JPS61182753A - Polishing plate - Google Patents

Polishing plate

Info

Publication number
JPS61182753A
JPS61182753A JP2084285A JP2084285A JPS61182753A JP S61182753 A JPS61182753 A JP S61182753A JP 2084285 A JP2084285 A JP 2084285A JP 2084285 A JP2084285 A JP 2084285A JP S61182753 A JPS61182753 A JP S61182753A
Authority
JP
Japan
Prior art keywords
polishing
pad
polishing plate
polished
workpiece
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2084285A
Other languages
Japanese (ja)
Inventor
Nobuo Nakamura
宣夫 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2084285A priority Critical patent/JPS61182753A/en
Publication of JPS61182753A publication Critical patent/JPS61182753A/en
Pending legal-status Critical Current

Links

Landscapes

  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Polishing Bodies And Polishing Tools (AREA)

Abstract

PURPOSE:To perform high accurate polishing with no generation of a step difference in a workpiece to be polished, by changing a proportion of an effective contact surface with the workpiece in the diametric direction. CONSTITUTION:A polishing pad 1 is spirally placed existing on a supporter 2. And said pad 1, arranging the line width of its spiral line gradually narrower from the center part to the peripheral part, forms a distance between the neighboring lines almost to a fixed value. And the pad forms a portion between the spiral lines to a groove 3 of fixed width. As a result, an effective contact surface of the polishing pad with a workpiece to be polished provides a narrower area as the surface changes its position toward the peripheral part. That is, an effective contact area with the workpiece per unit area of a polishing plate gradually decreases from the center part to the peripheral part. Accordingly, the more in the center part is the polishing pad a contact time with the polishing pad is the longer, while the more in the peripheral part the contact time is the shorter. Consequently, correction polishing, planing a ring belt shaped convex part, can be well performed with no generation of a step difference because a polishing quantity is almost in proportion to said contact time.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は研摩皿に関し、特に光学素子を高精度に研摩す
るのに好適な研摩皿に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a polishing plate, and particularly to a polishing plate suitable for polishing optical elements with high precision.

〔従来の技術〕[Conventional technology]

従来、光学素子たとえばレンズ、グリズムまたは反射鏡
等の表面精度を極めて高い精度に仕上げるために、一旦
ある程度の精度に研摩された表面を小径の研摩皿によシ
部分的に修正研摩することが行なわれる。
Conventionally, in order to finish the surface of optical elements such as lenses, grisms, or reflectors to extremely high precision, the surface, which has been polished to a certain degree of precision, is partially corrected and polished using a small-diameter polishing plate. It will be done.

第7図は、この様な修正研摩の具体例を説明するための
概略斜視図である。図において、12は被研摩物である
光学ガラス平行平面板であり、該被研摩物12は円形で
ある。被研摩物12はその下面が支持体14に接着され
て固定支持されている。支持体14は軸Xのまわシに回
転可能であり、被研摩物12は該軸Xに関し回転対称と
なる様に支持体14に固定されている。被研摩物12の
上面は前加工により予め鏡面研摩されている。但し、こ
の前加工によって、図示される輪帯Yの部分が凸になっ
ているとする。
FIG. 7 is a schematic perspective view for explaining a specific example of such corrective polishing. In the figure, reference numeral 12 denotes an optical glass parallel flat plate which is an object to be polished, and the object to be polished 12 is circular. The object to be polished 12 is fixedly supported by bonding its lower surface to a support 14 . The support 14 is rotatable about an axis X, and the object 12 to be polished is fixed to the support 14 so as to be rotationally symmetrical about the axis X. The upper surface of the object to be polished 12 has been mirror-polished in advance by pre-processing. However, it is assumed that the illustrated ring zone Y has become convex due to this pre-processing.

修正研摩においては被研摩物12の大きさに比ペて小さ
い研摩皿15が用いられる。研摩皿15は研摩ノ4ツド
16を支持体18に接着して固定支持したものからなシ
、該支持体18の上面中央部に形成された凹部には棒体
20の一端が突当てられている。該棒体20は被研摩物
12の径方向に適宜の幅で揺動可能である。22は研摩
液供給手段である。
In the correction polishing, a polishing plate 15 that is smaller than the size of the object 12 to be polished is used. The polishing plate 15 consists of a polishing plate 16 fixedly supported by adhering it to a support 18, and one end of a rod 20 is abutted against a recess formed in the center of the upper surface of the support 18. There is. The rod 20 is swingable in the radial direction of the object 12 to be polished by an appropriate width. 22 is a polishing liquid supply means.

