TW201930075A - Copper foil with insulating resin layer - Google Patents

Copper foil with insulating resin layer Download PDF

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Publication number
TW201930075A
TW201930075A TW107143553A TW107143553A TW201930075A TW 201930075 A TW201930075 A TW 201930075A TW 107143553 A TW107143553 A TW 107143553A TW 107143553 A TW107143553 A TW 107143553A TW 201930075 A TW201930075 A TW 201930075A
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Taiwan
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copper foil
resin layer
insulating resin
mass
parts
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TW107143553A
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Chinese (zh)
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TWI775996B (en
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川下和晃
加藤禎啓
杉本憲明
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日商三菱瓦斯化學股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B15/08Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/20Layered products comprising a layer of metal comprising aluminium or copper
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/18Layered products comprising a layer of synthetic resin characterised by the use of special additives
    • B32B27/20Layered products comprising a layer of synthetic resin characterised by the use of special additives using fillers, pigments, thixotroping agents
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/0366Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement reinforced, e.g. by fibres, fabrics
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/0373Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement containing additives, e.g. fillers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment
    • B32B2457/08PCBs, i.e. printed circuit boards

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Laminated Bodies (AREA)

Abstract

An object of the invention is to provide a copper foil with an insulating resin layer, which can be used favorably on thin printed circuit boards on which high-precision micro-wiring is formed, and on substrates for mounting semiconductor elements. The copper foil with an insulating resin later of the present invention includes a copper foil and an insulating resin layer laminated to the copper foil, wherein the arithmetic mean roughness (Ra) of the surface of the copper foil that contacts the insulating resin layer is in a range from 0.05 to 2 [mu]m, and the insulating resin layer is formed from a resin composition that contains (A) a thermosetting resin, (B) a spherical filler, and (C) short glass fibers with a mean fiber length of 10 to 300 [mu]m.

Description

附設絕緣性樹脂層之銅箔Copper foil with insulating resin layer

本發明關於附設絕緣性樹脂層之銅箔。詳細而言,本發明關於作為印刷配線板或半導體元件搭載用基板之堆疊材料係為有效的附設絕緣性樹脂層之銅箔。The present invention relates to a copper foil provided with an insulating resin layer. Specifically, the present invention relates to a copper foil with an insulating resin layer which is effective as a stacking material of a printed wiring board or a substrate for mounting a semiconductor element.

近年,廣泛使用於電子設備、通信設備及個人電腦等之半導體封裝體的高功能化及小型化愈益加速。隨之而來,半導體封裝體中的印刷配線板及半導體元件搭載用基板的薄型化也愈受到要求。In recent years, high-performance and miniaturization of semiconductor packages widely used in electronic equipment, communication equipment, and personal computers have been accelerated. As a result, the thickness of printed wiring boards and semiconductor element mounting substrates in semiconductor packages has been increasingly demanded.

就薄型印刷配線板及半導體元件搭載用基板之製造方法而言,例如,專利文獻1揭示:在於不銹鋼等剛性高且厚的支持基板(載板)上形成有可在之後的步驟剝離之銅層而成的疊層體上,利用圖案電鍍(pattern plating)形成電路圖案,再疊層被覆有環氧樹脂之玻璃纖維之類的絕緣層並進行加熱及加壓處理,最後將支持基板剝離、去除來製造薄型印刷配線板之方法。如此般藉由使電路圖案與絕緣材料疊層於剛性高且厚的支持基板上,最後將支持基板剝離、去除,即使利用現有的製造裝置也能製造薄型印刷配線板及半導體元件搭載用基板。With regard to a method for manufacturing a thin printed wiring board and a substrate for mounting a semiconductor element, for example, Patent Document 1 discloses that a copper layer that can be peeled off in a later step is formed on a thick and rigid support substrate (carrier plate) such as stainless steel. On the obtained laminated body, a circuit pattern is formed by pattern plating, and then an insulating layer such as glass fiber covered with epoxy resin is laminated and heated and pressurized. Finally, the supporting substrate is peeled off and removed. Method for manufacturing thin printed wiring board. In this manner, the circuit pattern and the insulating material are laminated on the support substrate having high rigidity and thickness, and the support substrate is finally peeled off and removed, so that a thin printed wiring board and a substrate for mounting a semiconductor element can be manufactured even by using an existing manufacturing apparatus.

又,就多層印刷配線板及半導體元件搭載用基板而言,為了改善電子零件之安裝密度,導體配線的微細化也有進展。就導體配線而言,通常係對於絕緣性樹脂層使用無電解鍍敷及電解鍍敷來形成導體層。專利文獻2記載有可用於形成印刷配線板之絕緣性樹脂層的樹脂組成物。
[先前技術文獻]
[專利文獻]
In addition, for multilayer printed wiring boards and substrates for mounting semiconductor elements, in order to improve the mounting density of electronic components, miniaturization of conductor wiring has also progressed. For conductor wiring, a conductive layer is usually formed by using electroless plating and electrolytic plating on an insulating resin layer. Patent Document 2 describes a resin composition that can be used to form an insulating resin layer of a printed wiring board.
[Prior technical literature]
[Patent Literature]

[專利文獻1]日本特表昭59-500341號公報
[專利文獻2]日本特開2015-67626號公報
[Patent Document 1] Japanese Patent Publication No. 59-500341
[Patent Document 2] Japanese Patent Laid-Open No. 2015-67626

[發明所欲解決之課題][Problems to be Solved by the Invention]

但是,為了薄型化而嘗試在不使用支持基板的情況下製造印刷配線板及半導體元件搭載用基板時,若使用現有的製造裝置的話,會產生印刷配線板及半導體元件搭載用基板彎折、或印刷配線板及半導體元件搭載用基板纏繞於輸送機等問題。因此,使用現有的製造裝置不易製造以薄型化為目的之印刷配線板及半導體元件搭載用基板。However, when trying to manufacture printed wiring boards and semiconductor element mounting substrates without using a supporting substrate for thinness, if a conventional manufacturing apparatus is used, the printed wiring boards and semiconductor element mounting substrates may be bent, or The printed wiring board and the substrate for mounting a semiconductor element are wound on a conveyor or the like. Therefore, it is difficult to manufacture a printed wiring board and a semiconductor element mounting substrate for the purpose of thickness reduction using the existing manufacturing apparatus.

又,專利文獻2中具體揭示的黏接薄膜,係於作為支持體之聚對苯二甲酸乙二酯(以下有時也稱為「PET」)之薄膜上形成有由樹脂組成物構成的層而成。專利文獻2係從該黏接薄膜剝離PET薄膜後,使樹脂組成物硬化來形成絕緣性樹脂層(絕緣層),並將該絕緣性樹脂層使用於印刷配線板。In addition, the adhesive film specifically disclosed in Patent Document 2 is formed of a resin composition layer on a film of polyethylene terephthalate (hereinafter sometimes referred to as "PET") as a support. Made. Patent Document 2 is a method of peeling a PET film from the adhesive film, curing the resin composition to form an insulating resin layer (insulating layer), and using the insulating resin layer for a printed wiring board.

但是,硬化後的絕緣性樹脂層之表面粗糙度低,故和使用無電解鍍敷及/或電解鍍敷而形成的導體層之黏合性低。因此,通常為了獲得黏合性,在無電解鍍敷或電解鍍敷之前會對絕緣性樹脂層實施除膠渣(desmear)處理等粗糙化處理。實施過粗糙化處理的絕緣性樹脂層之表面,其樹脂組成物中的玻璃纖維等無機物會暴露(突出),表面則會粗糙。又,由於無機物會從絕緣性樹脂層脫落,而亦有在絕緣性樹脂層形成大型凹陷孔的問題。此外,由於玻璃纖維等無機物會從孔的表面暴露,故使用雷射加工機來形成多層印刷配線板(以下有時也稱為「BVH」)時,還會有造成鍍敷物的異常析出、BVH的連接可靠性惡化的問題。不易在如此的絕緣性樹脂層之表面形成高密度的微細配線,由專利文獻2中的黏接薄膜不易製造形成有高密度的微細配線之印刷配線板及半導體元件搭載用基板。However, since the surface roughness of the hardened insulating resin layer is low, the adhesion to a conductor layer formed by using electroless plating and / or electrolytic plating is low. Therefore, in order to obtain adhesiveness, the insulating resin layer is generally subjected to a roughening treatment such as desmear treatment before the electroless plating or electrolytic plating. On the surface of the insulating resin layer that has been roughened, inorganic substances such as glass fibers in the resin composition are exposed (protruded), and the surface is roughened. In addition, there is a problem that large-scale recessed holes are formed in the insulating resin layer because inorganic substances may fall off from the insulating resin layer. In addition, since inorganic substances such as glass fibers are exposed from the surface of the hole, when a laser processing machine is used to form a multilayer printed wiring board (hereinafter sometimes referred to as "BVH"), there may be abnormal precipitation of plated matter and BVH. The problem of connection reliability deterioration. It is difficult to form high-density fine wiring on the surface of such an insulating resin layer, and it is difficult to manufacture a printed wiring board and a semiconductor element mounting substrate on which high-density fine wiring is formed from the adhesive film in Patent Document 2.

本發明係鑑於如此的課題而成,目的在提供一種附設絕緣性樹脂層之銅箔,可理想的使用於製造形成有高密度的微細配線且形成有良好的導通孔之薄型印刷配線板及半導體元件搭載用基板。
[解決課題之手段]
The present invention has been made in view of such problems, and an object thereof is to provide a copper foil with an insulating resin layer, which can be ideally used for manufacturing thin printed wiring boards and semiconductors having fine wirings with high density and good via holes. Component mounting substrate.
[Means for solving problems]

本發明人們為了解決上述課題反復深入探討後之結果發現:藉由使用在剛性高且和絕緣性樹脂層之黏合性優良的銅箔疊層有和銅箔之黏合性高且韌性高的絕緣性樹脂層而成之附設絕緣性樹脂層之銅箔,可獲得形成有高密度的微細配線且形成有良好的導通孔之薄型印刷配線板及半導體元件搭載用基板,乃至完成本發明。The inventors of the present invention have repeatedly conducted in-depth studies in order to solve the above-mentioned problems. As a result, they have found that by using a copper foil having high rigidity and excellent adhesion to an insulating resin layer, an insulating resin having high adhesion to the copper foil and high toughness is laminated The layered copper foil with an insulating resin layer can obtain a thin printed wiring board having a high density of fine wiring and a good via hole, and a substrate for mounting a semiconductor element, and has completed the present invention.

亦即,本發明係如下所述。
[1]一種附設絕緣性樹脂層之銅箔,包含:銅箔;及疊層於前述銅箔之絕緣性樹脂層,且與前述絕緣性樹脂層接觸之前述銅箔面的算術平均粗糙度(Ra)為0.05~2μm,前述絕緣性樹脂層係由含有(A)熱硬化性樹脂、(B)球狀填料及(C)平均纖維長為10~300μm之玻璃短纖維之樹脂組成物構成。
That is, the present invention is as follows.
[1] A copper foil provided with an insulating resin layer, comprising: a copper foil; and an arithmetic average roughness of the surface of the copper foil laminated on the insulating resin layer of the copper foil and in contact with the insulating resin layer ( Ra) is 0.05 to 2 μm, and the insulating resin layer is composed of a resin composition containing (A) a thermosetting resin, (B) a spherical filler, and (C) short glass fibers having an average fiber length of 10 to 300 μm.

[2]如[1]所記載之銅箔,其中,前述絕緣性樹脂層之厚度為3~50μm。
[3]如[1]或[2]所記載之銅箔,其中,前述銅箔之厚度為1~18μm。
[4]如[1]~[3]中任一項所記載之銅箔,其中,前述玻璃短纖維之纖維徑為1~15μm。
[5]如[1]~[4]中任一項所記載之銅箔,其中,前述玻璃短纖維之含量相對於前述樹脂組成物中的樹脂固體成分100質量份為5~450質量份。
[2] The copper foil according to [1], wherein the thickness of the insulating resin layer is 3 to 50 μm.
[3] The copper foil according to [1] or [2], wherein the thickness of the copper foil is 1 to 18 μm.
[4] The copper foil according to any one of [1] to [3], wherein a fiber diameter of the short glass fibers is 1 to 15 μm.
[5] The copper foil according to any one of [1] to [4], wherein the content of the short glass fibers is 5 to 450 parts by mass based on 100 parts by mass of the resin solid content in the resin composition.

[6]如[1]~[5]中任一項所記載之銅箔,其中,前述玻璃短纖維為經輾磨之纖維(milled fiber)。
[7]如[1]~[6]中任一項所記載之銅箔,其中,前述球狀填料之含量相對於前述樹脂組成物中的樹脂固體成分100質量份為50~500質量份。
[8]如[1]~[7]中任一項所記載之銅箔,其中,前述熱硬化性樹脂含有選自於由環氧樹脂、氰酸酯化合物、馬來醯亞胺化合物、酚醛樹脂、熱硬化改性聚苯醚樹脂、苯并㗁化合物、有機基改性聚矽氧化合物及具有可聚合的不飽和基之化合物構成之群組中之至少一種。
[9]如[1]~[8]中任一項所記載之銅箔,其係用作印刷配線板或半導體元件搭載用基板之堆疊材料。
[發明之效果]
[6] The copper foil according to any one of [1] to [5], wherein the short glass fibers are milled fibers.
[7] The copper foil according to any one of [1] to [6], wherein a content of the spherical filler is 50 to 500 parts by mass based on 100 parts by mass of a resin solid content in the resin composition.
[8] The copper foil according to any one of [1] to [7], wherein the thermosetting resin contains a material selected from the group consisting of epoxy resin, cyanate compound, maleimide compound, and phenolic compound. Resin, thermosetting modified polyphenylene ether resin, benzopyrene At least one of the group consisting of a compound, an organic-based modified polysiloxane, and a compound having a polymerizable unsaturated group.
[9] The copper foil according to any one of [1] to [8], which is used as a stacking material for a printed wiring board or a substrate for mounting a semiconductor element.
[Effect of the invention]

根據本發明可理想地獲得銅箔與絕緣性樹脂層之黏合強度高且在銅箔疊層有韌性高的絕緣性樹脂層而成之附設絕緣性樹脂層之銅箔。藉由使用本發明之附設絕緣性樹脂層之銅箔,可獲得形成有高密度的微細配線且形成有良好的導通孔之薄型印刷配線板及半導體元件搭載用基板。
又,在製造印刷配線板或半導體元件搭載用基板時,即使在銅箔蝕刻後施以鍍敷處理,銅箔面仍會轉印到絕緣性樹脂層,故絕緣性樹脂層與鍍敷物之間的黏合性會改善。
According to the present invention, a copper foil with an insulating resin layer, which has a high adhesion strength between the copper foil and the insulating resin layer and is laminated with a highly resilient insulating resin layer on the copper foil, can be obtained. By using the copper foil with an insulating resin layer of the present invention, it is possible to obtain a thin printed wiring board having a high density of fine wirings and a good via hole, and a substrate for mounting a semiconductor element.
In addition, when manufacturing a printed wiring board or a substrate for mounting a semiconductor element, even if copper plating is applied after the copper foil is etched, the copper foil surface is transferred to the insulating resin layer. Therefore, between the insulating resin layer and the plated material The adhesion will be improved.

以下,針對用以實施本發明之形態(以下簡稱為「本實施形態」)進行詳細的說明,但本發明並不限於下述本實施形態。本發明在不悖離其要旨之範圍內可有各種變化。本說明書中,疊層體雖然為各層互相黏接而成,但其各層也可因應需要而能相互剝離。Hereinafter, the embodiment for implementing the present invention (hereinafter simply referred to as "this embodiment") will be described in detail, but the present invention is not limited to the following embodiment. Various changes can be made in the present invention without departing from the gist thereof. In this specification, although the laminated body is formed by adhering the layers to each other, the respective layers may be peeled from each other as needed.

本實施形態中,「樹脂固體成分」或「樹脂組成物中之樹脂固體成分」除非另有特別說明,否則係指樹脂組成物中除去溶劑及填充材後之成分,「樹脂固體成分100質量份」係指樹脂組成物中除去溶劑及填充材後之成分的合計為100質量份。In this embodiment, "resin solid content" or "resin solid content in resin composition" means a component after removing a solvent and a filler in a resin composition unless otherwise specified, and "resin solid content 100 parts by mass" "" Means that the total of the components after removing the solvent and filler in the resin composition is 100 parts by mass.

