JPS61287042A - Optical image pickup device - Google Patents

Optical image pickup device

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Publication number
JPS61287042A
JPS61287042A JP60127619A JP12761985A JPS61287042A JP S61287042 A JPS61287042 A JP S61287042A JP 60127619 A JP60127619 A JP 60127619A JP 12761985 A JP12761985 A JP 12761985A JP S61287042 A JPS61287042 A JP S61287042A
Authority
JP
Japan
Prior art keywords
focus error
error signal
pickup device
lens
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60127619A
Other languages
Japanese (ja)
Inventor
Hisashi Suemitsu
末光 尚志
Takashi Nishio
隆 西尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pioneer Corp
Original Assignee
Pioneer Electronic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Electronic Corp filed Critical Pioneer Electronic Corp
Priority to JP60127619A priority Critical patent/JPS61287042A/en
Publication of JPS61287042A publication Critical patent/JPS61287042A/en
Pending legal-status Critical Current

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  • Automatic Focus Adjustment (AREA)
  • Optical Recording Or Reproduction (AREA)

Abstract

PURPOSE:To miniaturize an optical image pickup device forming a knife edge in common use with a reflection film to the side face of a polarized prism and using the reflection film so as to fold the optical path of a focus error signal detection optical system. CONSTITUTION:The knife edge is formed with a thin film in common use for a reflection film 7 in a focus error signal detection optical system using the knife edge, the reflection film 7 is formed directly to a 1/4 wavelength plate 6 sticked to a polarized prism 3 and the reflection film 7 folds the optical path of the focus error signal detection optical system. Thus, the length of the focus error signal detection optical system is reduced. Further, the knife edge which has been constituted conventionally by a metallic plate is formed by the reflection film 7 to attain light weight.

Description

【発明の詳細な説明】 「産業上の利用分野」 本発明は光ディスクに記録された情報を光学的に検出す
る光学式ピックアップのレーザスポットを、常時、正確
に光ディスクの記録情報面上に位置させるようにした光
学式ピックアップ装置に関する。
DETAILED DESCRIPTION OF THE INVENTION "Industrial Application Field" The present invention always and accurately positions the laser spot of an optical pickup that optically detects information recorded on an optical disc on the recorded information surface of the optical disc. The present invention relates to an optical pickup device.

「従来の技術」 従来の、この種の光学式ピックアップ装置として第6図
で示すものがあった0図面は焦点誤差信号検出光学系に
ナイフェツジ法を用いたもので、Aは光学的に情報が記
録されたディスクで、Bは光ディスクAの情報を読取る
ためのレーザを発生する半導体レーザ、Cは偏光プリズ
ム、Dは1/4波長板、Eは上記のレーザを光ディスク
Aの記録情報面上に所定のスポットサイズで集光する対
物レンズである。
``Prior Art'' A conventional optical pickup device of this type is shown in FIG. In the recorded disc, B is a semiconductor laser that generates a laser for reading information on optical disc A, C is a polarizing prism, D is a quarter-wave plate, and E is a device that directs the above laser onto the recorded information surface of optical disc A. This is an objective lens that focuses light into a predetermined spot size.

次に、偏光プリズムCの右側に配置する焦点誤差信号検
出光学系は、金属板製のナイフェツジFとフォトダイオ
ード等の光検出器Gにより構成されている。そして、光
検出器Gは、検出系の焦点位置(スポットサイズの最少
となる位置)におかれ、ナイフェツジFは偏光プリズム
Cと光検出器Gの間に置かれる。
Next, a focus error signal detection optical system disposed on the right side of the polarizing prism C is composed of a knife F made of a metal plate and a photodetector G such as a photodiode. The photodetector G is placed at the focal position of the detection system (the position where the spot size is minimum), and the knife F is placed between the polarizing prism C and the photodetector G.

次に2作用について説明する。まず、半導体レーザBか
ら発射したP偏光の光は、偏光プリズムCの偏光膜を透
過し、1/4波長板りにより直線偏光から円偏光に変え
られる。
Next, two effects will be explained. First, the P-polarized light emitted from the semiconductor laser B is transmitted through the polarizing film of the polarizing prism C, and is changed from linearly polarized light to circularly polarized light by a quarter-wave plate.

