KR200329288Y1 - Integrated Digital Tester for Communication Line - Google Patents

Abstract

The present invention relates to a line test bench for maintaining a subscriber line connected to an exchange. In particular, a single tester can integrate and manage lines connected to multiple exchanges and monitor various test values of the test line in numerical values. It relates to a digital integrated line test bench that can be marked on.

Description

Integrated Digital Tester for Communication Line

The present invention relates to a test bench for maintenance of subscriber lines connected to a switchboard of a telephone office. Particularly, various test values of test lines are digitized by integrating different types of switchboards into one test. The present invention relates to a digital integrated line test bench capable of outputting a digital signal.

There are many exchanges installed in Korea, depending on the telephone company, and the track test bench, which is an accompanying equipment, also uses different track test benches according to the type of exchanges in operation, and maintains the lines subscribed to the exchange. Doing.

As described above, the track test bench configured for each type of switch in operation has a problem in that it is inconvenient to operate and a plurality of test benches must be installed because the test benches are different for each switchboard.

In addition, the number of switchboards increases with the increase of telephone subscribers, and the increase of switchboards leads to an increase in test benches, and thus a space for installing test benches in a limited space of a telephone station is required, and a large number of personnel are required to operate each test bench. There was a problem.

To solve this problem, there is an integrated test bench filed on March 26, 2000 and filed on May 23, 2000 by the applicant of the present invention.

The integrated test bench is designed to maintain the tracks connected to each exchange by connecting all the exchangers to one test bench, regardless of the type of exchange in operation. And an input selection circuit 2, which is a circuit capable of selecting and inputting a model of the exchanger connected through the MDF terminal 1, and a T / D line of the exchanger input by the input selection. An exchange matching circuit (3) for controlling communication between the exchange and the test bench, a test connecting circuit (5) for converting the signals of the exchange connected in the exchange matching circuit (3) so that the analog meta can recognize, A meta 6 indicating the line status of the general subscriber captured by the test connection circuit 5, and a general subscriber captured through the T / D line of the matched exchange; A call connection circuit 7 for making a telephone call, and a hauler circuit for transmitting an arbitrary signal to a subscriber side at a test table when a general subscriber captured through the T / D line of the matched exchanger leaves the talker. 10), a 1KHz tone circuit 11 which transmits an arbitrary signal from a test bench when repairing a line between test benches and a test site, and any subscriber captured through the matched T / D line. A 20 Hz ring circuit 16 for sending a ring signal to the subscriber telephone, a dial 8 for inputting the subscriber's telephone number so as to be able to talk to the subscriber via the call connection circuit, and the call connection circuit ( 7) a handset circuit (9) that allows the test bench to communicate with field personnel or MDF operators or general subscribers; MDF test and call circuit 12 for capturing and testing a person, a general subscriber connection circuit 13 which is a telephone line circuit used when receiving field personnel or general complaints, and the field personnel through the general subscriber connection circuit 13 Or a pending sound transmission circuit 14 for generating a temporary hold sound when receiving a complaint from a general subscriber, and a primary call circuit 15 through which the general subscriber connection circuit can communicate with field personnel or a general subscriber. It consists of).

The integrated test bench constructed as described above maintains tracks subscribed to various exchangers by testing various abnormalities by connecting a plurality of exchangers to one test bench regardless of the type of exchanger.

However, because all the instruments that check the line of the integrated test bench configured as described above are displayed through the meta-type of analog, the measured line test values cannot be accurately recognized until the test bench operator examines them in detail. There was a problem that it was difficult to test the track.

In addition, it is possible to know the value of the selected line status only while the test bench is in operation, and there is no means to store or output the value. In order to accumulate data, there was a problem that the value should be written by hand every time the tester was operated.

In order to solve the above problems, the present invention is connected to a conventional integrated test bench, and each of the A / D converter and the A / D converter for converting the analog value of the integrated test bench into a digital value can be countered respectively. It is intended to add the necessary devices so that the monitor can display the desired line test values as digitized values.

In addition, it is another object of the present invention to store the track test values converted into digital values using a memory or output them using a printer so that the test data can be used as statistical data on a test line in the future.

In order to achieve the above object, the present invention provides an input selection circuit, an exchange matching circuit, a test connection circuit, a meta, a call connection circuit, a Howler circuit, a 1 KHz tone circuit, a 20 Hz ring circuit, a dial, a handset circuit, an MDF test and a call circuit. An integrated test bench comprising a general subscriber connection circuit, a holding sound transmitting circuit, and a primary call circuit, comprising: an A / D converter connected to the integrated test bench and converting an analog signal measured by the integrated test bench into a digital signal; Among the digital values of the circuits converted by the A / D converter, a frequency counter for countering the frequency of the test line, a direct / AC voltage measuring unit for measuring DC or AC voltages, and noise for measuring noise of the test line A digital measuring unit comprising a measuring unit, a resistance measuring unit for measuring the resistance of the test line, a capacitor capacitance measuring unit for measuring the capacitor capacity of the test line, and an error counter for counting errors; An I / O interface for transmitting a value measured by the digital measurement unit, an MCU for outputting a measurement value of a test line desired by an operator according to a command inputted by calculating a value input from the I / O interface; It provides a digital integrated line test bench comprising a keyboard for inputting a desired command through the MCU, and a monitor for displaying the output value of the MCU.

