SG10201609595UA - Laser-assisted device alteration using synchronized laser pulses - Google Patents

Laser-assisted device alteration using synchronized laser pulses

Info

Publication number
SG10201609595UA
SG10201609595UA SG10201609595UA SG10201609595UA SG10201609595UA SG 10201609595U A SG10201609595U A SG 10201609595UA SG 10201609595U A SG10201609595U A SG 10201609595UA SG 10201609595U A SG10201609595U A SG 10201609595UA SG 10201609595U A SG10201609595U A SG 10201609595UA
Authority
SG
Singapore
Prior art keywords
laser
synchronized
assisted device
device alteration
pulses
Prior art date
Application number
SG10201609595UA
Inventor
Praveen Vedagarbha
Derryck Reid
Keith Serrels
James S Vickers
Original Assignee
Dcg Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dcg Systems Inc filed Critical Dcg Systems Inc
Publication of SG10201609595UA publication Critical patent/SG10201609595UA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
SG10201609595UA 2012-05-16 2013-05-16 Laser-assisted device alteration using synchronized laser pulses SG10201609595UA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201261648042P 2012-05-16 2012-05-16

Publications (1)

Publication Number Publication Date
SG10201609595UA true SG10201609595UA (en) 2017-01-27

Family

ID=49758609

Family Applications (2)

Application Number Title Priority Date Filing Date
SG10201609595UA SG10201609595UA (en) 2012-05-16 2013-05-16 Laser-assisted device alteration using synchronized laser pulses
SG11201407582SA SG11201407582SA (en) 2012-05-16 2013-05-16 Laser-assisted device alteration using synchronized laser pulses

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG11201407582SA SG11201407582SA (en) 2012-05-16 2013-05-16 Laser-assisted device alteration using synchronized laser pulses

Country Status (4)

Country Link
JP (1) JP6200947B2 (en)
SG (2) SG10201609595UA (en)
TW (1) TWI479167B (en)
WO (1) WO2013188046A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10352995B1 (en) 2018-02-28 2019-07-16 Nxp Usa, Inc. System and method of multiplexing laser triggers and optically selecting multiplexed laser pulses for laser assisted device alteration testing of semiconductor device

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2428807A3 (en) 2010-09-08 2014-10-29 DCG Systems, Inc. Laser assisted fault localization using two-photon absorption
US9201096B2 (en) 2010-09-08 2015-12-01 Dcg Systems, Inc. Laser-assisted device alteration using synchronized laser pulses
SG11201507735RA (en) 2013-03-24 2015-10-29 Dcg Systems Inc Pulsed lada for acquisition of timing diagrams
TWI619954B (en) 2014-10-16 2018-04-01 Ｄｃｇ系統公司 Systems and method for laser voltage imaging
CN104484885B (en) * 2014-12-25 2017-09-19 上海华岭集成电路技术股份有限公司 The ATE method of testings of CIS chips yuv format output
JP6870740B2 (en) * 2017-08-22 2021-05-12 富士通株式会社 Soft error inspection method, soft error inspection device and soft error inspection system
US10782343B2 (en) 2018-04-17 2020-09-22 Nxp Usa, Inc. Digital tests with radiation induced upsets
US10910786B2 (en) * 2018-07-23 2021-02-02 University Of Maryland, College Park Laser cavity optical alignment

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5095262A (en) * 1988-09-01 1992-03-10 Photon Dynamics, Inc. Electro-optic sampling system clock and stimulus pattern generator
US6316950B1 (en) * 1997-05-15 2001-11-13 Lucent Technologies Inc. Method and apparatus for imaging semiconductor devices
US6400165B1 (en) * 2000-02-02 2002-06-04 Lucent Technologies Inc. Ultra-fast probe
JP4249410B2 (en) * 2001-12-10 2009-04-02 Ｎｅｃエレクトロニクス株式会社 Inspection apparatus and inspection method for semiconductor device
JP3776073B2 (en) * 2002-10-01 2006-05-17 株式会社神戸製鋼所 Semiconductor carrier lifetime measurement method and apparatus
US7450245B2 (en) * 2005-06-29 2008-11-11 Dcg Systems, Inc. Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system
US7733100B2 (en) * 2005-08-26 2010-06-08 Dcg Systems, Inc. System and method for modulation mapping
US9130344B2 (en) * 2006-01-23 2015-09-08 Raydiance, Inc. Automated laser tuning
JP2009300202A (en) * 2008-06-12 2009-12-24 Toshiba Corp Method and system for inspecting semiconductor device
SG10201401887YA (en) * 2009-05-01 2014-06-27 Dcg Systems Inc Systems and method for laser voltage imaging state mapping
EP2428807A3 (en) * 2010-09-08 2014-10-29 DCG Systems, Inc. Laser assisted fault localization using two-photon absorption

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10352995B1 (en) 2018-02-28 2019-07-16 Nxp Usa, Inc. System and method of multiplexing laser triggers and optically selecting multiplexed laser pulses for laser assisted device alteration testing of semiconductor device

Also Published As

Publication number Publication date
WO2013188046A1 (en) 2013-12-19
SG11201407582SA (en) 2014-12-30
WO2013188046A4 (en) 2014-02-27
TW201411157A (en) 2014-03-16
JP2015517667A (en) 2015-06-22
JP6200947B2 (en) 2017-09-20
TWI479167B (en) 2015-04-01

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