JPWO2015037133A1 - Correspondence information generation system and correspondence information generation method - Google Patents

Abstract

In order to reduce the load at the time of map data generation, an overall integrated analysis unit (1) that generates a first element set (Y, U) including a predetermined element, and an element ui in the first element set (Y, U) The third element is generated by generating a peripheral element uih that is a peripheral element of the element based on a predetermined condition, and adding the peripheral element to the first element set (Y, U) as an element of the first set. Based on the extension processing unit (2) for generating the set (Y, UP1) and the third element set (Y, UP1), the fourth element set (YP, YP, corresponding to the third element set (Y, UP1)) UP) and a data registration unit (5) for registering the mapping from the set UP to the set YP as map data (7) in the first storage unit (6). Features.

Description

  The present invention relates to a correspondence information generation system and a correspondence information generation method for generating correspondence information for one calculation program to use a calculation result calculated by one calculation program in two calculation programs.

  For the purpose of estimating the behavior and performance of the entire system such as the entire product and the entire component, for example, the technology described in Patent Document 1 expresses the behavior of various physical areas included in the system with simple models. Integrated analysis that integrates and executes analysis.

  In such integrated analysis, the behavior of a specific physical region has strong nonlinearity, and mathematical modeling is difficult, or the behavior of a specific physical region must be modeled faithfully to a three-dimensional structure. There are cases. In such a case, there is a method in which detailed analysis by a finite element method based on a three-dimensional CAD (Computer Aided Design) model is used together. As one of such methods, for example, a technique described in Patent Document 2 is disclosed. In the technique described in Patent Document 2, in detailed analysis, calculation results corresponding to a plurality of calculation conditions are calculated in advance, and map data is created from the calculation results. And the technique of patent document 2 takes in map data at the time of whole integration analysis, and performs whole integration analysis using the map data. As another method, there is a method of coupling the overall integration analysis and the detailed analysis. In this method, an interface for transmitting and receiving analysis results is provided in both a tool for performing overall integration analysis and a tool for performing detailed analysis, and both devices sequentially transmit and receive each other's calculation results via the interface. .

JP 2002-175338 A JP 2006-330156 A

  In the method of generating map data from the calculation result of the detailed analysis, the density of the map data needs to be increased as the accuracy of the detailed analysis increases. As a result, there is a problem that the calculation cost for generating map data increases.

  Also, the method of creating map data from the calculation results of the detailed analysis requires that the map data must be widened and the calculation cost for generating the map data is to be implemented for any calculation condition in the overall integrated analysis with map data. There is a problem that increases. That is, there is a problem in that map data in a range that is not planned to be used is generated, and unnecessary calculation costs are required.

  The present invention has been made in view of such a background, and an object of the present invention is to reduce the load when generating correspondence information.

  In order to solve the above-described problem, the present invention generates a peripheral element of an element included in the first set according to a predetermined condition, adds the element to the first set, and then adds the second set to the first set. The element is generated, and the mapping from the first set to the second set is used as the correspondence information.

  According to the present invention, it is possible to reduce the load when generating correspondence information.

It is a figure showing an example of composition of a map data generation system concerning this embodiment. It is a figure which shows the hardware structural example of the map data generation system which concerns on this embodiment. It is a flowchart which shows the procedure of the map data generation process which concerns on this embodiment. It is a figure which shows the example of the value output as a result of the calculation process which concerns on this embodiment. It is a figure for demonstrating in detail the 1st element expansion process which concerns on this embodiment (the 1). It is a figure for demonstrating in detail the 1st element expansion process which concerns on this embodiment (the 2). It is a schematic diagram for showing the outline | summary of the 2nd element expansion process which concerns on this embodiment. It is a figure which shows the content of the process in the extended process part which concerns on this embodiment. It is a figure which shows the specific example of the u expansion process which concerns on this embodiment. It is a figure which shows the specific example of the micro expansion process which concerns on this embodiment. It is a figure which shows the specific example of the thinning process which concerns on this embodiment. It is a figure which shows another example which concerns on this embodiment.

  Next, modes for carrying out the present invention (referred to as “embodiments”) will be described in detail with reference to the drawings as appropriate. In the present embodiment, a map data generation system is added to a control system design simulator that is configured by a plant and a control system that controls the plant, and in which part of the dynamic characteristics of the plant is described by map data (corresponding information). Although an applied example will be described, it may be applied to other systems.

