JPS62152136A - Spinning chuck for semiconductor wafer - Google Patents

Spinning chuck for semiconductor wafer

Info

Publication number
JPS62152136A
JPS62152136A JP29196585A JP29196585A JPS62152136A JP S62152136 A JPS62152136 A JP S62152136A JP 29196585 A JP29196585 A JP 29196585A JP 29196585 A JP29196585 A JP 29196585A JP S62152136 A JPS62152136 A JP S62152136A
Authority
JP
Japan
Prior art keywords
wafer
chuck
recess
chuck body
main body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP29196585A
Other languages
Japanese (ja)
Inventor
Seiji Hirata
平田 政治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP29196585A priority Critical patent/JPS62152136A/en
Publication of JPS62152136A publication Critical patent/JPS62152136A/en
Pending legal-status Critical Current

Links

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  • Cleaning Or Drying Semiconductors (AREA)
  • Manipulator (AREA)

Abstract

PURPOSE:To perform a drying treatment on a wafer in a stable state in the simple structure, without being subjected to the restriction of the installation place and also, preventing damage to the wafer by fixing the wafer by one end part of the wafer retention pawls which are shifted on the recessed part of the chuck by a centrifugal force. CONSTITUTION:A wafer 12 is housed in a recessed part 13 of a chuck 20 and thereafter, a chuck main body 11 is rotated. At this time, wafer retention pawls 16a-16c make bend end parts 17a-17c elongate outside on the recessed part 13 by the centrifugal force to accompany the turning force of the main body 11. A drying treatment of the wafer 12 is performed in a state that the wafer 12 is reliably held by the pinching action of the bent end arts 17a-17c and spacer pins 14. When the rotation of the main body 11 is stopped after the drying treatment, the wafer press pawls 16a-16c are returned to the prescribed positions on the main body 11 by the action of springs 19. Then, the wafer 12 is taken out of the recessed part 13.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明は、半導体ウェハ(以下、単にウェハと記す)の
スピンチャックに関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a spin chuck for semiconductor wafers (hereinafter simply referred to as wafers).

〔発明の技術的背景〕[Technical background of the invention]

従来、洗浄後のウェハ等を乾燥させるために例えば第3
図及び第4図に示す半導体ウェハのスピンチャック10
が使用されている。図中1は、シリンダーブロックであ
る。シリンダーブロック1は、回転軸2を介して図示し
ない回転機構に接続されている。シリンダーブロック1
の両端部には、その内部に設けられたばね3の引張作用
によシリンダーブロック1の中心部に向って引寄せられ
た状態でロッド4の端部が導出されている。ロツI−′
4の端部には、被処理体のウェハ5の周側面部を把持す
る把持部材6が取付けられている。
Conventionally, in order to dry wafers etc. after cleaning, for example, a third
A spin chuck 10 for a semiconductor wafer shown in FIGS.
is used. 1 in the figure is a cylinder block. The cylinder block 1 is connected to a rotation mechanism (not shown) via a rotation shaft 2. cylinder block 1
The ends of a rod 4 are drawn out from both ends of the cylinder block 1 in a state where they are pulled toward the center of the cylinder block 1 by the tensile action of a spring 3 provided inside the rod. Lotsu I-'
A gripping member 6 is attached to the end of the wafer 4 for gripping the peripheral side surface of the wafer 5 as the object to be processed.

而して1把持部材6によってウェハ5の周側面部を把持
し、この状態でシリンダーブロック1が回転することに
より、ウェハ5を乾燥するようになっている。
The wafer 5 is dried by gripping the circumferential side of the wafer 5 by one gripping member 6 and rotating the cylinder block 1 in this state.

〔背景技術の問題点〕[Problems with background technology]

このような従来の半導体ウェハのスピンチャツク10で
は、シリンダーブロック10ロツト。
In such a conventional semiconductor wafer spin chuck 10, there are 10 cylinder blocks in a lot.

4に高圧エアを負荷するだめの外部設備が必要であシ、
半導体ウェハのスピンチャック10の設置場所に制限が
ある。また、シリンダーブロック1を回転させる際にウ
ェハ5が外れて破損し易い問題がある。更に、シリンダ
ーブロック1の形状が円形でないため、ウェハ5f高速
回転させると、ウェハ5に大きな振動が加わりウェハ5
の割れ等の事故が起き易い問題がある。
4 requires external equipment to load high pressure air,
There are restrictions on the installation location of the spin chuck 10 for semiconductor wafers. Further, when rotating the cylinder block 1, there is a problem that the wafer 5 is likely to come off and be damaged. Furthermore, since the shape of the cylinder block 1 is not circular, when the wafer 5f is rotated at high speed, large vibrations are applied to the wafer 5 and the wafer 5
There is a problem that accidents such as cracks are likely to occur.

