JPS6384335A - Data calling test system - Google Patents

Data calling test system

Info

Publication number
JPS6384335A
JPS6384335A JP61231442A JP23144286A JPS6384335A JP S6384335 A JPS6384335 A JP S6384335A JP 61231442 A JP61231442 A JP 61231442A JP 23144286 A JP23144286 A JP 23144286A JP S6384335 A JPS6384335 A JP S6384335A
Authority
JP
Japan
Prior art keywords
circuit
terminal
data
subscriber
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61231442A
Other languages
Japanese (ja)
Inventor
Makoto Yoshida
誠 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP61231442A priority Critical patent/JPS6384335A/en
Publication of JPS6384335A publication Critical patent/JPS6384335A/en
Pending legal-status Critical Current

Links

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  • Monitoring And Testing Of Exchanges (AREA)
  • Data Exchanges In Wide-Area Networks (AREA)

Abstract

PURPOSE:To test the normal properties for exchange of circuits by simulating transmission/reception of data among subscribers via a single test equipment. CONSTITUTION:A subscriber terminal 1 transmits/receives data and the circuit of the terminal 1 stored in a subscriber circuit 3 is switched to the circuit of a test terminal 4. The data are transmitted through the terminal 4 and supplied to a subscriber circuit 7 through a circuit exchange 6 via an interface device 5 and the circuit 3. Then the data are received by the terminal 4 via the device 5. In a reception test mode the data are sent through the terminal 4 and supplied to the circuit 3 through the exchange 6 via the device 5 and the circuit 7. Then the data are received by the terminal 4 via the device 5.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はデータ呼の試験方式に関し、特に回線交換を介
してデータ交換を行うシステムのデータ呼の試験方式に
関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a data call testing method, and more particularly to a data call testing method for a system in which data is exchanged via line switching.

〔従来の技術〕[Conventional technology]

従来のデータ呼の試験方式は第2図に示すように、加入
者端末1に接続されている回線を加入者回路3にて試験
端末4側に切シ換え、回線交換機6の試験用加入者回路
8に収容された試験端末9と、試験端末4との間でデー
タを送受信することにより、回線交換機の正常性を試験
している。
As shown in FIG. 2, the conventional data call testing method is to switch the line connected to the subscriber terminal 1 to the test terminal 4 side at the subscriber circuit 3. The normality of the line exchange is tested by transmitting and receiving data between the test terminal 9 housed in the circuit 8 and the test terminal 4.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上述した従来の試験方式では、試験端末が2台必要であ
るので、保守者が2台の試験端末を操作しなければなら
ないという問題点がある。
The conventional test method described above requires two test terminals, so there is a problem in that a maintenance person must operate the two test terminals.

〔問題点を解決するだめの手段〕[Failure to solve the problem]

本発明のデータ呼試験方式は、回線交換機による加入者
間データの送受信を行うシステムにおいて、各加入者回
線を交換機に収容する加入者回路へのアクセス機能と、
専用加入者回路により交換機に収容され加入者装置を擬
似する機能をもつ試験装置を有し、該試験装置1台にて
加入者間のデータ送受信を擬似することにより回線交換
の正常性を試験するととを特徴とする特 〔実施例〕 次に、本発明について図面を参照して説明する。
The data call test method of the present invention is a system in which data is transmitted and received between subscribers using a circuit exchange, and includes an access function to a subscriber circuit that accommodates each subscriber line in the exchange;
It has a test device that is housed in the exchange using a dedicated subscriber circuit and has the function of simulating subscriber equipment, and tests the normality of line switching by simulating data transmission and reception between subscribers with one test device. [Embodiment] Next, the present invention will be described with reference to the drawings.

本発明の一実施例を示す第1図を参照すれば、加入者端
末lはデータを送受信する装置でインタフェース装置2
は加入者端末と交換機とのインタフェース装置である。
Referring to FIG. 1 showing an embodiment of the present invention, a subscriber terminal l is a device for transmitting and receiving data, and an interface device 2 is a device for transmitting and receiving data.
is an interface device between the subscriber terminal and the exchange.

