KR950000702B1 - Process for preparation of n-t-butoxycarbonylmaleimid and stylene derivatives copolymer - Google Patents

Process for preparation of n-t-butoxycarbonylmaleimid and stylene derivatives copolymer Download PDF

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KR950000702B1
KR950000702B1 KR1019910010272A KR910010272A KR950000702B1 KR 950000702 B1 KR950000702 B1 KR 950000702B1 KR 1019910010272 A KR1019910010272 A KR 1019910010272A KR 910010272 A KR910010272 A KR 910010272A KR 950000702 B1 KR950000702 B1 KR 950000702B1
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styrene
copolymer
bocmi
styrene derivative
butoxycarbonylmaleimide
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KR930000568A (en
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안광덕
구덕일
정동욱
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한국과학기술연구원
박원희
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/12Unsaturated polyimide precursors
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F212/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an aromatic carbocyclic ring
    • C08F212/02Monomers containing only one unsaturated aliphatic radical
    • C08F212/04Monomers containing only one unsaturated aliphatic radical containing one ring
    • C08F212/06Hydrocarbons
    • C08F212/08Styrene
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F22/00Homopolymers and copolymers of compounds having one or more unsaturated aliphatic radicals each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical and containing at least one other carboxyl radical in the molecule; Salts, anhydrides, esters, amides, imides or nitriles thereof
    • C08F22/36Amides or imides
    • C08F22/40Imides, e.g. cyclic imides
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F222/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical and containing at least one other carboxyl radical in the molecule; Salts, anhydrides, esters, amides, imides, or nitriles thereof
    • C08F222/36Amides or imides
    • C08F222/40Imides, e.g. cyclic imides
    • C08F222/402Alkyl substituted imides
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F222/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical and containing at least one other carboxyl radical in the molecule; Salts, anhydrides, esters, amides, imides, or nitriles thereof
    • C08F222/36Amides or imides
    • C08F222/40Imides, e.g. cyclic imides
    • C08F222/404Imides, e.g. cyclic imides substituted imides comprising oxygen other than the carboxy oxygen
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • G03F7/0392Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
    • G03F7/0395Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having a backbone with alicyclic moieties
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/30Imagewise removal using liquid means
    • G03F7/32Liquid compositions therefor, e.g. developers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/38Treatment before imagewise removal, e.g. prebaking

Abstract

The copolymer, useful for a heat-resistant positive resist image, of N-t-butoxycarbonyl maleimide and styrene deriv. is produced by radical polycondensing an N-t-butoxycarbonyl maleimide monomer and a styrene deriv. with a radical initiator. The styrene deriv. is pref. styrene, p-acetoxystyrene, p-methylstyrene, p-t-butoxycarbonyloxystyrene, p-trimethylsillylstyrene or p- chlorinated styrene. The resist image is formed by spin-coating a soln. obtd. by dissolving the copolymer and an onium salt in a chlorobenzene on the silicon wafer, prebaking, ultra-violet exposing and postbaking the coated wafer, and developing it with a developing liquor i.e. trimethylammonium hydroxy soln., anisole, toluene, methylisobutyl ketone or chloroform.

Description

N-t-부톡시카르보닐말레이미드와 스티렌유도체의 공중합체 제조방법및 N-t-부톡시크르보닐말레이미드와 스티렌 유도체의 공중합체를 이용한 내열성 포지티브 레지스튼 화상 형성 방법Method for preparing copolymer of N-t-butoxycarbonylmaleimide and styrene derivative and method for forming heat resistant positive resist image using copolymer of N-t-butoxycarbonylmaleimide and styrene derivative

본 발명은 새로운 단량체인 N-t-부톡시카르보닐말레아미드(이하 t-BOCMI라 함)(별도 출원중)와 스티렌 유도체의 공중합체 제조방법 및 이 공중합체의 감방사선(radiation-sensitive)을 이용하여 고집적 반도체 및 전자 디바이스 미세가공 공정에서 고감도, 고해상성으로 내열성 레지스트 화상을 형성하는 방법에 관한 것이다.The present invention utilizes a method for preparing a copolymer of styrene derivatives with Nt-butoxycarbonylmaleamide (hereinafter referred to as t-BOCMI) and a new monomer, and using radiation-sensitive radiation of the copolymer. A method of forming a heat resistant resist image with high sensitivity and high resolution in a highly integrated semiconductor and electronic device micromachining process.

미세 가공공정에서 고감도 달성을위하여 근년에 화학증폭성(chenicalapplification) 레지스트가 크게 각광받고 있으며, 이에 의하여 기존의 포지티브형 노볼락계 포토레지스트의 감도를 100배이상 증가시킬 수 있음이 알려졌다. 화학증폭성 레지스트는 광산 발생제(photoacid generator, 이하 PAG라 함)를 이용하는 레지스트계인데, 산(acid)에 민감하게 반응하는 구조의 매트릭스 고분자에 PAG를 배합하여 만든다.In order to achieve high sensitivity in the micromachining process, in recent years, the chemical amplification (chenicalapplification) resist has been greatly spotlighted, thereby increasing the sensitivity of the conventional positive novolak-based photoresist by more than 100 times. A chemically amplified resist is a resist system using a photoacid generator (hereinafter referred to as PAG), and is made by mixing PAG with a matrix polymer having a structure sensitive to acid.

