KR19990015377A - Next Generation Application Protocol Conformance Test System Architecture - Google Patents

Abstract

The present invention relates to a next generation intelligent network application protocol (INAP) conformance system architecture, and the next generation intelligent network (AIN) detects an intelligent network service from basic call processing of an exchange and performs a service exchange function (SSF) for requesting service execution. It consists of service control function (SCF) to perform service, special resource function (SRF) for user interface during service execution, and service data function (SDF) to manage data necessary for service execution. It is equipped to physically correspond to service exchange (SSP), service control system (SCP), intelligent information providing system (IP), and service data system (SDF) which are entities, and to support signals necessary for interaction between AIN function entities. It is an application protocol for service-independent general purpose protocol, and is an application layer between SCF-SSF, SCF-SRF and SCF-SDF functional entities. By configuring the next-generation application protocol (INAP) to support the interface, it ensures the generality of the INAP conformance test embedded in the AIN device, thereby improving interoperability among AIN devices, and constructing a test-independent test system. This is possible, and AIN device entrants have the effect of having generality of test results by performing device-independent tests.

Description

Next Generation Application Protocol Conformance Test System Architecture

The present invention relates to a next-generation intelligent network application protocol (hereinafter referred to as INAP) conformance test system architecture.

Conventional INAP has different application layer protocols for each service, so each time a new service is developed, the application layer protocol is tested as a system integration test. However, this test is not a test according to the ISO IS-9646 conformance test standard. By using a simple tester implemented by each intelligent network device developer, there is a problem that it is difficult to have generality of device verification.

The intelligent network devices determined through these tests issued a lot of errors when performing interoperability tests connected to the network. However, since there is no system independent of the implementation device, a lot of effort and time should be invested in correcting the error of the implementation object. Followed.

In order to solve the above problems, the present invention, by designing and implementing a test system independent of the implementation device to ensure the generality for verifying the INAP conformity mounted in the Advanced Intelligent Network (hereinafter referred to as AIN) device, through The goal is to increase interoperability between AIN devices.

1 is an AIN functional structure that is the subject of the present invention,

2 is a connection structure diagram between the INAP conformity test system and the test target system of the present invention,

3 is a structure diagram of an INAP conformity system to which the present invention is applied.

Explanation of symbols for main parts of the drawings

10: service exchanger (SSP) 11: service exchange function (SSF)

12, 21: Service control function (SCF) 20: Service control system (SCP)

22: Service data function unit (SDF) 30: Intelligent information system (IP)

31: SRF 40: Caller

50: called party 60: INAP conformity test system

61: ATS generator 62: test preparation unit

63: test analysis unit 64: test execution unit

64a: Verification Operator (TM) 64b: Execution Test Suite

64c: Abstract Exam Suite

64d, 71b: Intelligent Network Application Protocol (INAP)

64e: TCAP 64f, 71c: Signal Connection Control Unit (SCCP)

64g, 71d: Message Transmitter (MTP) 70, 71: Test Subject System (SUT)

71a: Test object (IUT) 80: Common line signal part (CCS No. 7)

100: ATS generator 110: INAP FSM modeling module

120: test object (TP) preparation module 130: simulation module

140: ATS module 150: ATS complement module

200: test preparation unit 210: PICS management module

220: PIXIT management module 230: ETS generation module

240: Interface definition module between ETS-test system

250: test database 300: test execution unit

310: test run initialization module 320: simulator drive module

330: test management module 340: test monitoring

350: test result storage module 400: test analysis unit

410: test history file management module 420: PCTR generation module

430: test results database

In order to achieve the above object, the present invention provides a test system structure adapted to the INAP conformance test, comprising: an ATS structure having an INAP_FSM modeling module, a test purpose preparation module, a simulation module, an ATS generator, and an ATS complementary module, and a PICS. Test preparation block structure with management module, PIXIT management module, ETS generation module, ETS-test system interface definition module, test execution initialization module, simulation drive module, test management module, test monitoring module, test result storage A test performance block structure having a module as an internal structure, and a test analysis block structure having a test history file management module and a PCTR generation module as an internal structure.

Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

1 is an AIN functional structure diagram to which the present invention is applied. A service switching point (hereinafter referred to as SSP) 10 receiving a call sent from a telephone terminal and an intelligent network service are to be used. A service control system (Service Control Point, hereinafter referred to as SCP) 20 that receives a service request message through a next generation intelligent network application protocol message in response to a caller's request, and the SCP 20 sends the caller with the help of the SSP 10. It consists of an intelligent information system (Intelligent Peripheral, hereinafter referred to as IP) (30) connected to collect information from.

In the AIN service of FIG. 1, AIN devices interoperate with each other to provide an intelligent network service to a subscriber.

When a call originated from the caller 40 is transferred from the caller 40 to the SSP 10 which is an intelligent network device, the SSP 10 receives a request of the caller 40 to use the intelligent network service, and loads a subservation request message into the INAP message. Send to SCP (20).

The service logic in the SCP 20 controls the service by referring to the profile of the service subscriber stored in a database form in the service data function (hereinafter referred to as SDF) 22.

When additional information is needed from the caller 40 for service processing, the SCP 20 is connected to the IP 30 with the help of the SSP 10 to collect information from the caller.

Upon completion of service processing, the SCP 20 sends the result to the SSP 10 with the result in an INAP message.

The SSP 10 connects a call between the caller 40 and the called party 50 using the result data received from the SCP 20 or performs other additional services.

The present invention described the conformance system structure for verifying the conformance of the INAP used as the interface between the devices of the AIN in consideration of the fact that the AIN service is realized by the transmission and reception of INAP messages between AIN devices developed by various vendors.

2 is a connection structure diagram between the INAP conformity test system and the test target system, which is the object of the present invention, and shows the connection structure between the INAP conformance test system 60 and the test target system 70.

First, the INAPs 64d and 71a use a common line signaling unit (common channel signaling number 7, hereinafter referred to as CCS No. 7) 80 as a protocol stack of a lower layer as an application layer protocol.

The protocol stack includes the message transfer part (hereinafter referred to as MTP) 64g and 71d from the lower layer, the signaling connection control part (hereinafter referred to as SCCP) 64f and 71c, and the question and answer function function unit ( Transaction Capabilities Application Part, hereinafter referred to as TCAP) (64e, 71b).

The physical connection between the test system and the test object is required by the test run 64 in the INAP conformance test system.

The test message required to perform each test is transmitted from the INAP conformance test system 60 to the test target system 70 through the lower protocol stacks 40 and 50, or a response to the test message is returned from the test target system 70. Sent to test system 60.

FIG. 3 is a structural diagram of an INAP conformity system to which the present invention is applied, and the INAP conformance test system is a functional abstract test suite (hereinafter referred to as ATS) generation unit 100, test preparation unit 200, and test execution unit ( 300), the test analysis unit 400 is composed of four blocks.

The ATS generation unit 100 describes a finite state machine (FSM) model of an INAP in an AIN functional entity from an INAP specification in specification and description language (hereinafter referred to as SDL). Module 110, a test preparation module 120 for generating test cases for testing whether each AIN device is properly implemented, a DSL model and message sequence chart (hereinafter referred to as MSC) module of INAP FSM Simulation module 130 for analyzing / verifying the ATS generation module 140 for converting the verified SDL model and MSC model into a test suite (ATS) having the tree and tabular combined notation (TTCN) format, and an INAP operation. It is composed of the ATS complementary module 150 that defines static parts such as parameters / data to be used, and corrects / complements and verifies the ATS.

The test preparation unit 200 inputs whether an implementer of an object (Implementation Under Test, hereinafter referred to as IUT) implements a test protocol and performs a protocol test execution state (Protocol Implementation Conformance Dtatement, Hereinafter, referred to as PICS) management module 210, protocol implementation extra information for testing for setting and processing each parameter value used in implementing an ITU (hereinafter referred to as PIXIT) management module 220 The ETS generation module 230, which translates the ATS and generates an Executable Test Suite (Executable Test Suitable, hereinafter referred to as ETS) from the ATS in a test system using the PICS and PIXIT management functions, between the ETS and the test system. To the ETS-Test System Interface Definition Module 240 for setting the execution environment and the Test Database 250 for PICS / PIXIT market management. It is sex.