この円偏光のレーザは対物レンズEにより、光ディスク
Aの信号面に所定のスポットサイズで集光される。そし
て、光ディスクの信号面での反射光は、円偏光の回転方
向が入射時とは逆方向となり、再び174波長板りを透
過することにより、入射時と90”偏光方向が回転した
直線偏光(S偏光)の光となり、偏光プリズムCの偏光
膜面で、焦点誤差信号検出光学系の方向へ反射される。
This circularly polarized laser beam is focused by an objective lens E onto the signal surface of the optical disk A at a predetermined spot size. The reflected light on the signal surface of the optical disk is circularly polarized light whose rotation direction is opposite to that at the time of incidence, and by passing through the 174-wavelength plate again, linearly polarized light whose polarization direction is rotated by 90" from that at the time of incidence ( The light becomes S-polarized light, and is reflected by the polarizing film surface of the polarizing prism C toward the focus error signal detection optical system.

焦点誤差信号検出光学系では、ナイフェツジFは光ディ
スクAの上下動にともない、検出系の光軸を中心として
、光束の1/2を遮光することにより、光検出器G上に
焦点誤差信号を発生させる。そして、この焦点誤差信号
により、光ディスクAに対して光ピツクアップを常時、
正しい位置に保持させるように制御する。
In the focus error signal detection optical system, the knife F generates a focus error signal on the photodetector G by blocking 1/2 of the light beam around the optical axis of the detection system as the optical disk A moves up and down. let Then, based on this focus error signal, the optical pickup is always performed on the optical disc A.
Control so that it is held in the correct position.

「発明が解決しようとする問題点」 しかし、従来の光学式ピックアップ装置は、焦点誤差信
号検出光学系がナイフェツジ法で構成されているので、
該検出光学系が入射光軸に対し垂直方向に長く張り出し
た形となり、光ピツクアップの小型化な困難にする欠点
があった。
"Problems to be Solved by the Invention" However, in the conventional optical pickup device, the focus error signal detection optical system is constructed using the Knifezi method.
The detection optical system has a long protruding shape in the direction perpendicular to the incident optical axis, which has the drawback of making it difficult to miniaturize the optical pickup.

r問題を解決するための手段」 本発明は上記のような欠点を解決するために成されたも
ので、ナイフェツジを偏光プリズムの側面に反射膜を兼
ねて形成し、この反射膜によって焦点誤差信号検出光学
系の光路を折り曲げるようにして、小型化された光学式
ピックアップ装置を提供するのが目的である。
The present invention has been made in order to solve the above-mentioned drawbacks, and a knife is formed on the side surface of a polarizing prism to also serve as a reflective film, and this reflective film is used to reduce the focus error signal. The object of the present invention is to provide a miniaturized optical pickup device by bending the optical path of a detection optical system.

「発明の構成」 以下、本発明を図面の実施例に基づいて説明する。第1
図は本発明に係る光学式ピックアップ装置の概略構成図
で、第2図は同要部の拡大された分解斜視図である。
"Structure of the Invention" The present invention will be described below based on embodiments of the drawings. 1st
The figure is a schematic configuration diagram of an optical pickup device according to the present invention, and FIG. 2 is an enlarged exploded perspective view of the main parts.

図面において、lは光学的に情報が記録された光ディス
クで、2は該光ディスクの情報を読取るレーザを発生す
る半導体レーザ、3は偏光プリズム、4は該偏光プリズ
ム3の光ディスク!側に配置した1/4波長板、5は上
記のレーザを光ディスク1の情報面上に、所定のスポッ
トサイズで絞り込む対物レンズである。
In the drawing, l is an optical disk on which information is optically recorded, 2 is a semiconductor laser that generates a laser for reading information on the optical disk, 3 is a polarizing prism, and 4 is the optical disk of the polarizing prism 3! A quarter wavelength plate 5 disposed on the side is an objective lens that focuses the laser beam onto the information surface of the optical disc 1 to a predetermined spot size.

次に、焦点検出光学系であるが、6は上記の偏光プリズ
ム3の右側面に直接、接着された174波長板、7は該
1/4波長板6の下半分のエリアに成形された薄膜のナ
イフェツジ兼反射膜である。このナイフェツジ兼反射1
III7(以後反射膜と略記する)はアルミニウム膜な
どの金属薄膜を蒸着あるいはスパッタリング法で形成さ
れる。8は偏光プリズム3の左側面に接着された焦点誤
差検出用の2分割光センサ等のフォトディテクタである
。9は偏光プリズム3の右側面に形成された反射膜7の
上位に接着されたトラッキングエラ検出用2分割光セン
サ等のフォトディテクタであ「発明の作用」 次に、上記の実施例の作用について説明する。
Next, regarding the focus detection optical system, 6 is a 174-wave plate directly glued to the right side of the polarizing prism 3, and 7 is a thin film formed in the lower half area of the quarter-wave plate 6. It is a knife and a reflective film. This knife cum reflection 1
III7 (hereinafter abbreviated as reflective film) is formed by depositing or sputtering a thin metal film such as an aluminum film. Reference numeral 8 denotes a photodetector such as a two-split optical sensor for detecting focus error, which is bonded to the left side surface of the polarizing prism 3. Reference numeral 9 denotes a photodetector, such as a two-split optical sensor for tracking error detection, which is bonded on top of the reflective film 7 formed on the right side of the polarizing prism 3. ``Action of the Invention'' Next, the operation of the above embodiment will be explained. do.

