其構成為,利用在具有支承面12A之載台12的內部所設置之流路12C,從親水部12F將液體LQ回收。
分離手段40係具備:作為驅動機器之複數個直動馬達41、及作為驅動機器之夾頭筒(Chuck cylinder)42。夾頭筒42,是被各直動馬達41的輸出軸41A支承,且是具有一對的把持爪42A之保持手段。
剝離手段50係具備:作為驅動機器之線性馬達51、及作為驅動機器之夾頭筒52。夾頭筒52是被線性馬達51的滑動件51A支承,且是具有一對的把持爪52A之保持手段。
針對以上的定位裝置EA的動作做說明。又藉由定位裝置EA所實施之以下的工序,係在具備晶片CP的半導體裝置之製造方法所實施的工序。
首先,對於在圖1A所示的初期位置配置了各構件之定位裝置EA,若該定位裝置EA的使用者(以下簡稱為「使用者」)、或多關節機器人、帶式輸送機等之未圖示的搬送手段將貼合於接著薄片AS之複數個晶片CP搬送到載台12上方的既定位置,分離手段40會驅動直動馬達41及夾頭筒42,如圖1A中的二點鏈線所示般,利用一對的把持爪42A將接著薄片AS把持住。接下來,分離手段40驅動直動馬達41,如圖1B所示般,對接著薄片AS賦予張力而將複數個晶片CP彼此的間隔擴大(分離工序)。這時,各晶片CP是以分別與支承面12A之各親水部12F對置的方式使彼此的間隔擴大。
然後,支承手段10驅動直動馬達11,如圖1B所示般,讓載台12上升而使支承面12A抵接於晶片CP之後,驅動減壓手段23,開始進行利用支承面12A之晶片CP的吸附保持(支承工序)。接下來,分離手段40驅動夾頭筒42,將利用把持爪42A之接著薄片AS的把持予以解除之後,支承手段10驅動直動馬達11,直到接著薄片AS到達夾頭筒52左方之既定高度位置為止讓載台12下降。
接下來,剝離手段50驅動線性馬達51及夾頭筒52,利用一對的把持爪52A將接著薄片AS的右端部把持住。接下來,支承手段10驅動直動馬達11,讓載台12下降而往初期位置復位,在此同時,剝離手段50驅動線性馬達51,如圖1C所示般,讓夾頭筒52往左方移動而從晶片CP將接著薄片AS剝離(剝離工序)。
若從所有的晶片CP都將接著薄片AS剝離,剝離手段50將線性馬達51的驅動停止之後,驅動夾頭筒52,將利用把持爪52A之接著薄片AS的把持予以解除,讓剝離後的接著薄片AS朝向位於其下方之回收箱、回收袋等之未圖示的回收手段內落下。然後,若支承手段10將減壓手段23的驅動停止,而將利用支承面12A之晶片CP的吸附保持予以解除,液體供給手段20驅動切換閥24、25,如圖1D所示般,透過加壓側配管21A讓凹部12B與加壓手段22連通之後,驅動該加壓手段22,讓儲槽21內的壓力上升。藉此,通過加壓側配管21A、切換閥25、配管25A、流路12C及多孔質構件12D而對支承面12A之親水部12F供給液體LQ(液體供給工序)。若液體LQ被供給到親水部12F,該液體LQ在親水部12F內隆起,如圖1D所示般將晶片CP往上推。若晶片CP被液體LQ往上推,該晶片CP如圖1D中的二點鏈線所示般,利用液體LQ的表面張力而定位在既定位置。
接下來,若液體供給手段20將加壓手段22的驅動停止,液體回收手段30驅動切換閥24、25,如圖1E所示般,透過減壓側配管21B讓凹部12B和減壓手段23連通之後,驅動該減壓手段23,讓儲槽21內的壓力下降。藉此,通過多孔質構件12D、流路12C、配管25A、切換閥25及減壓側配管21B將位於支承面12A的親水部12F上之液體LQ回收到儲槽21內(液體回收工序)。若位於親水部12F上的液體LQ被回收,晶片CP會與支承面12A抵接,而開始進行利用該支承面12A之晶片CP的吸附保持。這時,各晶片CP是在既定位置以既定角度被定位,而以定位在既定位置的狀態被支承面12A支承。又在液體回收工序從親水部12F回收後的液體LQ,是在下一次的液體供給工序朝向親水部12F再度供給。
