JPS6415673A - Product inspection expert system - Google Patents

Product inspection expert system

Info

Publication number
JPS6415673A
JPS6415673A JP62171433A JP17143387A JPS6415673A JP S6415673 A JPS6415673 A JP S6415673A JP 62171433 A JP62171433 A JP 62171433A JP 17143387 A JP17143387 A JP 17143387A JP S6415673 A JPS6415673 A JP S6415673A
Authority
JP
Japan
Prior art keywords
measuring
data
data base
retrieves
measure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62171433A
Other languages
Japanese (ja)
Inventor
Akihide Hara
Takeshi Kamogawa
Yoshiaki Goto
Hiroaki Unno
Shu Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP62171433A priority Critical patent/JPS6415673A/en
Publication of JPS6415673A publication Critical patent/JPS6415673A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To repair a product technically even by a person having no rich experience, by retrieving the measuring device and measuring method of the substrate corresponding to an inferior phenomenon and the circuit constitution data of the substrate to display the same. CONSTITUTION:When an electric product is inspected and an inferior phenomenon is inputted to a keyboard 8 by a key. The first inference mechanisms 2 retrieves the interior of an inferior phenomenon data base 4 to read the measure corresponding to the inferior phenomenon and next retrieves a measure data base 5 to retrieve and read the substrate No., coordinates, measuring deice or repairing tool No. and measuring or repairing method No. corresponding to said measure. The second control part 11 of a host M retrieves a CAD data base, a measuring device data base 13 and a measuring data base 14 from the receiving data to read circuit constitution data, the name of the measuring device and the measuring method. These data are returned to a terminal through communication devices 9, 10 to be displayed on a CRT display 7.
JP62171433A 1987-07-09 1987-07-09 Product inspection expert system Pending JPS6415673A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62171433A JPS6415673A (en) 1987-07-09 1987-07-09 Product inspection expert system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62171433A JPS6415673A (en) 1987-07-09 1987-07-09 Product inspection expert system

Publications (1)

Publication Number Publication Date
JPS6415673A true JPS6415673A (en) 1989-01-19

Family

ID=15923035

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62171433A Pending JPS6415673A (en) 1987-07-09 1987-07-09 Product inspection expert system

Country Status (1)

Country Link
JP (1) JPS6415673A (en)

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