まず、半導体レーザ2から発射されたP偏光の光は、偏
光プリズム3の偏光膜を通過し、l/4波長板4によっ
て直線偏光から円偏光に変えられる。この円偏光は対物
レンズ5によって光ディスク1の信号面に集光される1
次いで、光ディスクlの信号面で反射された反射光は、
入射時と逆回転方向の円偏光に変換される。そして、こ
の円偏光は再び、l/4波長板4を通過することによっ
て、今度は90°偏光方向の回転した直線偏光(S偏光
)の光となり、4に光プリズム3の偏光膜で反射され焦
点検出光学系に導入される。
First, P-polarized light emitted from the semiconductor laser 2 passes through the polarizing film of the polarizing prism 3, and is converted from linearly polarized light to circularly polarized light by the 1/4 wavelength plate 4. This circularly polarized light is focused onto the signal surface of the optical disc 1 by the objective lens 5.
Next, the reflected light reflected from the signal surface of the optical disc l is
It is converted into circularly polarized light with the rotation direction opposite to that at the time of incidence. This circularly polarized light passes through the 1/4 wavelength plate 4 again, and this time becomes linearly polarized light (S-polarized light) with the polarization direction rotated by 90 degrees, and is reflected by the polarizing film of the optical prism 3. Introduced into the focus detection optical system.

そして、焦点誤差信号検出光学系に入った光は、1/4
波長板6を通過することにより、再び円偏光に変換され
、該174波長板6の下半分のエリアに形成された反射
膜7により、光束の上半分が透過され、かつ下半分が反
射されて光路を折り曲げられる0反射膜7での反射によ
り入射とは逆回転の円偏光となった光は、再び1/4波
長板6を通過することにより、入射時と90”だけ偏光
方向が回転した(直線偏光)P偏光の光となり、偏光プ
リズム3の偏光膜を透過することができ、焦点誤差検出
用2分割光センサのフォトディテクタ8に到達する。
The light entering the focus error signal detection optical system is 1/4
By passing through the wavelength plate 6, it is converted into circularly polarized light again, and by the reflective film 7 formed in the lower half area of the 174 wavelength plate 6, the upper half of the light beam is transmitted and the lower half is reflected. The light becomes circularly polarized light with a rotation opposite to that of the incident light due to reflection by the zero-reflection film 7, which can bend the optical path, and then passes through the quarter-wave plate 6 again, so that the polarization direction is rotated by 90'' compared to the time of incidence. (Linearly polarized light) The light becomes P-polarized light, can pass through the polarizing film of the polarizing prism 3, and reaches the photodetector 8 of the two-split optical sensor for detecting focus error.

一方、トラッキングエラ検出では反射されていない偏光
プリズム3の上半分のエリアを通過する光を利用して、
トラッキングエラ検出用2分割フォトディテクタ9によ
り検出が行なわれる。
On the other hand, tracking error detection uses light passing through the upper half area of the polarizing prism 3 that is not reflected.
Detection is performed by a two-part photodetector 9 for tracking error detection.

「他の実施例」 第3図乃至第5図は本発明に係る光学式ピックアップ装
置の他の実施例である。この実施例においては、上記の
実施例の対物レンズ5の代りに厚みの薄いマイクロフレ
ネルレンズ10を使用したもので、偏光プリズム3の光
デイスクl側に接着された174波長板4の上に配置さ
れている。マイクロフレネルレンズlOはフレネルゾー
ンプレート、グレーティングレンズ、計算器ホログラム
、フレネル輪体等ともよばれ、電子通信学会論文集19
81年10月VOL、J84−C,No、10  f1
52頁〜657頁、電気通信学会論文集1883年1月
VOL 。
"Other Embodiments" FIGS. 3 to 5 show other embodiments of the optical pickup device according to the present invention. In this embodiment, a thin micro Fresnel lens 10 is used in place of the objective lens 5 of the above embodiment, and is placed on the 174 wavelength plate 4 glued to the optical disk l side of the polarizing prism 3. has been done. The micro Fresnel lens IO is also called a Fresnel zone plate, grating lens, computer hologram, Fresnel ring, etc., and is published in Proceedings of the Institute of Electronics and Communication Engineers 19.
October 1981 VOL, J84-C, No, 10 f1
Pages 52-657, Proceedings of the Institute of Electrical Communication Engineers, January 1883 VOL.

