TW201600242A - Polishing pad conditioner - Google Patents

Polishing pad conditioner Download PDF

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Publication number
TW201600242A
TW201600242A TW103120952A TW103120952A TW201600242A TW 201600242 A TW201600242 A TW 201600242A TW 103120952 A TW103120952 A TW 103120952A TW 103120952 A TW103120952 A TW 103120952A TW 201600242 A TW201600242 A TW 201600242A
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TW
Taiwan
Prior art keywords
polishing pad
abrasive
pad conditioner
substrate
fixed
Prior art date
Application number
TW103120952A
Other languages
Chinese (zh)
Inventor
Rui-Lin Zhou
jia-qun Wang
Jia-Feng Qiu
Xin-Ying Lin
Original Assignee
Kinik Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Kinik Co filed Critical Kinik Co
Priority to TW103120952A priority Critical patent/TW201600242A/en
Priority to US14/721,508 priority patent/US20150367480A1/en
Publication of TW201600242A publication Critical patent/TW201600242A/en

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B53/00Devices or means for dressing or conditioning abrasive surfaces
    • B24B53/017Devices or means for dressing, cleaning or otherwise conditioning lapping tools

Abstract

The present invention provides a polishing pad conditioner, which comprises: a substrate including a plurality of recessed parts which are inwardly concaved from the surface of the substrate; a plurality of fixed bases, each fixed base including a bottom part, a top part, at least one groove and one inclined face, the bottom part being arranged in the corresponding recessed part, the top part being connected to the bottom part, the groove being inwardly formed at the top part, the inclined face being formed by inclining from the contact surface of the top part and bottom part toward the groove so as to form an angle and a containing space between the inclined face and the side wall of the recessed part; and a plurality of abrasives disposed in the grooves. When the polishing pad is subjected to conditioning, the polishing pad is rebound to a natural thickness in the containing space without being limited by the abrasive size, so that the cutting depth imposed by the abrasive to the polishing pad can be increased thereby improving the cutting and conditioning effects.

Description

拋光墊修整器 Polishing pad dresser

本創作係關於一種拋光墊修整器,特別指一種具有斜面之拋光墊修整器。 The present invention relates to a polishing pad conditioner, and more particularly to a polishing pad dresser having a bevel.

化學機械平坦化係為半導體製程上不可或缺的方法,其係以一置於載台上之拋光墊,其表面加入有研磨液,藉載台之旋轉帶動拋光墊對晶圓表面進行拋光,使晶圓表面平坦以利進行後續製程。而拋光墊之表面需維持一定的粗糙度才能夠保持其拋光之效率,但因在拋光的過程中,拋光晶圓所產生的碎屑會和研磨液混合而逐漸在拋光墊表面形成一硬化層,導致其拋光效率下降,進而縮短拋光墊的使用壽命。 Chemical mechanical planarization is an indispensable method in semiconductor manufacturing. It is a polishing pad placed on a stage. The surface is filled with a polishing liquid. The rotation of the stage drives the polishing pad to polish the surface of the wafer. The wafer surface is flattened for subsequent processing. The surface of the polishing pad needs to maintain a certain roughness to maintain the polishing efficiency. However, during the polishing process, the debris generated by polishing the wafer will mix with the polishing liquid to gradually form a hardened layer on the surface of the polishing pad. This results in a decrease in polishing efficiency, which in turn shortens the life of the polishing pad.

因此,在拋光過程中需有一拋光墊修整器持續對拋光墊之表面進行修整,以維持拋光墊表面之粗糙度,延長拋光墊的使用壽命。 Therefore, a polishing pad conditioner is required during the polishing process to continuously trim the surface of the polishing pad to maintain the roughness of the polishing pad surface and prolong the service life of the polishing pad.

如圖10所示,現有之拋光墊修整器,其包含一基板80、複數金屬棒81與複數磨料82,該基板80包含複數貫穿該基板80之孔洞83,所述之金屬棒81係裝設固定於所述之孔洞83中,所述之磨料82係裝設固定於金屬棒81之一端並相對於該基板80部分露出。當該拋光墊修整器8用於修整拋光墊90時,該基板80係壓抵於拋光墊 90上,並透過磨料82露出部分切削拋光墊90之表面以達到修整拋光墊90之目的,而其切削深度D將受限於磨料82尺寸大小之限制,若是磨料82使用過一段時間後變得不夠尖銳更是會使得切削深度D減小並影響到修整之效率,再者,研磨液亦無法於有限之切削深度D下獲得充分的混合,因而影響到修整之效率。 As shown in FIG. 10, a conventional polishing pad conditioner includes a substrate 80, a plurality of metal bars 81 and a plurality of abrasives 82. The substrate 80 includes a plurality of holes 83 extending through the substrate 80. The metal bars 81 are mounted. The abrasive 82 is fixed to one end of the metal rod 81 and partially exposed with respect to the substrate 80. When the polishing pad conditioner 8 is used to trim the polishing pad 90, the substrate 80 is pressed against the polishing pad. 90, and partially exposing the surface of the polishing pad 90 through the abrasive material 82 to achieve the purpose of dressing the polishing pad 90, and the depth of cut D will be limited by the size limit of the abrasive material 82, if the abrasive material 82 is used after a certain period of time Not sharp enough will reduce the depth of cut D and affect the efficiency of dressing. Furthermore, the slurry can not achieve sufficient mixing at a limited depth of cut D, thus affecting the efficiency of dressing.

