JPS6162109A - Control panel inspection instrument - Google Patents

Abstract

PURPOSE:To substantially reduce the number of elements selectively operated and to reduce the simulation time by automatically setting initial condition only for the element group which relates to the element of which output results are required. CONSTITUTION:A control panel monitoring device 20 is composed of design results a monitoring device 100 and a products monitoring device 200 and also an M/T 300 which connects these two devices. Also a pattern input system 50 of the device 100 consists of a mainframe computer 51, an input device 52, and a graphic display 53. Since it is possible to automatically set the initial condition only for the element group which relates to the element whose output results are required to be monitored, the object of simulation can be limited. Namely, operation at each time is necessary while establishment of initial value is only one time, therefore processing time will be reduced by limiting the object of operation. Thus, the number of elements to be selectively processed will be reduced and simulation time will be substantially shortened.

Description

[Detailed Description of the Invention] [Field of Application of the Invention] The present invention relates to a control panel inspection device, and is a device suitable for automatic inspection of a control panel incorporating a microcomputer (hereinafter referred to as a microcomputer). Regarding.

[Background of the invention]

The outline of the procedure for designing, manufacturing, and inspecting the control panel is shown in Figure 1. Namely.

Step 101: 571 Based on the customer's request etc., IIl!
Create an operating plan that describes the required functions of the control panel.

Step 102: Design a control panel to satisfy the operating plan.Since control panels in recent years often incorporate microcomputers, their designs can be roughly divided into those related to hard logic and those related to microcomputer software.

Step 103: Inspect the design results to see if the i-meter satisfies the operating plan.

Step IQ4: Manufacture #t8 board based on the design result. Hereinafter, the manufactured control panel will be referred to as a product.

Step 105: Test pattern (information regarding various input signals to the product, hereinafter also referred to as test pattern) necessary to confirm that the product satisfies the function of the driving plan in the process of steps 102 to 103 above. and output patterns (information regarding various output signals when manufactured correctly) are separately created.

Step 106: Apply the input pattern to the product and check whether it matches the output pattern.

In conventional product inspection, an inspector applies a test pattern using a snap switch or the like, and another inspector checks whether the test pattern matches the output pattern using an ammeter or the like. Conventional inspection methods have the following problems.

(1) Since it is performed manually, it takes a lot of time and manpower to give the test pattern and check whether it matches the output pattern.

(2) The effort required to create an output pattern corresponding to the test pattern from the driving plan; this study was also done manually, which required a lot of time and personnel, and sometimes gave the wrong output pattern. .

(3) Since design inspections are performed by humans while looking at developed connection diagrams, it takes a lot of time and requires one person, and errors in the design may not be discovered.

If a mistake is not discovered at this stage and is discovered after product inspection or operation, design changes or product modifications may be required, which may lengthen the overall process.

The above trends are becoming stronger as control systems become more complex.

In order to solve the above problem, a method using an electronic computer to inspect the control panel (Coiaputar Aided Tas
ting.

(hereinafter referred to as CAT) is being considered (Special W1 1983)
This invention introduces an electronic computer to inspect the design results and products of a control panel controlled using microcomputer software and hard logic, and uses magnetic tape (hereinafter abbreviated as M/T) to CAT of the design and CA of the product, including the controlled object, connected by a floppy disk
It is distinctive in that it integrates T. The outline of this method is as shown below (see the above patent application for details).

[Inspection of design results] (Corresponds to step 103 in Fig. 1) (a) When the design is completed, input the functions of the control object (pump, boiler, etc.) into the computer.

(b) The movement of the control panel and the controlled object when a test pattern (normal operation signal from the operator, abnormal operation signal, input signal from the controlled object, etc.) created using the test pattern creation macro language is input. Perform a simulation (mock experiment) within an electronic computer.

(c) An inspector checks whether there are any problems with the simulation results output on the graphic display.

(d) If there is a problem, modify the design and repeat steps a) to (c). If there is no problem, save the test pattern and output pattern necessary for product inspection in the M/T.

[Product inspection] (corresponds to step 106 in Figure 1) (
e) Control GL After manufacturing, connect the product with a tester using a microcomputer.

(f) The above MZT is tested through a tester using a microcomputer.
The test pattern in the M/T is applied to the product, and whether the output matches the corresponding output pattern in the M/T is automatically checked in the tester.

By implementing (a) to (d), it becomes possible to reduce the creation of incorrect output patterns and to reduce design errors, which leads to problem (2).

