KR20170096441A - Device and method for detecting rogue ont based on profile - Google Patents

Abstract

The present invention relates to a profile-based malfunctioning ONT detecting apparatus and a malfunctioning ONT detecting method. The profile-based malfunctioning ONT detecting apparatus according to the present invention includes: a measuring unit for measuring a power value in an OLT (Optical Line Terminal) for distributing optical data to a plurality of ONTs (Optical Network Terminals); a level A determination unit that determines whether or not a malfunction ONT is generated; and a control unit that checks the plurality of ONTs according to an inspection order when the power value is included in a level related to the occurrence of at least one malfunction ONT, And a detection unit for detecting the number.

Description

TECHNICAL FIELD [0001] The present invention relates to a malfunction ONT detecting apparatus and a malfunction ONT detecting method,

The present invention relates to a profile-based malfunctioning ONT detecting apparatus and a malfunctioning ONT detecting method.

The passive optical network (PON) technology uses a point-to-multipoint (p-t-mp) data transmission scheme. In other words, the PON may be a structure in which an optical line terminal (OLT) communicates with a plurality of optical network terminals (ONTs). Since the downstream data signal from the OLT to the plurality of ONTs includes data for all the ONTs, each ONT may be a structure for receiving only data destined for itself and discarding other data. On the other hand, the upstream data signal directed from the ONTs to the OLT may be a structure that the ONTs transmit according to the time slots allocated to the ONTs from the OLT.

At this time, an ONT which causes a malfunction in the uplink transmission may occur. There are three causes of malfunctioning, which can be classified according to cause, operation phenomenon, and damage range.

First, there may be hardware defects and software defects by cause. In the case where a hardware defect is caused, a malfunction ONT may occur due to a defect in an optical transceiver, an ONT board, a MAC chip, a memory, a CPU, or an interface. These hardware faults can result from production line, design, external impact and environmental factors. If a software defect is the cause, a malfunctioning ONT may occur due to a defect in the MAC software, a malfunction in the operation and management software. Such software defects may be caused by software bugs or hacking.

Secondly, there may be a compound malfunction including two or more malfunctions such as a time malfunction, a wavelength malfunction, a power malfunction, and the malfunction. The time error operation may include drift phenomenon moving within the allowable guard band and overlapping phenomenon which may go beyond the allowable guard band and penetrate to another ONT transmission region. The wavelength malfunction is a phenomenon that occurs when the wavelength conversion is not performed correctly, and there may be a tuning error of the ONT optical transceiver. The power malfunction may occur when there is an error in the power leveling mechanism between the OLT and the ONT when the intensity of the ONT signal is smaller or larger than the power intensity allowed by the OLT.

Third, there may be cases in which damage to all ONT data, damage to some ONT data, and damage to other ONT data may be caused by the damage classification. If all the ONT data are damaged, it may occur when there is an error in the burst mode operation when the optical transmitter of the ONT is always turned on and operating. If the ONT data is damaged, it may be the case that only the malfunctioning ONTs and adjacent ONTs are damaged. In the case where the ONT data is not damaged, it is a case of moving within the guard band allowed by the OLT. In such a case as well, the OLT generates a continuous alarm signal and re- This can be difficult.

As described above, malfunction ONTs can appear in various forms and in various forms. Therefore, it is necessary to develop an apparatus and a method for detecting whether or not a malfunction ONT is caused by various causes and quickly detecting a malfunction ONT.

For example, in the prior art, a round robin method or a binary search method can be used. First, in the sequential search method in the prior art, in the PON structure in which 64 ONTs are present on one PON link, a malfunction ONT test can be sequentially performed from ONT 1 to 64 ONT sequentially. In the conventional binary search method, groups 1 to 32 are checked, and if there is a malfunctioning ONT in the group, the ONTs after the number 33 may not be tested. Thereafter, the binary search method can perform a malfunction ONT test for groups 1 to 16 again. If the OLT detects a malfunction ONT, the OLT in the related art can transmit a message instructing the malfunction ONT to stop the optical output and to make a transition to the standby state. However, in the case of the sequential search method or the binary search method, it may be difficult to cope with normal service of the ONTs without interruption.

That is, the malfunction ONT inspection method in the prior art may suffer a penalty (damage) in bandwidth allocation of a normally operating ONT. Therefore, there is a need for an apparatus and method that can minimize a penalty for a normally operating ONT and detect a malfunctioning ONT more quickly.

SUMMARY OF THE INVENTION The present invention has been conceived to solve the above-mentioned problems, and it is an object of the present invention to provide a method and apparatus for controlling a normal malfunction ONT using a first means for a single malfunction ONT and a second means for a multiple malfunction ONT, And to detect the malfunctioning ONT identification number while minimizing the damage to the ONT and the network service interruption time.

In addition, the present invention has another purpose of enabling quick and effective detection of the identification number of a malfunctioning ONT by first checking an ONT having a high probability of occurrence in real time by assigning a check order to each ONT based on the profile of the ONT have.

A malfunctioning ONT detecting apparatus based on a profile for achieving the above object includes a measuring unit for measuring a power value in an OLT (Optical Line Terminal) for distributing optical data to a plurality of ONTs (Optical Network Terminals) When the power value is included in a level related to the occurrence of at least one malfunctioning ONT, checking each of the plurality of ONTs according to the inspection order, and judging whether the malfunctioning ONT And a detection unit for detecting the identification number of the mobile terminal.