[附設絕緣性樹脂層之銅箔]
本實施形態之附設絕緣性樹脂層之銅箔係在銅箔疊層有由樹脂組成物構成的絕緣性樹脂層而成者。本實施形態之銅箔和絕緣性樹脂層接觸的銅箔面之算術平均粗糙度(Ra)為0.05~2μm。本實施形態之樹脂組成物含有(A)熱硬化性樹脂、(B)球狀填料及(C)平均纖維長為10~300μm之玻璃短纖維。
[Copper foil with insulating resin layer]
The copper foil with an insulating resin layer in this embodiment is obtained by laminating an insulating resin layer made of a resin composition on a copper foil. The arithmetic mean roughness (Ra) of the copper foil surface which the copper foil and the insulating resin layer contact in this embodiment is 0.05-2 micrometers. The resin composition of this embodiment contains (A) a thermosetting resin, (B) a spherical filler, and (C) short glass fibers having an average fiber length of 10 to 300 μm.

本實施形態係在剛性高且和絕緣性樹脂層之黏合性優良的銅箔疊層和銅箔之黏合性高且韌性高的絕緣性樹脂層,故即使使用本實施形態之附設絕緣性樹脂層之銅箔來製造印刷配線板,在其製造步驟中,薄的絕緣性樹脂層仍不會被破壞,且銅箔與絕緣性樹脂層也不會剝離。更可形成良好形狀的導通孔。This embodiment is a copper foil laminate having high rigidity and excellent adhesion to the insulating resin layer and an insulating resin layer having high adhesion and high toughness to the copper foil. Therefore, even if the insulating resin layer with the insulating resin layer of this embodiment is used Copper foil is used to manufacture a printed wiring board. In the manufacturing process, the thin insulating resin layer is not damaged, and the copper foil and the insulating resin layer are not peeled off. Further, a well-shaped via hole can be formed.

本實施形態之附設絕緣性樹脂層之銅箔可使用於製造電子設備、通信設備及個人電腦等,作為印刷配線板或半導體元件搭載用基板之堆疊材料係為有效。使用本實施形態之附設絕緣性樹脂層之銅箔作為印刷配線板及半導體元件搭載用基板之堆疊材料的話,可使銅箔疊層在印刷配線板及半導體元件搭載用基板的最表面,故可對於最表面之銅箔直接形成電路圖案。又,在製造印刷配線板或半導體元件搭載用基板時,即使在銅箔蝕刻後施以鍍敷處理,銅箔面仍會轉印到絕緣性樹脂層,故絕緣性樹脂層與鍍敷物之間的黏合性會改善。因此,藉由使用本實施形態之附設絕緣性樹脂層之銅箔,可獲得形成有高密度的微細配線之薄型印刷配線板及半導體元件搭載用基板。The copper foil with an insulating resin layer in this embodiment can be used for manufacturing electronic equipment, communication equipment, personal computers, and the like, and is effective as a stacked material for printed wiring boards or substrates for mounting semiconductor elements. When the copper foil with an insulating resin layer in this embodiment is used as a stacking material for a printed wiring board and a substrate for mounting a semiconductor element, the copper foil can be laminated on the outermost surface of the printed wiring board and the substrate for mounting a semiconductor element, so that it can be used. The circuit pattern is directly formed on the outermost copper foil. In addition, when manufacturing a printed wiring board or a substrate for mounting a semiconductor element, even if copper plating is applied after the copper foil is etched, the copper foil surface is transferred to the insulating resin layer. Therefore, between the insulating resin layer and the plated material The adhesion will be improved. Therefore, by using the copper foil with an insulating resin layer of this embodiment, a thin printed wiring board and a semiconductor element mounting substrate on which high-density fine wiring is formed can be obtained.

[銅箔]
就本實施形態之銅箔而言,係使用於一般的印刷配線板之銅箔或銅薄膜,若和絕緣性樹脂層接觸的銅箔面之算術平均粗糙度(Ra)為0.05~2μm則無特別限制。就銅箔之具體例而言,可列舉:電解銅箔、壓延銅箔及銅合金薄膜。銅箔或銅薄膜也可施以例如氈化處理、電暈處理、鎳處理及鈷處理等公知的表面處理。
[Copper foil]
The copper foil of this embodiment is a copper foil or a copper film used for a general printed wiring board, and if the arithmetic average roughness (Ra) of the copper foil surface in contact with the insulating resin layer is 0.05 to 2 μm, there is no Special restrictions. Specific examples of the copper foil include electrolytic copper foil, rolled copper foil, and copper alloy thin films. The copper foil or copper film may be subjected to a known surface treatment such as a felting treatment, a corona treatment, a nickel treatment, and a cobalt treatment.

考慮使銅箔與絕緣性樹脂層之黏合強度改善且可防止長時間使用時的層剝離之觀點,銅箔面之算術平均粗糙度(Ra)通常落在0.05~2μm之範圍,宜落在0.08~1.7μm之範圍,考慮可獲得銅箔與絕緣性樹脂層之更優良的黏合性之觀點,落在0.2~1.6μm之範圍更佳。本實施形態中,包含算術平均粗糙度落在前述範圍內之銅箔的附設絕緣性樹脂層之銅箔可理想地使用於製造形成有高密度的微細配線之印刷配線板及半導體元件搭載用基板。又,算術平均粗糙度未達0.05μm的話,會有無法獲得銅箔與樹脂之間的黏合強度之疑慮,超過2μm的話,會有配線形成時容易發生線腳殘留而無法形成微細的配線之疑慮。另外,算術平均粗糙度可使用市售之形狀測定顯微鏡(雷射顯微鏡,例如KEYENCE股份有限公司製VK-X210(商品名))來測定。具體的測定方法如實施例所記載。Considering the viewpoint of improving the adhesion strength between the copper foil and the insulating resin layer and preventing the layer from peeling when used for a long time, the arithmetic average roughness (Ra) of the copper foil surface usually falls within the range of 0.05 to 2 μm, and preferably falls within 0.08 The range of ˜1.7 μm is more preferably in the range of 0.2 to 1.6 μm, considering the viewpoint of obtaining better adhesion between the copper foil and the insulating resin layer. In this embodiment, the copper foil with an insulating resin layer including a copper foil having an arithmetic average roughness falling within the aforementioned range can be ideally used for manufacturing a printed wiring board having a high-density fine wiring and a substrate for mounting a semiconductor element. . In addition, if the arithmetic average roughness is less than 0.05 μm, there is a concern that the bonding strength between the copper foil and the resin cannot be obtained. If it exceeds 2 μm, there is a possibility that pin residues are likely to occur during wiring formation and fine wiring cannot be formed. The arithmetic mean roughness can be measured using a commercially available shape measuring microscope (laser microscope, for example, VK-X210 (trade name) manufactured by KEYENCE Corporation). The specific measurement method is as described in the examples.

銅箔的厚度只要能發揮本實施形態之效果則無特別限制,宜落在1~18μm之範圍內,考量可理想地獲得薄型印刷配線板及半導體元件搭載用基板之觀點,落在2~15μm之範圍內更佳。銅箔的厚度未達1μm的話,不易進行銅箔表面的粗糙化處理,超過18μm的話,則不利於成本面或開孔加工性。The thickness of the copper foil is not particularly limited as long as it exhibits the effects of this embodiment. It should fall within the range of 1 to 18 μm. Considering that a thin printed wiring board and a substrate for mounting a semiconductor element can be ideally obtained, the thickness is 2 to 15 μm. Within the range is better. If the thickness of the copper foil is less than 1 μm, it is difficult to roughen the surface of the copper foil, and if it is more than 18 μm, it is not conducive to cost surface or hole processability.

就銅箔而言可使用例如:JX金屬(股)製之GHY5(商品名,12μm厚銅箔)、三井金屬礦業(股)製之3EC-VLP(商品名,12μm厚銅箔)、3EC-III(商品名,12μm厚銅箔)及3EC-M2S-VLP(商品名,12μm厚銅箔)、古河電氣興業(股)製之銅箔GTS-MP(商品名,12μm厚銅箔)及JX金屬(股)製之JXUT-I(商品名,1.5μm厚銅箔)之市售品。As the copper foil, for example, GHY5 (trade name, 12 μm thick copper foil) made by JX Metal (stock), 3EC-VLP (trade name, 12 μm thick copper foil), 3EC- III (trade name, 12 μm thick copper foil) and 3EC-M2S-VLP (trade name, 12 μm thick copper foil), Furukawa Electric Industrial Co., Ltd. copper foil GTS-MP (trade name, 12 μm thick copper foil), and JX A commercially available product of JXUT-I (trade name, 1.5 μm thick copper foil) made of metal.

[樹脂組成物]
(A)熱硬化性樹脂
考慮耐熱性、絕緣性、鍍敷物黏合性之觀點,本實施形態之樹脂組成物中含有熱硬化性樹脂。就熱硬化性樹脂而言,若為使用於印刷配線板之絕緣層的樹脂則無特別限制。
[Resin composition]
(A) Thermosetting resin Considering the viewpoints of heat resistance, insulation, and adhesion of a plated material, the resin composition of this embodiment contains a thermosetting resin. The thermosetting resin is not particularly limited as long as it is a resin used for an insulating layer of a printed wiring board.

就熱硬化性樹脂之具體例而言,可列舉:環氧樹脂、氰酸酯化合物、馬來醯亞胺化合物、酚醛樹脂、熱硬化改性聚苯醚樹脂、苯并㗁化合物、有機基改性聚矽氧化合物及具有可聚合的不飽和基之化合物。
這些熱硬化性樹脂可使用1種或將2種以上適當地混合使用。
Specific examples of the thermosetting resin include epoxy resin, cyanate compound, maleimide compound, phenol resin, thermosetting modified polyphenylene ether resin, and benzofluorene. Compounds, organic-modified polysiloxanes, and compounds with polymerizable unsaturated groups.
These thermosetting resins may be used singly or as a mixture of two or more kinds as appropriate.

這些熱硬化性樹脂之中,考慮可獲得具有優良的剝離強度之絕緣性樹脂層之觀點,樹脂組成物中宜含有環氧樹脂及氰酸酯化合物,含有環氧樹脂及氰酸酯化合物同時更含有雙馬來醯亞胺化合物更佳。Among these thermosetting resins, considering the viewpoint of obtaining an insulating resin layer having excellent peeling strength, the resin composition should preferably contain an epoxy resin and a cyanate compound. Compounds containing bismaleimide are more preferred.

就環氧樹脂而言,若為1分子中具有2個以上之環氧基者則無特別限制,可使用習知之任意的環氧樹脂。
考慮使黏接性及可撓性更良好之觀點,環氧樹脂之環氧當量宜為250~850g/eq,為250~450g/eq更佳。環氧當量可利用常規方法進行測定。
The epoxy resin is not particularly limited as long as it has two or more epoxy groups in one molecule, and any conventional epoxy resin can be used.
Considering that the adhesiveness and flexibility are better, the epoxy equivalent of the epoxy resin is preferably 250 to 850 g / eq, and more preferably 250 to 450 g / eq. The epoxy equivalent can be measured by a conventional method.

就環氧樹脂之具體例而言,可列舉例如:聚氧伸萘基型環氧樹脂、聯苯芳烷基型環氧樹脂、萘4官能型環氧樹脂、二甲苯型環氧樹脂、萘酚芳烷基型環氧樹脂、雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚A酚醛清漆型環氧樹脂、3官能酚型環氧樹脂、4官能酚型環氧樹脂、萘型環氧樹脂、聯苯型環氧樹脂、芳烷基酚醛清漆型環氧樹脂、脂環族環氧樹脂、多元醇型環氧樹脂、環氧丙基胺型環氧樹脂、環氧丙基酯型環氧樹脂、將丁二烯等之雙鍵環氧化而成之化合物、利用含有羥基之聚矽氧樹脂類與環氧氯丙烷之反應而得之化合物。它們之中,尤其考慮鍍敷銅附著性與阻燃性之觀點,宜為聚氧伸萘基型環氧樹脂、聯苯芳烷基型環氧樹脂、萘4官能型環氧樹脂、二甲苯型環氧樹脂、萘酚芳烷基型環氧樹脂。這些環氧樹脂可使用1種或將2種以上適當地混合使用。Specific examples of the epoxy resin include polyoxynaphthyl epoxy resin, biphenylaralkyl epoxy resin, naphthalene 4-functional epoxy resin, xylene epoxy resin, and naphthalene. Phenolic aralkyl epoxy resin, bisphenol A epoxy resin, bisphenol F epoxy resin, bisphenol A novolac epoxy resin, trifunctional phenol epoxy resin, 4-functional phenol epoxy resin , Naphthalene type epoxy resin, biphenyl type epoxy resin, aralkyl novolac type epoxy resin, alicyclic epoxy resin, polyhydric alcohol type epoxy resin, epoxypropylamine type epoxy resin, epoxy resin A propyl ester epoxy resin, a compound obtained by epoxidizing a double bond such as butadiene, and a compound obtained by reacting a polysiloxane resin containing a hydroxyl group with epichlorohydrin. Among them, from the viewpoints of adhesion and flame retardancy of plated copper, polyoxynaphthyl epoxy resin, biphenylaralkyl epoxy resin, naphthalene 4-functional epoxy resin, and xylene are preferable. Type epoxy resin, naphthol aralkyl type epoxy resin. These epoxy resins can be used individually by 1 type or in mixture of 2 or more types suitably.

本實施形態中,環氧樹脂的含量並無特別限制,考慮耐熱性及硬化性之觀點,相對於樹脂組成物中之樹脂固體成分100質量份,宜落在10~80質量份之範圍內,落在30~70質量份之範圍內特佳。In this embodiment, the content of the epoxy resin is not particularly limited. Considering the heat resistance and hardenability, it is preferably within the range of 10 to 80 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition. It is particularly preferable to fall within the range of 30 to 70 parts by mass.

氰酸酯化合物具有耐藥品性、黏接性等優良的特性,由於其優良的耐藥品性而能形成均勻的粗糙化面,故可理想地使用作為本實施形態之樹脂組成物的成分。The cyanate ester compound has excellent characteristics such as chemical resistance and adhesion, and can form a uniform roughened surface due to its excellent chemical resistance. Therefore, it can be preferably used as a component of the resin composition of this embodiment.

就氰酸酯化合物之具體例而言,可列舉例如:式(1)表示之α-萘酚芳烷基型氰酸酯化合物、式(2)表示之酚醛清漆型氰酸酯化合物、式(3)表示之聯苯芳烷基型氰酸酯化合物、1,3-二氰氧基苯、1,4-二氰氧基苯、1,3,5-三氰氧基苯、雙(3,5-二甲基-4-氰氧基苯基)甲烷、1,3-二氰氧基萘、1,4-二氰氧基萘、1,6-二氰氧基萘、1,8-二氰氧基萘、2,6-二氰氧基萘、2,7-二氰氧基萘、1,3,6-三氰氧基萘、4,4’-二氰氧基聯苯、雙(4-氰氧基苯基)甲烷、雙(4-氰氧基苯基)丙烷、雙(4-氰氧基苯基)醚、雙(4-氰氧基苯基)硫醚、雙(4-氰氧基苯基)碸、2,2’-雙(4-氰氧基苯基)丙烷、雙(3,5-二甲基-4-氰氧基苯基)甲烷。這些氰酸酯化合物可使用1種或將2種以上適當地混合使用。Specific examples of the cyanate compound include, for example, an α-naphthol aralkyl type cyanate compound represented by the formula (1), a novolac type cyanate compound represented by the formula (2), and ( 3) Biphenylaralkyl-type cyanate ester compound, 1,3-dicyanooxybenzene, 1,4-dicyanooxybenzene, 1,3,5-tricyanoxybenzene, bis (3 , 5-dimethyl-4-cyanooxyphenyl) methane, 1,3-dicyanooxynaphthalene, 1,4-dicyanooxynaphthalene, 1,6-dicyanooxynaphthalene, 1,8 -Dicyanoxynaphthalene, 2,6-Dicyanoxynaphthalene, 2,7-Dicyanoxynaphthalene, 1,3,6-Tricyanoxynaphthalene, 4,4'-Dicyanoxybiphenyl , Bis (4-cyanooxyphenyl) methane, bis (4-cyanooxyphenyl) propane, bis (4-cyanooxyphenyl) ether, bis (4-cyanooxyphenyl) sulfide, Bis (4-cyanooxyphenyl) fluorene, 2,2'-bis (4-cyanooxyphenyl) propane, bis (3,5-dimethyl-4-cyanooxyphenyl) methane. These cyanate ester compounds can be used individually by 1 type or in mixture of 2 or more types suitably.