本創作之目的在於改善現有之拋光墊修整器的切削深度因受限於磨料尺寸大小之限制,並會因為磨料之磨損而大幅影響到修整拋光墊之效率的問題。 The purpose of this creation is to improve the depth of cut of the existing pad dresser due to the limitation of the size of the abrasive, and the effect of dressing the polishing pad is greatly affected by the wear of the abrasive.

本創作係提供一種拋光墊修整器,其包含:一基板,其包含複數內凹部,所述之內凹部內凹成型於該基板之表面,各內凹部具有一側壁;複數固定基座,各固定基座呈柱狀並包含一底部、一頂部、至少一凹槽與一斜面,該底部裝設固定對應之內凹部內,該頂部接合於該底部,所述之凹槽內凹成型於該頂部,該斜面係自該頂部與該底部之接觸面往該凹槽傾斜成型,且該斜面與該內凹部之側壁間具有一夾角與一容置空間,該夾角為30度至60度;複數磨料,其裝設固定於所述之凹槽內並與該頂部共同構成一錐狀結構。 The present invention provides a polishing pad conditioner comprising: a substrate comprising a plurality of concave portions, wherein the inner concave portion is concavely formed on a surface of the substrate, each inner concave portion has a side wall; and the plurality of fixed bases are fixed The base is columnar and includes a bottom portion, a top portion, at least one groove and a sloped surface, the bottom portion is fixedly fixed in the corresponding inner concave portion, the top portion is joined to the bottom portion, and the groove is concavely formed on the top portion The inclined surface is formed obliquely from the contact surface of the top portion and the bottom portion, and the inclined surface and the sidewall of the inner concave portion have an angle and an accommodating space, the angle is 30 degrees to 60 degrees; the plurality of abrasives The mounting is fixed in the recess and forms a tapered structure together with the top.

本創作之拋光墊修整器對於拋光墊進行修整時,拋光墊表面之研磨液得以於該容置空間中形成擾動與紊流效果,使得研磨液的濃度均勻,而拋光墊亦於該容置空間中彈回其自然厚度,不再受限於磨料尺寸之影響,使得磨料增加對拋光墊之切削深度,藉此增加切削、修整的 效果。 In the polishing pad dresser of the present invention, when the polishing pad is trimmed, the polishing liquid on the surface of the polishing pad can form a disturbance and turbulence effect in the accommodating space, so that the concentration of the polishing liquid is uniform, and the polishing pad is also in the accommodating space. The rebound back to its natural thickness is no longer limited by the size of the abrasive, so that the abrasive increases the depth of the polishing pad, thereby increasing the cutting and finishing effect.

較佳的是,各固定基座之底部透過一結合層裝 設固定於對應之內凹部內,該結合層之材質為陶瓷材料、硬焊材料、電鍍材料、金屬材料或高分子材料;其中,硬焊材料選自於鐵、鈷、鎳、鉻、錳、矽、鋁所構成之群組;高分子材料係為聚酯樹脂、環氧樹脂、聚丙烯酸樹脂或酚醛樹脂。 Preferably, the bottom of each fixed base is mounted through a bonding layer The material of the bonding layer is ceramic material, brazing material, electroplating material, metal material or polymer material; wherein the brazing material is selected from the group consisting of iron, cobalt, nickel, chromium, manganese, A group consisting of bismuth and aluminum; the polymer material is a polyester resin, an epoxy resin, a polyacrylic resin or a phenolic resin.

較佳的是,所述之固定基座係透過該結合層裝 設固定於對應之內凹部內之固定方法係可為陶瓷燒結法、金屬硬焊法、電鍍法、金屬燒結法或高分子硬化法。 Preferably, the fixed base is mounted through the bonding layer The fixing method fixed in the corresponding inner concave portion may be a ceramic sintering method, a metal brazing method, a plating method, a metal sintering method or a polymer hardening method.

