SE0303048L - Method and device for non-contact inspection and measurement of surface properties and surface defects on a material surface - Google Patents

Method and device for non-contact inspection and measurement of surface properties and surface defects on a material surface

Info

Publication number
SE0303048L
SE0303048L SE0303048A SE0303048A SE0303048L SE 0303048 L SE0303048 L SE 0303048L SE 0303048 A SE0303048 A SE 0303048A SE 0303048 A SE0303048 A SE 0303048A SE 0303048 L SE0303048 L SE 0303048L
Authority
SE
Sweden
Prior art keywords
measurement
contact inspection
defects
properties
material surface
Prior art date
Application number
SE0303048A
Other languages
Swedish (sv)
Other versions
SE525206C2 (en
SE0303048D0 (en
Inventor
Hans Aahlen
Original Assignee
Optonova Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Optonova Ab filed Critical Optonova Ab
Priority to SE0303048A priority Critical patent/SE525206C2/en
Publication of SE0303048D0 publication Critical patent/SE0303048D0/en
Priority to EP04800335A priority patent/EP1692460A1/en
Priority to PCT/SE2004/001672 priority patent/WO2005047816A1/en
Publication of SE0303048L publication Critical patent/SE0303048L/en
Publication of SE525206C2 publication Critical patent/SE525206C2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
SE0303048A 2003-11-17 2003-11-17 Contact free measurement of material surface properties for e.g. panels or cylinders, by reflecting light off surface onto optical device with image sensor and beam splitter SE525206C2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
SE0303048A SE525206C2 (en) 2003-11-17 2003-11-17 Contact free measurement of material surface properties for e.g. panels or cylinders, by reflecting light off surface onto optical device with image sensor and beam splitter
EP04800335A EP1692460A1 (en) 2003-11-17 2004-11-17 Scanning and measuring of surface features
PCT/SE2004/001672 WO2005047816A1 (en) 2003-11-17 2004-11-17 Scanning and measuring of surface features

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0303048A SE525206C2 (en) 2003-11-17 2003-11-17 Contact free measurement of material surface properties for e.g. panels or cylinders, by reflecting light off surface onto optical device with image sensor and beam splitter

Publications (3)

Publication Number Publication Date
SE0303048D0 SE0303048D0 (en) 2003-11-17
SE0303048L true SE0303048L (en) 2004-12-28
SE525206C2 SE525206C2 (en) 2004-12-28

Family

ID=29729074

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0303048A SE525206C2 (en) 2003-11-17 2003-11-17 Contact free measurement of material surface properties for e.g. panels or cylinders, by reflecting light off surface onto optical device with image sensor and beam splitter

Country Status (3)

Country Link
EP (1) EP1692460A1 (en)
SE (1) SE525206C2 (en)
WO (1) WO2005047816A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105823782B (en) * 2016-03-10 2019-01-11 北京大学 The characterizing method of crystal boundary and atom defect in a kind of two-dimensional material

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE385048B (en) * 1974-08-05 1976-05-31 Svenska Traeforskningsinst PROCEDURE FOR SATURATING THE TOPOGRAPHY OF A SURFACE
FR2665959B1 (en) * 1990-08-16 1994-01-14 Oreal APPARATUS FOR ASSESSING THE SHINE OF A SURFACE, PARTICULARLY SKIN.
US5208766A (en) * 1990-11-13 1993-05-04 Hughes Aircraft Company Automated evaluation of painted surface quality
EP1245922B1 (en) * 2001-03-26 2010-05-12 Candela Instruments System for measuring phase differences in reflected light signals
US6931149B2 (en) * 2002-04-19 2005-08-16 Norsk Elektro Optikk A/S Pipeline internal inspection device and method

Also Published As

Publication number Publication date
WO2005047816A1 (en) 2005-05-26
SE525206C2 (en) 2004-12-28
SE0303048D0 (en) 2003-11-17
EP1692460A1 (en) 2006-08-23

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Legal Events

Date Code Title Description
NUG Patent has lapsed