它們之中,式(1)表示之α-萘酚芳烷基型氰酸酯化合物、式(2)表示之酚醛清漆型氰酸酯化合物、及式(3)表示之聯苯芳烷基型氰酸酯化合物其阻燃性優良、硬化性高、且硬化物之熱膨脹係數低,故較理想。Among them, an α-naphthol aralkyl type cyanate compound represented by formula (1), a novolac type cyanate compound represented by formula (2), and a biphenylaralkyl type represented by formula (3) A cyanate ester compound is preferable because it has excellent flame retardancy, high hardenability, and a low thermal expansion coefficient of a cured product.

[化1]
[Chemical 1]

式(1)中,R1 表示氫原子或甲基,n1 表示1以上之整數。n1 宜為1~50之整數。In formula (1), R 1 represents a hydrogen atom or a methyl group, and n 1 represents an integer of 1 or more. n 1 is preferably an integer from 1 to 50.

[化2]
[Chemical 2]

式(2)中,R2 表示氫原子或甲基,n2 表示1以上之整數。n2 宜為1~50之整數。In formula (2), R 2 represents a hydrogen atom or a methyl group, and n 2 represents an integer of 1 or more. n 2 is preferably an integer from 1 to 50.

[化3]
[Chemical 3]

式(3)中,R3 表示氫原子或甲基,n3 表示1以上之整數。n3 宜為1~50之整數。In formula (3), R 3 represents a hydrogen atom or a methyl group, and n 3 represents an integer of 1 or more. n 3 should be an integer from 1 to 50.

本實施形態中,氰酸酯化合物的含量並無特別限制,考慮耐熱性、和銅箔之黏合性的觀點,相對於樹脂組成物中之樹脂固體成分100質量份,宜落在15~85質量份之範圍內,落在25~65質量份之範圍內更佳。In this embodiment, the content of the cyanate ester compound is not particularly limited. Considering the heat resistance and the adhesiveness of the copper foil, the content of the resin solid content in the resin composition is preferably 15 to 85 parts by mass. It is more preferable to fall within the range of 25 to 65 parts by mass.

馬來醯亞胺化合物能改善絕緣性樹脂層之吸濕耐熱性,故可理想地使用作為本實施形態之樹脂組成物的成分。
就馬來醯亞胺化合物而言,若為1分子中具有2個以上之馬來醯亞胺基者則無特別限制,可使用習知之任意的馬來醯亞胺化合物。
Since the maleimide compound can improve the moisture absorption and heat resistance of the insulating resin layer, it can be preferably used as a component of the resin composition of this embodiment.
The maleimide compound is not particularly limited as long as it has two or more maleimide groups in one molecule, and any conventional maleimide compound can be used.

就馬來醯亞胺化合物之具體例而言,可列舉例如:雙(4-馬來醯亞胺基苯基)甲烷、2,2-雙(4-(4-馬來醯亞胺基苯氧基)苯基)丙烷、雙(3,5-二甲基-4-馬來醯亞胺基苯基)甲烷、雙(3-乙基-5-甲基-4-馬來醯亞胺基苯基)甲烷、雙(3,5-二乙基-4-馬來醯亞胺基苯基)甲烷等雙馬來醯亞胺化合物;多苯基甲烷馬來醯亞胺。另外,亦能以這些馬來醯亞胺化合物之預聚物或馬來醯亞胺化合物與胺化合物之預聚物等的形式進行摻合。這些馬來醯亞胺化合物可使用1種或將2種以上適當地混合使用。Specific examples of the maleimidoimine compound include bis (4-maleimidoiminophenyl) methane and 2,2-bis (4- (4-maleimidoiminobenzene) (Oxy) phenyl) propane, bis (3,5-dimethyl-4-maleimidophenyl) methane, bis (3-ethyl-5-methyl-4-maleimide Bismaleimide compounds such as phenyl) methane and bis (3,5-diethyl-4-maleimidophenyl) methane; polyphenylmethanemaleimide. In addition, they may be blended in the form of a prepolymer of these maleimide compounds or a prepolymer of a maleimide compound and an amine compound. These maleimide compounds may be used alone or as a mixture of two or more thereof.

它們之中,考慮耐熱性的觀點,宜為雙馬來醯亞胺化合物,為雙(3-乙基-5-甲基-4-馬來醯亞胺基苯基)甲烷更佳。Among them, from the viewpoint of heat resistance, a bismaleimide compound is preferable, and bis (3-ethyl-5-methyl-4-maleimidephenyl) methane is more preferable.

本實施形態中,馬來醯亞胺化合物的含量並無特別限制,考慮耐熱性及和銅箔之黏合性的觀點,相對於樹脂組成物中之樹脂固體成分100質量份,宜落在5~75質量份之範圍內,落在5~45質量份之範圍內更佳。In this embodiment, the content of the maleimide compound is not particularly limited. Considering the heat resistance and the adhesiveness with copper foil, it is preferable to fall in the range of 5 to 75 with respect to 100 parts by mass of the resin solid content in the resin composition. It is more preferable to fall within the range of 5 to 45 parts by mass in the range of parts by mass.

就酚醛樹脂而言,若為1分子中具有2個以上之酚性羥基之樹脂則無特別限制,可使用習知之任意的酚醛樹脂。
就酚醛樹脂之具體例而言,可列舉例如:苯酚酚醛清漆樹脂、烷基苯酚酚醛清漆樹脂、雙酚A酚醛清漆樹脂、雙環戊二烯型酚醛樹脂、Xylok型酚醛樹脂、萜烯改性酚醛樹脂、聚乙烯基苯酚類、芳烷基型酚醛樹脂等1分子內有2個以上之鍵結於芳香族環之氫原子被羥基取代而成的化合物。這些酚醛樹脂可使用1種或將2種以上適當地混合使用。
The phenol resin is not particularly limited as long as it is a resin having two or more phenolic hydroxyl groups in one molecule, and any conventional phenol resin can be used.
Specific examples of the phenol resin include phenol novolac resin, alkylphenol novolac resin, bisphenol A novolac resin, dicyclopentadiene type phenol resin, Xylok type phenol resin, and terpene-modified phenol resin. A compound in which two or more hydrogen atoms bonded to an aromatic ring in one molecule, such as a resin, a polyvinyl phenol, and an aralkyl phenol resin, are substituted with a hydroxyl group. These phenol resins can be used singly or as a mixture of two or more kinds.

熱硬化改性聚苯醚樹脂係摻合熱塑性聚苯醚樹脂與環氧樹脂並使其溶解於甲苯等溶劑,再添加2-乙基-4-甲基咪唑作為觸媒來使其交聯而成的樹脂。Thermosetting modified polyphenylene ether resin is blended with thermoplastic polyphenylene ether resin and epoxy resin and dissolved in a solvent such as toluene, and then 2-ethyl-4-methylimidazole is added as a catalyst to crosslink and Into the resin.

就苯并㗁化合物而言,若具有㗁環作為基本骨架則無特別限制。又,本實施形態中,苯并㗁化合物也包含萘并㗁化合物等具有多環㗁骨架之化合物。Benzopyrene For compounds, if The ring is not particularly limited as a basic skeleton. In this embodiment, benzopyrene Naphthofluorene Polycyclic fluorene A skeleton compound.

有機基改性聚矽氧化合物並無特別限制,就具體例而言可列舉:二(甲胺基)聚二甲基矽氧烷、二(乙胺基)聚二甲基矽氧烷、二(丙胺基)聚二甲基矽氧烷、二(環氧丙基)聚二甲基矽氧烷、二(環氧丁基)聚二甲基矽氧烷。這些有機基改性聚矽氧化合物可使用1種或將2種以上適當地混合使用。The organic-modified polysiloxane is not particularly limited, and specific examples thereof include bis (methylamino) polydimethylsiloxane, bis (ethylamino) polydimethylsiloxane, and (Propylamino) polydimethylsiloxane, bis (epoxypropyl) polydimethylsiloxane, bis (epoxybutyl) polydimethylsiloxane. These organic-modified polysiloxanes can be used singly or in combination of two or more kinds.

就具有可聚合的不飽和基之化合物而言並無特別限制,可列舉:乙烯、丙烯、苯乙烯、二乙烯基苯、二乙烯基聯苯等乙烯系化合物;(甲基)丙烯酸甲酯、(甲基)丙烯酸-2-羥乙酯、(甲基)丙烯酸-2-羥丙酯、聚丙二醇二(甲基)丙烯酸酯、三羥甲基丙烷二(甲基)丙烯酸酯、三羥甲基丙烷三(甲基)丙烯酸酯、新戊四醇四(甲基)丙烯酸酯、二新戊四醇六(甲基)丙烯酸酯等單元醇或多元醇的(甲基)丙烯酸酯類;雙酚A型環氧(甲基)丙烯酸酯、雙酚F型環氧(甲基)丙烯酸酯等環氧(甲基)丙烯酸酯類;苯并環丁烯樹脂等。這些具有可聚合的不飽和基之化合物可使用1種或將2種以上適當地混合使用。The compound having a polymerizable unsaturated group is not particularly limited, and examples thereof include vinyl compounds such as ethylene, propylene, styrene, divinylbenzene, and divinylbiphenyl; methyl (meth) acrylate, 2-hydroxyethyl (meth) acrylate, 2-hydroxypropyl (meth) acrylate, polypropylene glycol di (meth) acrylate, trimethylolpropane di (meth) acrylate, trimethylol (Meth) acrylates of unit alcohols or polyhydric alcohols such as propane tri (meth) acrylate, neopentaerythritol tetra (meth) acrylate, and dipentaerythritol hexa (meth) acrylate; bis Epoxy (meth) acrylates such as phenol A epoxy (meth) acrylate and bisphenol F epoxy (meth) acrylate; benzocyclobutene resin and the like. These compounds having a polymerizable unsaturated group may be used singly or in combination of two or more kinds as appropriate.

(B)球狀填料
考慮低熱膨脹率、成形性、填充性及剛性的觀點,本實施形態之樹脂組成物中含有球狀填料。就球狀填料而言,若為使用於印刷配線板之絕緣層之球狀的填料,則無特別限制。
(B) Spherical fillers Considering the viewpoints of low thermal expansion, moldability, filling properties, and rigidity, the resin composition of this embodiment contains spherical fillers. The spherical filler is not particularly limited as long as it is a spherical filler used for an insulating layer of a printed wiring board.

球狀填料並無特別限制,但平均粒徑(D50)宜落在0.01~5μm之範圍內。另外,D50意指中值粒徑,係將所測得的粉體之粒度分佈分成2側時之較大側與較小側成為等量之粒徑。球狀填料的D50值一般而言係利用濕式雷射繞射-散射法進行測定。The spherical filler is not particularly limited, but the average particle diameter (D50) should preferably fall within a range of 0.01 to 5 μm. In addition, D50 means a median particle diameter, and is a particle diameter in which the larger side and the smaller side when the measured particle size distribution of the powder is divided into two sides become the same amount. The D50 value of the spherical filler is generally measured by a wet laser diffraction-scattering method.

就球狀填料而言,可列舉例如:氫氧化鎂;氧化鎂;天然二氧化矽、熔融二氧化矽、非晶態二氧化矽、中空二氧化矽等二氧化矽類;二硫化鉬、氧化鉬、鉬酸鋅等鉬化合物;氧化鋁;氮化鋁;玻璃;氧化鈦;氧化鋯等。這些球狀填料可使用1種或將2種以上適當地混合使用。Examples of spherical fillers include: magnesium hydroxide; magnesium oxide; natural silicon dioxide, fused silicon dioxide, amorphous silicon dioxide, hollow silicon dioxide and other silicon dioxide; molybdenum disulfide, oxide Molybdenum compounds such as molybdenum and zinc molybdate; alumina; aluminum nitride; glass; titanium oxide; zirconia. These spherical fillers can be used singly or in combination of two or more kinds as appropriate.

就球狀填料而言,考慮低熱膨脹性之觀點,宜為球狀熔融二氧化矽。就市售之球狀熔融二氧化矽而言,可列舉:Admatechs(股)製之SC2050-MB、SC2500-SQ、SC4500-SQ、SO-C2、SO-C1;電氣化學工業(股)製之SFP-130MC等。In terms of spherical fillers, spherical fused silica is preferred from the viewpoint of low thermal expansion. As for commercially available spherical fused silica, there are: SC2050-MB, SC2500-SQ, SC4500-SQ, SO-C2, SO-C1 manufactured by Admatechs; SFP-130MC and so on.

球狀二氧化矽的平均粒徑並無特別限制,宜落在0.01μm~5μm之範圍內,落在0.05μm~3μm之範圍內更佳,落在0.1μm~2μm之範圍內又更佳,落在0.3μm~1.5μm再更佳。球狀二氧化矽的平均粒徑可利用基於米氏(Mie)散射理論之雷射繞射-散射法進行測定。具體而言,可利用雷射繞射散射式粒度分佈測定裝置,以體積基準製作球狀二氧化矽之粒度分佈,並令其中值粒徑為平均粒徑,藉此進行測定。測定樣本可理想地使用將球狀二氧化矽利用超音波使其分散於水中而成者。就雷射繞射散射式粒度分佈測定裝置而言,可使用堀場製作所股份有限公司製LA-500等。The average particle diameter of the spherical silica is not particularly limited. It should fall within the range of 0.01 μm to 5 μm, more preferably fall within the range of 0.05 μm to 3 μm, and more preferably fall within the range of 0.1 μm to 2 μm. It is more preferable to fall between 0.3 μm and 1.5 μm. The average particle diameter of the spherical silica can be measured by a laser diffraction-scattering method based on the Mie scattering theory. Specifically, the measurement can be performed by using a laser diffraction scattering particle size distribution measuring device to prepare a particle size distribution of spherical silica on a volume basis, and making the median particle diameter the average particle diameter. As the measurement sample, a spherical silicon dioxide is preferably dispersed in water using ultrasonic waves. As a laser diffraction scattering type particle size distribution measuring device, LA-500 manufactured by Horiba, Ltd. can be used.

本實施形態中,球狀填料之含量並無特別限制,考慮成形性的觀點,相對於樹脂組成物中之樹脂固體成分100質量份,宜落在50~500質量份之範圍內,落在100~400質量份之範圍內特佳。In this embodiment, the content of the spherical filler is not particularly limited. Considering the viewpoint of moldability, it is preferably within a range of 50 to 500 parts by mass with respect to 100 parts by mass of the resin solid content in the resin composition. Particularly preferred is in the range of 400 parts by mass.

又,本實施形態之球狀填料也可利用矽烷偶聯劑等予以表面處理。就矽烷偶聯劑而言,可使用後述之矽烷偶聯劑。The spherical filler of this embodiment may be surface-treated with a silane coupling agent or the like. As a silane coupling agent, the silane coupling agent mentioned later can be used.

(C)平均纖維長為10~300μm之玻璃短纖維
本實施形態之樹脂組成物中,為了對銅箔之優良的黏合性、賦予樹脂組成物韌性、及獲得具有低熱膨脹率之樹脂組成物,而含有平均纖維長為10~300μm之玻璃短纖維。本實施形態之玻璃短纖維若為以SiO2 、Al2 O3 、CaO、MgO、B2 O3 、Na2 O及K2 O作為主成分且平均纖維長為10~300μm,則無特別限制。
(C) Short glass fibers having an average fiber length of 10 to 300 μm. In the resin composition of this embodiment, in order to obtain excellent adhesion to copper foil, impart toughness to the resin composition, and obtain a resin composition having a low thermal expansion coefficient, On the other hand, short glass fibers with an average fiber length of 10 to 300 μm are included. The glass short fiber of this embodiment is not particularly limited as long as it contains SiO 2 , Al 2 O 3 , CaO, MgO, B 2 O 3 , Na 2 O, and K 2 O as its main component and the average fiber length is 10 to 300 μm. .

考慮降低熱膨脹率之觀點,玻璃短纖維之平均纖維長宜為20μm以上,為30μm以上更佳。又,考慮改善玻璃短纖維之分散性的觀點,宜為250μm以下,為200μm以下更佳,為150μm以下再更佳。From the viewpoint of reducing the thermal expansion rate, the average fiber length of the short glass fibers is preferably 20 μm or more, and more preferably 30 μm or more. From the viewpoint of improving the dispersibility of short glass fibers, the thickness is preferably 250 μm or less, more preferably 200 μm or less, and even more preferably 150 μm or less.