As a technical solution to achieve the above object, a profile-based malfunctioning ONT detecting method includes a step of measuring a power value in an OLT (Optical Line Terminal) for distributing optical data to a plurality of ONTs (Optical Network Terminals) Determining whether or not a malfunction ONT occurs according to a level at which the power value is included; and, when the power value is included in a level related to occurrence of at least one malfunctioning ONT, checking each of the plurality of ONTs according to the inspection order And detecting the identification number of the malfunctioning ONT.

According to an embodiment of the present invention, a first means for a single malfunction ONT and a second means for a multiple malfunction ONT based on the power level at which the measured power value is included, And the malfunctioning ONT identification number can be detected while minimizing the network service interruption time.

According to an embodiment of the present invention, an ONT having a high probability of occurrence in real time can be checked first and then an identification number of a malfunctioning ONT can be detected quickly and effectively by giving an inspection order to each ONT based on the profile of the ONT have.

FIG. 1 is a diagram for explaining a process for a malfunctioning ONT according to an embodiment of the present invention.
FIG. 2 is a block diagram showing a profile-based malfunctioning ONT detecting apparatus according to an embodiment of the present invention.
3 is a view for explaining a process of determining whether a malfunction ONT occurs according to an embodiment of the present invention.
4 is a view for explaining a profile according to an embodiment of the present invention.
5 is a diagram for explaining a malfunction ONT detection process in a single malfunction ONT situation according to an embodiment of the present invention.
FIG. 6 is a view for explaining a malfunction ONT detection process in a multi-malfunction ONT situation according to an embodiment of the present invention.
FIG. 7 is a workflow diagram specifically illustrating a malfunctioning ONT detection method according to an embodiment of the present invention.

Hereinafter, embodiments according to the present invention will be described in detail with reference to the accompanying drawings. However, the present invention is not limited to or limited by the embodiments. Like reference symbols in the drawings denote like elements.

The profile-based malfunctioning ONT detecting apparatus and malfunctioning ONT detecting method described herein can determine whether a malfunctioning ONT has occurred according to the power level, give a checking order for checking malfunctioning ONTs based on the profile, It is possible to detect the identification number of the malfunction ONT by using different checking methods for the multiple ONTs.

The 'malfunction ONT' that is continuously used in this specification may refer to an ONT which is behaving abnormally on uplink data transmission in uplink data or downlink data transmission / reception mechanism of the PON structure.

FIG. 1 is a diagram for explaining a process for a malfunctioning ONT according to an embodiment of the present invention.

The profile-based malfunctioning ONT detection apparatus of the present invention can be included in the network management system 100. That is, the profile-based malfunctioning ONT detecting apparatus can be implemented as an individual device in the network management system 100 or an apparatus included in the OLT, and can detect a malfunction ONT in a malfunction ONT process as shown in FIG. Before describing the malfunction ONT detection apparatus, a process of processing a malfunction ONT in the network management system 100 will be described.

First, the network management system 100 may monitor the network status (110). In step 110, various information related to data transmission and reception can be acquired through real-time monitoring. For example, the OLT in the network management system 100 can check the network status by monitoring bit interleaved parity (BIP), bit error rate (BER), or various alarm information for upstream data in real time.

Next, the network management system 100 can determine a physical failure of the optical infrastructure (120). If an abnormal symptom is detected in the network state, the network management system 100 may use an OTDR (Optical Time Domain Reflectometer) or the like to determine whether an abnormality has occurred due to a fault in the physical network or an abnormality due to an upper data transmission layer The fault diagnosis of the optical line infrastructure can be performed through the optical line fault diagnosis meter. When it is determined that the physical obstacle (optical fiber cutting, optical fiber bending, optical fiber deterioration, etc.) is caused, the network management system 100 may alarm the field engineer to send the field engineer to perform the procedure for solving the fault situation.

If the failure is not a physical network, the network management system 100 may perform a determination operation (130) as to whether a malfunction ONT exists in the network. The network management system 100 in the prior art uses a method of setting a virtual ONT and monitoring a bandwidth allocated after assigning a bandwidth to a virtual ONT in order to determine whether a malfunction ONT exists in the network. However, the network management system 100 in the present invention can determine whether there is a malfunctioning ONT by using the malfunctioning ONT detecting apparatus 200 described in FIG. A more detailed description of the malfunctioning ONT detecting apparatus 200 will be described with reference to FIG.

When there is a malfunction ONT, the network management system 100 can use the following method in which the malfunction ONT is found and processed. First, the network management system 100 can use the manner in which the ONT is the subject. For example, the network management system 100 may monitor the optical output by the ONT itself and may block the output of the optical transmitter itself when an error occurs (140). Secondly, the network management system 100 can use the manner in which the OLT becomes the subject. If the malfunctioning ONT can not block the optical output by itself, the OLT in the network management system 100 can detect the malfunctioning ONT and issue an instruction to stop the optical output (150). The network management system 100 in the present invention can detect a malfunctioning ONT by using the malfunctioning ONT detecting apparatus 200 described in FIG. A more detailed description of the malfunctioning ONT detecting apparatus 200 will be described with reference to FIG.

If the malfunction ONT is in an out-of-control state not following the command of the OLT, the network management system 100 may alarm 160 to remove the malfunction ONT manually by dispatching a field engineer (field engineer) .

FIG. 2 is a block diagram showing a profile-based malfunctioning ONT detecting apparatus according to an embodiment of the present invention.

The malfunctioning ONT detecting apparatus 200 according to the present invention may include a measuring unit 210, a determining unit 220, and a detecting unit 230.

The measurement unit 210 measures power values in an OLT (Optical Line Terminal) that distributes optical data to a plurality of ONTs (Optical Network Terminals). Here, the power value may be a value indicating the degree of the intensity of the signal input to the ONT through the OLT is small or large. That is, the measuring unit 210 can measure the power value related to the signal intensity that is input to the ONT through the OLT.

