TW201508294A - Bed type detection mechanism for detecting alignment and conductivity of optical element - Google Patents

Abstract

A bed type detection mechanism for detecting alignment and conductivity of an optical element includes a base, a fine-tuning device, a displacement device, an electrical measurement platform, and an electrical measurement device. The fine-tuning device is disposed on the base for outputting power and fine moving relative to the base along the X-axis direction and the Y-axis direction. The displacement device is disposed on the fine-tuning device for outputting adequate power and moving relative to the displacement device along the X-axis direction and the Y-axis direction. The electrical measurement platform is disposed on the displacement device and moves through the linkage of the fine-tuning device and the displacement device for allowing conductive glass to be placed thereon. The electrical measurement device is disposed on the base for performing contact electrical detection on the conductive glass aligned with the electrical measurement platform.

Description

Bed table optics alignment and conductivity detection mechanism

The present invention relates to a detection device, and more particularly to a detection mechanism for alignment and conductivity of a bed-top optical component.

According to the requirements of thin and light electronic products and high performance, not only the IC design and manufacturing technology is becoming more and more refined, but also the advancement of IC packaging technology. In the LCD industry, as the LCD specifications are upgraded from VGA to WXGA, the circuit fabrication on the LCD panel will be complicated. If the number of driving circuits is not increased, the number of pins per driving circuit must be made. increase. Under such technology evolution, the driver circuit packaging technology has gradually evolved from TAB (Tape Automated Bonding) to COF (Chip on Film) or COG (Chip on Glass). The COG method is to directly solder the crystal grains of the long gold bumps to the wires on the conductive glass panel by flip chip, and the TAB tape can be omitted. Because the cost of TAB tape is very high, accounting for more than 70% of the cost of TAB packaging, COG is quite attractive in terms of cost advantages. Although COG has the advantage of low cost, it has not been able to replace the TAB package because the COG must install the driver circuit on the glass panel to check the result of the panel lighting. If it cannot be lit and cannot be reworked, it must be It is quite troublesome to unplug the drive circuit. The key part is how to check the driving circuit of the conductive glass before installation and improve the installation yield to make the COG technology more widely used.

As wafer-level packaging technology becomes mainstream, bump detection of driver circuits is still done in wafer type. In this regard, many manufacturers have provided related machines. After the wafer is cut to the final test, the product may still be contaminated or damaged. At present, the common quality control practices rely on statistical process control; however, due to the inability to achieve complete testing, which affects the rate of assembly in the future, it will also have a negative impact on the development of such advanced technologies.

Therefore, how to effectively improve the efficiency of detecting conductive glass is an urgent problem to be solved by current practitioners.

In view of the shortcomings derived from the conventional testing institutions, the inventors of the present invention have improved and innovated, and after years of painstaking research, they have successfully developed the detection mechanism for the alignment and conductivity of the bed-top optical components.

It is an object of the present invention to provide a detection mechanism for alignment and conductivity of a bed-top optical component, which is effective for improving the efficiency of detection.