즉, 광산 발생제가 빛에 노광되거나 X-선, 전자선의 고에너지 방사선에 조사되면 강한 양성자산인 브론스테드 산이 생성되고, 이 생성된 산의 작용으로 매트릭스 고분자의 주쇄 또는 축쇄가 반응하여 분해하되거나 가교결합, 또는 고분자의 극성이 크게 변하여 주어진 현상제에 대하여 용해도가 증가 또는 감소하게 되어 조사된 부분의 미세 화상이 만들어진다.That is, when the photoacid generator is exposed to light or irradiated with high energy radiation of X-rays or electron beams, a strong positive asset, bronsted acid, is formed, and the action of the acid causes the main chain or condensation of the matrix polymer to react and decompose. Or crosslinking, or the polarity of the polymer is greatly changed, so that the solubility increases or decreases for a given developer, thereby producing a fine image of the irradiated portion.

광산 발생제로는 오니움 염(onium salt)이 일반적으로 알려져 있으며, 대표적으로 여러가지 암모늄염, 술포늄염등이 있고, 최근에는 유기 술폰산 에스테르가 보고되었다.Onium salts are generally known as photoacid generators, and various ammonium salts, sulfonium salts, and the like, and organic sulfonic acid esters have recently been reported.

산반응성 매트릭스 고분자로는 t-부틸에스테르, 카보네이트, t-부톡시, t-부톡시카보닐(t-BOC)기로 보호된 측쇄를 갖는 카르복시산 또는 페놀 작용기를 가진 고분자가 사용되고, 측쇄 보호기중 t-BOC보호기가 감도면에서 가장 우수한 것으로 알려져 있다.As the acid-reactive matrix polymer, a polymer having a carboxylic acid or a phenol functional group having a side chain protected with t-butyl ester, carbonate, t-butoxy or t-butoxycarbonyl (t-BOC) group is used. BOC protecting groups are known to be the best in terms of sensitivity.

산반응성 고분자가 보호된 상태 또는 산과 반응 하기전에는 유기용매에 가용성이지만, 산고 반응하여 탈호된 상태에서의 고분자의 구조에서 극성이 크게 변하여 알칼리 수용액 가용성으로 변한다. 한편, 현재의 발달된 초미세(microlithography)에서는 자동화 공정을 거쳐 고해상성(resolution)을 달성하는데, 이때 플라즈마 드라이 엣칭(dry-etching)에 의한 패턴이전(pattern transfer)에서 레지스트의 미세화상이 200℃ 이상에서 내열성을 가져야함이 요구된다. 또한, 서브미크론 해상성 달성을 위하여 조사파장이 자외선의 G-선(436nm), I-선(365nm)에서 보다 단파장인 원자외선(deep UV. 200∼300nm) 또는 보다 유리하게 고출력의 볼호 크립톤 엑사이머레이저(KrF excimer laser)의 짧은 파장인 248nm쪽으로 이전 하는 기술발전 추세가 있다.The acid-reactive polymer is soluble in the organic solvent before the reaction with the protected state or acid, but the polarity is greatly changed in the structure of the polymer in the acid-reacted and de-removed state, thereby changing to an aqueous alkali solution. On the other hand, in today's advanced microlithography, high resolution is achieved through an automated process, where a fine image of a resist is 200 ° C. in a pattern transfer by plasma dry etching. It is required to have heat resistance from the above. In addition, to achieve submicron resolution, the irradiated wavelength is shorter in the ultraviolet rays of G-ray (436nm), I-ray (365nm) of ultraviolet rays (deep UV. Technological advances are moving towards shorter wavelengths of 248nm for the KrF excimer laser.

따라서, 원자외선, 특히 엑사이머 레이저 파장 영역에서 레지스트의 광흡수가 적절하여야 한다.Therefore, light absorption of the resist should be appropriate in the far ultraviolet, especially in the excimer laser wavelength range.

현재, 미세 가공에 사용되는 포지티브형 포토레지스트의 기본 매트릭스 고분자는 알칼리 수용액 현상성 노볼락 수지인데, 노볼락 수지는 유리전이온도가 100℃ 내지 150℃ 이하로 낮아서 플라즈마 식각 공정이나 온식각 공정중에 레지스트 미세화상의 변형이 일어날 수 있고, 또 원자외선 영역에서의 광흡수도가 너무 높아서 0.5㎛이하 해상도의 달성에 적합하지 않는 것으로 알려져 있다.Currently, the basic matrix polymer of the positive type photoresist used for microfabrication is an aqueous alkali solution developable novolak resin, and the novolak resin has a low glass transition temperature of 100 ° C. to 150 ° C. or lower. It is known that deformation of the microscopic image may occur, and the light absorption in the far ultraviolet region is too high to be suitable for achieving a resolution of 0.5 mu m or less.

이와같은 고감도, 고해상성, 내열성을 만족시키는 레지스트 재료로서 t-BOC 보호기 함유한 말레이미드 구조의 고분자가 각광받게 되었다.As a resist material satisfying such high sensitivity, high resolution, and heat resistance, a polymer having a maleimide structure containing a t-BOC protecting group has come into the spotlight.