較佳的是,所述之內凹部於該基板之表面係呈 同心圓排列;另擇的是,所述之內凹部係由該基板之表面朝四周輻射排列。 Preferably, the inner recess is formed on the surface of the substrate. Concentrically arranged; alternatively, the inner recess is radially arranged from the surface of the substrate toward the periphery.

較佳的是,所述之內凹部係貫穿成型於該基 板。 Preferably, the inner concave portion is formed through the base. board.

較佳的是,所述之斜面係經一表面處理而傾斜 成型,該表面處理係為機械研磨、化學蝕刻或雷射加工。 Preferably, the slope is inclined by a surface treatment Forming, the surface treatment is mechanical grinding, chemical etching or laser processing.

較佳的是,各磨料具有一端部,該端部係位於 各磨料相對於凹槽之一端,磨料之端部相對於該基板表面之水平面的垂直距離係為磨料之露出度,所述之磨料的露出度為100至300微米。 Preferably, each of the abrasives has an end portion, the end portion being located The vertical distance of each abrasive relative to one end of the groove, the end of the abrasive relative to the horizontal plane of the substrate surface, is the degree of exposure of the abrasive, the abrasive being exposed to a degree of 100 to 300 microns.

較佳的是,所述之磨料包含至少兩種不同之露 出度,且露出度之間的差係為20至100微米;更佳的是,露出度之間的差係為40至60微米。 Preferably, the abrasive comprises at least two different dews The degree of difference, and the difference between the degrees of exposure is 20 to 100 μm; more preferably, the difference between the degrees of exposure is 40 to 60 μm.

由於拋光墊之厚度並非均一,係以不同之磨料 露出度配合所述之固定基座於該基板上之排列,藉此使得修整拋光墊時能夠達到更為均一的修整效果。 Since the thickness of the polishing pad is not uniform, it is made of different abrasives. The degree of exposure matches the arrangement of the fixed base on the substrate, thereby enabling a more uniform trimming effect when the polishing pad is trimmed.

較佳的是,所述之磨料之材質係為人造鑽石、天然鑽石、多晶鑽石或立方氮化硼。 Preferably, the material of the abrasive is rhinestone, natural diamond, polycrystalline diamond or cubic boron nitride.

較佳的是,所述之磨料之尺寸係為30至2000微米;更佳的是,係為600至1000微米,且所述之磨料之尺寸最小之直徑為最大者之80%以上。 Preferably, the abrasive has a size of from 30 to 2000 microns; more preferably, from 600 to 1000 microns, and the smallest diameter of the abrasive is greater than 80% of the largest.

較佳的是,所述之磨料以電鍍、燒結或硬焊之方式裝設固定於該頂部之凹槽內。 Preferably, the abrasive is fixed in the groove of the top by electroplating, sintering or brazing.

較佳的是,所述之磨料係經一表面加工處理,使其具有特定的切削刃角、晶型結構、尖端高度及尖端方向性,表面加工處理係為機械研磨、化學蝕刻或雷射加工。 Preferably, the abrasive is subjected to a surface treatment to have a specific cutting edge angle, a crystal structure, a tip height and a tip orientation, and the surface processing is mechanical grinding, chemical etching or laser processing. .

較佳的是,所述之磨料的切削刃角為30度至150度;更佳的是,切削刃角為60度或90度。 Preferably, the abrasive has a cutting edge angle of from 30 to 150 degrees; more preferably, the cutting edge angle is 60 or 90 degrees.

較佳的是,所述之磨料的晶型結構為六面體或八面體。 Preferably, the crystal structure of the abrasive is a hexahedron or an octahedron.

較佳的是,該基板係為不銹鋼基板、模具鋼基板、金屬合金基板、陶瓷基板或高分子基板。 Preferably, the substrate is a stainless steel substrate, a mold steel substrate, a metal alloy substrate, a ceramic substrate or a polymer substrate.

較佳的是,所述之內凹部的數量係介於50至300個之間;更佳的是,介於60至100個之間。 Preferably, the number of the inner recesses is between 50 and 300; more preferably between 60 and 100.

較佳的是,所述之內凹部的橫切面為圓型,且其橫切面之直徑為2.6至3.6毫米。 Preferably, the inner concave portion has a circular cross section and a cross section having a diameter of 2.6 to 3.6 mm.

較佳的是,所述之固定基座係呈圓柱狀,且其材質係為不鏽鋼,而其橫切面之直徑為2.5至3.5毫米。 Preferably, the fixed base has a cylindrical shape and is made of stainless steel, and the cross section has a diameter of 2.5 to 3.5 mm.