The detection mechanism for the alignment and conductivity of the bed-top optical component, which can achieve the above object, includes: a pedestal; a fine adjustment device is disposed on the working range of the pedestal, the fine adjustment device includes a fine adjustment carrier plate, and a plurality of a rotary translation assembly disposed between the fine adjustment carrier and the base; and a fine adjustment power unit for driving the fine adjustment carrier to perform fine displacement in the X-axis direction and the Y-axis direction along the rotary translation assembly and finely rotating in the θ direction, the fine adjustment device Outputting appropriate power to perform fine displacement relative to the displacement device along the X-axis direction and the Y-axis direction; a displacement device is disposed on the fine adjustment carrier of the fine adjustment device, the displacement device includes a displacement carrier plate, and a plurality of displacements are disposed on the displacement a displacement slide assembly between the carrier plate and the fine adjustment carrier plate and a plurality of displacement power units for driving the displacement carrier plate along the displacement slide assembly for X-axis direction and Y-axis direction, and the displacement device can output appropriate power Displacement relative to the base along the X-axis direction and the Y-axis direction; an electrical measurement platform is disposed on the displacement carrier of the displacement device, and the electrical measurement platform is coupled by the displacement device and the fine adjustment device Displacement for placing a conductive glass, and the electric measuring platform has a plurality of vacuum adsorption holes arranged at a predetermined interval to generate vacuum suction on the placed conductive glass An electric measuring device comprises a support frame, a Z-axis power unit, an electric test stand, at least one image alignment unit and a contact type electrical test board; the support frame is disposed on the base, the Z The shaft power unit is disposed on the support frame for generating a reciprocating movement in the Z-axis direction, and the electric measuring block is coupled to the Z-axis power unit to be coupled by the Z-axis power unit, and Reciprocating displacement along the Z-axis direction, the image aligning unit is disposed on the electric measuring seat for taking image of the conductive glass located on the electric measuring platform, and providing an image signal for the controller to interpret the conductive glass The position of the driving circuit is correct. The contact type measuring board is disposed on the electric measuring seat and can be used in one water. Performing a 90-degree flip between the flat measurement position and a vertical movement position, and providing a contact test signal for the controller to interpret, and the electrical measurement device is used for performing contact electrical detection on the conductive glass located on the electrical measurement platform. The controller is electrically connected to the fine adjustment device, the displacement device, the electrical measurement platform and the electrical measurement device to control the actuation and stop of the fine adjustment device, the displacement device, the electrical measurement platform and the electrical measurement device. And the image signal of the image aligning unit (ie, the position of the driving circuit on the conductive glass) can be interpreted. If the position is in error, the position is corrected by the fine adjustment device, and the contact test of the contact type electrical measuring board is performed. The signal is judged by the reader.

Therefore, the detection mechanism of the alignment and conductivity of the bed-top optical component provided by the invention can detect the conductive glass in a more efficient manner to improve the output value of the product.

The present invention further provides a method for detecting the alignment and conductivity of a bed-top optical component, including: Step 1: The controller controls the displacement of the displacement device to drive the electrical measurement platform to a discharge position, and The operator places one of the conductive glasses to be tested on the electric measuring platform, and adsorbs by the vacuum suction generated by the vacuum adsorption holes; Step 2: Then the controller controls the displacement of the displacement device to drive The electrical measuring platform is connected to an electrical measuring position; step 3: the image aligning unit of the electrical measuring device performs image capturing (ie, image signal) on the driving circuit position of the conductive glass, and if there is an error, the control is performed by the control Controlling the fine adjustment device to precisely adjust the position of the electrical measurement platform until it is adjusted to the correct position; Step 4: connecting by the electrical measurement device The touch-type electrical measuring board is turned from a vertical moving position in a vertical state to a horizontal electrical measuring position in a horizontal state, so that the contact type electrical measuring board is in contact with the driving circuit of the conductive glass, and the conductive glass can be electrically detected. Step 5: After the electrical measurement of one area of the conductive glass is completed, the contact type electrical measuring board of the electrical measuring device is turned from the horizontal electrical measuring position in the horizontal state to the vertical moving position in the vertical state, and The controller then controls the displacement device to drive the electrical measurement platform to be displaced, so that another area to be tested (ie, the position of the next drive circuit) of the conductive glass is aligned with the electrical measurement device.

1‧‧‧Base

2‧‧‧ fine-tuning device

21‧‧‧ fine-tuning carrier board

22‧‧‧Rotary translation assembly

23‧‧‧ fine tuning power unit

3‧‧‧displacement device

31‧‧‧ Displacement carrier

32‧‧‧Displacement rail assembly

33‧‧‧displacement power unit

4‧‧‧Electric measurement platform

41‧‧‧Vacuum adsorption holes

5‧‧‧Electrical measuring device

51‧‧‧Support frame

52‧‧‧Z-axis power unit

53‧‧‧Electrical test stand

54‧‧‧Image Alignment Unit

55‧‧‧Contact electric measuring board

6‧‧‧ Controller

91‧‧‧Conductive glass

911‧‧‧ drive circuit

1 is a perspective assembled view of a preferred embodiment of the present invention.

Fig. 1A is a partial enlarged view of a portion A of Fig. 1.

