201128198 六、發明說明： 【發明所屬之技術領域】 土發明侧於—種戰設備，_是關於—_控 试汉備’可測试觸控面板、具備觸控面板 ^ 面板之各式電子產品。 具備觸控 【先前技術】 觸控面板為一貼附在液晶顯示器 阻式'電容式觸控面= 及於各種尺寸之面板。觸控面板從面板感應 m息:傳遞至控制器(control Ic)冤集處“ :=驅動軟硬體(μ—來完成-系列 hi可職、纽-闕 增?j子產品時，除了單點觸控測試外，新工 試ί面板測試，是以人1手觸摸的方式進行測 ϋ年=面板的市場需求大增後，人工測試方式遂漸^ 被淘汰，而改採用觸控面板測試機。 電腦觸ΐ面板測試機大多是由1個點_試機連接 ^^主機賴成。紅理係#由賴調整控 ίί與點制試機台的介面，墟纖台上測試筆之位i及所 =ΪΓ雜與預設的標準值進行比對，判斷被測觸控:板工 (ίί ίϊϊ試方式之速度，近來有業者開發多測試頭 式機台，例如中華民國新型專利_9505揭 測頭雙台面可定位之觸控面板測試機，同時測試三個 =面板，以提高測試產能。此外，甚至再設置—相鄰的3測 试頭之測試機’以兩平行機台作為待測觸控面板JL機（load) 201128198 i=rd)之支援’達到不物持續測試狀態，以提 術的單點觸控面板的測試因=== ⑽f:T::實際觸摸點:== 璃或力=;:)除，板本體(破 因此，‘是重要的因素。 產業界錢ίϊ之重點測試之觸 發明了符合«上之要求，本 電阻式及電容觸控_試設備’可切換測試 效率本發明之目的之一’是在提供一種測試設備，可提高測試 觸控面板進行時，在提供-種測試設備，可針對一 進行單點_試’敍對多片觸控面板同時 :板本 201128198 含複數個偵測單元及一訊號處理器，1 ^ ^ ^ ^ 旋轉機構設置於多轴機構:== 該控制模組，與該偵測模組耦接， 目 ^,j t # 〇 疋員料存取早元及-資料分析單元。該控 組控制參數，控制該複數個_單元之位置控二=201128198 VI. Description of the invention: [Technical field to which the invention belongs] The invention of the earth is in the field of warfare equipment, _ is about - _ test trial Han's testable touch panel, various electronic products with touch panel ^ panel . With touch [Prior Art] The touch panel is attached to the LCD display Resistive 'capacitive touch surface= and various sizes of panels. The touch panel senses the information from the panel: it is passed to the controller (control Ic). “:=Drives the software and hardware (μ—to complete the series-hi-hi, 纽-阙增?j sub-products, except for the single In addition to the touch test, the new test panel test is carried out by means of a person's touch. After the market demand for the panel is greatly increased, the manual test method is gradually eliminated, and the touch panel test is adopted. Most of the computer touch panel testers are connected by 1 point _ test machine ^^ host Lai Cheng. Red Lie system # 赖 调节 control ίί and point test machine interface, test the position of the pen on the market i and the = noisy and the preset standard value comparison, judging the measured touch: the board ( ίί ί ϊϊ speed of the test mode, recently developed by the industry to develop a multi-test head machine, such as the Republic of China new patent _9505 The touch panel tester with two countertops that can be positioned is tested, and three=panels are tested at the same time to improve the test capacity. In addition, even the tester of the adjacent 3 test heads is used as the two parallel machines. Test touch panel JL machine (load) 201128198 i=rd) support 'to achieve the continuous test According to the test of the single-touch panel of the technique, === (10)f:T:: actual touch point:== glass or force=;:) In addition, the board body (breaking, therefore, 'is an important factor. Industry The key test test of Qian ϊ 发明 invented the requirements of the above-mentioned requirements, this resistive and capacitive touch _ test equipment can switch the test efficiency one of the purposes of the present invention is to provide a test device that can improve the test touch panel At the time of providing a test device, a single point _ test can be performed for a plurality of touch panels simultaneously: the board 201128198 includes a plurality of detection units and a signal processor, 1 ^ ^ ^ ^ rotation mechanism setting In the multi-axis mechanism: == The control module is coupled to the detection module, and the jt # 〇疋 料 access material is accessed by the early element and the data analysis unit. The control group controls the parameters and controls the plurality of _ unit position control two =