Turner, Ahn, Willson은 탈보호후에 약 235℃의 유리전이온도를 갖는 폴리(t-BOC-옥시페닐말레이미/스티렌), P(t-BOCPMI/st)을 발표하였고, 또한 Osuch등은 역시 좋은 감도의 내열성을 갖는 t-BOC 보호된 말레이미드-스티렌 공중합체(P(MI/St)-t-BOC)를 원자외선 레지스트로 이용할 수 있음을 보고하였다.Turner, Ahn and Willson published poly (t-BOC-oxyphenylmaleimide / styrene), P (t-BOCPMI / st ), which had a glass transition temperature of about 235 ° C after deprotection. It has been reported that t-BOC protected maleimide-styrene copolymer (P (MI / St) -t-BOC) with heat resistance of sensitivity can be used as an far ultraviolet resist.

이처럼 매트릭스 고분자에 말레이미드 구조가 도입되면 내열성이 대폭 개선되고, 말레이미드가 포함된 메트릭스 고분자는 KrF 엑사이머 레이저 영역에서의 광흡수가 낮아서 레지스트 응용에 매우 적절하다.The introduction of the maleimide structure into the matrix polymer greatly improves the heat resistance, and the matrix polymer containing maleimide has low light absorption in the KrF excimer laser region, which is very suitable for resist applications.

그러나, 이상 두가지 말레이미드-스티렌 고분자는 t-BOC 함유 단량체로 부터 직접 중합된 것이 아니고, 고분자의 반응에 의하여 고분자에 t-BOC 보호기를 도입한 것이므로, 레지스트 고분자 구조를 완전히 제어하는데 문제가 있다.However, the above two maleimide-styrene polymers are not directly polymerized from t-BOC-containing monomers, but because t-BOC protecting groups are introduced into the polymer by reaction of the polymer, there is a problem in controlling the resist polymer structure completely.

즉, t-BOC 보호기 함유 고분자 P(MI/St)-t-BOC은 말레이미드(MI)와 스티렌(St)의 공중합체 P(MI/St)에 화학반응에 의하여 t-BOC 보호기를 도입하였다.That is, the t-BOC protecting group-containing polymer P (MI / St) -t-BOC introduced the t-BOC protecting group by chemical reaction to the copolymer P (MI / St) of maleimide (MI) and styrene (St). .

P-(MI/St)-t-BOC은 115℃에서 부터 t-BOC 기의 열분해가 시작되므로, 공정에서 문제가 생기는데, 이렇게 낮은 온도에서 t-BOO 보호기의 탈보호 반응이 일어나는 것은 t-BOC 보호기를 도입하는 고분자 반응 과정에서의 불완전 보호반응에 기인된다. 본 발명은 t-BOC 보호기 함유 고분자를 새로운 t-BOC보호 단량체인 t-BOCMI와 스티렌 및 스티렌 도체, 다른 단량체를 통상적인 라디칼 공중합체 반응에 의하여 효율적으로 제조하는 방법 및 이들을 레지스트 재료로 이용하는 것이다.Since P- (MI / St) -t-BOC starts pyrolysis of t-BOC groups at 115 ° C, problems arise in the process, and at this low temperature, de-protection of t-BOO protecting groups occurs at t-BOC It is due to the incomplete protection reaction in the polymer reaction process to introduce the protecting group. The present invention uses a t-BOC protecting group-containing polymer to efficiently produce a new t-BOC protecting monomer, t-BOCMI, styrene and styrene conductor, and other monomers by a conventional radical copolymer reaction, and uses them as a resist material.

본 발명에서 제조된 공중합체는 앞에서 기술한 고분자 반응에 의한 합성과는 달리 말레이미드 구조에 t-BOC 보호기가 완벽히 결합되어 있어서 고분자의 제조와 구조 제어에 유리하다.The copolymer prepared in the present invention, unlike the synthesis by the polymer reaction described above, is completely bonded to the t-BOC protecting group in the maleimide structure, which is advantageous for the preparation of the polymer and the structure control.

본 발명에서 t-BOCMI 함유된 대표적인 스티렌 유도체와의 공중합체는 다음과 같은 일반식(Ⅰ)를 갖는다.In the present invention, a copolymer with a representative styrene derivative containing t-BOCMI has the following general formula (I).

