TW200522173A - Nanoimprint method with uniform pressurization and method for protecting mold thereof - Google Patents

Nanoimprint method with uniform pressurization and method for protecting mold thereof Download PDF

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Publication number
TW200522173A
TW200522173A TW92137577A TW92137577A TW200522173A TW 200522173 A TW200522173 A TW 200522173A TW 92137577 A TW92137577 A TW 92137577A TW 92137577 A TW92137577 A TW 92137577A TW 200522173 A TW200522173 A TW 200522173A
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Taiwan
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pressure
transfer
power source
mold
uniform pressure
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TW92137577A
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Chinese (zh)
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TWI228764B (en
Inventor
Yu-Lun Ho
Chia-Hung Lin
Chia-Chun Hsu
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Ind Tech Res Inst
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping

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  • General Physics & Mathematics (AREA)
  • Shaping Of Tube Ends By Bending Or Straightening (AREA)

Abstract

The present invention relates to a nanoimprint method with uniform pressurization and a method for protecting a mold thereof. The invented method is applied on a nanoimprint device with uniform pressurization, and comprises: setting a power source of the nanoimprint device at a position control mode in order to drive an external mask to advance, and enabling the external mask to drive a first carrying unit loaded with an imprint mold to advance towards a second carrying unit loaded with a moldable material layer; switching the power source to a pressure control mode when the imprint mold contacts the moldable material layer; enabling the power source to apply a pressure on the external mask so that the pressure transmits from the external mask to the imprint mold and the moldable material layer; enabling the power source to maintain at a pressure maintenance mode when the pressure reaches a predetermined value; maintaining the pressure maintenance mode for a specified period of time, and then enabling the power source to drive the external mask to advance in a reverse direction so that the imprint mold and the moldable material layer separate from each other and a mold release step is completed, thereby achieving an accurate control of speed, pressure and location with multiple stages, an uniform imprint control and an imprint depth control.

Description

200522173 五、發明說明α) .【發明所屬之技術領域】 本發明係關於一種均勻施壓奈米轉印方法與其模具保 護方法,尤指一種適用於均勻施壓奈米轉印裝置且可提升 轉印成形品質的均勻施壓奈米轉印方法與其模具保護方 法。 【先前技術】 在傳統半導體製程中,微影(L i t h 〇 g r a p h y )製程多係 採用光學微影技術,並以此技術形成晶片或基板上所需之 導電跡線(T r a c e ),惟此一方法由於受到光源繞射極限的 g制,因此當加工線寬在1 0 0奈米以下時即很難運用光學 式微影來達成,產生線路線寬上的發展限制;因此,近年 來所發展出之奈米轉印微影術(N a η〇i m p r i n t Lithography, NIL)由於可突破此一線寬極限,且具有微 影解析度高、製造速度快與生產成本低等特色,已成為現 今最熱門之微影加工技術。 此一技術由於具有奈米等級之精密度,因此其轉印過 程之品質控制勢必得較一般熱壓成形(Ho t Embos s i ng )製 程更為嚴格,惟茗自前述操作流程觀之,可知在奈米轉印 過程中,若轉印所施之壓力不均,將造成如第7A圖所示轉 _深度不一且模具2 2與奈米結構2 3局部扭轉變形之現象; 又如第7 B圖所示,當模具2 2與基板3 1間之平行度不佳時, 轉印區域内之奈米結構2 3將呈現傾斜狀態,大幅降低轉印 品質,且此兩種情況均可能於脫模時造成奈米結構2 3的損 傷;因此,綜上所述,轉印過程的轉印力不均與平行度不200522173 V. Description of the invention α). [Technical field to which the invention belongs] The present invention relates to a method for uniformly pressing a nano transfer film and a method for protecting a mold thereof, and particularly to a nano transfer device suitable for evenly pressing a film and capable of improving the transfer speed. Nano press transfer method with uniform pressure for print forming quality and its mold protection method. [Previous technology] In the traditional semiconductor manufacturing process, the lithography process mostly uses optical lithography technology, and uses this technology to form the required conductive traces (T race) on the wafer or substrate. The method is subject to the g system of the diffraction limit of the light source. Therefore, when the processing line width is less than 100 nm, it is difficult to use optical lithography to achieve the limit of the development of the line line width. Therefore, it has been developed in recent years. Nanoprint Lithography (NIL) can break through this line width limit, and has the characteristics of high lithography resolution, fast manufacturing speed and low production cost, which has become the most popular today. Lithographic processing technology. Because this technology has nano-level precision, the quality control of the transfer process is bound to be stricter than the general hot stamping (Hot Embos sing) process. However, from the foregoing operation process, it can be seen that In the process of nanometer transfer, if the pressure applied by the transfer is uneven, as shown in Fig. 7A, the rotation and depth will be different, and the mold 2 2 and the nano structure 2 3 will be partially twisted and deformed. As shown in Figure B, when the parallelism between the mold 2 2 and the substrate 31 is not good, the nano-structure 2 3 in the transfer area will appear inclined, which will greatly reduce the transfer quality. Damage to the nano-structure 23 during demolding; therefore, in summary, the transfer force unevenness and parallelism of the transfer process

17692工研院.ptd 第4頁 200522173 五、發明說明(2) 佳顯然為成形品質控制上的一大難題,亦為量產上的一大 限制,而此些習知問題多半係由於轉印設備之設計與控制 所引起,顯然亦需藉由轉印設備與其控制方法之改良來解 決。 第8圖係為美國專利第6, 4 8 2, 7 4 2號案所提出之流體 壓力轉印微影裝置,其係將模具7 2與已塗佈可成形材料層 之基板7 3密封後,置入一密閉室7 4中,並於加熱至一預定 的成形溫度後,灌入流體以對模具7 2施壓而進行奈米結構 轉印成形;此一設計由於需於轉印前預先進行模具7 2、基 板7 3的堆疊與密封,且於轉印成形後亦必須解除該密封狀 態才能進行脫模,不僅增加前、後處理之成本,也將延長 成形週期,並造成控制程序上之不連貫,難達流暢且精準 之轉印控制。 第9圖係為PCT專利第W〇0 1 4 2 8 5 8號案所提出之奈米轉 印裝置與方法,其係配置一壓力艙8 2,並藉由控制流體進 出該壓力艙8 2之壓力穴8 3,使模具8 1因彈性膜8 4之變形而 向基板8 5移動或遠離,進而完成轉印或脫模動作;惟此方 法中若該模具8 L未置於該彈性膜8 4之正中央,則當流體灌 入該壓力穴8 3時,該模具8 1周圍之彈性膜8 4將具有一不對 稱膨脹而產生偏移,且此一流程至少需要上、下兩個獨立 動力源,其同步性與動力源之干涉均極易造成控制上之不 穩定。 綜上所述,即知現有轉印設備與控制方法常因模具與 奈米結構間之平行度不佳,或因轉印壓力控制不慎,而有17692 Industrial Research Institute.ptd Page 4 200522173 V. Description of Invention (2) Good is obviously a major problem in forming quality control and a major limitation in mass production, and most of these problems are due to transfer The design and control caused by the equipment obviously need to be solved by the improvement of the transfer equipment and its control method. FIG. 8 is a fluid pressure transfer lithography device proposed in U.S. Patent No. 6, 4 8 2, 7 4 2 which is a mold 7 2 and a substrate 7 3 coated with a formable material layer after sealing , Placed in a closed chamber 74, and heated to a predetermined forming temperature, filled with fluid to apply pressure to the mold 72 to perform nanostructure transfer molding; this design requires advance The stacking and sealing of the mold 7 2 and the substrate 7 3, and the sealing state must be released after the transfer molding can be performed, which not only increases the cost of pre- and post-processing, but also prolongs the molding cycle and causes control procedures. Incoherent, it is difficult to achieve smooth and precise transfer control. FIG. 9 is a nano transfer device and method proposed in PCT Patent No. WO 1 4 2 8 5 8 which is equipped with a pressure chamber 8 2 and controls the fluid to enter and exit the pressure chamber 8 2 The pressure cavity 8 3 causes the mold 8 1 to move or move away from the substrate 8 5 due to the deformation of the elastic film 8 4 to complete the transfer or demolding action; however, if the mold 8 L is not placed in the elastic film in this method The center of 8 4, when the fluid is poured into the pressure cavity 8 3, the elastic film 8 4 around the mold 8 1 will have an asymmetric expansion to cause offset, and this process needs at least two upper and lower Independent power source, its synchronization and interference of power source can easily cause instability in control. In summary, it is known that the existing transfer equipment and control methods are often caused by poor parallelism between the mold and the nanostructure, or due to careless transfer pressure control.