接收該個_域健伽情料賴齡析單y 該人機介面模組，與該控制模_接，包含—接收介面、 -處理器、-輸人介至少—顯示^ =料分析單元輸出之訊號。該處理器係用以== 之訊號後產生-輸出資料且顯示於該顯示器上。該輸入 以狐來自-者之輸人後提供該控制參數予該 控制核組’讀依據該使財的輸人進行該馳面板之測試。 上述實施例中，該輸出資料可選自下列族群之一者或 ^ ·靜悲感應器解析度（statie sensQr聊祕。η)、線 精準度（line accuracy)、應答時間（resp〇nse time)、抖動 =比 =崎可_最高距離(~^ 上述實施例中，該人機介面模組可為一電腦。 上述實施例中，該多軸機構可為具備χ、y及z軸之三轴 機構，X及y軸之位移速度範圍為〇mm/sec〜3〇〇mm/sec。 土述實施例中’該複數個感測頭可沿χ或y軸設置排成一 列，藉由該旋轉機構可使該複數個感測頭沿y或X轴排列，以 便對觸控面板進行X及y軸二軸之多點測試。另外，可藉由該 旋轉機構之旋轉，對觸控面板進行二對角線的多點測試。此 外，該旋轉機構可任意調整該複數個感測頭排列之方向。 上述實施例中’該待測物之對角線尺寸可為2 2吋〜6〇吋。 根據本發明的測試設備，因具備多個感測頭配合多軸及旋 轉機構，藉由適當地控制模組的控制，可有效地提高測試效 201128198 二二十對—觸控面板進行單點或同時多點測試，或者對 多:面板同時進行單點或同時多點測試，並可測試觸控面 之顯示11及具備觸控面板之各式電子產品。 【實施方式】 以下，詳細說明本發明的實施態樣。 本發明之-實施例揭露—測試設備丨⑻。第丨醜示根據 本f明兮一實施例的測試設備1〇〇之示意圖。該測試設備励 包^，測模組雇、一控制模组3〇〇及一人機介面模組4〇〇。 、一f A，717根據本發明之-實施例的侧模組200之俯 犯圖顯示第2A ®中該偵測模組200之側視示 二圖二^測模組2〇0具有Xyz三轴機構210及一旋轉機構 211，該旋轉機構叫設置於三軸機構⑽上。該偵測模組測 ，3 1個偵測單元220及-訊號處理器23〇。該偵測單元22〇 言轉機構211上且包含3個感測頭22卜例如該感測 Ϊϋΐί仿真手指。該_頭221偵測來自一待測物⑴(例 •谷二、控面板）之訊號且產生一偵測資料。於一實施例 該？測頭221為接觸該待測物1〇之感測頭，而於另一實 ^例中’該感測頭221可為不接觸該待測物1()之電阻式感測 ί 一實施例中’該感測頭221為不接觸該待測物1〇之 二頭’亦即該測試設備勘可對電容式觸控面板進行 非接觸式多點測試。 參照第1圖’該控制模組3〇〇，與該偵測模組雇耦接， 制該侧模組、接收該_資料及處理該偵測資料。該 包含一控制單元310、一資料存取單元320及-刀丨！早兀330。該控制單元根據一組控制參數cp，控制 ^偵^，兀220之位置（例如xyz座標及旋轉角度），該資料 J20 5收且儲存該制資料且提供該偵測資料予該 ιοΐ- 严測模組300可為控制板，可對制物 Αυΐϋ $5時多點測試。於―實施例中，該控繼組300 為可拆換式之控制H，用以選擇職電阻式觸控面板或電容式 201128198 觸控面板。 參照第1圖’該人機介面模組400，與該控制模組3〇〇耦 接。該人機介面模組400包含一接收介面41〇、一處理器420、 一輸入介面430及一顯示器440。該接收介面410接收該資料 分析單元330輸出之訊號後傳遞給該處理器42〇。該處理器42〇 處理該接收介面410輸出之訊號後產生一輸出資料〇D且顯示 於該顯示器440上。該輸入介面430係用以接收來自一使用者 之輸入後提供控制參數CP予該控制模組3〇〇，以便依據該使 用者的輸入進行該觸控面板之測試。例如該人機介面模組4⑻ 可為電腦，該處理器420可為中央處理器，該接收介面41〇可 為設置於電腦插槽中的介面卡，該輸入介面43〇可為鍵盤或滑 鼠，該顯示器440可為液晶顯示器或其他顯示器。 出資料OD可選自下列族群之一者或其任意組 合.靜態感應器解析度(static sensor resolution)、線精準 度（line accuracy)、應答時間（resp〇nse time):抖動 (jitter)、手勢(gesture)、可偵測最高距離(pr〇ximity)及訊 號雜訊比（SNR)。第3A圖表示感測頭221與待測物1〇之 位置關係，其中感測頭221與待測物1〇的距 的直徑為w。如第3A圖所*，感測頭221可在χ及 上自由移動，d大於0時，進行非接觸式測試，d等於〇或小 於0時’進行接觸式測試’此時可測試的數據包含有線精 應贫答時間、抖動、可偵測最高距離及訊號雜訊比。 =卜’第3B圖表示感測頭221與待測物1〇之位置關係，1 :221與待測物10的距離為d，_頭的直徑為二 ϊί循，感測頭221沿⑻、⑼、⑹、⑷、⑹、（Q 〆制钟衣持、貝進仃測試，⑻、⑼、⑷、⑻可為d等於0時進 i此時可測試的數據包含有線性度、應答時間及可 價須!J敢向距離。 Οιηιη/ϋίΪ三轴機構210 ’其X&y轴之位移速度範圍為 3〇〇mm/sec。各軸位移的解析能力為0.001mm，重覆Receiving the _ domain jianjiao material aging age analysis y the human machine interface module, connected with the control module, including - receiving interface, - processor, - input at least - display ^ = material analysis unit output Signal. The processor generates and outputs data for the == signal and displays it on the display. The input provides the control parameter to the control core group after the fox comes from the input, and the test is performed according to the input of the money. In the above embodiment, the output data may be selected from one of the following groups or ^ 静静 sensor resolution (statie sensQr Talk. η), line accuracy (line accuracy), response time (resp〇nse time)抖动======================== In the above embodiment, the human interface module can be a computer. In the above embodiment, the multi-axis mechanism can be three axes with χ, y and z axes The displacement speed of the mechanism, X