The determination unit 220 determines whether or not a malfunction ONT occurs according to the level at which the power value is included. That is, the determination unit 220 can determine which level the power value is included in, and can determine that at least one malfunction ONT has occurred with respect to the power value included in the level indicating that the malfunction ONT has occurred. Also, the determination unit 220 can determine that a malfunction ONT has not occurred with respect to the power value included in the level indicating that the malfunction ONT has not occurred. That is, the determination unit 220 can determine that all the ONTs are operating normally. At this time, the level can be set by a user (a person skilled in the art).

In addition, the level is distinguished by a first threshold value and a second threshold value that are set based on the number of malfunction ONTs generated, and the determination unit 220 determines that the power value is lower than the first threshold value and the second threshold value Values, the generated malfunction ONT can be determined as one. That is, if the power value is included in the level indicating that the malfunctioning ONT is unified, the determination unit 220 can determine that one malfunctioning ONT has occurred. At this time, the levels according to the first threshold value and the second threshold value may be set by a user (a person skilled in the art).

In addition, when the power value is included in the level divided by the second threshold value or more, the determination unit 220 can determine a number of the malfunction ONTs generated. That is, the determination unit 220 can determine that two or more malfunction ONTs have occurred with respect to power values having a value equal to or larger than the second threshold value.

A more detailed description of the process of determining a malfunction ONT will be described with reference to FIG.

3 is a view for explaining a process of determining whether a malfunction ONT occurs according to an embodiment of the present invention.

The determination unit 220 can determine which level among the levels 310, 320, and 330, in which the power value measured by the OLT is distinguished by the first threshold value and the second threshold value.

For example, when the measured power value is included in the level 310 that is equal to or lower than the first threshold value, the determination unit 220 can determine that all the ONTs do not have malfunctioning ONTs and perform normal operation.

If the measured power value is equal to or greater than the first threshold value, the determination unit 220 can determine that at least one malfunction ONT has occurred. The malfunctioning ONT detecting apparatus 200 can detect the malfunctioning ONT through the first means or the second means as it is determined that at least one malfunctioning ONT has occurred. At this time, the malfunctioning ONT detecting apparatus 200 can detect the malfunctioning ONT by selecting one of the first means and the second means according to the levels 320 and 330 including the power value.

If the measured power value is included in the level 320 between the first threshold value and the second threshold value, the determination unit 220 can determine that the single Rogue ONT (ONT) state is a single malfunctioning ONT . Then, the malfunctioning ONT detecting apparatus 200 can detect the malfunctioning ONT through the first means.

If the measured power value is included in the level 230 that is equal to or greater than the second threshold value, the determination unit 220 can determine that the multiple Roguer ONTs state has two or more malfunctioning ONTs. Then, the malfunctioning ONT detecting apparatus 200 can detect the malfunctioning ONT through the second means.

The malfunctioning ONT detecting apparatus 200 checks the ONT according to the inspection order (inspection order) given based on the profile 350 of the ONT when detecting one or a plurality of malfunctioning ONTs through the first means and the second means can do. A more detailed description of the first means and the second means is omitted in the following description of the detection unit 230, and is omitted here.

The first threshold value and the second threshold value may be variable values that can be set by the network administrator, and may be set based on experimental data values of installed ONTs.

1, when the power value is included in a level related to the occurrence of at least one malfunctioning ONT, the detecting unit 230 checks each of the plurality of ONTs according to the inspection order to determine an identification number of the malfunctioning ONT . That is, when one or more malfunctioning ONTs are generated, the detecting unit 230 can check all the ONTs and detect the identification number of the malfunctioning ONTs. At this time, the detection unit 230 can sequentially check the ONTs according to the inspection order (check procedure) assigned to the ONTs. For example, the detection unit 230 may first check the ONT whose inspection rank is the first.

Also, the detection unit 230 may assign the inspection order to each of the plurality of ONTs in accordance with the possibility of occurrence of the malfunction that is estimated in consideration of at least one information included in the profile. Here, the profile may indicate detailed information such as function, history, and specification for the ONT. The detecting unit 230 can estimate the possibility of a malfunction by considering the details of the ONT according to a condition capable of causing a malfunction to detect a malfunctioning ONT.

That is, the detecting unit 230 is highly likely to cause a malfunction to the ONT having the information that is likely to cause a malfunction according to the information included in the profile, and can rank the top positions. In the case of an ONT having information that it is presumed that the possibility of occurrence of a malfunction is low, the detection unit 230 can rank the bottom right.

The detecting unit 230 may detect at least one of the service life, the defect rate, the failure history, the number of re-ranging, the ranging time, the alarm, and the group information for the ONT, Can be obtained as a profile. That is, the detecting unit 230 can obtain a profile including at least one information for considering the possibility of a malfunction among the detailed information on the ONT. For a more detailed description of the profile, reference is made to FIG. 4 below.

4 is a view for explaining a profile according to an embodiment of the present invention.

The detection unit 230 can obtain a malfunction ONT detection profile for each ONT classified into ONT identification numbers.

The useful life period may represent the number of years (periods) in which ONT has been installed and used by the subscriber. Defect rate can indicate defective rate for optical transceiver, MAC chip, ONT system board, etc. by company and model. The fault history can indicate the fault history information of the ONT. The number of the re-ranging may be the number of resetting of the ranging according to the alarm information of the ONT and external environment factors. Here, the number of times of resetting the ranging may be the number of times the EqD is updated through a new ranging process in which the delay information (Equalization Delay, hereinafter referred to as EqD) distance information measured at the initial ranging is changed little by little.