(3) can be solved. Moreover, by implementing (e) and (f), it is possible to reduce the number of inspection personnel and time, and problem (1) can be solved. Furthermore, (a) to (d)
) and (e) to (f) are connected by M/T, thereby reducing the effort required to input the output pattern into the tester.

We hope to further improve the control panel inspection equipment with these features.
) In order to speed up the simulation, there is an apparatus that incorporates a method of selectively calculating only the portion where the signal changes (see Japanese Patent Application No. 59-58251).

The control panel inspection device improved in this way also had the following problems.

(1) In the actual control panel, the initial state that is naturally set (e.g. the OFF state of the relay coil) must be given as the initial condition in the simulation6.
If humans try to enter the conditions manually, a lot of manpower is required.
l,! :.

(2) Most of the initial conditions can be automatically set depending on the type of element, but doing so increases the number of elements that are selectively operated on, lengthening the simulation time, and making it less interactive. [Objective of the Invention] An object of the present invention is to provide a control panel inspection device based on a simulation method that solves the above-mentioned problem.

[Summary of the invention]

In order to achieve the above object, the present invention is characterized in that it employs a method of automatically setting initial conditions only for the element group that follows the element whose output result is desired to be known. The reason why this method can be expected to shorten the simulation time is that the number of elements that are selectively operated on is significantly reduced.

[Embodiments of the invention]

A first embodiment of the present invention will be described below with reference to FIGS. 2 to 13.

As shown in FIG. 2, this inspection device 20 includes a design result inspection device 100, a product inspection device 200, and an M/T connecting these.
Consisting of 300.

The 49 components of the design result inspection device 100 and its input portion are as shown in FIG. In other words, the input is CAD
(Computer Design)
(Kobayashi et al. “C: AD/CAM System A in Control Panels and Distribution Boards”
”Hitachi Review Vol. 1.62.&7 (1980) pp
5 to 10), this system 50 mainly uses a large-sized computer (for example, HITACM-200H) 51. It consists of an input device 52, a graphic display 53, a disk 54, and a graphics processing program 55.

In the process of designing the control panel's hard logic and microcomputer software, this CAD system is used to input, modify, and save the hard logic and microcomputer software in the form of graphics. An input device 52 is used for inputting and editing, a graphic display 53 is used for displaying graphic input results, and a disk 54 is used for data storage.

Further, in order to control these, a large-sized computer 51 and a graphic processing program 55 are used.

The graphic data stored on the disk 54 is input to the design result inspection device 100 when inspecting the design results.The device 100 includes a large computer 101, an input device 102,
Graphic display 103, disk 104, M
/T9i operating device 105, line printer 106, and program group 150.

The four components of the program group 150 and their mutual relationships are as shown in FIG. That is, the programs include a simulation model creation program 151, a simulation execution program 152, and a test pattern editing program 1.
53, a display program 154, and an output pattern editing program 155.

The simulation model creation program 151 is CAD
Hard logic graphics data, microcomputer software graphics data, and control object graphics data stored on the disk 54 for the system 50 are mutually integrated and converted into an element connection table convenient for simulation.
4 (for details about this program, see PP12-13 of Japanese Patent Application No. 1151348/1983).

At this point, I will explain the element connection table.For example, the graphic data 910 of the microcomputer software as shown in FIG.
, an element connection table 920 as shown in FIG. 6 can be created.

In FIG. 5, boxes represent elements (used in the same sense as elements), such as AND, aR.

AM etc. represent the type of element.6 For example, AND represents logical product, OR represents logical sum, and AM represents analog memory. AND and OR are digital elements,
AM is an analog element.

104, 105, etc. are sequence numbers representing the calculation order. Also, 0083,0084. AO71 etc. represent input/output signals.1For example, the input to the AM element is DO.
83, DO84, AO71°D088, indicating that the output signal is A073.

The execution order numbers, element symbols, control parameters, input signals, and output signals shown in FIG. 6 can be obtained directly from the microcomputer software graphic data or by partially converting them. Further, the output signal value is given by a simulation execution program described later.

Although the above example describes graphic data of microcomputer software, a similar table can be created for graphic data of a controlled object. Also, if you pre-process the figure data for hard logic, you can create a similar table.For example, as shown in FIG.
930 can be converted into a logic diagram 940 similar to that of microcomputer software, as shown in FIG. 8, and once such a logic diagram is obtained, it can be converted into a table 950 as shown in FIG. can.

The conceptual structure of the simulation model created in this way is shown in FIG. 4
02. The controlled object model 4ρ3 and the operation panel model 404 are
They are coupled by various signals 405-411 as shown in FIG. The operation panel here is a type of hard logic model of a control panel, and has an input/output section for the operator.