玻璃短纖維之纖維徑並無特別限制,考慮可進一步降低熱膨脹率的觀點,宜為1μm以上,為3μm以上更佳,為4μm以上再更佳。考慮平滑性的觀點,宜為15μm以下,為13μm以下更佳,為11μm以下再更佳。The fiber diameter of the short glass fibers is not particularly limited. Considering that the thermal expansion coefficient can be further reduced, it is preferably 1 μm or more, more preferably 3 μm or more, and even more preferably 4 μm or more. From the viewpoint of smoothness, it is preferably 15 μm or less, more preferably 13 μm or less, and even more preferably 11 μm or less.

玻璃短纖維之平均纖維長及纖維徑可使用光學顯微鏡或電子顯微鏡等進行測定。The average fiber length and fiber diameter of the glass short fibers can be measured using an optical microscope, an electron microscope, or the like.

就玻璃短纖維之具體例而言,可列舉:經輾磨之纖維(本實施形態也稱為milled fiber)、玻璃絨及微桿(micro rods),將其摻合於絕緣性樹脂層時,可獲得和銅箔優良的黏合性,考量價格低廉的觀點,宜為經輾磨之纖維。這些玻璃短纖維可使用1種或將2種以上適當地混合使用。Specific examples of short glass fibers include milled fibers (also referred to as milled fibers in this embodiment), glass wool, and micro rods, and when they are blended in an insulating resin layer, It can obtain excellent adhesion to copper foil, and considering the low cost, it is suitable to be milled fiber. These glass short fibers may be used singly or as a mixture of two or more kinds.

本實施形態中,玻璃短纖維之含量並無特別限制,考慮熱膨脹率、賦予韌性、及成形性的觀點,相對於樹脂組成物中之樹脂固體成分100質量份,宜落在5~450質量份之範圍內,落在10~400質量份之範圍內特佳。In this embodiment, the content of short glass fibers is not particularly limited. Considering the thermal expansion rate, imparting toughness, and moldability, it is preferable to fall in the range of 5 to 450 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition. Within the range, it is particularly preferable to fall within the range of 10 to 400 parts by mass.

本實施形態中,(B)球狀填料與(C)玻璃短纖維之摻合比並無特別限制,考慮成形性的觀點,(B)球狀填料:(C)玻璃短纖維之質量比宜為1:20~100:1,為1:10~150:1更佳,為1:2~10:1再更佳。In this embodiment, the blending ratio of (B) spherical filler and (C) short glass fiber is not particularly limited. In consideration of formability, (B) spherical filler: (C) mass ratio of short glass fiber It is 1:20 to 100: 1, more preferably 1:10 to 150: 1, and even more preferably 1: 2 to 10: 1.

(其他成分)
本實施形態之樹脂組成物中,除了含有(A)熱硬化性樹脂、(B)球狀填料及(C)玻璃短纖維之外,還可含有1或2種以上之其他成分。
就其他成分而言,例如為了改善本實施形態相關之絕緣性樹脂層的吸濕耐熱性,本實施形態之樹脂組成物中也可含有矽烷偶聯劑。就矽烷偶聯劑而言,若為通常使用於無機物之表面處理的矽烷偶聯劑,則無特別限制。就具體例而言,可列舉:胺基矽烷系矽烷偶聯劑(例如γ-胺丙基三乙氧基矽烷、N-β-(胺乙基)-γ-胺丙基三甲氧基矽烷)、環氧矽烷系矽烷偶聯劑(例如γ-環氧丙氧丙基三甲氧基矽烷)、乙烯基矽烷系矽烷偶聯劑(例如γ-甲基丙烯醯氧丙基三甲氧基矽烷)、陽離子性矽烷系矽烷偶聯劑(例如N-β-(N-乙烯苄基胺乙基)-γ-胺丙基三甲氧基矽烷鹽酸鹽)、苯基矽烷系矽烷偶聯劑等。這些矽烷偶聯劑可使用1種或將2種以上適當地混合使用。
(Other ingredients)
The resin composition of this embodiment may contain (A) a thermosetting resin, (B) a spherical filler, and (C) a glass short fiber, and may contain 1 or 2 or more other components.
As for other components, for example, in order to improve the moisture absorption and heat resistance of the insulating resin layer according to this embodiment, a silane coupling agent may be contained in the resin composition of this embodiment. The silane coupling agent is not particularly limited as long as it is a silane coupling agent generally used for surface treatment of inorganic substances. Specific examples include aminosilane-based silane coupling agents (e.g., γ-aminopropyltriethoxysilane, N-β- (aminoethyl) -γ-aminopropyltrimethoxysilane) , Silane-based silane coupling agent (e.g. γ-glycidoxypropyltrimethoxysilane), Silane-based silane coupling agent (e.g. γ-methacryloxypropyltrimethoxysilane), Cationic silane-based silane coupling agents (for example, N-β- (N-vinylbenzylaminoethyl) -γ-aminopropyltrimethoxysilane hydrochloride), phenylsilane-based silane coupling agents, and the like. These silane coupling agents may be used alone or as a mixture of two or more thereof.

本實施形態中,矽烷偶聯劑的含量並無特別限制,考慮改善吸濕耐熱性之觀點,相對於球狀填料100質量份,宜落在0.05~5質量份之範圍內,落在0.1~3質量份之範圍內更佳。另外,合併使用2種以上之矽烷偶聯劑時,它們的合計量宜符合上述範圍。In this embodiment, the content of the silane coupling agent is not particularly limited. Considering the viewpoint of improving the moisture absorption heat resistance, it is preferable to fall within a range of 0.05 to 5 parts by mass and fall within a range of 0.1 to 5 parts by mass with respect to 100 parts by mass of the spherical filler. It is more preferably within a range of 3 parts by mass. In addition, when two or more kinds of silane coupling agents are used in combination, their total amount is preferably within the above range.

就改善絕緣性樹脂層之製造性等目的而言,本實施形態之樹脂組成物中也可含有濕潤分散劑。就濕潤分散劑而言,若為通常使用於塗料等之濕潤分散劑,則無特別限制。就具體例而言,可列舉:BYK(股)製之Disperbyk(註冊商標)-110、Disperbyk-111、Disperbyk-180、Disperbyk-161、BYK(註冊商標)-W996、BYK-W9010、BYK-W903等。這些濕潤分散劑可使用1種或將2種以上適當地混合使用。For the purpose of improving the manufacturability of the insulating resin layer, the resin composition of the present embodiment may contain a wetting and dispersing agent. The wetting and dispersing agent is not particularly limited as long as it is a wetting and dispersing agent generally used in paints and the like. Specific examples include: Disperbyk (registered trademark) -110, Disperbyk-111, Disperbyk-180, Disperbyk-161, BYK (registered trademark) -W996, BYK-W9010, BYK-W903 Wait. These wetting and dispersing agents may be used alone or as a mixture of two or more of them as appropriate.

本實施形態中,濕潤分散劑的含量並無特別限制,考慮改善絕緣性樹脂層的製造性之觀點,相對於球狀填料100質量份,宜落在0.1~5質量份之範圍內,落在0.5~3質量份之範圍內更佳。另外,合併使用2種以上之濕潤分散劑時,它們的合計量宜符合上述範圍。In this embodiment, the content of the wetting and dispersing agent is not particularly limited, and considering the viewpoint of improving the manufacturability of the insulating resin layer, it is preferably within the range of 0.1 to 5 parts by mass relative to 100 parts by mass of the spherical filler, It is more preferably within a range of 0.5 to 3 parts by mass. In addition, when two or more kinds of wetting and dispersing agents are used in combination, their total amount is preferably within the above range.

考慮調整硬化速度等之目的,本實施形態之樹脂組成物中也可含有硬化促進劑。就硬化促進劑而言,若為使用於環氧樹脂或氰酸酯化合物等之硬化促進劑等通常使用之硬化促進劑,則無特別限制。就具體例而言,可列舉:含有銅、鋅、鈷、鎳、錳等金屬之有機金屬鹽類(例如辛酸鋅、萘酸鈷、辛酸鎳、辛酸錳)、咪唑類及其衍生物(例如2-乙基-4-甲基咪唑、1-苄基-2-苯基咪唑、2,4,5-三苯基咪唑)、三級胺(例如三乙胺、三丁胺)。這些硬化促進劑可使用1種或將2種以上適當地混合使用。In consideration of the purpose of adjusting the curing speed, etc., the resin composition of the present embodiment may contain a curing accelerator. The hardening accelerator is not particularly limited as long as it is a commonly used hardening accelerator such as a hardening accelerator used in an epoxy resin or a cyanate compound. Specific examples include organometallic salts containing metals such as copper, zinc, cobalt, nickel, and manganese (for example, zinc octoate, cobalt naphthalate, nickel octoate, manganese octoate), imidazoles, and derivatives thereof (for example, 2-ethyl-4-methylimidazole, 1-benzyl-2-phenylimidazole, 2,4,5-triphenylimidazole), tertiary amines (such as triethylamine, tributylamine). These hardening accelerators can be used individually by 1 type or in mixture of 2 or more types suitably.

本實施形態中,硬化促進劑的含量並無特別限制,考慮獲得高玻璃轉移溫度之觀點,相對於樹脂組成物中之樹脂固體成分100質量份,宜落在0.001~5質量份之範圍內,落在0.01~3質量份之範圍內更佳。另外,合併使用2種以上之硬化促進劑時,它們的合計量宜符合上述範圍。In this embodiment, the content of the hardening accelerator is not particularly limited. Considering the viewpoint of obtaining a high glass transition temperature, the content is preferably in the range of 0.001 to 5 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition. It is more preferable to fall within the range of 0.01 to 3 parts by mass. In addition, when two or more hardening accelerators are used in combination, their total amount is preferably within the above range.

本實施形態之樹脂組成物中也可含有其他各種高分子化合物及/或阻燃性化合物等。就高分子化合物及阻燃性化合物而言,若為通常使用者則無特別限制。The resin composition of this embodiment may contain other various polymer compounds and / or flame-retardant compounds. The polymer compound and the flame-retardant compound are not particularly limited as long as they are ordinary users.

就高分子化合物而言,係(A)熱硬化性樹脂以外,可列舉各種熱硬化性樹脂及熱塑性樹脂以及其寡聚物、彈性體類等。具體而言,可列舉:聚醯亞胺、聚醯胺醯亞胺、聚苯乙烯、聚烯烴、苯乙烯-丁二烯橡膠(SBR)、異戊二烯橡膠(IR)、丁二烯橡膠(BR)、丙烯腈丁二烯橡膠(NBR)、聚胺甲酸酯、聚丙烯、(甲基)丙烯酸系寡聚物、(甲基)丙烯酸系聚合物及聚矽氧樹脂等。考慮相容性之觀點,宜為丙烯腈丁二烯橡膠。The polymer compound includes, in addition to the thermosetting resin (A), various thermosetting resins and thermoplastic resins, and oligomers and elastomers thereof. Specific examples include polyimide, polyimide, imine, polystyrene, polyolefin, styrene-butadiene rubber (SBR), isoprene rubber (IR), and butadiene rubber. (BR), acrylonitrile-butadiene rubber (NBR), polyurethane, polypropylene, (meth) acrylic oligomer, (meth) acrylic polymer, and silicone resin. In view of compatibility, an acrylonitrile butadiene rubber is preferable.

就阻燃性化合物之具體例而言,係(B)球狀填料及(C)玻璃短纖維以外,可列舉:含有磷之化合物(例如磷酸酯、磷酸三聚氰胺、含有磷之環氧樹脂)、含有氮之化合物(例如三聚氰胺、苯并胍胺)、含有㗁環之化合物、聚矽氧系化合物等。這些高分子化合物及/或阻燃性化合物可使用1種或將2種以上適當地混合使用。Specific examples of the flame-retardant compound include, in addition to (B) the spherical filler and (C) the short glass fiber, compounds containing phosphorus (for example, phosphate esters, melamine phosphate, and epoxy resin containing phosphorus), Compounds containing nitrogen (e.g. melamine, benzoguanamine), Cyclic compounds, polysiloxane compounds, etc. These polymer compounds and / or flame retardant compounds may be used alone or as a mixture of two or more thereof.

本實施形態之樹脂組成物中為了各種目的也可含有各種添加劑。就添加劑之具體例而言,可列舉:紫外線吸收劑、抗氧化劑、光聚合起始劑、螢光增白劑、光敏劑、染料、顏料、增黏劑、潤滑劑、消泡劑、分散劑、整平劑及亮光劑。這些添加劑可使用1種或將2種以上適當地混合使用。The resin composition of this embodiment may contain various additives for various purposes. Specific examples of the additives include ultraviolet absorbers, antioxidants, photopolymerization initiators, fluorescent whitening agents, photosensitizers, dyes, pigments, thickeners, lubricants, defoamers, and dispersants. , Leveling agent and brightener. These additives may be used alone or as a mixture of two or more thereof.

(樹脂組成物及其製造方法)
本實施形態之樹脂組成物係藉由將(A)熱硬化性樹脂、(B)球狀填料、(C)平均纖維長為10~300μm之玻璃短纖維及因應需要之其他成分予以混合而製得。又,樹脂組成物也可因應需要製成使這些成分溶解於有機溶劑而成的溶液形態。如此的樹脂組成物之溶液可理想地使用作為後述製作本實施形態之附設絕緣性樹脂層之銅箔時的清漆。就有機溶劑而言,只要可使各成分各別理想地溶解或分散且能發揮本實施形態之樹脂組成物的效果,則無特別限制。就有機溶劑之具體例而言,可列舉:醇類(例如甲醇、乙醇及丙醇)、酮類(例如丙酮、甲乙酮及甲基異丁酮)、醯胺類(例如二甲基乙醯胺及二甲基甲醯胺)、芳香族烴類(例如甲苯及二甲苯)。這些有機溶劑可使用1種或將2種以上適當地混合使用。
(Resin composition and manufacturing method thereof)
The resin composition of this embodiment is prepared by mixing (A) a thermosetting resin, (B) a spherical filler, (C) short glass fibers having an average fiber length of 10 to 300 μm, and other components as required. Got. In addition, the resin composition may be in the form of a solution in which these components are dissolved in an organic solvent, if necessary. The solution of such a resin composition can be preferably used as a varnish when producing the copper foil with an insulating resin layer of this embodiment mentioned later. The organic solvent is not particularly limited as long as each component can be individually dissolved or dispersed as desired and the effect of the resin composition of this embodiment can be exhibited. Specific examples of the organic solvent include alcohols (for example, methanol, ethanol, and propanol), ketones (for example, acetone, methyl ethyl ketone, and methyl isobutyl ketone), and amines (for example, dimethylacetamide). And dimethylformamide), aromatic hydrocarbons (such as toluene and xylene). These organic solvents may be used alone or as a mixture of two or more thereof.

(由樹脂組成物構成的絕緣性樹脂層)
本實施形態之絕緣性樹脂層可得自於本實施形態之樹脂組成物。絕緣性樹脂層的厚度並無特別限制,考慮平滑性及玻璃短纖維的配向之觀點,宜落在3~50μm之範圍內,考慮更進一步獲得良好的成形性之觀點,為6~45μm更佳,考慮更進一步獲得良好的銅箔與絕緣性樹脂層之黏合性之觀點,為8~40μm再更佳。
(Insulating resin layer made of resin composition)
The insulating resin layer of this embodiment can be obtained from the resin composition of this embodiment. There is no particular limitation on the thickness of the insulating resin layer. From the viewpoint of smoothness and the orientation of short glass fibers, it should be in the range of 3 to 50 μm. From the viewpoint of further obtaining good moldability, it is more preferably 6 to 45 μm. From the viewpoint of further obtaining good adhesion between the copper foil and the insulating resin layer, it is more preferably 8 to 40 μm.

(附設絕緣性樹脂層之銅箔之製造方法)
本實施形態中,在銅箔上疊層由樹脂組成物構成的絕緣性樹脂層來製造本實施形態之附設絕緣性樹脂層之銅箔之方法並無特別限制。就製造方法而言,可舉例如:將使樹脂組成物溶解或分散於有機溶劑而成的溶液(清漆)塗佈於銅箔的表面,於加熱及/或減壓下進行乾燥,將溶劑去除並使樹脂組成物固化來形成絕緣性樹脂層之方法。
乾燥條件並無特別限制,就有機溶劑相對於絕緣性樹脂層之含有比率而言,相對於絕緣性樹脂層100質量份,通常使其乾燥成10質量份以下,宜使其乾燥成5質量份以下。達成乾燥的條件取決於清漆中的有機溶劑量而不同,例如在相對於清漆100質量份含有30~60質量份之有機溶劑的清漆之情況,於50~160℃之加熱條件下使其乾燥約3~10分鐘即可。
(Manufacturing method of copper foil with insulating resin layer)
In this embodiment, the method of manufacturing the copper foil with an insulating resin layer of this embodiment laminated | stacking the insulating resin layer which consists of a resin composition on a copper foil is not specifically limited. For the manufacturing method, for example, a solution (varnish) obtained by dissolving or dispersing a resin composition in an organic solvent is applied to the surface of a copper foil, dried under heating and / or reduced pressure, and the solvent is removed. A method of curing a resin composition to form an insulating resin layer.
There are no particular restrictions on the drying conditions. The content ratio of the organic solvent to the insulating resin layer is usually dried to 10 parts by mass or less relative to 100 parts by mass of the insulating resin layer. the following. The conditions for achieving drying vary depending on the amount of organic solvent in the varnish. For example, in the case of a varnish containing 30 to 60 parts by mass of an organic solvent with respect to 100 parts by mass of the varnish, it is dried under heating conditions at 50 to 160 ° C. 3 to 10 minutes.