17692工研院.ptd 第5頁 200522173 五、發明說明(3) 脫形 於成 或與 壞度 破精 具印 模轉 成其 造響 能影 可幅 並大 題傷 問損 之的 擊構 撞結 構米 結奈 米成 奈造 與段 具階 模模 具 模 其 與 法 方 印 轉 。米 命奈 壽壓 用施 使勻 之均 備種 設一 印發 轉開 了何 低如 降, 亦此 , 因 質 品 轉確 升, 提壞 ,破 置之 位構 與結 度米 速奈 、或 力具 壓模 印免 轉避 其並 制, 控度 確勻 精均 以印 ,轉 法與 方度 護深 保印 題 =0 發 研 之 臨 面 切 迫 需 所 域 領1 關容 相内 此明 為發 已ί 印護 轉保 制具 控模 確其 精與 可法 種方 一印 供轉 提米 在奈 即壓 的施 目句 一均 之的 明度 發勻 本均 ,印 此轉 因與 。 度法 ·方 壓轉 、米 度奈 速壓 段施 多勻 對均 針的 可質 種品 一印 供轉 提升 在提 即以 的制 目控 一配 再搭 之行 明進 發置 本位 及 力 間 時 期 週 程 行 低 降 可 g-nn 一 種 - 供 提 。在 法即 方的 護目 保一 具又 模之 其明 與發 法本 方 印 壓 受 致 不 具 。 模 法護 方保 護可 7K. 保種 具一 模供 其提 與在 法即 方的 印目 轉一 米另 奈之 壓明 施發 勻本 均 的 施 勻 均 。之 法出 方提 護所 保明 具發 模本 其, 與的 法目 方他 印其 轉及 米述 奈前 壓達 施為 勻 , 均此 的因 壞 破 該一 ,第 置的 裝具 印模 轉用 米印 奈轉 壓載 施承 勻以 均用 一括 於包 用係 運置 係裝 ,印 法轉 方米 印奈 轉壓 米施 奈勻 ·均 用傳動 、之的 罩力給 外印進 之轉罩 上於外 元設該 單接動 載、驅 承元以 一 單用 第載及 該承以 於二、 置第元 接的單 地層壓 定料施 固材勻 非形均 、成的 元可上 單載徑 載承路 承以遞17692 Industrial Research Institute.ptd Page 5 200522173 V. Description of the invention (3) Distorted from or formed with a bad broken mold impression into a collision that can affect the impact and cause damage. The structure is made of nanometer, nanometer and nanometer, and the mold with step mold is printed with the normal method. Mi Ming Nai ’s life pressure is reduced by using the same equipment as the printing equipment, and it ’s so low that it ’s lowered. This is also the case, because the quality of the product has indeed risen, it has been raised, and the broken structure and degree of rice have been broken. The pressure stamp of the power tool is not to be avoided, and the control system is uniform and fine. The method of transfer and the method of protecting the depth are guaranteed. The question of research and development is urgently needed. In order to protect the transfer control system, make sure that it is accurate and that the method can be printed for the transfer of Timi ’s impressed sentence, and that it is evenly distributed. Dufa · Square pressure rotation, Miduan speed pressing section, Shi Duoyun, can transfer the quality seeds of uniform needles, print them for rotation, and upgrade them at the speed of the eye-control system. The period of the week can be lowered g-nn one-supply and supply. The protection of the law in the law is to protect the appearance of the law, and the law of the law is incomplete. The protection of the mold can be protected by 7K. The seed is provided with a mold for its improvement and the print in the France is turned one meter away. The method provided by the law-promoting care center has a copy of the mold, and the law and the law of the other party and Mi Shunai before the pressure is equal, and because of this, the first one is transferred to the mold of the set. Mi Yinai transfers the ballast Shi Chengyun to use the package system to install the package, the printing method transfers Mi Yinai transfers the Mi Shi Naiyun, all uses the transmission, the covering force to the outer printing into the hood The order is set in the foreign element, and the order is driven by the first order and the single-layer laminated fixed material used in the order is set to apply uniformly and uniformly to the order. Load path

