KR950028680U - Socket opening and closing device for device testing - Google Patents

Socket opening and closing device for device testing

Info

Publication number
KR950028680U
KR950028680U KR2019940004974U KR19940004974U KR950028680U KR 950028680 U KR950028680 U KR 950028680U KR 2019940004974 U KR2019940004974 U KR 2019940004974U KR 19940004974 U KR19940004974 U KR 19940004974U KR 950028680 U KR950028680 U KR 950028680U
Authority
KR
South Korea
Prior art keywords
socket opening
testing
closing device
closing
device testing
Prior art date
Application number
KR2019940004974U
Other languages
Korean (ko)
Other versions
KR200161672Y1 (en
Inventor
강정호
Original Assignee
현대반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 현대반도체주식회사 filed Critical 현대반도체주식회사
Priority to KR2019940004974U priority Critical patent/KR200161672Y1/en
Publication of KR950028680U publication Critical patent/KR950028680U/en
Application granted granted Critical
Publication of KR200161672Y1 publication Critical patent/KR200161672Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019940004974U 1994-03-11 1994-03-11 Socket opening and closing apparatus for device testing KR200161672Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940004974U KR200161672Y1 (en) 1994-03-11 1994-03-11 Socket opening and closing apparatus for device testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940004974U KR200161672Y1 (en) 1994-03-11 1994-03-11 Socket opening and closing apparatus for device testing

Publications (2)

Publication Number Publication Date
KR950028680U true KR950028680U (en) 1995-10-20
KR200161672Y1 KR200161672Y1 (en) 1999-12-01

Family

ID=19378823

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940004974U KR200161672Y1 (en) 1994-03-11 1994-03-11 Socket opening and closing apparatus for device testing

Country Status (1)

Country Link
KR (1) KR200161672Y1 (en)

Also Published As

Publication number Publication date
KR200161672Y1 (en) 1999-12-01

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20050822

Year of fee payment: 7

LAPS Lapse due to unpaid annual fee