식 중, X는 수소, 메틸, 에틸등의 알킬기와 아세톡시, 염소, 염화메틸, 히드록실, t-BOC-옥시 및 트리메틸실릴, 트리메틸실리메틸등 실리콘 함유기이다. t-BOCMI와 치환체 X의 스티렌 유도체(XSt)의 공중합체는 P(t-BOCMI/XSt)로 표시된다. t-BOCMI 단량체의 라디칼 공중합 반응은 라디칼 중합 개시제를 사용하여 통상의 중합방법에 따라 수행한다. 여러 스티렌 유도체 (XSt로 표시) 또는 메타아크릴산메틸(MMA) 단량체의 t-BOCMI의 높은 전환율로 진행되고, 특히 스티렌 유도체 XSt와 t-BOCMI의 공중합에서는 사용된 라디칼 개시제양, 용매양에 의해 합성된 중합체의 분자량의 조절이 가능하다. t-BOCMI와 여러 스티렌 유도체와의 공중합반응은 1 : 1몰비로 수행하며, 합성된 공중합체는 탄소-13과 양성자 핵자기 공명 분광 분석으로 교대 구조(alternating structure)를 가짐이 확인되었다.In the formula, X is an alkyl group such as hydrogen, methyl or ethyl, and a silicon-containing group such as acetoxy, chlorine, methyl chloride, hydroxyl, t-BOC-oxy and trimethylsilyl, trimethylsilmethyl and the like. The copolymer of t-BOCMI and styrene derivative (XSt) of substituent X is represented by P (t-BOCMI / XSt). The radical copolymerization reaction of the t-BOCMI monomer is carried out according to a conventional polymerization method using a radical polymerization initiator. It proceeds with a high conversion of t-BOCMI of various styrene derivatives (expressed as XSt) or methyl methacrylate (MMA) monomers, and especially in the copolymerization of styrene derivatives XSt and t-BOCMI synthesized by the amount of radical initiator and solvent used. Control of the molecular weight of the polymer is possible. Copolymerization of t-BOCMI with various styrene derivatives was carried out in a 1: 1 molar ratio, and the synthesized copolymer had an alternating structure by carbon-13 and proton nuclear magnetic resonance spectroscopy.

전자가 부족한 단량체인 t-BOCMI의 전작 풍부한 단량체인 스티렌 유도체가 공중합될때 1 : 1 교대 공중합체가 생성되는 것은 잘 알려진 사실이다.It is well known that 1: 1 copolymers are produced when styrene derivatives, the former monomers of t-BOCMI, which are electron-deficient monomers, are copolymerized.

본 발명에서 합성된 대표적인 스티렌과 t-BOCMI의 교대 공중합체 폴리(t-부톡시카르보닐말레이미드/스티렌), P(t-BOCMI/St) 공중합체는 열중량 분석(TGA)에서 130℃까지 안정하며 150℃ 이상에서는, t-부톡시카르보닐(t-BOC)기의 빠른 탈보호가 일어나 2-메틸프로펜과 이산화탄소 발생에 해당하는 33%의 무게 감소가 관찰되었는데, 이로서 P(t-BOCMI/St)는 고분자 반응으로 합성된 기존의 P(MI/St)-t-BOC 고분자보다 우수한 열적 성질을 가짐을 알 수 있다.Representative styrene and alternating copolymers of t-BOCMI poly (t-butoxycarbonylmaleimide / styrene) and P (t-BOCMI / St) copolymers synthesized in the present invention are thermogravimetric analysis (TGA) up to 130 ° C. Stable and above 150 ° C, rapid deprotection of the t-butoxycarbonyl (t-BOC) group occurred, resulting in a 33% weight loss corresponding to 2-methylpropene and carbon dioxide evolution, resulting in P (t- It can be seen that BOCMI / St) has superior thermal properties than conventional P (MI / St) -t-BOC polymers synthesized by polymer reaction.

열시차 분석법(DSC)에서 P(t-BOCMI/St)는 실온에서 부터 200℃까지 승온시켜서 관찰한 1차 측정시 152℃에서 t-BOC기의 탈보호에 해당하는 흡열현상을 나타냈고, 이때 탈보호된 동일 시료를 실온까지 냉각한후, 다시 승온시키면서 관찰한 2차 측정에서는 유리전이온도는 245℃였고, 400℃에서 분해가 시작되었다. 본 발명에서의 t-BOCMI와 스티렌 유도체들 및 다른 단량체의 중합으로 제도된 t-BOC보호 공중합체는 모두 좋은 필름 형성능을 보여, 특히 합성된 P(t-BOCMI/XSt)는 클로로포름, 디옥산, 테트라히드로퓨란, 클로로벤젠 같은 유기용매에 매우 잘 용해되었고, 반면에 탈보호된 중합체는 가성소다, 암모윰염등 알칼리 수용액에 잘 녹고 대부분의 유기용매에 잘 녹지 않는 것으로 나타나 t-BOC기의 탈보호 전후에 있어서 선택적 현상에 의한 우수한 화상형성능을 확인하였다.P (t-BOCMI / St) showed the endothermic phenomenon corresponding to deprotection of t-BOC group at 152 ° C in the first measurement observed at room temperature to 200 ° C. After cooling the same deprotected sample to room temperature, the glass transition temperature was 245 ° C in the second measurement observed while raising the temperature again, and decomposition started at 400 ° C. In the present invention, all of the t-BOC protective copolymers drawn by the polymerization of t-BOCMI and styrene derivatives and other monomers show good film-forming ability. In particular, the synthesized P (t-BOCMI / XSt) is chloroform, dioxane, It was very well soluble in organic solvents such as tetrahydrofuran and chlorobenzene, while the deprotected polymer was well soluble in aqueous alkali solution such as caustic soda and ammonium salt and insoluble in most organic solvents. The excellent image forming ability by the selective phenomenon was confirmed before and after.

