KR100424771B1 - Apparatus for measuring characteristic of edfa to multi-channel signal - Google Patents

Apparatus for measuring characteristic of edfa to multi-channel signal Download PDF

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KR100424771B1
KR100424771B1 KR1019970036860A KR19970036860A KR100424771B1 KR 100424771 B1 KR100424771 B1 KR 100424771B1 KR 1019970036860 A KR1019970036860 A KR 1019970036860A KR 19970036860 A KR19970036860 A KR 19970036860A KR 100424771 B1 KR100424771 B1 KR 100424771B1
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signal light
edfa
light source
signal
fiber amplifier
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KR1019970036860A
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KR19990014992A (en
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황성택
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삼성전자주식회사
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3127—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR using multiple or wavelength variable input source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/26—Optical coupling means
    • G02B6/28—Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals
    • G02B6/293—Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means
    • G02B6/29379—Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means characterised by the function or use of the complete device
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
    • H01S3/06—Construction or shape of active medium
    • H01S3/063—Waveguide lasers, i.e. whereby the dimensions of the waveguide are of the order of the light wavelength
    • H01S3/067—Fibre lasers
    • H01S3/06754—Fibre amplifiers

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  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Lasers (AREA)

Abstract

PURPOSE: An apparatus for measuring a characteristic of an EDFA(Erbium Doped Fiber Amplifier) to a multi-channel signal is provided to measure the characteristic of the EDFA from a corresponding wavelength by inputting a saturation signal into the EDFA and using a probe signal. CONSTITUTION: An apparatus for measuring a characteristic of an optical fiber amplifier to a multi-channel signal includes a saturation signal light source, a probe signal light source, an optic coupler, an EDFA, and a measurement system. The saturation signal light source(200) is used for outputting a single wavelength signal having the same intensity as the total intensity of signals of each channel. The probe signal light source(202) is used for outputting the signal regardless of the inverse distribution of the EDFA. The optic coupler(204) is used for coupling an output signal of the saturation light source and an output signal of the probe signal light source. The EDFA(206) is used for amplifying a coupled signal of the optic coupler. The measurement system(208) measures the wavelength and the intensity of the amplified probe signal.

Description

다채널 신호광에 대한 광섬유증폭기의 특성 측정장치Characteristic measuring device of optical fiber amplifier for multi-channel signal light

본 발명은 광섬유증폭기의 특성 측정장치에 관한 것으로, 보다 상세하게는 다채널 신호광에 대한 광섬유증폭기의 특성 측정장치에 관한 것이다.The present invention relates to an apparatus for measuring a characteristic of an optical fiber amplifier, and more particularly, to an apparatus for measuring a characteristic of an optical fiber amplifier for multi-channel signal light.

통상적으로 파장분할다중화(Wavelength Division Multiplexing,, 이하 WDM이라 약함) 통신에서는 한 개의 광선로에 여러 채널의 신호광을 동시에 전송한다. 따라서, WDM 통신용 광섬유증폭기(Erbium Doped Fiber Amplifier, 이하 EDFA라 약함)의 특성도 여러 채널의 신호광을 이용하여 측정해야한다. 예를 들어, 8채널 신호광에 대한 EDFA의 특성을 측정하기 위해서는 8개의 신호광원과 이를 감지할 수 있는 측정 시스템이 필요하다. 도 1은 종래의 8채널 신호광에 대한 광섬유증폭기의 특성 측정장치에 대한 블록도로서, 도 1에 따른 광섬유증폭기의 특성 측정장치는 8개의 신호광(100), 광 다중화기(Optic Multiplexer, 102), EDFA(104) 및 측정 시스템(106)으로 이루어진다. 그 동작원리는 다음과 같다. 먼저, 8개의 신호광(100)으로부터 출력되는 각각 다른 파장을 갖는 신호광들은 광 다중화기(102)를 통해 다중화된 다음, EDFA(104)를 통해 증폭된다. 이 때, 8채널 신호광은 EDFA(104)에 입사되기 전의 세기와 EDFA(104)를 지나 증폭된 출력광의 세기가 각 파장별로 측정 시스템(106)을 통해 측정되어 이득이 구해지고, 여기서 구한 이득과 EDFA(104)로부터 나오는 자연방출(Amplified Spontaneous Emission, ASE)로부터 잡음지수가 구해진다.In general, wavelength division multiplexing (hereinafter, referred to as WDM) communication transmits signal light of several channels simultaneously in one optical path. Therefore, the characteristics of the WDM communication optical fiber amplifier (Erbium Doped Fiber Amplifier, hereinafter referred to as EDFA) should also be measured using signal light of several channels. For example, in order to measure the characteristics of EDFA for 8-channel signal light, eight signal light sources and a measurement system capable of detecting the same are required. 1 is a block diagram of a conventional apparatus for measuring characteristics of an optical fiber amplifier for 8-channel signal light. The apparatus for measuring characteristics of an optical fiber amplifier according to FIG. 1 includes eight signal lights 100, an optical multiplexer 102, EDFA 104 and measurement system 106. The operation principle is as follows. First, signal lights having different wavelengths output from the eight signal lights 100 are multiplexed through the optical multiplexer 102 and then amplified by the EDFA 104. At this time, the eight-channel signal light is measured by the measurement system 106 for each wavelength by the intensity before the incident to the EDFA 104 and the intensity of the amplified output light after the EDFA 104, and the gain is obtained. The noise figure is obtained from the Amplified Spontaneous Emission (ASE) from the EDFA 104.

