KR20150059058A - User device having host ftl and method for transfering page offset of open block thereof - Google Patents
User device having host ftl and method for transfering page offset of open block thereof Download PDFInfo
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- KR20150059058A KR20150059058A KR1020140026175A KR20140026175A KR20150059058A KR 20150059058 A KR20150059058 A KR 20150059058A KR 1020140026175 A KR1020140026175 A KR 1020140026175A KR 20140026175 A KR20140026175 A KR 20140026175A KR 20150059058 A KR20150059058 A KR 20150059058A
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- Prior art keywords
- host
- storage device
- read
- memory
- page offset
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/14—Handling requests for interconnection or transfer
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/38—Information transfer, e.g. on bus
Abstract
Description
The present invention relates to a user device, and more particularly to a user device having a host flash translation layer (FTL) and a method for transmitting a page offset of an open block thereof.
A storage system is composed of a host and a storage device and includes a universal flash storage (UFS), a serial ATA (SATA), a small computer small interface (SCSI), a serial attached SCSI (SAS) eMMC (embedded MMC), and the like.
The storage device is connected to the host through an interface. The storage device may include a non-volatile memory such as flash memory, MRAM, PRAM, FeRAM, and the like. A storage device based on a flash memory efficiently utilizes the characteristics of a flash memory using a flash translation layer (FTL).
Meanwhile, as the process of the storage device is gradually shrinked and the characteristics of the storage device become worse, various schemes are being developed to guarantee reliability for each storage device. In particular, a user device that manages the FTL in a host needs to provide the storage device with the necessary information to improve the performance of the storage device and ensure reliability.
SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned technical problems, and it is an object of the present invention to provide a user device for managing FTL in a host, in which, in order to improve the performance of a storage device and ensure reliability, The page offset of the page offset.
A user device according to an embodiment of the present invention includes a storage device based on flash memory; And a host connected to the storage device via an interface and transmitting data to the storage device, wherein the host provides page offset information of an open block of the flash memory to the storage device.
In an embodiment, the host provides the page offset information of the open block to the storage device if the specific condition is satisfied. The specific condition may be a case where the read target block is an open block, a first read after the user device is initialized, a case where the read target block is an open block, a memory block is changed in the same CAU, Is the open block and the page offset of the read target block is changed.
In another embodiment, the host provides the page offset command field format of the open block to the storage device prior to sending the read command field format. The page offset command field format of the open block includes a read command mark, a storage address format, and a read command and mark. The storage address format includes a read hint area and a page offset area. The page offset command field format and the read command field format are determined by the read hint area. The host includes a buffer RAM for driving the Host FTL.
Another aspect of the present invention relates to a method of transmitting a page offset of an open block of a user equipment. The user device includes a host connected to the storage device via a storage device based on a flash memory. A method of transmitting a page offset of an open block of a user equipment comprises the steps of: the host providing page offset information of an open block to the storage device when a specific condition is satisfied; And providing the read command to the storage device after providing the page offset information of the open block.
A user device according to an embodiment of the present invention transmits a page offset of an open block from a host to a storage device, thereby improving the performance of the storage device and ensuring reliability.
1 is a block diagram showing a user equipment.
2 is a block diagram illustrating a user device based on a flash memory.
3 is a block diagram illustrating an exemplary flash memory shown in FIG.
4 is a circuit diagram illustrating an exemplary memory block shown in FIG.
5 is a diagram showing a threshold voltage distribution of the memory cell shown in FIG.
FIG. 6 is a block diagram illustrating the command field format of the user equipment shown in FIG. 2. FIG.
FIG. 7 is a conceptual diagram for explaining an open block in the memory block of the flash memory shown in FIG. 3. FIG.
FIG. 8 is a block diagram showing a more detailed storage address format of the read command field format shown in FIG.
9 is a block diagram illustrating a page offset transmission method of an open block in a user equipment according to an embodiment of the present invention.
FIG. 10 is a conceptual diagram for explaining a specific embodiment of the page offset transmission method shown in FIG.
11 is a conceptual diagram showing an example in which a normal read operation is performed when the read hint area is set to 0;
12 is a block diagram exemplarily showing a three-dimensional flash memory used in the present invention.
13 is a perspective view exemplarily showing a three-dimensional structure of the memory block BLK1 shown in FIG.
14 is an equivalent circuit diagram of the memory block BLK1 shown in Fig.
FIG. 15 shows an example in which a storage device of a user apparatus according to an embodiment of the present invention is applied to a memory card.