표 1에 대표적인 P(t-BOCMI/St) 공중합체의 탈보호에 따른 용해도 변화를 요약하였다. 또한, 유기산 존재하에서 이 고분자의 t-BOC기 탈보호가 100℃ 이하에서 관찰되었고, 통상의 미세화상 형상 실험으로 화학증폭성 레지스트로서의 응용성이 확인되었다.Table 1 summarizes the change in solubility following deprotection of representative P (t-BOCMI / St) copolymers. In addition, t-BOC group deprotection of this polymer was observed at 100 ° C. or lower in the presence of an organic acid, and its application as a chemically amplified resist was confirmed by ordinary microscopic image experiments.

본 발명에서 중요한 특성인 중합체의 열분해 거동 측정은 듀폰사의 910 DSC와 Model 951 TGA를 이용하여 질소 기체하에서 10℃의 승온 속도로 수행하였다.Measurement of the pyrolysis behavior of the polymer, which is an important characteristic of the present invention, was carried out using a DuPont 910 DSC and Model 951 TGA at a temperature rising rate of 10 ° C. under nitrogen gas.

고분자의 용액점도는 25℃에서 유리점도관에서 디옥산 용액의 농도를 0.20g/dl로 하여 측정하였다. 이하 본 발명의 몇가지 실시예를 들어 자세히 설명하나, 이들 실시예가 본 발명을 한정하는 것은 아니다.The solution viscosity of the polymer was measured at 25 ° C. with a concentration of dioxane solution of 0.20 g / dl in a glass viscosity tube. Some embodiments of the present invention are described in detail below, but these examples do not limit the present invention.

참고실시예 : t-BOCMI 단량체의 합성방법(특허출원중)Reference Example: Synthesis method of t-BOCMI monomer (patent pending)

딜스-알더반응에 따라 반응기에 말레이미드 25.0g(0.26mol)과 퓨란 28.0g(0.41mol), 톨루엔 100ml를 가지고 24시간 환류시켰다. 반응물을 실온으로 식히고 여과 및 건조하여 3.6-에폭시-1, 2, 3, 6-테트라히드로탈이미드 42.0g(99% 수율)을 얻고 더 이상의 정제없이 다음 반응에 사용되었다. 3, 6-에폭시-1, 2, 3,-테트라히드로프탈이미드 42.0g(0.26mol)을 취하여 디메틸술폭사이드(DMSO) 300ml에 녹이고 분말상의 타시움 t-부톡사이드 35.0g(0.31mol)을 가하여 실온에서 30분동안 저어준후, 디-t-부틸디카보테이트 .0g(0.28mol)을 부가하여 2시간 반응시켰다.According to the Diels-Alder reaction, 25.0 g (0.26 mol) of maleimide, 28.0 g (0.41 mol) of furan, and 100 ml of toluene were refluxed for 24 hours. The reaction was cooled to room temperature, filtered and dried to give 42.0 g (99% yield) of 3.6-epoxy-1, 2, 3, 6-tetrahydrotalimide and used for the next reaction without further purification. Take 42.0 g (0.26 mol) of 3, 6-epoxy-1, 2, 3, -tetrahydrophthalimide, dissolve in 300 ml of dimethyl sulfoxide (DMSO), and add 35.0 g (0.31 mol) of tasium t-butoxide in powder form. After stirring at room temperature for 30 minutes, di-t-butyldicarbate 0.0 g (0.28 mol) was added and reacted for 2 hours.

반응물을 냉각시킨 증류수에 부어 침전시키고, 여과후 건조하여 흰분말의 t-BOC 함유 N-(t-부톡시카보닐)-3, 6-에폭시-1, 2, 3, 6-테트라히드로프탈아미드 55.0g(81% 수율)울 얻었다. N-(t-부톡시카보닐)-3, 6-에폭시-1, 2, 3 ,6-테트라히드로프탈이미드 10.0g 취하여 톨루엔 100ml에 녹이고 110℃∼125℃ 기름 중탕에서 1.5시간 환류시켜 열분해하였다.The reactant was poured into cooled distilled water, precipitated, filtered and dried to give N- (t-butoxycarbonyl) -3, 6-epoxy-1, 2, 3, 6-tetrahydrophthalamide containing t-BOC as a white powder. 55.0 g (81% yield) were obtained. Take 10.0 g of N- (t-butoxycarbonyl) -3, 6-epoxy-1, 2, 3,6-tetrahydrophthalimide, dissolve in 100 ml of toluene and reflux for 1.5 hours in 110 ℃ -125 ℃ oil bath. It was.

톨루엔을 감압 증발시키고 얻어진 고체를 톨루엔과 헥산(1 : 10의 체적 비율)용매로 재결정하여 고순도의 t-BOCMI 6.7g을 얻었다(수율 90%). t-BOCMI는 녹는점이 62℃로 관찰되었고 양성자 분광분석에서 이중합의 2개 프로트(6.70ppm)과 t-BOC기의 9개 프론트(1.60ppm)을 각각 단일 피크로 확인하였다. 적외 분광분석에서 t-부틸에 해당하는 2980cm-1와 이미드와 에스테르에 해당하는 1800, 1760, 1720cm2 수띠가 확인되었다.Toluene was evaporated under reduced pressure, and the obtained solid was recrystallized from a solvent of toluene and hexane (volume ratio of 1: 10) to obtain 6.7 g of high purity t-BOCMI (yield 90%). The melting point of t-BOCMI was observed at 62 ° C, and proton spectroscopy confirmed two protopes of double sum (6.70ppm) and nine fronts of t-BOC group (1.60ppm) as single peaks. 2980 cm equivalent to t-butyl in infrared spectroscopy-One1800, 1760, 1720 cm equivalent to imides and esters2of The belt was confirmed.