[System configuration]
FIG. 1 includes a plant according to the present embodiment and a control system that controls the plant, and a map data generation system is provided for a control system design simulator in which part of the dynamic characteristics of the plant is described by map data. It is a figure which shows the structural example at the time of applying.
The map data generation system (corresponding information generation system) Z in this embodiment includes an overall integration analysis unit (first set generation unit) 1, an extension processing unit 2, a thinning processing unit 3, and a detailed analysis unit (second set). A generation unit 4, a data registration unit (registration unit) 5, and a first storage unit (storage unit) 6.

The overall integrated analysis unit 1 is a control system design simulator, and includes a plant model 16 composed of the calculation processing unit 14 and map data 7 of FIG. The plant model 16 is configured to receive a control command from the control unit 13 and return an output value to the control unit 13 via the map data 7. Further, the total integration analysis unit 1 sets the output set of the calculation processing unit 14 and the input set of the calculation processing unit 14 as U and Y, respectively, and outputs them to the extension processing unit 2 as a first element set (Y, U). .
The overall integrated analysis unit 1 will be described later.

When the first element set (Y, U) is input from the overall integration analysis unit 1, the extension processing unit 2 applies a first element extension described later to the first element set (Y, U). Processing and second element expansion processing are performed. And the expansion process part 2 outputs the 2nd element set (Y, ^UP1 ) output as a result of a 2nd element expansion process. The second element expansion process will be described later.

The thinning processing unit 3 performs a thinning process on the second element set (Y, ^UP1 ) output from the extension processing unit 2, and outputs the result as a third element set (Y, ^UP ). . The thinning process will be described later.

The detailed analysis unit 4, a third element set (Y, U ^P) that is input from the thinning processing unit 3 based on, perform detailed analysis, the results fourth element set (Y ^P, U ^P ) Is output. The processing of the detailed analysis unit 4 will be described later.

Data registration unit 5, the fourth element set (Y ^{P, U P)} that detailed analysis unit 4 has output registers to map data 7 of the first memory unit 6 in the form of a mapping from U ^P to Y ^P.
The first storage unit 6, as described above, the fourth element set (Y ^{P, U P)} map data 7 was registered in the form of mapping from U ^P to Y ^P is stored.
^{Incidentally, U, U P1, U P} is first set, Y, ^{Y P} is the second set.

  The overall integration analysis unit 1 includes a control unit 13, a calculation processing unit (first set generation unit) 14, a data acquisition unit 11, a second storage unit 12, and a conversion processing unit 15. When the data acquisition unit 11 acquires the map data 7 from the first storage unit 6, the data acquisition unit 11 stores the acquired map data 7 in the second storage unit 12.

  The process in the overall integrated analysis unit 1 differs depending on whether the map data 7 has been generated or not.

(If map data has already been generated)
The overall integrated analysis unit 1 obtains the control target value wi of the plant model 16 corresponding to the calculation condition i from the outside, and outputs the observation value ηi based on the generated map data 7. Here, the calculation condition i is, for example, a past control condition.

The control unit 13 outputs a control command value di that is a difference between the observation value ηi of the plant model 16 corresponding to the calculation condition i and the control target value wi of the plant model 16 corresponding to the calculation condition i, which is output from the calculation processing unit 14. Is output. When the calculation processing unit 14 acquires the element yi of the map data 7 corresponding to the calculation condition i from the map data 7, the calculation processing unit 14 calculates ui = f (yi, di) using a preset function f (•). To do. The calculation processing unit 14 acquires yi corresponding to ui from the map data 7, and calculates and outputs ηi = s (yi). Thereafter, the control unit 13 and the calculation processing unit 14 repeat these processes.
As the values of ui and yi, ui = current, external force, yi = external force, stress, strain, and the like can be considered. As will be described later, ui and yi are actually shown by graphs, but are not limited to this, and may be predetermined values, matrices, or the like.

(When map data is not generated)
The conversion processing unit 15 is provided with a function g (·) in advance, and when a signal mi related to the calculation condition i (past actual measurement value, simulation result (virtual value), etc.) mi is input, the signal mi is converted to the function g. The converted signal value g (mi) converted at (·) is output to the calculation processing unit 14.

The calculation processing unit 14 calculates ui = h (g (mi), di) based on a preset function h (•). Here, di is a control command value or the like under the calculation condition i output from the control unit 13.
The calculation processing unit 14 refers to the map data 7 and outputs {yi, ui} to the extension processing unit 2 when yi corresponding to ui exists (when yi is known). When yi for ui does not exist (yi is unknown), the calculation processing unit 14 outputs {φ, ui} to the extension processing unit 2. “Φ” indicates that it is empty. That is, the calculation processing unit 14 generates a first set (U) including an element (ui) generated based on an experimental value or a past actual measurement value.