ϋ LTIMlIrlv —IH5I iϋ LTIMlIrlv —IH5I i

Lru>Lnn1p lb ϋLru > Lnn1p lb ϋ

17692工研院.ptd 第6頁 200522173 五、發明說明(4) 力源,而該方法之步驟係包括:將該動力源設定為位置控 制模式,以驅動該外罩進給,並令該外罩帶動該第一承載 單元朝向該第二承載單元進給;當該第一承載單元上之轉 印用模具與第二承載單元上之可成形材料層接觸時,令該 動力源切換為壓力控制模式;令該動力源對該外罩施壓, 以令壓力自該外罩經該均勻施壓單元而傳至該轉印用模具 與可成形材料層上;當壓力達至一預定值時,令該動力源 維持一保壓狀態;以及維持保壓狀態至一預定時間後,令 該動力源驅動該外罩反向進給,俾使該轉印用模具與該可 成形材料層分離,完成脫模步驟。 本發明另提出一種均勻施壓奈米轉印之模具保護方 法,以避免模具受損,其係運用於一均勻施壓奈米轉印裝 置,該均勻施壓奈米轉印裝置係包括用以承載轉印用模具 的第一承載單元、非固定地接置於該第一承載單元上之外 罩、用以承載可成形材料層的第二承載單元、接設於轉印 力之傳遞路徑上的均勻施壓單元、用以驅動該外罩進給的 動力源、以及至少一壓力感測元件,而該保護方法之步驟 係包括:將該動源設定為位置控制模式,以驅動該外罩 進給,並令該外罩帶動該第一承載單元朝向該第二承載單 元進給,而可藉該壓力感測元件即時偵測該第一承載單元 與轉印用模具間的壓力;判斷該壓力感測元件所偵測得之 壓力值是否大於預定值;當該壓力值大於預定值時,即令 該動力源停止進給;以及令該動力源反向進給並退回起始 位置,以保護該轉印用模具。17692 ITRI.ptd Page 6 200522173 V. Description of the invention (4) The force source, and the steps of the method include: setting the power source to a position control mode to drive the cover feed and make the cover drive The first bearing unit is fed toward the second bearing unit; when the transfer mold on the first bearing unit is in contact with the formable material layer on the second bearing unit, the power source is switched to a pressure control mode; The power source is pressed to the outer cover, so that the pressure is transmitted from the outer cover to the transfer mold and the formable material layer through the uniform pressure unit; when the pressure reaches a predetermined value, the power source is made to Maintaining a pressure-holding state; and after maintaining the pressure-holding state for a predetermined time, causing the power source to drive the cover to feed in reverse to separate the transfer mold from the formable material layer to complete the demolding step. The invention further provides a mold protection method for uniform pressure nano transfer to avoid mold damage. The method is applied to a uniform pressure nano transfer device. The uniform pressure nano transfer device includes A first load-bearing unit carrying a transfer mold, an outer cover which is non-stationarily connected to the first load-bearing unit, a second load-bearing unit for carrying a layer of a formable material, and is connected to a transfer path of a transfer force A uniform pressure applying unit, a power source for driving the cover feed, and at least one pressure sensing element, and the step of the protection method comprises: setting the dynamic source to a position control mode to drive the cover feed, And making the cover drive the first bearing unit to feed toward the second bearing unit, and the pressure between the first bearing unit and the transfer mold can be detected by the pressure sensing element in real time; the pressure sensing element is judged Whether the detected pressure value is greater than a predetermined value; when the pressure value is greater than a predetermined value, the power source is stopped from feeding; and the power source is reversely fed and returned to the starting position to protect the rotation Printing mold.

17692工研院.ptd 第7頁 200522173 五、發明說明(5) 前述之動力源係設計以多階段速度進行進給,且當該 動力源設定為位置控制模式時,係以設置於該均勻施壓奈 米轉印裝置的位置控制元件決定其多階段速度切換點,而 該動力源設定為壓力控制模式時,則係以設置於該均勻施 壓奈米轉印裝置的壓力感測元件決定其多階段速度切換 點;此外,該壓力感測元件亦可用以偵測該轉印用模具與 可成形材料層間之壓印深度,並可偵測該轉印用模具與可 成形材料層間之分離。 因此,綜上所述,藉由該位置控制元件與壓力感測元 φ之設計,即可配合本發明之控制方法而進行精準的多階 段速度、壓力及位置之控制,從而發揮均勻壓印與深度控 制之功效,達至理想的轉印品質並保護模具不致受損,充 分解決習知技術之問題。 【實施方式】 以下係藉由特定的具體實例說明本發明之實施方式, 熟悉此技藝之人士可由本說明書所揭示之内容輕易地瞭解 本發明之其他優點與功效。本發明亦可藉由其他不同的具 體實例加以施行或應用,本說明書中的各項細節亦可基於 不同觀點與應用,在不悖離本發明之精神下進行各種修飾 •變更。 本發明所提出之均勻施壓奈米轉印方法與其模具保護 方法係適用於一特殊均勻施壓奈米轉印裝置中,以下即先 說明該均勻施壓奈米轉印裝置1之細部結構,其結構配置 的較佳實施例係如第1圖所示,包括一外罩1 0、第一承載17692 ITRI.ptd Page 7 200522173 V. Description of the invention (5) The aforementioned power source system is designed to feed at multi-stage speed, and when the power source is set to the position control mode, it is set to the uniform application. The position control element of the pressure nano transfer device determines its multi-stage speed switching point, and when the power source is set to the pressure control mode, it is determined by the pressure sensing element provided in the uniform pressure nano transfer device. Multi-stage speed switching point; In addition, the pressure sensing element can also be used to detect the imprint depth between the transfer mold and the formable material layer, and to detect the separation between the transfer mold and the formable material layer. Therefore, in summary, by designing the position control element and the pressure sensing element φ, it is possible to cooperate with the control method of the present invention to perform accurate multi-stage speed, pressure, and position control, thereby exerting uniform imprinting and The effect of deep control, to achieve the ideal transfer quality and protect the mold from damage, fully solve the problems of conventional technology. [Embodiment] The following is a description of specific embodiments of the present invention. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific examples. Various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of the present invention. The uniform pressure nano transfer method and the mold protection method proposed by the present invention are applicable to a special uniform pressure nano transfer device. The detailed structure of the uniform pressure nano transfer device 1 will be described first. A preferred embodiment of the structural configuration is shown in FIG. 1 and includes a cover 10, a first bearing

17692工研院.ptd 第8頁 200522173 五、發明說明(6) 單元2 0、第二承載單元3 0、均勻施壓單元4 0、動力源5 0、 位置控制元件5 5、以及一配置於該外罩1 0上的壓力感測元 件6 0,其中,該外罩1 0係為中空且具一開口 ,以定義出一 容置空間1 2,該開口周圍處係形成有至少一組向内延伸之 第一凸緣部1 1 (Flange),且該第一承載單元20接置於該 外罩1 0之一側係形成有至少一組相對於該第一凸緣部1 1而 向外延伸的第二凸緣部2 1,以令該第一承載單元2 0可藉該 第二凸緣部2 1而非固定地接置於該第一凸緣部1 1上,並令 該第二凸緣部2 1始終位於該外罩1 0之容置空間1 2内,而使 該第一承載單元2 0不落於該外罩1 0外並可與其產生一自由 地相對運動,俾使該外罩1 Q受一動力源5 0驅動時,可帶動 該第一承載單元2 0—併移動。 該第一承載單元2 0相對於該第二凸緣部2 1之一側係承 載有一轉印用模具2 2,該模具2 2上則形成有用以進行轉印 之奈米結構2 3,同時,該第二承載單元3 0上與該轉印用模 具2 2相對之表面係承載一基板3 1,該基板3 1之表面則塗佈 一例如高分子聚合物的可成形材料層3 2,以令該可成形材 料層3 2朝向該轉ip用模具2 2而可於轉印過程中進行奈米結 構2 3之轉印,且該第一承載單元2 0與第二承載單元3 0中均 配置有一溫度控制元件(未圖示),以於轉印過程中視需要 進行升降溫;此外,該均勻施壓單元4 0係如圖所示配置於 該第一承載單元2 0上,且容設於該容置空間1 2内,亦即位 於轉印過程中第一承載單元2 0側之轉印力傳遞路徑上,該 均勻施壓單元4 0係包括一彈性材料封閉外膜4 0 a與其内部17692 ITRI.ptd Page 8 200522173 V. Description of the invention (6) Unit 20, second load unit 30, uniform pressure unit 40, power source 50, position control element 55, and a The pressure sensing element 60 on the outer cover 10, wherein the outer cover 10 is hollow and has an opening to define an accommodating space 12, and at least one group of inward extensions is formed around the opening. The first flange portion 1 1 (Flange), and the first bearing unit 20 is connected to one side of the cover 10 to form at least one group extending outward relative to the first flange portion 11. The second flange portion 21, so that the first bearing unit 20 can be connected to the first flange portion 11 by the second flange portion 21 instead of fixedly, and make the second convex portion The edge portion 21 is always located in the accommodating space 12 of the outer cover 10, so that the first load-bearing unit 20 does not fall outside the outer cover 10 and can generate a free relative movement with it, so that the outer cover 1 When Q is driven by a power source 50, it can drive the first bearing unit 20—and move. A transfer mold 22 is carried on one side of the first supporting unit 20 with respect to the second flange portion 21, and a nanostructure 2 3 for transferring is formed on the mold 22, and The surface of the second supporting unit 30 opposite to the transfer mold 22 carries a substrate 31, and the surface of the substrate 31 is coated with a formable material layer 32 such as a polymer. In order to make the formable material layer 32 face the die for ip 22, the nano structure 23 can be transferred during the transfer process, and the first load-bearing unit 20 and the second load-bearing unit 30 can be transferred. All are equipped with a temperature control element (not shown) to raise and lower the temperature as needed during the transfer process. In addition, the uniform pressure applying unit 40 is arranged on the first bearing unit 20 as shown in the figure, and It is located in the accommodating space 12, that is, on the transfer force transmission path of the first load-bearing unit 20 side during the transfer process. The uniform pressure unit 40 includes an elastic material sealing outer film 40 a. Instead of inside