1、1A、1B‧‧‧拋光墊修整器 1, 1A, 1B‧‧‧ polishing pad dresser

10、10A、10B‧‧‧基板 10, 10A, 10B‧‧‧ substrate

11、11A、11B‧‧‧內凹部 11, 11A, 11B‧‧‧ recess

111、111A、111B‧‧‧側壁 111, 111A, 111B‧‧‧ side wall

20、20A、20B、20C‧‧‧固定基座 20, 20A, 20B, 20C‧‧‧ fixed base

21、21A、21C‧‧‧底部 21, 21A, 21C‧‧‧ bottom

22、22A、22C‧‧‧頂部 22, 22A, 22C‧‧‧ top

23、23A、23C‧‧‧凹槽 23, 23A, 23C‧‧‧ grooves

24、24A、24B、24C‧‧‧斜面 24, 24A, 24B, 24C‧‧‧ bevel

25、25A、25B‧‧‧容置空間 25, 25A, 25B‧‧‧ accommodating space

30、30A、30B、30C‧‧‧磨料 30, 30A, 30B, 30C‧‧‧ abrasives

31、31A、31B、31C‧‧‧端部 31, 31A, 31B, 31C‧‧‧ end

40、40A、40B‧‧‧結合層 40, 40A, 40B‧‧‧ bonding layer

8‧‧‧拋光墊修整器 8‧‧‧ polishing pad dresser

80‧‧‧基板 80‧‧‧Substrate

81‧‧‧金屬棒 81‧‧‧Metal rod

82‧‧‧磨料 82‧‧‧Abrasive

83‧‧‧孔洞 83‧‧‧ hole

90‧‧‧拋光墊 90‧‧‧ polishing pad

D‧‧‧切削深度 D‧‧‧During depth

H、H’‧‧‧露出度 H, H’‧‧‧ exposure

C‧‧‧固定基座之橫切面直徑 C‧‧‧Cross section diameter of the fixed base

α‧‧‧夾角 ‧‧‧‧ angle

θ‧‧‧切削刃角 Θ‧‧‧ cutting edge angle

圖1為本創作第一實施例之剖面圖。 Figure 1 is a cross-sectional view showing a first embodiment of the creation.

圖2為本創作第一實施例之部分剖面圖。 Figure 2 is a partial cross-sectional view showing the first embodiment of the creation.

圖3為本創作第一實施例之固定基座的剖面分解圖。 Figure 3 is a cross-sectional, exploded view of the fixed base of the first embodiment of the present invention.

圖4為本創作第一實施例之固定基座與磨料的電子顯微鏡照片。 Fig. 4 is an electron micrograph of the fixed base and the abrasive of the first embodiment of the present invention.

圖5為本創作第一實施例用於修整拋光墊之使用狀態圖。 Fig. 5 is a view showing the state of use of the polishing pad according to the first embodiment of the present invention.

圖6為本創作第二實施例之剖面圖。 Figure 6 is a cross-sectional view showing a second embodiment of the creation.

圖7為本創作第二實施例之部分剖面圖。 Figure 7 is a partial cross-sectional view showing a second embodiment of the creation.

圖8為本創作第三實施例之部分剖面圖。 Figure 8 is a partial cross-sectional view showing a third embodiment of the creation.

圖9為本創作第四實施例之固定基座的剖面分解圖。 Figure 9 is a cross-sectional, exploded view of the fixed base of the fourth embodiment of the present invention.

圖10為現有技術之拋光墊修整器用於修整拋光墊之使用狀態示意圖。 FIG. 10 is a schematic view showing the state of use of the polishing pad dresser of the prior art for dressing the polishing pad.

根據下面說明,本創作的優點和特徵將更清楚的呈現。需說明的是,圖式均採用簡化的形式且均使用非精準的比例,僅用以方便、清晰地輔助說明本創作實施例的目的。 The advantages and features of this creation will be more clearly presented in light of the following description. It should be noted that the drawings are in a simplified form and both use non-precise proportions, and are only used to facilitate and clearly explain the purpose of the present embodiment.

實施例1Example 1

如圖1、圖2所示,本創作提供一種拋光墊修整器1,其包含:一基板10、複數固定基座20與複數磨料30。 As shown in FIG. 1 and FIG. 2, the present invention provides a polishing pad conditioner 1 comprising: a substrate 10, a plurality of fixed bases 20 and a plurality of abrasives 30.

