KR970002323A - How to prevent damage to the test board when replacing the adapter - Google Patents
How to prevent damage to the test board when replacing the adapter Download PDFInfo
- Publication number
- KR970002323A KR970002323A KR1019950018144A KR19950018144A KR970002323A KR 970002323 A KR970002323 A KR 970002323A KR 1019950018144 A KR1019950018144 A KR 1019950018144A KR 19950018144 A KR19950018144 A KR 19950018144A KR 970002323 A KR970002323 A KR 970002323A
- Authority
- KR
- South Korea
- Prior art keywords
- adapter
- circuit board
- printed circuit
- replacing
- software
- Prior art date
Links
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- Tests Of Electronic Circuits (AREA)
Abstract
본 발명은 인쇄회로기판의 시험시 어뎁터의 전기적인 손상을 방지하기 위한 방법에 관한 것으로, 특히 인쇄회로기판용 시험 어뎁터 및 소프트웨어 교체시 어뎁터의 하드웨어부분과 소프트웨어가 매칭되지 않을 경우 어뎁터의 손상을 방지하기 위한 방법에 관한 것이다. 본 발명에서는 어뎁터 교체시 이를 감지하여 어뎁터가 교체되었다는 메세지를 모니터 화면에 디스플레이시켜 시험할 때 실수로 인한 어뎁터의 전기적 손상을 방지하며, 또한 각각의 시험용 소프트웨어를 구동시에도 메인 메뉴상에서 선택된 어뎁터가 예를 들어 MMC용이라면 마우스로 메뉴선택시 MMC용 스프트웨어만 선택되도록 한다.The present invention relates to a method for preventing the electrical damage of the adapter during the test of the printed circuit board, in particular, to prevent damage to the adapter when the hardware portion of the adapter and the software does not match when replacing the test adapter and software for the printed circuit board It relates to a method for doing so. In the present invention, by detecting this when replacing the adapter to display a message that the adapter is replaced on the monitor screen to prevent the electrical damage of the adapter due to mistakes when testing, and also when the test software is running each adapter selected on the main menu For example, for MMC, select only the software for MMC when selecting a menu with the mouse.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.
제1도는 일반적인 인쇄회로기판의 시험에 대한 흐름도, 제2도는 본 발명에 따른, 인쇄회로기판의 기능 시험장치에 대한 개략적인 블럭도, 제3도는 본 발명에 따른, 인쇄회로기판의 기능 시험 장치에 대한 시험 흐름도.1 is a flow chart of a test of a general printed circuit board, FIG. 2 is a schematic block diagram of a functional test apparatus for a printed circuit board according to the present invention, and FIG. 3 is a functional test apparatus for a printed circuit board according to the present invention. Test flow chart for.
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950018144A KR970002323A (en) | 1995-06-29 | 1995-06-29 | How to prevent damage to the test board when replacing the adapter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950018144A KR970002323A (en) | 1995-06-29 | 1995-06-29 | How to prevent damage to the test board when replacing the adapter |
Publications (1)
Publication Number | Publication Date |
---|---|
KR970002323A true KR970002323A (en) | 1997-01-24 |
Family
ID=66526435
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950018144A KR970002323A (en) | 1995-06-29 | 1995-06-29 | How to prevent damage to the test board when replacing the adapter |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR970002323A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100432736B1 (en) * | 2001-11-26 | 2004-05-24 | 주식회사 엘지이아이 | Course choosing method and apparatus in washing machine |
US8378686B2 (en) | 2007-08-08 | 2013-02-19 | Lg Chem, Ltd. | Apparatus and method for sensing battery cell voltage using isolation capacitor |
-
1995
- 1995-06-29 KR KR1019950018144A patent/KR970002323A/en not_active Application Discontinuation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100432736B1 (en) * | 2001-11-26 | 2004-05-24 | 주식회사 엘지이아이 | Course choosing method and apparatus in washing machine |
US8378686B2 (en) | 2007-08-08 | 2013-02-19 | Lg Chem, Ltd. | Apparatus and method for sensing battery cell voltage using isolation capacitor |
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WITN | Withdrawal due to no request for examination |