JPS649656A - Bipolar transistor - Google Patents

Bipolar transistor

Info

Publication number
JPS649656A
JPS649656A JP16400787A JP16400787A JPS649656A JP S649656 A JPS649656 A JP S649656A JP 16400787 A JP16400787 A JP 16400787A JP 16400787 A JP16400787 A JP 16400787A JP S649656 A JPS649656 A JP S649656A
Authority
JP
Japan
Prior art keywords
base
xas
base layer
type impurity
room temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16400787A
Other languages
Japanese (ja)
Inventor
Akio Furukawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP16400787A priority Critical patent/JPS649656A/en
Publication of JPS649656A publication Critical patent/JPS649656A/en
Pending legal-status Critical Current

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  • Bipolar Transistors (AREA)

Abstract

PURPOSE:To accelerate an NPN type transistor whose base resistance is several times smaller compared with conventional ones subject to the same base layer thickness and P-type impurity concentration of the base by providing the transistor with a strain superlattice structured base layer. CONSTITUTION:A strain superlattice is led in a base layer 2. For example, In0.52Al0.48As is used for an emitter 1 and a collector 3 as semiconductor material while In0.53+xGa0.47-xAs and In0.53-xGa0.47+xAs (x=0.15) are used for a base 2 and respective elements 1, 2 and 3 are alternately laminated in thickness of 200Angstrom to dope P type impurity such as berillium etc. Here, the compressive force is given to an In0.35+xGa0.47-xAs layer to increase the hole mobility assuming x=0.15 instead of x=0 up to four times at the room temperature and ten times at 77K. Thus, subject to the same base layer thickness and the P type impurity concentration, the base resistance can be reduced down to 1/2 at the room temperature and 1/5 at 77K compared with the conventional base resistance enabling high speed transistors to be manufactured.
JP16400787A 1987-07-02 1987-07-02 Bipolar transistor Pending JPS649656A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16400787A JPS649656A (en) 1987-07-02 1987-07-02 Bipolar transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16400787A JPS649656A (en) 1987-07-02 1987-07-02 Bipolar transistor

Publications (1)

Publication Number Publication Date
JPS649656A true JPS649656A (en) 1989-01-12

Family

ID=15784993

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16400787A Pending JPS649656A (en) 1987-07-02 1987-07-02 Bipolar transistor

Country Status (1)

Country Link
JP (1) JPS649656A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6737684B1 (en) 1998-02-20 2004-05-18 Matsushita Electric Industrial Co., Ltd. Bipolar transistor and semiconductor device
WO2005053030A1 (en) * 2003-11-20 2005-06-09 Qinetiq Limited Strained semiconductor devices
CN103180490A (en) * 2010-11-02 2013-06-26 日本碍子株式会社 Crystal production method
US10086168B2 (en) 2016-08-19 2018-10-02 Sarah L. Olson External catheter stabilizer
KR102024463B1 (en) 2018-03-19 2019-09-23 연세대학교 산학협력단 Large area transfer method of transition metal dichalcogenides
USD876621S1 (en) 2017-08-18 2020-02-25 Sarah L. Olson External catheter stabilizer

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61150373A (en) * 1984-12-25 1986-07-09 Nec Corp Bipolar transistor with low threshold voltage

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61150373A (en) * 1984-12-25 1986-07-09 Nec Corp Bipolar transistor with low threshold voltage

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6737684B1 (en) 1998-02-20 2004-05-18 Matsushita Electric Industrial Co., Ltd. Bipolar transistor and semiconductor device
WO2005053030A1 (en) * 2003-11-20 2005-06-09 Qinetiq Limited Strained semiconductor devices
CN103180490A (en) * 2010-11-02 2013-06-26 日本碍子株式会社 Crystal production method
US10086168B2 (en) 2016-08-19 2018-10-02 Sarah L. Olson External catheter stabilizer
US11684754B2 (en) 2016-08-19 2023-06-27 Levity Products, Inc. Method of stabilizing catheter tube using stabilizing device
USD876621S1 (en) 2017-08-18 2020-02-25 Sarah L. Olson External catheter stabilizer
KR102024463B1 (en) 2018-03-19 2019-09-23 연세대학교 산학협력단 Large area transfer method of transition metal dichalcogenides

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