KR20000050537A - Apparatus for measuring crt flat panel - Google Patents

Apparatus for measuring crt flat panel Download PDF

Info

Publication number
KR20000050537A
KR20000050537A KR1019990000487A KR19990000487A KR20000050537A KR 20000050537 A KR20000050537 A KR 20000050537A KR 1019990000487 A KR1019990000487 A KR 1019990000487A KR 19990000487 A KR19990000487 A KR 19990000487A KR 20000050537 A KR20000050537 A KR 20000050537A
Authority
KR
South Korea
Prior art keywords
flat panel
cathode ray
ray tube
flatness
panel
Prior art date
Application number
KR1019990000487A
Other languages
Korean (ko)
Other versions
KR100404660B1 (en
Inventor
송태근
Original Assignee
서두칠
한국전기초자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 서두칠, 한국전기초자 주식회사 filed Critical 서두칠
Priority to KR10-1999-0000487A priority Critical patent/KR100404660B1/en
Publication of KR20000050537A publication Critical patent/KR20000050537A/en
Application granted granted Critical
Publication of KR100404660B1 publication Critical patent/KR100404660B1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/42—Measurement or testing during manufacture
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/86—Vessels; Containers; Vacuum locks
    • H01J29/861—Vessels or containers characterised by the form or the structure thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)

Abstract

PURPOSE: An apparatus for measuring a dimension of a flat panel of a cathode ray tube is provided to facilely measure a degree of flatness and a thickness of the panel. CONSTITUTION: An apparatus(1) for measuring a dimension of a flat panel(3) of a cathode ray tube comprises an aligning portion for aligning a transferred flat panel, a standard block which is contacted with an upper and lower face of the aligned flat panel to decide a standard value of flatness of the flat panel, a plurality of probes which are approached to and got away from the flat panel so as to be contacted and non-contacted with the upper and lower face of the flat panel, a lifting block which is mounted at the lower portion of the flat panel to lift up and down the flat panel and a lifting member for lifting up and down the standard block and the probe. In the apparatus, the aligning portion has at least one pressing portion for pressing a side of the flat panel and sliding the flat panel and at least one stopper which is mounted to be opposite to the pressing portion to be contacted with other side of the flat panel.

Description

음극선관용 평판패널의 치수측정장치{APPARATUS FOR MEASURING CRT FLAT PANEL}Dimension measuring apparatus for flat panel for cathode ray tube {APPARATUS FOR MEASURING CRT FLAT PANEL}

본 발명은, 음극선관용 평판패널의 치수측정장치에 관한 것으로서, 보다 상세하게는, 평판패널의 평탄도 및 두께를 용이하게 측정할 수 있는 음극선관용 평판패널의 치수측정장치에 관한 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a dimension measuring apparatus for flat panel for cathode ray tube, and more particularly, to a dimension measuring apparatus for flat panel for cathode ray tube which can measure flatness and thickness of flat panel easily.

일반적으로 음극선관은 전방에 위치하여 화상이 투사되는 패널과, 패널의 후방에 결합되는 깔때기 형상의 펀넬과, 전자총을 구비하여 펀넬의 후방에 결합되는 넥크를 가진다.In general, a cathode ray tube has a panel which is positioned in front of it to project an image, a funnel-shaped funnel that is coupled to the rear of the panel, and a neck that is coupled to the rear of the funnel with an electron gun.

통상의 음극선관용 패널은, 전면부가 전방을 향하여 만곡되게 형성되어 있기 때문에 음극선관의 부피가 전체적으로 증대하고, 패널의 모서리영역은 소정의 각도를 가지고 경사지게 형성되어 있어 화상인식이 용이하지 않다는 단점이 있다. 이에 따라, 최근에는 패널의 전면부를 평탄하게 형성시켜 음극선관의 부피를 줄이고 전체적으로 화상이 넓게 분포되게 하여 종래의 패널에서 나타난 모서리영역의 화상왜곡을 줄일 수 있는 평면패널이 고안되어 사용되고 있다.The conventional cathode ray tube panel has a disadvantage that the front portion is formed to be curved forward, so that the volume of the cathode ray tube is increased overall, and the edge region of the panel is formed to be inclined at a predetermined angle so that image recognition is not easy. . Accordingly, recently, a flat panel has been devised and used to reduce the volume of the cathode ray tube and to broadly distribute the image, thereby reducing the image distortion of the edge region shown in the conventional panel.