FIG. 2 is a schematic diagram of a three-dimensional combination of a pedestal and a fine adjustment device.

Figure 3 is a perspective perspective view of Figure 2; illustrating the internal configuration of the trimming device.

4 is a perspective assembled view of the fine adjustment device and the displacement device.

Figure 5 is an exploded perspective view of Figure 4.

Figure 6 is a schematic perspective view of the displacement device.

Figure 7 is a perspective assembled view of the displacement device and the electrical measurement platform.

FIG. 8 is a schematic diagram of a three-dimensional combination of a displacement device, a fine adjustment device and an electrical measurement platform.

Figure 9 is a side elevational view of the embodiment of Figure 1.

Figure 10 is a schematic view showing the operation of the partial members of the embodiment shown in Figure 1.

Figure 11 is a top plan view of the partial member of the embodiment of Figure 1.

Figure 12 is a perspective view of another perspective of the embodiment of Figure 1.

Figure 13 is a schematic view showing the operation of the partial members of the embodiment shown in Figure 1.

Figure 14 is a block diagram of the flow of the present invention.

Referring to FIG. 1 to FIG. 13 , the detecting mechanism for the alignment and conductivity of the bed-top optical component provided by the present invention mainly includes: a base 1 , a fine adjustment device 2 , a displacement device 3 , and an electrical measurement platform 4 . An electric measuring device 5 and a controller 6 are combined.

The base 1 can be stably placed on a plane (as shown in FIGS. 1 to 3).

The fine adjustment device 2 is disposed on the working range of the susceptor 1, and can output appropriate electric power to perform precise fine displacement with respect to the displacement device 3 in the X-axis direction and the Y-axis direction. The fine adjustment device 2 has a fine adjustment carrier 21, a plurality of rotary translation components 22 disposed between the fine adjustment carrier 21 and the base 1, and a plurality of driving the fine adjustment carrier 21 along the rotational translation assembly 22 in the X-axis direction, Y. Fine adjustment of the axial direction and fine adjustment of the power unit 23 (shown in Figures 2 to 3).

The displacement device 3 is disposed on the displacement device 3 and can output appropriate power to perform displacement relative to the fine adjustment device 2 along the X-axis direction and the Y-axis direction; the displacement device 3 has a displacement carrier 31 and a plurality of settings In this a displacement slide assembly 32 between the displacement carrier 31 and the fine adjustment carrier 21 and a plurality of displacement power units 33 for driving the displacement carrier 31 along the displacement slide assembly 32 for X-axis direction and Y-axis displacement (as shown in the figure) 4 to Figure 7).

The electric measuring platform 4 is disposed on the displacement carrier 31 of the displacement device 3 to be coupled by the displacement device 3 of the displacement carrier 31 and precisely displaced by the fine adjustment device 2, and the electrical measurement platform 4 has a plurality of The vacuum suction holes 41 are arranged at a predetermined interval to generate a vacuum suction force for placing one of the conductive glasses 91 (as shown in FIGS. 7 to 9).

The electrical measuring device 5 is disposed on the base 1 for performing a contact type electrical detection on the conductive glass 91 located on the electrical measuring platform 4. The electric measuring device 5 has a supporting frame 51, a Z-axis power unit 52, an electric measuring block 53, an image aligning unit 54 and a contact electric measuring board 55; the supporting frame 51 is disposed on the base 1 And having a predetermined height, the Z-axis power unit 52 is disposed on the support frame 51 for generating a power for reciprocating movement in the Z-axis direction, and the electrical test block 53 is coupled to the Z-axis power unit 52. The image aligning unit 54 is a photographic device, which is disposed on the electrical pedestal 53 and is used for being coupled to the Z-axis power unit 52. The conductive glass 91 on the electrical test platform 4 is imaged, and the contact electrical test board 55 is disposed on the electrical test stand 53 and can be used between a horizontal electrical measurement position and a vertical moving position. Flip (as shown in Figure 1, Figure 7 to Figure 9).