1 7692工研院.ptd 第9頁 200522173 五、發明說明(7) .所充填之流體4 0 b,以藉該封閉外膜4 0 a内之流體4 0 b各點 壓力相等之性質,提供均勻傳力之效果,同時亦可維持該 模具2 2與基板3 1間之平行度。 該動力源5 0係由電動馬達6 1、傳動皮帶6 2、皮帶輪組 6 3與螺桿6 4所組成,其係配置於該外罩1 0—側,以驅動該 外罩1 0向該第二承載單元3 0移動,並藉由該第一凸緣部1 1 與第二凸緣部2 1之接觸一併帶動該第一承載單元2 0,而使 該第一承載單元2 0上之轉印用模具2 2移動至接觸該第二承 載單元3 0上之基板3 1,以進行轉印,並藉該壓力感測元件 #即時偵測該轉印用模具2 2之受力;此外,該位置控制元 件5 5係為一位置開關,其係可選自極限開關、光電開關或 近接開關等習知控制開關。 因此,本發明之均勻施壓奈米轉印方法即係利用前述 之均勻施壓奈米轉印裝置1,而如第2圖之流程圖所示,分 別進行進給、壓印與脫模三階段步驟,以藉該動力源5 0驅 動該外罩1 0進給、令該轉印用模具2 2與基板3 1上之可成形 材料層3 2接觸、藉該動力源5 0施壓進行壓印、保壓、乃至 完成轉印並反向_進給而脫模,並於前述過程中藉該位置控 制元件5 5與壓力控制元件6 0決定動力源5 0進給速度之切換 蠢。 該方法之特徵與細部控制流程係如第3圖之流程圖所 示,首先,如步驟S 1 0 1開始轉印動作,再如步驟S 1 0 2,將 該動力源5 0設定為位置控制模式,而以速度V 1驅動該外罩 1 0進給,並藉前述之第一凸緣部1 1與第二凸緣部2 1,令該1 7692 Industrial Research Institute. Ptd Page 9 200522173 V. Description of the invention (7). The filled fluid 4 0 b is based on the properties that the fluid 4 0 b in the closed outer membrane 40 a has the same pressure at each point. The effect of uniform force transmission can also maintain the parallelism between the mold 22 and the substrate 31. The power source 50 is composed of an electric motor 61, a transmission belt 6, a belt pulley set 63, and a screw 64, and is arranged on the side of the cover 10 to drive the cover 10 to the second load. The unit 30 moves, and the first bearing unit 20 is driven by the contact between the first flange portion 1 and the second flange portion 21, so that the transfer on the first bearing unit 20 is transferred. The mold 22 is moved to contact the substrate 31 on the second supporting unit 30 to perform transfer, and the pressure sensing element # is used to detect the force of the transfer mold 22 in real time; in addition, the The position control element 55 is a position switch, which can be selected from conventional control switches such as limit switches, photoelectric switches or proximity switches. Therefore, the uniform pressure nano transfer method of the present invention uses the aforementioned uniform pressure nano transfer device 1 and, as shown in the flow chart in FIG. 2, feed, emboss, and demold are performed separately. In the step, the cover 10 is driven by the power source 50, the transfer mold 22 is brought into contact with the moldable material layer 32 on the substrate 31, and the pressure is pressed by the power source 50. Printing, holding pressure, and even complete the transfer and reverse feed and demold, and in the foregoing process, the position control element 55 and the pressure control element 60 determine the switching speed of the power source 50 feed speed. The characteristics and detailed control flow of this method are shown in the flow chart in Fig. 3. First, start the transfer operation in step S 1 0 1, and then set the power source 50 to position control in step S 1 0 2. Mode, and driving the cover 10 at a speed of V1, and using the aforementioned first flange portion 11 and second flange portion 21 to make the

17692工研院.ptd 第10頁 200522173 五、發明說明(8) 外罩1 0帶動該第一承載單元2 0與該均勻施壓單元4 0而朝向 該第二承載單元3 0進給;其次,如步驟S 1 Q 3之判定方塊, 判別該外罩1 0是否進給至觸動該位置開關5 5,若為 「是」,則切換該動力源5 0之速度,改以一較小之速度V 2 持續進給,此階段係如步驟S 1 0 4所示,可視實際需要或裝 置差異而設計成具有多段之速度切換,進行一多階段的速 度控制;接著,如步驟S 1 0 5之判定方塊,以該壓力感測元 件6 0偵測該轉印用模具2 2是否已進給至接觸該可成形材料 層3 2,若為「是」,則令該動力源5 0由位置控制模式立即 切換至壓力控制模式(此時該外罩1 0並將與該第一承載單 元2 0分離),並再切換速度而以更低的速度V X與壓力P 1進 行進給壓印,以令壓力自該外罩1 0經該均勻施壓單元4 0而 傳至該轉印用模具2 2上,俾使該轉印用模具2 2上之奈米結 構2 3轉印至該可成形材料層3 2上,並藉此一切換避免該轉 印用模具2 2與可成形材料層3 2間因接觸速度過快所致的衝 擊,且由於奈米轉印之壓印深度僅在數十至數百奈米之 間,故此時該動力源5 0之進給速度幾乎趨近於零。 步驟S 1 0 7,:/系判定該動力源5 0所逐漸施加的漸增轉印 壓力是否已達預定值,若結果為「是」,表示已完成壓 印,此時動力源5 0將停止驅動,而進入步驟S 1 0 8的保壓階 段,停留於該預定值壓力一段時間,維持其圖案轉移之完 整性,同時,並以該第二承載單元3 0中的溫度控制元件降 低該基板3 1與可成形材料層3 2之溫度,進行冷卻;步驟 S 1 0 9之判定方塊則判定該保壓時間是否已達預定時間,若17692 ITRI.ptd Page 10 200522173 V. Description of the invention (8) The outer cover 10 drives the first bearing unit 20 and the uniform pressure unit 40 to feed toward the second bearing unit 30; secondly, As the decision block of step S 1 Q 3, it is judged whether the cover 10 is fed to touch the position switch 55. If it is "YES", then the speed of the power source 50 is switched and a smaller speed V is changed. 2 Continuous feed, this stage is shown in step S 104, according to actual needs or device differences, it is designed to have multiple stages of speed switching to perform a multi-stage speed control; then, as in step S 105 Block, using the pressure sensing element 60 to detect whether the transfer mold 22 has been fed to contact the formable material layer 32, and if yes, the power source 50 is caused to be in a position control mode Immediately switch to pressure control mode (at this time, the cover 10 will be separated from the first load-bearing unit 20), and then switch the speed to feed and imprint at a lower speed VX and pressure P 1 to make the pressure Passed from the cover 10 to the transfer mold 22 through the uniform pressing unit 40.俾 transfer the nano-structure 2 3 on the transfer mold 22 to the moldable material layer 3 2, and thereby avoid switching between the transfer mold 22 and the moldable material layer 32 The impact caused by the contact speed is too fast, and because the embossing depth of the nanometer transfer is only between tens to hundreds of nanometers, at this time, the feed speed of the power source 50 is nearly zero. Step S 107: It is determined whether the gradual transfer pressure gradually applied by the power source 50 has reached a predetermined value. If the result is "Yes", it means that the imprint has been completed, and at this time the power source 50 will Stop driving and enter the pressure holding stage of step S 108, stay at the predetermined value pressure for a period of time, maintain the integrity of its pattern transfer, and reduce the temperature with the temperature control element in the second bearing unit 30 The temperature of the substrate 31 and the moldable material layer 32 are cooled; the decision block of step S109 determines whether the holding time has reached a predetermined time.