16 is a block diagram showing an example of applying a storage device according to an embodiment of the present invention to a solid state drive (SSD).
17 is a block diagram illustrating an exemplary configuration of the
18 is a block diagram showing an example of implementing a storage device according to an embodiment of the present invention with an electronic device.
Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings, so that those skilled in the art can easily carry out the technical idea of the present invention. .
Ⅰ. User device with host FTL
1 is a block diagram showing a user equipment. Referring to FIG. 1, a
Referring to FIG. 1, the
The
The
The
The
2 is a block diagram illustrating a user device based on a flash memory. The
The
A command (for example, a write command) generated by the
2, the
Commands input from the
The
The
3 is a block diagram illustrating an exemplary flash memory shown in FIG. The
The
Each memory cell can store one bit of data or two or more bits of data. A memory cell capable of storing one bit of data in one memory cell is called a single level cell (SLC) or a single bit cell. A memory cell capable of storing two or more bits of data in one memory cell is called a multi-level cell (MLC) or a multi-bit cell.
The single-level cell SLC may have an erase state or a program state depending on the threshold voltage. The multi-level cell MLC may have either an erase state or a plurality of program states, depending on the threshold voltage. The
The data input /
The
The
4 is a circuit diagram illustrating an exemplary memory block shown in FIG. Referring to FIG. 4, the memory block BLK1 has a cell string structure. One cell string includes a string selection transistor connected to a string selection line (SSL), a plurality of memory cells connected to a plurality of word lines WL1 to WLn, and a ground selection line (GSL) Lt; RTI ID = 0.0 > a < / RTI > The string selection transistors are connected to bit lines (BL1 to BLm), and the ground selection transistors are connected to a common source line (CSL).
A plurality of memory cells may be connected to one word line (e.g., WLi). The set of memory cells connected to the selected word line WLi and programmed at the same time is called a page. In Fig. 4, the
5 is a diagram showing a threshold voltage distribution of the memory cell shown in FIG. 5 illustrates a threshold voltage distribution of memory cells in which 2-bit data is stored in one memory cell. 5, the horizontal axis represents the threshold voltage (Vth), and the vertical axis represents the number of memory cells (# of cells). The memory cell may have one of four states (E, P1, P2, P3) depending on the threshold voltage distribution. Here, E represents an erase state. And P1, P2 and P3 represent program states.
FIG. 6 is a block diagram illustrating the command field format of the user equipment shown in FIG. 2. FIG. The command field format is an interfacing standard to be exchanged between the
6 shows a program command field format for writing data to the
Referring to FIG. 6, the
6, the
After a read CMD end mark is transmitted, the
2, a
Ⅱ. How to transfer the page offset of the open block of the user device
As the process of a storage device becomes increasingly shrinking and its characteristics become worse, various schemes are being developed to ensure reliability for each storage device. At this time, the page offset of the open block is one of very important information. The present invention can improve the performance of the
FIG. 7 is a conceptual diagram for explaining an open block in the memory block of the flash memory shown in FIG. 3. FIG. An open block is an entire block of memory that is in the process of writing and can be rewritten.
Referring to FIG. 7, the memory block is composed of 64 pages, and the first to fifth pages (page1 to page5) are programmed pages, and the sixth to 64th pages (page6 to page64) It is an unprogrammed page. The fifth page (page 5) is the last programmed page. The page offset refers to the number of the last programmed page. In the example of FIG. 7, the page offset is the fifth page (page 5).
FIG. 8 is a block diagram showing a more detailed storage address format of the read command field format shown in FIG. Referring to FIG. 8, the storage address format may be composed of, for example, 32 bits.
The unused area consists of X bits. The cell type area determines which cell type (eg, SLC or MLC) is to be read, and consists of A bits. A CAU area (concurrently addressable unit area) specifies a data storage location at an upper level such as a chip, a die, and a plane, and is composed of B bits. The block area designates a block number within the CAU, and consists of C bits. The page area specifies the page number within the block, and it consists of D bits. In the above example, the store address format can be composed of 32 bits, which is the sum of X bits and A to D bits.
9 is a block diagram illustrating a page offset transmission method of an open block in a user equipment according to an embodiment of the present invention. FIG. 9 shows a page offset command field format for transmitting a page offset of an open block.
The
The
Referring to FIG. 9, the page offset command field format may be used in a manner similar to the read command field format. That is, in the page offset command field format, only the read command mark, the storage address format, and the read command end mark can be used in the read command field format. The page offset command field format does not output data after the read command end mark.
