SG11201709275YA - Detection apparatus and detection method - Google Patents

Detection apparatus and detection method

Info

Publication number
SG11201709275YA
SG11201709275YA SG11201709275YA SG11201709275YA SG11201709275YA SG 11201709275Y A SG11201709275Y A SG 11201709275YA SG 11201709275Y A SG11201709275Y A SG 11201709275YA SG 11201709275Y A SG11201709275Y A SG 11201709275YA SG 11201709275Y A SG11201709275Y A SG 11201709275YA
Authority
SG
Singapore
Prior art keywords
detection
detection method
detection apparatus
Prior art date
Application number
SG11201709275YA
Inventor
Junji Kondo
Hiroyuki Tsutada
Megumi Irie
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of SG11201709275YA publication Critical patent/SG11201709275YA/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/75—Determining position or orientation of objects or cameras using feature-based methods involving models
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8896—Circuits specially adapted for system specific signal conditioning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20092—Interactive image processing based on input by user

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
SG11201709275YA 2015-05-26 2015-11-02 Detection apparatus and detection method SG11201709275YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015106782 2015-05-26
PCT/JP2015/080942 WO2016189764A1 (en) 2015-05-26 2015-11-02 Detection device and detection method

Publications (1)

Publication Number Publication Date
SG11201709275YA true SG11201709275YA (en) 2017-12-28

Family

ID=57392992

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201709275YA SG11201709275YA (en) 2015-05-26 2015-11-02 Detection apparatus and detection method

Country Status (7)

Country Link
US (1) US10620131B2 (en)
EP (1) EP3296722B1 (en)
JP (1) JP6192880B2 (en)
CN (1) CN107615050B (en)
HK (1) HK1245886A1 (en)
SG (1) SG11201709275YA (en)
WO (1) WO2016189764A1 (en)

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Also Published As

Publication number Publication date
HK1245886A1 (en) 2018-08-31
CN107615050B (en) 2021-04-23
EP3296722B1 (en) 2021-12-22
US10620131B2 (en) 2020-04-14
EP3296722A4 (en) 2018-04-11
WO2016189764A1 (en) 2016-12-01
JPWO2016189764A1 (en) 2017-08-31
JP6192880B2 (en) 2017-09-06
CN107615050A (en) 2018-01-19
US20180156736A1 (en) 2018-06-07
EP3296722A1 (en) 2018-03-21

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