The ranging time may mean the time taken to complete the ranging once. At this time, the ranging time may be one in which the average value is stored by checking the time each time the ranging is performed. The alarm (Alarm) may indicate the alarm information for the ONT up signal. Malfunctions The ONT-related alarms can be DoW (Drift of Window), Drift of Burst (DoB), Loss of Signal (LoS), and Loss of Frame (LoF) have.

The group information may be information obtained by grouping neighboring ONTs in the uplink band allocation by the OLT. For example, when the upstream band is sequentially allocated for each ONT number, the upstream band may be grouped based on the ONT identification number. The group information may be useful information when a malfunctioning ONT affects some ONTs.

A malfunction ONT check order (check order) may be a rank assigned to an ONT having the highest possibility of malfunction through analysis of the obtained profile. That is, the detection unit 230 can assign an ONT rank with a high probability of malfunction based on the profile information. For example, the detection unit 230 may rank the profile information by using some or all of the obtained profile information. In addition, the detection unit 230 may assign a specific weight to each piece of information and assign a ranking based on the calculated value, in order to assign a ranking. Although the present invention has been described by way of example with reference to a method of assigning weights by setting weights, the present invention is not limited thereto. That is, the detection unit 230 can assign a ranking by applying various methods for ranking. However, the detailed description of the calculation process will be omitted in this specification, and the detection unit 230 may include all the methods for giving a malfunction ONT check rank in consideration of the profile information.

The detection unit 230 is managed by real-time updating based on a real-time monitoring value based on a malfunction ONT inspection rank. Therefore, when a network malfunction due to a malfunctioning ONT is detected, a malfunction ONT checking process is performed in accordance with the checking sequence.

Referring again to FIG. 1, if the number of the malfunction ONTs is one, the detecting unit 230 determines ONTs of the inspection order among the plurality of ONTs as the ONTs to be checked, Allocates a band to the surrounding ONT, and monitors a signal generation relationship between the ONT and the neighboring ONT. That is, when the number of malfunctioning ONTs is one, the malfunctioning ONT can be detected according to whether or not a signal is generated in the ONT to be inspected by the surrounding ONTs in a state in which the band of the ONT to be inspected is not allocated have. In other words, when the number of malfunctioning ONTs is one, the detecting unit 230 determines that the malfunctioning ONT is in a single malfunctioning ONT state and can detect malfunctioning ONTs through the first means in FIG.

For example, the detection unit 230 can allocate the band to the surrounding ONTs without allocating the band to the first ONT to be checked. Also, as the inspection order arrives, the detecting unit 230 may not allocate the bandwidth to the n-th check target ONT when the surrounding ONT becomes the n-th check target ONT (n is a natural number). The detection unit 230 can monitor the signal generation relationship between the ONT that becomes the ONT to be inspected and the surrounding ONTs sequentially according to the inspection order.

At this time, if the signal is not generated in the ONT to be checked that the band is not allocated as a result of the monitoring, the detector 230 checks the ONT to be checked with the malfunction ONT and detects the identification number of the ONT to be checked . For example, the detection unit 230 can monitor the signal generation relationship when the peripheral ONT becomes the n-th check target ONT (n is a natural number) unless a signal is generated in the first ONT to which the band is not allocated . That is, when the peripheral ONT becomes the second, third,... Nth check target ONT as the inspection order arrives, the detecting unit 230 detects the ONTs (second, third, A signal is generated by the first ONT to be checked, so that the first ONT to be checked can be confirmed as a malfunction ONT.

A process of detecting a malfunction ONT in a single malfunction ONT situation will be described in more detail with reference to FIG.

5 is a diagram for explaining a malfunction ONT detection process in a single malfunction ONT situation according to an embodiment of the present invention.

As shown in FIG. 5, the uplink data signal of a type in which a band is normally allocated and operated is shown by a solid line, and a malfunctioning ONT is represented by a dotted line. 5, a description will be made of a malfunction ONT detection process through an example in which the ONT No. 2 interrupts the data transmission of the ONTs No. 1 and No. 3 to No. 6 in FIG.

If it is determined that there is only one malfunction ONT, the detection section 230 can detect the malfunction ONT by using the above-described first means in FIG. That is, the detector 230 can monitor the ONT to be inspected after allocating a normal band to all other ONTs without allocating a band to the ONT to be inspected in order to detect a malfunction ONT. At this time, the detection unit 230 can sequentially determine the ONT as the ONT to be checked according to the inspection order given by the profile.

For example, if the ONT 3 is the first to check the profile, the detector 230 can allocate the band to the ONTs 1, 2, 4 to 6 without assigning the band to the ONT 3 have. The detection unit 230 can monitor the ONT band period 3. In this case, since the ONT of the malfunction ONT is ONT 2 times, the ONT of the third ONT may generate a signal at the 3rd band spot although the band is not allocated. That is, as the signal is generated at the third band point, the detecting unit 230 can confirm that the third ONT is not a malfunctioning ONT.

Next, when the profile check order of the second ONT is second, the detection unit 230 can allocate the band to the ONTs # 1 and # 3 to # 6 without allocating the band to the ONT # 2. Then, the detector 230 can monitor the ONT band # 2. Then, since the second ONT has not been allocated a band, a signal may not be generated in the second ONT band. That is, if the 2 ONTs that have influenced the ONTs 1 through 6 due to the malfunction are not allocated to the ONT band, the signal is not generated in the ONT band 2, so that the detector 230 can confirm that the ONT 2 is malfunctioning ONT have.