該基板10呈圓盤狀並包含複數內凹部11,所述之內凹部11內凹成型於該基板10之表面,各內凹部11 具有一側壁111。在本實施例中,該基板10為不鏽鋼材質且其厚度為6.35毫米,所述之內凹部11之數量為66個並於該基板10之表面呈同心圓排列,其中外圈為36個,內圈為30個(圖1僅為示意),且各內凹部11的橫切面為圓型,其直徑為2.6毫米。 The substrate 10 has a disk shape and includes a plurality of concave portions 11 recessed and formed on the surface of the substrate 10, and each of the concave portions 11 There is a side wall 111. In this embodiment, the substrate 10 is made of stainless steel and has a thickness of 6.35 mm. The number of the inner recesses 11 is 66 and is arranged concentrically on the surface of the substrate 10, wherein the outer ring has 36 inner portions. The number of the circles is 30 (only the schematic is shown in Fig. 1), and the cross section of each of the concave portions 11 is a circular shape having a diameter of 2.6 mm.

所述之固定基座20係裝設固定對應之內凹部 11內,並包含一底部21、一頂部22、一凹槽23與一斜面24,在本實施例中,所述之固定基座20大致呈圓柱狀且其材質係為不鏽鋼,且各固定基座20之橫切面的直徑為2.5毫米。 The fixed base 20 is fixedly disposed corresponding to the inner recess 11 and including a bottom portion 21, a top portion 22, a recess 23 and a slope 24, in the embodiment, the fixed base 20 is substantially cylindrical and the material is stainless steel, and each fixed base The cross section of the seat 20 has a diameter of 2.5 mm.

各固定基座20之底部21係透過一結合層40 固設於所對應之內凹部11內,在本實施例中,各固定基座20之底部21係以金屬硬焊法並透過該結合層40裝設固定於對應之內凹部11內,而該結合層40之材質係為硬焊材料,在本實施例中,硬焊材料為鋁。 The bottom portion 21 of each fixed base 20 is transmitted through a bonding layer 40 The bottom portion 21 of each of the fixing bases 20 is fixed to the corresponding inner recess 11 by metal brazing and through the bonding layer 40, and is fixed in the corresponding inner recessed portion 11. The material of the bonding layer 40 is a brazing material. In this embodiment, the brazing material is aluminum.

該頂部22係一體成型地接合於該底部21,且 該凹槽23係內凹成型於該頂部22,並且設置於相對該底部21之一端,且該頂部22具有自該頂部22與該底部21之接觸面往該凹槽23傾斜成型之斜面24,且該斜面24與該內凹部11之側壁111間具有一夾角α與一容置空間25,本實施例中,該夾角α係為45度。 The top portion 22 is integrally formed to the bottom portion 21, and The groove 23 is concavely formed on the top portion 22 and disposed at one end opposite to the bottom portion 21, and the top portion 22 has a slope 24 formed obliquely from the contact surface of the top portion 22 and the bottom portion 21 toward the groove 23. The angle between the inclined surface 24 and the side wall 111 of the inner concave portion 11 has an angle α and an accommodating space 25. In the embodiment, the angle α is 45 degrees.

配合圖3、圖4所示,所述之磨料30係裝設固 定於該凹槽23內並與該頂部共同構成一錐狀結構,在本實施例中,各磨料30係以硬焊方式裝設固定於該凹槽23內並具有一端部31,且各磨料30的材質為人造鑽石,尺寸為 800微米,而各磨料30之端部31係位於各磨料30相對於凹槽23之一端,且各磨料30之端部31相對於該基板10表面之水平面的垂直距離係為各磨料30之露出度H,所述之磨料30的露出度H係為100微米,再者,所述之磨料30係經一表面加工處理,使其具有特定的切削刃角與晶型結構。於本實施例中,該磨料30之切削刃角θ為60度(圖3僅為示意),其晶型結構為六面體,且各磨料30之露出度與各固定基座20之橫切面的直徑C的比例為1:25,而磨料30之尺寸與與各固定基座20之橫切面的直徑C的比例為8:25。 As shown in FIG. 3 and FIG. 4, the abrasive material 30 is fixedly mounted. In the groove 23, a tapered structure is formed together with the top portion. In the embodiment, each of the abrasives 30 is fixedly fixed in the groove 23 by a brazing method and has one end portion 31, and each abrasive material 30 is made of synthetic diamonds and the size is 800 microns, and the end portion 31 of each of the abrasives 30 is located at one end of each of the abrasives 30 with respect to the groove 23, and the vertical distance of the end portion 31 of each of the abrasives 30 relative to the horizontal plane of the surface of the substrate 10 is the exposure of the respective abrasives 30. The degree H of the abrasive 30 is 100 micrometers. Further, the abrasive 30 is subjected to a surface treatment to have a specific cutting edge angle and a crystal structure. In the present embodiment, the cutting edge angle θ of the abrasive 30 is 60 degrees (illustration 3 is only schematic), the crystal structure is a hexahedron, and the exposure of each abrasive 30 and the cross section of each fixed base 20 The ratio of the diameter C is 1:25, and the ratio of the size of the abrasive 30 to the diameter C of the cross section of each fixed base 20 is 8:25.