〔発明の目的〕[Purpose of the invention]

本発明は、外部設備を不要にして簡単な構造で設置場所
の制限を受けず、しかも、ウェハの破損を防止して安定
した状態でウェハの乾燥処理を行うことができる半導体
ウェハのスピンチャックを提供することをその目的とす
るものである。
The present invention provides a spin chuck for semiconductor wafers that does not require external equipment, has a simple structure, is not limited by installation locations, and is capable of drying wafers in a stable state while preventing damage to the wafers. Its purpose is to provide.

〔発明の概要〕[Summary of the invention]

本発明は、遠心力によって凹部上に移動するウニへ押え
爪の一端部によりウェハを固定するようにしたことによ
ジ、外部設備を不要にして簡単な構造で設置場所の制限
を受けず、しかも、ウェハの破損を防止して安定した状
態でウェハの乾燥処理を行うことができる半導体ウェハ
のスピンチャックである。
The present invention uses one end of the presser claw to fix the wafer to the sea urchin that moves onto the recess due to centrifugal force, thereby eliminating the need for external equipment and having a simple structure that is not subject to restrictions on installation location. In addition, this semiconductor wafer spin chuck is capable of drying a wafer in a stable state while preventing damage to the wafer.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の実施例について図面を参照して説明する
。第1図は、本発明の一実施例の平面図、第2図は同実
施例の正面図である、図中11は、円板状のチャック本
体である。チャック本体1ノの中央部には、被処理体の
ウェハ12が嵌合する凹部13が形成されている。凹部
13の床部上には、その中心部から120度の開き角間
隔でスペーサビン14が設けられている。スペーサビン
14は、ウェハ12の裏面と凹部13の床面とが接触す
るのを防止して、ウェハ12の乾燥処理を効果的に行う
ためのものである。チャック本体11は、図示しない回
転機構によシ所定の回転速度で回転するようになってい
る。凹部13の床上の所定位置には、ウェハ12のオリ
フラ面に当接する位置決めビン15が立設している。チ
ャック本体1ノ上の凹部13の近傍領域には、凹部13
の中心から例えば120度の開き角で放射状に3個のウ
ェハ押え爪16B、16b、16cが配置されている。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a plan view of an embodiment of the present invention, and FIG. 2 is a front view of the embodiment. Reference numeral 11 in the figure indicates a disc-shaped chuck body. A recess 13 into which a wafer 12 as an object to be processed is fitted is formed in the center of the chuck body 1 . Spacer bins 14 are provided on the floor of the recess 13 at an opening angle interval of 120 degrees from the center thereof. The spacer bin 14 prevents the back surface of the wafer 12 from coming into contact with the floor surface of the recess 13, thereby effectively performing the drying process of the wafer 12. The chuck body 11 is rotated at a predetermined rotational speed by a rotation mechanism (not shown). A positioning bin 15 is erected at a predetermined position on the floor of the recess 13 so as to come into contact with the orientation flat surface of the wafer 12 . In the vicinity of the recess 13 on the chuck body 1, there is a recess 13.
Three wafer holding claws 16B, 16b, and 16c are arranged radially from the center at an opening angle of, for example, 120 degrees.

f) y−ハ押え爪16a、16b、16Cは、後述す
るチャック本体1ノの回転による遠心力によって折曲端
部17a、17b、17Cが凹部13上に延出するよう
に回動自在に設けられている。各々のウニへ押え爪16
a、zt;b。
f) The y-c presser claws 16a, 16b, and 16C are rotatably provided so that bent ends 17a, 17b, and 17C extend above the recess 13 due to centrifugal force caused by the rotation of the chuck body 1, which will be described later. It is being Presser claw 16 for each sea urchin
a,zt;b.

16Cの近傍には、折曲端部rva、1vb。Bent ends rva and 1vb are located near 16C.

17Cが凹部13上に延出した際に後端部が当接してウ
ェハ押え爪16a、16b、16C(D回転を防止する
ための爪ストッパ18が設けられている。爪ストッパ1
8とウェハ押え爪16a、16b、16C間には、チャ
ック本体11が回転していない場合に、ウェハ押え爪1
6a、16b、16Cをチャック本体11上の所定位置
に戻すためのはね19が設けられている。なお、2個の
ウェハ押え爪16b、16Gについては、説明を簡略に
するために第1図中爪ストッパ18の図示を省略してい
る。また、このうちの一方のウェハ押え爪16bは、チ
ャック本体11の回転に伴う遠心力によって折曲端部1
7bが凹部13上に延出した状態を示している。残りの
ウェハ押え爪16Cは、チャック本体1)の停止後にば
ね19の作用によって所定位置に戻った状態を示してい
る。
A claw stopper 18 is provided for preventing the wafer holding claws 16a, 16b, 16C (D rotation) by abutting the rear ends of the wafer holding claws 17C when they extend above the recess 13.Claw stopper 1
8 and the wafer presser claws 16a, 16b, and 16C, when the chuck main body 11 is not rotating, the wafer presser claw 1
A spring 19 is provided for returning 6a, 16b, 16C to a predetermined position on chuck body 11. As for the two wafer holding claws 16b and 16G, the claw stopper 18 is not shown in FIG. 1 to simplify the explanation. Further, one of the wafer holding claws 16b is pressed against the bent end by the centrifugal force accompanying the rotation of the chuck body 11.
7b is shown extending above the recess 13. The remaining wafer holding claws 16C are shown returning to their predetermined positions by the action of the spring 19 after the chuck body 1) has stopped.