The detection unit 230 can sequentially check all the ONTs according to the check sequence given to the ONTs # 1 to # 6. Further, since the detection unit 230 has one malfunctioning ONT, it is possible to detect one malfunctioning ONT through the signal generation relationship between the ONT to be inspected and the surrounding ONT under the premise that the malfunctioning ONT is one.

However, the detection unit 230 can not be detected using the first means in the multiple malfunction ONT situations.

For example, when the ONTs # 2 and # 4 are malfunctioning, the ONT # 2 is interfering with the ONTs # 1 to # 6, and the # 4 ONT is interfering with the operation # 3 to # 6 If the first means is used, the following problems may occur.

First, the detection unit 230 may not allocate bandwidth to the ONT # 4 if the first of the profile-based malfunction ONT check procedures is ONT # 4. Then, the detector 230 can monitor the 4th band interval. However, although the ONT # 4 is malfunctioning ONT, an optical signal due to the ONT # 2 may be generated. Therefore, the detection unit 230 can confirm the normal ONT even though the fourth ONT is a malfunction ONT.

The first means is advantageous in that the penalty for bandwidth allocation can be minimized by allowing the normal ONTs to be allocated a continuous bandwidth even during a malfunction ONT check process. However, the first means has a disadvantage in that an error can be generated in a plurality of malfunction ONT situations.

Therefore, the detection unit 230 can detect a plurality of malfunction ONTs using the second means described below.

Referring again to FIG. 1, the detection unit 230 determines ONTs that have arrived at the inspection order among the plurality of ONTs as the ONTs to be checked, if the number of the malfunction ONTs is large, And can monitor the signal generation relationship between the ONT to be checked and the neighboring ONT located adjacent to the ONT to be checked. That is, the detection unit 230 can monitor whether the signal generation period in the ONT to be inspected is normal by allocating only the ONT to be inspected and allocating a band in the surrounding ONT. At this time, when the number of the malfunctioning ONTs is two or more, the detecting unit 230 can determine that the malfunctioning ONT is in the majority malfunctioning ONT state and detect the malfunctioning ONT through the second means in FIG.

For example, the detection unit 230 may allocate a band to the first ONT to be checked and not allocate a band to the surrounding ONT. Also, as the inspection order arrives, the detecting unit 230 can allocate a band to the n-th check target ONT when the surrounding ONT becomes the n-th check target ONT (n is a natural number). The detection unit 230 can monitor the signal generation relationship between the ONT that becomes the ONT to be inspected and the surrounding ONTs sequentially according to the inspection order.

If it is determined that the signal is generated in the peripheral ONT to which the band is not allocated as a result of the monitoring, the detecting unit 230 may detect the identification number of the ONT to be checked by checking the ONT to be checked with the malfunction ONT . That is, the detection unit 230 can detect the identification number of the ONT to be inspected by confirming that a malfunction has occurred by the ONT to be inspected when a signal is generated in the surrounding ONT by allocating the band only to the ONT to be inspected.

For example, when a signal is generated in the first ONT to which the band is allocated and a signal is generated in the neighboring ONT to which the band is not allocated, the detection unit 230 can identify the first ONT as a malfunction ONT. In addition, the detection unit 230 can monitor the signal generation relationship when one of the peripheral ONTs becomes the second ONT. That is, when a signal is generated in the peripheral ONTs when the peripheral ONTs become the second, third,... Nth check target ONTs as the inspection order arrives, the detection unit 230 outputs the second, n Since the signal is generated by the ONT to be checked, the second, third,... nth check target ONT can be confirmed as a malfunction ONT. If a signal is not generated in the peripheral ONT when the peripheral ONT becomes the second, third,... Nth check target ONT as the checking order arrives, the detecting unit 230 outputs the second, The nth check target ONT can be confirmed by the ONT that performs the normal operation.

A detailed description of a process of detecting a malfunction ONT in a multi-malfunction ONT situation will be described with reference to FIG.

FIG. 6 is a view for explaining a malfunction ONT detection process in a multi-malfunction ONT situation according to an embodiment of the present invention.

As shown in FIG. 6, an uplink data signal of a type in which a band is normally allocated and operated is indicated by a solid line, and an operation mode of a malfunction ONT is represented by a dotted line. The malfunction ONT detection process will be described with reference to an example in which the second and fourth ONTs generate malfunctions in FIG. 6 to interrupt data transmission in the first, third, fifth, and sixth ONTs.

When it is determined that there are a plurality of malfunction ONTs, the detecting section 230 can detect malfunction ONTs using the second means in FIG. That is, the detector 230 can monitor the allocated band and the surrounding band of the ONT to be inspected after allocating the band to only the ONT to be inspected and not allocating the band to all the other ONTs in order to detect the malfunction ONT. At this time, the detecting unit 230 can sequentially determine the ONT as the ONT to be checked according to the inspection sequence given by the profile.

For example, if the ONT of the 4th ONT is the first, the detector 230 may allocate the bandwidth to only the 4 ONTs and not allocate the bandwidth to all other ONTs. The detection unit 230 can monitor the ONT band period 4 and the peripheral band. In this case, an optical signal may be generated up to the ONTs of ONTs 3 to 6 ONTs due to the 4 ONTs and malfunction phenomenon, even though the 4 ONTs are allocated only to the band. Therefore, since the signal is generated in the peripheral ONTs (4th, 5th, and 6th ONTs) to which no band is assigned, the detection unit 230 checks the 4th ONT as a malfunction ONT and detects the identification number '4' .

Thereafter, the detection unit 230 may repeat the second means until the malfunction ONT phenomenon disappears according to the check procedure. The second means is advantageous in that the malfunctioning ONTs can be accurately detected in the situation of a plurality of malfunctioning ONTs.