17692工研院.p.td 第11頁 200522173 五、發明說明(9) 為「是」,則令該動力源5 0切換成位置控制模式並重新啟 動,以如步驟S 1 1 0驅動該外罩1 0反向進給進行脫模(此時 該外罩1 0係先反向進給至與該第一承載單元2 0接觸),且 為顧及壓印品質,其係仍以一趨近於零之速度進給脫模, 直至步驟S 1 1 1,該壓力感測元件6 0偵測到該轉印用模具2 2 與可成形材料層3 2分離,即切換該動力源5 0之速度至較高 之速度,而如步驟S 1 1 2至S 1 1 4,持續上升至回到轉印起始 位置,其中步驟S 11 2亦如步驟S 1 0 4,可視實際需要或裝置 差異而設計成具有多段之速度切換,此即完成本發明之均 φ施壓奈米轉印方法的全部控制流程。 此外,前述步驟S 1 0 4中所進行之多階段速度切換控 制,係可進一步以第4圖之流程圖說明,其係先如步驟 S1 041所示令該動力源50以速度V2進給,再於步驟S 1 0 4 2中 判定是否該外罩1 0是否進給至觸動該位置開關5 5,若為 「是」,則切換速度令該動力源5 0改以速度V η進給,若為 「否」,則持續以速度V 2進給;本發明即可以此流程設 計,而視需要設計成可多階段切換之速度進給控制,並可 藉此設計,配合_各種裝置,適量調整轉印流程中空行程的 速度,以縮短行程週期時間。 _ 再者,本發明亦提出一種均勻施壓奈米轉印之模具保 護方法,以避免該模具2 2於進給或轉印過程中因受壓過大 而破壞,其係同樣於步驟S 1 0 4中,而操作如第5圖所示之 流程圖,首先,如步驟S 1 0 4 a,由動力源5 0驅動該外罩1 0 進給,再如步驟S 1 0 4 b,以壓力感測元件6 0偵測該第一承17692 ITRI.p.td Page 11 200522173 V. Description of the invention (9) is "Yes", then the power source 50 is switched to the position control mode and restarted to drive the cover as in step S 1 1 0 1 0 reverse feed for demolding (at this time, the cover 10 is first reverse fed to contact the first load unit 20), and in consideration of the imprint quality, it is still close to zero The mold is fed at a speed until step S 1 1 1. The pressure sensing element 60 detects that the transfer mold 2 2 is separated from the formable material layer 3 2, and the speed of the power source 50 is switched to Higher speed, as in steps S 1 12 to S 1 1 4, continue to rise back to the transfer starting position, where step S 11 2 is also the same as step S 1 0 4 and can be designed according to actual needs or device differences With multiple speed switching, this completes the control process of the average φ pressure nano transfer method of the present invention. In addition, the multi-stage speed switching control performed in the foregoing step S 104 can be further described with reference to the flowchart in FIG. 4, which first causes the power source 50 to feed at the speed V2 as shown in step S1 041. Then, it is determined in step S 1 0 4 2 whether the housing 10 has been fed until the position switch 5 5 is touched. If YES, the speed is switched so that the power source 50 is fed at the speed V η. If it is "No", it will continue to feed at the speed V 2; the present invention can be designed with this flow, and it can be designed as a speed feed control that can be switched in multiple stages as needed, and can be designed to cooperate with various devices and adjust appropriately Speed of the empty stroke in the transfer process to shorten the stroke cycle time. _ Furthermore, the present invention also proposes a mold protection method for uniformly pressing the nanometer transfer to prevent the mold 22 from being damaged due to excessive pressure during the feeding or transfer process, which is also the same as step S 1 0 In step 4, the operation is as shown in the flow chart in FIG. 5. First, as in step S 1 0 4 a, the cover 10 is driven by the power source 50 and then, as in step S 1 0 4 b, the pressure is sensed. Test element 60 detects the first bearing