如圖5所示,利用該拋光墊修整器1對於拋光 墊90進行修整時,拋光墊90表面之研磨液得以於該容置空間25中形成擾動與紊流效果,使得研磨液的濃度均勻,而拋光墊90亦於該容置空間25中彈回其自然厚度,不再受限於磨料30尺寸之影響,使得磨料30增加對拋光墊90之切削深度D,藉此增加切削、修整的效果。 As shown in Figure 5, the polishing pad conditioner 1 is used for polishing When the pad 90 is trimmed, the polishing liquid on the surface of the polishing pad 90 can form a disturbance and turbulence effect in the accommodating space 25, so that the concentration of the polishing liquid is uniform, and the polishing pad 90 also bounces back in the accommodating space 25. The natural thickness is no longer limited by the size of the abrasive 30, so that the abrasive 30 increases the depth of cut D to the polishing pad 90, thereby increasing the effect of cutting and trimming.

實施例2Example 2

如圖6、圖7所示,本實施例所述之拋光墊修整器1A與實施例1大致相同,其不同之處在於,在本實施例中,該基板10A為陶瓷材質,所述之內凹部11A係貫穿該基板10A,且所述之內凹部11A的數量為100個並係由該基板10A之中心朝四周輻射排列(圖6僅為示意),而各內凹部11A的橫切面之直徑為3.6毫米。 As shown in FIG. 6 and FIG. 7 , the polishing pad conditioner 1A of the present embodiment is substantially the same as the first embodiment, except that in the embodiment, the substrate 10A is made of ceramic material. The recessed portion 11A penetrates the substrate 10A, and the number of the inner recessed portions 11A is 100, and is radiated by the center of the substrate 10A toward the periphery (only FIG. 6 is schematically shown), and the diameter of the cross section of each of the inner recessed portions 11A. It is 3.6 mm.

各固定基座20A之橫切面的直徑為3.5毫米,各固定基座20A之底部21A係以高分子硬化法並透過該結 合層40A裝設固定於對應之內凹部11A內,而該結合層40A之材質係為高分子材料,高分子材料為環氧樹脂。 Each of the fixing bases 20A has a cross-sectional surface having a diameter of 3.5 mm, and the bottom portion 21A of each of the fixing bases 20A is polymer-hardened and transmits the knot. The bonding layer 40A is fixed in the corresponding inner recess 11A, and the material of the bonding layer 40A is a polymer material, and the polymer material is an epoxy resin.

各磨料30A係以燒結方式裝設固定於該凹槽 23A,且其材質為立方氮化硼,其尺寸為2000微米,而所述之磨料30A的露出度H為300微米,各磨料30A之切削刃角θ為90度(圖7僅為示意),晶型結構為八面體,各磨料30A之露出度與各固定基座20A之橫切面的直徑C的比例為3:35,而磨料30A之尺寸與各固定基座20A之橫切面的直徑C的比例為4:7。 Each abrasive 30A is fixedly fixed to the groove by sintering 23A, and the material thereof is cubic boron nitride, the size of which is 2000 micrometers, and the exposure degree H of the abrasive 30A is 300 micrometers, and the cutting edge angle θ of each abrasive 30A is 90 degrees (FIG. 7 is only schematic). The crystal structure is an octahedron, and the ratio of the degree of exposure of each of the abrasives 30A to the diameter C of the cross section of each of the fixed pedestals 20A is 3:35, and the size of the abrasive 30A and the diameter C of the cross section of each of the fixed pedestals 20A The ratio is 4:7.

實施例3Example 3

如圖8所示,本實施例所述之拋光墊修整器1B與實施例1大致相同,其不同之處在於,在本實施例中具有兩種不同的磨料30B露出度H,H’,所述之磨料30B之露出度H,H’的差係為20至100微米,且於本實施例中,磨料30B之尺寸與各固定基座20B之橫切面的直徑C的比例為1:2。 As shown in FIG. 8, the polishing pad conditioner 1B of the present embodiment is substantially the same as that of Embodiment 1, except that in the present embodiment, there are two different abrasives 30B exposure degrees H, H', The difference in the degree of exposure H, H' of the abrasive 30B is 20 to 100 μm, and in the present embodiment, the ratio of the size of the abrasive 30B to the diameter C of the cross section of each of the fixed pedestals 20B is 1:2.

由於拋光墊90之厚度並非均一,係以不同之磨料30B露出度H,H’配合所述之固定基座20B於該基板10B上之排列,藉此使得修整拋光墊時能夠達到更為均一的修整效果。 Since the thickness of the polishing pad 90 is not uniform, the exposure degree H, H' of the different abrasives 30B is matched with the arrangement of the fixed base 20B on the substrate 10B, thereby making the polishing pad more uniform. Trimming effect.