このように構成された半導体ウェハのスピンチャック2
0によれば、凹部13にウェハ12を”収容した後、チ
ャック本体11を回転機構により回転させる。このとき
、各々のウェハ押え爪16a 、 16b 、 16c
は、チャック本体11の回転力に伴う遠心力により、折
曲端部17a、17b、17Gを四部13上に延出させ
る。この折曲端部17a 、 17b 、 17Cとス
ペーサビン14との挟持作用によってウェハ12を完全
に確実した状態で遠心力を利用してウェハ12の乾燥処
理を行う。乾燥処理後、チャック本体1ノの回転が停止
すると、各々のウェハ押え爪16a、16’D、16C
はばね19の作用を受けてチャック本体11上の所定位
買に戻る。然る後、遠心力によって乾燥させたウェハ1
2を凹部13から取出す。
Semiconductor wafer spin chuck 2 configured in this way
According to No. 0, after the wafer 12 is accommodated in the recess 13, the chuck body 11 is rotated by the rotation mechanism. At this time, each of the wafer holding claws 16a, 16b, 16c
The bent ends 17a, 17b, and 17G are extended onto the four parts 13 by the centrifugal force accompanying the rotational force of the chuck body 11. The wafer 12 is completely secured by the sandwiching action between the bent ends 17a, 17b, 17C and the spacer bin 14, and the wafer 12 is dried using centrifugal force. After the drying process, when the rotation of the chuck body 1 stops, each wafer holding claw 16a, 16'D, 16C
It returns to a predetermined position on the chuck body 11 under the action of the spring 19. After that, the wafer 1 was dried by centrifugal force.
2 from the recess 13.

このようにこの半導体ウェハのスピンチャック20によ
れば、チャック本体1ノの回転に伴う遠心力を利用して
回動するウェハ押え爪16Fa、16b、ノロCの折曲
端部17a。
As described above, according to this semiconductor wafer spin chuck 20, the wafer holding claws 16Fa, 16b and the bent end portion 17a of the groove C rotate using the centrifugal force accompanying the rotation of the chuck body 1.

17b 、 17Cでウェハ12を固定する極めて簡単
な構造であシ、何ら外部設備を不要にして設置場所の制
限を受けないものである。また、折曲端部17a、17
b、17Cとスペーサビン14とでウェハ12を表裏両
面から挾持して固定するので、ウェハ12の飛出し等に
よる破損を防止して安定した状態で乾燥、処理を行うこ
とができる。
It is an extremely simple structure in which the wafer 12 is fixed by the wafers 17b and 17C, and there is no need for any external equipment and there is no restriction on the installation location. Moreover, the bent ends 17a, 17
Since the wafer 12 is clamped and fixed from both sides by the spacer bin 14 and the spacer bin 17B, the wafer 12 can be dried and processed in a stable state without being damaged due to the wafer 12 flying out or the like.

〔発明の効果〕〔Effect of the invention〕

以上説明した如く、本発明に係る半導体ウェハのスピン
チャックによれば、外部設備を不要にして簡単な構造で
設置場所の制限を受けず、しかも、ウェハの破損を防止
して安定した状態でケ′土′ハの乾燥処理を行うことが
できるものである。
As explained above, the spin chuck for semiconductor wafers according to the present invention does not require any external equipment, has a simple structure, is not limited by installation locations, and also prevents damage to the wafer and allows the chuck to be held in a stable state. It is capable of drying ``soil''.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、本発明の一実施例の平面図、第2図は、間実
施例の正面図、第3図は、従来の半導体ウェハのスピン
チャックの平面図、第4図は、間従来の半導体ウェハの
スピンチャックの正面図でおる。 1ノ・・・チャック本体、12・・・ウェハ、13・・
・凹部、14・・・スペーサビン、15・・・位置決め
ビン、16 a 、 16 b 、 16 C・・・つ
Z ハ押え爪、17 a 、 17 b 、 J 7 
c−−−折曲端部、1 B ・・・爪ストッパ、19・
・・ばね、20・・・半導体ウェハのスピンチャック。 出願人代理人 弁理士  鈴  江  武  彦並 第1図 へ32図 第4図
FIG. 1 is a plan view of an embodiment of the present invention, FIG. 2 is a front view of an embodiment of the present invention, FIG. 3 is a plan view of a conventional semiconductor wafer spin chuck, and FIG. 4 is a conventional This is a front view of a spin chuck for semiconductor wafers. 1... Chuck body, 12... Wafer, 13...
・Concavity, 14...Spacer bin, 15...Positioning bin, 16a, 16b, 16C...Z Presser claw, 17a, 17b, J7
c---Folded end, 1 B...Claw stopper, 19.
...Spring, 20... Spin chuck for semiconductor wafers. Applicant's agent Patent attorney Takehiko Suzue Go to Figure 1 Figure 32 Figure 4