研摩液供給手段22から被研摩物12の上面上へと研摩
液を供給しながら支持体14を矢印A方向にU転させ、
同時に支持体18を矢印B方向に揺動させることによっ
て修正研摩が行なわれる。
While supplying the polishing liquid onto the upper surface of the object to be polished 12 from the polishing liquid supply means 22, the support body 14 is rotated in the direction of arrow A,
At the same time, corrective polishing is performed by swinging the support 18 in the direction of arrow B.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかしながら、従来の修正研摩においては研摩皿15の
研摩/’Pツド16が全面にわたって均一の圧力にて被
研摩物12に接触しながら研摩加工を行なうため、被研
摩物12の上面において修正研摩を受けた部分と受けな
い部分とで段差を生じ易いという問題があった。
However, in conventional corrective polishing, the polishing process is performed while the polishing plate 16 of the polishing plate 15 contacts the object 12 with uniform pressure over the entire surface, so corrective polishing is performed on the upper surface of the object 12. There was a problem in that a difference in level was likely to occur between the receiving part and the non-receiving part.

第8図(a)及び(b)は第7図における■−■断面に
相当する被研摩物12の断面図である。
FIGS. 8(a) and 8(b) are cross-sectional views of the object to be polished 12 corresponding to the section 1--2 in FIG.

第8図(、)は修正研摩前の状態を示し、第8図(b)
は修正研摩後の状態を示すものであり、これから分る様
に、修正研摩時の研摩皿15の揺動幅に応じた位置に光
学的にみてかなり大きな段差24が形成される。
Figure 8 (,) shows the state before corrective polishing, and Figure 8 (b)
2 shows the state after the corrective polishing, and as can be seen from the figure, a considerably large step 24 is formed in a position corresponding to the swing width of the polishing plate 15 during the corrective polishing.

このだめ、研摩皿15の揺動幅を固定したものとせず、
徐々に揺動幅を変えることで段差の発生を防止すること
が提案されている。しかしながら、この様な揺動幅の連
続的変化のための機構はかなり複雑であυ、研摩装置が
高価なものとなるという欠点がある。
In this case, the swing width of the polishing plate 15 is not fixed,
It has been proposed to prevent the occurrence of steps by gradually changing the swing width. However, such a mechanism for continuously changing the oscillation width is quite complicated and has the disadvantage that the polishing device becomes expensive.

〔問題点を解決するだめの手段〕[Failure to solve the problem]

本発明によれば、以上の如き従来技術の問題点を解決す
るものとして、被研摩物との有効接触面の割合が径方向
に変化していることを特徴とする、研摩皿が提供される
According to the present invention, as a solution to the problems of the prior art as described above, there is provided a polishing plate characterized in that the ratio of the effective contact surface with the object to be polished changes in the radial direction. .

〔実施例〕〔Example〕

以下、図面を参照しながら本発明の研摩皿の具体的実施
例を説明する。
Hereinafter, specific embodiments of the polishing plate of the present invention will be described with reference to the drawings.

第1図は本発明研摩皿の第1の実施例を示す概略平面図
であり、第2図はその■−■断面図である。
FIG. 1 is a schematic plan view showing a first embodiment of the polishing plate of the present invention, and FIG. 2 is a cross-sectional view taken along the line -■.

本実施例の研摩皿は一様な厚さを有する研摩パッド1と
その支持体2とからなる。研摩皿は全体として円板状の
形状を有し、2はその対称軸である。研摩A/ラッドは
、第1図に示される様に、支持体2上にスパイラル状に
存在している。該研摩ノ9ツド1のスパイラル状ライン
の線幅は中心部から外周部へと次第に狭くなりている。
The polishing plate of this embodiment consists of a polishing pad 1 having a uniform thickness and its support 2. The polishing plate has a disk-like shape as a whole, and 2 is its axis of symmetry. The polishing A/rud is present in a spiral shape on the support 2, as shown in FIG. The width of the spiral line of the polishing nozzle 1 gradually becomes narrower from the center to the outer periphery.