實施例4Example 4

如圖9所示,本實施例所述之拋光墊修整器與實施例1大致相同,其不同之處在於,所述之固定基座20C具有至少兩凹槽23C與該斜面24C,所述之凹槽23C係內凹成型於該頂部22C,該斜面24C係自該頂部22C與該底 部21C之接觸面往該凹槽23C傾斜成型,而所述之磨料30C係裝設固定於該凹槽23C內,且各磨料30C的材質為多晶鑽石,其尺寸為300微米,而各固定基座20C之橫切面的直徑C為2.5毫米,磨料30C之尺寸與各固定基座20C之橫切面的直徑C的比例為1:8。各固定基座20C上裝設有更多數量之磨料30C,藉此增加修整拋光墊之效率。 As shown in FIG. 9, the polishing pad conditioner of the embodiment is substantially the same as that of Embodiment 1, except that the fixing base 20C has at least two grooves 23C and the inclined surface 24C. The groove 23C is concavely formed on the top portion 22C, and the inclined surface 24C is from the top portion 22C and the bottom portion The contact surface of the portion 21C is formed obliquely to the groove 23C, and the abrasive 30C is mounted and fixed in the groove 23C, and each of the abrasives 30C is made of polycrystalline diamond, and its size is 300 micrometers, and each fixed The diameter C of the cross section of the susceptor 20C is 2.5 mm, and the ratio of the size of the abrasive 30C to the diameter C of the cross section of each of the fixed pedestals 20C is 1:8. A larger number of abrasives 30C are mounted on each of the fixed bases 20C, thereby increasing the efficiency of dressing the polishing pads.

試驗例Test case

取兩片相同的拋光墊,並分別以實施例1之拋光墊修整器與現有之拋光墊修整器(對照組,其結構如先前技術所述)進行修整,記錄不同時間下之兩拋光墊之厚度,以分別計算拋光效率(拋光墊厚度差除以修整時間),其結果如表1所示。 Two identical polishing pads were taken and trimmed with the polishing pad conditioner of Example 1 and the existing polishing pad conditioner (control group, the structure is as described in the prior art), and the two polishing pads at different times were recorded. The thickness was calculated to calculate the polishing efficiency (the polishing pad thickness difference divided by the dressing time), and the results are shown in Table 1.

實施例1之拋光墊修整器的拋光效率為118微米/小時,係相對於現有之拋光墊修整器的90微米/小時, 其拋光效率提高31%,透過該斜面與該內凹部間之該容置空間,拋光墊得於該容置空間中彈回其自然厚度,使得磨料增加對拋光墊之切削深度,所以本創作之拋光墊修整器相對於現有之拋光墊修整器確實提高切削、修整的效果。 The polishing pad conditioner of Example 1 has a polishing efficiency of 118 μm/hr, which is 90 μm/hr relative to the existing pad conditioner. The polishing efficiency is increased by 31%. Through the accommodating space between the inclined surface and the inner concave portion, the polishing pad rebounds into the natural thickness of the polishing space, so that the abrasive increases the cutting depth of the polishing pad, so the creation The polishing pad conditioner does improve the cutting and trimming effect with respect to the existing pad dresser.

以上所述僅是本創作的較佳實例而已,並非對 本創作做任何形式上的限制,雖然本創作已以較佳實施例揭露如上,然而並非用以限定本創作,任何所屬技術領域中具有通常知識者,在不脫離本創作技術方案的範圍內,當可利用上述揭示的技術內容做出些許更動或修飾為等同變化的等效實施例,但凡是未脫離本創作之技術方案的內容,依據本創作的技術實質對以上實施例作任何簡單修改、等同變化與修改,均仍屬於本創作技術方案的範圍內。 The above description is only a preferred example of the creation, not the The present invention is not limited to the scope of the present invention, and is not intended to limit the present invention, and is not limited to the scope of the present invention. When an equivalent embodiment of the above-discussed technical content is used to make a modification or modification to the equivalent embodiment, any simple modification of the above embodiment may be made according to the technical essence of the present invention without departing from the technical solution of the present invention. Equivalent changes and modifications are still within the scope of this creative technical solution.