The
Continuing with reference to FIG. 9, the storage address format is composed of 32 bits and may include a read hint area and a page offset area.
The read hint area can use 1 bit of the X bits of the unused area. In this case, the unused area consists of X-1 bits, and the read hint area can consist of 1 bit. The cell type area is composed of A bits, the CAU area (concurrently addressable unit area) is composed of B bits, and the block area is composed of C bits. The page area of FIG. 7 is used as a page offset area and may be composed of D bits.
FIG. 10 is a conceptual diagram for explaining a specific embodiment of the page offset transmission method shown in FIG. The
The condition that the read hint command bit in FIG. 9 is set to 1 is expressed by Equation (1).
(⊙ is an and operation, and ∥ is an or operation)
Here, the condition A is a case where the read target block is an open block. Condition B is the first read after the user device is initialized. For example, the condition B is a case where a read operation is performed after the page offset command field format is transmitted, and a power on / off occurs. Condition C is a case where a memory block is changed in the same CAU. That is, the read target block is changed in the same chip or die. Condition D is the case where the page offset of the read target block is changed. For example, the condition D is a case where the read operation is performed after the transmission of the page offset command field format, and the last programmed page offset is changed by executing the program in the corresponding memory block.
Referring to FIG. 10, a 04h of the storage address format includes a read hint CMD bit, and a page offset bit finally programmed at 05h may be included. In the example of Fig. 10, the page offset of the open block is the fifth page. The user device (see FIG. 2, 2000) according to the embodiment of the present invention sets the read hint command bit to 1, sets the page offset to the fifth page, And transmits the offset command field format to the
11 is a conceptual diagram showing an example in which a normal read operation is performed when the read hint area is set to 0; If the condition of Equation (1) is not satisfied, the
Referring to FIG. 11, a read command bit (read CMD bit) is included in 00h of the storage address format, and a page number to be read may be included in 03h. In the example of Fig. 11, the read target page is the third page. The
The
Ⅲ. Application examples of the present invention
The user device according to the embodiment of the present invention can be applied not only to a flash memory having a two-dimensional structure but also to a flash memory having a three-dimensional structure.
12 is a block diagram exemplarily showing a three-dimensional flash memory used in the present invention. Referring to FIG. 12, the
The data input /
The
13 is a perspective view exemplarily showing a three-dimensional structure of the memory block BLK1 shown in FIG. Referring to FIG. 13, the memory block BLK1 is formed in a direction perpendicular to the substrate SUB. An n + doped region is formed in the substrate SUB.
A gate electrode layer and an insulation layer are alternately deposited on the substrate SUB. An information storage layer may be formed between the gate electrode layer and the insulation layer.
When the gate electrode film and the insulating film are vertically patterned in a vertical direction, a V-shaped pillar is formed. The pillar penetrates the gate electrode film and the insulating film and is connected to the substrate (SUB). The interior of the pillar may be a filing dielectric pattern and may consist of an insulating material such as silicon oxide. The exterior of the pillar may be composed of a channel semiconductor in a vertical active pattern.
The gate electrode layer of the memory block BLK1 may be connected to a ground selection line GSL, a plurality of word lines WL1 to WL8, and a string selection line SSL. A pillar of the memory block BLK1 may be connected to the plurality of bit lines BL1 to BL3. 13, one memory block BLK1 is shown to have two select lines GSL and SSL, eight word lines WL1 to WL8, and three bit lines BL1 to BL3, May be more or less than these.
14 is an equivalent circuit diagram of the memory block BLK1 shown in Fig. Referring to FIG. 14, cell strings CS11 to CS33 are connected between the bit lines BL1 to BL3 and the common source line CSL. Each cell string (for example, CS11) includes a ground selection transistor GST, a plurality of memory cells MC1 to MC8, and a string selection transistor SST.
The string selection transistor (SST) is connected to a string selection line (SSL). The string selection line SSL is divided into first to third string selection lines SSL1 to SSL3. The ground selection transistor (GST) is connected to the ground selection line (GSL). The ground selection line GSL of each cell string is connected. The string selection transistor SST is connected to the bit line BL and the ground selection transistor GST is connected to the common source line CSL.
The plurality of memory cells MC1 to MC8 are connected to the corresponding word lines WL1 to WL8, respectively. A set of memory cells connected to one word line and programmed at the same time is called a page. The memory block BLK1 is composed of a plurality of pages. In addition, a plurality of pages may be connected to one word line. Referring to Fig. 14, word lines (e.g., WL4) of the same height from the common source line CSL are connected in common to three pages.
