JPS621039A - Automatic test method - Google Patents

Abstract

PURPOSE:To attain centralized control in a simple way for function tests of various types of devices to be tested by storing previously various test programs in a center controller and extracting the test program corresponding to the device to be tested to load it to the device to be tested via a MODEM. CONSTITUTION:A center controller 1 contains a data file 1c to which various test programs are registered and interfaces 1b and 1a corresponding to an input/output device 4 and an optical data MODEM 2a. The data are transferred between the controller 1 and the devices 3(0)-3(n). In such a case the data are converted into the optical data, e.g., laser beams by optical data MODEM 2a and 2b. The devices 3(0)-3(n) are connected to the corresponding optical MODEM 2b(0)-2b(n) respectively. Then the test program sent via an optical data MODEM 2b(i) is loaded to the corresponding memory. The result obtained from the test carried out by the corresponding test program is sent back via the optical data MODEM 2b.

Description

[Detailed Description of the Invention] [Summary] An automatic testing method for 1n information processing equipment, in which various testing programs are stored in a center control equipment, and one operator can test the corresponding equipment under test. By extracting the program from the center control device and loading it into the device under test via the modem, it becomes possible to centrally manage the functional tests of multiple types of devices under test in a simple manner.

[Industrial application field]

The present invention relates to an automatic test method that connects a plurality of types of devices under test and a center control device via a data modem and centrally manages the exchange of test programs and test result information.

As the usage of information processing devices expands, various types of terminal devices to be connected to the information processing devices are being developed. Along with this, various dive control devices for controlling these terminal devices have been developed and put into practical use.

In factories that manufacture such devices, it is a prerequisite to carry out shipping tests accurately and efficiently to ensure high quality.

[Prior Art and Problems to be Solved by the Invention] As a prior art, an automatic testing method for a plurality of types of terminal control devices will be described as an example.

FIG. 3 shows a block diagram illustrating a conventional automatic testing method.

Figure 3 shows a terminal control device 3 having a modem interface.
FIG. That is, when a plurality of terminals exchange data and control signals with a partner device connected through a communication line via a data modem, the terminal control device 3 controls the communication line at that time and controls the operation of the plurality of terminals. Take control.

This control device 3 includes a main control unit 31 (hereinafter referred to as CPU 31) that controls the operations of various functional blocks within the control device 3, and an input/output medium 4.
It is composed of an input/output interface 32 that controls connection with the computer, a memory 33 that stores various data, and an adapter section 34 that has various interface functions and control functions for connecting to the outside, such as a modem interface.

Conventionally, various methods have been implemented to test the control device 3 having the above-mentioned functions, but one of them is to test a separately created test program on the input/output medium 4.
is loaded into the internal memory of the CPU 31, and based on this test program, various functional blocks (CP
U31. Input/output interface 32. Memory 33. A method of testing the adapter section 34, etc.) has been implemented.

The test contents include, for example, (1) various command tests sent to each terminal under control, (2) interrupt test for a host device (not shown), (3) function test of the memory 33, (4) Control function test of each terminal under control, (5)
Performs a line control function test connected to a host device (not shown). In this method, the function test itself is automatically performed using a test program, but the method of loading the test program depends on the type of control device 3. Since the test methods and test methods are different, a large number of operators with the technical ability to accurately handle these are required.

In addition, if the control device 3 does not have a display function in the event of a failure, a display function compatible with the control device 3 may be prepared, or if a display function is not connected, a specialist engineer with a higher level of expertise will be required to confirm the presence or absence of a failure. There are various problems such as the necessity of

[Means for solving problems]

FIG. 1 shows a system diagram of the principle of the present invention.

The system in FIG. 1 includes: a center control device 1 that centrally manages functional tests of devices under test 3(0) to 3(n); and the center control device 1 and devices under test 3(0) to 3(n).
Optical data (for example, Laserhi,
Optical data modems 2a and 2b that convert into
and corresponding optical data modems 2b (0) to 2b (n)
, loads a test program sent via the corresponding optical data modem 2b(i) into its memory, and returns the results of the test using the test program via the optical data modem 2b. Device under test 3 (0) ~
3(n).

The center control device 1 also has a data file 1c in which various test programs are registered, and an interface lb corresponding to the input/output device 4 and the optical data modem 2a.

1a.

[Effect]

Test programs and test information corresponding to multiple devices under test are registered in the data file of the center control device, and data is exchanged between the device under test and the center control device via a data modem. By centrally managing the functional tests of multiple devices under test, it becomes possible to easily perform functional tests on a large number of multiple types of devices under test with a small number of personnel.

〔Example〕

The gist of the present invention will be specifically explained below with reference to an embodiment shown in FIG.

FIG. 2 shows a test system diagram illustrating the invention in detail. Note that the same reference numerals indicate the same objects throughout the figures.

The test system of this embodiment shown in FIG. 2 is an automatic test method in which the test contents are divided into, for example, a functional test line 5a, a high temperature test line 5b, and a final confirmation test line 5c, and the device under test 3(i) is It is assumed that this is the same as the control device 3 explained in FIG.

It should be noted that the plurality of devices under test 3(i) connected to each of the test lines 58 to 5c are the same type of devices under test 3(i).
).

The center control device 1 includes three modem interfaces 1a (la(0) to 1a(2)) explained in FIG. 1, and an input/output interface 1b and data file lc (in this embodiment, A CPU 1d that controls various operations of the center control device 1; and a control program file 1e that stores control programs that instruct the CPU 1d to perform various control operations.