이러한, 평판패널은 품질에서 평탄도가 매우 중요하게 인식되어 평탄도를 정밀하게 측정하는 측정장치의 필요성이 대두되어 있다.The flat panel is recognized as a very important flatness in quality, and there is a need for a measuring device for accurately measuring flatness.

그런데, 평탄패널의 평탄도 및 두께를 측정하기 위하여 종래에는 연마 공정을 지나 이송하는 제품중 일부를 샘플링하여 3차원 측정기와 버니어 캘리퍼스 혹은 다이얼 게이지로 평판패널의 두께 및 평탄도를 측정함에 따라 측정에 소요되는 시간이 오래 걸리고 이에 의해 제품의 전량 검사가 어려운 문제점이 있다.However, in order to measure the flatness and thickness of the flat panel, conventionally, a part of the products transported through the polishing process is sampled, and the thickness and flatness of the flat panel are measured by using a three-dimensional measuring instrument, a vernier caliper or a dial gauge. It takes a long time, thereby making it difficult to inspect the whole quantity of the product.

따라서, 본 발명의 목적은, 평판패널의 평탄도와 두께를 용이하게 측정할 수 있는 음극선관용 평판패널의 치수측정장치를 제공하는 것이다.Accordingly, it is an object of the present invention to provide a dimensional measurement apparatus for a flat panel for cathode ray tubes that can easily measure the flatness and thickness of the flat panel.

도 1은 본 발명에 따른 음극선관용 평판패널의 치수측정장치의 정면도,1 is a front view of a dimension measuring apparatus of a flat panel for a cathode ray tube according to the present invention,

도 2는 도 1의 정렬부의 정면도,2 is a front view of the alignment unit of FIG. 1;

도 3은 도 1의 정렬부의 평면도,3 is a plan view of the alignment unit of FIG.

도 4는 도 1의 평판패널 하부영역의 확대정면도,4 is an enlarged front view of the lower region of the flat panel of FIG.

도 5는 본 발명에 따른 하부측정부과 하부기준블럭 및 승강블럭의 위치를 도시한 평면도,5 is a plan view showing the position of the lower measuring unit, the lower reference block and the lifting block according to the present invention;

도 6은 도 1의 평판패널 상부영역의 확대정면도,6 is an enlarged front view of the upper region of the flat panel of FIG.

도 7은 본 발명에 따른 상부측정부 및 상부기준블럭의 위치를 도시한 평면도이다.7 is a plan view showing the position of the upper measuring unit and the upper reference block according to the present invention.

* 도면의 주요 부분에 대한 부호의 설명* Explanation of symbols for the main parts of the drawings