  For all calculation conditions i, the set output to the extension processing unit 2 as {yi, ui} or {φ, ui} is the first element set (Y, U) described above.

[Hardware configuration diagram]
FIG. 2 is a diagram illustrating a hardware configuration example of the map data generation system according to the present embodiment.
The map data generation system Z includes a detailed analysis device 100, an overall integrated analysis device 200, an extended processing device 300, and a database 400.
In the detailed analysis device 100, a program stored in the storage device 103 is expanded in the memory 101 and executed by a CPU (Central Processing Unit) 102, whereby the detailed analysis unit 4 and the data registration unit 5 are realized. Yes. In the detailed analysis apparatus 100, the transmission / reception apparatus 104 transmits / receives data to / from other apparatuses (mainly the database 400 and the extension processing apparatus 300).

In the overall integrated analysis device 200, the program stored in the storage device 203, which is the second storage unit 12 in FIG. 1, is expanded in the memory 201 and executed by the CPU 202. A data acquisition unit 11, a calculation processing unit 14, a conversion processing unit 15, and a control unit 13 constituting the integrated analysis unit 1 are embodied.
In the overall integrated analysis apparatus 200, the transmission / reception apparatus 204 transmits / receives data to / from other apparatuses (mainly the database 400 and the extension processing apparatus 300).

In the extended processing device 300, the program stored in the storage device 303 is expanded in the memory 301 and executed by the CPU 302, thereby realizing the extended processing unit 2 and the thinning-out processing unit 3.
In the extended processing device 300, the transmission / reception device 304 transmits / receives data to / from other devices (mainly the overall integrated analysis device 200 and the detailed analysis device 100).

The database 400 corresponds to the first storage unit 6 in FIG. 1 and stores map data 7.
In addition, since the function of each part 1-5, 11, 13-15 in each apparatus has been demonstrated in FIG. 1, description is abbreviate | omitted here.

[Map data generation processing]
Next, map data generation processing according to the present embodiment will be described with reference to FIGS.

[flowchart]
FIG. 3 is a flowchart showing a procedure of map data generation processing according to the present embodiment, (a) is a flowchart showing a procedure of overall processing, and (b) is a flowchart showing a procedure of second element expansion processing. is there.
Hereinafter, an arbitrary element of the set U including all ui may be referred to as u, and an arbitrary element of the set Y including all yi may be referred to as y. U is a set of elements μ, and y is a set of elements γ. Note that μ is a set for each ui. That is, the element μ generated from ui (with ui as a generation source) and the element μ generated from uj belong to different sets. Hereinafter, unless otherwise specified, μ is assumed to belong to a set generated from a ui that is a generation source. The same applies to γ.

As shown in FIG. 3A, first, the calculation processing unit 14 performs the above-described calculation processing using the signal mi (S101), calculates the first element set (Y, U), and the extension processing unit 2 Hess.
If there is a known y in Y of the first element set (Y, U), the extension processing unit 2 performs a first element extension process for extending u using this known y (S102). The first element expansion process will be described later. Note that step S102 can be omitted.

Next, the extension processing unit 2 applies the first element set (Y, U) calculated in step S101 or the first element set (Y, U) calculated in the first element extension process in step S102. Then, a second element expansion process for expanding u and further expanding the element μ of u is performed (S103), and a second element set (Y, ^UP1 ) is calculated. The second element expansion process will be described later.
Further, the thinning processing unit 3 performs thinning processing for thinning out μ in accordance with a predetermined condition from the second element set (Y, ^UP1 ) calculated as a result of the second element expansion processing (S104). An element set (Y, ^UP ) is calculated. Note that the process of step S104 can be omitted. When the process of step S104 is omitted, the third element set (Y, ^UP ) = the second element set (Y, ^UP1 ).

The detailed analysis unit 4, a third element set (Y, ^{U P)} of the elements of ^{U P;} with (ui Actually mu), a detailed analysis process (S105) that is, ^{U P} All y corresponding to the element u of is calculated. As a result of step S105, a fourth element set (Y ^P , U ^P ) is calculated.
Then, the data registration unit 5, the fourth element set ^{(Y P, U} P) as a mapping from ^{U P} to ^{Y P} in registers map data 7 in the first storage section 6 (S106). Mapping from U ^P to Y ^P is in fact the element μ of any u of the set U ^P, represented by mapping to element γ of y set Y ^P.

(Second element expansion process)
As shown in FIG. 3B, the extension processing unit 2 uses the u extension process (S201) for extending u and the result of step S201 in the second extension process (S102) shown in FIG. Based on this, μ expansion processing (S202) is performed to expand μ which is an element on u. The processing of step S201 and step S202 will be described later.

