JPS62116204A - Method and apparatus for measuring contact area - Google Patents

Method and apparatus for measuring contact area

Info

Publication number
JPS62116204A
JPS62116204A JP25722685A JP25722685A JPS62116204A JP S62116204 A JPS62116204 A JP S62116204A JP 25722685 A JP25722685 A JP 25722685A JP 25722685 A JP25722685 A JP 25722685A JP S62116204 A JPS62116204 A JP S62116204A
Authority
JP
Japan
Prior art keywords
light
reflected
specimen
contact area
prism
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25722685A
Other languages
Japanese (ja)
Inventor
Yasuo Hirayama
泰生 平山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Denko Corp
Original Assignee
Nitto Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Electric Industrial Co Ltd filed Critical Nitto Electric Industrial Co Ltd
Priority to JP25722685A priority Critical patent/JPS62116204A/en
Publication of JPS62116204A publication Critical patent/JPS62116204A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To enable highly accurate quantification and the judgement of the increase and decrease in a contact surface due to a change with time, by quantifying the reflected light from the specimen mount surface of a triangle prism and quantifying a contact area on the basis of the measured value thereof. CONSTITUTION:The light emitted from a light source 2 is incident on an equilateral right-angled prism 1 from the surface B thereof toward the direction (specimen) of the surface A thereof and this incident light (a) is reflected from the surface A to obtain reflected light (b) which is, i turn, taken out from the surface C of the prism 1. When the light (a) is reflected from the surface A, at a contact part where the order of the gap between the surface of the pressure-sensitive adhesive of a pressure- sensitive adhesive tape 4 and the surface A came to about a function of the wavelength of incident light, the contact state of the surface A and the tape 4 is reflected to the reflected light (b) as the magnitude of reflectivity by the tunnel effect acting between the prism 1 and the pressur-sensitive adhesive. Next, reflected light (c) is received and measured by an optical sensor 3 and the light absorbing ratio on the surface A is calculated from the measured value and a measured value obtained when the incident light (a) is totally reflected fro the surface A without adhering the tape 4 to the surface A to quantify a contact area.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、被着体に対する接着剤の有効接着面積を知る
場合などに好ましく適用することができる、定饋精度に
優れる新規な接触面積測定方法及びその装置に関するも
のである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention provides a novel contact area measuring method with excellent fixing accuracy, which can be preferably applied to determining the effective bonding area of an adhesive to an adherend. This is related to the device.

従来の技術 接着剤あるいは粘着テープなどの貼着製品における被着
体に対する有効接着面積は、その接着性能を評価する上
で重要なファクタである。そのため、接着剤、貼着製品
が特定の温度、圧着力等の接着条件下でどの程度の有効
接着面積を持ちうるかを知ることが必要となる。
The effective adhesive area of conventional adhesives or adhesive products such as adhesive tapes to adherends is an important factor in evaluating their adhesive performance. Therefore, it is necessary to know how much effective adhesive area an adhesive or adhesive product can have under specific adhesive conditions such as temperature and pressure force.

従来、粘着テープ等の接触面積測定方法とじては、スラ
イドグラス等からなる透明板に粘着テープ等における接
着剤層を貼り付けてこれを写真に撮り、暗黒部分と白色
部分とに2値化してその面積比を求めることにより定量
する方法が知られていた。すなわち、透明板と接着剤層
との接触部では入射光が透過するためにその反射光が減
少して暗黒部分となり、非接触部では入射光がほとんど
反射して白色部分となるので、その明暗の分布面積を求
めることにより定量する方法である。
Conventionally, the contact area measurement method for adhesive tape, etc., involves attaching the adhesive layer of adhesive tape to a transparent plate made of a slide glass, taking a photograph, and binarizing it into dark and white areas. A method of quantifying by determining the area ratio was known. In other words, at the contact area between the transparent plate and the adhesive layer, the incident light passes through and the reflected light decreases, resulting in a dark area, while at the non-contact area, most of the incident light is reflected, resulting in a white area, so the brightness and darkness of the area is different. This is a method of quantifying by determining the distribution area of .

発明が解決しようとする問題点 しかしながら、従来の方法では明暗の差が僅少の場合や
、接触部分が微少な場合などではその判別が難しく、定
量精度に劣るという問題点があった。
Problems to be Solved by the Invention However, in the conventional method, it is difficult to distinguish when the difference between brightness and darkness is small or when the contact area is minute, and there has been a problem that the quantitative accuracy is poor.