17692工研院.ptd 第12頁 200522173 五、發明說明(10) 載單元2 0與轉印用模具2 2所受之壓力是否異常地大於一預 定值,該預定值係為預先設定避免該轉印用模具2 2受壓破 壞的壓力上限值,若其結果為「是」,則如步驟S 1 0 4 c, 令該動力源5 0停止驅動進給;再如步驟S 1 0 4 d,令該動力 源5 0反向進給並退回起始位置,以藉此一偵測機制達至保 護該轉印用模具2 2之功效,最終如步驟S 1 0 4 e,停止壓印 流程。 前述所揭示之均句施壓奈米轉印方法,係可再進一步 以第6圖所示之轉印行程位置、速度、壓力與時間關係圖 說明,可以該第6圖之曲線搭配前述第3圖之流程圖,即可 更清楚見得本發明之設計與特徵所在;於第6圖中,位置 L 1係表示轉印起點位置,L 2表示外罩1 0觸動該位置開關 5 5,L 3表示轉印用模具2 2與可成形材料層3 2接觸,L 4表示 壓印開始,L 5表示壓印結束且保壓階段開始,L 6表示保壓 階段結束,L 7表示脫模步驟開始,L 8則表示轉印用模具22 與可成形材料層3 2分離。 因此,於位置L 1起,該壓力感測元件6 0係偵測得一向 下之拉力初始值_.P 1,並將由該電動馬達6 1驅動皮帶輪組6 3 而使該螺桿6 4之一端連接外罩1 0以速度V 1向下進給;於位 置L 2,該外罩1 0已進給至觸動該位置開關5 5,此時動力源 5 0將切換成一較小的速度V 2,持續向下進給,此過程亦如 前所述(第5圖),若該壓力感測元件6 0偵測得壓力值遠大 於P1,該電動馬達6 1將立即停止驅動,並令外罩1 0退回至 起始位置,以保護模具2 2 ;接著,於位置L 3,當該轉印用17692 ITRI.ptd Page 12 200522173 V. Description of the invention (10) Are the pressures on the load cell 20 and the transfer mold 22 abnormally greater than a predetermined value? The predetermined value is set in advance to avoid the rotation. The upper limit value of the pressure of the printing die 2 2 under pressure. If the result is "Yes", stop the power feed of the power source 50 as in step S 1 0 4 c; and then perform step S 1 0 4 d. , Make the power source 50 reverse feed and return to the starting position, in order to use a detection mechanism to protect the effect of the transfer mold 22 2, and finally stop the imprinting process as step S 1 0 4 e . The above-mentioned uniform sentence pressure nano transfer method can be further illustrated with the transfer stroke position, speed, pressure and time relationship diagram shown in FIG. 6, which can be matched with the aforementioned third diagram The flow chart in the figure can more clearly see the design and features of the present invention. In Figure 6, position L 1 is the starting position of the transfer, L 2 is the cover 1 0 and the position switch 5 5 and L 3 are touched. Indicates that the transfer mold 22 is in contact with the moldable material layer 3 2, L 4 indicates the start of embossing, L 5 indicates the end of embossing and the holding step, L 6 indicates the end of the holding step, and L 7 indicates the start of the demolding step , L 8 indicates that the transfer mold 22 is separated from the moldable material layer 32. Therefore, from the position L 1, the pressure sensing element 60 detects a downward initial value of _.P 1, and the electric motor 6 1 drives the pulley group 6 3 to make one end of the screw 6 4 The outer cover 10 is fed down at a speed V 1; at position L 2, the outer cover 10 has been fed to touch the position switch 5 5. At this time, the power source 50 0 will switch to a smaller speed V 2 and continue. Feeding downwards, the process is also as described above (Figure 5). If the pressure value detected by the pressure sensing element 60 is far greater than P1, the electric motor 61 will immediately stop driving and make the cover 10 Return to the starting position to protect the mold 2 2; then, at position L 3, when the transfer is used

17692工研院.ptd 第13頁 200522173 五、發明說明(11) .模具2 2與可成形材料層3 2接觸,此時該外罩1 0將與該第一 承載單元2 0分離,並繼續以速度V 2向下進給,而轉印用模 具2 2之壓力將於接觸瞬間迅速增加至P 2 ;接著,於位置 L 4,該繼續向下進給之外罩1 0將接觸該均勻施壓單元4 0而 施壓,並將該壓力透過該均勻施壓單元4 0而均勻地傳遞至 該轉印用模具2 2,並開始進行壓印,此時該動力源5 0之速 度將再切換降低至趨近零之速度V 3,以避免該轉印用模具 2 2與可成形材料層3 2之快速接觸所致的衝擊,同時,所偵 測得之壓力將由向下拉力轉為向上推力,並隨著該動力源 #之進給速度與施壓而逐步上升,直至壓力上升至預定之 保壓壓力值P 3,即完成壓印動作,並進入位置L 5之保壓階 段。 位置L 5至位置L 6間,即進行保壓動作以維持圖案轉移 之完整性,此時壓力將維持在保壓壓力P 3,而進給速度將 維持零(V 4 )而不進行驅動,此階段之長短則視預先設定的 保壓時間而定,當保壓時間到達,即進入位置L 6,該動力 源5 0將再驅動外罩1 0反向進給,且由於此時該外罩1 0並未 與該第一承載單义2 0接觸,故而其係先以一速度V 2反向進 給,直至位置L 7,該外罩1 0之第一凸緣部1 1與該第一承載 拳元2 0之第二凸緣部2 1接觸時,方驅動該第一承載單元2 0 而進行脫模,並將速度切換至一趨近於零的速度V3,以於 脫模過程維持壓印成品之品質,而壓力值將自保壓壓力P 3 快速下降至開始脫模之P 4與完成脫模之P 5 ;且當完成脫 模,亦即於該轉印用模具2 2與可成形材料層3 2正式分離之17692 ITRI. Ptd Page 13 200522173 V. Description of the invention (11). The mold 22 is in contact with the formable material layer 32. At this time, the outer cover 10 will be separated from the first load-bearing unit 20 and continue to The speed V 2 is fed downward, and the pressure of the transfer mold 22 2 will be rapidly increased to P 2 at the moment of contact; then, at the position L 4, the continuous downward feeding of the outer cover 10 will contact the uniform pressure. The unit 40 applies pressure, and the pressure is uniformly transmitted to the transfer mold 22 through the uniform pressure unit 40, and embossing is started. At this time, the speed of the power source 50 will be switched again. Reduce the speed V 3 to near zero to avoid the impact caused by the rapid contact between the transfer mold 22 and the formable material layer 32. At the same time, the detected pressure will change from a downward pull force to an upward push force And gradually increase with the feeding speed and pressure of the power source # until the pressure rises to a predetermined holding pressure value P 3, the imprinting operation is completed, and the holding phase of the position L 5 is entered. Between the position L 5 and the position L 6, the holding pressure action is performed to maintain the integrity of the pattern transfer. At this time, the pressure will be maintained at the holding pressure P 3 and the feed rate will be maintained at zero (V 4) without driving. The length of this stage depends on the preset holding pressure time. When the holding pressure time is reached, that is, it enters the position L 6, the power source 50 will re-drive the housing 10 to reverse feed, and because the housing 1 at this time 0 is not in contact with the first load-bearing unitary 2 0, so it is first fed in reverse at a speed V 2 to position L 7, the first flange portion 11 of the cover 10 and the first load When the second flange portion 21 of the boxer 20 is in contact, the square drives the first load-bearing unit 20 to demold, and switches the speed to a speed V3 which is close to zero to maintain the pressure during the demolding process. The quality of the printed product, and the pressure value will decrease rapidly from the holding pressure P 3 to the beginning of the release P 4 and the completion of the release P 5; and when the release is completed, that is, the transfer mold 22 and the Forming material layer 3 2 formally separated

17692工研院.ptd 第14頁 200522173 五、發明說明(12) 位置L 8時,壓力將於分離瞬間迅速降至P卜而該動力源5 0 將切換速度至較快之速度V 1,以快速驅動該外罩1 0上升並 回到轉印起始位置L 1,完成所有控制流程。 因此,綜上所述,本發明所揭示之均勻施壓奈米轉印 方法與其模具保護方法,即係藉由該位置開關與壓力感測 元件,以進行精準的多階段速度、壓力及位置之控制,從 而發揮均勻壓印與深度控制之功效,達至理想的轉印品 質,同時,復間具有降低行程週期時間與保護模具不致受 損之優點。 上述實例僅為例示性說明本發明之原理及其功效,而 非用於限制本發明。任何熟習此項技藝之人士均可在不違 背本發明之精神及範疇下,對上述實施例進行修飾與變 化,例如更改該凹設區域之數量、位置或形狀等。因此, 本發明之權利保護範圍,應如後述之申請專利範圍所列。17692 ITRI.ptd Page 14 200522173 V. Description of the invention (12) When the position is L 8, the pressure will quickly drop to P at the moment of separation and the power source 5 0 will switch to a faster speed V 1 to Quickly drive the cover 10 to rise and return to the transfer start position L 1 to complete all control processes. Therefore, to sum up, the uniform pressure nano transfer method and the mold protection method disclosed in the present invention use the position switch and pressure sensing element to perform accurate multi-stage speed, pressure, and position. Control, so as to exert the effects of uniform imprint and depth control, to achieve the ideal transfer quality, at the same time, the compound has the advantages of reducing the stroke cycle time and protecting the mold from damage. The above examples are merely illustrative to illustrate the principle of the present invention and its effects, and are not intended to limit the present invention. Anyone skilled in the art can modify and change the above embodiments, such as changing the number, position, or shape of the recessed area, without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the rights of the present invention should be listed in the scope of patent application mentioned later.