(Calculation process: S101)
FIG. 4 is a diagram illustrating an example of values output as a result of the calculation processing according to the present embodiment.
As shown in FIG. 4, in the present embodiment, ui is represented by a curve graph. That is, a curve graph ui exists for each calculation condition i.
However, the value obtained as the actual measurement value is the element μj (j = 1,..., P) on the curve graph ui obtained every time Δt. Hereinafter, among all μj, an arbitrary μj may be expressed as μ.
Here, the extension processing unit 2 acquires all μs obtained from the elements u of the set U.

  Here, all the μs obtained from the elements u of the set U are all μj obtained by discretizing ui with the discretization width Δt for all i as shown in FIG. That is, all μs obtained from the elements u of the set U are sets for all i of μj obtained from each element ui.

  Although not shown, the extension processing unit 2 performs the same processing for all γ obtained from the y of the acquired Y. In other words, the expansion processing unit 2 obtains all the known γj, if any, among the values γj obtained by discretizing all elements yi in Y with a discretization width Δt (similar to ui). To do. However, here, all known γj means all currently known γj, and is actually a part of all γj that can exist. Hereinafter, of all γj, an arbitrary γj may be expressed as γ.

  Note that the set Y may be calculated by performing coupled analysis of the detailed analysis unit 4 and the overall integration analysis unit 1 based on a part of μ. That is, based on a part of the elements of μ, the detailed analysis unit 4 and the total integration analysis unit 1 perform a coupled calculation to calculate a part of the element γ of y, and the expansion processing unit 2 calculates γ May be obtained. In this case, a part of μ is selected in order to avoid taking too much time for the coupled calculation.

(First element expansion processing: S102)
5 and 6 are diagrams for explaining in detail the first element expansion processing according to the present embodiment. 5 is the same as FIG. 4.
In the first element expansion processing in step S102 of FIG. 3A, the expansion processing unit 2 performs μ expansion by the method shown in FIGS.
That is, as shown in FIG. 5, the detailed analysis unit 4 and the overall integration analysis unit 1 have u elements μ (here, μ1 to 1) obtained by discretizing ui with the discretization width Δt shown in FIG. A coupled analysis is performed on μ1, μh, and μp−1 which are part of μp), and y elements γ1, γh, and γp-1 corresponding to each μ are calculated. Then, the expansion processing unit 2 calculates the change rate (slope) of γ as shown in FIG. 5 based on the calculated γ1, γh, γp-1 and μ1, μh, μp-1.

  Subsequently, as illustrated in FIG. 6, when the calculated change rate of γ is equal to or greater than a predetermined value, the extension processing unit 2 newly generates at least one μ based on the change rate. Specifically, new μa and μb are set in a section where the change rate of γ is equal to or greater than a predetermined value, added to the set of μs having ui as a generation source, and the set U is redefined. The detailed analysis unit 4 and the overall integration analysis unit 1 may or may not calculate γ (γa, γb) for μa and μb.

  In FIG. 6, the expansion processing unit 2 divides the interval [γ1, γh] of γ where the rate of change in γ is equal to or greater than a predetermined value at equal intervals, and sets the division points as γa and γb. Is sent to the calculation processing unit 14. The calculation processing unit 14 calculates the corresponding μa and μb based on γa and γb, and sends the calculated μa and μb to the extension processing unit 2. Then, the extension processing unit 2 adds the sent μa and μb to the set μ and redefines the set U.

  The expansion processing unit 2 may divide the interval [μ1, μh] of μ in which the change rate of γ is equal to or greater than a predetermined value at equal intervals, and set the division points as μa and μb.

That is, when there is a known element (y) in the set Y (second set) corresponding to the set U (first set), the extension processing unit 2 includes the set Y (second set). Based on the known elements (γa, γb), elements (μa, μb) of the set U (first set) are newly generated. Then, the extension processing unit 2 adds the newly generated elements (μa, μb) to the set U (first set).
More specifically, the expansion processing unit 2 sets the set U (first set) when the change amount of the known element (γa, γb) in the set Y (second set) is equal to or greater than a predetermined value. ) Elements (μa, μb) are newly generated. This generation is performed based on known elements (γa, γb) of the set Y (second set).

As described above, by acquiring a large amount of μ in a section where the change rate of γ is large, it is possible to enrich μ in a section where the change rate of γ is large. Thereby, the element density of the map data 7 in the section where the change rate of γ is large can be increased. As a result, the map data generation system Z can generate highly accurate map data 7 for necessary portions.
As described above, the first element expansion processing described with reference to FIGS. 5 and 6 can be omitted.