Next, the test pattern editing program 153 shown in FIG. 4 will be explained. When a test item is input using the input device 102 using a test pattern creation language, the test pattern editing program 153 creates a temporal change in the state of the specified input signal. Here, the targets of 1 normal input designation are the manual input signal 405 and the control target initial input signal 406 in FIG. In addition, the test pattern
.

- The macro language for creating macros has been developed for various tests, and can be improved.

Next, the simulation execution program 152 shown in FIG.
An outline of the processing will be explained using FIG. 11.

Step 800: Input the simulation model created by the simulation model creation program 151 (saved in the form of an element connection table).

Step 810: Test pattern editing program 153
Input the test pattern created by .

Step 820: End if the simulation has been completed for all test patterns, otherwise.

Perform the following operations.

Step 830: Input the simulation time and simulation time step.

Step 840: Set initial conditions necessary for simulation, such as the initial state of the control panel. This method will be described in detail later.

Mechitube 860: A method for performing simulation under the above circumstances and estimating the output pattern from the control panel will be described in detail later.

Step 880: Output the simulation results.

Return to step 82'O.

This completes the explanation of the outline of the processing in the simulation execution program 152. Before explaining the initial value setting method, the simulation execution method will be explained first.

A feature of this simulation method is that the output signal is selectively calculated only when the input signal changes for each element, making it possible to speed up the simulation. A changing phenomenon is called an event, and its processing procedure will be described below along with FIG. 12.

Step 861: Search the test pattern corresponding to the target test item, and register the signals whose signal values change in the event table for each time.

Step 862: Check whether all times have been completed. If it is completed, the simulation using the test pattern corresponding to one test item is completed. Otherwise, advance the time increments by one step and perform the following steps for the next time.

Step 863: Search the event table at time t.0 Next, the cutting edge element names (or numbers) of these event signals are searched by the element connection cheeples, and all are restored. In the example of FIG. 5, if D083 is an event signal, the elements to be restored are the OR element of T104 and the AM element of T108.

Step 864: Register the above restored elements in the calculation order table.

Step 865: Extract the smallest element of the calculation execution order designation value (specified by the simulation model creation program 151; if there is no designation, order it arbitrarily here) from the elements in the calculation order table: sk . In the above example, the OR element of T104 has a smaller order designation value than the AM element of T108, so the former is extracted.

Step 866: Check whether there is any ik to be taken out. If it does not exist, the process advances to step 867; if it exists, the process advances to step 868.

Step 867: The fact that there are no elements to be extracted means that all simulations for one time have been completed, so the calculated value of the signal specified for output is extracted from the output signal value tank of the element connection table and stored in the output storage table. After the transfer, one time passes and the process returns to step 862.

Step 868: For the selected element k, a subroutine describing the function of the element is called, and the output value of the target element is calculated using the calculated value corresponding to the input signal described in the element connection table as input.

□ Step 869: Search the element connection table,
After checking whether the output value is the same as the value one time ago, it is entered in the output column of the element connection table. If they are the same, the output signal is not an event, so the calculation for the next element is not performed and the process goes to step 865; if they are not the same, the process goes to the next step.

Step 870: Search the element connection table for elements of output light to the element, and register these elements in the calculation order table.

Step 871: Check whether the output of the financial element at the next time changes due to the change in the output at the current time. Whether or not it changes can be automatically determined depending on the type of element. For example, in FIG. 5, it is known that AND and OR do not change, but AM changes. Other variables that change include an integral element, a W1-like differential element, etc., and these elements will be referred to as elements with self-feedback.

If the output changes at the current time, Therefore, the output at the next time will not change. If not, go to step 865. If not, go to the next step.

Step 872: Register the input signal to the element in the event table at the next point in time, and return to step 865. The processing here is for replacing elements that include self-feedback in which the output changes even if the input to the element does not change.

This concludes the explanation of the simulation method.

This method allows selective calculation even if there is an element including self-feedback, and enables high-speed simulation, and is a modification of the method described in Japanese Patent Application No. 58251/1983.

Next, a method of setting the initial value at 840 in FIG. 11 will be explained. The reason why such an initial value setting method is necessary is as follows.

(1) The initial state that is naturally set in an actual control panel (for example, the OFF state of a relay coil) must be given as an initial condition in the simulation.

(2) Most of the initial conditions can be automatically set depending on the type of element, but if this is done, the number of elements to be selectively operated on will increase at the first time, and once the operation starts, , an integral element, or a pseudo-differential element that includes self-feedback, there is a high possibility that calculations will have to be performed at subsequent times, increasing the simulation time.