The malfunctioning ONT detecting apparatus 200 of the present invention can determine whether a malfunction ONT occurs according to the level at which the power value measured in the OLT is included.

The malfunctioning ONT detecting apparatus 200 of the present invention performs a normal operation using the first means for a single malfunction ONT and the second means for a multiple malfunction ONT based on the power level including the measured power value The ONT identification number can be detected while minimizing damage to the ONT and network service interruption time.

In addition, the malfunctioning ONT detecting apparatus 200 of the present invention checks the ONT having a high probability of occurrence in real time first and thereby quickly and effectively detects the identification number of the malfunctioning ONT by assigning a check order to each ONT based on the profile of the ONT can do.

FIG. 7 is a workflow diagram specifically illustrating a malfunctioning ONT detection method according to an embodiment of the present invention.

First, the malfunctioning ONT detecting method according to the present embodiment can be performed by the malfunctioning ONT detecting apparatus 200 described above.

First, the malfunction ONT detecting apparatus 200 measures a power value in an OLT (Optical Line Terminal) that distributes optical data to a plurality of ONTs (710). Here, the power value may be a value indicating the degree of the intensity of the signal input to the ONT through the OLT is small or large. That is, the step 710 may be a process of measuring a power value with respect to a signal intensity that is input to the ONT through the OLT.

Next, the malfunctioning ONT detecting apparatus 200 determines whether a malfunction ONT has occurred (720) according to the level at which the power value is included. That is, the step 720 can determine which level the power value is included in, and may be a process of determining that at least one malfunction ONT occurs with respect to the power value included in the level indicating that the malfunction ONT occurs. Step 720 may be a process of determining that a malfunction ONT has not occurred with respect to a power value included in a level indicating that a malfunction ONT has not occurred. That is, the malfunctioning ONT detecting apparatus 200 can determine that all the ONTs are operating normally. At this time, the level can be set by a user (a person skilled in the art).

The level is distinguished by a first threshold value and a second threshold value that are set based on the number of malfunction ONTs generated and step 720 is a step in which the power value is divided into a first threshold value and a second threshold value , It may be determined that the malfunctioning ONT is one. That is, the malfunctioning ONT detecting apparatus 200 can determine that one malfunctioning ONT occurs when the power value is included in the level indicating that the malfunctioning ONT is unified. At this time, the levels according to the first threshold value and the second threshold value may be set by a user (a person skilled in the art).

In addition, the step 720 may be a process of determining a number of the malfunction ONTs generated when the power value is included in the level separated by the second threshold value or more. That is, the malfunctioning ONT detecting apparatus 200 can determine that two or more malfunctioning ONTs have occurred with respect to the power value having a value equal to or larger than the second threshold value.

If the power value is included in the level related to the occurrence of at least one malfunctioning ONT, the malfunctioning ONT detecting apparatus 200 checks each of the plurality of ONTs according to the inspection order to detect the identification number of the malfunctioning ONT (730). That is, if at least one malfunctioning ONT occurs, step 730 may be a process of detecting all the ONTs and detecting the identification number of the malfunctioning ONTs. At this time, the malfunctioning ONT detecting apparatus 200 can sequentially check the ONTs according to the inspection order (inspection order) assigned to the ONTs. For example, the malfunctioning ONT detecting apparatus 200 can first check the ONT whose inspection rank is the first.

According to the embodiment, the malfunctioning ONT detecting apparatus 200 can give the inspection order to each of the plurality of ONTs in accordance with the possibility of occurrence of the malfunction estimated by considering at least one information included in the profile. Here, the profile may indicate detailed information such as function, history, and specification for the ONT. The malfunctioning ONT detecting apparatus 200 can estimate the possibility of malfunction by considering the detailed information of the ONT according to a condition that can cause a malfunction to detect the malfunctioning ONT.

In other words, the malfunctioning ONT detecting apparatus 200 is highly likely to malfunction with respect to the ONT having the information of the malfunction-prone condition, according to the information included in the profile. In the case of an ONT having information that it is presumed that the possibility of occurrence of a malfunction is low, the detection unit 230 can rank the bottom right.

According to the embodiment, the malfunctioning ONT detecting apparatus 200 detects at least one of the service life, the defect rate, the failure history, the number of re-ranging, the ranging time, the alarm, One piece of information can be obtained as the profile. That is, the malfunctioning ONT detecting apparatus 200 can obtain a profile including at least one information for considering the possibility of malfunction among the detailed information on the ONT.

The useful life period may represent the number of years (periods) in which ONT has been installed and used by the subscriber. Defect rate can indicate defective rate for optical transceiver, MAC chip, ONT system board, etc. by company and model. The fault history can indicate the fault history information of the ONT. The number of the re-ranging may be the number of resetting of the ranging according to the alarm information of the ONT and external environment factors. Here, the number of times of resetting the ranging may be the number of times the EqD is updated through a new ranging process in which the delay information (Equalization Delay, hereinafter referred to as EqD) distance information measured at the initial ranging is changed little by little.

The ranging time may mean the time taken to complete the ranging once. At this time, the ranging time may be one in which the average value is stored by checking the time each time the ranging is performed. The alarm (Alarm) may indicate the alarm information for the ONT up signal. Malfunctions The ONT-related alarms can be DoW (Drift of Window), Drift of Burst (DoB), Loss of Signal (LoS), and Loss of Frame (LoF) have.

The group information may be information obtained by grouping neighboring ONTs in the uplink band allocation by the OLT. For example, when the upstream band is sequentially allocated for each ONT number, the upstream band may be grouped based on the ONT identification number. The group information may be useful information when a malfunctioning ONT affects some ONTs.