3 : 평판패널 5 : 공급부3: flat panel 5: supply part

7 : 이송부13 : 지지프레임7: transfer unit 13: support frame

33 : 제1승강부재35 : 승강블럭33: first lifting member 35: lifting block

37 : 탐침39 : 하부기준블럭37: probe 39: lower reference block

43 : 상부기준블럭43: upper reference block

상기 목적은, 본 발명에 따라, 음극선관용 평판패널의 치수측정장치에 있어서, 이송된 평판패널을 정렬시키는 정렬부와; 상기 정렬부에 의해 정렬된 상기 평판패널의 상부면 및 하부면에 접촉되어 평탄도의 기준점을 잡는 각각 세 개의 기준블럭과; 상기 평판패널을 향해 접근 및 이반되어 상기 평판패널의 상부면과 하부면에 접촉 및 이탈되는 복수의 탐침을 포함하는 것을 특징으로 하는 음극선관용 평판패널의 치수측정장치에 의해 달성된다.According to the present invention, there is provided a dimension measuring apparatus for a cathode ray tube flat panel, comprising: an alignment unit for aligning the transferred flat panel; Three reference blocks each contacting an upper surface and a lower surface of the flat panel panel aligned by the alignment unit to establish a reference point of flatness; It is achieved by the dimensional measurement apparatus of the flat panel for cathode ray tube, characterized in that it comprises a plurality of probes approaching and separating toward the flat panel and in contact with and separated from the upper and lower surfaces of the flat panel.

여기서, 상기 평판패널의 하부에 설치되어 상기 평판패널을 승강시키는 승강블럭과, 상기 기준블럭 및 상기 탐침을 승강시키는 승강부재를 더 포함하는 것이 효과적이다.Here, it is effective to further include an elevating block installed on the lower portion of the flat panel to elevate the flat panel, and elevating member for elevating the reference block and the probe.

또한, 상기 정렬부는 상기 평판패널의 일측면을 가압하는 적어도 하나의 가압부와; 상기 가압부와 대향되게 설치되어 상기 평판패널의 타측면에 접촉되는 적어도 하나의 스톱퍼를 포함하여 치수측정장치에 공급된 평판패널을 효과적으로 정렬시킬 수 있다.In addition, the alignment unit and at least one pressing unit for pressing one side of the flat panel; The at least one stopper may be installed to face the pressing unit to be in contact with the other side of the flat panel to effectively align the flat panel supplied to the dimensional measuring device.

이하에서는 첨부도면을 참조하여 본 발명에 대해 상세히 설명한다.Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

도 1은 본 발명에 따른 음극선관용 평판패널의 치수측정장치의 측면도이다. 이 도면에 도시된 바와 같이, 본 발명에 따른 음극선관용 평판패널의 치수측정장치의 양측에는 치수측정장치(1)로 평판패널(3)을 공급하는 공급부(5)와, 치수측정장치(1)에서 측정이 완료된 평판패널(3)을 다음 공정으로 이송시키는 이송부(7)가 마련되어 있다.1 is a side view of a dimension measuring apparatus of a flat panel for cathode ray tubes according to the present invention. As shown in this figure, on both sides of the dimension measuring apparatus of the flat panel for cathode ray tubes according to the present invention, a supply unit 5 for supplying the flat panel 3 to the dimension measuring apparatus 1, and the dimension measuring apparatus 1 The transfer part 7 which transfers the flat panel 3 which the measurement was completed to to the next process is provided.

치수측정장치(1)는 상부베이스(9)와 상부베이스(9)로부터 소정 이격간격을 두고 설치된 하부베이스(11)를 갖는 지지프레임(13)과, 하부베이스(11)에 설치되어 평판패널(3) 하부면을 측정하는 하부측정부(15)와, 상부베이스(9)에 설치되어 평판패널(3)의 상부면을 측정하는 상부측정부(17)를 가진다.The dimension measuring device 1 includes a support frame 13 having an upper base 9 and a lower base 11 provided at a predetermined distance from the upper base 9, and a flat panel ( 3) has a lower measuring unit 15 for measuring the lower surface, and an upper measuring unit 17 installed on the upper base 9 to measure the upper surface of the flat panel 3.

도 2는 정렬부의 정면도이며, 도 3은 도 1의 정렬부의 평면도이다. 이들 도면에 도시된 바와 같이, 상부측정부(17)에는 치수측정장치(1)로 공급되는 평판패널(3)을 정렬시키는 정열부가 설치되어 있다. 정렬부는 평판패널(3)의 단측면을 구속하는 단측면구속부와 장측면을 구속하는 장측면구속부를 가진다.2 is a front view of the alignment unit, and FIG. 3 is a plan view of the alignment unit of FIG. 1. As shown in these figures, the upper measuring portion 17 is provided with an alignment portion for aligning the flat panel 3 supplied to the dimensional measuring device 1. The alignment portion has a short side restraint portion that restrains the short side surface of the flat panel 3 and a long side restraint portion that restrains the long side surface.