그러나, 이러한 다채널 신호광을 이용하여 EDFA의 특성을 측정하기 위해서는 여러 개의 신호광원이 필요하고, 채널의 수를 4, 8, 16 또는 32채널로 증가시키면 그에 따른 신호광원 수도 증가시켜야 한다. 또한 신호광의 채널간격을 0.8nm에서 1.6nm로 바꾸어 측정하고자할 경우, 채널 간격에 따라 원하는 파장의 신호광원으로 바꿔야하며, 동일한 다채널 신호광에 대한 EDFA의 특성을 측정하는 경우라도, 파장대역이 바뀌면 신호광원을 모두 바꿔야한다. 다채널 EDFA의 특성 측정을 위한 측정 시스템도 신호광의 채널 수에 따라 이들을 감지할 수 있도록 채널 수가 늘어야 한다.However, in order to measure the characteristics of the EDFA by using the multi-channel signal light, several signal light sources are required, and when the number of channels is increased to 4, 8, 16, or 32 channels, the number of signal light sources must be increased accordingly. In addition, if you want to measure the channel spacing of the signal light from 0.8nm to 1.6nm, you should change to the signal light source of the desired wavelength according to the channel spacing. All signal sources must be changed. Measurement systems for the characterization of multichannel EDFAs must also increase the number of channels to detect them according to the number of channels of signal light.

본 발명이 이루고자하는 기술적 과제는 다채널 신호광의 전체 세기에 해당하는 세기를 갖는 단일 파장의 포화 신호광(saturation signal)을 EDFA에 입사시키고, 프로브 신호광(probe signal)을 이용하여 해당 파장에서 EDFA의 특성을 측정할 수 있는 다채널 신호광에 대한 광섬유증폭기의 특성 측정장치를 제공하는데 있다.The technical problem to be achieved by the present invention is to inject a saturation signal of a single wavelength having an intensity corresponding to the total intensity of the multi-channel signal light into the EDFA, the characteristics of the EDFA at the wavelength using a probe signal (probe signal) An object of the present invention is to provide an apparatus for measuring a characteristic of an optical fiber amplifier for a multi-channel signal light capable of measuring.

도 1은 종래의 8채널 신호광에 대한 광섬유증폭기의 특성 측정장치에 대한 블록도이다.1 is a block diagram of a conventional apparatus for measuring characteristics of an optical fiber amplifier for 8-channel signal light.

도 2는 본 발명에 따른 다채널 신호광에 대한 광섬유증폭기의 특성 측정장치에 대한 블록도이다.2 is a block diagram of an apparatus for measuring characteristics of an optical fiber amplifier for multi-channel signal light according to the present invention.