17692工研院.ptd 第15頁 200522173 圖式簡單說明 【圖式簡單說明】 第1圖係為本發明所使用之均勻施壓裝置示意圖; 第2圖係本發明之均勻施壓奈米轉印方法的操作流程 圖; 第3圖係第2圖所示之均勻施壓奈米轉印方法的細部控 制流程圖; 第4圖係本發明之均勻施壓奈米轉印方法的多階段速 度切換流程圖; 第5圖係本發明之均勻施壓奈米轉印模具保護方法的 φ作流程圖; 第6圖係本發明之均句施壓奈米轉印方法的轉印行程 位置、速度、壓力與時間關係圖; 第7 A及7 B圖係為奈米轉印技術之習知問題範例示意 圖; 第8圖係為美國專利第6, 4 8 2, 7 4 2號案之奈米轉印裝 置示意圖;以及 第9圖係為PCT專利第WOO 1 4 2 8 5 8號案之奈米轉印裝置 示意圖。 P 均 勻 施 壓 裝 置 10 外 罩 11 第 一 凸 緣 部 12 容 置 空 間 20 第 — 承 載 σσ 早 元 21 第 二 凸 緣部 22 模 具 23 奈 米 結 構 30 第 —一 承 載 早 元 31 基 板17692 Institute of Industry and Technology.ptd Page 15 200522173 Brief description of the drawings [Simplified description of the drawings] Figure 1 is a schematic diagram of the uniform pressure applying device used in the present invention; Figure 2 is the uniform pressure nano transfer of the present invention Method operation flowchart; Figure 3 is a detailed control flowchart of the uniform pressure nano transfer method shown in Figure 2; Figure 4 is a multi-stage speed switching of the uniform pressure nano transfer method of the present invention Flow chart; FIG. 5 is a φ flow chart of the method for protecting a uniformly-pressed nanometer transfer mold according to the present invention; and FIG. 6 is a transfer stroke position, speed, Diagram of the relationship between pressure and time; Figures 7 A and 7 B are schematic diagrams of examples of the conventional problems of nano transfer technology; Figure 8 is the nano transfer of US Patent No. 6, 4 8 2, 7 4 2 And FIG. 9 is a schematic diagram of a nano transfer device of PCT Patent No. WOO 1 4 2 8 5 8. P Uniform pressure application device 10 Outer cover 11 First convex edge portion 12 Receiving space 20 First-bearing σσ early element 21 Second convex edge portion 22 Mould 23 Nano structure 30 First-first bearing early element 31 Base plate

17692工研院.ptd 第16頁 20052217317692 ITRI. Ptd page 16 200522173

17692工研院.ptd 第17頁17692 ITRI.ptd Page 17

Claims (1)