The controller 6 is disposed on the side of the base 1 and is fine-tuned The device 2, the displacement device 3, the electrical measurement platform 4 and the electrical measurement device 5 are electrically connected to control the actuation and stop of the fine adjustment device 2, the displacement device 3, the electrical measurement platform 4 and the electrical measurement device 5, and can The image signal of the image aligning unit 54 (ie, the position of the driving circuit 911 on the conductive glass 91) is interpreted. If the position is in error, the position is corrected by the fine adjustment device 3, and the contact test of the contact type measuring board 55 is performed. The signal is judged by the reader.

On the conductive glass 91, a plurality of driving circuits 911 are arranged in an array, and the image aligning unit 54 of the electrical measuring device 5 is provided to interpret the model and the detecting position of the conductive glass 91.

Therefore, the above is a description of each component of the detecting mechanism of the alignment and conductivity of the bed-top optical component according to a preferred embodiment of the present invention, and the manner of assembling the same, and then the manner of use thereof is as follows: 1: First, the displacement of the displacement device 3 is controlled by the controller 6 to drive the electrical measurement platform 4 to a discharge position, and the operator places a conductive glass 91 to be placed on the electrical measurement platform 4. And adsorbed by the vacuum suction generated by the vacuum adsorption holes 41; Step 2: Then the controller 6 controls the displacement of the displacement device 3 to drive the electrical measurement platform 4 to an electrical measurement position; Step 3: The image aligning unit 54 of the electrical measuring device 5 performs image capturing (ie, image signal) on the position of the driving circuit 911 of the conductive glass 91. If there is an error, the controller 6 controls the fine tuning device 2 to precisely Adjusting the position of the electrical test platform 4 until it is adjusted to the correct position; Step 4: The contact type electrical measuring plate 55 of the electrical measuring device 5 is turned from a vertical moving position in a vertical state to a horizontal electrical measuring position in a horizontal state (as shown in FIGS. 10 to 11), so that the contact type electrical measuring is performed. The board 55 is in contact with the driving circuit 911 of the conductive glass 91, and can electrically detect the conductive glass 91. Step 5: After the electrical measurement of one area of the conductive glass 91 is completed, the contact of the measuring device 5 The electric measuring board 55 is turned from the horizontal electric measuring position in the horizontal state to the vertical moving position in the vertical state, and the controller 6 controls the displacement device 3 to drive the electric measuring platform 4 to perform displacement (as shown in FIG. 12). The other area to be tested (ie, the position of the next driving circuit 911) of the conductive glass 91 is aligned with the electrical measuring device 5.

Therefore, by repeating the above steps 3 to 5, the image aligning unit 54 performs image capturing on the position of the driving circuit 911 of the conductive glass 91, and the fine adjustment device 2 precisely adjusts the position of the electrical measuring platform 4, and The contact type electrical measuring plate 55 is turned from the vertical moving position in the vertical state to the horizontal electric measuring position in the horizontal state, so that the contact type electrical measuring plate 55 is in contact with the driving circuit 911 of the conductive glass 91 to enable the conductive glass The electrical detection is performed by 91, whereby the electrical drive of each of the area drive circuits 911 of the conductive glass 91 is continuously performed.

In addition, the Z-axis power unit 52 of the electric measuring device 5 is controlled by the controller 6 to automatically adjust the height of the Z-axis according to the thickness of the conductive glass 91 to be detected (as shown in FIG. 11).

Therefore, the detection mechanism for the alignment and conductivity of the bed-top optical component provided by the present invention can perform the detection of the conductive glass 91 in a more efficient manner to improve the output value of the product.

The detailed description of the preferred embodiments of the present invention is intended to be limited to the scope of the invention, and is not intended to limit the scope of the invention. The patent scope of this case.

In summary, this case is not only innovative in terms of space type, but also can enhance the above-mentioned multiple functions compared with the customary items. It should fully meet the statutory invention patent requirements of novelty and progressiveness, and apply for it according to law. This invention patent application, in order to invent invention, to the sense of virtue.