단측면구속부는 평판패널(3)의 유입측 단측면에 대해 승강하면서 평판패널(3)의 일측 단측면에 접하는 제1스톱퍼(25)와, 제1스톱퍼(25)가 접촉하는 단측면에 대해 대향된 타측면 주변영역에 설치되어 제1스톱퍼(25)를 향해 평판패널(3)을 가압하는 제1가압부(27)를 가지며, 장측면구속부는 전방측 장측면에 대해 접하는 복수의 제2스톱퍼(29)와, 제2스톱퍼(29)가 접하는 장측면에 대해 대향된 후방측 장측면에 접촉하여 제2스톱퍼(29)를 향해 평판패널(3)을 가압하는 제2가압부(31)를 가진다.The short side restraining portion is lifted with respect to the inflow side short side of the flat panel 3 while the first stopper 25 is in contact with the one side short side of the flat panel 3 and the short side which the first stopper 25 is in contact with. A first pressing part 27 provided in the opposite peripheral side peripheral area and urging the flat panel 3 toward the first stopper 25, and the long side restraining part is provided with a plurality of second side facing the front long side face. The second pressing part 31 which presses the flat panel 3 toward the second stopper 29 by contacting the stopper 29 and the rear long side surface opposed to the long side surface in contact with the second stopper 29. Has

도 4는 도 1의 평판패널 하부영역의 확대정면도이며, 도 5는 본 발명에 따른 하부측정부와 하부기준블럭 및 승강블럭의 위치를 도시한 평면도이다. 이들 도면에 도시된 바와 같이, 평판패널(3)의 하부에는 제1승강부재(33)에 의해 승강하면서 평판패널(3)의 하부면에 접촉하여 하부평탄도의 기준을 잡는 세 개의 하부기준블럭(39)과, 하부기준블럭(39)의 기준점을 기초로 하여 평판패널(3)의 하부면에 접촉하여 하부평탄도를 측정하는 19개의 탐침(37)이 설치되어 있으며, 평판패널(3)을 소정 승강시키는 승강블럭(35)을 가진다.4 is an enlarged front view of the lower region of the flat panel of FIG. 1, and FIG. 5 is a plan view illustrating positions of a lower measuring unit, a lower reference block, and a lifting block according to the present invention. As shown in these figures, three lower reference blocks for raising and lowering by the first elevating member 33 at the lower portion of the flat panel 3 to contact the lower surface of the flat panel 3 to set the standard of the lower flatness. 19 and 37 probes 37 are provided for contacting the lower surface of the flat panel 3 based on the reference point of the lower reference block 39 to measure the lower flatness. Has a lifting block 35 for raising and lowering the predetermined amount.

또한, 도 6은 도 1의 평판패널 상부영역의 확대정면도이며, 도 7은 본 발명에 따른 상부측정부와 상부기준블럭의 위치를 도시한 평면도이다. 이들 도면에 도시된 바와 같이, 평판패널(3)의 상부에는 평판패널(3)의 상부면에 접촉하여 상부평탄도의 기준을 잡는 세 개의 상부기준블럭(43)과, 상부기준블럭(43)의 기준점을 기초로 하여 평판패널(3)의 상부면에 접촉하여 상부평탄도를 측정하는 13개의 탐침(37)이 설치되어 있다.6 is an enlarged front view of the upper region of the flat panel of FIG. 1, and FIG. 7 is a plan view illustrating positions of the upper measuring unit and the upper reference block according to the present invention. As shown in these figures, three upper reference blocks 43 and an upper reference block 43 which contact the upper surface of the flat panel 3 to set the upper flatness standard on the upper part of the flat panel 3. Thirteen probes 37 are provided for contacting the upper surface of the flat panel 3 and measuring the upper flatness based on the reference point of.

