JPS649342A - Pulsed excitation of semiconductor laser beam source - Google Patents
Pulsed excitation of semiconductor laser beam sourceInfo
- Publication number
- JPS649342A JPS649342A JP16581987A JP16581987A JPS649342A JP S649342 A JPS649342 A JP S649342A JP 16581987 A JP16581987 A JP 16581987A JP 16581987 A JP16581987 A JP 16581987A JP S649342 A JPS649342 A JP S649342A
- Authority
- JP
- Japan
- Prior art keywords
- pulse
- counter
- signal
- supplied
- rom
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
- Semiconductor Lasers (AREA)
Abstract
PURPOSE:To enable the execution of stable modulation by a simple construction, by varying a pulse interval of a driving pulse current. CONSTITUTION:A clock pulse of high frequency taken out of a quartz oscillator 8 is supplied to a counter 9 and counted therein. This counter 9 supplies a pulse of a prescribed width as a trigger signal to a pulse power source 3 every time when counting the clock pulse by the value of pulse interval data obtained from ROM 7, and also supplies a count pulse one by one to a cycle counter 10 so as to increment the counter 10. Besides, the pulse interval data supplied from ROM 7 to the counter 9 are renewed to subsequent data every time when the trigger signal is outputted from the counter 9. A laser light emitted from a laser diode 6 is transmitted through a gas atmosphere in a gas cell 13 and made to enter a photodetector 14, and it is supplied therefrom to a signal processing circuit 15. Moreover, the circuit 15 samples the signal from the detector 14, detects a differential signal by harmonic synchronism detection and compares same with a calibration value, and thus the concentration of gas can be detected.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16581987A JPS649342A (en) | 1987-07-01 | 1987-07-01 | Pulsed excitation of semiconductor laser beam source |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16581987A JPS649342A (en) | 1987-07-01 | 1987-07-01 | Pulsed excitation of semiconductor laser beam source |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS649342A true JPS649342A (en) | 1989-01-12 |
Family
ID=15819599
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16581987A Pending JPS649342A (en) | 1987-07-01 | 1987-07-01 | Pulsed excitation of semiconductor laser beam source |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS649342A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04326041A (en) * | 1991-04-26 | 1992-11-16 | Tokyo Gas Co Ltd | Gas concentration measuring method and device |
JP2009222526A (en) * | 2008-03-14 | 2009-10-01 | Mitsubishi Heavy Ind Ltd | Gas concentration measuring method and apparatus |
JP2013096839A (en) * | 2011-11-01 | 2013-05-20 | Fuji Electric Co Ltd | Laser gas analyzer |
US20130135619A1 (en) * | 2011-11-28 | 2013-05-30 | Yokogawa Electric Corporation | Laser gas analyzer |
JP2018096974A (en) * | 2016-12-15 | 2018-06-21 | 株式会社堀場製作所 | Analysis device, analysis device program and analysis method |
-
1987
- 1987-07-01 JP JP16581987A patent/JPS649342A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04326041A (en) * | 1991-04-26 | 1992-11-16 | Tokyo Gas Co Ltd | Gas concentration measuring method and device |
JP2009222526A (en) * | 2008-03-14 | 2009-10-01 | Mitsubishi Heavy Ind Ltd | Gas concentration measuring method and apparatus |
JP2013096839A (en) * | 2011-11-01 | 2013-05-20 | Fuji Electric Co Ltd | Laser gas analyzer |
US20130135619A1 (en) * | 2011-11-28 | 2013-05-30 | Yokogawa Electric Corporation | Laser gas analyzer |
US9347877B2 (en) * | 2011-11-28 | 2016-05-24 | Yokogawa Electric Corporation | Laser gas analyzer |
JP2018096974A (en) * | 2016-12-15 | 2018-06-21 | 株式会社堀場製作所 | Analysis device, analysis device program and analysis method |
US10605726B2 (en) | 2016-12-15 | 2020-03-31 | Horiba, Ltd. | Analysis apparatus, program for analysis apparatus, and analysis method |
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