and y axes ranges from 〇mm/sec to 3〇〇mm/sec. In the embodiment, the plurality of sensing heads can be arranged in a row along the χ or y axis, by the rotation. The mechanism can arrange the plurality of sensing heads along the y or X axis to perform multi-point testing of the X and y axes on the touch panel. In addition, the touch panel can be rotated by the rotation of the rotating mechanism. The multi-point test of the diagonal line. In addition, the rotating mechanism can arbitrarily adjust the direction of the arrangement of the plurality of sensing heads. In the above embodiment, the diagonal dimension of the object to be tested can be 2 2 吋 6 6 。. The test apparatus according to the present invention has a plurality of sensing heads for multi-axis and rotating mechanism, by appropriately The control of the module can effectively improve the test effect 201128198 twenty-two pairs - touch panel for single point or simultaneous multi-point test, or more: panel simultaneously single-point or simultaneous multi-point test, and can test touch The display of the surface 11 and various electronic products including the touch panel. [Embodiment] Hereinafter, an embodiment of the present invention will be described in detail. The present invention discloses an embodiment of the present invention - a test device (8). A schematic diagram of a test device according to an embodiment of the present invention. The test device includes a package, a test module, a control module 3, and a human interface module 4, a f A, 717 according to The tilting diagram of the side module 200 of the embodiment of the present invention shows that the side view of the detecting module 200 in the second embodiment has two Xyz triaxial mechanisms 210 and a rotating mechanism. 211, the rotating mechanism is set on the three-axis mechanism (10). The detecting module measures 31 detecting units 220 and - signal processor 23A. The detecting unit 22 is on the rotating mechanism 211 and includes 3 The sensing head 22, for example, the sensing sensor 仿真 simulates a finger. The _head 221 detects from a The signal of the object to be tested (1) (example, valley 2, control panel) generates a detection data. In one embodiment, the probe 221 is a sensing head that contacts the object to be tested, and the other is In the example, the sensing head 221 can be a resistive sensing that does not touch the object to be tested 1 (in the embodiment), the sensing head 221 is not touching the two ends of the object to be tested. The test device can perform a non-contact multi-point test on the capacitive touch panel. Referring to FIG. 1 'the control module 3', the sensor module is coupled to the detection module, and the side module is received and received. _Information and processing of the detection data. The control unit 310, a data access unit 320 and a knife are included! As early as 330. The control unit controls the position of the Detector 220, such as the xyz coordinate and the rotation angle, according to a set of control parameters cp, and the data J20 5 receives and stores the data and provides the detection data to the ιοΐ- The module 300 can be a control panel that can test multiple points for the product Αυΐϋ $5. In the embodiment, the control group 300 is a detachable control