탄소 -13 양성자 분광분석에서 t-부틸기의 탄소가 85.24ppm, 올레핀의 탄소가 135.83ppm, 에스테르의 탄소가 145.88ppm, 말레이미드의 케톤 탄소가 166.22ppm에서 확인되었다.In the carbon-13 proton spectroscopy, the carbon of the t-butyl group was found to be 85.24 ppm, the carbon of the olefin was 135.83 ppm, the carbon of the ester was 145.88 ppm, and the ketone carbon of the maleimide was 166.22 ppm.

[실시예 1]Example 1

t-BOCMI의 호모 중합체 제조Homopolymer Preparation of t-BOCMI

단량체 t-BOCMI 0.98g(5mmol)과 라디칼 중합개시제 벤조일 퍼옥사이드(BPO) 12.10g(35% 전환율)의 합체를 얻었다. 측정된 점도는 0.24dl/g이었다.A copolymer of 0.98 g (5 mmol) of monomer t-BOCMI and 12.10 g (35% conversion) of a radical polymerization initiator benzoyl peroxide (BPO) was obtained. The viscosity measured was 0.24 dl / g.

[실시예 2]Example 2

t-BOCMI와 스티렌의 교대 공중합체 P(t-BOCMI/St) 제조Preparation of Alternating Copolymer P (t-BOCMI / St) of t-BOCMI and Styrene

중합용기에 t-BOCMI 단량체 15.8g(80mmol) 라디칼 개시제AIBN1.1g(6.4mmol)을 넣고 디옥산 40ml에 녹인뒤 질소기류하에 기름 중탕의 55℃ 온도에서 5시간 중합하였다.15.8 g (80 mmol) of the radical initiator AIBN 1.1 g (6.4 mmol) was added to the polymerization vessel, dissolved in 40 ml of dioxane, and then polymerized at 55 ° C. in an oil bath under nitrogen stream for 5 hours.

중합반응후 디옥산에 희석하여 메탄올 5ℓ 가량에 침전시키고 회수하여 21.4g(89%의 전환율)의 공중합체를 얻었다.After the polymerization reaction, the mixture was diluted with dioxane, precipitated in about 5 L of methanol, and recovered to obtain a copolymer of 21.4 g (89% conversion).

탄소 및 양성자 분광 분석경로가 1 : 1 교대구조임이 확인되었고 열분석에 의해 150℃∼160℃에서 t-BOCMI의 탈보호에 해당하는 33%의 무게가 감소되었다. 측정된 점도는 0.95dl/g이었다.The carbon and proton spectroscopic paths were found to have a 1: 1 alternation structure, and thermal analysis reduced the weight of 33% corresponding to the deprotection of t-BOCMI from 150 ° C to 160 ° C. The measured viscosity was 0.95 dl / g.

[실시예 3]Example 3

BOCMI와 스티렌유도체(XSt)의 공중합체 P(t-BOCMI/XSt)제조Manufacture copolymer P (t-BOCMI / XSt) of BOCMI and styrene derivative (XSt)

단량체 t-BOCMI와 스티렌유도체 XSt인 p-메틸스티렌(MeSt), p-아세톡시스티렌(AcOSt), p-염화스티렌(ClSt), m-염화메틸스티렌(ClCH1St), p-t-BOC-옥시스티렌(t-BOCSt), p-트리메틸실릴스티렌(SiSt), p-트리메틸실릴메틸스티렌(SiCH1St)을 단량체의 몰비를 1 : 1로 하여 앞에서 기술한 실시예 3과 같은 절차로 행한바 t-BOCMI와 각 XSt 단량체의 공중합 결과는 표 2와 같았다.P-methylstyrene (MeSt), p-acetoxystyrene (AcOSt), p-styrene chloride (ClSt), m-methyl chloride (ClCH 1 St), pt-BOC-oxy as monomer t-BOCMI and styrene derivative XSt Styrene (t-BOCSt), p-trimethylsilylstyrene (SiSt), and p-trimethylsilylmethylstyrene (SiCH 1 St) were subjected to the same procedure as described in Example 3, with the molar ratio of monomers 1: 1. The copolymerization result of -BOCMI and each XSt monomer was shown in Table 2.

[실시예 4]Example 4

t-BOCMI MMA의 공중합체 제조Copolymer Preparation of t-BOCMI MMA

t-BOCMI와 메타아크릴산메틸(MMI)의 공중합을 실시예 3과 같은 절차로 진행한 바 표 2와 같았다.The copolymerization of t-BOCMI and methyl methacrylate (MMI) was carried out in the same manner as in Example 3, as shown in Table 2.

[실시예 5]Example 5

t-BOCMI와 N-페닐말레이미드(PhMI)의 공중합체 제조Copolymer Preparation of t-BOCMI and N-phenylmaleimide (PhMI)

t-BOCMI와 PhMI의 공중합을 실시예 3과 같은 절차로 진행한 바 결과는 표 2와 같았다.The copolymerization of t-BOCMI and PhMI was carried out in the same manner as in Example 3, and the results were as shown in Table 2.

