JPS649342A - Pulsed excitation of semiconductor laser beam source - Google Patents

Pulsed excitation of semiconductor laser beam source

Info

Publication number
JPS649342A
JPS649342A JP16581987A JP16581987A JPS649342A JP S649342 A JPS649342 A JP S649342A JP 16581987 A JP16581987 A JP 16581987A JP 16581987 A JP16581987 A JP 16581987A JP S649342 A JPS649342 A JP S649342A
Authority
JP
Japan
Prior art keywords
pulse
counter
signal
supplied
rom
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16581987A
Other languages
Japanese (ja)
Inventor
Iwao Sugiyama
Akira Sawada
Shoji Doi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP16581987A priority Critical patent/JPS649342A/en
Publication of JPS649342A publication Critical patent/JPS649342A/en
Pending legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To enable the execution of stable modulation by a simple construction, by varying a pulse interval of a driving pulse current. CONSTITUTION:A clock pulse of high frequency taken out of a quartz oscillator 8 is supplied to a counter 9 and counted therein. This counter 9 supplies a pulse of a prescribed width as a trigger signal to a pulse power source 3 every time when counting the clock pulse by the value of pulse interval data obtained from ROM 7, and also supplies a count pulse one by one to a cycle counter 10 so as to increment the counter 10. Besides, the pulse interval data supplied from ROM 7 to the counter 9 are renewed to subsequent data every time when the trigger signal is outputted from the counter 9. A laser light emitted from a laser diode 6 is transmitted through a gas atmosphere in a gas cell 13 and made to enter a photodetector 14, and it is supplied therefrom to a signal processing circuit 15. Moreover, the circuit 15 samples the signal from the detector 14, detects a differential signal by harmonic synchronism detection and compares same with a calibration value, and thus the concentration of gas can be detected.
JP16581987A 1987-07-01 1987-07-01 Pulsed excitation of semiconductor laser beam source Pending JPS649342A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16581987A JPS649342A (en) 1987-07-01 1987-07-01 Pulsed excitation of semiconductor laser beam source

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16581987A JPS649342A (en) 1987-07-01 1987-07-01 Pulsed excitation of semiconductor laser beam source

Publications (1)

Publication Number Publication Date
JPS649342A true JPS649342A (en) 1989-01-12

Family

ID=15819599

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16581987A Pending JPS649342A (en) 1987-07-01 1987-07-01 Pulsed excitation of semiconductor laser beam source

Country Status (1)

Country Link
JP (1) JPS649342A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04326041A (en) * 1991-04-26 1992-11-16 Tokyo Gas Co Ltd Gas concentration measuring method and device
JP2009222526A (en) * 2008-03-14 2009-10-01 Mitsubishi Heavy Ind Ltd Gas concentration measuring method and apparatus
JP2013096839A (en) * 2011-11-01 2013-05-20 Fuji Electric Co Ltd Laser gas analyzer
US20130135619A1 (en) * 2011-11-28 2013-05-30 Yokogawa Electric Corporation Laser gas analyzer
JP2018096974A (en) * 2016-12-15 2018-06-21 株式会社堀場製作所 Analysis device, analysis device program and analysis method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04326041A (en) * 1991-04-26 1992-11-16 Tokyo Gas Co Ltd Gas concentration measuring method and device
JP2009222526A (en) * 2008-03-14 2009-10-01 Mitsubishi Heavy Ind Ltd Gas concentration measuring method and apparatus
JP2013096839A (en) * 2011-11-01 2013-05-20 Fuji Electric Co Ltd Laser gas analyzer
US20130135619A1 (en) * 2011-11-28 2013-05-30 Yokogawa Electric Corporation Laser gas analyzer
US9347877B2 (en) * 2011-11-28 2016-05-24 Yokogawa Electric Corporation Laser gas analyzer
JP2018096974A (en) * 2016-12-15 2018-06-21 株式会社堀場製作所 Analysis device, analysis device program and analysis method
US10605726B2 (en) 2016-12-15 2020-03-31 Horiba, Ltd. Analysis apparatus, program for analysis apparatus, and analysis method

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