In addition, the devices under test 3 (
i) Maximum of 8 units, each test line 58-5c
Movement to the location shall be carried out using an automated guided vehicle (not shown), etc. In this embodiment, as shown in FIG. 2, the device under test 3(i) and the optical data modem 2b(i) housed in the functional test line 5a are
), optical data modems 2b (0) to 2b (7).

Furthermore, in the high temperature test line 5b, the devices under test 3(8) to 3
(15), optical data modem 2b (8) to 2b (15)
, in the final confirmation test line 5c, the devices under test 3 (16) ~
3 (23), optical data modem 2b (16) to 2b (
23), and each optical data modem 2b (0) to 2b (
23), corresponding addresses are assigned to each of them.

On the other hand, the optical data modems 2a (0) to 2a (2) installed on the center control device l side correspond to each test line 58 to 5c, respectively.
It faces the optical data modem 2b(i) inside and exchanges optical data (data is exchanged by emitting light beams at intervals of about 10 m).

The functions of the center control device 1 of this system can be broadly classified as follows. That is, (1) Information registration of the device under test 3(i),
i) The station number of the device (e.g. 3(0)
) to 3(n), etc.), the model and machine number are registered in the data file lc of the center control device 1.

The registration is input by the operator from the device under test 3(i), and upon completion of the input, the center control device 1 is notified and displayed on the display of the input/output device 4.

(2) Registration of test program: Register the test program of the device under test 3(i) in the data file 1c of the center control device 1. Thereby, the device under test 3(i) is tested.

(3) Registration and modification of operation data This function is for registering and modifying input data necessary when running a test program, and its processing method is as follows.

(al) At the start of testing the device under test 3(i), if it is necessary to change various data, the operator issues a change instruction using the input/output device 4.

(Input the number of the device under test 3 (i) whose bl is to be changed and the name of the test program using the input/output device 4.

(C) Information to be changed is "instruction code" (change position),
This is done by inputting "data" (change data).

(d) The center control device 1 changes the registration upon completion of information input.

(4) This is a function to control the start/resume/interruption/end of the test, and to notify the test start, interruption, and end to the device under test 3 (i) from the center control device 1, and the operator can display the input/output device 4 display. Perform operations according to instructions from

The operation is ■Test start operation, which starts distribution of the test program.

■Test restart operation performed when restarting a test after an error occurs. ■Test suspension operation when you want to temporarily suspend the test for some reason during normal operation. There is a test termination operation, etc. when all tests are completed and the device under test 3(i) is disconnected from the center control device 1.

(5) Automatic distribution of test programs. This function distributes the test programs of the device under test 3(i) to the optical data modems 2a(0) to 2a(2) via the modem interfaces 1a(0) to 1a(2). , 2b(0) ~
2b (23) to load each device under test 3(i).

(6) Monitoring of exam time; There is a function to manage the progress of the exam.

(7) Fault separation management: This is a function to manage the fault details of the device under test 3(i), and when a fault occurs, the device under test 3(i) notifies the center control device 1 of the fault code and details. do.

(8) Tested processing: This is a function of notifying the higher-level system (not shown) of tested information when the device under test 3(i) has completed all steps up to the final confirmation line 5c.

As described above, the test system of this embodiment has easy wiring because it connects the center control device 1 and each device under test 3(i) wirelessly, and can be used with various models of devices under test. Tests for device 3(i) can be managed collectively.

In other words, a small number of personnel can test multiple devices under test 3 (i) of multiple types.
) can be tested quickly with a simple configuration and easy operation.

〔Effect of the invention〕

According to the present invention as described above, wiring is easy because the device under test and the center control device are faced to each other through an optical data modem, and furthermore, the function tests of multiple types of devices under test can be centrally managed. This method has the advantage that functional tests of a large number of devices under test of a plurality of types can be performed quickly and easily with a minimum number of personnel.

[Brief explanation of drawings]

FIG. 1 is a principle system diagram of the present invention, FIG. 2 is a test system diagram explaining the present invention in detail, and FIG. 3 is a block diagram explaining a conventional automatic test method. In the diagram, 1 is center + 11? wholesale equipment, la, 1a(0) to 1a(2) are modem interfaces, lb, 32 are input/output interfaces, 1c is data files, ld, 31 is CP(1; 1e is control program file, 2a, 2a(0) ) ~ 2a (2), 2b (0) ~ 2b (
n) is an optical data modem; 3 is a control device; 3(0) to 3(n) are devices under test; 33 is a memory; 34 is an adapter section;
5a shows the input/output device, 5a shows the function test line, 5b shows the high temperature test line, and 5C shows the final confirmation test line.

Claims (1)

[Claims] A functional testing method for a device that has a modem interface and controls the exchange of signals with a plurality of terminals under its control via the modem interface, the method comprising: storing various test programs; data file (
1c), and transmits the test program and the function test results conducted using the test program to the modem (2a, 2b).
) and a plurality of devices under test (3(0) to 3(n) connected through the modem interface of the center control device (1)).
), and the test program stored in the data file (1c) in the memory of the device under test (3(0) to 3(n)) is transferred to the modem (2a , 2b), and the test program loads the device under test (3).
An automatic test method characterized by carrying out the functional tests (0) to 3(n)).