1‧‧‧拋光墊修整器 1‧‧‧ polishing pad dresser

10‧‧‧基板 10‧‧‧Substrate

20‧‧‧固定基座 20‧‧‧Fixed base

24‧‧‧斜面 24‧‧‧Bevel

25‧‧‧容置空間 25‧‧‧ accommodating space

30‧‧‧磨料 30‧‧‧Abrasive

90‧‧‧拋光墊 90‧‧‧ polishing pad

D‧‧‧切削深度 D‧‧‧During depth

Claims (10)

一種拋光墊修整器,其包含:一基板,其包含複數內凹部,所述之內凹部內凹成型於該基板之表面,各內凹部具有一側壁;複數固定基座,各固定基座包含一底部、一頂部、至少一凹槽與一斜面,該底部固設於對應之內凹部內,該頂部接合於該底部,所述之凹槽內凹成型於該頂部,該斜面係自該頂部與該底部之接觸面往該凹槽傾斜成型,且該斜面與該內凹部之側壁間具有一夾角與一容置空間,該夾角為30度至60度;複數磨料,其固設於所述之凹槽內。 A polishing pad conditioner comprising: a substrate comprising a plurality of concave portions, wherein the inner concave portion is concavely formed on a surface of the substrate, each inner concave portion has a side wall; the plurality of fixed bases, each fixed base comprises a a bottom portion, a top portion, at least one groove and a sloped surface, the bottom portion being fixed in the corresponding inner concave portion, the top portion being joined to the bottom portion, wherein the groove is concavely formed on the top portion, the slope surface is from the top portion The bottom contact surface is formed obliquely to the groove, and the inclined surface and the sidewall of the inner recess have an angle and an accommodating space, the angle is 30 degrees to 60 degrees; a plurality of abrasives are fixed on the Inside the groove. 依據請求項1所述之拋光墊修整器,其中各固定基座之底部透過一結合層裝設固定於對應之內凹部內,該結合層之材質為陶瓷材料、硬焊材料、電鍍材料、金屬材料或高分子材料。 The polishing pad conditioner according to claim 1, wherein the bottom of each of the fixing bases is fixed in a corresponding inner concave portion through a bonding layer, and the bonding layer is made of ceramic material, brazing material, plating material, metal. Material or polymer material. 依據請求項1所述之拋光墊修整器,其中各固定基座之底部透過一結合層裝設固定於對應之內凹部內,該結合層之材質選自於鐵、鈷、鎳、鉻、錳、矽及鋁所構成之群組。 The polishing pad conditioner according to claim 1, wherein the bottom of each of the fixing bases is fixed in a corresponding inner concave portion through a bonding layer, and the material of the bonding layer is selected from the group consisting of iron, cobalt, nickel, chromium and manganese. Group of 矽, 矽 and aluminum. 依據請求項1所述之拋光墊修整器,其中各固定基座之底部透過一結合層裝設固定於對應之內凹部內,該結合層之材質係為聚酯樹脂、環氧樹脂、聚丙烯酸樹脂或酚醛樹脂。 The polishing pad conditioner according to claim 1, wherein the bottom of each of the fixing bases is fixed in a corresponding inner concave portion through a bonding layer, and the bonding layer is made of polyester resin, epoxy resin, polyacrylic acid. Resin or phenolic resin. 依據請求項1所述之拋光墊修整器,其中所述之內凹部於該基板之表面係呈同心圓排列。 The polishing pad conditioner of claim 1, wherein the inner concave portion is arranged concentrically on a surface of the substrate. 依據請求項1所述之拋光墊修整器,其中各磨料具有一端部,該端部位於各磨料相對於凹槽之一端,該端部相對於該基板表面之水平面的垂直距離係為磨料之露出度,所述之磨料的露出度為100微米至300微米。 A polishing pad conditioner according to claim 1, wherein each of the abrasives has an end portion located at one end of each of the abrasives relative to the groove, and a vertical distance of the end portion relative to a horizontal plane of the substrate surface is an exposure of the abrasive The abrasive has an exposure of from 100 micrometers to 300 micrometers. 依據請求項6所述之拋光墊修整器,其中所述之磨料包含至少兩種不同之露出度,且露出度之間的差係為20微米至100微米。 The polishing pad conditioner of claim 6, wherein the abrasive comprises at least two different degrees of exposure, and the difference between the degrees of exposure is from 20 micrometers to 100 micrometers. 依據請求項1所述之拋光墊修整器,其中所述之磨料具有特定的切削刃角,切削刃角係為30度至150度。 A polishing pad conditioner according to claim 1, wherein said abrasive has a specific cutting edge angle of from 30 degrees to 150 degrees. 依據請求項1所述之拋光墊修整器,其中所述之磨料具有特定的晶型結構,晶型結構係為六面體或八面體。 A polishing pad conditioner according to claim 1, wherein the abrasive has a specific crystal structure, and the crystal structure is a hexahedron or an octahedron. 依據請求項1至9項任一項所述之拋光墊修整器,其中所述之內凹部係貫穿成型於該基板。 A polishing pad conditioner according to any one of claims 1 to 9, wherein the inner recess is formed through the substrate.
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