然後,支承手段10將減壓手段23的驅動停止,而將利用支承面12A之晶片CP的吸附保持予以解除之後,未圖示的搬送手段從支承面12A將晶片CP進行搬送,而積層在引線框架、基板等(積層工序)。接下來,若所有的晶片CP都從支承面12A進行搬送,各手段驅動各自的驅動機器,讓各構件往初期位置復位,之後反覆進行與上述同樣的工序。
依據以上般的實施形態,因為從在支承面12A的親水部12F將液體LQ回收,到達晶片CP被支承面12A支承的程度不須等到親水部12F的液體LQ蒸發,可防止單位時間的處理能力降低。
如以上般,用於實施本發明之最佳構成、方法等雖揭示於前述記載,但本發明並不限定於此。亦即,本發明,雖主要是針對特定的實施形態做圖示及說明,但在不脫離本發明的技術思想及目的之範圍內,對於以上所述的實施形態,在形狀、材質、數量及其他詳細的構造方面,所屬技術領域具有通常知識者可做各種變形。此外,上述揭示之將形狀、材質等予以限定之記載,僅是為了容易理解本發明之例示記載,並非用來限定本發明,因此將該等形狀、材質等的限定之一部分或全部的限定解除後之構件名稱也包含於本發明。
例如,支承手段10,亦可藉由獨立於液體回收手段30之外的減壓手段而利用支承面12A將晶片CP進行吸附保持,亦可在液體回收工序之後不利用支承面12A將晶片CP進行吸附保持。
疏水部12E亦可構成為,將具有疏水性的薄片、薄膜、膠帶等貼合於支承面12A,或對支承面12A實施可發揮疏水性之表面處理、塗布。
親水部12F亦可構成為,將具有親水性的薄片、薄膜、膠帶等貼合於支承面12A,或對支承面12A實施可發揮親水性之表面處理、塗布。
液體供給手段20亦可構成為,利用噴嘴、軟管等從載台12的外側朝向支承面12A上供給液體LQ,或將在液體回收工序從親水部12F回收後的液體LQ不朝向親水部12F再度供給。
液體回收手段30亦可設置成與液體供給手段20為不同個體,在此情況,可將載台12的流路12C與液體供給手段20共用而從該流路12C將液體LQ回收,亦可在載台12設置有別於流路12C之回收用流路,而從該回收用流路將液體LQ回收。
分離手段40亦可對接著薄片AS,例如賦予上下方向的張力,或賦予右方、左方、前方及後方共4方向、右方及左方共2方向、左前方、左後方及右方共3方向、或是包含前後左右方向的成分共5方向以上的張力,而將晶片CP彼此的間隔擴大;當採用透過接著薄片AS而與晶片CP一體化之環狀框架等的框架構件的情況,可藉由支承框架構件並對接著薄片AS賦予張力,而將晶片CP彼此的間隔擴大;亦可對貼合有藉由脆弱層、凹槽、缺口而成為可單片化成複數個晶片CP的狀態的半導體晶圓(以下也簡稱為「晶圓」)之接著薄片AS賦予張力,藉此將晶圓分割成複數個晶片CP而將晶片CP彼此的間隔擴大,該脆弱層是利用雷射照射裝置、化學藥品賦予裝置等的脆弱化手段而物理性或化學性地形成,該凹槽、缺口是利用切刀等的切斷手段所形成的。
分離手段40,在本發明的定位裝置EA是具備或不具備皆可,當不具備分離手段40的情況,可利用其他裝置將晶片CP彼此的間隔擴大。
剝離手段50,在本發明的定位裝置EA是具備或不具備皆可,當不具備剝離手段50的情況,可利用其他裝置將接著薄片AS剝離,亦可藉由切刀等的切斷手段、基於噴嘴等的氣體噴吹手段之氣體噴吹來將接著薄片AS沿著複數個晶片CP之間隙切斷,而讓切斷後的接著薄片AS就那樣貼合於晶片CP。
定位裝置EA可具備:利用按壓輥等的按壓構件在晶片CP或晶圓上貼合接著薄片AS之貼合手段,亦可具備:將晶圓切斷成複數個晶片CP之雷射照射裝置、切刀等的切斷手段,亦可具備:透過接著薄片AS使晶片CP或晶圓與框架構件成為一體化之一體化手段,亦可構成為,將未貼合於接著薄片AS之複數個晶片CP藉由未圖示的搬送手段進行搬送,而載置在支承面12A之親水部12F上。