[印刷配線板]
本實施形態之印刷配線板可藉由對於被稱做芯板基材之絕緣性樹脂層完全硬化而成的覆金屬箔疊層板使用作為堆疊材料之本實施形態之附設絕緣性樹脂層之銅箔而獲得。本實施形態由於使用在剛性高且和絕緣性樹脂層之黏合性優良的銅箔疊層有和銅箔之黏合性高且韌性高的絕緣性樹脂層而成之薄的附設絕緣性樹脂層之銅箔,故可不使用厚的支持基板(載板)而製造薄型印刷配線板。使用本實施形態之附設絕緣性樹脂層之銅箔而獲得之印刷配線板係薄型、形成有高密度的微細配線且外觀不良少。
[Printed wiring board]
The printed wiring board of this embodiment can be used as a stacking material of the copper foil with an insulating resin layer of the present embodiment by completely hardening an insulating resin layer called a core substrate base material. Foil. In this embodiment, a thin copper layer with an insulating resin layer is used, which is formed by laminating a copper foil having high rigidity and excellent adhesion to the insulating resin layer, and an insulating resin layer having high adhesion to the copper foil and high toughness. Foil, it is possible to manufacture a thin printed wiring board without using a thick supporting substrate (carrier plate). The printed wiring board obtained by using the copper foil with an insulating resin layer of this embodiment is thin, has fine wiring with high density, and has few appearance defects.

覆金屬箔疊層板的表面係利用通常使用的覆金屬箔疊層板之金屬箔及/或將金屬箔剝離後進行鍍敷等而獲得的導體層來形成導體電路。又,覆金屬箔疊層板之基材並無特別限制,主要為玻璃環氧樹脂基板、金屬基板、聚酯基板、聚醯亞胺基板、BT樹脂基板及熱硬化型聚苯醚基板。The surface of the metal foil-clad laminate is a conductor circuit formed by using a generally used metal foil of the metal foil-clad laminate and / or a conductor layer obtained by peeling the metal foil and then plating. The base material of the metal foil-clad laminate is not particularly limited, and is mainly a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a BT resin substrate, and a thermosetting polyphenylene ether substrate.

本實施形態中,堆疊係指對於覆金屬箔疊層板之表面的金屬箔及/或導體層疊層本實施形態之附設絕緣性樹脂層之銅箔中的絕緣性樹脂層。In this embodiment, the term "stacking" refers to an insulating resin layer in a copper foil provided with an insulating resin layer on the surface of a metal foil-clad laminated board and / or a conductor laminated layer.

通常,使用黏接薄膜等作為堆疊材料並使絕緣性樹脂層(樹脂組成物層)疊層於覆金屬箔疊層板時,獲得的印刷配線板之單面或雙面具有絕緣性樹脂層。雖然會對該絕緣性樹脂層形成導體層,但硬化後的絕緣性樹脂層之表面粗糙度低,故通常會利用包含除膠渣處理之粗糙化處理使其形成凹凸,然後使用無電解鍍敷及/或電解鍍敷來形成導體層。但是,實施過粗糙化處理的絕緣性樹脂層之表面,其樹脂組成物中之玻璃纖維等無機物會暴露(突出),表面則會粗糙。又,由於無機物會從絕緣性樹脂層脫落,而亦有在絕緣性樹脂層形成大型凹陷孔的問題。因此,不易在如此的絕緣性樹脂層之表面形成高密度的微細配線。又,還有在形成導孔(via hole)及/或通孔(through hole)等導通孔時,玻璃纖維等無機物容易殘留而對可靠性造成不良影響的問題。In general, when an insulating resin layer (resin composition layer) is laminated on a metal foil-clad laminate using an adhesive film or the like as a stacking material, an insulating resin layer is provided on one or both sides of the printed wiring board obtained. Although a conductive layer is formed on the insulating resin layer, the surface roughness of the hardened insulating resin layer is low. Therefore, it is generally roughened by a roughening treatment including a slag removal treatment, and then electroless plating is used. And / or electrolytic plating to form a conductor layer. However, on the surface of the insulating resin layer subjected to the roughening treatment, inorganic substances such as glass fibers in the resin composition are exposed (protruded), and the surface is roughened. In addition, there is a problem that large-scale recessed holes are formed in the insulating resin layer because inorganic substances may fall off from the insulating resin layer. Therefore, it is difficult to form high-density fine wiring on the surface of such an insulating resin layer. In addition, when via holes such as via holes and / or through holes are formed, inorganic substances such as glass fibers tend to remain and adversely affect reliability.

但是,使作為堆疊材料之本實施形態之附設絕緣性樹脂層之銅箔疊層於覆金屬箔疊層板的話,得到的印刷配線板之單面或雙面即具有銅箔。即使不施以鍍敷處理,仍可對銅箔直接形成電路圖案,故可形成高密度的微細配線。又,在製造印刷配線板或半導體元件搭載用基板時,即使在銅箔蝕刻後施以鍍敷處理,銅箔面仍會轉印到絕緣性樹脂層,故絕緣性樹脂層與鍍敷物之間的黏合性會改善。However, when a copper foil with an insulating resin layer as a stacking material is laminated on a metal-clad laminate, the obtained printed wiring board has copper foil on one or both sides. The circuit pattern can be directly formed on the copper foil even without a plating treatment, so high-density fine wiring can be formed. In addition, when manufacturing a printed wiring board or a substrate for mounting a semiconductor element, even if copper plating is applied after the copper foil is etched, the copper foil surface is transferred to the insulating resin layer. Therefore, between the insulating resin layer and the plated material The adhesion will be improved.

製造印刷配線板時,會因應需要為了將各導體層電性連接而實施導孔及/或通孔等開孔加工。實施此開孔加工時,雖然會在之後實施包含除膠渣處理之粗糙化處理,但在本實施形態,印刷配線板的表面受到和絕緣性樹脂層之黏合性優良的銅箔保護,故即使實施粗糙化處理,印刷配線板的表面仍不會粗糙。When manufacturing a printed wiring board, a hole such as a via hole and / or a through hole is applied to electrically connect the conductor layers as necessary. When this hole-cutting process is performed, although a roughening process including a desmearing process is performed later, in this embodiment, the surface of the printed wiring board is protected by a copper foil with excellent adhesion to the insulating resin layer. The surface of the printed wiring board is not roughened by performing the roughening treatment.

開孔加工通常係使用機械鑽孔機、二氧化碳雷射、UV雷射及YAG雷射等來實施。本實施形態由於印刷配線板的表面受到銅箔保護,故可增強這些鑽孔機或雷射的能量。因此,根據本實施形態,如圖1之示意圖所示,在開孔加工時可理想地去除從孔的表面暴露之玻璃纖維等無機物。Drilling is usually performed using a mechanical drill, carbon dioxide laser, UV laser, and YAG laser. In this embodiment, since the surface of the printed wiring board is protected by copper foil, the energy of these drills or lasers can be enhanced. Therefore, according to this embodiment, as shown in the schematic diagram of FIG. 1, inorganic substances such as glass fibers that are exposed from the surface of the hole can be ideally removed during the hole-cutting process.

另外,通常粗糙化處理係由膨潤步驟、表面粗糙化及膠渣溶解步驟、以及中和步驟構成。The roughening treatment generally includes a swelling step, a surface roughening and slag dissolving step, and a neutralization step.

膨潤步驟係藉由使用膨潤劑使絕緣性樹脂層的表面膨潤而實施。就膨潤劑而言,若為可改善絕緣性樹脂層的表面之潤濕性,並使絕緣性樹脂層的表面膨潤到在後續的表面粗糙化及膠渣溶解步驟中會促進氧化分解的程度者,則無特別限制。就膨潤劑之例而言,可列舉:鹼溶液、界面活性劑溶液等。The swelling step is performed by swelling the surface of the insulating resin layer with a swelling agent. As for the swelling agent, if it can improve the wettability of the surface of the insulating resin layer, and swell the surface of the insulating resin layer to the extent that it will promote oxidative decomposition in the subsequent surface roughening and slag dissolution steps , There are no special restrictions. Examples of the swelling agent include an alkali solution and a surfactant solution.

表面粗糙化及膠渣溶解步驟係使用氧化劑來實施。就氧化劑而言,可舉例如鹼性過錳酸鹽溶液等,就理想的具體例而言,可列舉:過錳酸鉀水溶液、過錳酸鈉水溶液等。該氧化劑處理被稱為濕式除膠渣,除了該濕式除膠渣之外,也可適當地組合電漿處理或UV處理等所為之乾式除膠渣、拋光輪等所為之機械拋光、噴砂等其他公知的粗糙化處理來實施。The surface roughening and slag dissolution steps are performed using an oxidizing agent. Examples of the oxidizing agent include an alkaline permanganate solution and the like. Specific examples include an aqueous potassium permanganate solution and an aqueous sodium permanganate solution. The oxidant treatment is called wet deslagging. In addition to the wet deslagging, mechanical polishing and sandblasting for dry deslagging and polishing wheels such as plasma treatment or UV treatment can also be appropriately combined. It is implemented by other well-known roughening processes.

中和步驟係以還原劑中和前述步驟所使用的氧化劑。就還原劑而言,可例舉胺系還原劑,就理想的具體例而言,可列舉:羥基胺硫酸鹽水溶液、乙二胺四乙酸水溶液、氮三乙酸水溶液等酸性水溶液。The neutralization step neutralizes the oxidizing agent used in the previous step with a reducing agent. Examples of the reducing agent include amine-based reducing agents, and specific examples include acidic aqueous solutions such as a hydroxylamine sulfate aqueous solution, an ethylenediaminetetraacetic acid aqueous solution, and a nitrogen triacetic acid aqueous solution.

本實施形態中,在設置導孔及/或通孔後、或對導孔及/或通孔內進行除膠渣處理後,為了將各導體層電性連接,宜進行金屬鍍敷處理。在本實施形態,即使施以金屬鍍敷處理,銅箔面仍會轉印到絕緣性樹脂層,故絕緣性樹脂層與金屬鍍敷物之間的黏合性會改善。In this embodiment, after the via hole and / or the via hole are provided, or after the slag removal treatment is performed on the via hole and / or the via hole, in order to electrically connect the conductor layers, a metal plating treatment is preferably performed. In this embodiment, even if a metal plating process is applied, the copper foil surface is transferred to the insulating resin layer, so the adhesion between the insulating resin layer and the metal plating is improved.

就金屬鍍敷處理之方法而言,並無特別限制,可適當地使用通常在製造多層印刷配線板時所使用的金屬鍍敷處理之方法。金屬鍍敷處理之方法及鍍敷所使用的藥液之種類並無特別限制,可適當地使用通常在製造多層印刷配線板時所使用的金屬鍍敷處理之方法及藥液。金屬鍍敷處理所使用的藥液也可為市售品。
就金屬鍍敷處理方法而言並無特別限制,可列舉例如:脫脂液所為之處理、微蝕刻(softetching)液所為之處理、酸清洗、預浸液所為之處理、催化液所為之處理、促進液所為之處理、化學銅液所為之處理、酸清洗及浸漬於硫酸銅溶液並流通電流之處理。
There is no particular limitation on the method of metal plating treatment, and a method of metal plating treatment generally used when manufacturing a multilayer printed wiring board can be appropriately used. The method of metal plating and the type of chemical solution used for the plating are not particularly limited, and the method and chemical solution of metal plating generally used in the manufacture of multilayer printed wiring boards can be suitably used. The chemical solution used for the metal plating process may be a commercially available product.
There is no particular limitation on the metal plating treatment method, and examples thereof include: treatment by degreasing solution, treatment by softetching solution, acid cleaning, treatment by prepreg solution, treatment by catalyst solution, promotion Treatment of liquid solution, treatment of chemical copper liquid, acid cleaning and treatment of immersion in copper sulfate solution and current flow.

又,使用半硬化狀態之附設絕緣性樹脂層之銅箔並使其堆疊時,通常可藉由對於半硬化狀態之絕緣性樹脂層實施熱處理等以使其完全硬化來獲得印刷配線板。本實施形態中,也可對於得到的印刷配線板進一步疊層另一本實施形態之附設絕緣性樹脂層之銅箔。When a copper foil with an insulating resin layer in a semi-hardened state is used and stacked, a printed wiring board can usually be obtained by subjecting the insulating resin layer in a semi-hardened state to heat treatment or the like to completely harden it. In this embodiment, another copper foil with an insulating resin layer in this embodiment may be further laminated on the obtained printed wiring board.

堆疊法中的疊層方法並無特別限制,可理想地使用真空加壓式層合機。此時,可對於本實施形態之附設絕緣性樹脂層之銅箔藉由橡膠等彈性體進行疊層。就層合條件而言,若為通常的印刷配線板之疊層所使用的條件,則無特別限制,例如在70~140℃之溫度、1~11kgf/cm2 之範圍的接觸壓力以及20hPa以下之環境減壓下實施。於層合步驟之後也可利用金屬板所為之熱壓製來實施已層合的黏接薄膜之平滑化。層合步驟及平滑化步驟可利用市售的真空加壓式層合機連續地實施。也可於層合步驟之後或平滑化步驟之後具有熱硬化步驟。藉由使用熱硬化步驟,可使絕緣性樹脂層完全地硬化。熱硬化條件取決於樹脂組成物所含的成分之種類等而不同,但通常硬化溫度為170~190℃及硬化時間為15~60分鐘。The lamination method in the stacking method is not particularly limited, and a vacuum pressure type laminator can be preferably used. In this case, the copper foil provided with an insulating resin layer in this embodiment can be laminated with an elastomer such as rubber. The lamination conditions are not particularly limited as long as they are conditions used for lamination of a general printed wiring board, for example, at a temperature of 70 to 140 ° C, a contact pressure in a range of 1 to 11 kgf / cm 2 and 20 hPa or less. It is carried out under reduced pressure. After the lamination step, the laminated adhesive film can be smoothed by hot pressing with a metal plate. The lamination step and the smoothing step can be performed continuously using a commercially available vacuum pressure laminator. It is also possible to have a heat-hardening step after the lamination step or after the smoothing step. By using the thermal curing step, the insulating resin layer can be completely cured. The thermal curing conditions differ depending on the types of components contained in the resin composition, etc., but usually the curing temperature is 170 to 190 ° C and the curing time is 15 to 60 minutes.

就對於本實施形態之印刷配線板的單面或雙面之銅箔形成電路圖案之方法而言,可列舉:半加成(semi-additive)法、全加成(full-additive)法、減去(subtractive)法等。其中,考慮形成微細配線圖案之觀點,半加成法較理想。Examples of the method for forming a circuit pattern on the single-sided or double-sided copper foil of the printed wiring board of this embodiment include a semi-additive method, a full-additive method, and a subtractive method. Subtractive method and so on. Among them, a semi-additive method is preferable in view of forming a fine wiring pattern.

就利用半加成法形成電路圖案之方法例而言,可例舉使用阻鍍劑選擇性地施以電解鍍敷(圖案電鍍),其後剝離阻鍍劑,並將整體予以適度地蝕刻來形成配線圖案之方法。利用半加成法來形成電路圖案係組合無電解鍍敷與電解鍍敷來實施,此時宜在無電解鍍敷之後及電解鍍敷之後分別實施乾燥。無電解鍍敷後之乾燥並無特別限制,例如宜在80~180℃實施10~120分鐘,電解鍍敷後之乾燥並無特別限制,例如宜在130~220℃實施10~120分鐘。鍍敷宜為銅鍍敷。As an example of a method for forming a circuit pattern by a semi-additive method, electrolytic plating (pattern plating) can be selectively applied using a plating resist, and thereafter, the plating resist is peeled off, and the whole is appropriately etched. Method for forming wiring pattern. The circuit pattern formed by the semi-additive method is implemented by combining electroless plating and electrolytic plating. At this time, it is preferable to perform drying after electroless plating and after electrolytic plating. Drying after electroless plating is not particularly limited. For example, it is preferably performed at 80 to 180 ° C for 10 to 120 minutes. Drying after electrolytic plating is not particularly limited. For example, it is preferably performed at 130 to 220 ° C for 10 to 120 minutes. The plating should be copper plating.