J88−C,No、1 85頁〜81頁に詳しい。J88-C, No. 1, pages 85 to 81 for details.

10aはマイクロフレネルレンズ10に形成されたレン
ズパターンで、図面では平面視が同心円状で、断面形状
が鋸歯形状(ブレーズドタイプ)の効率改善型が示され
ている。このレンズパターン10aは紫外線硬化型樹脂
(フォトポリマー)やフォトレジスト、電子線レジスト
等により形成され、厚さは数終mである。
Reference numeral 10a denotes a lens pattern formed on the micro Fresnel lens 10, and the drawing shows an efficiency-improving type lens pattern having concentric circles in plan view and a sawtooth (blazed type) cross-sectional shape. This lens pattern 10a is formed of ultraviolet curing resin (photopolymer), photoresist, electron beam resist, etc., and has a thickness of several meters.

11はレンズ基板で、このレンズ基板11は上記の1/
4波長板4の上にスペーサ12を介して接着されており
、レンズ基板11の裏面には、上記のマイクロフレネル
レンズ10が取付けられている。ここで、レンズ基板1
1はガラスまたはプラスチック酸で、厚さは0.3〜1
.0wmのものが使用されている。
11 is a lens substrate, and this lens substrate 11 is similar to the above 1/
It is bonded onto the four-wavelength plate 4 via a spacer 12, and the above-mentioned micro Fresnel lens 10 is attached to the back surface of the lens substrate 11. Here, lens substrate 1
1 is glass or plastic acid, thickness is 0.3~1
.. 0wm is used.

また、スペーサ12は金属板あるいはプラスチックシー
トなどにより形成されているが、このスペーサ12の厚
みはレンズパターンloaの厚みより少し厚く設定し、
該レンズパターン10aと1/4波長板4との間に空気
層13を形成して、レンズパターン10aとの屈折率差
を大きくしている。
Further, the spacer 12 is formed of a metal plate or a plastic sheet, and the thickness of the spacer 12 is set to be slightly thicker than the thickness of the lens pattern loa.
An air layer 13 is formed between the lens pattern 10a and the quarter-wave plate 4 to increase the difference in refractive index with the lens pattern 10a.

なお、図面ではマイクロフレネルレンズ10は、レンズ
パターンloa面を保護するために。
In addition, in the drawing, the micro Fresnel lens 10 is used to protect the lens pattern loa surface.

偏光プリズム3側に向けて配置しであるが、光デイスク
1側に向けてもよい、この場合はマイクロフレネルレン
ズ10は1/4波長板4の上に直接に接着され、スペー
サ12は不用となり、空気層13はレンズパターンlo
aの上部にできる。
The micro Fresnel lens 10 is placed facing the polarizing prism 3 side, but it may also be placed facing the optical disk 1 side. In this case, the micro Fresnel lens 10 is directly glued onto the 1/4 wavelength plate 4, and the spacer 12 is unnecessary. , the air layer 13 has a lens pattern lo
It can be formed on the upper part of a.

なお、マイクロフレネルレンズ10の代りに薄板状のホ
ログラムレンズを使用してもよい、その他の点について
は、上記の実施例と同様である。
Note that a thin plate-like hologram lens may be used instead of the micro Fresnel lens 10, and other points are the same as in the above embodiment.

この実施例では、対物レンズ5の代りに厚みの薄いマイ
クロフレネルレンズ10を使用したので、偏光プリズム
3から光ディスクlまでの間隔を大幅に短縮することが
できる。このため光ピツクアップの光軸方向のサイズを
小さくすることができる。
In this embodiment, since the thin micro Fresnel lens 10 is used in place of the objective lens 5, the distance from the polarizing prism 3 to the optical disc l can be significantly shortened. Therefore, the size of the optical pickup in the optical axis direction can be reduced.

「発明の効果」 本発明は叙上のように、光ディスクlに記録された情報
を光学的に読みとる光学式ピックアップ装置のナイフェ
ツジを用いた焦点誤差信号検出光学系において、ナイフ
ェツジを反射膜7を兼ねた薄膜とし、該反射s7を偏光
プリズム3に接着された1/4波長板6に直接形成し、
この反射膜7によって焦点誤差信号検出光学系の光路を
折り曲げたので、焦点誤差信号検出光学系を短縮するこ
とができる。
``Effects of the Invention'' As described above, the present invention provides a focus error signal detection optical system using a knife of an optical pickup device that optically reads information recorded on an optical disc l, in which the knife also serves as the reflective film 7. the reflection s7 is formed directly on the quarter-wave plate 6 bonded to the polarizing prism 3,
Since the optical path of the focus error signal detection optical system is bent by this reflective film 7, the focus error signal detection optical system can be shortened.