이상과 같은 구성에 의하여, 연마가 완료된 평판패널(3)이 공급부(5)를 통해 치수측정장치(1)에 공급되면 제1스톱퍼(25)가 하강하여 진행중인 평판패널(3)을 정지시키고 평판패널(3)이 제1스톱퍼(25)에 의해 정지되면, 제1승강부재(33)이 승강하게 된다.By the above-described configuration, when the polished flat panel 3 is supplied to the dimensional measuring device 1 through the supply unit 5, the first stopper 25 descends to stop the flat panel 3 in progress and the flat plate When the panel 3 is stopped by the first stopper 25, the first lifting member 33 is lifted up and down.

제1승강부재(33)가 승강하여 평판패널(3)이 소정 상승하게 되면, 제1가압부(27)가 제1스톱퍼(25)를 향해 평판패널(3)을 가압함과 동시에 제2가압부(31)가 제2스톱퍼(29)를 향해 후방측 장측면을 밀어 제1가압부(27)와 제1스톱퍼(25) 그리고 제2가압부(31)와 제2스톱퍼(29)에 의해 평판패널(3)이 정렬된다.When the first elevating member 33 is elevated to raise the flat panel 3 by a predetermined amount, the first pressing part 27 presses the flat panel 3 toward the first stopper 25 and at the same time, the second pressurizing member. The part 31 pushes the rear long side toward the second stopper 29 by the first pressing part 27, the first stopper 25, and the second pressing part 31 and the second stopper 29. The flat panel 3 is aligned.

이렇게, 평판패널(3)이 정렬되면, 제1승강부재(33)와 함께 상승한 하부기준블럭(39)이 평판패널(3) 하부면의 평탄도 기준을 잡게 되고 제1승강부재(33)와 함께 상승한 평판패널(3)의 하부영역에 위치한 19개의 탐침(37)이 평판패널(3)의 하부면에 접촉하면서 평판패널(3) 하부면의 평탄도를 측정하며, 평판패널(3)의 상부에 위치한 13개의 탐침(37)이 평판패널(3)의 상부면에 접촉함에 따라 측정한 값과 평판패널(3)의 하부면에 위치한 19개의 탐침(37)이 측정한 값을 통해 평판패널(3)의 두께가 측정된다.As such, when the flat panel 3 is aligned, the lower reference block 39 raised together with the first elevating member 33 may set the flatness reference of the lower surface of the flat panel 3 and the first elevating member 33. 19 probes 37 located in the lower region of the flat panel 3, which are raised together, contact the bottom surface of the flat panel 3 to measure the flatness of the bottom surface of the flat panel 3, and The 13 panels 37 located at the top of the flat panel 3 are measured by contact with the upper surface of the flat panel 3, and the 19 panels 37 at the lower surface of the flat panel 3 are measured through the values measured. The thickness of (3) is measured.

평판패널(3)의 두께와 하부면의 평탄도가 측정되면, 평판패널(3)의 하부영역에 위치한 승강블럭(35)이 소정 상승함에 따라 평판패널(3)을 상향 이송시켜 평판패널(3)의 상부면을 상부기준블럭(43)에 접촉시킴으로써 평판패널(3) 상부면의 평탄도 기준점을 잡게 된다. 평판패널(3) 상부면의 평탄도 기준점이 잡히게 되면, 평판패널(3)의 상부에 배치되어 평판패널(3)의 상부면에 접촉되는 13개의 탐침(37)에 의해 평판패널(3) 상부면의 평탄도가 측정된다.When the thickness of the flat panel 3 and the flatness of the lower surface of the flat panel 3 are measured, the flat panel 3 is conveyed upwards as the lifting block 35 positioned in the lower region of the flat panel 3 rises a predetermined amount. By contacting the upper surface of the upper surface with the upper reference block 43 to set the flatness reference point of the upper surface of the flat panel (3). When the flatness reference point of the upper surface of the flat panel 3 is caught, the upper surface of the flat panel 3 is provided by thirteen probes 37 disposed on the upper surface of the flat panel 3 and contacting the upper surface of the flat panel 3. The flatness of the face is measured.