また、接着強さなどに関係する接触部における間隙など
としての接触レヘルを知ることができないという問題点
などもあった。
Another problem was that it was not possible to know the contact level, such as a gap in the contact portion, which is related to adhesive strength and the like.

問題点を解決するための手段 本発明は上記の問題点を克服したものであり、三角プリ
ズムの検体付設面からの反射光を定量し、その測定値に
基づいて接触面積を定量化することを原理とする。
Means for Solving the Problems The present invention overcomes the above-mentioned problems, and includes quantifying the reflected light from the sample mounting surface of the triangular prism and quantifying the contact area based on the measured value. As a principle.

すなわち、本発明は、三角プリズムの三角を構成する第
1の面に検体を接触させ、第2の面より光線を検体に対
し入射させてその反射光を第3の面より取り出し、取り
出した反射光を定量してその値に基づいて検体の接触面
積を定量化することを特徴とする接触面積測定方法、及
び 三角プリズムと、この三角プリズムの三角を構成する3
面のうちの1面より光線を入射させるための少なくとも
一の光源と、前記三角プリズムの残る2面のうちの1面
で反射して残る最後の面より出た反射光を検知するため
の受光器とからなることを特徴とする接触面積測定装置
を提供するものである。
That is, in the present invention, a specimen is brought into contact with a first surface constituting a triangle of a triangular prism, a light beam is made incident on the specimen from the second surface, and the reflected light is extracted from the third surface. A contact area measuring method characterized by quantifying light and quantifying the contact area of a specimen based on the value, a triangular prism, and three constituting triangles of the triangular prism.
at least one light source for making a light beam incident from one of the surfaces, and a light receiver for detecting the reflected light reflected from one of the remaining two surfaces of the triangular prism and emitted from the last remaining surface. The present invention provides a contact area measuring device characterized by comprising a device.

作  用 三角プリズムの三角を構成する3面のうちの1面(A面
)に検体を設け、残る2面のうちの1面(B面)より光
線を入射させてその検体付設面からの反射光を残る1面
(C面)より取り出すことにより、C面における反射光
に光入射面としてのB面による反射光の混在を防止する
ことができる結果、A面の状態を精度よ(反映した反射
光をC面より取り出すことができ、A面による反射光の
微少な差も判別することが可能となる。
A specimen is placed on one of the three surfaces (surface A) that makes up the triangle of a triangular prism, and a light beam is made incident on one of the remaining two surfaces (surface B), and the reflection from the surface on which the specimen is attached is measured. By extracting the light from the remaining surface (C surface), it is possible to prevent the reflected light from the C surface from being mixed with the light reflected from the B surface, which is the light incident surface.As a result, the state of the A surface can be accurately (reflected) The reflected light can be extracted from the C-plane, and even minute differences in the reflected light due to the A-plane can be determined.

また、トンネル効果等に基づきA面での反射率は接触部
と非接触部とで異なると共に、接触部であっても入射光
の波長により異なったものとなる。
Further, the reflectance on the A surface differs between the contact portion and the non-contact portion due to the tunnel effect and the like, and even in the contact portion, it differs depending on the wavelength of the incident light.

その結果、入射光の波長を変えて調べることにより接触
レベルの判定が可能になる。
As a result, it becomes possible to determine the contact level by changing the wavelength of the incident light.

実施例 以下、図示した本発明装置の実施例に基づいて本発明方
法を説明する。
EXAMPLE The method of the present invention will be explained below based on the illustrated example of the apparatus of the present invention.

図において、■は二等辺直角プリズム、2はレンズ2a
とともにコリメータを構成する光源、3は受光器として
の光センサ、4は感圧性接着剤層4aと支持基材4bか
らなる検体としての粘着テープである。
In the figure, ■ is an isosceles right angle prism, and 2 is a lens 2a.
The reference numeral 3 designates a light source constituting a collimator, a light sensor 3 as a light receiver, and an adhesive tape 4 as a specimen consisting of a pressure-sensitive adhesive layer 4a and a support base material 4b.

粘着テープ4は、その感圧性接着剤層4aを介して二等
辺直角プリズム1の三角を構成する3面のうちの直角を
なす頂角の対面(A面)に所定の接着条件で圧着されて
いる。光源2は、二等辺直角プリズム1の三角を構成す
る3面の残る2面のうちの1面(B面)より光線を検体
に対して入射させることができるように配置されている
。光センサ3は、二等辺直角プリズムlの三角を構成す
る3面の残る1面(C面)より取り出される反射光の受
光が可能なように配置されている。
The adhesive tape 4 is pressed under predetermined bonding conditions to the face (side A) of the right-angled apex of the three faces forming the triangle of the isosceles rectangular prism 1 via the pressure-sensitive adhesive layer 4a. There is. The light source 2 is arranged so that a light beam can be incident on the specimen from one of the remaining two surfaces (surface B) of the three surfaces forming the triangle of the isosceles right-angle prism 1. The optical sensor 3 is arranged so as to be able to receive reflected light extracted from the remaining one surface (C surface) of the three triangular surfaces of the isosceles right angle prism l.

