SU1515175A2 - Arrangement for diagnosis of faults of technological objects - Google Patents

Abstract

The invention relates to diagnostic devices for complex technical objects. The aim of the invention is to increase the reliability and efficiency of diagnosis. The device contains sensors 1, blocks: 2 controls, 3 inputs of information about the state of the object, 6 inputs of diagnostic information, 7 tolerance memories, 8 ratings, 10 fault symptom memories, 12 displays, 13 test sequence memories, switches 5, 9 , multi-channel switch 4, the element OR 11 and the generator of test sequences. The device provides fault localization and higher performance due to the constant availability of information about the state of the object being diagnosed. 1 hp f-ly, 2 ill.

Description

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The invention relates to devices for determining the state (diagnosis) of complex technical objects without disassembling them.

The aim of the invention is to increase the reliability and efficiency of diagnosis.

Figure 1 shows a structural diagram of the proposed device; 2 is a control block diagram.

The device consists of sensors 1, control unit 2, unit 3 for entering information about the state of an object, multichannel switch 4, switch 5 for entering data, block 6 for entering diagnostic information, block 7 for tolerances, block 8 for evaluating, switch 9 for block 10 memory signs of faults, the element OR 11, the display unit 12, the block 13 of the memory of the test sequences, the generator 1A of the test sequences and the output 15 of the diagnosed technical object. The control unit 2 consists of the imaging unit 16, the first counter 17, the first decoder 18, the trigger 19 of the input unit state, the 20 clock pulse generator}, the second counter 21, the second decoder 22, register 23, the test trigger 24, the third counter 25

The device works as follows.

The device operates in two modes: in the self-test mode and in the diagnostics mode. In the self-test mode, unit 3 of entering information about the state of an object, which is designed as a remote control with a key, through switch 5, in blocks 7, 10 and 13, the control values of permissible deviations, signs of faults and tests for finding these faults are entered. Then, at the command from block 3, switch 5 is connected to the input of switch 4. At block 3, a value is entered that corresponds to the nominal value of the diagnosed parameter. This value is provided in blocks 6 and 8. Hack. As the parameter being diagnosed passes the tolerance check in block 6, a signal appears at its output, which in block 12 indicates the relevant information. At the same time, the control signal through the OR 11 element switches unit 2 to the diagnostics of the next parameter.

In the second case, from block 3, the value of the parameter being diagnosed is entered, which exceeds the tolerance limits. This value is recorded in blocks 6 and 8, where the recorded value is compared with the symptoms of a fault, which are read through switch 9. If these values coincide from the output of block 8, a signal is output to control block 2. The signal from block 2 switches the switch 9 and finds a fault according to the data entered in block 13 using the generator 14. If the fault corresponds to that entered from block 13, then the output of block 8 receives a signal to the display unit 12 and simultaneously through the OR element 11, a switch signal is issued to block 2. If the fault indicated by block 12 corresponds to the one entered, the self-test mode is over and the device is ready for operation in the diagnostic mode.

In this mode, the device performs a tolerance control of the monitored parameter and, in the case of a code beyond its tolerance limits, searches for and identifies a malfunction. In the diagnostics mode from unit 3, the tolerance limits for all monitored parameters are entered into unit 7 via switch 5, and then, block 10 records signs of possible malfunctions that the diagnosed object may have. In addition, in block 13, test sequences are introduced that allow an accurate determination of the location of the malfunction in the technical object being diagnosed. On the control signal, which is removed from the decoder 18, the switch 4 connects the first sensor to the input of the device. This signal connects the memory cells of block 7, where tolerance limits for this monitored parameter are recorded, to block 6. The controlled parameter enters blocks 6 and R.B, block 6 performs tolerance control, which results in further operation of the device. If the monitored parameter passed the tolerance control in block 6, then a signal appears on its output, including the display unit 12, which displays information from the information output of block 6. The same signal through the OR 11 element goes to the input of block 2 n resets to the original the state of the trigger 19, the second counter 21, as well as through the driver 16, goes to the first counter 17. Then this signal is read out and through the decoder 18 is fed to switch A and block 7 as a control switch signal to control the next parameter tra.