そして、隣シあうスパイラル状ラインどうしの間の間隔
はほぼ一定である。支持体2の研摩パッド貼付側の面は
、第2図に示される様に、該研摩パッド1の実際に貼付
けられている部分を除く部分(即ち、スパイラル状ライ
ンどうしの間の部分)はス・臂イラル状に一定幅の溝3
が形成されている。
The spacing between adjacent spiral lines is approximately constant. As shown in FIG. 2, the surface of the support 2 on the side to which the polishing pad is attached is smooth except for the part where the polishing pad 1 is actually attached (i.e., the area between the spiral lines).・Groove 3 with a constant width in the shape of the armpit
is formed.

本実施例研摩皿は、平坦な研摩パッド貼付面を有する支
持体2に全面一様に研摩パッド1を貼付け、しかる後に
数値制御旋盤によシ切削加工を行なって所定の部分の研
摩パッド及び支持体表面を除去することによシ製造する
ことができる。
In the polishing plate of this embodiment, the polishing pad 1 is uniformly pasted on the entire surface of the support 2 having a flat polishing pad pasting surface, and then cutting is performed using a numerically controlled lathe to form the polishing pad and the support at predetermined portions. It can be manufactured by removing the body surface.

本実施例研摩皿においては、被研摩物と有効に接触する
研摩・ぐラド面は外周部はど面積が狭い。
In the polishing plate of this embodiment, the polishing/grid surface that effectively contacts the object to be polished has a narrow outer peripheral area.

即ち、研摩皿の単位面積当シの被研摩物との有効接触面
積は、研摩皿の中心部から外周部へと次第に小さくなっ
ている。従って、本実施例の研摩皿を用いて研摩を行な
う際には、研摩皿と接触する被研摩物表面の領域におい
ては第3図に示される様な研摩パッドとの接触時間特性
がある。即ち、研摩パッドとの接触領域のうちで、中心
部分はど研摩パッドとの接触時間が長く、外周部分はど
研摩11ツドとの接触時間が短かい。
That is, the effective contact area of the polishing plate with the object to be polished per unit area becomes gradually smaller from the center to the outer periphery of the polishing plate. Therefore, when polishing is performed using the polishing plate of this embodiment, the region of the surface of the object to be polished that comes into contact with the polishing plate has contact time characteristics with the polishing pad as shown in FIG. That is, among the contact areas with the polishing pad, the center portion has a longer contact time with the polishing pad, and the outer peripheral portion has a shorter contact time with the polishing pad.

第4図(、)及び(b)は本実施例研摩皿を用いて修正
研摩を行なった場合の被研摩物12の変化を示す断面図
である。第4図(、)は修正研摩前の状態を示し、第4
図(b)は修正研摩後の状態を示すものである。本実施
例研摩皿によれば、第3図に示される様な接触時間特性
が得られ、研摩量はこの接触時間にほぼ比例するため、
段差を生ずることなく輪帯状凸部を平坦化する修正研摩
を良好に行なうことができる。
FIGS. 4(a) and 4(b) are cross-sectional views showing changes in the object to be polished 12 when corrective polishing is performed using the polishing plate of this embodiment. Figure 4 (,) shows the state before corrective polishing;
Figure (b) shows the state after corrective polishing. According to the polishing plate of this embodiment, the contact time characteristics as shown in FIG. 3 can be obtained, and since the amount of polishing is approximately proportional to this contact time,
Correction polishing for flattening the annular convex portion can be performed satisfactorily without creating a step.

本実施例においては研摩パッド1のスフ4イラル状ライ
ンの線幅が中心部から外周部へと次第に狭くなっておシ
且つ該スパイラル状ライン間の間隔がほぼ一定である場
合を示したが、研摩パッド1のスパイラル状ライン間 スパイラル状ライン間の間隔が中心部から外周部へと次
第に広くなる様にすることもでき、これによっても第3
図と類似の特性が得られる。
In this embodiment, the width of the spiral lines of the polishing pad 1 is gradually narrowed from the center to the outer periphery, and the interval between the spiral lines is approximately constant. The distance between the spiral lines of the polishing pad 1 may be made gradually wider from the center to the outer periphery.
Characteristics similar to those shown in the figure can be obtained.