이렇게, 평판패널(3) 하부면과 상부면의 평탄도 및 두께가 측정된 평판패널(3)은 이송부(7)를 통해 다음 공정으로 이송되게 된다.In this way, the flat panel 3, the flatness and the thickness of the lower surface and the upper surface of the flat panel 3 is measured is transferred to the next process through the transfer unit (7).

이와 같이, 공급된 평판패널의 두께 및 하부면과 상부면의 평탄도를 짧은 시간에 측정할 수 있어 전량 검사가 가능하게 됨에 따라 평판패널을 채용한 음극선관의 품질을 향상시킬 수 있다.As such, the thickness of the supplied flat panel and the flatness of the lower surface and the upper surface can be measured in a short time, so that the whole quantity can be inspected, thereby improving the quality of the cathode ray tube employing the flat panel.

이상에서 설명한 바와 같이, 본 발명에 따르면, 평판패널의 평탄도 및 두께를 용이하게 측정할 수 있는 음극선관용 평판패널의 치수측정장치가 제공된다.As described above, according to the present invention, there is provided an apparatus for measuring the size of a flat panel for cathode ray tubes that can easily measure the flatness and thickness of the flat panel.

Claims (3)

음극선관용 평판패널의 치수측정장치에 있어서,In the dimension measuring apparatus of the flat panel for cathode ray tube, 이송된 평판패널을 정렬시키는 정렬부와;An alignment unit for aligning the transferred flat panel; 상기 정렬부에 의해 정렬된 상기 평판패널의 상부면 및 하부면에 접촉되어 평탄도의 기준점을 잡는 각각 세 개의 기준블럭과;Three reference blocks each contacting an upper surface and a lower surface of the flat panel panel aligned by the alignment unit to establish a reference point of flatness; 상기 평판패널을 향해 접근 및 이반되어 상기 평판패널의 상부면과 하부면에 접촉 및 이탈되는 복수의 탐침을 포함하는 것을 특징으로 하는 음극선관용 평판패널의 치수측정장치.Apparatus for dimensional measurement of a cathode ray tube flat panel, characterized in that it comprises a plurality of probes that are approached and separated toward the flat panel and in contact with and separated from the upper and lower surfaces of the flat panel. 제 1항에 있어서,The method of claim 1, 상기 평판패널의 하부에 설치되어 상기 평판패널을 승강시키는 승강블럭과;An elevating block installed at a lower portion of the flat panel to elevate the flat panel; 상기 기준블럭 및 상기 탐침을 승강시키는 승강부재를 더 포함하는 것을 특징으로 하는 음극선관용 평판패널의 치수측정장치.Dimensioning device of the flat panel for cathode ray tube further comprises a lifting member for elevating the reference block and the probe. 제 1항에 있어서,The method of claim 1, 상기 정렬부는 상기 평판패널의 일측면을 가압하여 슬라이딩시키는 적어도 하나의 가압부와;The alignment unit and at least one pressing unit for sliding by pressing one side of the flat panel; 상기 가압부와 대향되게 설치되어 상기 평판패널의 타측면에 접촉되는 적어도 하나의 스톱퍼를 포함하는 것을 특징으로 하는 음극선관용 평판패널의 치수측정장치.Size measuring device of the flat panel for cathode ray tube, characterized in that it comprises at least one stopper installed to face the pressing portion in contact with the other side of the flat panel.
KR10-1999-0000487A 1999-01-11 1999-01-11 Apparatus for measuring crt flat panel KR100404660B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR10-1999-0000487A KR100404660B1 (en) 1999-01-11 1999-01-11 Apparatus for measuring crt flat panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR10-1999-0000487A KR100404660B1 (en) 1999-01-11 1999-01-11 Apparatus for measuring crt flat panel