H for selecting a resistive touch panel or a capacitive 201128198 touch panel. Referring to Figure 1, the human interface module 400 is coupled to the control module 3A. The human interface module 400 includes a receiving interface 41 , a processor 420 , an input interface 430 , and a display 440 . The receiving interface 410 receives the signal output by the data analyzing unit 330 and transmits the signal to the processor 42. The processor 42 processes the signal output by the receiving interface 410 to generate an output data 〇D and displays it on the display 440. The input interface 430 is configured to receive an input from a user and provide a control parameter CP to the control module 3 to perform the test of the touch panel according to the input of the user. For example, the human interface module 4 (8) can be a computer, the processor 420 can be a central processing unit, and the receiving interface 41 can be an interface card disposed in a computer slot. The input interface 43 can be a keyboard or a mouse. The display 440 can be a liquid crystal display or other display. The data OD may be selected from one of the following groups or any combination thereof. Static sensor resolution, line accuracy, response time (resp〇nse time): jitter, gesture (gesture), detectable maximum distance (pr〇ximity) and signal-to-noise ratio (SNR). Fig. 3A shows the positional relationship between the sensing head 221 and the object to be tested, wherein the diameter of the distance between the sensing head 221 and the object to be tested is w. As shown in Fig. 3A, the sensing head 221 can move freely on the χ and the above, when d is greater than 0, the non-contact test is performed, and when d is equal to 〇 or less than 0, the 'contact test' is performed. Wired poor response time, jitter, detectable maximum distance and signal noise ratio. =B' Figure 3B shows the positional relationship between the sensing head 221 and the object to be tested 1 , the distance between 1:221 and the object to be tested 10 is d, the diameter of the head is 2ϊ, and the head 221 is along (8). (9), (6), (4), (6), (Q 〆 钟 钟 衣, 贝 仃 仃 test, (8), (9), (4), (8) can be d equal to 0 when the data can be tested at this time including linearity, response time and Price is required! J dare to distance. Οιηιη/ϋίΪ three-axis mechanism 210 'The displacement speed of its X&y axis is 3〇〇mm/sec. The resolution of each axis displacement is 0.001mm, repeat
LSI 201128198 精度為±0.0lnun。 日月，該旋轉機構可旋轉偵測單元使複數個感測 角？排列。於一實施例中，該3個感測頭沿X軸設置 旋轉機構可使該3個感測頭沿y軸排列，如 :目二、I·工f板進行X及y轴二轴之同時多點測試（例如2點 ，該3個感測頭可沿y轴設置排成—列，藉由該 ^轉機構可使該3佩_沿χ _列，如此可義控面板進 5 21轴之同時多點測試。另外，藉由該旋轉機構可使 k個感測頭沿對角線進行同時多點測試。LSI 201128198 has an accuracy of ±0.0lnun. In the sun and the moon, the rotating mechanism can rotate the detecting unit to make a plurality of sensing angles? arrangement. In one embodiment, the three sensing heads are arranged along the X-axis to enable the three sensing heads to be arranged along the y-axis. For example, the two axes of the I and the y-axis are simultaneously performed on the X-axis and the y-axis. Multi-point test (for example, at 2 o'clock, the three sensing heads can be arranged in a row along the y-axis. By means of the ^-turning mechanism, the 3-spans can be arranged along the χ _ column, so that the control panel can enter the 5 21 axis. At the same time, multiple points are tested. In addition, the k-sensors can be simultaneously multi-point tested along the diagonal by the rotating mechanism.