第5図は本発明研摩皿の第2の実施例を示す概略平面図
であり、第6図はその■−■断面図である。
FIG. 5 is a schematic plan view showing a second embodiment of the polishing plate of the present invention, and FIG. 6 is a sectional view taken along the line 1--2.

本実施例の研摩皿は、研摩パッド1が支持体2上に同心
円状に存在している点のみ、上記第1の実施例と異なる
。そして、研摩パッド1の同心円状ラインの線幅は中心
部から外周部へと次第に狭くなっておシ、同心円状ライ
ン間の間隔はほぼ一定である。
The polishing plate of this embodiment differs from the first embodiment only in that the polishing pad 1 is disposed concentrically on the support 2. The line width of the concentric lines of the polishing pad 1 gradually becomes narrower from the center to the outer periphery, and the intervals between the concentric lines are approximately constant.

本実施例の研摩皿においても第3図と類似の特性が得ら
れる。
The polishing plate of this example also has characteristics similar to those shown in FIG. 3.

尚、本実施例においては研摩パッド1の同心円状ライン
の線幅が中心部から外周部へと次第に狭くなっており且
つ該同心円状ライ/間の間隔がほぼ一定である場合を示
したが、研摩パッド1の複数の同心円状ラインの線幅が
ほぼ一定で且つ該同心円状ライン間の間隔が中心部から
外周部へと次第に広くなる様にすることもでき、これに
よりても第3図と類似の特性が得られる。
In this embodiment, the width of the concentric lines of the polishing pad 1 is gradually narrowed from the center to the outer periphery, and the intervals between the concentric lines are approximately constant; however, It is also possible to make the line widths of the plurality of concentric lines of the polishing pad 1 substantially constant and the intervals between the concentric lines gradually widen from the center to the outer periphery. Similar properties are obtained.

以上の実施例においては修正研摩を例にとり説明したが
、本発明研摩皿はその他の通常の研摩にも利用できるこ
とはもちろんである。
Although the above embodiments have been explained by taking corrective polishing as an example, it goes without saying that the polishing plate of the present invention can also be used for other ordinary polishing.

また、本発明研摩皿は、上記実施例に記載の様な使用方
法において研摩時間を適宜設定することによシ、非球面
量の少ない軸対称非球面を創成研摩するのに利用するこ
ともできる。
Furthermore, the polishing plate of the present invention can also be used for creating and polishing an axially symmetric aspherical surface with a small amount of aspherical surface by appropriately setting the polishing time in the usage method described in the above embodiment. .

更に、以上の実施例においては平面研摩皿を示したが、
凸面研摩皿及び凹面研摩皿も同様の効果を有することは
もちろんである。
Furthermore, although a flat polishing plate was shown in the above embodiments,
Of course, convex polishing plates and concave polishing plates have similar effects.

〔発明の効果〕〔Effect of the invention〕

以上の如き本発明研摩皿によれば、複雑な機構を有する
研摩装置を用いることなしに、被研摩物に段差を生ずる
ことなく高精度な研摩を行なうことができる。
According to the polishing plate of the present invention as described above, highly accurate polishing can be performed without creating a step on the object to be polished, without using a polishing device having a complicated mechanism.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明研摩皿の平面図でアシ、第2図はその■
−■断面図である。第3図は研摩、4ツドと被研摩物と
の接触時間特性を示すグラフである。 第4図(&)及び(b)、ならびに第8図(a)及び(
b)は被研摩物の断面図である。第5図は本発明研摩皿
の平面図であり、第6図はその■−■断面図である。 第7図は研摩方法を示す斜視図である。 1:研摩ノ4 ラド、2:支持体、3:溝。
Figure 1 is a plan view of the polishing plate of the present invention, and Figure 2 is a plan view of the polishing plate.
−■ It is a sectional view. FIG. 3 is a graph showing the contact time characteristics between the polishing tool and the object to be polished. Figure 4 (&) and (b), and Figure 8 (a) and (
b) is a sectional view of the object to be polished. FIG. 5 is a plan view of the polishing plate of the present invention, and FIG. 6 is a cross-sectional view taken along the line -■. FIG. 7 is a perspective view showing the polishing method. 1: Polishing No.4 Rad, 2: Support, 3: Groove.

