SG11201803354YA - Detection device and detection method - Google Patents

Detection device and detection method

Info

Publication number
SG11201803354YA
SG11201803354YA SG11201803354YA SG11201803354YA SG11201803354YA SG 11201803354Y A SG11201803354Y A SG 11201803354YA SG 11201803354Y A SG11201803354Y A SG 11201803354YA SG 11201803354Y A SG11201803354Y A SG 11201803354YA SG 11201803354Y A SG11201803354Y A SG 11201803354YA
Authority
SG
Singapore
Prior art keywords
detection
detect
crack
information
deformation
Prior art date
Application number
SG11201803354YA
Inventor
Megumi Irie
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of SG11201803354YA publication Critical patent/SG11201803354YA/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
    • G01S13/88—Radar or analogous systems specially adapted for specific applications
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/60—Memory management
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)

Abstract

DocketNo. PMAA--US,EP,CN,SG: Final 61 To obtain a detection device that can detect a state a crack. A detection device includes: a crack detection unit (3) to detect a deformation on a surface of a structure from image information on the structure; a step detection 5 unit (4) to detect a step on the surface of the structure from three-dimensional point group information on the structure measured with a laser; and a determination unit (5) to determine a state of the deformation using information on the deformation generated by the crack 10 detection unit (3) and information on the step generated by the step detection unit (4).
SG11201803354YA 2016-01-07 2016-08-10 Detection device and detection method SG11201803354YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016001994 2016-01-07
PCT/JP2016/073615 WO2017119154A1 (en) 2016-01-07 2016-08-10 Detection device and detection method

Publications (1)

Publication Number Publication Date
SG11201803354YA true SG11201803354YA (en) 2018-07-30

Family

ID=59273563

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201803354YA SG11201803354YA (en) 2016-01-07 2016-08-10 Detection device and detection method

Country Status (6)

Country Link
US (1) US10704900B2 (en)
EP (1) EP3401671B1 (en)
JP (1) JP6173655B1 (en)
CN (1) CN108474747B (en)
SG (1) SG11201803354YA (en)
WO (1) WO2017119154A1 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018216629A1 (en) * 2017-05-22 2018-11-29 キヤノン株式会社 Information processing device, information processing method, and program
WO2019111391A1 (en) * 2017-12-07 2019-06-13 三菱電機株式会社 Display data generation device, display data generation method, and display processing method
JP6942649B2 (en) * 2018-01-30 2021-09-29 株式会社日立製作所 Image processing device and image processing method
WO2019163556A1 (en) * 2018-02-22 2019-08-29 パナソニックＩｐマネジメント株式会社 Inspection device and inspection method
JP7079926B2 (en) * 2018-03-07 2022-06-03 五洋建設株式会社 3D image generation system
WO2020026677A1 (en) * 2018-07-31 2020-02-06 株式会社ニコン Detection device, processing device, detection method, and processing program
JP7225810B2 (en) 2019-01-11 2023-02-21 富士通株式会社 Crack line extraction device, crack line extraction method, and crack line extraction program
CN110161047A (en) * 2019-06-14 2019-08-23 汕头大学 A kind of road and bridge Crack Detection and repair integrated robot
WO2021014754A1 (en) * 2019-07-23 2021-01-28 富士フイルム株式会社 Crack evaluation device, crack evaluation method, and crack evaluation program
JP7353485B2 (en) 2020-05-29 2023-09-29 富士フイルム株式会社 Damage diagram creation support method and device
KR102494890B1 (en) * 2020-12-17 2023-02-06 텔스타홈멜 주식회사 Intelligent Total Inspection System for Quality Inspection of Iron Frame Mold
CN112762852B (en) * 2020-12-28 2022-07-05 广东工业大学 Floating state manufacturing process deformation detection device and installation and detection method thereof
CN112415542B (en) * 2021-01-25 2021-04-16 湖南联智科技股份有限公司 Deformation monitoring and resolving method based on combination of Beidou and INS
CN112950549B (en) * 2021-02-04 2021-12-24 科大智能物联技术股份有限公司 Goods shelf deformation detection system and detection method based on machine vision
CN115018840B (en) * 2022-08-08 2022-11-18 珠海市南特金属科技股份有限公司 Method, system and device for detecting cracks of precision casting
CN115790360A (en) * 2023-02-03 2023-03-14 中大智能科技股份有限公司 Three-dimensional deformation measurement method
CN116385434B (en) * 2023-06-02 2023-08-08 同济检测(济宁)有限公司 Intelligent detection method for precast beam cracks
CN116625582B (en) * 2023-07-24 2023-09-19 上海安宸信息科技有限公司 Movable gas leakage monitoring system for petroleum and petrochemical gas field station

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4588901B2 (en) * 2001-03-02 2010-12-01 株式会社竹中工務店 Defect inspection method for concrete and defect inspection apparatus for concrete
JP3867025B2 (en) * 2002-07-08 2007-01-10 株式会社中田測量 Tunnel control chart, its creation method and system
JP2006132973A (en) * 2004-11-02 2006-05-25 Fujimitsu Komuten:Kk Crack inspection device and method of concrete structure
JP2011095222A (en) * 2009-11-02 2011-05-12 Tosetsu Doboku Consultant:Kk System and method for inspecting tunnel inner wall
JP5795850B2 (en) 2010-11-02 2015-10-14 清水建設株式会社 Image data processing system
JP5734070B2 (en) 2011-04-14 2015-06-10 三菱電機株式会社 Development drawing generation apparatus and development drawing generation method
US8873837B2 (en) * 2011-08-04 2014-10-28 University Of Southern California Image-based crack detection
US9285296B2 (en) * 2013-01-02 2016-03-15 The Boeing Company Systems and methods for stand-off inspection of aircraft structures
JP6032678B2 (en) * 2013-06-20 2016-11-30 株式会社パスコ Data analysis apparatus, data analysis method, and program
CA2927853C (en) * 2013-10-22 2022-05-10 Jentek Sensors, Inc. Impedance instrument

Also Published As

Publication number Publication date
JPWO2017119154A1 (en) 2018-01-11
WO2017119154A1 (en) 2017-07-13
US10704900B2 (en) 2020-07-07
CN108474747B (en) 2021-08-03
CN108474747A (en) 2018-08-31
EP3401671A4 (en) 2019-04-03
EP3401671B1 (en) 2020-04-01
US20190003830A1 (en) 2019-01-03
EP3401671A1 (en) 2018-11-14
JP6173655B1 (en) 2017-08-02

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