上記装置を用いての接触面積の定量化は次のようにして
行われる。
Quantification of the contact area using the above device is performed as follows.

すなわち、先ず光源2から出た光線を二等辺直角プリズ
ム1のB面よりA面方向(検体)に向がって入射させ、
この入射光aのA面での反射光すをC面より取り出す。
That is, first, the light beam emitted from the light source 2 is made incident on the isosceles rectangular prism 1 from the B side toward the A side (specimen).
The reflected light of this incident light a on the A plane is taken out from the C plane.

入射光aがA面で反射する際、粘着テープの感圧性接着
剤層面とA面との間隙のオーダが入射光の波長の数分の
1程度以内となった接触部では、プリズムと感圧性接着
剤層の屈折率差が小さいことに基づいてトンネル効果が
作用し、入射光の一部が粘着テープ側に透過してその反
射率が低下する。その結果、A面と粘着テープの接触状
態が反射率の大小となって反射光に反映される。
When incident light a is reflected on surface A, the prism and pressure sensitive A tunnel effect occurs due to the small difference in refractive index of the adhesive layer, and a portion of the incident light is transmitted to the adhesive tape side, reducing its reflectance. As a result, the state of contact between the A side and the adhesive tape changes the reflectance and is reflected in the reflected light.

次に、0面より取り出した反射光すを光センサ3で受光
測定し、その測定値と、A面に粘着テープ4を貼着しな
いで入射光aをA面の全面で反射させた場合の測定値よ
りA面における光吸収率を求めて接触面積を定量化する
Next, the reflected light taken out from surface 0 is measured by the optical sensor 3, and the measured value and the value obtained when the incident light a is reflected on the entire surface of surface A without attaching adhesive tape 4 to surface A. The contact area is quantified by determining the light absorption rate on the A side from the measured values.

接触レベルについては、上記した反射光の定量操作を入
射光の波長を変えて行い、波長の相違による光吸収率の
変化、あるいは定量化された接触面積の変化を調べるこ
とにより判定することができる。すなわち、短波長側の
光線における光吸収率が大きいほど、あるいは短波長側
の光線を用いた場合に定量化される接触面積が大きいほ
どA面と感圧性接着剤層面との間隙の小さい部分が多く
あることを意味するので、これにより判定が可能になる
The contact level can be determined by performing the above-mentioned quantitative operation of the reflected light by changing the wavelength of the incident light, and examining the change in light absorption rate due to the difference in wavelength or the change in the quantified contact area. . In other words, the larger the light absorption rate for light rays on the short wavelength side, or the larger the contact area quantified when using light rays on the short wavelength side, the smaller the gap between side A and the surface of the pressure-sensitive adhesive layer becomes. This means that there are many, so this makes it possible to make a determination.

なお、入射光aを8面より入射させるに際しては、その
A面における入射角が臨界角以上となるように入射させ
て、非接触部では全反射が起こるようにすることが定量
精度の点で好ましい。ちなみに、実施例の二等辺直角プ
リズムと空気の界面における臨界角は約40度である。
In addition, when making the incident light a enter from 8 surfaces, it is important to make it incident so that the angle of incidence on the A surface is equal to or greater than the critical angle, so that total reflection occurs in the non-contact parts, in terms of quantitative accuracy. preferable. Incidentally, the critical angle at the interface between the isosceles rectangular prism and air in the example is about 40 degrees.

前記した実施例では、通例の大気中における検査で全反
射条件を満足させ、かつ、8面に対する垂直入射及び0
面での反射光の垂直角度での取り出しを可能とするため
に二等辺直角プリズムを用いたが、本発明においてはこ
れに限定するものでなく、三角プリズムであればその形
態等に関係なく用いることができる。
In the above-mentioned embodiment, the total reflection condition is satisfied in the ordinary atmospheric inspection, and the normal incidence and 0
Although an isosceles rectangular prism is used to enable light reflected from a surface to be taken out at a vertical angle, the present invention is not limited to this, and any triangular prism may be used regardless of its form. be able to.