The test execution unit 300 is a test execution initialization module 310 for providing an execution environment for performing the ETS generated in the test preparation unit 200, the lower protocol simulator driving module 320 below INAP. Each test case can be tested according to a user's request, and a test management module 330 for executing a test by selecting a corresponding ETS according to a test object, and a test monitoring module for observing test data when a test is performed. 340, and a test result storage module 350 for storing the event or result occurring during the test.

The test analysis unit 400 is a step in which a final analysis of the processes and contents performed in the test system is performed, and the history file management module 410 which provides the basis data for a series of processes and contents generated during the conformance test is performed. ), A test results database 430 that stores data for judging the actual test results and calculating the conformance test results report from the test history file, the Protocol Conformance Test Report (PCTR) of the final results of the INAP conformance test system. It is composed of a generation module 420.

As described above, the present invention guarantees the generality of the INAP conformity test mounted in the AIN device, thereby improving the interoperability between the AIN devices, and enables the configuration of a test system independent of the test object. Device entrants, or network operators, have the effect of having generality of test results by performing device-independent tests.

Claims (5)

In the test system structure applied to the next generation intelligent network application protocol (INAP) conformance test, An ATS generating unit having an internal structure of an INAP_FSM modeling module, a test purpose preparing module, a simulation module, an ATS generating module, and an ATS complementing module; A test preparation unit having an internal structure of an ATS structure having an internal structure of the ATS complementary module, a PICS management module, a PIXIT management module, an ETS generating module, and an interface defining module between an ETS-test system; A test execution unit having an internal structure of a test execution initialization module, a simulation driving module, a test management module, a test monitoring module, and a test result storage module; Next-generation application protocol (INAP) conformance test system structure, characterized in that the test history file management module, the PCTR generation module consists of a test analysis unit as an internal structure. The method of claim 1, wherein the ATS generating unit An INAP FSM modeling module for describing a finite state machine (FSM) model for INAP in an AIN functional entity in the specification language (SDL) from the INAP specification; A test purpose (TP) preparation module for generating a test case (ATS) for testing whether each AIN device is properly implemented; A simulation module for analyzing / verifying the SDL model and message flow chart (MSC) model of the INAP FSM; An ATS module for converting the verified SDL ATS into a test case having a tree and tabular combined notation (hereinafter referred to as TTCN) format; A next generation application protocol (INAP) conformance test system architecture that includes static ATS complementary modules that define static parts, such as parameters / data used by INAP operations, and modify / supplement and validate ATS. The method of claim 1, wherein the test preparation unit A PICS management module that implements and implements a test protocol by an implementer of a test object to perform a test system; A PIXIT management module for setting each parameter value used in the IUT implementation and processing the same; An ETS generation module for translating the ATS and generating an ETS of a form that can be executed in a test system from the ATS using a PICS and PIXIT management function; An interface definition module between the ETS-test system for setting a performance environment between the ETS and the test system; A next generation application protocol (INAP) conformance test system architecture comprising a test database for PICS / PIXIT information management. According to claim 1, wherein the test performing unit A test execution initialization module for providing an execution environment that enables execution of an executable ETS generated by the test preparation unit; An INAP lower protocol simulator driving module; A test management module which can test each test case according to a user's request and selects a corresponding ETS according to a test object to execute a test; A test monitoring module for observing test data when performing the test; A next generation application protocol (INAP) conformance test system architecture comprising a test result storage module for storing events or results that occur during a test run. The method of claim 1, wherein the test analysis unit A test history file management module for providing evidence of a series of processes and contents generated during the conformance test, in which final analysis of the processes and contents performed in the test system is performed; A test result database for storing data for report generation from a test history file management module to an actual test result determination and a conformance test result; A next generation application protocol (INAP) conformance test system architecture comprising a protocol conformance test result report (PCTR) generation module that is the end result of the INAP conformance test system.