(Second element expansion processing: S103)
7 to 10 are diagrams for explaining in detail the procedure of the second element expansion processing according to the present embodiment.
Here, a predetermined one of u in the set U will be described, but the extension processing unit 2 performs the processes described with reference to FIGS. 7 to 10 for all u.

FIG. 7 is a schematic diagram for illustrating an outline of the second element expansion processing. In FIG. 7, ui, ui1, ui2, ui3, ui4, um, un, ii, yy1, yy2, yi3, yy4, ym, yn are graphs as described above, but are shown here as points for convenience. ing.
First, the extension processing unit 2 performs a second operation on ui, um, and un (yi, ym, and yn corresponding to these may be known or unknown) as shown in the upper part of FIG. Perform element expansion processing. As a result, {ui, ui1, ui2, ui3, ui4} obtained by extending ui is generated. Here, as will be described later with reference to FIGS. 8 and 10, the expansion processing unit 2 expands each element μ of the expanded u.

Then, the detailed analysis unit 4 calculates y for u whose corresponding y is unknown among the expanded elements {ui, ui1, ui2, ui3, ui4}, so that {ui, ui1, ui2, ui3 , Ui4} is calculated {yi, yi1, yi2, yi3, yi4}. The calculation of {yi, yi1, yi2, yi3, yi4} is actually performed by calculating the element γ on {yi, yi1, yi2, yi3, yi4}.
The extension processing unit 2 performs the same processing for um and un, but is not shown in FIG. 7 to avoid complication.

In this way, the expanded u (μ) and the set of y (γ) corresponding to the u (μ) become the fourth element set (Y ^P , U ^P ) after the detailed analysis processing or the like. Then, the data registration unit 5 (FIG. 1), start set the ^{U P,} the ^{Y P} to a final set, and registers the mapping ^{U P} → ^{Y P} as map data 7 in the first storage unit 6. Specifically, the map data 7 is a mapping of μ to γ. Note that the thinning processing unit 3 may perform a thinning process as described later on the result output by the extension processing unit 2, but the thinning process is omitted in FIG.

As illustrated in FIG. 8, the expansion processing unit 2 includes a u expansion processing unit 801 that expands u and a μ expansion processing unit 802 that expands μ. Incidentally, the u extension processing unit 801 and the μ extension processing unit 802 are realized by a program stored in the storage device 303 in the extension processing device 300 of FIG. 2 being expanded in the memory 301 and executed by the CPU. Yes.
(U extension processing: S201)
First, u extension processing (S201 in FIG. 3B) by the u extension processing unit 801 will be described. In FIG. 8, as described above, u is shown as a graph, but here it is shown as a point for convenience.

The u extension processing unit 801 generates an arbitrary exponential distribution 811 with ui as an average. The exponential distribution 811 may be any distribution other than the exponential distribution, as long as the frequency near the average is large and the frequency decreases with distance from the average, such as an exponential distribution or a normal distribution.
Here, the u extension processing unit 801 has a reciprocal of the frequency of the exponential distribution 811 as a parameter, and defines a distance function that monotonously increases with respect to this parameter. In other words, the u extension processing unit 801 defines a function in which the distance is short if the frequency in the exponential distribution 811 is large and the distance is long if the frequency is small.

Subsequently, the u extension processing unit 801 arbitrarily sets at least one frequency level 812, and calculates a distance according to the frequency level 812 using the distance function described above. Then, the u extension processing unit 801 generates a plurality of U elements uih located at locations separated from the element ui by the distance described above. The extension processing unit 2 redefines the set U by adding the generated element uih to one of the peripheral elements of the element ui of U.
In this way, the u expansion processing unit 801 defines the periphery of ui according to the frequency of the exponential distribution 811.

FIG. 8 shows an example in which the u extension processing unit 801 newly generates four elements ui1 to ui4 (peripheral elements) around ui from two frequency levels 812. As shown in FIG. 8, the peripheral elements ui1 to ui4 are denser as they are closer to the element ui, and are sparser as they are farther from the element ui.
In FIG. 8, two frequency levels 812 are set, but three or more frequency levels may be set.

Here, the u extension processing will be described more specifically with reference to FIG.
In FIG. 9, a graph indicated by a solid line is a graph indicating ui. And each graph shown with a broken line is a graph which shows ui1-ui4 newly produced | generated. Each graph of ui1 to ui4 is a graph generated according to the exponential distribution 811 with ui as an average by the procedure described in FIG.