1‧‧‧Base

3‧‧‧displacement device

4‧‧‧Electric measurement platform

41‧‧‧Vacuum adsorption holes

5‧‧‧Electrical measuring device

51‧‧‧Support frame

6‧‧‧ Controller

91‧‧‧Conductive glass

Claims (3)

The invention relates to a detection mechanism for alignment and conductivity of a bed-top optical component, comprising: a pedestal; a fine adjustment device is disposed on the working range of the pedestal, the fine adjustment device comprises a fine adjustment carrier plate, and a plurality of fine adjustment carrier plates are disposed on the fine adjustment carrier plate a rotary translation assembly between the base and a plurality of fine-tuning power units for driving the fine-tuning carrier plate to perform fine displacement in the X-axis direction and the Y-axis direction along the rotational translation assembly and finely rotating in the θ direction, the fine adjustment device outputs appropriate power along The X-axis direction and the Y-axis direction are finely displaced relative to the displacement device; a displacement device is disposed on the fine adjustment carrier of the fine adjustment device, the displacement device includes a displacement carrier, and a plurality of displacement carriers are disposed on the displacement carrier and the fine adjustment carrier a displacement slide assembly between the plates and a displacement power unit for driving the displacement carrier along the displacement slide assembly for X-axis direction and Y-axis direction, and the displacement device can output appropriate power along the X-axis direction and The Y-axis direction is displaced relative to the base; an electrical measurement platform is disposed on the displacement carrier of the displacement device, and the electrical measurement platform is adapted to receive the displacement device The fine adjustment device is displaced and displaced for a conductive glass holder, and the electrical measurement platform has a plurality of vacuum adsorption holes arranged at a predetermined interval to generate vacuum suction on the placed conductive glass; and an electrical measurement device, including a support frame, a Z-axis power unit, an electric test stand, at least one image alignment unit and a contact type electrical test board; the support frame is disposed on the base, and the Z-axis power unit is disposed on the support frame And a power for reciprocating in the Z-axis direction, the electric measuring block is connected to the Z-axis power unit to be reciprocally displaced along the Z-axis direction by the Z-axis power unit. The image aligning unit is disposed on the electrical measuring base for taking image of the conductive glass located on the electrical measuring platform, and providing an image signal for the controller to determine whether the position of the driving circuit on the conductive glass is correct. The electric measuring board is disposed on the electric measuring seat, and can perform a 90 degree flip between a horizontal electric measuring position and a vertical moving position, and provides a contact test signal for the controller to interpret, and the electric measuring device is used for Conducting a contact type electrical tester on the conductive glass on the electrical measurement platform; a controller electrically connected to the fine adjustment device, the displacement device, the electrical measurement platform and the electrical measurement device to control the fine adjustment The device, the displacement device, the electric measuring platform and the actuating and stopping of the electric measuring device, and can perform the interpretation of the position of the driving circuit on the conductive glass by the image signal of the image aligning unit, if the position has an error Position correction means through the fine adjustment, the reader is arbitrated test signal contacts contact the electrical measuring plate. The apparatus for detecting alignment and conductivity of a bed-top optical component according to claim 1, wherein the image alignment unit is a photographing device. A method for detecting the alignment and conductivity of a bed-top optical component includes: Step 1: The controller controls the displacement of the displacement device to drive the electrical measurement platform to a discharge position, and the operator will Detect one of the conductive glass Putting on the electric measuring platform and adsorbing by the vacuum suction generated by the vacuum adsorption holes; Step 2: controlling the displacement of the displacement device by the controller to drive the electric measuring platform to an electric measuring position; Step 3: The image aligning unit of the electrical measuring device performs image capturing (ie, image signal) on the driving circuit position of the conductive glass. If there is an error, the controller controls the fine adjusting device to precisely adjust the power. Measure the position of the platform until it is adjusted to the correct position; Step 4: The contact type electrical measuring board of the electric measuring device is turned from the vertical moving position in the vertical state to the horizontal electric measuring position in the horizontal state, so that the contact type electrical measuring The board is in contact with the driving circuit of the conductive glass, and the conductive glass can be electrically detected; Step 5: After the electrical measurement of one area of the conductive glass is completed, the contact type electrical measuring board of the electric measuring device is The horizontal electric measurement position in a horizontal state is turned to a vertical movement position in a vertical state, and the controller further controls the displacement device to drive the electric measurement platform to perform displacement, so that the conductive glass is another Sensing region (i.e., a driving circuit at a position) to the position measuring device.