JPS6427231A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS6427231A
JPS6427231A JP16424187A JP16424187A JPS6427231A JP S6427231 A JPS6427231 A JP S6427231A JP 16424187 A JP16424187 A JP 16424187A JP 16424187 A JP16424187 A JP 16424187A JP S6427231 A JPS6427231 A JP S6427231A
Authority
JP
Japan
Prior art keywords
substrate
rear face
excimer laser
melted
front surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16424187A
Other languages
Japanese (ja)
Inventor
Kazumi Takemura
Fumitoshi Toyokawa
Masao Mikami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP16424187A priority Critical patent/JPS6427231A/en
Publication of JPS6427231A publication Critical patent/JPS6427231A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To eliminate the contamination of a substrate surface with fine particles and to prevent it from warping or cracking without necessity of a high temperature heat treatment and protection of the substrate surface by providing the steps of irradiating the rear face of the substrate to be formed with an element on its front surface with excimer laser and heat-treating the substrate. CONSTITUTION:The rear surface of a substrate 11 is irradiated with an excimer laser 12, the front surface is then mirror-polished to obtain a substrate 13. The energy of the laser 12 is substantially absorbed to the vicinity of the surface of the rear face of the substrate 11, and the shallow region of the front surface of the substrate is melted. The melted part is rapidly solidified to become a laser beam-like shape melted mark 14 in the vicinity of the surface of the rear face of the substrate 11 to form a distortion field for causing a gettering. Then, elements, such as a transistor and a diode, are formed on the mirror-polished surface of the substrate 13. Thus, since excimer laser light is not introduced deeply into silicon, the mark 14 is formed in a shallow depth. Thus, it prevents the substrate from warping or cracking.
JP16424187A 1986-06-30 1987-06-30 Manufacture of semiconductor device Pending JPS6427231A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16424187A JPS6427231A (en) 1986-06-30 1987-06-30 Manufacture of semiconductor device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP15437286 1986-06-30
JP16424187A JPS6427231A (en) 1986-06-30 1987-06-30 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS6427231A true JPS6427231A (en) 1989-01-30

Family

ID=26482671

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16424187A Pending JPS6427231A (en) 1986-06-30 1987-06-30 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS6427231A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100348342B1 (en) * 1995-07-25 2002-11-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 Laser annealing method and apparatus
JP2007031849A (en) * 2005-07-22 2007-02-08 Cnj Japan:Kk Laminated sheet for human body
JP2007237503A (en) * 2006-03-07 2007-09-20 Japan Vilene Co Ltd Cover tape material
JP2008221816A (en) * 2007-03-16 2008-09-25 Japan Vilene Co Ltd Covering tape material
JP2011082470A (en) * 2009-09-11 2011-04-21 Tokyo Seimitsu Co Ltd Method for processing wafer and wafer processing apparatus
JP2012049397A (en) * 2010-08-27 2012-03-08 Sumco Corp Method of manufacturing silicon wafer
JP2014175421A (en) * 2013-03-07 2014-09-22 Japan Steel Works Ltd:The Gettering semiconductor wafer and manufacturing method thereof
US10475663B2 (en) 2012-10-02 2019-11-12 Mitsubishi Electric Corporation Semiconductor device and method for manufacturing semiconductor device

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5352355A (en) * 1976-10-25 1978-05-12 Hitachi Ltd Impurity gettering method
JPS57155726A (en) * 1981-03-20 1982-09-25 Fujitsu Ltd Manufacture of semiconductor device
JPS58197717A (en) * 1982-05-13 1983-11-17 Toshiba Corp Preparation of semiconductor device
JPS59108322A (en) * 1982-12-13 1984-06-22 Fujitsu Ltd Semiconductor wafer
JPS60217672A (en) * 1984-04-13 1985-10-31 Hitachi Ltd Manufacture of solar cell
JPS6175528A (en) * 1984-09-20 1986-04-17 Nec Corp Si surface processing by irradiation of multiple laser beam

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5352355A (en) * 1976-10-25 1978-05-12 Hitachi Ltd Impurity gettering method
JPS57155726A (en) * 1981-03-20 1982-09-25 Fujitsu Ltd Manufacture of semiconductor device
JPS58197717A (en) * 1982-05-13 1983-11-17 Toshiba Corp Preparation of semiconductor device
JPS59108322A (en) * 1982-12-13 1984-06-22 Fujitsu Ltd Semiconductor wafer
JPS60217672A (en) * 1984-04-13 1985-10-31 Hitachi Ltd Manufacture of solar cell
JPS6175528A (en) * 1984-09-20 1986-04-17 Nec Corp Si surface processing by irradiation of multiple laser beam

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7452788B2 (en) 1995-07-25 2008-11-18 Semiconductor Energy Laboratory Co., Ltd. Method of laser annealing using linear beam having quasi-trapezoidal energy profile for increased depth of focus
US6524977B1 (en) 1995-07-25 2003-02-25 Semiconductor Energy Laboratory Co., Ltd. Method of laser annealing using linear beam having quasi-trapezoidal energy profile for increased depth of focus
KR100388731B1 (en) * 1995-07-25 2003-06-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 Method of manufacturing a semiconductor device
US7303980B2 (en) 1995-07-25 2007-12-04 Semiconductor Energy Laboratory Co., Ltd. Laser annealing method and apparatus
KR100348342B1 (en) * 1995-07-25 2002-11-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 Laser annealing method and apparatus
JP2007031849A (en) * 2005-07-22 2007-02-08 Cnj Japan:Kk Laminated sheet for human body
JP2007237503A (en) * 2006-03-07 2007-09-20 Japan Vilene Co Ltd Cover tape material
JP2008221816A (en) * 2007-03-16 2008-09-25 Japan Vilene Co Ltd Covering tape material
JP2011082470A (en) * 2009-09-11 2011-04-21 Tokyo Seimitsu Co Ltd Method for processing wafer and wafer processing apparatus
JP2012049397A (en) * 2010-08-27 2012-03-08 Sumco Corp Method of manufacturing silicon wafer
US10475663B2 (en) 2012-10-02 2019-11-12 Mitsubishi Electric Corporation Semiconductor device and method for manufacturing semiconductor device
US10950461B2 (en) 2012-10-02 2021-03-16 Mitsubishi Electric Corporation Method for manufacturing semiconductor device
JP2014175421A (en) * 2013-03-07 2014-09-22 Japan Steel Works Ltd:The Gettering semiconductor wafer and manufacturing method thereof

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