Claims (1)

【特許請求の範囲】[Claims] 半導体ウェハが嵌合される凹部を有するチャック本体と
、前記半導体ウェハの裏面と該凹部の床面とを離間する
ように該床部に設けられたスペーサと、前記チャック本
体を回転させる回転機構と、前記凹部の近傍のチャック
本体上に前記凹部の中心からほぼ放射状に所定間隔で配
置され、前記チャック本体の回転に伴う遠心力によって
一端部が該近傍のチャック本体上から前記凹部上に向け
て回動自在に設けられた複数個のウェハ押え爪と、該ウ
ェハ押え爪の他端部が当接するように前記チャック本体
上に突設された爪ストッパーとを具備することを特徴と
する半導体ウェハのスピンチャック。
A chuck body having a recess into which a semiconductor wafer is fitted, a spacer provided on the floor so as to separate the back surface of the semiconductor wafer from the floor of the recess, and a rotation mechanism for rotating the chuck body. , disposed on the chuck body near the recess at predetermined intervals substantially radially from the center of the recess, one end of which is directed from above the chuck body near the recess toward the recess due to centrifugal force accompanying rotation of the chuck body. A semiconductor wafer comprising a plurality of rotatably provided wafer holding claws and a claw stopper protruding from the chuck body so that the other end of the wafer holding claws comes into contact with the chuck body. spin chuck.
JP29196585A 1985-12-26 1985-12-26 Spinning chuck for semiconductor wafer Pending JPS62152136A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29196585A JPS62152136A (en) 1985-12-26 1985-12-26 Spinning chuck for semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29196585A JPS62152136A (en) 1985-12-26 1985-12-26 Spinning chuck for semiconductor wafer

Publications (1)

Publication Number Publication Date
JPS62152136A true JPS62152136A (en) 1987-07-07

Family

ID=17775753

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29196585A Pending JPS62152136A (en) 1985-12-26 1985-12-26 Spinning chuck for semiconductor wafer

Country Status (1)

Country Link
JP (1) JPS62152136A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0245951A (en) * 1988-08-08 1990-02-15 Kyushu Electron Metal Co Ltd Holding device for semiconductor substrate
JPH0254527A (en) * 1988-08-18 1990-02-23 Kawasaki Steel Corp Spin dryer
US5375291A (en) * 1992-05-18 1994-12-27 Tokyo Electron Limited Device having brush for scrubbing substrate
EP1308989A2 (en) * 1997-11-03 2003-05-07 ASM America, Inc. Improved low mass wafer support system
CN102867770A (en) * 2011-07-05 2013-01-09 北京中科信电子装备有限公司 Silicon chip clamp for silicon chip implantation process
JP2018066894A (en) * 2016-10-20 2018-04-26 マッパー・リソグラフィー・アイピー・ビー.ブイ. Method and device for positioning substrate on substrate support unit
US10133186B2 (en) 2016-10-20 2018-11-20 Mapper Lithography Ip B.V. Method and apparatus for aligning substrates on a substrate support unit

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0245951A (en) * 1988-08-08 1990-02-15 Kyushu Electron Metal Co Ltd Holding device for semiconductor substrate
JPH0254527A (en) * 1988-08-18 1990-02-23 Kawasaki Steel Corp Spin dryer
US5375291A (en) * 1992-05-18 1994-12-27 Tokyo Electron Limited Device having brush for scrubbing substrate
EP1308989A2 (en) * 1997-11-03 2003-05-07 ASM America, Inc. Improved low mass wafer support system
EP1308989A3 (en) * 1997-11-03 2007-12-26 ASM America, Inc. Improved low mass wafer support system
CN102867770A (en) * 2011-07-05 2013-01-09 北京中科信电子装备有限公司 Silicon chip clamp for silicon chip implantation process
JP2018066894A (en) * 2016-10-20 2018-04-26 マッパー・リソグラフィー・アイピー・ビー.ブイ. Method and device for positioning substrate on substrate support unit
US10133186B2 (en) 2016-10-20 2018-11-20 Mapper Lithography Ip B.V. Method and apparatus for aligning substrates on a substrate support unit

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