[표 1] P(t-BOCMI/ST) 공중합체의 탈보호에 따른 변화[Table 1] Deprotection of P (t-BOCMI / ST) copolymer

보기 : ++ : 잘녹음, + ; 녹음 - ; 녹지않음Example: ++: Recorded, +; record - ; Insoluble

*P(t-BOCMI/St) : t-BOCMI와 스티렌의 몰비 1 : 1 구조의 공중합체.* P (t-BOCMI / St): Copolymer of the molar ratio 1: 1 structure of t-BOCMI and styrene.

**P(MI/St) : P(t-BOCMI/St) 공중합체로 부터 t-BOC기를 탈보호하여 얻어진 말레이미드의 스티렌의 몰비 1 : 1구조의 공중합체** P (MI / St): Copolymer of mole ratio 1: 1 structure of styrene of maleimide obtained by deprotecting t-BOC group from P (t-BOCMI / St) copolymer

*TMAH : 테트라메틸암모늄히드록시드* TMAH: Tetramethylammonium Hydroxide

[표 2] t-BOCMI의 공중합 결과Table 2 Copolymerization Results of t-BOCMI

*공단량체 : St는 스티렌 ; AcOSt는 p-아세톡시스티렌 ; MeST는 p-메틸스티렌 ; ClSt는 p-염화스티렌 ; ClCH2St는 m-염화메틸스티렌 ; BOCSt는 p-t-부톡시카르보닐옥시스티렌 ; SiSt는 p-트리메틸실릴스티렌 ; SiCH2St는 p-트리메틸실릴메틸스티렌 ; MMA는 메타아크릴메틸 ; PhMI는 N-페닐말레이미드임.* Comonomer: St is styrene; AcOSt is p-acetoxy styrene; MeST is p-methylstyrene; ClSt is p-styrene chloride; ClCH 2 St is m-methyl chloride; BOCSt is pt-butoxycarbonyloxystyrene; SiSt is p-trimethylsilyl styrene; SiCH 2 St is p-trimethylsilylmethylstyrene; MMA is methacrylmethyl; PhMI is N-phenylmaleimide.

**M/S : 몰비 1 : 1로 사용한 단량체의 총무게에 대한 디옥산 용매의 부피 비율.** Volume ratio of dioxane solvent to total weight of monomers used in M / S: molar ratio 1: 1.

*ninh : 고유점도 측정치, 디옥산 용액농도 0.20g/dl, 25℃ 용액.* ninh: intrinsic viscosity measurement, dioxane solution concentration 0.20g / dl, 25 ℃ solution.

[실시예 6]Example 6

레지스트 용액 제조와 포지티브 미세화상 형성방법Resist Solution Preparation and Positive Micro Image Formation Method

클로로벤젠에 P(t-BOCMI/St)를 10.0% 내지 20.0 무게%로 녹이고, 광산발생제 오니움염 및 유기 술폰산을 레지스트 고분자에 대하여 5.0 내지 20.0무게%로 배합하여 화학증폭성 레지스트 용액을 만들어 실리콘 웨이퍼에 스핀 도포하여 두께 1.0㎛ 내외의 얇은 박막을 제조하였다.Dissolve P (t-BOCMI / St) in chlorobenzene at 10.0% to 20.0% by weight, and mix the photoacid generator onium salt and organic sulfonic acid at 5.0 to 20.0% by weight with respect to the resist polymer to form a chemically amplified resist solution. Spin coating was performed on the wafer to prepare a thin film having a thickness of about 1.0 μm.

이 시료 웨이퍼를 110℃ 오븐에서 3∼10분간 전열처리(prebaking)하고, 원자외선 노광후 100∼110℃ 오븐에서 1∼3분간 후열처리(postexposurebaking ; PEB)한 다음, 트리메티암모늄 히드록시드(TMAH) 2.38무게% 수용액에 3분간 침지현상한 바 서브미크론의 레지스트 화상이 형성되었다.The sample wafer was prebaked in a 110 ° C. oven for 3 to 10 minutes, postexposurebaked (PEB) in a 100 to 110 ° C. oven for 1 to 3 minutes after exposure to ultraviolet light, and then trimethammonium hydroxide ( TMAH) Submerged in 2.38 weight% aqueous solution for 3 minutes, the submicron resist image was formed.

[실시예 7]Example 7

내열성 네가티브 화상형성방법Heat-resistant negative image forming method

레지스트용액(실시예 6)을 동일방으로 스핀도포하고, 원자외선 노광한 다음에 노광후 열처리(PEB)를 수행한다. 현상액으로서 유기용매인 아니솔(anisole)을 사용하여 3분간 침지현상한 바, 네가티브 화상이 형성되었고, 200℃ 이상의 내열성을 나타냈다.The resist solution (Example 6) was spin-coated in the same direction, exposed to ultraviolet light and then subjected to post-exposure heat treatment (PEB). After immersion for 3 minutes using an organic solvent, anisole, as a developing solution, a negative image was formed and exhibited heat resistance of 200 ° C. or higher.

