JPS6427231A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS6427231A JPS6427231A JP16424187A JP16424187A JPS6427231A JP S6427231 A JPS6427231 A JP S6427231A JP 16424187 A JP16424187 A JP 16424187A JP 16424187 A JP16424187 A JP 16424187A JP S6427231 A JPS6427231 A JP S6427231A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- rear face
- excimer laser
- melted
- front surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE:To eliminate the contamination of a substrate surface with fine particles and to prevent it from warping or cracking without necessity of a high temperature heat treatment and protection of the substrate surface by providing the steps of irradiating the rear face of the substrate to be formed with an element on its front surface with excimer laser and heat-treating the substrate. CONSTITUTION:The rear surface of a substrate 11 is irradiated with an excimer laser 12, the front surface is then mirror-polished to obtain a substrate 13. The energy of the laser 12 is substantially absorbed to the vicinity of the surface of the rear face of the substrate 11, and the shallow region of the front surface of the substrate is melted. The melted part is rapidly solidified to become a laser beam-like shape melted mark 14 in the vicinity of the surface of the rear face of the substrate 11 to form a distortion field for causing a gettering. Then, elements, such as a transistor and a diode, are formed on the mirror-polished surface of the substrate 13. Thus, since excimer laser light is not introduced deeply into silicon, the mark 14 is formed in a shallow depth. Thus, it prevents the substrate from warping or cracking.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16424187A JPS6427231A (en) | 1986-06-30 | 1987-06-30 | Manufacture of semiconductor device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15437286 | 1986-06-30 | ||
JP16424187A JPS6427231A (en) | 1986-06-30 | 1987-06-30 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6427231A true JPS6427231A (en) | 1989-01-30 |
Family
ID=26482671
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16424187A Pending JPS6427231A (en) | 1986-06-30 | 1987-06-30 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6427231A (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100348342B1 (en) * | 1995-07-25 | 2002-11-23 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | Laser annealing method and apparatus |
JP2007031849A (en) * | 2005-07-22 | 2007-02-08 | Cnj Japan:Kk | Laminated sheet for human body |
JP2007237503A (en) * | 2006-03-07 | 2007-09-20 | Japan Vilene Co Ltd | Cover tape material |
JP2008221816A (en) * | 2007-03-16 | 2008-09-25 | Japan Vilene Co Ltd | Covering tape material |
JP2011082470A (en) * | 2009-09-11 | 2011-04-21 | Tokyo Seimitsu Co Ltd | Method for processing wafer and wafer processing apparatus |
JP2012049397A (en) * | 2010-08-27 | 2012-03-08 | Sumco Corp | Method of manufacturing silicon wafer |
JP2014175421A (en) * | 2013-03-07 | 2014-09-22 | Japan Steel Works Ltd:The | Gettering semiconductor wafer and manufacturing method thereof |
US10475663B2 (en) | 2012-10-02 | 2019-11-12 | Mitsubishi Electric Corporation | Semiconductor device and method for manufacturing semiconductor device |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5352355A (en) * | 1976-10-25 | 1978-05-12 | Hitachi Ltd | Impurity gettering method |
JPS57155726A (en) * | 1981-03-20 | 1982-09-25 | Fujitsu Ltd | Manufacture of semiconductor device |
JPS58197717A (en) * | 1982-05-13 | 1983-11-17 | Toshiba Corp | Preparation of semiconductor device |
JPS59108322A (en) * | 1982-12-13 | 1984-06-22 | Fujitsu Ltd | Semiconductor wafer |
JPS60217672A (en) * | 1984-04-13 | 1985-10-31 | Hitachi Ltd | Manufacture of solar cell |
JPS6175528A (en) * | 1984-09-20 | 1986-04-17 | Nec Corp | Si surface processing by irradiation of multiple laser beam |
-
1987
- 1987-06-30 JP JP16424187A patent/JPS6427231A/en active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5352355A (en) * | 1976-10-25 | 1978-05-12 | Hitachi Ltd | Impurity gettering method |
JPS57155726A (en) * | 1981-03-20 | 1982-09-25 | Fujitsu Ltd | Manufacture of semiconductor device |
JPS58197717A (en) * | 1982-05-13 | 1983-11-17 | Toshiba Corp | Preparation of semiconductor device |
JPS59108322A (en) * | 1982-12-13 | 1984-06-22 | Fujitsu Ltd | Semiconductor wafer |
JPS60217672A (en) * | 1984-04-13 | 1985-10-31 | Hitachi Ltd | Manufacture of solar cell |
JPS6175528A (en) * | 1984-09-20 | 1986-04-17 | Nec Corp | Si surface processing by irradiation of multiple laser beam |
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7452788B2 (en) | 1995-07-25 | 2008-11-18 | Semiconductor Energy Laboratory Co., Ltd. | Method of laser annealing using linear beam having quasi-trapezoidal energy profile for increased depth of focus |
US6524977B1 (en) | 1995-07-25 | 2003-02-25 | Semiconductor Energy Laboratory Co., Ltd. | Method of laser annealing using linear beam having quasi-trapezoidal energy profile for increased depth of focus |
KR100388731B1 (en) * | 1995-07-25 | 2003-06-25 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | Method of manufacturing a semiconductor device |
US7303980B2 (en) | 1995-07-25 | 2007-12-04 | Semiconductor Energy Laboratory Co., Ltd. | Laser annealing method and apparatus |
KR100348342B1 (en) * | 1995-07-25 | 2002-11-23 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | Laser annealing method and apparatus |
JP2007031849A (en) * | 2005-07-22 | 2007-02-08 | Cnj Japan:Kk | Laminated sheet for human body |
JP2007237503A (en) * | 2006-03-07 | 2007-09-20 | Japan Vilene Co Ltd | Cover tape material |
JP2008221816A (en) * | 2007-03-16 | 2008-09-25 | Japan Vilene Co Ltd | Covering tape material |
JP2011082470A (en) * | 2009-09-11 | 2011-04-21 | Tokyo Seimitsu Co Ltd | Method for processing wafer and wafer processing apparatus |
JP2012049397A (en) * | 2010-08-27 | 2012-03-08 | Sumco Corp | Method of manufacturing silicon wafer |
US10475663B2 (en) | 2012-10-02 | 2019-11-12 | Mitsubishi Electric Corporation | Semiconductor device and method for manufacturing semiconductor device |
US10950461B2 (en) | 2012-10-02 | 2021-03-16 | Mitsubishi Electric Corporation | Method for manufacturing semiconductor device |
JP2014175421A (en) * | 2013-03-07 | 2014-09-22 | Japan Steel Works Ltd:The | Gettering semiconductor wafer and manufacturing method thereof |
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