また、従来、金属板で構成されていたナイフエツジを反
射膜7化することにより、軽量化することができる。
Further, by using the reflective film 7 for the knife edge, which was conventionally made of a metal plate, it is possible to reduce the weight.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係る光学式ピックアップ装置の概略構
成図で、第2図は同要部の分解斜視図。 第3図は光学式ピックアップ装置の他の実施例を示す概
略構成図、第4図は同要部の拡大縦断面図、第5図は同
要部の一部を分解した斜視図、第6図は従来の光学式ピ
ックアップ装置の概略構成図を示す。 l・・・光ディスク、 2・・・半導体レーザ。 3・・・偏光プリズム。 4.6・・・l/4波長板、 5・・・対物レンズ、 7・・・反射膜、 8・・・フォトディテクタ。 第1図     第2図 第3図    第4図 第5図 第6図 Δ
FIG. 1 is a schematic configuration diagram of an optical pickup device according to the present invention, and FIG. 2 is an exploded perspective view of the main parts. FIG. 3 is a schematic configuration diagram showing another embodiment of the optical pickup device, FIG. 4 is an enlarged longitudinal sectional view of the same essential part, FIG. 5 is a partially exploded perspective view of the same essential part, and FIG. The figure shows a schematic configuration diagram of a conventional optical pickup device. l... Optical disk, 2... Semiconductor laser. 3...Polarizing prism. 4.6...l/4 wavelength plate, 5...objective lens, 7...reflection film, 8...photodetector. Figure 1 Figure 2 Figure 3 Figure 4 Figure 5 Figure 6 Δ

Claims (2)

【特許請求の範囲】[Claims] (1)光ディスクに記録された情報を光学的に読みとる
光学系ピックアップ装置のナイフエッジを用いた焦点誤
差信号検出光学系において、ナイフエッジを反射膜を兼
ねた薄膜とし、該反射膜を偏光プリズムに接着された1
/4波長板に直接形成し、この反射膜によって焦点誤差
信号検出光学系の光路を折り曲げるようにしたことを特
徴とする光学式ピックアップ装置。
(1) In a focus error signal detection optical system using a knife edge of an optical pickup device that optically reads information recorded on an optical disk, the knife edge is a thin film that also serves as a reflective film, and the reflective film is used as a polarizing prism. glued 1
1. An optical pickup device, characterized in that it is formed directly on a /4 wavelength plate, and the optical path of a focus error signal detection optical system is bent by this reflective film.
(2)対物レンズとしてフレネルレンズあるいはホログ
ラムレンズなどの薄板形状のレンズを使用し、それを偏
光プリズム上に接着された入射光路の1/4波長板上に
接着したことを特徴とする特許請求の範囲の範囲第1項
記載の光学式ピックアップ装置。
(2) A patent claim characterized in that a thin plate-shaped lens such as a Fresnel lens or a hologram lens is used as the objective lens, and the lens is bonded to a quarter wavelength plate of an incident optical path that is bonded to a polarizing prism. The optical pickup device according to item 1 of the range.
JP60127619A 1985-06-12 1985-06-12 Optical image pickup device Pending JPS61287042A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60127619A JPS61287042A (en) 1985-06-12 1985-06-12 Optical image pickup device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60127619A JPS61287042A (en) 1985-06-12 1985-06-12 Optical image pickup device

Publications (1)

Publication Number Publication Date
JPS61287042A true JPS61287042A (en) 1986-12-17

Family

ID=14964564

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60127619A Pending JPS61287042A (en) 1985-06-12 1985-06-12 Optical image pickup device

Country Status (1)

Country Link
JP (1) JPS61287042A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63279439A (en) * 1987-05-12 1988-11-16 Matsushita Electric Ind Co Ltd Optical head
JPH01133313U (en) * 1988-03-07 1989-09-11

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS586534A (en) * 1981-07-03 1983-01-14 Matsushita Electric Ind Co Ltd Optical device for reproducer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS586534A (en) * 1981-07-03 1983-01-14 Matsushita Electric Ind Co Ltd Optical device for reproducer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63279439A (en) * 1987-05-12 1988-11-16 Matsushita Electric Ind Co Ltd Optical head
JPH01133313U (en) * 1988-03-07 1989-09-11

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