就利用減去法形成電路圖案之方法例而言,可例舉藉由使用抗蝕劑選擇性地去除導體層來形成配線圖案之方法。具體而言,例如可用下述方式實施。於溫度110±10℃、壓力0.50±0.02MPa之條件下,在銅箔之全面疊層貼附(層合)乾式薄膜光阻(日立化成製RD-1225(商品名))。然後,順著電路圖案進行曝光並實施遮蔽。其後,利用1%碳酸鈉水溶液對乾式薄膜光阻進行顯影處理,最後利用胺系光阻剝離液將乾式薄膜光阻剝離。藉此可對銅箔進行電路圖案化。As an example of a method of forming a circuit pattern by a subtractive method, a method of forming a wiring pattern by selectively removing a conductor layer using a resist may be mentioned. Specifically, it can be implemented in the following manner, for example. Under the conditions of a temperature of 110 ± 10 ° C and a pressure of 0.50 ± 0.02 MPa, a dry film photoresist (Laminated by Hitachi Chemical Co., Ltd. RD-1225 (trade name)) was laminated on the entire surface of the copper foil. Then, exposure and masking are performed along the circuit pattern. Thereafter, the dry film photoresist was developed using a 1% sodium carbonate aqueous solution, and finally, the dry film photoresist was peeled using an amine-based photoresist stripping solution. This allows the copper foil to be patterned.

本實施形態也可在印刷配線板上進一步疊層絕緣性樹脂層及/或導體層,並獲得多層印刷配線板。多層印刷配線板的內層也可具有電路基板。本實施形態之附設絕緣性樹脂層之銅箔的絕緣性樹脂層係構成多層印刷配線板之絕緣性樹脂層及導體層之一。In this embodiment, an insulating resin layer and / or a conductor layer may be further laminated on the printed wiring board to obtain a multilayer printed wiring board. The inner layer of the multilayer printed wiring board may have a circuit board. The insulating resin layer of the copper foil provided with an insulating resin layer in this embodiment is one of an insulating resin layer and a conductor layer constituting a multilayer printed wiring board.

疊層方法並無特別限制,可使用在一般的印刷配線板之疊層成形中通常使用的方法。就疊層方法而言,可列舉例如:多層壓製、多層真空壓製、層合機、真空層合機、高溫高壓(autoclave)成形機等。疊層時的溫度並無特別限制,例如在100~300℃之範圍內適當地選擇來實施,壓力並無特別限制,例如在0.1~100kgf/cm2 (約9.8kPa~約9.8MPa)之範圍內適當地選擇來實施,加熱時間並無特別限制,例如在30秒~5小時之範圍內適當地選擇來實施。又,也可因應需要例如在150~300℃之溫度範圍內實施後硬化並調整硬化度。The lamination method is not particularly limited, and a method generally used in general lamination molding of a printed wiring board can be used. Examples of the lamination method include a multilayer press, a multilayer vacuum press, a laminator, a vacuum laminator, an autoclave forming machine, and the like. The temperature at the time of lamination is not particularly limited. For example, it is appropriately selected and implemented in the range of 100 to 300 ° C. The pressure is not particularly limited. For example, it is in the range of 0.1 to 100 kgf / cm 2 (about 9.8 kPa to about 9.8 MPa). The heating time is appropriately selected and implemented, and for example, the heating time is not particularly limited. For example, the heating time is appropriately selected and implemented in a range of 30 seconds to 5 hours. Further, if necessary, post-hardening may be performed in a temperature range of 150 to 300 ° C. and the degree of hardening may be adjusted.

[半導體元件搭載用基板]
半導體元件搭載用基板例如藉由使本實施形態之附設絕緣性樹脂層之銅箔疊層於覆金屬箔疊層板並對得到的疊層體之表面或單面的銅箔進行遮蔽及圖案化而製得。遮蔽及圖案化可使用製造印刷配線板時所實施的公知之遮蔽及圖案化,並無特別限制,但宜利用前述減去法來形成電路圖案。電路圖案可僅形成於疊層體之單面也可形成於雙面。
[Semiconductor element mounting substrate]
For the substrate for mounting a semiconductor element, for example, a copper foil with an insulating resin layer according to this embodiment is laminated on a metal foil-clad laminate, and the surface or one side of the obtained copper foil is masked and patterned. And made. The masking and patterning may be performed using a known masking and patterning method used in the manufacture of a printed wiring board, and is not particularly limited, but it is preferable to use the aforementioned subtraction method to form a circuit pattern. The circuit pattern may be formed on only one side of the laminate or on both sides.

使用本實施形態之附設絕緣性樹脂層之銅箔而獲得之半導體元件搭載用基板係薄型、形成有高密度的微細配線且外觀不良少。
[實施例]
The substrate for mounting a semiconductor element obtained by using the copper foil provided with an insulating resin layer of this embodiment is thin, has fine wiring with high density, and has few appearance defects.
[Example]

雖然針對本實施形態之實施例進行說明,但本實施形態並不限於這些實施例。Although the examples of this embodiment will be described, this embodiment is not limited to these examples.

[1.銅箔之評價]
(1)算術平均粗糙度
利用形狀測定顯微鏡(雷射顯微鏡,KEYENCE股份有限公司製VK-X210(商品名))以對物透鏡倍率150倍(15吋螢幕上倍率:3000倍)拍攝銅箔面。然後,利用圖像處理求出拍攝而得的圖像之中隨機選出之長度90μm的直線上之高度分佈,並算出算術平均粗糙度(Ra)。
[1. Evaluation of copper foil]
(1) Arithmetic average roughness Using a shape measuring microscope (laser microscope, VK-X210 (trade name) manufactured by KEYENCE Co., Ltd.), the copper foil surface was photographed at an objective lens magnification of 150 times (15-inch screen magnification: 3000 times) . Then, the height distribution on a straight line with a length of 90 μm randomly selected among the captured images is obtained by image processing, and the arithmetic average roughness (Ra) is calculated.

[2.覆金屬箔疊層板之評價]
(1)成形性
對後述覆金屬箔疊層板進行蝕刻來去除銅箔。以目視確認得到的樹脂基板(絕緣性樹脂層)之表面,觀察到成形時所造成的裂縫破損或空隙、顯眼的斑紋或樹脂的不平均等時評價為「C」,此外則評價為「A」。
[2. Evaluation of metal foil-clad laminates]
(1) Moldability A metal foil-clad laminate described later is etched to remove copper foil. The surface of the obtained resin substrate (insulating resin layer) was visually confirmed and evaluated as "C" when cracks or voids, prominent streaks, or unevenness in resin were observed during molding, and the evaluation was "A"".

(2)搬運性試驗
對後述覆金屬箔疊層板進行蝕刻來去除銅箔。將得到的樹脂基板(絕緣性樹脂層)調整為100mm×50mm之矩形後,投入剝離作業線(EMINENTO式顯影蝕刻剝離作業線之剝離部分,壓力0.1MPa,東京化工機(股)製)進行水洗搬運,藉此確認是否有樹脂基板的破損。
樹脂基板破損、欠缺的部分為投入前之質量的1%以上時評價為「C」,比1%少時評價為「A」。
(2) Transportability test The metal foil-clad laminate described later is etched to remove copper foil. After the obtained resin substrate (insulating resin layer) was adjusted to a rectangle of 100 mm × 50 mm, the peeling part (the peeling part of the EMINENTO type development etching peeling part line, the pressure was 0.1 MPa, manufactured by Tokyo Chemical Industry Co., Ltd.) was washed It is conveyed to confirm whether the resin substrate is damaged.
When the resin substrate is damaged or missing, it is evaluated as "C" when it is 1% or more of the mass before the input, and when it is less than 1%, it is evaluated as "A".

又,比較例3及4係將得到的黏接薄膜之聚對苯二甲酸乙二酯薄膜剝離,並於雙面以接觸銅箔之氈化面的方式配置12μm厚的銅箔(三井金屬礦業(股)製3EC-III(商品名)),並於壓力30kgf/cm2 、溫度220℃實施120分鐘之成形,藉此獲得覆金屬箔疊層板。針對得到的覆金屬箔疊層板實施上述成形性及搬運性試驗。In Comparative Examples 3 and 4, the obtained polyethylene terephthalate film of the adhesive film was peeled off, and a copper foil of 12 μm thickness was disposed on both sides so as to contact the felted surface of the copper foil (Mitsui Metals 3EC-III (trade name) made by Co., Ltd.) was formed at a pressure of 30 kgf / cm 2 and a temperature of 220 ° C. for 120 minutes to obtain a metal foil-clad laminate. The obtained formability and transportability test were performed on the obtained metal-clad laminate.

(3)雷射加工試驗
對後述覆金屬箔疊層板以半蝕刻處理(三菱瓦斯化學(股)製Clean Etch(註冊商標)CPE-770(商品名))將銅的厚度從12μm蝕刻成5μm後,實施雷射前處理(Atotech Japan(股)製BONDFilm(註冊商標)LDD101(商品名))。對經雷射前處理後之疊層板使用印刷基板用二氧化碳雷射加工機(三菱電機(股)製ML605GTW3(H)-5200U(商品名),遮罩1.1mm)實施開口徑為φ60μm之開孔加工。其後,將開口部之剖面進行拋光後,使用SEM(掃描式電子顯微鏡,KEYENCE股份有限公司製VE-7800S(商品名))於倍率500倍觀察開口部之表面。由得到的SEM圖像尋找玻璃纖維從開口部之剖面突出之玻璃纖維,測定5次該玻璃纖維突出的部分之根著處到前端之距離並計算其平均值。平均值為5μm以下時評價為「A」,比5μm大時評價為「C」。
(3) Laser processing test The metal foil-clad laminate to be described later was subjected to a half-etching treatment (Clean Etch (registered trademark) CPE-770 (trade name) manufactured by Mitsubishi Gas Chemical Co., Ltd.), and the thickness of copper was etched from 12 μm to 5 μm. Then, a laser pre-treatment (BONDFilm (registered trademark) LDD101 (trade name) made by Atotech Japan) was performed. A carbon dioxide laser processing machine for printed circuit boards (ML605GTW3 (H) -5200U (trade name), mask 1.1 mm, manufactured by Mitsubishi Electric Corporation) was used for the laminated board after the laser pre-treatment. Hole processing. After that, the cross section of the opening was polished, and then the surface of the opening was observed at a magnification of 500 times using a SEM (scanning electron microscope, VE-7800S (trade name) manufactured by KEYENCE Corporation). The obtained SEM image was used to find the glass fiber protruding from the cross section of the opening, and the distance from the root to the tip of the glass fiber protruding portion was measured 5 times, and the average value was calculated. When the average value was 5 μm or less, it was evaluated as “A”, and when it was larger than 5 μm, it was evaluated as “C”.

又,比較例3及4係對得到的層合基板(未實施除膠渣處理)使用印刷基板用二氧化碳雷射加工機(三菱電機(股)製ML605GTW3(H)-5200U(商品名),遮罩1.1mm)實施開口徑為φ80μm之盲導孔(開孔)加工。其後和上述雷射加工試驗同樣地進行,算出玻璃纖維突出的部分之根著處到前端之距離的平均值並進行評價。In Comparative Examples 3 and 4, the obtained laminated substrates (without slag removal treatment) were used with a carbon dioxide laser processing machine for printed substrates (ML605GTW3 (H) -5200U (trade name) manufactured by Mitsubishi Electric Corporation). The cover (1.1 mm) is processed with a blind guide hole (opening) having an opening diameter of φ80 μm. Thereafter, it was performed in the same manner as the laser processing test described above, and the average value of the distance from the root to the tip of the protruding portion of the glass fiber was calculated and evaluated.

(4)除膠渣處理後之外觀
針對比較例3及4所記載之層合基板實施除膠渣處理。除膠渣處理係以65℃條件浸入除膠渣用膨潤液(奧野製藥工業(股)製PTH-B103(商品名))5分鐘使其膨潤後,以80℃條件浸入除膠渣處理液(PTH1200(商品名)及PTH1200NA(商品名),奧野製藥工業(股)製)8分鐘,最後以45℃條件浸入除膠渣用中和液(奧野製藥工業(股)製PTH-B303(商品名))5分鐘來實施。其後,確認除膠渣處理後之層合基板的表面狀態,均勻的表面形狀時評價為「A」,不均勻的表面形狀、觀察到玻璃纖維脫落或玻璃纖維暴露在表面時評價為「C」。
(4) Appearance after deslagging treatment The deslagging treatment was performed on the laminated substrates described in Comparative Examples 3 and 4. The slag removal treatment is immersed in a swelling liquid for removing slag (PTH-B103 (trade name) manufactured by Okuno Pharmaceutical Industry Co., Ltd.) at 65 ° C for 5 minutes, and then swelled at 80 ° C. PTH1200 (commercial name) and PTH1200NA (commercial name), Okano Pharmaceutical Industry Co., Ltd. for 8 minutes, and finally immersed in a neutralizing solution for removing rubber residue at 45 ° C (Okuno Pharmaceutical Industry Co., Ltd. PTH-B303 (trade name) )) 5 minutes to implement. Thereafter, the surface state of the laminated substrate after the slag removal treatment was confirmed, and the evaluation was "A" when the surface was uniform, and the evaluation was evaluated as "C" when the uneven surface shape was observed and the glass fibers were peeled off or the glass fibers were exposed on the surface. ".

(5)剝離強度測定
使用後述覆金屬箔疊層板之試驗片(30mm×150mm×0.8mm厚),依據JIS C6481所記載之試驗方法(5.7 剝離強度),測定3次已利用塗佈棒塗佈於銅箔之絕緣性樹脂層與該銅箔之剝離強度(peeling strength)並求出平均值(kN/m)。
又,同樣地,使用比較例3及4所記載之已施以鍍敷處理之層合基板,測定3次銅鍍敷層與絕緣性樹脂層之剝離強度(peeling strength)並求出平均值(kN/m)。
從得到的平均值,根據下述基準評價剝離強度。
A:0.6kN/m以上
B:0.4kN/m以上且未達0.6kN/m
C:未達0.4kN/m
(5) Peel strength measurement A test piece (30 mm x 150 mm x 0.8 mm thick) of a metal foil-clad laminate described later was used, and the measurement was performed three times using a coating bar according to the test method (5.7 Peel strength) described in JIS C6481. The average peeling strength (kN / m) of the insulating resin layer provided on the copper foil and the peeling strength of the copper foil was calculated.
In the same manner, using the laminated substrates described in Comparative Examples 3 and 4 which had been subjected to plating treatment, the peeling strength of the copper plating layer and the insulating resin layer was measured three times, and the average value was determined ( kN / m).
From the obtained average value, the peel strength was evaluated according to the following criteria.
A: 0.6kN / m or more
B: 0.4kN / m or more and less than 0.6kN / m
C: less than 0.4kN / m

[3.樹脂組成物及附設絕緣性樹脂層之銅箔之製作]
(α-萘酚芳烷基型氰酸酯化合物之合成)
事先利用鹽水(brine)將安裝有溫度計、攪拌器、滴加漏斗及回流冷卻器之反應器冷卻至0~5℃,並將氯化氰7.47g(0.122mol)、35%鹽酸9.75g(0.0935mol)、水76ml及二氯甲烷44ml進料於其中。然後,保持該反應器內之溫度在-5~+5℃、pH為1以下,邊攪拌邊利用滴加漏斗歷時1小時滴加已將下式(4)表示之芳烷基α-萘酚(新日鐵化學(股)製SN485(商品名),OH基當量:214g/eq.,軟化點:86℃)20g(0.0935mol)及三乙胺14.16g(0.14mol)溶解於二氯甲烷92ml而成的溶液。滴加結束後,再歷時15分鐘滴加三乙胺4.72g(0.047mol)。
[3. Production of resin composition and copper foil with insulating resin layer]
(Synthesis of α-naphthol aralkyl cyanate compound)
The reactor equipped with a thermometer, a stirrer, a dropping funnel and a reflux cooler was cooled to 0 to 5 ° C with brine in advance, and 7.47 g (0.122 mol) of cyanogen chloride and 9.75 g (0.0935 of 35% hydrochloric acid) were cooled. mol), 76 ml of water and 44 ml of dichloromethane were fed. Then, the temperature in the reactor was maintained at -5 to + 5 ° C and the pH was 1 or less, and the aralkyl α-naphthol represented by the following formula (4) was added dropwise using a dropping funnel over 1 hour while stirring. (SN485 (trade name) manufactured by Nippon Steel Chemical Co., Ltd., OH group equivalent: 214 g / eq., Softening point: 86 ° C) 20 g (0.0935 mol) and triethylamine 14.16 g (0.14 mol) were dissolved in dichloromethane 92ml solution. After the dropwise addition was completed, 4.72 g (0.047 mol) of triethylamine was added dropwise over a further 15 minutes.