(Μ extension processing: S202)
After the u extension processing by the u extension processing unit 801 (S201 in FIG. 3B), the μ extension processing unit 802 performs the μ extension processing (S202 in FIG. 3B) using the result of the u extension processing.
Here, μj is one point on the element ui as shown in FIG. As shown in FIG. 8, the μ extension processing unit 802 generates an arbitrary exponential distribution 821 with μ j as an average. The exponential distribution 821 does not have to be an exponential distribution as long as the average frequency is large and the frequency decreases with increasing distance from the average. Subsequently, the μ extension processing unit 802 has a reciprocal of the frequency of the exponential distribution 821 as a parameter similarly to the u extension processing unit 801, and defines a monotonically increasing distance function for this parameter. Then, the μ extension processing unit 802 arbitrarily sets at least one frequency level 822. Next, the μ extension processing unit 802 calculates a distance according to the frequency level 822 using the distance function described above. Then, a plurality of elements μjh located at a place separated from μj by the distance described above are generated.
The set U is redefined by including these elements μjh in the set of μ.
In this way, the μ expansion processing unit 802 defines the peripheral elements of μj according to the frequency of the exponential distribution 821.

In FIG. 8, the μ expansion processing unit 802 generates _four elements μj _{1 to} μj 4 around the element μj on ui, and newly adds them as peripheral elements of μj. Indicates that it will be redefined.
In FIG. 8, two frequency levels 822 are set, but three or more frequency levels 822 may be set.

A specific example of the μ extension process will be described with reference to FIG. FIG. 10 is an enlarged view of a part of FIG.
First, the μ extension processing unit 802 sets an exponential distribution 821 (FIG. 8) for μj that is an element on ui. Then, the μ extension processing unit 802 generates the peripheral elements μj ₁ to μj ₄ of μj according to the method described in FIG. 8, and adds them to the set of μ. At this time, the μ extension processing unit 802 causes the generated μ j ₁ to μ j ₄ to belong to a set of μ having ui as a generation source. A circle 1001 indicated by a broken line in FIG. 10 indicates an intersection line between the exponential distribution 821 and the frequency level 822 shown in FIG.

Similarly, the μ extension processing unit 802 performs the same process on ui1 to ui4 generated in the u extension process (S201).
As a result, peripheral elements μj1 _{1 to} μj1 ₄ of μj1, peripheral elements μj2 _{1 to} μj2 ₄ of μj2, peripheral elements μj3 _{1 to} μj3 ₄ of μj3, and peripheral elements μj4 _{1 to} μj4 ₄ of μj4 are generated.
As shown in FIG. 10, the peripheral elements μj1 _{1 to} μj1 ₄ , μj2 _{1 to} μj2, μj3 _{1 to} μj3 ₄ , μj4 _{1 to} μj4 ₄ become denser as the elements μj1, μj2, μj3, and μj4 are closer to each other, and the element μj1 , Μj2, μj3, and μj4 become sparse as they move away from each other.
Then, the μ expansion processing unit 802 generates each μ (μj1 _{1 to} μj1 ₄ , μj2 _{1 to} μj2, μj3 _{1 to} μj3 ₄ , μj4 _{1 to} μj4 ₄ ) generated by the μ expansion processing as a generation source u. Add to the set of μs generated from. For example, μj1 _{1 to} μj1 ₄ are added to the set of μ generated from ui1. Similarly, μj2 _{1 to} μj2 are added to the set of μ generated from ui2. The same applies to μj3 _{1 to} μj3 ₄ and μj4 _{1 to} μj4 ₄ .

  In this way, the accuracy of the map data 7 with respect to the vicinity of the information related to the predetermined calculation condition is increased by making the peripheral elements denser as they are closer to the elements and sparser as they move away from the elements. In this way, efficient generation of map data 7 is possible.

Hereinafter, the set of u generated in this way is referred to as U ¹ , and the set of μ is referred to as N ¹ . Note that the set of μs here is a set of μs generated from all u.
Subsequently, the extension processing unit 2 calculates the union of U ¹ and N ¹ . This union becomes a set of μ on each ui and its peripheral elements uih, ui, and uih. This union is ^UP1 in FIG. Then, the extension processing unit 2 sends the union UP ¹ to the thinning processing unit 3. A combination of the union set U ^P1 and the set Y of y acquired from the overall integration analysis by the extension processing unit 2 is the second element set (Y, U ^P1 ) in FIG.
As described above, the expansion processing unit 2 uses the peripheral elements (ui1 to ui4) that are the peripheral elements of the elements based on a predetermined condition for each element (u, μ) in the set U (first set). μj1 _{1 to} μj1 ₄ , μj2 _{1 to} μj2, μj3 _{1 to} μj3 ₄ , μj4 _{1 to} μj4 ₄ ) are generated. Thereafter, the extension processing unit 2 adds the peripheral elements to the set U (first element) as elements of the set U (first set).