도 3은 도 1의 측정장치의 결과와 도 2의 측정장치의 결과를 비교하여 도시한 것이다.FIG. 3 shows the result of the measuring device of FIG. 1 compared with the result of the measuring device of FIG. 2.

상기 기술적 과제를 달성하기 위한, 본 발명에 따른 다채널 신호광에 대한 광섬유증폭기의 특성 측정장치는 측정하고자하는 각 채널 신호광의 전체 세기와 같은 세기를 갖는 단일 파장의 신호광을 출력하는 포화 신호광원; 상기 광섬유증폭기의 반전분포에 영향을 미치지않을 만큼의 세기를 갖는 신호광을 출력하는 프로브 신호광원; 상기 포화광원의 출력 신호광과 상기 프로브 신호광원의 출력 신호광을 결합하는 광 결합기; 상기 광 결합기를 통해 전송된 결합 신호광을 증폭하는 광섬유증폭기; 및 상기 광섬유증폭기의 특성을 구하기위해 상기 광섬유증폭기에서 증폭된 프로브 신호광의 파장과 세기를 측정하는 측정 시스템을 포함함이 바람직하다.In order to achieve the above technical problem, an apparatus for measuring a characteristic of an optical fiber amplifier for a multi-channel signal light according to the present invention comprises: a saturation signal light source for outputting signal light having a single wavelength having the same intensity as the total intensity of each channel signal light to be measured; A probe signal light source for outputting signal light having an intensity that does not affect the inversion distribution of the optical fiber amplifier; An optical coupler for coupling the output signal light of the saturated light source and the output signal light of the probe signal light source; An optical fiber amplifier for amplifying the combined signal light transmitted through the optical coupler; And a measurement system for measuring the wavelength and intensity of the probe signal light amplified by the optical fiber amplifier to obtain the characteristics of the optical fiber amplifier.

이하에서 첨부된 도면을 참조하여 본 발명을 보다 상세히 설명하기로 한다. 도 2는 본 발명에 따른 다채널 신호광에 대한 광섬유증폭기의 특성 측정장치에 대한 블록도로서, 도 2에 따른 광섬유증폭기의 특성 측정장치는 포화 신호광원(200), 프로브신호광원(202), 광 결합기(optic coupler, 204), EDFA(206) 및 측정 시스템(208)로 이루어진다.Hereinafter, the present invention will be described in more detail with reference to the accompanying drawings. 2 is a block diagram of an apparatus for measuring characteristics of an optical fiber amplifier for multi-channel signal light according to the present invention. The apparatus for measuring characteristics of an optical fiber amplifier according to FIG. 2 includes a saturation signal light source 200, a probe signal light source 202, and an optical fiber. Optical coupler 204, EDFA 206 and measurement system 208.

포화 신호광원(200)은 다채널 신호광의 전체 세기에 해당하는 세기를 갖는 단일 파장의 신호광을 출력하고, 프로브 신호광원(202)은 EDFA의 반전분포(population inversion)에 영향을 미치지않을 만큼의 약한 세기(-30dB 이하)를 갖는 신호광을 출력한다. 포화 신호광원(200)과 프로브 신호광원(202)에서 출력되는 광신호의 파장과 세기는 조절가능하다(tunable). 광 결합기(204)는 상술한 포화 신호광과 프로브 신호광을 결합하여 하나의 광전송로를 통해 전송한다. EDFA(206)는 어븀(Er)과 같은 희토류 원소가 도핑된 증폭매질에서 여기된(excited) 어븀의 유도방출(stimulated emmission)을 통해 입사된 신호광을 증폭한다. 측정 시스템(208)으로는 신호광의 파장과 세기를 측정할 수 있는 광 스펙트럼 분석기(optical spectrum analyzer) 등이 사용되는데, 하나의 채널만을 측정할 수 있는 종래의 측정 시스템이 사용된다.The saturation signal light source 200 outputs signal light of a single wavelength having an intensity corresponding to the overall intensity of the multi-channel signal light, and the probe signal light source 202 is weak enough to not affect the inversion of EDFA. Outputs signal light having intensity (-30 dB or less). The wavelength and intensity of the optical signal output from the saturation signal light source 200 and the probe signal light source 202 are tunable. The optical coupler 204 combines the above-mentioned saturation signal light and probe signal light and transmits them through one optical transmission path. The EDFA 206 amplifies the incident signal light through stimulated emmission of erbium excited in an amplification medium doped with a rare earth element such as erbium (Er). As the measurement system 208, an optical spectrum analyzer or the like capable of measuring the wavelength and intensity of the signal light is used. A conventional measurement system capable of measuring only one channel is used.