[化4]
[Chemical 4]

式(4)中,n4 係就平均值而言落在3~4之範圍內。In the formula (4), n 4 falls within a range of 3 to 4 as an average value.

滴加結束後,在相同溫度攪拌15分鐘後,將反應液進行分液並分離提取有機層。將得到的有機層以水100ml清洗2次後,利用蒸發器於減壓下餾去二氯甲烷,最後於80℃使其濃縮乾固1小時,藉此獲得下式(5)表示之α-萘酚芳烷基型氰酸酯化合物23.5g。After completion of the dropwise addition, after stirring at the same temperature for 15 minutes, the reaction solution was separated, and the organic layer was separated and extracted. After the obtained organic layer was washed twice with 100 ml of water, dichloromethane was distilled off under reduced pressure using an evaporator, and finally concentrated and dried at 80 ° C. for 1 hour, thereby obtaining α- represented by the following formula (5): 23.5 g of naphthol aralkyl cyanate compound.

[化5]
[Chemical 5]

式(5)中,n5 係就平均值而言落在3~4之範圍內。In the formula (5), n 5 falls within a range of 3 to 4 as an average value.

[實施例1]
摻合上述式(5)表示之α-萘酚芳烷基型氰酸酯化合物50質量份、雙(3-乙基-5-甲基-4-馬來醯亞胺基苯基)甲烷(K・I化成(股)製BMI-70(商品名))10質量份及聚氧伸萘基型環氧樹脂(DIC(股)製EXA-7311(商品名),環氧當量:277g/eq.)40質量份並使其溶解於甲乙酮。然後,藉由在該溶液中混合濕潤分散劑(BYK(股)製Disperbyk(註冊商標)-161)3質量份、球狀熔融二氧化矽(平均粒徑:0.4~0.6μm,Admatechs(股)製SC2050-MB(商品名))250質量份、辛酸鋅0.02質量份、丙烯腈丁二烯橡膠(JSR(股)製N220S(商品名))5質量份、經輾磨之纖維(Central Glass(股)製EFDE50-31(商品名),平均纖維長:50μm,纖維徑:6μm)21質量份而製得清漆。以甲乙酮稀釋得到的清漆,並利用塗佈棒塗佈於350mm×250mm×12μm厚之銅箔(算術平均粗糙度(Ra):1.0~1.5μm,三井金屬礦業(股)製3EC-III(商品名))之氈化面側,於130℃加熱乾燥5分鐘,藉此獲得絕緣性樹脂層之厚度為40μm之附設絕緣性樹脂層之銅箔。
[Example 1]
50 parts by mass of an α-naphthol aralkyl cyanate compound represented by the above formula (5), and bis (3-ethyl-5-methyl-4-maleiminophenyl) methane ( 10 parts by mass of BMI-70 (trade name) by K.I. Kasei Co., Ltd. and polyoxynaphthalene-based epoxy resin (EXA-7311 (trade name) by DIC (share)), epoxy equivalent: 277 g / eq .) 40 parts by mass are dissolved in methyl ethyl ketone. Then, 3 parts by mass of a wetting and dispersing agent (Disperbyk (registered trademark) -161 made by BYK), spherical fused silica (average particle diameter: 0.4 to 0.6 μm, Admatechs (shares)) 250 parts by mass of SC2050-MB (trade name)), 0.02 parts by mass of zinc octoate, 5 parts by mass of acrylonitrile butadiene rubber (N220S (trade name) manufactured by JSR) and milled fibers (Central Glass ( EFDE50-31 (trade name) made of strands, average fiber length: 50 μm, fiber diameter: 6 μm), 21 parts by mass of varnish. The varnish obtained by diluting with methyl ethyl ketone was applied to a copper foil having a thickness of 350 mm × 250 mm × 12 μm using a coating rod (arithmetic average roughness (Ra): 1.0 to 1.5 μm, 3EC-III (commodity made by Mitsui Metals Mining Corporation) Name)) was heated and dried at 130 ° C. for 5 minutes to obtain a copper foil with an insulating resin layer having an insulating resin layer having a thickness of 40 μm.

將12μm厚之銅箔(三井金屬礦業(股)製3EC-III(商品名))以接觸其氈化面的方式配置於得到的附設絕緣性樹脂層之銅箔之絕緣性樹脂層面側,並以壓力30kgf/cm2 、溫度220℃實施120分鐘之成形,藉此獲得覆金屬箔疊層板。針對得到的覆金屬箔疊層板實施評價,結果如表1所示。又,開口部表面之SEM圖像如圖2所示。A 12 μm-thick copper foil (3EC-III (trade name) manufactured by Mitsui Metals Mining Co., Ltd.) was placed on the insulating resin layer side of the obtained copper foil with an insulating resin layer so as to contact the felted surface, and Forming was performed at a pressure of 30 kgf / cm 2 and a temperature of 220 ° C. for 120 minutes, thereby obtaining a metal foil-clad laminate. The obtained metal-clad laminate was evaluated, and the results are shown in Table 1. The SEM image of the surface of the opening is shown in FIG. 2.

[實施例2]
將經輾磨之纖維(Central Glass(股)製EFDE50-31(商品名),平均纖維長:50μm,纖維徑:6μm)從21質量份變更為63質量份,除此之外,和實施例1同樣地進行,獲得絕緣性樹脂層之厚度為40μm之附設絕緣性樹脂層之銅箔。其後,和實施例1同樣地進行,獲得覆金屬箔疊層板。針對得到的覆金屬箔疊層板實施評價,其結果如表1所示。
[Example 2]
The milled fiber (EFDE50-31 (trade name) manufactured by Central Glass (trade name), average fiber length: 50 μm, fiber diameter: 6 μm) was changed from 21 parts by mass to 63 parts by mass, and the examples were also used. 1 In the same manner, a copper foil with an insulating resin layer having a thickness of 40 μm of the insulating resin layer was obtained. Then, it carried out similarly to Example 1, and obtained the metal foil-clad laminated board. Evaluation was performed on the obtained metal-clad laminate, and the results are shown in Table 1.

[實施例3]
將經輾磨之纖維(Central Glass(股)製EFDE50-31(商品名),平均纖維長:50μm,纖維徑:6μm)從21質量份變更為100質量份,除此之外,和實施例1同樣地進行,獲得絕緣性樹脂層之厚度為40μm之附設絕緣性樹脂層之銅箔。其後,和實施例1同樣地進行,獲得覆金屬箔疊層板。針對得到的覆金屬箔疊層板實施評價,其結果如表1所示。
[Example 3]
The milled fiber (EFDE50-31 (trade name) manufactured by Central Glass (stock), average fiber length: 50 μm, fiber diameter: 6 μm) was changed from 21 parts by mass to 100 parts by mass, and the examples were also used. 1 In the same manner, a copper foil with an insulating resin layer having a thickness of 40 μm of the insulating resin layer was obtained. Then, it carried out similarly to Example 1, and obtained the metal foil-clad laminated board. Evaluation was performed on the obtained metal-clad laminate, and the results are shown in Table 1.

[實施例4]
將經輾磨之纖維(Central Glass(股)製EFDE50-31(商品名),平均纖維長:50μm,纖維徑:6μm)從21質量份變更為300質量份,除此之外,和實施例1同樣地進行,獲得絕緣性樹脂層之厚度為40μm之附設絕緣性樹脂層之銅箔。其後,和實施例1同樣地進行,獲得覆金屬箔疊層板。針對得到的覆金屬箔疊層板實施評價,其結果如表1所示。
[Example 4]
The milled fiber (EFDE50-31 (trade name), manufactured by Central Glass (stock), average fiber length: 50 μm, fiber diameter: 6 μm) was changed from 21 parts by mass to 300 parts by mass, and the examples were also used. 1 In the same manner, a copper foil with an insulating resin layer having a thickness of 40 μm of the insulating resin layer was obtained. Then, it carried out similarly to Example 1, and obtained the metal foil-clad laminated board. Evaluation was performed on the obtained metal-clad laminate, and the results are shown in Table 1.

[實施例5]
將絕緣性樹脂層之厚度從40μm變更為15μm,除此之外,和實施例1同樣地進行,獲得絕緣性樹脂層之厚度為15μm之附設絕緣性樹脂層之銅箔。其後,和實施例1同樣地進行,獲得覆金屬箔疊層板。針對得到的覆金屬箔疊層板實施評價,其結果如表1所示。
另外,由於絕緣性樹脂層之厚度薄而無法進行覆金屬箔疊層板之蝕刻,故未實施搬運性試驗。
[Example 5]
Except changing the thickness of the insulating resin layer from 40 μm to 15 μm, the same procedure as in Example 1 was performed to obtain a copper foil with an insulating resin layer having a thickness of 15 μm of the insulating resin layer. Then, it carried out similarly to Example 1, and obtained the metal foil-clad laminated board. Evaluation was performed on the obtained metal-clad laminate, and the results are shown in Table 1.
In addition, since the thickness of the insulating resin layer is too thin to etch the metal-clad laminate, the transportability test was not performed.

[實施例6]
將實施例1得到的清漆以甲乙酮稀釋,並利用塗佈棒塗佈於350mm×250mm×12μm厚之銅箔(算術平均粗糙度(Ra):0.5μm,三井金屬礦業(股)公司製3EC-M2S-VLP(商品名))之氈化面側,於130℃加熱乾燥5分鐘,藉此獲得絕緣性樹脂層之厚度為40μm之附設絕緣性樹脂層之銅箔。其後,和實施例1同樣地進行,使用12μm厚之銅箔(三井金屬礦業(股)製3EC-III(商品名))來獲得覆金屬箔疊層板。針對得到的覆金屬箔疊層板實施評價,其結果如表1所示。
[Example 6]
The varnish obtained in Example 1 was diluted with methyl ethyl ketone and applied to a copper foil having a thickness of 350 mm × 250 mm × 12 μm using a coating rod (arithmetic average roughness (Ra): 0.5 μm, manufactured by Mitsui Metals Mining Corporation) M2S-VLP (trade name)) was heated and dried at 130 ° C. for 5 minutes to obtain a copper foil with an insulating resin layer having a thickness of 40 μm and an insulating resin layer. Then, it carried out similarly to Example 1, and used the 12 micrometer-thick copper foil (3EC-III (trade name) by Mitsui Metals Mining Co., Ltd.) to obtain a metal foil-clad laminate. Evaluation was performed on the obtained metal-clad laminate, and the results are shown in Table 1.

[實施例7]
使用經輾磨之纖維(Central Glass(股)製EFH30-01(商品名),平均纖維長:30μm,纖維徑:11μm)替換經輾磨之纖維(Central Glass(股)製EFDE50-31(商品名),平均纖維長:50μm,纖維徑:6μm),除此之外,和實施例1同樣地進行,獲得絕緣性樹脂層之厚度為40μm之附設絕緣性樹脂層之銅箔。其後,和實施例1同樣地進行,獲得覆金屬箔疊層板。針對得到的覆金屬箔疊層板實施評價,其結果如表1所示。
[Example 7]
Milled fiber (EFH30-01 (trade name), manufactured by Central Glass (stock), average fiber length: 30 μm, fiber diameter: 11 μm) was used instead of milled fiber (EFDE50-31, manufactured by Central Glass (stock)) Name), average fiber length: 50 μm, fiber diameter: 6 μm), except that the same procedure as in Example 1 was performed to obtain a copper foil with an insulating resin layer having an insulating resin layer thickness of 40 μm. Then, it carried out similarly to Example 1, and obtained the metal foil-clad laminated board. Evaluation was performed on the obtained metal-clad laminate, and the results are shown in Table 1.

[實施例8]
使用經輾磨之纖維(Central Glass(股)製EFH150-31(商品名),平均纖維長:150μm,纖維徑:11μm)替換經輾磨之纖維(Central Glass(股)製EFDE50-31(商品名),平均纖維長:50μm,纖維徑:6μm),除此之外,和實施例1同樣地進行,獲得絕緣性樹脂層之厚度為40μm之附設絕緣性樹脂層之銅箔。其後,和實施例1同樣地進行,獲得覆金屬箔疊層板。針對得到的覆金屬箔疊層板實施評價,其結果如表1所示。
[Example 8]
Milled fiber (EFH150-31 (trade name), manufactured by Central Glass (stock), average fiber length: 150 μm, fiber diameter: 11 μm) was used instead of milled fiber (EFDE50-31, manufactured by Central Glass (stock)) Name), average fiber length: 50 μm, fiber diameter: 6 μm), except that the same procedure as in Example 1 was performed to obtain a copper foil with an insulating resin layer having an insulating resin layer thickness of 40 μm. Then, it carried out similarly to Example 1, and obtained the metal foil-clad laminated board. Evaluation was performed on the obtained metal-clad laminate, and the results are shown in Table 1.

[比較例1]
未摻合經輾磨之纖維(Central Glass(股)製EFDE50-31(商品名),平均纖維長:50μm,纖維徑:6μm),除此之外,和實施例1同樣地進行,獲得絕緣性樹脂層之厚度為40μm之附設絕緣性樹脂層之銅箔。針對得到的覆金屬箔疊層板實施評價,其結果如表1所示。另外,在雷射加工性之評價中,由於比較例1未摻合經輾磨之纖維,故未觀察到從開口部之剖面突出之玻璃纖維。
[Comparative Example 1]
Except that the milled fiber (EFDE50-31 (trade name) manufactured by Central Glass, average fiber length: 50 μm, fiber diameter: 6 μm) was not blended, it was conducted in the same manner as in Example 1 to obtain insulation. The thickness of the insulating resin layer was 40 μm, and the copper foil was provided with an insulating resin layer. Evaluation was performed on the obtained metal-clad laminate, and the results are shown in Table 1. In addition, in the evaluation of laser processability, since the milled fiber was not blended in Comparative Example 1, no glass fiber protruding from the cross section of the opening was observed.

[比較例2]
將經輾磨之纖維(Central Glass(股)製EFDE50-31(商品名),平均纖維長:50μm,纖維徑:6μm)從21質量份變更為500質量份,除此之外,和實施例1同樣地進行,製得清漆。以甲乙酮稀釋得到的清漆,並嘗試利用塗佈棒塗佈於聚對苯二甲酸乙二酯薄膜(厚度:38μm),但無法塗佈而無法獲得黏接薄膜。
[Comparative Example 2]
The milled fiber (EFDE50-31 (trade name), manufactured by Central Glass (stock), average fiber length: 50 μm, fiber diameter: 6 μm) was changed from 21 parts by mass to 500 parts by mass, and the examples were also used. 1 was performed in the same manner to obtain a varnish. The varnish obtained by diluting with methyl ethyl ketone was applied to a polyethylene terephthalate film (thickness: 38 μm) using a coating rod. However, the varnish could not be applied and an adhesive film could not be obtained.

[比較例3]
將經輾磨之纖維(Central Glass(股)製EFDE50-31(商品名),平均纖維長:50μm,纖維徑:6μm)從21質量份變更為63質量份,除此之外,和實施例1同樣地進行,製得清漆。以甲乙酮稀釋此清漆,並利用塗佈棒塗佈於聚對苯二甲酸乙二酯薄膜(厚度:38μm),於130℃加熱乾燥5分鐘,藉此獲得由樹脂組成物構成的層之厚度為40μm之黏接薄膜。針對得到的黏接薄膜實施搬運性試驗,其結果如表1所示。
[Comparative Example 3]
The milled fiber (EFDE50-31 (trade name) manufactured by Central Glass (trade name), average fiber length: 50 μm, fiber diameter: 6 μm) was changed from 21 parts by mass to 63 parts by mass, and the examples were also used. 1 was performed in the same manner to obtain a varnish. This varnish was diluted with methyl ethyl ketone, and applied to a polyethylene terephthalate film (thickness: 38 μm) with a coating rod, and dried by heating at 130 ° C. for 5 minutes, thereby obtaining a thickness of a layer composed of a resin composition as 40 μm adhesive film. A transportability test was performed on the obtained adhesive film, and the results are shown in Table 1.