また、三角プリズムはその検体を接触させる面が、平滑
なものであってもよいし、任意に粗面化したものないし
凹凸を設けたものなどであってもよい。検体を接触させ
る面すなわち、検体付設面をあらかじめ所定の面粗さに
粗面化加工し、これを用いて検査することにより検体付
設面の面粗さないし検体の面粗さの程度による接触面積
の変化を知ることができ、ひいては実際の被着体に対す
るその面粗さに対応した接触面積の信頼性に優れる推定
が可能となる。
Further, the surface of the triangular prism that contacts the specimen may be smooth, or may be arbitrarily roughened or uneven. The surface that comes into contact with the specimen, that is, the surface with which the specimen is attached, is roughened to a predetermined surface roughness in advance, and this is used for inspection to determine the contact area depending on the surface roughness of the specimen attachment surface or the surface roughness of the specimen. As a result, it is possible to estimate with high reliability the contact area corresponding to the surface roughness of the actual adherend.

本発明の装置において光源は必要であるが、その個数に
ついて限定はなく、単数であってもよいし、複数であっ
てもよく、複数の場合には波長の異なる光線を放射する
ものの併用などであってもよい。
Although light sources are necessary in the device of the present invention, there is no limitation on the number of light sources, and they may be singular or plural, and in the case of multiple light sources, they may be used in combination with those that emit light rays of different wavelengths. There may be.

一方、受光器としては光量の定量が可能なものであれば
制約な(用いることができる。一般には光導電素子、ホ
トダイオードな、とで代表される光センサが用いられる
On the other hand, the light receiver can be used without any restrictions as long as it is capable of quantifying the amount of light. Generally, a light sensor such as a photoconductive element or a photodiode is used.

本発明の方法は、接着剤、粘着テープ等の貼着製品など
の接触面積の定量化のほか、接触面積を判断基準とする
例えばガラス板、フィルムなどの表面平滑性の判定など
にも利用することができる。
The method of the present invention can be used not only for quantifying the contact area of adhesive products such as adhesives and adhesive tapes, but also for determining the surface smoothness of glass plates, films, etc. using the contact area as a criterion. be able to.

また、本発明の装置を画像解析システムと組み合わせて
反射光を画像解析することも可能であり、これによれば
接触部の形状やその接触レベルの分布状態なども知るこ
とができる。
Furthermore, it is also possible to perform image analysis of reflected light by combining the apparatus of the present invention with an image analysis system, and with this, it is possible to know the shape of the contact portion and the distribution state of its contact level.

発明の効果 本発明によれば、三角プリズムを用いた光学的手法で被
着面における光線の反射程度に基づいて接触面積を定量
化するようにしたので、その定量化を高い精度で行うこ
とができ、経時変化による接触面積の微妙な増減なども
判別することができると共に、接触部における接触レベ
ルを判定することも可能である。
Effects of the Invention According to the present invention, since the contact area is quantified based on the degree of reflection of light rays on the adherend surface using an optical method using a triangular prism, the quantification can be performed with high accuracy. It is possible to detect subtle increases and decreases in the contact area due to changes over time, and it is also possible to determine the contact level at the contact portion.

【図面の簡単な説明】[Brief explanation of drawings]

図は本発明の装置の実施例を表した概略図である。 1 :二等辺直角プリズム 2:光源 3 :光センサ 4;粘着テープ A面:検体付設面 8面:光入射面 0面:反射光取り出し面 a・入射光 す二反射光 The figure is a schematic diagram representing an embodiment of the device of the present invention. 1: Isosceles right angle prism 2: Light source 3: Optical sensor 4; Adhesive tape A side: Sample attachment side 8th surface: light incidence surface Surface 0: Reflected light extraction surface a. Incident light double reflected light

Claims (1)