定位裝置EA所使用的液體LQ,只要是具有一定的表面張力即可,沒有特別的限定,例如可為包含乙醇、丙醇、甘油等之醇類溶液。
在前述實施形態雖例示出,作為片狀體是將複數個晶片CP進行定位,但作為片狀體亦可為1個晶片CP。
支承工序及液體供給工序哪個先實施皆可,可在實施支承工序之後再實施液體供給工序,亦可在實施液體供給工序之後再實施支承工序。當實施液體供給工序之後再實施支承工序的情況,可一邊利用其他裝置維持晶片CP彼此的間隔一邊將晶片CP從接著薄片AS剝離,在實施了液體供給工序之後將剝離後的晶片CP轉印到支承面12A而被支承。
積層工序及回收工序是實施或不實施皆可。
框架構件,除了環狀框架以外,亦可為非環狀(外周不相連)、圓形、橢圓形、多角形、或其他形狀。
本發明的手段及工序,只要能完成針對該等手段及工序所說明之動作、功能或工序即可,並沒有任何的限定,當然不限定於在前述實施形態所示之單一實施形態的構造物及工序。例如,支承工序只要是利用設置於支承面之具有親水性的複數個親水部來支承片狀體者即可,參照申請時的技術常識,只要是在其技術範圍內者即可,並沒有任何的限定(其他手段及工序也是同樣的)。
接著薄片AS及片狀體的材質、種類、形狀等沒有特別的限定。例如,接著薄片AS及片狀體可為圓形、橢圓形、多角形、或其他形狀,接著薄片AS可為感壓接著性、感熱接著性等的接著形態。又這樣的接著薄片AS,例如可為:只有接著劑層之單層者,在基材和接著劑層之間具有中間層者、在基材之上表面具有被覆層等之3層以上者,亦可為能夠將基材從接著劑層剝離之所謂雙面接著薄片者。雙面接著薄片,可為具有單層或複層之中間層者,亦可為不具中間層之單層或複層者。又作為片狀體,例如可為:食品、樹脂容器、矽半導體晶片或化合物半導體晶片等的半導體晶片、電路基板、光碟等的資訊記錄基板、玻璃板、鋼板、陶器、木板或樹脂等的單體物,亦可為由其等中之2個以上所形成之複合物,也能以任意形態的構件、物品等作為對象。又接著薄片AS改成功能性、用途性的稱謂時,例如可為資訊記載用標籤、裝飾用標籤、保護薄片、切割膠帶、黏晶薄膜(die attach film)、黏晶膠帶(die bonding tape)、記錄層形成樹脂薄片等之任意的薄片、薄膜、膠帶等。
前述實施形態之驅動機器,可採用:轉動馬達、直動馬達、線性馬達、單軸機器人、具備有2軸或3軸以上的關節之多關節機器人等的電動機器,氣缸、油壓缸、無桿缸及旋轉缸等的致動器等,還能採用將其等直接或間接組合而成者。
在前述實施形態中,當採用按壓輥、按壓頭等的按壓手段或按壓構件作為對被按壓物進行按壓者的情況,可取代上述所例示者或與其併用,而採用輥子、圓棒、板片(blade)材、橡膠、樹脂、海綿等的構件,亦可採用藉由大氣、瓦斯等氣體之噴吹來進行按壓的構成,進行按壓者可由橡膠、樹脂等之可變形的構件所構成,亦可由不變形的構件所構成。當採用支承(保持)手段或支承(保持)構件等之用於將被支承構件(被保持構件)進行支承(保持)者的情況,可採用利用機械夾頭或夾頭筒等的把持手段、庫侖力、接著劑(接著薄片、接著膠帶)、黏著劑(黏著薄片、黏著膠帶)、磁力、柏努利吸附、吸引吸附、驅動機器等來將被支承構件進行支承(保持)的構成。當採用切斷手段或切斷構件等之用於將被切斷構件切斷、或在被切斷構件形成切口、切斷線者的情況,可取代上述所例示者或與其併用,而採用利用切刀、雷射切割機、離子束、火力、熱、水壓、電熱線、氣體或液體等的噴吹等進行切斷者,亦可讓與適宜的驅動機器組合而進行切斷者移動來進行切斷。Hereinafter, an embodiment of the present invention will be described based on FIGS. 1A to 1E.