[실시예 8]Example 8

레지스트 미세화상 형성방법Resist Micro Image Formation Method

실시예 6과 7에 있어서 광산발생제로는 기존의 오니움염과 유기 술폰산 에스테르가 포함되고 레지스트 용액제조에 사용되는 용매로 클로로벤젠을 위시하여 시클로헥사논, 2-에톡시에틸아세테이트(셀로솔브아세테이트), 디옥산, 메틸이소부틸케톤 등 기존의 레지스트용액 제조용 용매를 사용하였다. 알칼리 현상액으로 TMAH가 포함된 것과 가성 소다 수용액을 사용하여도 동일한 결과가 얻어졌다.In Examples 6 and 7, photoacid generators include conventional onium salts and organic sulfonic acid esters, and cyclohexanone and 2-ethoxyethyl acetate (cellosolve acetate), including chlorobenzene, as a solvent used for preparing a resist solution. Conventional solvents for preparing resist solutions, such as dioxane and methyl isobutyl ketone, were used. The same result was obtained when using TMAH and alkaline caustic aqueous solution as alkaline developing solution.

Claims (4)

N-t-부톡시카르보닐말레이미드 단량체와, 스티렌계 유도체를 라디칼 공중합시켜 N-t-부톡시카르보닐말레이미드와 스티렌 유도체의 몰비가 1 : 1인 N-t-부톡시카르보닐말레이미드와 스티렌 유도체의 공중합체 제조방법A copolymer of Nt-butoxycarbonylmaleimide monomer and a styrene derivative by radical copolymerization of Nt-butoxycarbonylmaleimide and a styrene derivative in which the molar ratio of Nt-butoxycarbonylmaleimide and styrene derivative is 1: 1. Manufacturing method 제 1 항에 있어서, 스티렌 유도체가 스티렌, P-아세톡시스티렌, P-메틸스티렌, P-염화스티렌, m-염화메틸스티렌, P-t-부톡시카르보닐옥시스티렌, P-트리메틸시릴메틸스티렌, P-트리메틸실릴스티렌인-N-t-부톡시카르보닐말레이미드와 스티렌 유도체의 공중합체 제조방법.The styrene derivative according to claim 1, wherein the styrene derivative is styrene, P-acetoxystyrene, P-methylstyrene, P-styrene chloride, m-methyl chloride, Pt-butoxycarbonyloxystyrene, P-trimethylsilylmethylstyrene, P A method for producing a copolymer of -Nt-butoxycarbonylmaleimide, which is -trimethylsilylstyrene, and a styrene derivative. 실리콘 웨이퍼상에 N-t-부톡시카르보닐말레이미드와 스티렌 유도체의 공중합체와 오니움염을 클로로벤젠에 용해한 용액을 스핀 도포한 다음, 전열처리(prebaking)하고 원자외선 노광후 후열처리한 다음 현상하는 내열성 포지티브 레지스타 화상형성방법.A spin-coated solution of a copolymer of Nt-butoxycarbonylmaleimide and a styrene derivative and an onium salt in chlorobenzene was spin-coated on a silicon wafer, followed by prebaking, post-heat treatment, and development. Positive resist image forming method. 제 3 항에 있어서, 현상액이 트리메틸암모늄 히드록시드 수용액, 아니솔, 톨루엔, 메틸이소부틸케톤, 클로로포름인 것이 특징인 내열성 포지티즈 레지스트 화상형성방법.4. The method of claim 3, wherein the developer is an aqueous solution of trimethylammonium hydroxide, anisole, toluene, methyl isobutyl ketone, and chloroform.
KR1019910010272A 1991-06-21 1991-06-21 Process for preparation of n-t-butoxycarbonylmaleimid and stylene derivatives copolymer KR950000702B1 (en)

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JP4024158A JPH0680724A (en) 1991-06-21 1992-02-10 Production of n-t-butoxycarbonylmaleimide (co)polymer, and method for forming heat-resistant positive resist image using n-t-butoxycarbonylmaleimide (co)polymer

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EP0659781A3 (en) * 1993-12-21 1995-09-27 Ciba Geigy Ag Copolymers of maleimide, for photoresists.
JP5270249B2 (en) * 2008-03-25 2013-08-21 富士フイルム株式会社 Negative resist composition for development and pattern forming method using the same
JP5827788B2 (en) * 2010-03-09 2015-12-02 富士フイルム株式会社 Pattern forming method, chemically amplified resist composition, and resist film
JP5557568B2 (en) * 2010-03-23 2014-07-23 富士フイルム株式会社 Pattern formation method, chemically amplified resist composition, and resist film
JP5675532B2 (en) 2011-08-30 2015-02-25 富士フイルム株式会社 Pattern forming method, actinic ray-sensitive or radiation-sensitive resin composition, and actinic ray-sensitive or radiation-sensitive film

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US4837124A (en) * 1986-02-24 1989-06-06 Hoechst Celanese Corporation High resolution photoresist of imide containing polymers
US4775609A (en) * 1987-05-18 1988-10-04 Hoescht Celanese Corporation Image reversal
EP0361906A3 (en) * 1988-09-29 1991-05-02 Hoechst Celanese Corporation Method of producing an image reversal negative photoresist having a photo-labile blocked imide

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