然後,利用MEC(股)製CZ-8100(商品名)對覆銅箔疊層板(三菱瓦斯化學(股)製CCL(註冊商標)-HL832NSF(商品名),絕緣性樹脂層之厚度:0.1mm,銅箔之厚度:12μm)之雙面進行粗糙化處理,獲得覆銅箔疊層板之粗糙化處理品。將前述得到的黏接薄膜以由樹脂組成物構成的層與銅箔接觸的方式配置於該覆銅箔疊層板之粗糙化處理品的兩側,並使用批式真空加壓層合機(Nichigo-Morton(股)製CVP-600(商品名))進行層合,獲得疊層體。層合係藉由於真空下、溫度120℃、壓力8kgf/cm2 進行壓製而實施。從得到的疊層體之雙面剝離聚對苯二甲酸乙二酯薄膜。其後,以於溫度80℃30分鐘,然後於溫度180℃30分鐘之硬化條件,使由樹脂組成物構成的層硬化來形成絕緣性樹脂層,獲得於覆銅箔疊層板之雙面具有絕緣性樹脂層之層合基板。針對得到的層合基板實施雷射加工試驗,其結果如表1所示。又,開口部表面的SEM圖像如圖3所示。Next, a copper-clad laminate (CCL (registered trademark)-HL832NSF (trade name), manufactured by Mitsubishi Gas Chemical Co., Ltd.) was used with a CZ-8100 (trade name) manufactured by MEC (stock), and the thickness of the insulating resin layer was 0.1. mm, copper foil thickness: 12 μm) roughened on both sides to obtain a roughened copper foil-clad laminate. The adhesive film obtained above was placed on both sides of the roughened product of the copper-clad laminate so that the layer composed of the resin composition was in contact with the copper foil, and a batch vacuum pressure laminator was used ( CVP-600 (trade name) manufactured by Nichigo-Morton (stock) was laminated to obtain a laminate. The lamination system was carried out by pressing under a vacuum at a temperature of 120 ° C and a pressure of 8 kgf / cm 2 . The polyethylene terephthalate film was peeled from both sides of the obtained laminate. Thereafter, a layer made of a resin composition was hardened under a hardening condition at a temperature of 80 ° C. for 30 minutes and then at a temperature of 180 ° C. for 30 minutes to form an insulating resin layer. Laminated substrate of insulating resin layer. A laser processing test was performed on the obtained laminated substrate, and the results are shown in Table 1. The SEM image of the surface of the opening is shown in FIG. 3.

針對利用雷射加工施以開孔加工後之層合基板實施除膠渣處理,並確認處理後之外觀。其結果如表1所示。由於在雙面並無銅箔,故觀察到玻璃纖維的突出較多而表面粗糙。The laminated substrate subjected to the hole-opening processing by laser processing is subjected to a slag removing treatment, and the appearance after the processing is confirmed. The results are shown in Table 1. Since there are no copper foils on both sides, the glass fiber was observed to protrude a lot and the surface was rough.

針對得到的除膠渣處理後之層合基板施以銅鍍敷,形成厚度18μm之銅鍍敷層。使用已施以鍍敷處理之層合基板,測定剝離強度。其結果如表1所示。The obtained laminated substrate after the desmearing treatment was subjected to copper plating to form a copper plating layer having a thickness of 18 μm. The laminated substrate subjected to the plating treatment was used to measure the peel strength. The results are shown in Table 1.

[比較例4]
未摻合經輾磨之纖維(Central Glass(股)製EFDE50-31(商品名),平均纖維長:50μm,纖維徑:6μm),除此之外,和比較例3同樣地進行,獲得由樹脂組成物構成的層之厚度為40μm之黏接薄膜、於覆銅箔疊層板之雙面具有絕緣性樹脂層之層合基板、利用雷射加工施以開孔加工後之層合基板、及除膠渣處理後之層合基板。針對它們和比較例3同樣地進行並實施評價,結果如表1所示。另外,在雷射加工性及除膠渣處理後之外觀之評價中,比較例4由於未摻合經輾磨之纖維,故並未觀察到從開口部之剖面突出之玻璃纖維,表面形狀亦為均勻。
[Comparative Example 4]
Except that the milled fiber was not blended (EFDE50-31 (trade name) manufactured by Central Glass, average fiber length: 50 μm, fiber diameter: 6 μm), the same procedure as in Comparative Example 3 was performed. An adhesive film having a thickness of 40 μm of a layer composed of a resin composition, a laminated substrate having an insulating resin layer on both sides of a copper-clad laminated board, a laminated substrate subjected to hole processing by laser processing, And laminated substrate after deslagging treatment. These were evaluated in the same manner as in Comparative Example 3, and the results are shown in Table 1. In addition, in the evaluation of the laser processability and the appearance after the slag removal treatment, in Comparative Example 4, since the milled fiber was not blended, the glass fiber protruding from the cross section of the opening was not observed, and the surface shape was also not observed. For uniform.

[比較例5]
於預浸體(三菱瓦斯化學(股)製GHPL-830NSF(商品名),絕緣性樹脂層之厚度:40μm)的兩側配置12μm厚之銅箔(三井金屬礦業(股)製3EC-III(商品名)),於壓力30kgf/cm2 、溫度220℃實施120分鐘之成形,藉此獲得覆金屬箔疊層板。針對得到的覆金屬箔疊層板實施搬運性試驗及雷射加工試驗之評價,其結果如表1所示。
[Comparative Example 5]
On both sides of the prepreg (GHPL-830NSF (trade name) manufactured by Mitsubishi Gas Chemical Co., Ltd., thickness of the insulating resin layer: 40 μm), a copper foil of 12 μm thickness (3EC-III (manufactured by Mitsui Metals Mining Co., Ltd.) Trade name)), forming at a pressure of 30 kgf / cm 2 and a temperature of 220 ° C. for 120 minutes, thereby obtaining a metal foil-clad laminate. The evaluation of the transportability test and the laser processing test was performed on the obtained metal-clad laminate, and the results are shown in Table 1.

[比較例6]
將經輾磨之纖維(Central Glass(股)製EFDE50-31(商品名),平均纖維長:50μm,纖維徑:6μm)從21質量份變更為63質量份,且未摻合球狀熔融二氧化矽(Admatechs(股)製SC2050MB(商品名)),除此之外,和實施例1同樣地進行,製得清漆。和實施例1同樣地進行,以甲乙酮稀釋得到的清漆,並利用塗佈棒塗佈於350mm×250mm×12μm厚之銅箔(三井金屬礦業(股)製3EC-III(商品名))的氈化面側。其後,於130℃加熱乾燥5分鐘,欲藉此製造附設絕緣性樹脂層之銅箔,但絕緣性樹脂層無法成型而無法製造附設絕緣性樹脂層之銅箔。
[Comparative Example 6]
The milled fiber (EFDE50-31 (trade name) manufactured by Central Glass (stock), average fiber length: 50 μm, fiber diameter: 6 μm) was changed from 21 parts by mass to 63 parts by mass, and the spherical fusion A varnish was produced in the same manner as in Example 1 except that silicon oxide (SC2050MB (trade name) manufactured by Admatechs) was used. The varnish obtained by diluting with methyl ethyl ketone was carried out in the same manner as in Example 1. Then, a 350 mm × 250 mm × 12 μm-thick copper foil (3EC-III (trade name) manufactured by Mitsui Metals Mining Co., Ltd.) was coated with a coating rod.化 面面。 Face side. Thereafter, it was heated and dried at 130 ° C. for 5 minutes to manufacture a copper foil with an insulating resin layer, but the insulating resin layer could not be molded, and a copper foil with an insulating resin layer could not be manufactured.

[比較例7]
以甲乙酮稀釋實施例1得到的清漆,並利用塗佈棒塗佈於350mm×250mm×12μm厚之銅箔(算術平均粗糙度(Ra):0.04μm,JX金屬(股)製GHT5-HA(商品名))的氈化面側,於130℃加熱乾燥5分鐘,藉此獲得絕緣性樹脂層之厚度為40μm之附設絕緣性樹脂層之銅箔。其後,和實施例1同樣地進行,使用12μm厚之銅箔(三井金屬礦業(股)製3EC-III(商品名)),獲得覆金屬箔疊層板。針對得到的覆金屬箔疊層板實施評價,其結果如表1所示。
[Comparative Example 7]
The varnish obtained in Example 1 was diluted with methyl ethyl ketone, and applied to a copper foil having a thickness of 350 mm × 250 mm × 12 μm using a coating rod (arithmetic average roughness (Ra): 0.04 μm, GHT5-HA (commercial product made by JX Metal Co., Ltd.) Name)) The heated side of the felt surface was heated and dried at 130 ° C. for 5 minutes to obtain a copper foil with an insulating resin layer having an insulating resin layer thickness of 40 μm. Then, it carried out similarly to Example 1, and used the 12 micrometer-thick copper foil (3EC-III (trade name) by Mitsui Metals Mining Co., Ltd.), and obtained the metal foil-clad laminate. Evaluation was performed on the obtained metal-clad laminate, and the results are shown in Table 1.

[比較例8]
以甲乙酮稀釋實施例1得到的清漆,並利用塗佈棒塗佈於350mm×250mm×70μm厚之銅箔(算術平均粗糙度(Ra):4μm,Furukawa Circuit Foil Taiwan(FCFT)製GY-MP(商品名))的氈化面側,於130℃加熱乾燥5分鐘,藉此獲得絕緣性樹脂層之厚度為40μm之附設絕緣性樹脂層之銅箔。其後,和實施例1同樣地進行,使用12μm厚之銅箔(三井金屬礦業(股)製3EC-III(商品名)),獲得覆金屬箔疊層板。針對得到的覆金屬箔疊層板實施評價,其結果如表1所示。
[Comparative Example 8]
The varnish obtained in Example 1 was diluted with methyl ethyl ketone and applied to a 350 mm × 250 mm × 70 μm-thick copper foil (arithmetic average roughness (Ra): 4 μm, GY-MP (manufactured by Furukawa Circuit Foil Taiwan (FCFT)) using a coating rod. Product name)) was heated and dried at 130 ° C. for 5 minutes to obtain a copper foil with an insulating resin layer having an insulating resin layer thickness of 40 μm. Then, it carried out similarly to Example 1, and used the 12 micrometer-thick copper foil (3EC-III (trade name) by Mitsui Metals Mining Co., Ltd.), and obtained the metal foil-clad laminate. Evaluation was performed on the obtained metal-clad laminate, and the results are shown in Table 1.

[表1]
[Table 1]

本申請案係基於2017年12月14日提申之日本專利申請案(日本特願2017-239467),並將其內容援用於此作為參照。
[產業上利用性]
This application is based on a Japanese patent application filed on December 14, 2017 (Japanese Patent Application No. 2017-239467), and the contents thereof are incorporated herein by reference.
[Industrial availability]

根據本發明可理想地獲得形成有高密度的微細配線且形成有良好的導通孔之薄型印刷配線板及半導體元件搭載用基板。According to the present invention, it is possible to ideally obtain a thin printed wiring board having a high density of fine wirings and a good via hole, and a substrate for mounting a semiconductor element.

10‧‧‧使絕緣性樹脂層疊層於覆銅箔疊層板而成的印刷配線板(開孔前)10‧‧‧Printed wiring board made by laminating insulating resin on copper-clad laminate (before opening)

11‧‧‧使絕緣性樹脂層疊層於覆銅箔疊層板而成的印刷配線板(開孔後) 11‧‧‧Printed wiring board made by laminating insulating resin on copper-clad laminate (after opening)

20‧‧‧使本實施形態之附設絕緣性樹脂層之銅箔疊層於覆金屬箔疊層板而成的印刷配線板(開孔前) 20‧‧‧ This is a printed wiring board in which copper foil with an insulating resin layer in this embodiment is laminated on a metal foil laminate (before opening).

21‧‧‧使本實施形態之附設絕緣性樹脂層之銅箔疊層於覆金屬箔疊層板而成的印刷配線板(開孔後) 21‧‧‧A printed wiring board (after opening) in which a copper foil with an insulating resin layer is laminated on a metal foil laminated board in this embodiment

30‧‧‧絕緣性樹脂層 30‧‧‧ insulating resin layer

31‧‧‧銅箔 31‧‧‧copper foil

32‧‧‧玻璃纖維等無機物 32‧‧‧ Glass fiber and other inorganic substances

40‧‧‧玻璃纖維突出的部分 40‧‧‧ glass fiber protruding part

[圖1]係顯示使用雷射加工對印刷配線板實施開孔時的導通孔之表面狀態的示意圖。[Fig. 1] It is a schematic diagram showing a surface state of a via hole when a printed wiring board is drilled using laser processing.

[圖2]係雷射加工後之開口部表面的SEM圖像(實施例1)。 Fig. 2 is a SEM image of the surface of the opening after laser processing (Example 1).

[圖3]係雷射加工後之開口部表面的SEM圖像(比較例3)。 Fig. 3 is a SEM image of the surface of the opening after laser processing (Comparative Example 3).

Claims (9)

一種附設絕緣性樹脂層之銅箔,包含: 銅箔;及 疊層於該銅箔之絕緣性樹脂層, 與該絕緣性樹脂層接觸之該銅箔面的算術平均粗糙度(Ra)為0.05~2μm, 該絕緣性樹脂層係由含有(A)熱硬化性樹脂、(B)球狀填料及(C)平均纖維長為10~300μm之玻璃短纖維之樹脂組成物構成。A copper foil with an insulating resin layer includes: Copper foil; and An insulating resin layer laminated on the copper foil, The arithmetic mean roughness (Ra) of the copper foil surface in contact with the insulating resin layer is 0.05 to 2 μm, The insulating resin layer is composed of a resin composition containing (A) a thermosetting resin, (B) a spherical filler, and (C) short glass fibers having an average fiber length of 10 to 300 μm. 如申請專利範圍第1項之附設絕緣性樹脂層之銅箔,其中,該絕緣性樹脂層之厚度為3~50μm。For example, the copper foil provided with an insulating resin layer in the first patent application scope, wherein the thickness of the insulating resin layer is 3 to 50 μm. 如申請專利範圍第1項之附設絕緣性樹脂層之銅箔,其中,該銅箔之厚度為1~18μm。For example, the copper foil provided with an insulating resin layer in the first patent application scope, wherein the thickness of the copper foil is 1 to 18 μm. 如申請專利範圍第1項之附設絕緣性樹脂層之銅箔,其中,該玻璃短纖維之纖維徑為1~15μm。For example, the copper foil with an insulating resin layer attached to the first patent application scope has a fiber diameter of 1 to 15 μm. 如申請專利範圍第1項之附設絕緣性樹脂層之銅箔,其中,該玻璃短纖維之含量相對於該樹脂組成物中的樹脂固體成分100質量份為5~450質量份。For example, the copper foil provided with an insulating resin layer in the first patent application scope, wherein the content of the short glass fibers is 5 to 450 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition. 如申請專利範圍第1項之附設絕緣性樹脂層之銅箔,其中,該玻璃短纖維為經輾磨之纖維(milled fiber)。For example, the copper foil provided with an insulating resin layer in the first patent application scope, wherein the short glass fibers are milled fibers. 如申請專利範圍第1項之附設絕緣性樹脂層之銅箔,其中,該球狀填料之含量相對於該樹脂組成物中的樹脂固體成分100質量份為50~500質量份。For example, the copper foil with an insulating resin layer in the first patent application scope, wherein the content of the spherical filler is 50 to 500 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition. 如申請專利範圍第1項之附設絕緣性樹脂層之銅箔,其中,該熱硬化性樹脂含有選自於由環氧樹脂、氰酸酯化合物、馬來醯亞胺化合物、酚醛樹脂、熱硬化改性聚苯醚樹脂、苯并㗁化合物、有機基改性聚矽氧化合物及具有可聚合的不飽和基之化合物構成之群組中之至少一種。For example, the copper foil provided with an insulating resin layer in the first patent application range, wherein the thermosetting resin contains a material selected from the group consisting of epoxy resin, cyanate compound, maleimide compound, phenol resin, and thermosetting. Modified polyphenylene ether resin, benzopyrene At least one of the group consisting of a compound, an organic-based modified polysiloxane, and a compound having a polymerizable unsaturated group. 如申請專利範圍第1項之附設絕緣性樹脂層之銅箔,係用作印刷配線板或半導體元件搭載用基板之堆疊材料。For example, the copper foil with an insulating resin layer in the scope of patent application No. 1 is used as a stacking material for printed wiring boards or substrates for mounting semiconductor elements.
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