200522173 六、申請專利範圍 1 . 一種均勻施壓奈米轉印方法,係運用於一均勻施壓奈 米轉印裝置中,其中該均勻施壓奈米轉印裝置係包括 承載轉印模具的第一承載單元、接著在第一承載單元 的均勻施壓單元、與第一承載單元非固定地接置且包 套該第一承載單元及均勾施壓單元之外罩、用以驅動 該外罩進給的動力源、以及用以承載可成形材料層的 第二承載單元等單元組成,控制此裝置之均勻施壓奈 米轉印方法步驟係包括進給、壓印、脫模階段: 將該動力源設定為位置控制模式,以驅動該外罩 籲進給,並令該外罩帶動該第一承載單元朝向該第二承 載單元進給; 當該第一承載單元上之轉印模具與固定的第二承 載單元上之可成形材料層接觸時,令該動力源切換為 壓力控制模式; 令該動力源施壓於外罩,壓力經均勻施壓單元而 傳至轉印模具與可成形材料層上; 保壓,係當壓力達至一預定值時,令該動力源維 持一壓力值至設定時間,以及 完成保壓狀態後,令該動力源驅動該外罩反向進 •給,俾使該轉印模具與該可成形材料層分離,達成脫 模並完成整個轉印過程。 2 .如申請專利範圍第1項所述之均勻施壓奈米轉印方法, 其中,該動力源係以多階段速度進行進給,以驅動該 外罩並施壓。200522173 VI. Application Patent Scope 1. A uniform pressure nano transfer method is applied to a uniform pressure nano transfer device, wherein the uniform pressure nano transfer device includes A load-bearing unit, followed by a uniform pressure-applying unit on the first load-bearing unit, non-fixedly connected to the first load-bearing unit and enclosing the outer cover of the first load-bearing unit and the equal pressure-applying unit to drive the feeding of the cover It consists of a power source and a second load-bearing unit to support the layer of formable material. The steps of the nanometer transfer method for controlling the uniform pressure of the device include feeding, stamping, and demolding stages: the power source Set to position control mode to drive the cover to feed, and make the cover drive the first load unit to feed towards the second load unit; when the transfer mold on the first load unit and the fixed second load When the formable material layer on the unit is in contact, the power source is switched to the pressure control mode; the power source is pressed to the outer cover, and the pressure is transmitted to the transfer mold and the Shape material layer; holding pressure, when the pressure reaches a predetermined value, to make the power source maintain a pressure value for a set time, and after completing the pressure holding state, make the power source drive the housing reverse feed •俾 Separate the transfer mold from the formable material layer to achieve demolding and complete the entire transfer process. 2. The uniform pressure nano transfer method as described in item 1 of the scope of patent application, wherein the power source is fed at a multi-stage speed to drive the cover and apply pressure. 17692工研院.ptd 第18頁 200522173 六、申請專利範圍 3. 如申請專利範圍第1項所述之均勻施壓奈米轉印方法, 其中,轉印模具與可成形材料係可置換位置實施。 4. 如申請專利範圍第2項所述之均勻施壓奈米轉印方法, 其中,該動力源設定為位置控制模式時,係以設置於 該均句施壓奈米轉印裝置的位置控制元件決定其多階 段速度切換點。 5. 如申請專利範圍第4項所述之均勻施壓奈米轉印方法, 其中,該位置控制元件可為極限開關、光電開關、近 接開關與具有位置判別功能之任何元件中之一者。 6. 如申請專利範圍第2項所述之均勻施壓奈米轉印方法, 其中,該動力源設定為壓力控制模式時,係以設置於 該均勻施壓奈米轉印裝置的壓力感測元件決定其多階 段速度切換點。 7. 如申請專利範圍第6項所述之均勻施壓奈米轉印方法, 其中,該壓力感測元件係可用以偵測轉印壓力變化, 用以判別該轉印模具與可成形材料層間之壓印深度。 8. 如申請專利範圍第6項所述之均勻施壓奈米轉印方法, 其中,該壓力.感測元件係可用以偵測轉印壓力變化, 用以判別該轉印模具與可成形材料層間之分離。 9. 如申請專利範圍第1項所述之均勻施壓奈米轉印方法, 其中,當該轉印模具與該可成形材料層接觸時,該外 罩係與該第一承載單元分離。 1 〇.如申請專利範圍第1項所述之均勻施壓奈米轉印方法, 其中,該動力源可為液壓驅動系統、氣壓驅動系統、17692 ITRI.ptd Page 18 200522173 VI. Application for patent scope 3. The method of uniform pressure nano transfer as described in item 1 of the scope of patent application, wherein the transfer mold and the formable material are implemented at interchangeable positions . 4. The method of uniform pressure nano transfer as described in item 2 of the scope of the patent application, wherein when the power source is set to the position control mode, the position control of the nano pressure transfer device set in the uniform pressure is performed. The component determines its multi-stage speed switching point. 5. The uniform pressure nano transfer method as described in item 4 of the scope of patent application, wherein the position control element may be one of a limit switch, a photoelectric switch, a proximity switch, and any element having a position discrimination function. 6. The uniform pressure nano transfer method as described in item 2 of the scope of the patent application, wherein when the power source is set to the pressure control mode, the pressure sensing provided in the uniform pressure nano transfer device is used. The component determines its multi-stage speed switching point. 7. The method of uniform pressure nano transfer as described in item 6 of the scope of patent application, wherein the pressure sensing element can be used to detect a change in transfer pressure to discriminate between the transfer mold and the formable material layer The imprint depth. 8. The method of uniform pressure nano transfer as described in item 6 of the scope of patent application, wherein the pressure. Sensing element can be used to detect a change in transfer pressure to discriminate the transfer mold from a formable material. Separation between layers. 9. The uniform pressure nano transfer method according to item 1 of the scope of the patent application, wherein when the transfer mold is in contact with the formable material layer, the cover is separated from the first bearing unit. 1 〇. The uniform pressure nano transfer method as described in item 1 of the scope of patent application, wherein the power source may be a hydraulic drive system, a pneumatic drive system, 17692工研院.ptd 第19頁 200522173 六、申請專利範圍 滾珠導螺桿搭配伺服馬達、線性馬達,與任何具直線 驅動功能之動力配置中之一者。 1 1 .如申請專利範圍第1項所述之均勻施壓奈米轉印方法, 其中,該均勻施壓單元係包括一可密閉彈性膜及其所 包覆之流體。 1 2 .如申請專利範圍第1項所述之均勻施壓奈米轉印方法, 其中,該第一承載單元與第二承載單元中係裝置有溫 度控制元件,得適時提供轉印模具與可成形材料層進 行升降溫等功能。 _ .一種均勻施壓奈米轉印之模具保護方法,係運用於一 均勻施壓奈米轉印裝置中,其中該均句施壓奈米轉印 裝置係包括承載轉印模具的第一承載單元、接著在第 一承載單元的均勻施壓單元、與第一承載單元非固定 地接置且包套該第一承載單元及均勻施壓單元之外 罩、用以驅動該外罩進給的動力源;以及用以承載可 成形材料層的第二承載單元等單元組成,保護控制此 裝置之步驟係包括: 將該動九源設定為位置控制模式^以驅動該外罩 進給,並令該外罩帶動該第一承載單元朝向該第二承 _載單元進給; 當該第一承載單元上之轉印模具與固定的第二承 載單元上之可成形材料層接觸時,令該動力源切換為 壓力控制模式,判斷該壓力感測元件所偵測得之壓力 值是否大於預定值,當該壓力值大於預定值時,即令17692 Industrial Research Institute. Ptd Page 19 200522173 6. Scope of patent application One of the ball screw with servo motor, linear motor, and any power configuration with linear drive function. 11. The uniform pressure applying nano transfer method as described in item 1 of the scope of patent application, wherein the uniform pressure applying unit comprises a sealable elastic film and a fluid covered by the elastic film. 1 2. The uniform pressure nano transfer method as described in item 1 of the scope of the patent application, wherein the first load bearing unit and the second load bearing unit are provided with a temperature control element, and a transfer mold and a transfer mold may be provided in a timely manner. The forming material layer performs functions such as temperature rise and fall. _. A mold protection method for uniform pressure nano transfer is applied to a uniform pressure nano transfer device, wherein the uniform pressure nano transfer device includes a first load bearing a transfer mold. A unit, a uniform pressure applying unit next to the first load bearing unit, a non-fixed connection with the first load bearing unit and enveloping the first load bearing unit and the uniform pressure applying unit outer cover, and a power source for driving the outer cover feed ; And a second load-bearing unit for carrying a layer of formable material, the steps of protecting and controlling the device include: setting the moving source to a position control mode ^ to drive the feeding of the cover, and causing the cover to drive The first load bearing unit feeds toward the second load bearing unit; when the transfer mold on the first load bearing unit contacts the formable material layer on the fixed second load bearing unit, the power source is switched to pressure Control mode to determine whether the pressure value detected by the pressure sensing element is greater than a predetermined value, and when the pressure value is greater than a predetermined value, 17692工研院.ptd 第20頁 200522173 六、申請專利範圍 該動力源停止進給;以及 令該動力源反向進給並退回起始位置,以保護該 轉印模具。 1 4 .如申請專利範圍第1 3項所述之模具保護方法,其中, 該壓力感測元件係藉該外罩與均勻施壓單元之力量傳 遞,以即時偵測該第一承載單元與轉印模具間的壓 力017692 ITRI.ptd Page 20 200522173 VI. Patent Application Range The power source stops feeding; and the power source is reversely fed and returned to the starting position to protect the transfer mold. 14. The mold protection method as described in item 13 of the scope of patent application, wherein the pressure sensing element is transmitted by the force of the cover and the uniform pressure unit to detect the first load unit and the transfer in real time. Pressure between molds 0 17692工研院.ptd 第21頁17692 ITRI.ptd Page 21
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102360162B (en) * 2007-02-06 2015-08-26 佳能株式会社 Imprint method and marking press equipment

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102360162B (en) * 2007-02-06 2015-08-26 佳能株式会社 Imprint method and marking press equipment
US9573319B2 (en) 2007-02-06 2017-02-21 Canon Kabushiki Kaisha Imprinting method and process for producing a member in which a mold contacts a pattern forming layer
US9579843B2 (en) 2007-02-06 2017-02-28 Canon Kabushiki Kaisha Imprint apparatus in which alignment control of a mold and a substrate is effected
EP2584408A3 (en) * 2007-02-06 2018-03-21 Canon Kabushiki Kaisha Imprint method and imprint apparatus
EP2118706B1 (en) * 2007-02-06 2019-09-18 Canon Kabushiki Kaisha Imprint apparatus and process
US10670961B2 (en) 2007-02-06 2020-06-02 Canon Kabushiki Kaisha Imprinting apparatus for producing a member in which a mold contacts a pattern forming layer using alignment control in an in-plane direction of a substrate
US10990005B2 (en) 2007-02-06 2021-04-27 Canon Kabushiki Kaisha Method in which alignment control of a member and a substrate is effected with respect to an in-plane direction of the substrate and an uncured material in a state of bringing a member and the uncured material on a substrate into contact

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