Claims (3)

【特許請求の範囲】[Claims] (1)被研摩物との有効接触面の割合が径方向に変化し
ていることを特徴とする、研摩皿。
(1) A polishing plate characterized in that the ratio of the effective contact surface with the object to be polished changes in the radial direction.
(2)有効接触面の形状がスパイラル状または同心円状
であり、該スパイラル状または同心円状のラインの線幅
が中心部から外周部へと次第に狭くなっており、且つ該
スパイラル状または同心円状のライン間の間隔がほぼ一
定である、特許請求の範囲第1項の研摩皿。
(2) The shape of the effective contact surface is a spiral or concentric circle, and the line width of the spiral or concentric line becomes gradually narrower from the center to the outer periphery, and The polishing plate of claim 1, wherein the spacing between the lines is substantially constant.
(3)有効接触面の形状がスパイラル状または同心円状
であり、該スパイラル状または同心円状のラインの線幅
がほぼ一定であり、且つ該スパイラル状または同心円状
のライン間の間隔が中心部から外周部へと次第に広くな
っている、特許請求の範囲第1項の研摩皿。
(3) The shape of the effective contact surface is spiral or concentric, the line width of the spiral or concentric lines is approximately constant, and the distance between the spiral or concentric lines is from the center. The polishing plate according to claim 1, wherein the polishing plate gradually becomes wider toward the outer periphery.
JP2084285A 1985-02-07 1985-02-07 Polishing plate Pending JPS61182753A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2084285A JPS61182753A (en) 1985-02-07 1985-02-07 Polishing plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2084285A JPS61182753A (en) 1985-02-07 1985-02-07 Polishing plate

Publications (1)

Publication Number Publication Date
JPS61182753A true JPS61182753A (en) 1986-08-15

Family

ID=12038324

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2084285A Pending JPS61182753A (en) 1985-02-07 1985-02-07 Polishing plate

Country Status (1)

Country Link
JP (1) JPS61182753A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6452658U (en) * 1987-09-30 1989-03-31
EP0878270A2 (en) 1997-05-15 1998-11-18 Applied Materials, Inc. Polishing pad having a grooved pattern for use in a chemical mechanical polishing apparatus
US6783436B1 (en) 2003-04-29 2004-08-31 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Polishing pad with optimized grooves and method of forming same

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6452658U (en) * 1987-09-30 1989-03-31
JPH047897Y2 (en) * 1987-09-30 1992-02-28
EP0878270A2 (en) 1997-05-15 1998-11-18 Applied Materials, Inc. Polishing pad having a grooved pattern for use in a chemical mechanical polishing apparatus
EP0878270B2 (en) 1997-05-15 2014-03-19 Applied Materials, Inc. Polishing pad having a grooved pattern for use in a chemical mechanical polishing apparatus
US6783436B1 (en) 2003-04-29 2004-08-31 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Polishing pad with optimized grooves and method of forming same

Similar Documents

Publication Publication Date Title
US6135856A (en) Apparatus and method for semiconductor planarization
US5683290A (en) Apparatus for forming a convex tip on a workpiece
CN110088058B (en) Glass plate and method for manufacturing glass plate
JPS61182753A (en) Polishing plate
JP2800188B2 (en) Substrate suction device
JPS6351824B2 (en)
JPS61182752A (en) Polishing plate
JPH06132387A (en) Vacuum suction stage
US3830021A (en) Spherical bearing workpiece holder in an optical lens generating machine
JP2000301451A (en) Polishing device carrier and manufacture thereof
JP2001001243A (en) Method and device for chamfering outer circumferential portion of thin disklike work
JPH03208552A (en) Polishing method
JPH03213265A (en) Surface plate for lapping machine
JPH03256668A (en) Mount plate for polishing semiconductor wafer
JPS6237369B2 (en)
JP3545883B2 (en) Semiconductor device manufacturing equipment
KR200155242Y1 (en) Polishing apparatus for semiconductor manufacturing process
JPH02155231A (en) Manufacture of wafer
JPS6045011A (en) Semiconductor wafer and manufacture thereof
JPH04129669A (en) Method and device for super precision polishing of wafer
JPH0236072A (en) Polishing method for semiconductor wafer and polishing plate used therefor
JP2554424Y2 (en) Inner circumference grinding wheel
JP2799130B2 (en) Cutting method of ophthalmic lens and processing jig used for it
JPH06179165A (en) Surface plate for lapping work
JP2002254296A (en) Guide ring and polishing device, and polishing method