【特許請求の範囲】 1、三角プリズムの三角を構成する第1の面に検体を接
触させ、第2の面より光線を検体に対し入射させてその
反射光を第3の面より取り出し、取り出した反射光を定
量してその値に基づいて検体の接触面積を定量化するこ
とを特徴とする接触面積測定方法。 2、三角プリズムが二等辺直角プリズムである特許請求
の範囲第1項記載の方法。 3、第1の面が直角をなす頂角の対面である特許請求の
範囲第2項記載の方法。 4、検体を接触させる第1の面が粗面である特許請求の
範囲第1項記載の方法 5、検体が感圧性接着剤層等の接着剤層である特許請求
の範囲第1項記載の方法。 6、三角プリズムと、この三角プリズムの三角を構成す
る3面のうちの1面より光線を入射させるための少なく
とも一の光源と、前記三角プリズムの残る2面のうちの
1面で反射して残る最後の面より出た反射光を検知する
ための受光器とからなることを特徴とする接触面積測定
装置。 7、三角プリズムにおける入射光の反射面が粗面である
特許請求の範囲第6項記載の装置。
[Claims] 1. A specimen is brought into contact with the first surface forming a triangle of a triangular prism, a light beam is made incident on the specimen from the second surface, and the reflected light is extracted from the third surface. A contact area measuring method characterized by quantifying reflected light and quantifying the contact area of a specimen based on the value. 2. The method according to claim 1, wherein the triangular prism is an isosceles right angle prism. 3. The method according to claim 2, wherein the first surface faces a right apex angle. 4. The method according to claim 1, wherein the first surface that is brought into contact with the specimen is a rough surface. 5. The method according to claim 1, wherein the specimen is an adhesive layer such as a pressure-sensitive adhesive layer. Method. 6. A triangular prism, at least one light source for allowing a ray to enter from one of the three surfaces forming the triangle of the triangular prism, and a light beam reflected by one of the remaining two surfaces of the triangular prism. A contact area measuring device comprising: a light receiver for detecting reflected light emitted from the last remaining surface. 7. The device according to claim 6, wherein the triangular prism has a rough reflecting surface for incident light.
JP25722685A 1985-11-16 1985-11-16 Method and apparatus for measuring contact area Pending JPS62116204A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25722685A JPS62116204A (en) 1985-11-16 1985-11-16 Method and apparatus for measuring contact area

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25722685A JPS62116204A (en) 1985-11-16 1985-11-16 Method and apparatus for measuring contact area

Publications (1)

Publication Number Publication Date
JPS62116204A true JPS62116204A (en) 1987-05-27

Family

ID=17303421

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25722685A Pending JPS62116204A (en) 1985-11-16 1985-11-16 Method and apparatus for measuring contact area

Country Status (1)

Country Link
JP (1) JPS62116204A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0459418A2 (en) * 1990-05-29 1991-12-04 Dainippon Screen Mfg. Co., Ltd. Gap measuring device and gap measuring method
US5513537A (en) * 1992-02-25 1996-05-07 The Boeing Company Method and apparatus to determine composite prepreg tack

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5513446A (en) * 1978-07-14 1980-01-30 Agency Of Ind Science & Technol Uneven pattern input device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5513446A (en) * 1978-07-14 1980-01-30 Agency Of Ind Science & Technol Uneven pattern input device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0459418A2 (en) * 1990-05-29 1991-12-04 Dainippon Screen Mfg. Co., Ltd. Gap measuring device and gap measuring method
US5225690A (en) * 1990-05-29 1993-07-06 Dainippon Screen Mfg. Co., Ltd. Gap measuring device and method using frustrated internal reflection
US5513537A (en) * 1992-02-25 1996-05-07 The Boeing Company Method and apparatus to determine composite prepreg tack

Similar Documents

Publication Publication Date Title
EP0001178B1 (en) An optical sensing instrument
US7586614B2 (en) System and method for self-referenced SPR measurements
EP0617273A3 (en) Optical method and device for analyzing substances on sensor surfaces.
US6992770B2 (en) Sensor utilizing attenuated total reflection
US6417924B1 (en) Surface plasmon sensor obtaining total reflection break angle based on difference from critical angle
KR100876257B1 (en) Optical measuring method and device therefor
EP0321836A2 (en) Improved reflectance photometer
KR950014849A (en) Photometric detectors scattered by thin films of colloidal media
JPS62116204A (en) Method and apparatus for measuring contact area
EP0903571A2 (en) Apparatus and method for determining the concentration of specific substances
US5309288A (en) Prismatic device for use with process refractometers
EP0447991B1 (en) Apparatus for measuring the distribution of the size of diffraction-scattering type particles
JPH07113609B2 (en) Adhesion failure area detection method
RU2156437C2 (en) Gear determining surface roughness
US6804007B2 (en) Apparatus for multiplexing two surface plasma resonance channels onto a single linear scanned array
JP3269772B2 (en) Non-destructive refractive index measuring method and apparatus
JP2527459Y2 (en) Contact pressure detector
KR100409204B1 (en) Apparatus and method for measuring diffusion coefficient of metal surface
RU2035721C1 (en) Method of checking transparency of flat light-translucent materials
RU2092789C1 (en) Device measuring surface roughness
JP3877875B2 (en) X-ray sensor and X-ray detection method
JPH0121884B2 (en)
JP3071643B2 (en) Total reflection type refractive index sensor
JPH0330810B2 (en)
JPS61226619A (en) Spectrophotometer using integrating sphere