Therefore, we devised a method to selectively set only the correct initial state of the element corresponding to the output signal whose value we want to know. This method will be described along the lines of FIG.

Step 841: Clear the element connection table output field by X values. Here, the X value can be any value, and the element to which the X value is input is not calculated.

Step 842: Clear the event table, calculation order table, and search table at each point in time to zero.

Step 843: Register the element Na whose value you want to know in the search table. In the example of FIG. 8, if one wants to know the status of the lamp Nα13, Nα13 is registered in the search table.

Step 844: Check whether any elements remain in the search table. If no elements remain, the initial value setting is completed. Otherwise, go to the next step. In the above example, Nα13 remains, so proceed to the next step.

Step 845: Set element (&i) in the search table to 1
Select one and set the processed flag. In the above example, i is 13.

Step 846: Search for the input source element j of the element owner using the element connection table. In the above example, j is 12.

Step 847: Check whether the processed flag is set. If the person is standing, go to step 848; if not, go to step 849.

In the above example, it is not standing, so Proceed to step 849. here Processing is done by creating feedbars between elements. Processing may not end due to This is a measure to deal with such issues.

Step 848: Discard element j and return to step 844.

Step 849: Check whether the input source element exists. If not, return to step 844, and if it exists, proceed to the next step.

Step 850: Check whether the element connects directly to the bus (+). If not connected, go to step 852.

Otherwise, go to the next step.

Step 851: Register element j in the calculation order table. This is because the hard sequence is calculated from the bus (+) side 91), so anything that is connected to the signal whose value you want to know and that is directly connected to the bus (+) is treated as an event.

Step 852: The element type is coil, pseudo coil (
(simulates the operation on the switch to the state of the coil), and checks whether it is a timer. If not, proceed to step 854; if so, proceed to the first step.

Step 853: Set the output value of element j to 1 value. Here, the value 1 is 0 when used as an input value, and is a value that is treated as an event even when the value 1 is replaced by O through calculation. By doing so, the initial state of the coil etc. can be automatically set.

Step 854: Register input source element j in the search table and return to step 844.

This concludes the explanation of the initial value setting constant force method. In the above example, the value ■ is set and both elements are Nα10'.

11.7' and 8.14, making a total of 5 pieces. By setting the initial values in this way, the objects to be simulated can be limited. The initial value is set once, but simulation requires calculation at each time, so
By limiting the target, processing time can be expected to be shortened.

This concludes the explanation of the simulation execution program processing method.

The functions and configurations of the display program 154 and output pattern editing program 155 in FIG.
It is the same as the control panel inspection device of No.-115848. Further, the function and configuration of the product inspection apparatus 200 shown in FIG. 2 are also the same as those of the above-mentioned apparatus.

Next, as a second embodiment of the present invention, the test pattern input method for the design result inspection apparatus is such that the test pattern can be directly input using a control panel implementation diagram configured on a graphic display. The apparatus will be explained with reference to FIGS. 2 and 3, and FIGS. 14 and 15.

As shown in FIG.
/T 300.

The configuration of the design inspection apparatus 100 is as shown in FIG.

The configuration and mutual relationships of the program group 150 are as shown in FIG. That is, the program includes a simulation model creation program 151, a simulation execution program 152, a test pattern editing program 153, a display program 154, an output pattern editing program 155, and an input operation processing program 156.

The input operation processing program 156 is a program that has a function of converting a signal input from the input/output device 120 and passing it to the test pattern editing program 153, or outputting a message to guide test pattern input.

Below, as an example of an input method using the control panel implementation diagram on the display, when switch A is turned on, lamp 1 (hereinafter referred to as L1) lights up, and when switch B is turned on, lamp 2 (hereinafter referred to as L2) is turned on. The input method for the control panel which has the function of turning on the light and turning off both LL and L2 when both switches A and B are turned on will be explained with reference to FIGS. 14 and 15.

(1) Construct an implementation diagram (in this example, the screen 132) of the control panel to be inspected on the graphic display 121.

(2) Input a signal to turn on switch A on the screen 132 and result confirmation data (in this example, L1 lights up) using the keyboard 123 (or tablet 122).

(3) The input signal is converted by the input operation program 156 into data for the test pattern editing program 153, and then passed to the test pattern editing program 153.

(4) The signal passed to the test pattern editing program 153 is processed by the simulation execution program 1 in the same manner as the processing flow of the program group of the conventional design result inspection device.
The resulting signal processed in step 52 and input to the one display program 154 is passed.

(5) The display program 154 is executed on the display 121
The display of devices (switches, lamps, etc.) on both sides of the device is changed according to the resulting signal.