According to the embodiment, the malfunctioning ONT detecting apparatus 200 determines ONTs of the inspection order among the plurality of ONTs as the ONTs to be checked, if the number of malfunction ONTs is one, And a signal generation relation between the check ONT and the neighbor ONT can be monitored. That is, when the number of malfunction ONTs is one, the malfunctioning ONT detecting apparatus 200 determines whether a malfunctioning ONT is detected in accordance with whether or not a signal is generated in the ONT to be inspected by the surrounding ONT, Can be detected. For example, the malfunctioning ONT detecting apparatus 200 can allocate the bandwidth to the peripheral ONTs without allocating the bandwidth to the first ONT to be checked. Also, the malfunctioning ONT detecting apparatus 200 may not allocate the bandwidth to the n-th check target ONT when the surrounding ONT becomes the n-th check target ONT (n is a natural number) as the inspection order arrives. The malfunctioning ONT detecting apparatus 200 can monitor the signal generating relationship between the ONT and the peripheral ONT that becomes the ONT to be inspected sequentially according to the inspection order.

At this time, if it is determined in step 730 that no signal is generated in the ONT to be checked that the band is not allocated as a result of the monitoring, the identification number of the ONT to be checked is detected by checking the ONT to be checked with the malfunction ONT Process. For example, the malfunction ONT detecting apparatus 200 monitors (monitors) the signal generation relationship when the peripheral ONT becomes the n-th check target ONT (n is a natural number) if no signal is generated in the first check target ONT to which the band is not allocated can do. That is, when the malfunction ONT detecting apparatus 200 comes to a check order, when the peripheral ONT becomes the second, third, ... nth check target ONT, the peripheral ONT (second, third, When the signal is generated in the target ONT, this is because the signal is generated by the first ONT to be checked, so that the first ONT to be checked can be confirmed as a malfunction ONT.

According to the embodiment, the malfunctioning ONT detecting apparatus 200 determines ONTs whose inspection order comes out of the plurality of ONTs as the ONTs to be checked, if the number of malfunction ONTs is large, And monitors the signal generation relationship between the ONT to be checked and the neighboring ONTs positioned adjacent to the ONT to be checked. That is, the malfunctioning ONT detecting apparatus 200 can monitor whether or not the signal generating section in the ONT to be inspected is normal by allocating only the ONT to be inspected and not allocating the band in the surrounding ONT.

For example, the malfunctioning ONT detecting apparatus 200 may allocate a band to the first ONT to be checked and not allocate a band to the surrounding ONT. Also, the malfunctioning ONT detecting apparatus 200 can allocate the band to the n-th inspection target ONT when the surrounding ONT becomes the n-th inspection subject ONT (n is a natural number) as the inspection order arrives. The malfunctioning ONT detecting apparatus 200 can monitor the signal generating relationship between the ONT which becomes the ONT to be inspected sequentially and the peripheral ONTs sequentially according to the inspection order.

At this time, if it is determined that the signal is generated in the neighboring ONT to which the band is not allocated as a result of the monitoring, step 730 is a process of detecting the identification number of the ONT to be checked by checking the ONT to be checked with the malfunctioning ONT . That is, the malfunctioning ONT detecting apparatus 200 can detect the identification number of the ONT to be inspected by confirming that a malfunction has occurred by the ONT to be inspected when a signal is generated in the surrounding ONT, by allocating the band only to the ONT to be inspected.

For example, when a malfunction ONT detecting apparatus 200 generates a signal in a first ONT to which a band is assigned and a signal is generated in a surrounding ONT to which a band is not allocated, the first ONT to be checked is determined to be a malfunction ONT . Further, the malfunctioning ONT detecting apparatus 200 can monitor the signal generating relationship when one of the peripheral ONTs becomes the second checking target ONT. That is, when the malfunction ONT detecting apparatus 200 generates a signal at the peripheral ONT when the peripheral ONT becomes the second, third,... . Since the signal is generated by the n-th check target ONT, the second, third, ... n-th check target ONT can be confirmed as a malfunction ONT. If a signal is not generated in the peripheral ONT when the peripheral ONT becomes the second, third,... Nth check target ONT as the checking order arrives, the malfunctioning ONT detecting apparatus 200 detects the second, ... The nth check target ONT can be confirmed by the ONT that performs the normal operation.

According to the malfunctioning ONT detection method of the present invention, it is possible to determine whether a malfunction ONT occurs according to a level at which the power value measured in the OLT is included.

Also, the malfunctioning ONT detection method of the present invention is a method for detecting a malfunctioning ONT using a first means for a single malfunction ONT and a second means for a multiple malfunction ONT based on a power level including a measured power value, It is possible to detect the malfunctioning ONT identification number while minimizing the damage and network service interruption time.

In addition, the malfunctioning ONT detection method of the present invention can quickly and effectively detect the identification number of a malfunctioning ONT by first checking the ONTs having a high probability of occurrence in real time by assigning inspection order to each ONT based on the profile of the ONT .

The method according to an embodiment of the present invention may be implemented in the form of a program command that can be executed through various computer means and recorded in a computer-readable medium. The computer-readable medium may include program instructions, data files, data structures, and the like, alone or in combination. The program instructions to be recorded on the medium may be those specially designed and configured for the embodiments or may be available to those skilled in the art of computer software. Examples of computer-readable media include magnetic media such as hard disks, floppy disks and magnetic tape; optical media such as CD-ROMs and DVDs; magnetic media such as floppy disks; Magneto-optical media, and hardware devices specifically configured to store and execute program instructions such as ROM, RAM, flash memory, and the like. Examples of program instructions include machine language code such as those produced by a compiler, as well as high-level language code that can be executed by a computer using an interpreter or the like. The hardware devices described above may be configured to operate as one or more software modules to perform the operations of the embodiments, and vice versa.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments. For example, it is to be understood that the techniques described may be performed in a different order than the described methods, and / or that components of the described systems, structures, devices, circuits, Lt; / RTI > or equivalents, even if it is replaced or replaced.