4曰缺j明之另一實施例揭露一測試設備1(U。第5A酬示 ，據^發明之另-實施例的測試設備1〇1之示意圖，第5B圖 二=5A圖中該偵測模組2〇1之側視示意圖。該測試設備⑼ ί二ΐ測模組2G1、—控制模組3G1及一人機介面模組仙。 f if組301及該人機介面模組401的構成與測試設備1〇〇 ^控麵組3GG及該人機介面模組類似，在此，其相同部 2再，贅述。該偵測模組2〇1具有xyz三轴機構21〇，及旋轉機 ，^及211’’且包含2個偵測單元22〇’、220，，及一訊號處理 盗230。各制皁疋22〇,、22〇，，分別設置於該旋轉機構211， ^211上且包含3個感測頭221，及221”。該控制模組3⑴根 據控制參數cp分碰繼細單元22G，、22()，，，職測物^ ϋ同時進行測試。說明至此’熟悉本領域之技術者應能理 ，偵測模_献，細單讀婦機觀三械構之運作方 式理’在此不再費述。例如偵測模組可具有3、4或6個 測試單元，可同時測試3、4或ό片待測物。 於本實施例中’該輪出資料OD可選自下列族群之一者 或其任意組合：靜態感應器解析度（static sensor resolution)、線精準度（Hne accuracy)、應答時間（resp〇nse ，me)、抖動（jmer)、手勢（gesture)、可偵測最高距離 (proximity)及訊號雜訊比（SNR)。該三軸機構21〇，，其X 及y軸之位移速度範圍為各轴位移的解 201128198 析月b力為O.OOlnun ’重覆精度為士o.oimm。 此外’第6圖顯示根據本發明之一實施例之感測頭221，，， 與待測物13之位置關係。如第6圖所示，於該實施例中，偵 測單元220”，可包含有2個感測頭22Γ”，使用2個感測頭221，，， 偵測待測物13 ’其中2個感測頭221”，的直徑分別為Wi及 W2 ’ W1及W2可為相同或相異，感測頭221”，與待測物13 的距離為d ’可測試的數據包含有靜態感應器解析度⑻扣沁 sensor resolution)、線精準度（line accuracy)、應答時間 (response time)、抖動(jitter)、手勢(gesture)、可偵測最 高距離(proximity)及訊號雜訊比（SNR)。 根據本發明之實施例’該待測物可為例如選自個人數位助 理(PDA)、智慧型手機(Smart phone)、導航機(GPS)、影音播放 器(MP3、MP4) '攝影機(DSC)、電子書(E-book)、筆記型電腦 _)、工業電腦、AOI中任一種電子產品所使用之電容式或電 阻式觸控面板。 以上雖以特定實施例說明本發明，但並不因此限定本發明 之庫έ*圍’ ✓、要不脫離本發明之要旨’熟悉本技藝者瞭解在不脫 離本發明的意圖及範圍下可進行各種變形或變更。 【圖式簡單說明】 第1圖顯示根據本發明之一實施例的測試設備1〇〇之示意圖。 第2Α圖顯示根據本發明之一實施例的偵測模組200之俯視示 意圖。 第2Β圖顯示第2Α圖中該偵測模組200之側視示意圖。 第3圖顯示根據本發明之一實施例之感測頭221與待測物1〇 之位置關係。 第4圖顯示根據本發明之一實施例之感測頭221與待測物1〇 之位置關係。 第5Α圖顯示根據本發明之另一實施例的測試設備101之示意 圖。 第5Β圖顯示第3Α圖中該偵測模組201之侧視示意圖。 201128198 第6圖顯示根據本發明之一實施例之感測頭22Γ”與待測物 13之位置關係。 【主要元件符號說明】 100, 101 :測試設備 200, 201 ··偵測模組 210, 210’ ：三轴機構 211,211’, 211” ：旋轉機構 220, 220’, 220”,220’’’ ：偵測單元 221, 221’，221”,22Γ” ：感測頭 230,230’ ：訊號處理器 300,301 :控制模組 310 :控制單元 320 :資料存取單元 330 :資料分析單元 400,401 :人機介面模組 410 :接收介面 420 :處理器 430 :輸入介面 440 :顯示器 CP :控制參數 OD :輸出資料 10, 11，12,13 :待測物Another embodiment of the invention discloses a test device 1 (U. 5A reward, according to another embodiment of the invention - a schematic diagram of the test device 1〇1, the 5B Figure 2 = 5A map The side view of the module 2〇1. The test device (9) ΐ 2 test module 2G1, the control module 3G1 and a human interface module s. f if group 301 and the human interface module 401 The test device 1〇〇 control panel 3GG is similar to the human interface module, and the same portion 2 is further described herein. The detection module 2〇1 has an xyz triaxial mechanism 21〇, and a rotating machine. And 211'' and including two detecting units 22〇', 220, and one signal processing thief 230. The saponins 22〇, 22〇 are respectively disposed on the rotating mechanism 211, ^211 and There are three sensing heads 221, and 221". The control module 3(1) is divided according to the control parameter cp, and the second unit 22G, 22(), and the test object are simultaneously tested. The technicians should be able to handle the problem, and the mode of operation of the three-machine structure will not be described here. For example, the detection module can have 3, 4 or 6 The test unit can simultaneously test the 3, 4 or the bracts to be tested. In the present embodiment, the rounded data OD can be selected from one of the following groups or any combination thereof: static sensor resolution , line accuracy (Hne accuracy), response time (resp〇nse, me), jitter (jmer), gesture (gesture), detectable maximum distance (proximity) and signal noise ratio (SNR). 