(Thinning process: S104)
FIG. 11 is a diagram illustrating a specific example of the thinning process according to the present embodiment.
The thinning processing unit 3 performs a thinning process for thinning a predetermined element from μ in the union UP ¹ output from the expansion processing unit 2.
The thinning processing unit 3 defines, for example, a threshold regarding the mutual distance between elements in μ. In the thinning-out process, μ is thinned out so that the mutual distance of μ is equal to or greater than the threshold value. That is, the thinning processing unit 3 defines a distance between the μs, and deletes μs whose distances are equal to or less than a threshold value. In short, the thinning processing unit 3 deletes μ according to a predetermined condition.

As another example of the thinning-out process, μ may be thinned out so that μ within a predetermined range is a predetermined number or less.
In the example of FIG. 11, the thinning-out processing unit 3 sets μj2 ₂ , μj ₁ , μj ₄ , μj3 ₃ (marked with “x” in FIG. This is an example of thinning out the elements.
In this embodiment, μ is deleted, but not limited to this, u may also be deleted.

Thinning processing unit 3, the set ^{U P} by u and μ subjected to thinning processing, and outputs with a set Y (third element set in FIG. ^{1 (Y, U P))} . That is, the thinning processing unit 3 thins out the elements (u, μ) of the first set from the set ^UP1 (first set) to which the peripheral elements are added according to a predetermined condition.
Thus, by performing the thinning processing by the thinning processing unit 3, it is possible to avoid that the element density of the set U ^p to be used in detailed analysis unit 4 definitive detailed analysis is higher than necessary. Thereby, the map data generation system Z can make the calculation cost of the detailed analysis part 4 appropriate.

(Detailed analysis processing: S105)
Detailed analysis unit 4, for each mu in the set U ^P, perform detailed analysis, to calculate all the γ corresponding to each mu. Set that contains all the γ calculated in detailed analysis process is a Y ^P in FIG. Since detailed analysis is a known technique, detailed description is omitted here. As a result, the element set U ^P output from the thinning-out processing unit 3, the fourth element set (Y ^{P, U P)} that combined the element set Y ^P which detailed analysis unit 4 has been calculated is outputted.
In other words, detailed analysis unit 4, based on the set ^{U P} (first set of) to produce a second set corresponding to the set ^{U P} (first set of) ^{(Y P)}

(Data registration process: S106)
Then, the data registration unit 5 start set the U ^P, as mapping of the Y ^P a final set, and registers the map data 7 in the first storage unit 6. Specifically, the mapping of μ to γ is registered in the first storage unit 6 as map data 7.

To summarize the above processing, the overall integration analysis unit 1 in the map data generation system Z according to the embodiment of the present invention calculates the information mi (experimental values, past performance values, simulation results, etc.) related to a plurality of calculation conditions i. One element set (Y, U) is calculated. Then, the expansion processing unit 2 adds elements using a probability distribution that becomes coarser as the distance from the average increases, for each element of the first element set (Y, U). ^UP1 ) is generated. Then, the thinning processing unit ^3, by decimating the elements of ^{U P1,} and generates a third element set (Y, ^{U P).} Subsequently, detailed analysis unit 4, a third element set (Y, ^{U P)} based on, perform detailed analysis, the fourth element set as the detailed analysis result ^{(Y P, U} P) is calculated. Then, the data registration unit 5, the start set of U ^P, Y ^P and registers the mapping to a final set as map data 7, i.e., the data registration unit 5, the set from a set U ^{P (first} set of) Y The mapping to ^P (second set) is registered in the first storage unit 6 as map data.

  By doing in this way, map data 7 about the neighborhood of the actually used value is generated based on the actual actual value, the experimental value (mi), and the simulation result, and the place where the possibility of using it is low The generation of the map data 7 can be omitted. Thereby, the load at the time of map data 7 production | generation can be reduced.

  Further, the map data generation system Z in the present embodiment grasps the outline of the change in y (γ) as shown in FIGS. 5 and 6 and increases the density of the map data 7 in the section where the change rate is high. Thereby, the map data generation system Z can increase the element density of the map data 7 in the section where the change rate of γ is large, and can generate the map data 7 with high accuracy for the necessary portion. Become.