Therefore, other implementations, other embodiments, and equivalents to the claims are also within the scope of the following claims.

200: Profile-based malfunction ONT detection device
210:
220:
230:

Claims (18)

A measuring unit for measuring a power value in an optical line terminal (OLT) for distributing optical data to a plurality of ONTs;
A determination unit for determining whether a malfunction ONT occurs according to a level at which the power value is included; And
When the power value is included in a level related to the occurrence of at least one malfunction ONT, a detection unit for detecting the identification number of the malfunction ONT by checking each of the plurality of ONTs according to the inspection order,
Based ONT detection device. The method according to claim 1,
A processing unit for assigning the inspection order to each of the plurality of ONTs in accordance with the possibility of a malfunction occurring, which is estimated in consideration of at least one information included in the profile
Based ONT detection device. The method according to claim 1,
A process for acquiring information on at least one of a content year, a defect rate, a failure history, a number of re-ranging, a ranging time, an alarm, and a group information for the ONT,
Based ONT detection device. The method according to claim 1,
The level is distinguished by a first threshold value and a second threshold value which are set based on the number of malfunction ONTs generated,
Wherein,
When the power value is included in a level separated between the first threshold value and the second threshold value, the malfunctioning ONT is determined to be one
Profile based malfunction ONT detection device. 5. The method of claim 4,
Wherein,
When the power value is included in the level separated by the second threshold value or more, the number of the malfunctioning ONTs generated is determined to be a plurality
Profile based malfunction ONT detection device. The method according to claim 1,
If the number of malfunction ONTs is one,
Wherein:
Wherein the control unit determines an ONT whose inspection order arrives from among the plurality of ONTs as an ONT to be checked and allocates a band to a peripheral ONT positioned adjacent to the ONT to be checked, Monitoring
Profile based malfunction ONT detection device. The method according to claim 6,
If it is determined that no signal is generated in the ONT to be checked,
Wherein:
The ONT to be inspected is checked by the malfunction ONT and the identification number of the ONT to be inspected is detected
Profile based malfunction ONT detection device. The method according to claim 1,
If the number of malfunction ONTs is large,
Wherein:
Wherein the control unit determines an ONT whose inspection order arrives from among the plurality of ONTs as an ONT to be inspected, allocates a band to the ONT to be inspected, and generates a signal between the ONT to be inspected and a peripheral ONT Monitoring the occurrence relationship
Profile based malfunction ONT detection device. 9. The method of claim 8,
As a result of the monitoring, when a signal is generated in the neighboring ONT to which the band is not allocated,
Wherein:
The ONT to be inspected is checked by the malfunction ONT and the identification number of the ONT to be inspected is detected
Profile based malfunction ONT detection device. Measuring power values in an optical line terminal (OLT) for distributing optical data to a plurality of ONTs;
Determining whether a malfunction ONT occurs according to a level at which the power value is included; And
Detecting the identification number of the malfunctioning ONT by checking each of the plurality of ONTs according to the inspection order when the power value is included in a level related to occurrence of at least one malfunction ONT
Based ONT detection method. 11. The method of claim 10,
A step of assigning the inspection order to each of the plurality of ONTs in accordance with the possibility of occurrence of an estimated malfunction considering at least one information included in the profile
Further comprising the steps of: 11. The method of claim 10,
Acquiring information on at least one of a service life, a defect rate, a failure history, a number of re-ranging, a ranging time, an alarm, and a group information for the ONT as the profile
Further comprising the steps of: 11. The method of claim 10,
The level is distinguished by a first threshold value and a second threshold value which are set based on the number of malfunction ONTs generated,
Wherein the step of determining whether or not the malfunctioning ONT occurs comprises:
Determining that the malfunctioning ONT is one when the power value is included in a level separated between the first threshold value and the second threshold value
Based ONT detection method. 14. The method of claim 13,
Wherein the step of determining whether or not the malfunctioning ONT occurs comprises:
Determining a number of the malfunctioning ONTs generated when the power value is included in the level separated by the second threshold value or more;
Based ONT detection method. 11. The method of claim 10,
If the number of malfunction ONTs is one,
Determining, as an ONT to be inspected, an ONT from the plurality of ONTs having the inspection order;
Allocating a bandwidth to a neighboring ONT located adjacent to the ONT to be checked; And
Monitoring a signal generation relationship between the check ONT and the peripheral ONT
Further comprising the steps of: 16. The method of claim 15,
If it is determined that no signal is generated in the ONT to be checked,
The step of detecting the identification number of the malfunctioning ONT includes:
Detecting the ONT to be checked with the malfunction ONT and detecting the identification number of the ONT to be checked
Based ONT detection method. 11. The method of claim 10,
If the number of malfunction ONTs is large,
Determining, as an ONT to be inspected, an ONT from the plurality of ONTs having the inspection order;
Allocating a bandwidth to the ONT to be checked; And
Monitoring a signal generation relationship between the ONT to be inspected and a peripheral ONT located adjacent to the ONT to be checked
Further comprising the steps of: 18. The method of claim 17,
As a result of the monitoring, when a signal is generated in the neighboring ONT to which the band is not allocated,
The step of detecting the identification number of the malfunctioning ONT includes:
Detecting the ONT to be checked with the malfunction ONT and detecting the identification number of the ONT to be checked
Based ONT detection method.

Images