Meanwhile, the user apparatus according to the embodiment of the present invention can be applied to or applied to various products. A user apparatus according to an embodiment of the present invention can be implemented in an electronic apparatus such as a personal computer, a digital camera, a camcorder, a mobile phone, an MP3, a PMP, a PSP, a PDA and the like. The storage medium of the user device may be implemented as a storage device such as a memory card, a USB memory, a solid state drive (SSD), or the like.
FIG. 15 shows an example in which a storage device of a user apparatus according to an embodiment of the present invention is applied to a memory card. The
The
The
16 is a block diagram showing an example of applying a storage device according to an embodiment of the present invention to a solid state drive (SSD). Referring to FIG. 16, the
The
The plurality of
The
The
17 is a block diagram illustrating an exemplary configuration of the
The
The
The
The
18 is a block diagram showing an example of implementing a storage device according to an embodiment of the present invention with an electronic device. Here, the
18, the
While the invention has been shown and described with reference to certain preferred embodiments thereof, it will be understood by those skilled in the art that various changes and modifications may be made therein without departing from the spirit and scope of the invention. Therefore, the scope of the present invention should not be limited to the above-described embodiments, but should be determined by the equivalents of the claims of the present invention as well as the claims of the following.
1000, 2000: User device
1100, 2100: Host
1101, 2101: Host interface
1110, 2110: Application
1120, 2120: Device Driver
1130, 2130: Host controller
1140, 2140: Buffer memory or buffer RAM
1200, 2200: Storage device
1201, 2201: Device interface
1210, 2210: NVM or flash memory
1230, 2230: Device controller
1240, 2240: buffer memory or buffer RAM
Claims (10)
A host connected to the storage device via an interface and transmitting data to the storage device,
Wherein the host provides page offset information of an open block of the flash memory to the storage device.
Wherein the host provides the page offset information of the open block to the storage device when a specific condition is satisfied.
Wherein the specific condition is the case where the read target block is an open block and the first read after the user device is initialized.
Wherein the specific condition is a case where the read target block is an open block and the memory block is changed in the same CAU.
Wherein the specific condition is a case where the read target block is an open block and the page offset of the read target block is changed.
Wherein the host provides the page offset command field format of the open block to the storage device prior to sending the read command field format.
Wherein the page offset command field format of the open block includes a read command mark, a storage address format, and a read command and mark.
Wherein the storage address format comprises a read hint region and a page offset region.
Wherein the page offset command field format and the read command field format are determined by the read hint area.
Wherein the host comprises a buffer RAM for driving a Host FTL.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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US14/540,122 US9612773B2 (en) | 2013-11-21 | 2014-11-13 | User device having a host flash translation layer (FTL), a method for transferring an erase count thereof, a method for transferring reprogram information thereof, and a method for transferring a page offset of an open block thereof |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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US201361906980P | 2013-11-21 | 2013-11-21 | |
US61/906,980 | 2013-11-21 |
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KR1020140026174A KR20150059057A (en) | 2013-11-21 | 2014-03-05 | User device having host ftl and method for transfering reprogram information thereof |
KR1020140026173A KR20150059056A (en) | 2013-11-21 | 2014-03-05 | User device having host ftl and method for transfering erase count thereof |
KR1020140026175A KR20150059058A (en) | 2013-11-21 | 2014-03-05 | User device having host ftl and method for transfering page offset of open block thereof |
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KR1020140026174A KR20150059057A (en) | 2013-11-21 | 2014-03-05 | User device having host ftl and method for transfering reprogram information thereof |
KR1020140026173A KR20150059056A (en) | 2013-11-21 | 2014-03-05 | User device having host ftl and method for transfering erase count thereof |
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Cited By (1)
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US11080198B2 (en) | 2019-03-05 | 2021-08-03 | SK Hynix Inc. | Data processing system and operating method thereof |
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US20240053922A1 (en) * | 2022-08-10 | 2024-02-15 | Micron Technology, Inc. | Command sequence to support adaptive memory systems |
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- 2014-03-05 KR KR1020140026174A patent/KR20150059057A/en not_active Application Discontinuation
- 2014-03-05 KR KR1020140026173A patent/KR20150059056A/en not_active Application Discontinuation
- 2014-03-05 KR KR1020140026175A patent/KR20150059058A/en not_active Application Discontinuation
Cited By (1)
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US11080198B2 (en) | 2019-03-05 | 2021-08-03 | SK Hynix Inc. | Data processing system and operating method thereof |
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