한편, 상술한 구성에 의거하여 본 발명의 동작을 설명하기로 한다. 먼저, 포화 신호광원(200)과 프로브 신호광원(202)로부터 출력된 포화 신호광과 프로브 신호광이 광 결합기(204)를 통해 EDFA(206)에 입사되는데, 이 때 프로브 신호광의 세기는 일정하게 유지되고, 파장은 사용자에 의해 각 파장에 따른 EDFA의 이득특성이 측정되도록 변화된다. 측정 시스템(208)을 통해서 EDFA(204)에서 증폭된 프로브 신호광의 파장 및 세기가 측정되어 파장에 따른 EDFA의 이득특성이 측정된다. 프로브 신호광은 EDFA의 특성에 영향을 주지않을만큼 충분히 약한 세기의 광이므로, 포화 신호광에 의한 EDFA의 이득특성에 영향을 주지않게된다. 그러므로 측정된 프로브 신호광에 대한 EDFA의 이득특성은 실제 측정하고자하는 신호광의 특성이 된다.On the other hand, the operation of the present invention will be described based on the above configuration. First, the saturation signal light and the probe signal light output from the saturation signal light source 200 and the probe signal light source 202 are incident on the EDFA 206 through the optical combiner 204, where the intensity of the probe signal light is kept constant. The wavelength is changed so that the gain characteristic of EDFA according to each wavelength is measured by the user. The measurement system 208 measures the wavelength and intensity of the probe signal light amplified by the EDFA 204 to measure the gain characteristics of the EDFA according to the wavelength. Since the probe signal light is light of sufficient intensity not to affect the properties of the EDFA, the probe signal light does not affect the gain characteristics of the EDFA due to the saturated signal light. Therefore, the gain characteristic of the EDFA with respect to the measured probe signal light becomes the characteristic of the signal light to be actually measured.

도 3은 EDFA의 이득특성을 직접 측정한 결과와 본 발명에 의한 측정결과를 도시한 것이다. 포화 신호광의 파장을 1550nm로 하고 프로브 신호광의 파장을 변화시켜면서 측정한 결과 1550nm 파장 근처에서 직접 측정한 결과와 일치함을 알 수 있다. 나머지 파장대의 측정결과 또한 측정 시스템의 내부 오차 수준이므로 충분히 받아들일 수 있는 값이다. 따라서, 측정하고자하는 파장범위에 따라 포화 신호광 및 프로브 신호광만 변화시켜주면 실제 신호광에 대한 EDFA의 이득특성이 측정가능하다.Figure 3 shows the results of the direct measurement of the gain characteristics of the EDFA and the measurement results according to the present invention. It was found that the wavelength of the saturation signal light was 1550 nm and the measurement result was changed while changing the wavelength of the probe signal light. The measurement results of the remaining wavelength bands are also acceptable, since they are internal error levels of the measurement system. Therefore, if only the saturation signal light and the probe signal light are changed according to the wavelength range to be measured, the gain characteristics of the EDFA with respect to the actual signal light can be measured.

본 발명에 의하면, 다채널 신호광에 대한 EDFA의 특성측정에 여러 개의 신호광원을 준비할 필요가 없고, 측정하고자하는 채널 수를 증가 또는 감소시켜 EDFA의 특성을 측정할 때에도 포화광 신호의 세기만 조절하면 된다. 또한 신호광의 채널 간격을, 예를 들어, 0.8nm에서 1.6nm로 바꾸어 측정하고자할 때에도 포화광 신호 및 프로브 신호광의 파장만을 변화시키면 되므로 조작이 간편하고 경제적이다. 또한 종래의 한 채널 EDFA 특성 측정 시스템을 사용하므로 경제적이다.According to the present invention, it is not necessary to prepare several signal sources for the characteristic measurement of EDFA for multi-channel signal light, and only the intensity of the saturated light signal is adjusted even when measuring the characteristics of EDFA by increasing or decreasing the number of channels to be measured. Just do it. In addition, even when the channel spacing of the signal light is to be measured, for example, from 0.8 nm to 1.6 nm, only the wavelengths of the saturated light signal and the probe signal light need to be changed, so that the operation is simple and economical. It is also economical by using a conventional one channel EDFA characterization system.