21〇, the displacement velocity range of the X and y axes is the solution of the displacement of each axis. 201128198 The monthly b force is O.OOlnun 'The repetition accuracy is ±o.oimm. In addition, the 6th figure shows the implementation according to one of the inventions. For example, as shown in FIG. 6, in the embodiment, the detecting unit 220" may include two sensing heads 22", using 2 The sensing heads 221,,, detect the object to be tested 13 'two of the sensing heads 221 ′′, respectively, Wi and W2 'W1 and W2 may be the same or different, the sensing head 221 ′′, and The distance of the object 13 is d 'testable data includes static sensor resolution (8) sensor resolution), line accuracy Line accuracy, response time, jitter, gesture, detectable maximum distance, and signal to noise ratio (SNR). According to an embodiment of the present invention, the object to be tested It can be, for example, selected from a personal digital assistant (PDA), a smart phone, a navigation device (GPS), a video player (MP3, MP4), a camera (DSC), an e-book, and a notebook. A capacitive or resistive touch panel used in any computer product, such as computer _), industrial computer, or AOI. The present invention has been described with respect to the specific embodiments of the present invention, but is not intended to limit the scope of the present invention. It is understood that those skilled in the art can understand that the invention can be carried out without departing from the scope and scope of the present invention. Various deformations or changes. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a view showing a test apparatus 1 according to an embodiment of the present invention. The second drawing shows a top view of a detection module 200 in accordance with an embodiment of the present invention. The second diagram shows a side view of the detection module 200 in the second diagram. Figure 3 shows the positional relationship of the sensing head 221 and the object to be tested 1 根据 according to an embodiment of the present invention. Fig. 4 is a view showing the positional relationship between the sensing head 221 and the object to be tested 1 according to an embodiment of the present invention. Figure 5 shows a schematic diagram of a test apparatus 101 in accordance with another embodiment of the present invention. Figure 5 shows a side view of the detection module 201 in the third diagram. 201128198 FIG. 6 shows the positional relationship between the sensing head 22Γ” and the object to be tested 13 according to an embodiment of the present invention. [Main Component Symbol Description] 100, 101: Test Equipment 200, 201 · Detection Module 210, 210': three-axis mechanism 211, 211', 211": rotating mechanism 220, 220', 220", 220''': detecting unit 221, 221', 221", 22"": sensing head 230, 230': signal processor 300, 301: control module 310: control unit 320: data access unit 330: data analysis unit 400, 401: human interface module 410: receiving interface 420: processor 430: input interface 440: display CP: control parameter OD: output data 10, 11,12,13 : DUT