SG149899A1 - Methods and apparatus for data analysis - Google Patents

Methods and apparatus for data analysis

Info

Publication number
SG149899A1
SG149899A1 SG200900904-4A SG2009009044A SG149899A1 SG 149899 A1 SG149899 A1 SG 149899A1 SG 2009009044 A SG2009009044 A SG 2009009044A SG 149899 A1 SG149899 A1 SG 149899A1
Authority
SG
Singapore
Prior art keywords
data analysis
methods
data
characteristic
various aspects
Prior art date
Application number
SG200900904-4A
Inventor
Emilio Miguelanez
Michael Scott
Jacky Gorin
Paul Buxton
Eric Paul Tabor
Original Assignee
Test Advantage Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/817,750 external-priority patent/US7395170B2/en
Application filed by Test Advantage Inc filed Critical Test Advantage Inc
Publication of SG149899A1 publication Critical patent/SG149899A1/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0229Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions knowledge based, e.g. expert systems; genetic algorithms
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2894Aspects of quality control [QC]

Landscapes

  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Evolutionary Biology (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

METHODS AND APPARATUS FOR DATA ANALYSIS A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.
SG200900904-4A 2004-02-06 2005-02-07 Methods and apparatus for data analysis SG149899A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US54245904P 2004-02-06 2004-02-06
US54608804P 2004-02-19 2004-02-19
US10/817,750 US7395170B2 (en) 2001-05-24 2004-04-02 Methods and apparatus for data analysis

Publications (1)

Publication Number Publication Date
SG149899A1 true SG149899A1 (en) 2009-02-27

Family

ID=40380629

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200900904-4A SG149899A1 (en) 2004-02-06 2005-02-07 Methods and apparatus for data analysis

Country Status (3)

Country Link
JP (1) JP4728968B2 (en)
IL (1) IL177293A (en)
SG (1) SG149899A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8838408B2 (en) 2010-11-11 2014-09-16 Optimal Plus Ltd Misalignment indication decision system and method

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9069725B2 (en) 2011-08-19 2015-06-30 Hartford Steam Boiler Inspection & Insurance Company Dynamic outlier bias reduction system and method
US10557840B2 (en) 2011-08-19 2020-02-11 Hartford Steam Boiler Inspection And Insurance Company System and method for performing industrial processes across facilities
EP3514700A1 (en) * 2013-02-20 2019-07-24 Hartford Steam Boiler Inspection and Insurance Company Dynamic outlier bias reduction system and method
CA3116974A1 (en) 2014-04-11 2015-10-15 Hartford Steam Boiler Inspection And Insurance Company Improving future reliability prediction based on system operational and performance data modelling
KR102529171B1 (en) * 2016-02-26 2023-05-04 삼성전자주식회사 Memory device diagnosis system
KR102620433B1 (en) * 2016-09-30 2024-01-03 세메스 주식회사 Method of forming a wafer map
EP3309690A1 (en) * 2016-10-17 2018-04-18 Tata Consultancy Services Limited System and method for data pre-processing
US11636292B2 (en) 2018-09-28 2023-04-25 Hartford Steam Boiler Inspection And Insurance Company Dynamic outlier bias reduction system and method
CN110135121B (en) * 2019-06-13 2023-04-18 中国人民解放军海军航空大学 Fault diagnosis method based on Lagrange-particle swarm update algorithm
JP7399269B2 (en) 2019-09-18 2023-12-15 ハートフォード スチーム ボイラー インスペクション アンド インシュアランス カンパニー Computer-based systems, computer components and computer objects configured to implement dynamic outlier bias reduction in machine learning models
US11328177B2 (en) 2019-09-18 2022-05-10 Hartford Steam Boiler Inspection And Insurance Company Computer-based systems, computing components and computing objects configured to implement dynamic outlier bias reduction in machine learning models
US11615348B2 (en) 2019-09-18 2023-03-28 Hartford Steam Boiler Inspection And Insurance Company Computer-based systems, computing components and computing objects configured to implement dynamic outlier bias reduction in machine learning models
TWI742865B (en) * 2020-09-28 2021-10-11 蔚華科技股份有限公司 Automatic testing machine with data processing function and its information processing method
CN112595912B (en) * 2020-12-09 2022-09-02 华域麦格纳电驱动系统有限公司 Test data analysis system of new energy electric drive system
CN115190140A (en) * 2022-06-12 2022-10-14 上海轩田工业设备有限公司 Microwave data software acquisition platform

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5130936A (en) * 1990-09-14 1992-07-14 Arinc Research Corporation Method and apparatus for diagnostic testing including a neural network for determining testing sufficiency
JP2000116003A (en) * 1998-09-29 2000-04-21 Kansai Electric Power Co Inc:The Method for controlling reactive voltage power
JP2004012422A (en) * 2002-06-11 2004-01-15 Dainippon Screen Mfg Co Ltd Pattern inspection device, pattern inspection method, and program

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8838408B2 (en) 2010-11-11 2014-09-16 Optimal Plus Ltd Misalignment indication decision system and method

Also Published As

Publication number Publication date
JP4728968B2 (en) 2011-07-20
IL177293A0 (en) 2006-12-10
IL177293A (en) 2013-03-24
JP2007522658A (en) 2007-08-09

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