If the monitored parameter did not pass the tolerance control, then a signal appears at the output of block 6, which enters block 2 at the C input of the trigger 19. The same signal arrives at the input of the block 10. At the D input of the trigger 19, there is already a signal with the output of the decoder 18 and when a signal arrives at the C input, it is transmitted to the output of the trigger 19 and from it to the input of the counter 21. This signal allows the counter 21, /.e to start working. it begins to count the pulses arriving at the black from the generator 20. The digital code from the output of the counter 21 is fed to block 10 and this begins to search for signs of faults relating to this parameter. The switch 9 in its initial state connects the output of block 10 to the input of block 8 of estimates.

The setting of the memory area related to the monitored parameter is made by the control signal from block 6. In block 8, the incoming trouble symptoms from block 10 are compared with the recorded value of the monitored parameter. When a fault is detected, a control signal appears at the first output of block 8, which stops the counter 21 and starts the counter 25 and sets the output of trigger 24 1. This signal switches the switch 9, starts the generator 14 and writes the source address to block 13 In addition, it enables the operation of the counter 25. The information of the output of the counter 21 is fed to the decoder 22 and then written to the register 23. From the output of the register 23 it is fed to the D input of the counter 25 and is the initial setting from which the counting begins . From the output of the counter 25, which is the output of the control unit, to the unit 13, the address information of the desired

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test sequence. Starting from this address, block 13 issues tests to the generator 14 and through the switch 9 to block 8, where the incoming test from block 13 is compared with the recorded value passed through the control object. In determining the place of failure, cha output of block 8

a turn-on signal appears on the display unit 12, on which information is entered from the information output of the block 8. The same control signal through the OR 11 element is fed to

the input of block 2 and resets the trigger 19, the counter 21 and the register 23.

The third counter 25 counts to overflow and stops

in the initial state. By the overflow signal, it resets trigger 24 to the initial state. In addition, the signal from the OR element .11 through the driver 16 is fed to the input

counter 17 is added to the number written there. This value is transmitted via decoder 18 as a control switching signal to switch 4 and block 7.

After the first counter 17 is completely filled, it overflows to its original state, i.e. the device returns to the initial state and the diagnostic cycle is repeated.

Claims (2)

1. A device for diagnosing Q faults of technical objects according to the author. To 1236506, in order to increase the reliability and efficiency of diagnostics, a D5 switch, a test sequence memory block and a test sequence generator, the output of which is a device output for connecting the diagnosed object, are entered into the device; the memory of the test sequences and the control input of the switch are connected to the additional output of the control unit, the information input of the test sequence generator and the first information input to the commutator is connected to the output of the unit pa1 of 1 test sequences, the mating input of which is connected to 55 an additional output of the input switchboard, and a group of address inputs to an additional group of outputs of the control unit, the second information input of the switch is connected to the output of the fault indication memory, and the output is connected to the first information input of the rating unit. 2. Device pop.1, which differs from the fact that the test trigger is entered into the control unit, the third count, the register and the second decoder, whose input is connected to the output of the second counter, and the output to the information input of the register, the control input of which is associated with the input of the unit connected to the output of the elec five 0 OR, the output of the register is connected to the D input of the third counter, the V and C inputs of which are respectively connected to the inputs of the block connected to the outputs of the estimator and the clock generator, the output of the bits of the third counter is an additional group of outputs of the block the transfer output of the third counter is connected to the R-input of the test trigger, the D and C inputs of which are respectively connected to the inputs of the block connected to the outputs of the diagnostic information input block and the rating block, and the forward output of the trigger is connected to the input Third meter counter and with additional block output. Sat / 1kah ratings 8 Q item. (LS 11 Sloblo 6 Fia.g On blocks 9,1 and 14 On 6 / IOK IS