Furthermore, the X-axis, Y-axis, and Z-axis in the present embodiment are in an orthogonal relationship, respectively, the X-axis and Y-axis are axes in a predetermined plane, and the Z-axis is an axis orthogonal to the aforementioned predetermined plane. Furthermore, in this embodiment, when viewing the direction from the hand side of FIGS. 1A to 1E parallel to the Y axis as a reference, "up" is the direction of the arrow on the Z axis, and "down" is the opposite. Direction, "Left" is the arrow direction of the X axis, "Right" is the opposite direction, "Front" is the hand direction in Figures 1A~1E parallel to the Y axis, and "Back" is the opposite direction.
The positioning device EA of the present invention is a device that uses the surface tension of liquid LQ such as water, alcohol solution, etc. to position a semiconductor chip (hereinafter also referred to as "chip") CP in a predetermined position as a sheet, and it is equipped with a
10:支承手段
11,41:直動馬達
11A,41A:輸出軸
12:載台
12A:支承面
12B:凹部
12C:流路
12D:多孔質構件
12E:疏水部
12F:親水部
12G:撥水材料
20:液體供給手段
21:儲槽
21A:加壓側配管
21B:減壓側配管
22:加壓手段
23:減壓手段
24,25:切換閥
25A:配管
30:液體回收手段
40:分離手段
42,52:夾頭筒
42A,52A:把持爪
50:剝離手段
51:線性馬達
51A:滑動件
AS:接著薄片
CP:半導體晶片(片狀體)
EA:定位裝置
LQ:液體10: Supporting means
11, 41:
[圖1A]係實施本發明的一實施形態之定位方法的定位裝置之說明圖。 [圖1B]係實施本發明的一實施形態之定位方法的定位裝置之說明圖。 [圖1C]係實施本發明的一實施形態之定位方法的定位裝置之說明圖。 [圖1D]係實施本發明的一實施形態之定位方法的定位裝置之說明圖。 [圖1E]係實施本發明的一實施形態之定位方法的定位裝置之說明圖。[Fig. 1A] is an explanatory diagram of a positioning device that implements a positioning method according to an embodiment of the present invention. [Fig. 1B] is an explanatory diagram of a positioning device that implements a positioning method according to an embodiment of the present invention. [Fig. 1C] is an explanatory diagram of a positioning device that implements a positioning method according to an embodiment of the present invention. [Fig. 1D] is an explanatory diagram of a positioning device that implements a positioning method according to an embodiment of the present invention. [Fig. 1E] is an explanatory diagram of a positioning device that implements a positioning method according to an embodiment of the present invention.
10:支承手段 10: Supporting means
11,41:直動馬達 11, 41: Direct drive motor
11A,41A:輸出軸 11A, 41A: output shaft
12:載台 12: Stage
12A:支承面 12A: Bearing surface
12B:凹部 12B: recess
12C:流路 12C: Flow path
12D:多孔質構件 12D: Porous member
12E:疏水部 12E: hydrophobic part
12F:親水部 12F: Hydrophilic part
12G:撥水材料 12G: Water repellent material
20:液體供給手段 20: Liquid supply means
21:儲槽 21: storage tank
21A:加壓側配管 21A: Pressure side piping
21B:減壓側配管 21B: Decompression side piping
22:加壓手段 22: Pressure means
23:減壓手段 23: Decompression means
24,25:切換閥 24, 25: switching valve
25A:配管 25A: Piping
30:液體回收手段 30: Liquid recovery means
40:分離手段 40: Separation means
42,52:夾頭筒 42,52: chuck barrel
42A,52A:把持爪 42A, 52A: gripping claw
50:剝離手段 50: Stripping means
51:線性馬達 51: Linear motor
51A:滑動件 51A: Sliding parts
AS:接著薄片 AS: then slice
CP:半導體晶片(片狀體) CP: Semiconductor wafer (sheet body)
EA:定位裝置 EA: Positioning device
LQ:液體 LQ: Liquid
Claims (4)
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JP2020-046319 | 2020-03-17 | ||
JP2020046319A JP7461183B2 (en) | 2020-03-17 | 2020-03-17 | Positioning method and positioning device |
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JP (1) | JP7461183B2 (en) |
KR (1) | KR20210116253A (en) |
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JP2015154031A (en) | 2014-02-19 | 2015-08-24 | 株式会社ディスコ | Chip arrangement table and chip arrangement method |
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