Publications (2)

Publication Number Publication Date
KR20000050537A true KR20000050537A (en) 2000-08-05
KR100404660B1 KR100404660B1 (en) 2003-11-10

Family

ID=19571004

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-1999-0000487A KR100404660B1 (en) 1999-01-11 1999-01-11 Apparatus for measuring crt flat panel

Country Status (1)

Country Link
KR (1) KR100404660B1 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020037963A (en) * 2000-11-16 2002-05-23 박영구 System for measuring panel of cathode ray tube
KR100432770B1 (en) * 2001-05-21 2004-05-24 한국전기초자 주식회사 Alignment device for apparatus of measuring crt flat panel
KR100432771B1 (en) * 2001-07-04 2004-05-24 한국전기초자 주식회사 Apparatus of measuring crt flat panel and measuring method thereof
KR100446908B1 (en) * 2002-05-21 2004-09-04 한국전기초자 주식회사 apparatus for measuring warpage of CRT flat panel
KR100455316B1 (en) * 2002-05-21 2004-11-06 한국전기초자 주식회사 apparatus for inspecting CRT panel

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR950010672Y1 (en) * 1992-12-30 1995-12-23 석진철 Bulb seal alignment tester for crt

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020037963A (en) * 2000-11-16 2002-05-23 박영구 System for measuring panel of cathode ray tube
KR100432770B1 (en) * 2001-05-21 2004-05-24 한국전기초자 주식회사 Alignment device for apparatus of measuring crt flat panel
KR100432771B1 (en) * 2001-07-04 2004-05-24 한국전기초자 주식회사 Apparatus of measuring crt flat panel and measuring method thereof
KR100446908B1 (en) * 2002-05-21 2004-09-04 한국전기초자 주식회사 apparatus for measuring warpage of CRT flat panel
KR100455316B1 (en) * 2002-05-21 2004-11-06 한국전기초자 주식회사 apparatus for inspecting CRT panel

Also Published As

Publication number Publication date
KR100404660B1 (en) 2003-11-10

Similar Documents

Publication Publication Date Title
KR100404660B1 (en) Apparatus for measuring crt flat panel
CN215005010U (en) Silicon rod terminal surface automatic checkout device
CN207386173U (en) A kind of steel plate flatness detecting device
CN110850227B (en) Screen detection device and method
KR100432770B1 (en) Alignment device for apparatus of measuring crt flat panel
JPH07311375A (en) Inspection stage of liquid crystal display substrate inspecting device
CN110455168A (en) A kind of advanced lines TFT glass A type frame detection device
KR101701213B1 (en) Device for testing flatness
CN107025871B (en) Display panel detection device and detection method
JP2005251813A (en) Wafer level burn in alignment device and method
JPH1070209A (en) Apparatus for measuring thickness of ceramic sealing board for semiconductor device
JPS595641A (en) Prober
KR100397148B1 (en) Apparatus and method for measuring outside face contour of crt glass panel
CN216560894U (en) Fool-proof device for pin card test
CN220346588U (en) Injection molding screening machine based on visual detection
KR100432771B1 (en) Apparatus of measuring crt flat panel and measuring method thereof
KR20040005089A (en) Apparatus and method for leveling chuck of wafer
KR100397144B1 (en) Apparatus for measuring periphery dimensions of crt panel
JP2501613B2 (en) Wafer prober
CN218808804U (en) Bearing plate jacking device
JPH1183411A (en) Shape-measuring method and device for funnel for cathode-ray tube
CN210198253U (en) Dimension quantifying device for quartz wafer production
KR101426927B1 (en) Thickness measuring device for pcb
KR20000026546A (en) Apparatus and method for checking flat display
KR100446908B1 (en) apparatus for measuring warpage of CRT flat panel

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
LAPS Lapse due to unpaid annual fee