加入者回路3に収容されでいる加入者端末工の回線を試
験端末4の回線に切り換え、試験端末4よりデータを送
信し試験インタフェース装置5を介し、加入者回路3を
介し、回線交換機6にて加入者回路7に接続され、試験
インタフェース装置5を介し、試験端末4にて受信する
。また、受信試験時には試験端末4よシデータを送信し
インタフェース装u5を介し、加入者回路7を介し、回
線交換機6にて加入者回路3に接続され、インタフェー
ス装置5會介し試験端末4にて受信する。
The line of the subscriber terminal installed in the subscriber circuit 3 is switched to the line of the test terminal 4, and the data is transmitted from the test terminal 4 through the test interface device 5, through the subscriber circuit 3, and then to the line exchange 6. The signal is connected to the subscriber circuit 7 and received at the test terminal 4 via the test interface device 5. In addition, during a reception test, the test terminal 4 transmits data, which is connected to the subscriber circuit 3 via the interface device U5, the subscriber circuit 7, and the line exchange 6, and is received by the test terminal 4 via the interface device 5. do.

以上のように試験端末よりデータの送受信を行うことに
よ多回線交換の正常性を試験する。
The normality of multi-circuit switching is tested by transmitting and receiving data from the test terminal as described above.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明は試験装置が擬似的に加入
者回線でのデータの送受信を手順通シ行うことにより、
回線交換の正常性を試験端末1台にて試験できる効果が
ある。
As explained above, the present invention allows the test device to perform the procedure of sending and receiving data on the subscriber line in a pseudo manner.
This has the effect of being able to test the normality of line switching using a single test terminal.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例のブロック図、第2図に従来
のデータ呼の試験方式を示すブロック図である。 1・・・・・・加入者端末、2・・・・・・インタフェ
ース装置、3・・・・・・加入者回路、4,9・・・・
・・試験端末、5・・・・・・試験インタフェース装置
、6・・・・・・回線交換機、7゜8・・・・・・試験
用加入者回路。
FIG. 1 is a block diagram of an embodiment of the present invention, and FIG. 2 is a block diagram showing a conventional data call testing method. 1...Subscriber terminal, 2...Interface device, 3...Subscriber circuit, 4, 9...
...Test terminal, 5...Test interface device, 6...Line exchange, 7゜8...Test subscriber circuit.

Claims (1)

【特許請求の範囲】[Claims] 回線交換機による加入者間データの送受信を行うシステ
ムにおいて、各加入者回線を交換機に収容する加入者回
路へのアクセス機能と、専用加入者回路により交換機に
収容され加入者装置を擬似する機能をもつ試験装置を有
し、該試験装置1台にて加入者間のデータ送受信を擬似
することにより回線交換の正常性を試験するととを特徴
とするデータ呼試験方式。
In a system that transmits and receives data between subscribers using a line exchange, it has the function of accessing the subscriber circuit that accommodates each subscriber line in the exchange, and the function of simulating subscriber equipment housed in the exchange using a dedicated subscriber circuit. 1. A data call test method comprising a test device, and testing the normality of circuit switching by simulating data transmission and reception between subscribers using the single test device.
JP61231442A 1986-09-29 1986-09-29 Data calling test system Pending JPS6384335A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61231442A JPS6384335A (en) 1986-09-29 1986-09-29 Data calling test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61231442A JPS6384335A (en) 1986-09-29 1986-09-29 Data calling test system

Publications (1)

Publication Number Publication Date
JPS6384335A true JPS6384335A (en) 1988-04-14

Family

ID=16923601

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61231442A Pending JPS6384335A (en) 1986-09-29 1986-09-29 Data calling test system

Country Status (1)

Country Link
JP (1) JPS6384335A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002169269A (en) * 2000-11-30 2002-06-14 Kimoto & Co Ltd Method of making photomask and photomask

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57157671A (en) * 1981-03-25 1982-09-29 Nec Corp Automatic testing system for subscriber's circuit
JPS5980052A (en) * 1982-10-29 1984-05-09 Nec Corp Test system of subscriber circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57157671A (en) * 1981-03-25 1982-09-29 Nec Corp Automatic testing system for subscriber's circuit
JPS5980052A (en) * 1982-10-29 1984-05-09 Nec Corp Test system of subscriber circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002169269A (en) * 2000-11-30 2002-06-14 Kimoto & Co Ltd Method of making photomask and photomask

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