1 is a view showing a digital integrated line test bench according to the present invention.

<Description of Symbols for Main Parts of Drawings>

1: MDF terminal 2: Input selection circuit

3: exchanger matching circuit 4: power supply

5: test connection circuit 6: meta

7: call connection circuit 8: dial

9: handset circuit 10: Howler circuit

11: 1KHz tone circuit 12: MDF test call circuit

13: general subscriber connection circuit 14: hold sound transmission circuit

15: primary call circuit 16: 20 Hz ring circuit

17: A / D converter 20: digital measuring unit

21: frequency counter 22: direct-current voltage measuring unit

23: noise measuring unit 24: resistance measuring unit

25 capacitor capacity measuring unit 26 error counter

27: I / O interface 28: MCU

29: monitor 30: monitor

Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

Figure 1 shows a digital integrated line test bench according to the present invention, MDF terminal (1), input selection circuit (2), switch matching circuit (3), test connection circuit (5), meta (6), call connection circuit (7), Howler circuit (10), 1 KHz tone circuit (11), 20 Hz ring circuit (16), dial (8), handset circuit (9), MDF test and call circuit (12), general subscriber connection circuit (13), the holding sound transmitting circuit 15, the primary call circuit 15, the A / D converter 17, the digital measuring unit 20, the I / O interface 27, the MCU 28 and the keyboard ( 30), and a monitor (29).

The digital integrated line test bench is a part other than the A / D converter 17 and the digital measuring unit 20, the I / O interface 27, the MCU 28, the monitor 29 and the keyboard 30 Since it has already been described in the related art, further description will be omitted.

According to the present invention will be described in detail for the portion to convert the measured value of the test line to a digital value and output, first, the A / D converter 17 is measured by the circuit of the conventional integrated test bench described above meta (6) Converts analog values to digital values.

Next, the digital measuring unit 20 selects one of various test values included in the digital value converted by the A / D converter 17 and selects a plurality of measuring units for measuring a desired value. The plurality of measuring units have a frequency counter 21 for countering the frequency of the test line, a direct / AC voltage measuring unit 22 for measuring direct current and alternating voltage of the test line, and noise of the test line. Noise measuring section 23 for measuring, resistance measuring section 24 for measuring resistance value of test line, capacitor capacitance measuring section 25 for measuring capacitor capacity of test line, and error of test line It consists of an error counter 26 for generating a pattern to measure and using it to counter errors in the test line. The digital measuring unit having such a configuration separates the signals available for each measuring unit from the digital values of the circuits converted by the A / D converter 17 and outputs the measured values to the I / O interface 27.

Next, the measured values transmitted to the MCU 28 through the I / O interface 27 are calculated through the MCU 28 and output as numerical values through the monitor 29. At this time, the MCU 28 is connected to the keyboard 30 for inputting the operator's command, the operator inputs a command so that the operator can output the desired measurement value of the test line through the monitor, according to the input command The MCU 28 calculates only the measured measured values among the values transmitted through the I / O interface 27 and outputs them through the monitor 29.

As described above, when the test bench operator inputs a command to output a value to be measured on the subscriber line through the keyboard, the digital integrated line test bench selects one or more measuring means included in the digital measurement unit according to the input command. Then, the selected value is measured from various test values of the integrated test bench converted into digital value and displayed on the monitor.

In addition, although not shown, the memory and the printer are further connected to the MCU so that the measured value of the test line may be stored in the memory or output through the printer by the command of the keyboard. Therefore, it is possible to store or output the values for the tested line and accumulate them as statistics on the test line.

As described above, the digital integrated line test bench can be connected regardless of the type of switchboard to identify the abnormality of the line by the numerical value.

As described above, the digital integrated line test bench of the present invention displays the test value of the test line as a digital value on the monitor so that the test bench operator can easily determine whether there is an abnormality in the test line, so that the test bench can be efficiently operated.

In addition, by storing the values tested by the digital integrated line test bench in the memory or output through the printer to use as statistical data for the test line it is possible to adjust the timing of maintenance by detecting the aging of the test line in advance in the future .

Claims (3)

MDF terminal, input selection circuit, exchange matching circuit, test connection circuit, META, call connection circuit, howler circuit, 1KHz tone circuit, 20Hz ring circuit, dial, handset circuit, MDF test and call circuit, An integrated test bench including a general subscriber connection circuit, a holding sound transmitting circuit, and a primary calling circuit; An A / D converter connected to the integrated test bench and converting the analog signal measured by the integrated test bench into a digital signal; A digital measuring unit for measuring various measured values of a test line by using digital values of each circuit converted by the A / D converter; An I / O interface for transmitting a value measured by the digital measurement unit; An MCU for calculating a value input from the I / O interface; A keyboard for inputting a command to the MCU to output a desired measurement value; And a monitor for displaying the value calculated by the MCU. The method of claim 1, The digital measuring unit and the frequency counter for counting the frequency of the test line; Direct and AC voltage measuring unit for measuring the DC or AC voltage of the test line, A noise measuring unit for measuring the noise of the test line, A resistance measuring unit for measuring resistance of the test line, A capacitor capacity measuring unit for measuring the capacitor capacity of the test line; And an error counter for counting errors in the test line. The method of claim 1, A memory for storing measured values of a test line calculated through the MCU; And a printer capable of outputting a value displayed on the monitor or a value stored in a memory.