(Another embodiment example)
FIG. 12 is a diagram illustrating another example according to the present embodiment.
In this embodiment, as shown in FIG. 10, the μ expansion processing unit 802 adds two peripheral elements of μ at each intersection of the exponential distribution 821 (FIG. 8) and the frequency level 822 (FIG. 8). Although acquired, you may acquire four each as shown in FIG.
Further, the number is not limited to four, and may be one, three, five or more.
In the present embodiment, the map data 7 is used as the correspondence information, but a table, a function, or the like may be used in addition to this.

  In addition, this invention is not limited to above-described embodiment, Various modifications are included. For example, the above-described embodiment has been described in detail for easy understanding of the present invention, and is not necessarily limited to having all the configurations described. In addition, a part of the configuration of a certain embodiment can be replaced with the configuration of another embodiment, and the configuration of another embodiment can be added to the configuration of a certain embodiment. In addition, it is possible to add, delete, and replace other configurations for a part of the configuration of each embodiment.

In addition, each of the above-described configurations and functions, the respective units 1 to 5, 11, 13 to 15, the first storage unit 6, the second storage unit 12, and the like are designed, for example, by using an integrated circuit for a part or all of them. May be realized by hardware. Each of the above-described configurations, functions, and the like may be realized by software by interpreting and executing a program that realizes each function by a processor such as the CPUs 102, 202, and 302 (FIG. 2). In addition to storing information such as programs, tables, and files for realizing each function in an HD (Hard Disk), recording devices such as memories 101, 201, 301 (FIG. 2), SSD (Solid State Drive), Alternatively, it can be stored in a recording medium such as an IC (Integrated Circuit) card, an SD (Secure Digital) card, or a DVD (Digital Versatile Disc).
In each embodiment, control lines and information lines are those that are considered necessary for explanation, and not all control lines and information lines on the product are necessarily shown. In practice, it can be considered that almost all configurations are connected to each other.

1 Overall integration analysis unit (first set generation unit)
2 Extended processing unit 3 Thinning processing unit 4 Detailed analysis unit (second set generation unit)
5 Data registration department (registration department)
6 First storage unit (storage unit)
7 Map data (corresponding information)
11 data acquisition unit 12 second storage unit 13 control unit 14 calculation processing unit (first set generation unit)
15 Conversion processing unit Z Map data generation system (corresponding information generation system)

Claims (10)

A first set generation unit that generates a first set including elements generated based on information related to a predetermined calculation condition;
For each element in the first set, a peripheral element that is a peripheral element of the element is generated based on a predetermined condition, and the peripheral element is set as the element of the first set, and the first element An extended processing unit to be added to
A second set generation unit that generates a second set corresponding to the first set based on the first set;
A registration unit that registers a mapping from the first set to the second set in the storage unit as correspondence information;
A correspondence information generation system characterized by comprising: The correspondence information generation system according to claim 1, wherein the peripheral element is denser as it is closer to the element and sparser as it is farther from the element. The correspondence information generating system according to claim 1, wherein the information related to the predetermined calculation condition is an experimental value, a past actual measurement value, or a virtual value corresponding to the predetermined calculation condition. The extension processing unit
In the second set corresponding to the first set, when there is a known element, when the amount of change of the known element in the second set is equal to or greater than a predetermined value, the second set The correspondence information generation system according to claim 1, wherein an element of the first set is newly generated based on a known element of the set. A thinning-out processing unit that thins out the elements of the first set according to a predetermined condition from the first set to which the peripheral elements are added.
The correspondence information generation system according to claim 1, further comprising: A correspondence information generation system that generates correspondence information to be referred to when the calculation unit performs calculation,
Generating a first set including elements generated based on information related to a predetermined calculation condition;
For the elements in the first set, based on a predetermined condition, generate peripheral elements that are peripheral elements of the elements,
Adding the peripheral element to the first element as an element of the first set;
Generating a second set corresponding to the first set based on the first set;
A mapping from the first set to the second set is registered in the storage unit as correspondence information. The correspondence information generation method according to claim 6, wherein the peripheral element is denser as it is closer to the element and sparser as it is farther from the element. The correspondence information generating method according to claim 6, wherein the information related to the predetermined calculation condition is an experimental value, a past actual measurement value, or a virtual value corresponding to the predetermined calculation condition. The correspondence information generation system includes:
In the second set corresponding to the first set, when there is a known element, when the amount of change of the known element in the second set is equal to or greater than a predetermined value, the second set The correspondence information generation method according to claim 6, wherein an element of the first set is newly generated based on a known element of the set. The correspondence information generation system includes:
The correspondence information generation method according to claim 6, further comprising: thinning out elements of the first set from the first set to which the peripheral elements are added according to a predetermined condition.

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