(6) The inspector confirms that switch A on both sides displays the ○N state and that Ll lights up at the same time, and then inputs the following (
Turn off switch A and turn on switch B.

(7) Ll on one side as in (3) to (5)
goes out and L2 lights up.0th order.If the ON signal is input to switch A while switch B remains ON, L2 goes out.

(8) If you enter the end value of the test pattern, the test management screen 131 at the top of both sides will indicate whether the test has passed (or failed).
Test result information such as

By switching the screen mode, it is possible to display test results in graphs, etc.

By outputting guide messages to support the inspector's input on the command screen 133 at the bottom of the screen, input operations can be easily performed while looking at the display. Furthermore, for products for which it is difficult to input using a control panel implementation diagram, it is possible to use the conventional input method using a macro language for creating test patterns.

Note that the control panel mounting diagram configured on the display can be easily realized by using a control panel mounting CAD database.

This concludes the explanation of the input method using the control panel implementation diagram.

A simulation model creation program 151 and a simulation execution program 152 in FIG. The functions and configurations of the Eggplant 1-Putter 2 program 153 and the display program 155 are described in patent application number (3183
01720) is the same as the control panel inspection device. Further, the function and configuration of the product inspection apparatus 200 shown in FIG. 2 are also the same as those of the above-mentioned apparatus.

This concludes the description of the embodiment of the control panel inspection device.

〔Effect of the invention〕

The present invention has the following effects.

(1) By using the control panel implementation diagram on the graphic display, test patterns can be input while imagining operating the actual control panel, making the input work easier and less likely to make input errors.

(2) The same inspection that is carried out at the LIU product inspection stage can be carried out at the design completion stage, so the inspection work becomes simpler.

(3) Compared to conventional control panel inspection devices, the effort required to input the initial state can be reduced, and the range of simulation is limited, so simulation time is reduced, thereby making it possible to shorten the inspection process.

[Brief explanation of drawings]

Figure 1 is a schematic diagram of the procedure for designing, manufacturing, and inspecting a control panel, Figure 2 is an overall configuration diagram of the control panel inspection device, Figure 3 is a configuration diagram of the design result inspection device and its input section, and Figure 4 is a configuration diagram of a program for a design result inspection device, FIG. 5 is a diagram showing an example of graphic data, FIG. 6 is a diagram showing an example of an element connection table,
Figure 7 shows an example of the hard sequence part, Figure 8 shows its logical diagram, Figure 9 shows part of its element connection table, and Figure 10 shows the configuration of the simulation model and signal flow. Figure 11 is a schematic processing procedure diagram of the simulation execution program, Figure 12 is a diagram showing the simulation execution procedure, Figure 13 is a diagram showing the initial value setting method, and Figure 14 is the configuration of the program for the design result inspection device. FIG. 15 is a diagram showing a configuration example of a test pattern input/output device. 20... Control panel inspection device, 100... Design result inspection device, 20o... Product inspection device, 300... M/T
, 500...Control panel product, 120...Test pattern input/output device. Port No. 11 Port No. 12

Claims (1)

[Claims] 1. In a control panel inspection device using a computer, a control panel model that simulates a design result of a control panel, a controlled object model that simulates a controlled object controlled by the control panel, and a control panel model that simulates a controlled object controlled by the control panel, and A control panel design that automatically sets the initial state of the simulation target and extracts only the range related to the output you want to know, when inputting test input patterns into the computer and simulating the operation of the above model on the computer. a result inspection means; an external storage means for storing an output pattern determined to be correct among the output patterns indicating the inspection results and an input pattern corresponding to the output pattern; and a control manufactured based on the design result inspected by the inspection means. When a test input pattern is read from the storage means and applied to the control panel, an operation is performed to check whether the output pattern output from the control panel matches the corresponding pattern in the storage means. A control panel inspection device comprising: product inspection means for inspecting the manufactured control panel. 2. In a computer-based control panel inspection device, the design results of the control panel, a simulated model representing the control object controlled by the control panel inspection device, and a test input pattern for the model are directly displayed on both sides of the control panel. an input means for inputting an input pattern, an inspection means for inspecting the design result by simulating the test input pattern in a computer, and an output pattern corresponding to an output pattern determined to be correct among the output patterns indicating the inspection results. an external storage means for storing the input pattern; and an output output from the control panel when the test input pattern is read from the storage means and applied to the control panel manufactured based on the design result inspected by the inspection means. A control panel inspection device comprising: product inspection means for inspecting the manufactured control panel by performing calculations to check whether the pattern matches a corresponding output pattern in the storage means.