Claims (3)

광섬유증폭기의 특성을 측정하는 장치에 있어서,In the device for measuring the characteristics of the optical fiber amplifier, 측정하고자하는 각 채널 신호광의 전체 세기와 같은 세기를 갖는 단일 파장의 신호광을 출력하는 포화 신호광원;A saturation signal light source for outputting signal light of a single wavelength having the same intensity as the overall intensity of each channel signal light to be measured; 상기 광섬유증폭기의 반전분포에 영향을 미치지않을 만큼의 세기를 갖는 신호광을 출력하는 프로브 신호광원;A probe signal light source for outputting signal light having an intensity that does not affect the inversion distribution of the optical fiber amplifier; 상기 포화광원의 출력 신호광과 상기 프로브 신호광원의 출력 신호광을 결합하는 광 결합기;An optical coupler for coupling the output signal light of the saturated light source and the output signal light of the probe signal light source; 상기 광 결합기를 통해 전송된 결합 신호광을 증폭하는 광섬유증폭기; 및An optical fiber amplifier for amplifying the combined signal light transmitted through the optical coupler; And 상기 광섬유증폭기의 특성을 구하기위해 상기 광섬유증폭기에서 증폭된 프로브 신호광의 파장과 세기를 측정하는 측정 시스템을 포함함을 특징으로하는 다채널 신호광에 대한 광섬유증폭기의 특성 측정장치.And a measuring system for measuring the wavelength and intensity of the probe signal light amplified by the optical fiber amplifier to obtain the characteristics of the optical fiber amplifier. 제1항에 있어서, 상기 포화 신호광원은The method of claim 1, wherein the saturation signal light source 출력되는 신호광의 세기 및 파장을 조절할 수 있는 광원임을 특징으로하는 다채널 신호광에 대한 광섬유증폭기의 특성 측정장치.Characteristic measuring apparatus of the optical fiber amplifier for multi-channel signal light, characterized in that the light source that can adjust the intensity and wavelength of the output signal light. 제1항에 있어서, 상기 프로브 신호광원은The method of claim 1, wherein the probe signal light source 출력되는 신호광의 세기 및 파장을 조절할 수 있는 광원임을 특징으로하는 다채널 신호광에 대한 광섬유증폭기의 특성 측정장치.Characteristic measuring apparatus of the optical fiber amplifier for multi-channel signal light, characterized in that the light source that can adjust the intensity and wavelength of the output signal light.
KR1019970036860A 1997-08-01 1997-08-01 Apparatus for measuring characteristic of edfa to multi-channel signal KR100424771B1 (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06167421A (en) * 1992-07-23 1994-06-14 Fujikura Ltd Measurement of brillouin gain spectrum of optical fiber
US5596667A (en) * 1992-10-20 1997-01-21 Fujitsu Limited Application of phase conjugate optics to optical systems
JPH09318492A (en) * 1996-05-30 1997-12-12 Ando Electric Co Ltd Otdr measuring device
JP2000114672A (en) * 1998-09-30 2000-04-21 Ando Electric Co Ltd Measuring device for optical fiber amplifier

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06167421A (en) * 1992-07-23 1994-06-14 Fujikura Ltd Measurement of brillouin gain spectrum of optical fiber
US5596667A (en) * 1992-10-20 1997-01-21 Fujitsu Limited Application of phase conjugate optics to optical systems
JPH09318492A (en) * 1996-05-30 1997-12-12 Ando Electric Co Ltd Otdr measuring device
JP2000114672A (en) * 1998-09-30 2000-04-21 Ando Electric Co Ltd Measuring device for optical fiber amplifier

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